With Transversal Scan Patents (Class 250/559.48)
  • Patent number: 11810285
    Abstract: A method for determining soil clod parameters within a field includes receiving, with a computing system, three-dimensional image data depicting an imaged portion of the field. The three-dimensional image data, in turn, includes a first two-dimensional image depicting the imaged portion of the field relative to a first position and a second two-dimensional image depicting the imaged portion of the field relative to a second position, with the first position being spaced apart from the second position. Furthermore, the method includes identifying, with the computing system, a soil clod depicted with the received three-dimensional image data. Additionally, the method includes comparing, with the computing system, the first and second two-dimensional images to identify a shadow surrounding at least a portion of the identified soil clod. Moreover, the method includes determining, with the computing system, a soil clod parameter associated with the identified soil clod based on the identified shadow.
    Type: Grant
    Filed: March 16, 2021
    Date of Patent: November 7, 2023
    Assignee: CNH INDUSTRIAL CANADA, LTD.
    Inventor: James W. Henry
  • Patent number: 11614323
    Abstract: A method of predicting the gravity-free shape of a glass sheet and a method of managing the quality of a glass sheet based on the gravity-free shape of the glass sheet. The initial shape of a glass sheet is determined. When the glass sheet is flattened, values of stress at a plurality of locations in the glass sheet are obtained. A shape that the glass sheet will have when the flattened glass sheet is deformed such that the values of stress are zero is predicted as a stress-induced shape and a gravity-free shape of the glass sheet is predicted by combining the initial shape and the stress-induced shape. Quality management is performed on glass sheets based on gravity-free shapes thereof predicted using the method of predicting the gravity-free shape of a glass sheet.
    Type: Grant
    Filed: May 23, 2017
    Date of Patent: March 28, 2023
    Assignee: Corning Incorporated
    Inventors: Sang-ho Lim, Myunghwan Oh
  • Patent number: 11213970
    Abstract: An automated crosscut saw system utilizing a wood scanning unit to optimize the cuts in a particular piece of wood to remove defects or flaws and a method of use therefor is provided. The automated saw system has the ability to scan and cut a piece of wood simultaneously or in rapid succession without the need for scanning the entire length of the wood prior to cutting. Further, the automated saw system may eliminate the need for a secondary feeder and secondary queue.
    Type: Grant
    Filed: March 26, 2020
    Date of Patent: January 4, 2022
    Assignee: Eagle Machinery & Supply, Inc.
    Inventors: Kirk Spillman, Todd Spillman
  • Patent number: 10739259
    Abstract: A system for measuring the reflectivity of a painted object includes an electromagnetic wave source that emits an electromagnetic wave, a panel that holds the painted object, with the panel being movable to adjust an incident angle of the electromagnetic wave onto the panel, a reflector to receive and direct electromagnetic waves that are reflected by the painted object towards the reflector, a detector to detect an intensity of electromagnetic waves, and a control unit. The control unit is communicatively connected to the panel and to the detector. The control unit determines the incident angle of the electromagnetic wave, receives the intensity of the electromagnetic wave detected by the detector, and determines the reflectivity of the painted object as a function of the intensity of the electromagnetic wave detected by the detector over a predetermined range of incident angle values.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: August 11, 2020
    Assignee: AXALTA COATING SYSTEMS IP CO., LLC
    Inventors: Larry E. Steenhoek, Robert V. Canning
  • Patent number: 10345248
    Abstract: An optical system for inspecting a transparent plate includes a light source for casting incident light onto a face of the transparent plate so that there is a primary reflected light and secondary reflected light from the face of the transparent plate, a photo sensor for receiving light from the face of the transparent plate, and a blocking element for blocking the secondary reflected light while allowing the primary reflected light to reach the photo sensor.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: July 9, 2019
    Assignee: STEK CO. LTD
    Inventor: Ming-Sheng Chen
  • Patent number: 9557169
    Abstract: This invention allows tracking of a defect across multiple inspections. The inventive solution translates every inspection record into a common set of fields that are first archived into a relational database. Then the defect coordinates from the inspection records of the same mask are all transformed into a common reference frame having the same origin and orientation with respect to the mask coordinate system. Following this, the defect having coordinates within a given tolerance distance are paired up and reported to the user.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: January 31, 2017
    Assignee: RETICLE LABS LLC
    Inventor: Mohammad Saghir Munir
  • Patent number: 8742385
    Abstract: Paper and continuous web scanners operate at varying and high temperature conditions that cause distortion of the support beams and ultimately misalignment of the scanner heads. Circulating a heat transfer fluid between the support beams and through segmented fluid channels within the beam allows tuning of the beam's deflection when operating in an uneven thermal environment. The heat transfer rate can be modulated through various techniques, including: (1) varying the flow rate through each channel under manual or automatic control, (2) controlling the inlet fluid temperature of each channel with fluid immersion heaters or coolers, and (3) setting up the flow sequence via distribution channels that are, for example, in parallel, serial, or mixed.
    Type: Grant
    Filed: January 26, 2011
    Date of Patent: June 3, 2014
    Assignee: Honeywell ASCa Inc.
    Inventors: Ron Beselt, Michael Wardas, Cris Andronic
  • Patent number: 6710868
    Abstract: Apparatus for inspection of a sample includes an optical assembly made up of first and second optical heads with respective first and second levels of spatial resolution, such that the second level of spatial resolution is substantially higher than the first level. A positioning device imparts motion to at least one of the optical assembly and the sample, so as to cause the optical assembly to scan over the surface of the sample. An inspection controller processes the signal output by the first optical head to identify spots on the surface that should be inspected at the second level of spatial resolution, and then controls the second optical head so as to inspect the identified spots.
    Type: Grant
    Filed: May 22, 2002
    Date of Patent: March 23, 2004
    Assignee: Applied Materials, Inc.
    Inventor: Avishay Guetta
  • Patent number: 6670627
    Abstract: A surface examining apparatus irradiates an examinatorial light from a projector on a examined body that runs in a Z-direction. The projector is arranged at a distance from the surface of the examined body in a Y-direction orthogonal to the surface thereof and arranged inwardly of outer ends of the examined body in the width direction thereof in the X-direction orthogonal to the Z-direction and the Y-direction, and which detects the light that has passed through the examined body thereby to examine surface defects of the examined body. A light shielding unit is provided, which includes a light shielding member arranged between the projector and the examined body and shields the examinatorial light that is going to travel outwards from the outer end in the width direction of the examined body, and a moving unit that moves the light shielding member in the X-direction and in the Y-direction.
    Type: Grant
    Filed: April 12, 2002
    Date of Patent: December 30, 2003
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Ippei Takahashi, Hiroshi Tsuzaki
  • Patent number: 6622621
    Abstract: A device for detecting register marks includes at least one receiver for scanning register marks along a track disposed in a direction of movement of the register marks, and a device for positioning the receiver transversely with respect to the track, in order to determine an offset of the receiver with respect to the track, at least one positioning mark being disposed upline of the register marks in the direction of movement thereof, the positioning mark having at least one edge extending at an angle to the track, having an extent transverse to the track, which is a multiple of the extent of the register marks, and having a predetermined positional relationship to the track which is transverse to the track.
    Type: Grant
    Filed: September 18, 2001
    Date of Patent: September 23, 2003
    Assignee: Heidelberger Druckmaschinen AG
    Inventors: Harald Bucher, Frank Schumann
  • Patent number: 6621082
    Abstract: A scanning electron microscope equipped with a laser defect detection function has an automatic focusing function that performs the steps of: obtaining a deviation (offset) amount between focal positions of an optical microscope and a scanning electron microscope; detecting a defect by a laser dark-field image of the optical microscope; analyzing the dark-field image to readjust a focus of the optical microscope to adjust a height of the optical microscope; and automatically adjusting a focus of the scanning electron microscope by adding a readjusted amount of the focus of the optical microscope to the offset amount before an observation is conducted by the scanning electron microscope.
    Type: Grant
    Filed: June 13, 2002
    Date of Patent: September 16, 2003
    Assignee: Seiko Instruments Inc
    Inventors: Seiji Morita, Mitsuyoshi Sato, Atsushi Uemoto
  • Publication number: 20030151008
    Abstract: A surface inspection apparatus inputs image data obtained by scanning an inspection object by a camera which includes a line image sensor into calculation means. The surface inspection apparatus comprises a line memory and adder to add image data of two adjacent main scanning lines to generate an image data string, adds the image data in a block including a plurality of pixels continuous in a main scanning direction by the calculation processor to generate added data in the block, calculates a correlated value of the added data in the blocks adjacent to each other in the main scanning direction, and judges the correlated value with a threshold value by judgment means to obtain a surface state of the inspection object.
    Type: Application
    Filed: March 7, 2003
    Publication date: August 14, 2003
    Inventor: Yoshiro Yamada
  • Patent number: 6548821
    Abstract: Substrate inspection apparatus in accordance with the invention comprises optics for reflecting a laser beam off of a substrate and a detector for detecting the reflected laser beam. If a defect is present at the point where the laser reflects off the substrate, the laser will be deflected at an angle. Circuitry coupled to the detector generates a first signal that provides a measure of the extent to which the laser beam is deflected. (This signal is a measure of the slope of the defect walls.) An integrator receives that signal, and generates a second signal that is the integral of the first signal. The second signal is a measure of the height of the defect. The first and second signals provide a measure of the types of defects present on the substrate, and are used to determine whether the substrate is acceptable or should be rejected. In accordance with a second embodiment of the invention, laser beams are reflected off both the top and bottom surfaces of the substrate and detected by detectors.
    Type: Grant
    Filed: April 14, 2000
    Date of Patent: April 15, 2003
    Assignee: Komag, Inc.
    Inventors: David Treves, Thomas A. O'Dell
  • Patent number: 6538252
    Abstract: In a method for determining alignment of line formations of a web, a radiation source emitting radiation and a detector with numerous radiation sensors for sensing the radiation are provided. The radiation source and the detector are reciprocated together simultaneously transversely across the web. During reciprocation across the web, at least one measuring location of the web is irradiated by the radiation source and measured values, based on local radiation intensities are measured by the radiation sensors of the detector. The measured values are communicated to a computer. The computer generates, based on the measured values and the relative positions of the radiation sensors to one another, a local structural image of the at least one measuring location of the web.
    Type: Grant
    Filed: April 25, 2000
    Date of Patent: March 25, 2003
    Assignee: PLEVA GmbH
    Inventors: Ralf Pleva, Harry Pleva
  • Publication number: 20020195577
    Abstract: Multiple scans of the same object are obtained, where for any given line on the object to be scanned, the angle of the illumination is different for each scan. The different scans are obtained from different rows of photosensors that are separated. Because the angles of illumination are different, the resulting shadows in each scan are different. The multiple scans may be combined into a single composite color image. In a composite image, a dust particle may generate a series of overlapping shadows, where each shadow is a different color. Searching the composite image for the unique pattern of colors may identify artifacts or defects. Alternatively, the data for one scanned image may be compared to the data for another scanned image, and any differences may be due to shadows, which may indicate defects.
    Type: Application
    Filed: August 22, 2002
    Publication date: December 26, 2002
    Inventors: Robert G. Gann, Kurt E. Spears
  • Patent number: 6462813
    Abstract: A system and method for detecting defects on a painted workpiece surface. The system includes an elongated line of light having a pair of sharp transition zones. The line of light falls onto a moving substrate containing a plurality of workpieces to be inspected. An area detector receives light scattered by the workpiece surface. A first image is captured proximate one edge of the line of light and a second image is captured proximate the other. A defect on the workpiece produces characteristic shadow or backscatter patterns which vary between the first and second images. The shadow and backscatter patterns cause variations in the amplitude of light detected by the detector. The image data is then digitized and electronically processed by software which recognizes each defect, and characterizes the defect by type and/or size.
    Type: Grant
    Filed: April 10, 1997
    Date of Patent: October 8, 2002
    Assignee: Perceptron, Inc.
    Inventors: G. Neil Haven, Myron Czubko
  • Patent number: 6426510
    Abstract: An inspection device for inspecting pattern shapes of rectiles or mask patterns is disclosed. The inspection device includes a light source for irradiating inspection light, a scanning unit for scanning the inspection light, an inspection light dividing unit for dividing the inspection light scanned by the scanning unit, a monitor light detecting unit for receiving one of the inspection lights divided by the inspection light dividing unit and converting the one of the inspection lights to a monitor signal, a transmitting light detecting unit for receiving a transmitting light, which has transmitted through a pattern shape, among the other inspection lights divided by the inspection light dividing unit and converting the transmitting light into a transmission detecting signal.
    Type: Grant
    Filed: December 7, 1999
    Date of Patent: July 30, 2002
    Assignee: NEC Corporation
    Inventor: Jun-Ichi Yano
  • Patent number: 6219135
    Abstract: The invention relates to a device and a method for the optical recording of at least one parameter on a longitudinally moved thread-type material. To enable parameters such as the diameter of a thread-type material, the diameter of a yarn package, the hairiness of a yarn etc. to be determined more simply and more accurately, an optical sensor composed of at least two individual sensors (30), in which at least one individual sensor is so constructed and arranged that at least one measured value is recorded digitally for a parameter, is to be used to record in parallel from the material at least two signals, one at least of which is clocked.
    Type: Grant
    Filed: June 29, 1999
    Date of Patent: April 17, 2001
    Assignee: Zellweger Luwa AG
    Inventors: Rolf Hensel, Hans Wampfler, Jeffrey Mitchell Raynor, Peter Markus Seitz