Abstract: A laser processing apparatus includes a laser light output section, a first scanner and a second scanner, a distance measurement light emitting section, a reference member which is arranged at a position which is the other end of a correction optical path formed with the distance measurement light emitting section as one end of the correction optical path and is arranged such that an optical path length of the correction optical path is a predetermined reference distance, a distance measurement light receiving section which receives distance measurement light reflected by the workpiece or the reference member, a distance measuring section which measures a distance to the workpiece or the reference member, and a distance correcting section which compares a measurement result of the distance to the reference member with the reference distance stored in advance to correct the measurement result obtained by the distance measuring section.

Abstract: A polygon scanner (10) for detecting objects (24) in a monitored zone (22) is provided having a light transmitter (12); having a light receiver (30); having an evaluation unit (32); and having a rotatable mirror unit (20) for a periodic deflection of the light beam (16) that has a plurality of mirror facets (34) in order thus to scan an angular section multiple times per rotation of the mirror unit (20) by a respective mirror facet (34), wherein at least some of the mirror facets (34) have a different curvature from one another. In this respect, at least one of the mirror facets (34) is configured as a free-form surface whose curvature is adapted to the angle of incidence of the transmitted light beam (16) on the mirror facet (34) that varies during the rotation of the mirror unit (20).

Abstract: It is an object of the present invention to provide a user interface which facilitates confirmation of an area in an image and associated data corresponding to the area without requiring user's complicated operations. To achieve the object, an information processing apparatus comprises: an obtaining unit configured to obtain a first image including a plurality of objects, and information related to respective positions of the plurality of objects in the first image; and a determining unit configured to determine a position in case of shifting and displaying a second image indicating the plurality of objects with respect to the first image, based on the obtained positions of the plurality of objects.

Abstract: Provided is a method of inspecting a pattern defect. The method includes: applying a voltage to an object to be inspected and measuring an inspection signal generated in a pattern of the object to be inspected due to the voltage applied to the object to be inspected over time; generating an intensity image showing a relationship between an intensity of the inspection signal measured in the pattern and a time by processing the inspection signal; and detecting a pattern defect position by comparing the intensity image with a comparative intensity image.

Abstract: An optical system for measuring a distance to an object furnished with a plane mirror is disclosed. The optical distance measuring system includes a coherent light source projecting a laser beam, optical elements, and a one-dimensional photosensor. The optical elements split the laser beam into two laser beams and spread out the laser beam into a sheet of light whose orientation is perpendicular to a plane created by the propagation directions of the laser beams. The laser beams are reflected by the mirror and back to the photosensor. The photosensor detects incident light intensity distribution of the reflected laser beams with two local maxima, whose position can be employed to calculate the distance of the mirror and its momentary tilt angle.

Abstract: A method for operating a machine for producing and/or processing a material web, wherein a first drive unit is supplied by a converter with a current, a vibration propagating over the material web is captured via the first drive unit, the vibration is measured and transformed into a measurement signal that is examined for presence of a signature that differs from the basic waveform of the current, a web tear is thus identified if the signature propagating over the material web is missing during the evaluation of the electrical measurement signal, whereby no further sensors, in particular optical sensors, are required to capture the measurement signal, and the measurement also occurs independently of a torque, a speed or speed development of drive motors over time and, moreover, the detection of the web tear does not require a comparison measurement at the machine without a continuous material web.

Abstract: Systems and methods of processing images of expense receipts are provided. Images of expense receipts are received from an image capture device and an image filter is used to process the images. The filtered images are displayed to the user in a real-time preview portion of a user interface.

Abstract: A self-powered current sensor is described. The self-powered current sensor including an electrical signal input configured to receive a current signal. Further, the self-powered current sensor includes a power circuit configured to generate a power voltage from an electrical signal. The self-powered current sensor also includes a variable resistor configured to set a value corresponding to one or more indicators on the electrical sensor and an amplifier coupled with a variable resistor and a power circuit. And, the self-powered current sensor includes an alarm coupled with an amplifier, an alarm configured to activate based on a value set by said variable resistor.

Abstract: In at least some embodiments, an ultrasound system includes an ultrasound transducer and a bi-directional transistor coupled to the ultrasound transducer. The ultrasound system also includes an ultrasound receiver coupled to the bi-directional transistor. The bi-directional transistor operates to selectively connect the ultrasound transducer to ground and to selectively connect the ultrasound transducer to the ultrasound receiver.

Abstract: Provided with a pellicle inspection apparatus that inspects a pellicle film of a mask provided with a pellicle and used in EUV lithography. The pellicle inspection apparatus includes: an illumination optical system that projects a converging illuminating beam toward the pellicle film; a light collection optical system including an object lens having an optical axis substantially orthogonal to the pellicle film and that collects scattering light outgoing from a foreign substance present on the pellicle film; and a detection system that detects the scattering light collected by the light collection optical system, wherein an incident angle ?2 of the illuminating beam with respect to the pellicle film satisfies Expression ?2??0>?1+23°, where ?0 is a collecting angle (half angle) of the illuminating beam, and ?1 is a maximum light-receiving angle (half angle) of the object lens.

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: The disclosure relates to a system and device for evaluating imperfections in a lens for a display for an electronic device. The evaluation device comprises: a substrate; and a pattern imposed on the substrate. The pattern comprises a series of lines in a grid imposed on the substrate wherein when the pattern is viewed through the lens, the series of lines having thickness of between approximately 10 and approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center, the pattern is distorted around an area where a defect is present in the lens. With the device, the lens is identifiable as being defective if the pattern appears as a moiré distortion in the area when viewed through the lens.

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable scan speed beam scanning subsystem, preferably using an acousto-optic deflector, with beam compensation, so that variable scanning speeds can be achieved. Also included are methods and systems for improving the signal to noise ratio by use of scatter reducing complements, and a system and method for selectively and repeatedly scanning a region of interest on the surface in order to provide additional observations of the region of interest.

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: A device (10) is provided for measuring at least one characteristic (12) related to presence of particles. The device (10) includes a light source unit (16) for emitting light into a region (18) containing particles (20), with the light source being configured to emit light from a plurality of locations in a manner so that the emitted light follows a desired intensity distribution (22), the desired intensity distribution (22) being desired for the measurement of the at least one characteristic (12). In preferred embodiments the intensity distribution is Lambertian.

Abstract: The invention relates to a system, method and device for evaluating imperfections in a lens for a display for an electronic device. For the device, it comprises: a substrate; and a pattern imposed on the substrate. For the pattern, when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens. For the system, it comprises: an evaluation table for the lens, the table having a mounting area; and a substrate for mounting on the mounting area, the substrate having a pattern imposed thereon wherein when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens.

Abstract: A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The system features a variable scan speed beam scanning subsystem, preferably using an acousto-optic deflector, with beam compensation, so that variable scanning speeds can be achieved. Also included are methods and systems for improving the signal to noise ratio by use of scatter reducing complements, and a system and method for selectively and repeatedly scanning a region of interest on the surface in order to provide additional observations of the region of interest.

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: The invention device measures the instantaneous rotation speed of a turbine (6) which is housed inside the body (3) of the paint sprayer (2) and which rotationally drives the rotating bowl (5) when the paint sprayer is mounted on the end of an arm (8) of a robot or an analogous multi-axis machine. A disk (10), which is disposed to the rear of the turbine (6) and which rotates therewith, cooperates with the front end (11a) of an optical-fiber-type light guide (11) which is interrupted (11b) at the rear (7) of the body (3) of the paint sprayer (2). Transmitting and receiving optoelectronic means are mounted on the end of the arm on the mounting plane (9) of the paint sprayer, opposite the rear end (11b) of the light guide (11). Said means convert a reflected optical signal which is carried by the optical guide (11) into an electronic signal which is carried by an electric cable (22) placed in the arm (8). The inventive device is suitable for use with machines on automatic painting lines for automotive vehicles.

Abstract: Substrate inspection apparatus in accordance with the invention comprises optics for reflecting a laser beam off of a substrate and a detector for detecting the reflected laser beam. If a defect is present at the point where the laser reflects off the substrate, the laser will be deflected at an angle. Circuitry coupled to the detector generates a first signal that provides a measure of the extent to which the laser beam is deflected. (This signal is a measure of the slope of the defect walls.) An integrator receives that signal, and generates a second signal that is the integral of the first signal. The second signal is a measure of the height of the defect. The first and second signals provide a measure of the types of defects present on the substrate, and are used to determine whether the substrate is acceptable or should be rejected. In accordance with a second embodiment of the invention, laser beams are reflected off both the top and bottom surfaces of the substrate and detected by detectors.

Abstract: A printer, which can detect a media sheet type, includes: a light emitting source and a reflector, the light emitting source being capable of emitting light in a light emission direction towards the reflector, the reflector being arranged in light emission direction and being capable of reflecting light emitted by the light emitting source in a light reflection direction; a detector being arranged such that it can detect reflected light; and a controller connected to the reflector, the controller being capable of modulating a characteristic of the reflected light.