Abstract: An on-line measuring system for measuring a thickness of a transferred substrate includes a first image detector, a second image detector, an elevator, and a display device. After the first image detector indicates a vertical variation of a bottom surface of the substrate, the second image detector captures an image of the bottom surface of the substrate. The elevator perpendicularly moves the second image detector with respect to the bottom surface of the glass substrate, depending on the vertical variation of the bottom surface, such that a vertical distance between the bottom surface and the second image detector remains constant. Then, a controller processes the image of the bottom surface to calculate a distance between opposite edges of the bottom surface, thereby obtaining a thickness of the substrate.

Abstract: An imaging recording method and an apparatus for its implementation, including applying a light to an image to produce imaged light, passing the imaged light through a filter unit to provide filtered light, and recording the filtered light on an optical detector to produce a recorded image. The filter unit includes a first filter and a second filter. The first filter is polarization selective and the second filter is wavelength selective.

Abstract: The present invention provides a system for image-capturing devices, such as scanners, to accurately identify defects in objects. The objects can be the physical images to be captured or elements of the image-capturing devices such as the platen and mirrors. The image-capturing devices can then use this defect information to remove defects from captured images. The invention teaches an advantageous arrangement of illumination and sensor elements to record defect data at an angle roughly equal to the angle at which light is directed to an object, i.e. where the angle of reflection roughly equals the angle of incidence. Light reflected from surface defects has a wider diffusion and thus a lower amplitude than light reflected from the surface of the object itself. Accordingly, this characteristic can be utilized to identify defect information.

Abstract: A method and system for verifying the intended imaging produced by a printer allow this task to be accomplished in essentially real-time, and utilizing relatively inexpensive, and high speed (e.g. about 200 feet per minute or greater) components. A computer control commands a raster image processor (RIP) to generate electronic print data (e.g. a bitmap) that is sent to an electronic digital printer (such as an inkjet cartridge array) and also to a print monitor. The printer images the bitmap onto a web or sheet, then a linear digital photosensor (e.g. photodiode) array scans essentially every pixel across the width of the web or sheet image area and transmits the scanned data to the print monitor system, which compares it to the bitmap produced by the RIP.

Abstract: The present invention is a method and device for identifying recording media in a printer. The invention utilizes fine structure of the media revealed by illumination from one or more directions to distinguish among different kinds of plain papers, coated papers, such as glossy papers, and transparency films. When the medium is bond paper, by introducing light at an angle of less than approximately sixteen degrees relative to the surface, raised surface irregularities cast shadows creating a pattern rich in detail. For glossy surfaces, a high contrast image is obtained in the specular direction from normally incident illumination. The medium surface is imaged on an optoelectronic sensor to form a characteristic vector which is compared with reference vectors, corresponding to different media types, to determine the recording medium. The detection of the recording medium may then be used to change the characteristics of the printer.

Abstract: A web inspection system for analysis of a moving web of material records and stores continuous sequences of the web. The web inspection system includes a camera for recording the continuous sequence of the web, an encoder for synchronizing movements of the web with the video image being recorded, and an Image Processing System (IPS) including a real time video disk for storing the image of the web and for displaying the continuous sequence web image on a video display. The IPS is also utilized for detecting faults or features and for categorizing the faults or features detected. The entire web is recorded and the image can be viewed either interactively while the image is being recorded or at a later time. The recorded image of the web can be played back at a slower speed to allow for a more detailed inspection of the web. The sequence image can be analyzed to build a defect image database. The web inspection system can also be utilized for sorting and displaying defect information.

Abstract: The method which is applicable to the inspection of bobbins of yarn of any size, color and material, is based on the acquisition of images of the surface of the bobbin and on their processing by a computer program in order to evaluate defects, and comprises various steps of exploring the bobbin (1) taking a plurality of images of various areas of said bobbin, each step occurring under specific conditions of lighting and relative position of particular image sensors (3, 4) in order to identify specific defects, displacing either the bobbin (1) or the image acquisition device (3, 4), or bot to explore, sector by sector, the whole surface of interest, each of the focused images, related to a particular defect being processed individually by the evaluation program.

Abstract: A microprobe chip for detecting evanescent waves includes a photoconductive material and a substrate for supporting the photoconductive material. The photoconductive material is connected to electrodes formed on the substrate. A method for making a microprobe chip for detecting evanescent waves includes forming a film comprising a photoconductive material on a peeling layer of a first substrate, the film having a shape of the microprobe chip, and transferring the film on the peeling layer onto a junction layer provided on a second substrate. A method for making a probe provided with a microprobe chip for detecting evanescent waves includes forming a film comprising a photoconductive material and having the shape of the microprobe chip on a peeling layer of a first substrate, forming a thin film cantilever on a second substrate, and transferring the film on the peeling layer onto a junction layer formed on the thin film cantilever.