Abstract: An analog front-end circuit includes an analog processing circuit, an A/D converter, a target register in which a lower limit target value of an input image signal is set, and a calculation circuit. The analog processing circuit includes an offset control circuit which performs offset control based on an offset control value set in an offset control register. The calculation circuit monitors the A/D-converted value in a lower limit value output period when the A/D-converted value corresponding to a lower limit value of an input range is output from the A/D converter, and sets the offset control value that causes the A/D-converted value to become closer to the lower limit target value set in the target register in the offset control register.

Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.