Electron Or Ion Source Patents (Class 315/111.81)
  • Patent number: 8440981
    Abstract: A non-radioactive source for Atmospheric Pressure Ionization is described. The electron-beam sealed tube uses a pyroelectric crystal(s). One end of the crystal is grounded while the other end has a metallic cap with sharp feature to generate an electron beam of a given energy. The rate of heating and/or cooling of the crystal is used to control the current generated from a tube. A heating and/or cooling element such as a Peltier element is useful for controlling the rate of cooling of the crystal. A thin window that is transparent to electrons but impervious to gases is needed in order to prolong the life of the tube and allow the extraction of the electrons. If needed, multiple crystals with independent heaters can be used to provide continuous operation of the device. Dielectric shielding of the pyroelectric crystal is used to minimize discharge of the crystal.
    Type: Grant
    Filed: June 13, 2011
    Date of Patent: May 14, 2013
    Assignee: Excellims Corporation
    Inventors: Leslie Bromberg, Ching Wu
  • Publication number: 20130088150
    Abstract: An ion beam source that emits an ion beam in a direction of a substrate is provided. A cathode with a discharge opening defined therein is included. An anode is also included and spaced apart from the cathode. Ions are set to be emitted in an area proximate to the discharge opening in a direction similar to the direction from the anode to the discharge opening. First and second ceramic walls at least partially define a discharge channel between the anode and the cathode. At least one magnet generates a magnetic field in an area proximate to the discharge opening.
    Type: Application
    Filed: October 10, 2011
    Publication date: April 11, 2013
    Applicant: Guardian Industries Corp.
    Inventor: Maximo FRATI
  • Patent number: 8415645
    Abstract: It is aimed to prevent electrical charging inside a resin material as well as a surface of a resin vessel at a time of sterilizing the resin vessel by being irradiated with electron beam. A bottle support unit is mounted to a lower end portion of a cylindrical rotating shaft rotatably supported by a rotating wheel. The bottle support unit includes a pair of griper members by which a mouth portion of a bottle is gripped. The bottle rotated and conveyed in a state supported by the bottle support unit is irradiated with the electron beam from an electron beam irradiator to thereby sterilize the bottle. A ground electrode is disposed to be capable of being inserted into the interior of the resin vessel through a mouth portion thereof, and the interior of the resin vessel is irradiated with the electron beam in a state of the ground electrode being inserted into the resin vessel.
    Type: Grant
    Filed: January 21, 2010
    Date of Patent: April 9, 2013
    Assignee: Shibuya Kogyo Co., Ltd.
    Inventors: Toshiya Kobayashi, Mitsuomi Narita, Tomohiko Sugimori, Tsunehiko Yokoi, Yukinobu Nishino, Masami Hayashi, Hideki Nishikawa, Yukihiro Yamamoto, Tokuo Nishi
  • Patent number: 8410452
    Abstract: The invention relates to an ion source means comprising at least one holding means for holding at least one sample to expose the sample to a mass spectrometer device, wherein the holding means comprises a structured sample support means for supporting the sample and/or a structured sample or sample comprising a structured surface, respectively.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: April 2, 2013
    Assignee: Universitaetsklinikum Muenster
    Inventors: Simone Koenig, Klaus Dreisewerd, Alexander Pirkl
  • Patent number: 8410704
    Abstract: Ionization devices that have at least two modes of ionization, and that can switch between these two modes of operation, are described. Illustratively, the ionization devices can switch between a photoionization (PI) mode and a combined mode of electroionization (EI) and PI (EI/PI mode).
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: April 2, 2013
    Assignee: Agilent Technologies, Inc.
    Inventors: James Edward Cooley, Sameer Kothari
  • Patent number: 8405043
    Abstract: The present invention provides a method for extracting a charged particle beam from a charged particle source. A set of electrodes is provided at the output of the source. The potentials applied to the electrodes produce a low-emittance growth beam with substantially zero electric field at the output of the electrodes.
    Type: Grant
    Filed: January 10, 2011
    Date of Patent: March 26, 2013
    Assignee: FEI Company
    Inventors: Roderick Boswell, Orson Sutherland
  • Patent number: 8399865
    Abstract: An ion implantation system and process, in which the performance and lifetime of the ion source of the ion implantation system are enhanced, by utilizing isotopically enriched dopant materials, or by utilizing dopant materials with supplemental gas(es) effective to provide such enhancement.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: March 19, 2013
    Assignee: Advanced Technology Materials, Inc.
    Inventors: Robert Kaim, Joseph D. Sweeney, Anthony M. Avila, Richard S. Ray
  • Patent number: 8399863
    Abstract: A charged particle gun includes: a charged particle source; a first extracting electrode arranged in such a manner that a distance between the charged particle source and the first extracting electrode is fixed; a second extracting electrode located on the side opposite to the charged particle source with respect to the first extracting electrode, the electrode being arranged in such a manner that a distance between the first extracting electrode and the second extracting electrode is adjustable; and an earth electrode located on the side opposite to the first extracting electrode with respect to the second extracting electrode, the electrode being arranged in such a manner that a distance between the second extracting electrode and the earth electrode is fixed; wherein the first extracting electrode is equal in potential to the second extracting electrode.
    Type: Grant
    Filed: July 23, 2009
    Date of Patent: March 19, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyasu Kaga, Masashi Sasaki, Junzo Azuma
  • Patent number: 8389937
    Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.
    Type: Grant
    Filed: June 7, 2011
    Date of Patent: March 5, 2013
    Assignee: Mochii, Inc.
    Inventors: Christopher Su-Yan Own, Andrew Bleloch, William Andregg
  • Patent number: 8389953
    Abstract: A focused ion beam apparatus includes an ion gun unit having an emitter tip, a gas supply unit that supplies gas to the tip, and an ion source gas supply source. An extracting electrode ionizes the gas adsorbed onto the surface of the tip and extracts ions by applying a voltage between the extracting electrode and the tip. A cathode electrode accelerates the ions toward a sample. An aperture member has an opening that passes therethrough a part of the ion beam ejected from the ion gun unit, and a lens system focuses the ion beam onto the sample.
    Type: Grant
    Filed: February 15, 2011
    Date of Patent: March 5, 2013
    Assignee: SII NanoTechnology Inc.
    Inventors: Takashi Ogawa, Kenichi Nishinaka, Yoshihiro Koyama
  • Patent number: 8368309
    Abstract: Thermal control is provided for an extraction electrode of an ion-beam producing system that prevents formation of deposits and unstable operation and enables use with ions produced from condensable vapors and with ion sources capable of cold and hot operation. Electrical heating of the extraction electrode is employed for extracting decaborane or octadecaborane ions. Active cooling during use with a hot ion source prevents electrode destruction, permitting the extraction electrode to be of heat-conductive and fluorine-resistant aluminum composition.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: February 5, 2013
    Assignee: SemEquip, Inc.
    Inventors: Thomas N. Horsky, Robert W. Milgate, III, George P. Sacco, Jr., Dale Conrad Jacobson, Wade Allen Krull
  • Patent number: 8368012
    Abstract: Charged spray droplets are guided in a pseudopotential distribution generated by audio frequency voltages at electrodes of a guiding device, focusing the spray droplets toward the axis. An axial electric field profile and an axial flow profile of a drying gas in the guiding device allow the drift of different-sized droplets to be controlled in the longitudinal direction of the guiding device, so that the droplets are roughly equal in size when they leave the guiding device and finally dry up shortly after leaving. As a result, the ions are formed in a relatively small spatial region. Electrostatic potentials guide the analyte ions from this small spatial region to the entrance aperture of the inlet capillary; during this process, very light ions, especially protons and water-proton complexes, can be filtered out by a mobility filter.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: February 5, 2013
    Assignee: Bruker Daltonik GmbH
    Inventors: Evgenij Nikolaev, Jochen Franzen
  • Publication number: 20130026917
    Abstract: A Hall effect thruster with an annular discharge channel that includes inner and outer sidewall electrodes located at an axial position that is downstream from the anode. The Hall effect thruster may also include shielding elements configured to shield the inner and outer sidewall electrodes from electrons in the annular discharge channel. The shielding elements may be magnetic shielding elements.
    Type: Application
    Filed: July 27, 2012
    Publication date: January 31, 2013
    Inventors: Mitchell L.R. Walker, Kunning Gabriel Xu
  • Publication number: 20130026921
    Abstract: Described herein is a method and apparatus for removing metal oxides on a surface of a component via electron attachment. In one embodiment, there is provided a field emission apparatus, wherein the electrons attach to at least a portion of the reducing gas to form a negatively charged atomic ions which removes metal oxides comprising: a cathode comprising an electrically conductive and comprising at least one or more protrusions having a high surface curvature, wherein the cathode is surrounded by a dielectric material which is then surrounded by an electrically conductive anode wherein the cathode and anode are each connected to an electrical voltage source, and the dielectric material between the cathode and anode is polarized to provide an electric field at one or more protrusions and thereby electrons from the cathode.
    Type: Application
    Filed: February 2, 2012
    Publication date: January 31, 2013
    Applicant: AIR PRODUCTS AND CHEMICALS, INC.
    Inventors: Chun Christine Dong, Russell A. Siminski
  • Patent number: 8362444
    Abstract: A patterned beam of radiation is projected onto a substrate. A reflective optical element is used to help form the radiation beam from radiation emitted from a plasma region of a plasma source. In the plasma source, a plasma current is generated in the plasma region. To reduce damage to the reflective optical element, a magnetic field is applied in the plasma region with at least a component directed along a direction of the plasma current. This axial magnetic field helps limit the collapse of the Z-pinch region of the plasma. By limiting the collapse, the number of fast ions emitted may be reduced.
    Type: Grant
    Filed: October 19, 2010
    Date of Patent: January 29, 2013
    Assignee: ASML Netherlands B.V.
    Inventors: Vladimir Vitalevitch Ivanov, Vadim Yevgenyevich Banine, Konstantin Nikolaevitch Koshelev
  • Publication number: 20130020940
    Abstract: Disclosed is a surge protection system for use with an ion source assembly. The system comprises a high voltage power source coupled in series with a thermionic diode and an ion source assembly. The high voltage power supply is enclosed in the pressure tank and drives the ion source assembly. The thermionic diode is comprised of an insulating tube disposed between the ion source assembly enclosure and the output of the high voltage power supply and makes use of existing ion source assembly components to limit damage to the power supply during arc failures of the ion source assembly.
    Type: Application
    Filed: July 21, 2011
    Publication date: January 24, 2013
    Applicant: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    Inventors: Klaus Becker, Klaus Petry, Piotr Lubicki
  • Publication number: 20130015767
    Abstract: Methods and systems to compensate for distortions created by dynamic voltage applied to an electron multiplier used in mass spectrometry. An electron multiplier has a cathode end accepting ion flow, an opposite emitter end and an interior surface. The electron multiplier produces an electron output from ions colliding with the interior surface. A variable power supply has a voltage output coupled to the cathode end and the emitter end of the electron multiplier. The voltage output changes dynamically to adjust the electron output from the electron multiplier. An anode is located in proximity to the electron multiplier. An electrometer is coupled to the anode in proximity to the electron multiplier to measure the current generated by the electron output. A low pass filter circuit is coupled to the emitter end to the ground of the electrometer to attenuate emitter voltage changes. A bias circuit is coupled to the emitter end to stabilize emitter to anode voltage difference.
    Type: Application
    Filed: July 15, 2011
    Publication date: January 17, 2013
    Applicant: Bruker Daltonics, Inc.
    Inventors: Urs Steiner, Roy P. Moeller, David Deford
  • Patent number: 8354657
    Abstract: In an extreme ultra violet light source apparatus of a laser produced plasma type, charged particles such as ions emitted from plasma are promptly ejected to the outside of a chamber. The apparatus includes a chamber, a target supply unit for supplying a target material into the chamber, a collector mirror for collecting extreme ultra violet light radiated from plasma generated by irradiating the target material with a laser beam to output the extreme ultra violet light, an electromagnet arranged outside of the chamber, and a charged particle collection mechanism provided on at least one of two surfaces of the chamber to which lines of magnetic force generated by the electromagnet extend.
    Type: Grant
    Filed: March 14, 2011
    Date of Patent: January 15, 2013
    Assignees: Gigaphoton Inc., Osaka University
    Inventors: Georg Soumagne, Yoshifumi Ueno, Hiroshi Komori, Akira Sumitani, Katsunobu Nishihara, Young Gwang Kang, Masanori Nunami
  • Patent number: 8338796
    Abstract: An electron beam emitter includes an electron generator for generating electrons. The electron generator can have a housing containing at least one electron source for generating the electrons. The at least one electron source has a width. The electron generator housing can have an electron permeable region spaced from the at least one electron source for allowing extraction of the electrons from the electron generator housing. The electron permeable region can include a series of narrow elongate slots and ribs formed in the electron generator housing and extending laterally beyond the width of the at least one electron source. The electron permeable region can be configured and positioned relative to the at least one electron source for laterally spreading the electrons that are generated by the at least one electron source.
    Type: Grant
    Filed: May 20, 2009
    Date of Patent: December 25, 2012
    Assignee: Hitachi Zosen Corporation
    Inventors: Steven Raymond Walther, Michael L. Bufano, Gerald M. Friedman
  • Patent number: 8334510
    Abstract: An interface, a scanning electron microscope and a method for observing an object that is positioned in a non-vacuum environment. The method includes: generating an electron beam in the vacuum environment; scanning a region of the object with the electron beam while the object is located below an object holder; wherein the scanning comprises allowing the electron beam to pass through an aperture of an aperture array, pass through an ultra thin membrane that seals the aperture, and pass through the object holder; wherein the ultra thin membrane withstands a pressure difference between the vacuum environment and the non-vacuum environment; and detecting particles generated in response to an interaction between the electron beam and the object.
    Type: Grant
    Filed: July 2, 2009
    Date of Patent: December 18, 2012
    Assignee: B-Nano Ltd.
    Inventors: Dov Shachal, Rafi De Picciotto
  • Patent number: 8324574
    Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope operates in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.
    Type: Grant
    Filed: February 10, 2011
    Date of Patent: December 4, 2012
    Assignee: Mochii, Inc.
    Inventors: Christopher Su-Yan Own, Andrew Bleloch, Paul John Dabrowski
  • Patent number: 8324591
    Abstract: A method for generating a pulsed flux of energetic particles comprises the following steps: —initiating an ion plasma at a first electrode (111) in a vacuum chamber (110) and allowing said plasma to develop towards a second electrode (112) in said vacuum chamber, —at a time at which said ion plasma is in a transitional state with a space distribution of ions or electrons at a distance from said second electrode, applying between said electrodes a short high voltage pulse so as to accelerate said distributed ions or electrons towards said second electrode, whereby a high-energy flux of charged particles is generated while overcoming the space charge current limit of a conventional vacuum diode, and —generating said energetic particles at said second electrode (112). A particle source is also disclosed. Application in particular to ultra-short pulse neutron generation.
    Type: Grant
    Filed: July 25, 2007
    Date of Patent: December 4, 2012
    Assignee: Sage Innovations Inc.
    Inventor: Peter Choi
  • Patent number: 8320786
    Abstract: An image forming apparatus according to one embodiment of the present invention is an image forming apparatus that prints an image on a recording paper, and is provided with an ion generating means that is attached at an outer side of the image forming apparatus main unit, and generates and emits ions, and an emission direction varying means that varies an emission direction of ions from the ion generating means in response to whether the image forming apparatus is operating or in standby.
    Type: Grant
    Filed: January 12, 2010
    Date of Patent: November 27, 2012
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Junichi Kajiwara, Sae Hiroki, Hiroyuki Nagao
  • Patent number: 8304744
    Abstract: A closed drift ion source is provided, having an anode that serves as both the center magnetic pole and as the electrical anode. The anode has an insulating material cap that produces a closed drift region to further increase the electrical impedance of the source. The ion source can be configured as a round, conventional ion source for space thruster applications or as a long, linear ion source for uniformly treating large area substrates. A particularly useful implementation uses the present invention as an anode for a magnetron sputter process.
    Type: Grant
    Filed: October 19, 2007
    Date of Patent: November 6, 2012
    Assignee: General Plasma, Inc.
    Inventor: John Eric Madocks
  • Patent number: 8294120
    Abstract: The process of the present application differs substantially from the prior art, as it facilitates the deliberate extraction of electrons from atoms and molecules during the production of positive ions, as compared with occasionally and accidentally knocking them away. It is an energy efficient process for the extraction and capture of electrons, production of positive ions and negative ions, the construction of molecules and the selective decomposition of molecules. These results are accomplished by the forcible extraction of electrons from the object molecules and atoms. The present process is superior to any other intended for the production of positive ions and the composition and the decomposition of molecules, because it not only simplifies the process, but it also speeds the process, allowing a continuous stream or beam of particles to be so converted to positive ions.
    Type: Grant
    Filed: July 26, 2010
    Date of Patent: October 23, 2012
    Inventor: Eugene B. Pamfiloff
  • Patent number: 8293173
    Abstract: Improved electron beam sterilization apparatus and shielding techniques for use in are provided. A controller modulates an electron beam when sterilizing an interior to an object to ensure that adequate dose is received. Sterilization carousels are configured with input/discharge feeds to reduce the possibility of humans being exposed to dangerous levels of radiation. The system reduces the amount of shielding required to thereby lower cost of installation.
    Type: Grant
    Filed: July 22, 2010
    Date of Patent: October 23, 2012
    Assignee: Hitachi Zosen Corporation
    Inventors: Michael Lawrence Bufano, Steven Raymond Walther, Peter F. Hays, William Frederick Thomson, Arthur Wayne Sommerstein, Gerald Martin Friedman, P. Michael Fletcher, Stephen Whittaker Into, Anne Testoni, Brian S. Phillips
  • Patent number: 8294115
    Abstract: A linear plasma electron source is provided. The linear plasma electron source includes a housing acting as a first electrode, the housing having side walls a slit opening in the housing for trespassing of a electron beam, the slit opening defining a length direction of the source, a second electrode being arranged within the housing and having a first side facing the slit opening, the first side being spaced from the slit opening by a first distance, wherein the length of the electron source in the length direction is at least 5 times the first distance, and at least one gas supply for providing a gas into the housing.
    Type: Grant
    Filed: November 17, 2008
    Date of Patent: October 23, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Guenter Klemm, Volker Hacker, Hans-Georg Lotz
  • Patent number: 8288950
    Abstract: An apparatus and method for controlling electron flow within a plasma to produce a controlled electron beam is provided. A plasma is formed between a cathode and an acceleration anode. A control anode is connected to the plasma and to the acceleration anode via a switch. If the switch is open, the ions from the plasma flow to the cathode and plasma electrons flow to the acceleration anode. With the acceleration anode suitably transparent and negatively biased with a DC high voltage source, the electrons flowing from the plasma are accelerated to form an electron beam. If the switch is closed, the ions still flow to the cathode but the electrons flow to the control anode rather than the acceleration anode. Consequently, the electron beam is turned off, but the plasma is unaffected. By controlling the opening and closing of the switch, a controlled pulsed electron beam can be generated.
    Type: Grant
    Filed: October 6, 2010
    Date of Patent: October 16, 2012
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventors: Scott G. Walton, Christopher D. Cothran, Richard F. Fernsler, Robert A. Meger, William E. Amatucci
  • Patent number: 8281738
    Abstract: The present invention relates to ion sources (14) comprising a cathode (20) and a counter-cathode (44) that are suitable for ion implanters (10). Typically, the ion source is held under vacuum and produces ions using a plasma generated within an arc chamber (16). Plasma ions are extracted from the arc chamber and subsequently implanted in a semiconductor wafer (12). The ion source according to the present invention further comprises a cathode (40) arranged to emit electrons into the arc chamber; an electrode (44) positioned in the arc chamber such that electrons emitted by the cathode are incident thereon; one or more voltage potential sources (76) arranged to bias the electrode; and a voltage potential adjuster (82) operable to switch between the voltage potential source biasing the electrode positively thereby to act as an anode and the voltage potential source biasing the electrode negatively thereby to act as a counter-cathode.
    Type: Grant
    Filed: March 22, 2006
    Date of Patent: October 9, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Andrew Stephen Devaney, Richard David Goldberg, Christopher Burgess, David George Armour, David Kirkwood
  • Patent number: 8274228
    Abstract: A flow tube apparatus may include a flow tube having a first opening and a second opening, a corona electrode provided in the flow tube, a collecting electrode provided in the flow tube, and at least one focusing electrode provided in the flow tube to guide ions and thereby provide an ionic wind. In at least one embodiment, the flow tube apparatus may be provided in an electronic apparatus to provide an air flow.
    Type: Grant
    Filed: December 24, 2009
    Date of Patent: September 25, 2012
    Assignee: Intel Corporation
    Inventors: Mark MacDonald, Rajiv K. Mongia, David B. Go
  • Patent number: 8274225
    Abstract: An image display apparatus according to the present invention comprises a plurality of electron emitting devices having an electron emitting portion provided between a cathode electrode and a gate electrode; a cathode wiring connected to the cathode electrode; and a gate wiring connected to the gate electrode and having a resistance higher than the resistance of the cathode wiring, wherein an impedance element having a resistance value of Ry and an electrostatic capacitance of Cy is connected to between the cathode wiring and the cathode electrode, a resistive element having a resistance value of Rx is connected to between the gate wiring and the gate electrode, and |Ry/(1+j?RyCy)|<Rx and Ry>Rx are satisfied, where ? is 100 MHz.
    Type: Grant
    Filed: April 5, 2010
    Date of Patent: September 25, 2012
    Assignee: Canon Kabushiki Kaisha
    Inventor: Norihiro Suzuki
  • Patent number: 8263943
    Abstract: Provided is an ion beam device provided with a gas electric field ionization ion source which can prevent an emitter tip from vibrating in a non-contact manner. The gas electric field ionization ion source is comprised of an emitter tip (21) for generating ions; an emitter base mount (64) for supporting the emitter tip; an ionizing chamber which has an extraction electrode (24) opposed to the emitter tip and which is configured so as to surround the emitter tip (21); and a gas supply tube (25) for supplying gas to the vicinity of the emitter tip. The emitter base mount and a vacuum container magnetically interact with each other.
    Type: Grant
    Filed: January 8, 2010
    Date of Patent: September 11, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Noriaki Arai, Tohru Ishitani
  • Patent number: 8247784
    Abstract: A novel ion source for ambient mass spectrometry (switched ferroelectric plasma ionizer or “SwiFerr”), which utilizes the ambient pressure plasma resulting from a sample of barium titanate [001] whose polarization is switched by an audio frequency electric field. High yields of both anions and cations are produced by the source and detected using an ion trap mass spectrometer. Protonated amines and deprotonated volatile acid species, respectively, are detected in the observed mass spectra. Aerodynamic sampling is employed to analyze powders of drug tablets of loperamide and ibuprofen. A peak corresponding to the active pharmaceutical ingredient for each drug is observed in the mass spectra. Pyridine is detected at concentrations in the low part-per-million range in air. The low power consumption of the source is consistent with incorporation into field portable instrumentation for detection of hazardous materials and trace substances in a variety of different applications.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: August 21, 2012
    Assignee: California Institute of Technology
    Inventors: Evan L. Neidholdt, Jesse L. Beauchamp
  • Patent number: 8242696
    Abstract: Various apparatuses and methods for a vacuum electronic device are disclosed herein. In one embodiment, a vacuum electronic device includes a vacuum housing, an array of slow wave structures inside the vacuum housing sharing a common electron beam tunnel, an electron beam input port at a first end of the common electron beam tunnel, and an electron beam output port at a second end of the common electron beam tunnel.
    Type: Grant
    Filed: May 6, 2010
    Date of Patent: August 14, 2012
    Inventors: Ruey-Jen Hwu, Laurence P. Sadwick, Jishi Ren
  • Publication number: 20120199171
    Abstract: According to one aspect, a system generates electricity from a temperature differential using a thermoelectric module. At least one side of the temperature differential is supplied by a thermal element having a fluid flowing through it. The fluid contains suspended nanoparticles to enhance the transfer of heat between the fluid containing the nanoparticles and the thermal element, as compared with a similar fluid not containing the nanoparticles. The nanoparticles may include metal ions, for example silver ions, copper ions, or both. The system may further include an ion generator for generating the ions within the fluid.
    Type: Application
    Filed: February 25, 2011
    Publication date: August 9, 2012
    Applicant: Watts Thermoelectric, LLC
    Inventor: Phillip C. Watts
  • Patent number: 8237134
    Abstract: An ion implantation system and process, in which the performance and lifetime of the ion source of the ion implantation system are enhanced, by utilizing isotopically enriched dopant materials, or by utilizing dopant materials with supplemental gas(es) effective to provide such enhancement.
    Type: Grant
    Filed: February 21, 2012
    Date of Patent: August 7, 2012
    Assignee: Advanced Technology Materials, Inc.
    Inventors: Robert Kaim, Joseph D. Sweeney, Anthony M. Avila, Richard S. Ray
  • Patent number: 8217565
    Abstract: A stable cold field electron emitter is produced by forming a coating on an emitter base material. The coating protects the emitter from the adsorption of residual gases and from the impact of ions, so that the cold field emitter exhibits short term and long term stability at relatively high pressures and reasonable angular electron emission.
    Type: Grant
    Filed: January 10, 2011
    Date of Patent: July 10, 2012
    Assignee: FEI Company
    Inventors: Theodore Carl Tessner, II, Gregory A. Schwind, Lynwood W. Swanson
  • Patent number: 8217343
    Abstract: A device includes a first substrate having a principal surface having a plurality of sample sites having a corresponding sample; a second substrate having a principal surface facing and spaced apart from the principal surface of the first substrate, the second substrate having a plurality of ultraviolet emission sites corresponding to the sample sites of the first substrate, each of the ultraviolet emission sites being spaced apart from and facing a corresponding one of the sample sites of the first substrate, each of the ultraviolet emission sites being configured to emit ultraviolet light to a corresponding one of the sample sites on the first substrate, and to ionize at least a portion of a sample provided at each sample site; and an ion extraction device configured to extract ions from a gap between the first substrate and the structure.
    Type: Grant
    Filed: January 26, 2010
    Date of Patent: July 10, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: James Edward Cooley, Viorica Lopez-Avila, Randall Urdahl
  • Publication number: 20120167962
    Abstract: A method of fabricating a film. The method comprises directing onto a substrate a pulsed supersonic beam of a molecular precursor characterized by kinetic energy of at least 1 eV per molecule, such that non-volatile species of molecules of the precursor are deposited on the substrate.
    Type: Application
    Filed: June 30, 2010
    Publication date: July 5, 2012
    Applicant: RAMOT AT TEL-AVIV UNIVERSITY LTD.
    Inventors: Uzi Even, Nachum Lavie, Fernando Patolsky
  • Patent number: 8205428
    Abstract: A standard 4-pole electric motor stator with capacitive plates in-line with the magnetic poles, but electrically 90° out of phase, produces two Lorentz force geometries 90° out of phase with each other (i.e., vertical, horizontal). An alternating source electrically rotates this pair of Lorentz geometries producing a propagating electromagnetic wave at the source frequency within the vacant internal cavity. Any charged particle within the cavity and along its axis will be accelerated or decelerated from an initial velocity via the Lorentz force. The rotating geometry provides for the coupling of the Lorentz force through a current loop and diamagnetism, providing acceleration and deceleration of non-charged particles. The force coupling is dependent upon the material's electromagnetic properties, the frequencies generated by the capacitive stator, and the velocity of the particles within the capacitive stator's influence.
    Type: Grant
    Filed: February 5, 2009
    Date of Patent: June 26, 2012
    Assignee: Lockheed Martin Corporation
    Inventor: Dale W. Boren
  • Patent number: 8188445
    Abstract: An ion source includes an arc chamber having an extraction aperture, and a plasma sheath modulator positioned in the arc chamber. The plasma sheath modulator is configured to control a shape of a boundary between a plasma and a plasma sheath proximate the extraction aperture, wherein the plasma sheath modulator includes a semiconductor. A well focused ion beam having a high current density can be generated by the ion source. A high current density ion beam can improve the throughput of an associated process. The emittance of the ion beam can also be controlled.
    Type: Grant
    Filed: August 2, 2010
    Date of Patent: May 29, 2012
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Ludovic Godet, Timothy J. Miller, Joseph C. Olson, Vikram Singh
  • Patent number: 8168957
    Abstract: The present invention provides an inductively coupled, magnetically enhanced ion beam source, suitable to be used in conjunction with probe-forming optics to produce an ion beam without kinetic energy oscillations induced by the source.
    Type: Grant
    Filed: February 11, 2010
    Date of Patent: May 1, 2012
    Assignee: FEI Company
    Inventors: John Keller, Noel Smith, Roderick Boswell, Lawrence Scipioni, Christine Charles, Orson Sutherland
  • Patent number: 8153993
    Abstract: The present invention relates to a front plate for an ion source that is suitable for an ion implanter. The front plate according to the invention comprises obverse and reverse sides, an exit aperture for allowing egress of ions from the ion source that extends substantially straight through the front plate between the obverse and reverse sides, and a slot penetrating through the front plate from obverse side to reverse side at a slant for at least part of its depth, the slot extending from a side of the front plate to join the exit aperture. The slot is slanted to occlude line of sight into the ion source when viewed from in front, yet provides an expansion gap.
    Type: Grant
    Filed: February 1, 2010
    Date of Patent: April 10, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Richard D. Goldberg, Christopher Burgess
  • Patent number: 8154001
    Abstract: An ion radiation therapy machine provides a steerable beam for treating a tumor within the patient where the exposure spot of the beam is controlled in width and/or length to effect a flexible trade-off between treatment speed, accuracy, and uniformity.
    Type: Grant
    Filed: June 10, 2010
    Date of Patent: April 10, 2012
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Ryan Thomas Flynn, Thomas R. Mackie
  • Patent number: 8154210
    Abstract: An ion source is disclosed incorporating various aspects of the invention including i) a vaporizer, ii) a vaporizer valve, iii) a gas feed, iv) an ionization chamber, v) an electron gun, vi) a cooled mounting frame, and vii) an ion exit aperture. The ion source includes means for introducing gaseous feed material into the ionization chamber, means for vaporizing solid feed materials and introducing their vapors into the ionization chamber, means for ionizing the introduced gaseous feed materials within the ionization chamber, and means for extracting the ions thus produced from an ion exit aperture adjacent to the ionization region. In addition, means for accelerating and focusing the exiting ions are provided. The vaporizer, vaporizer valve, gas feed, ionization chamber, electron gun, cooled mounting frame, and ion exit aperture are all integrated into a single assembly in preferred embodiments of the novel ion source.
    Type: Grant
    Filed: December 18, 2009
    Date of Patent: April 10, 2012
    Assignee: SemEquip, Inc.
    Inventors: Thomas Neil Horsky, John Noel Williams
  • Patent number: 8142607
    Abstract: An ion source, capable of generating high density wide ribbon ion beam, utilizing one or more helicon plasma sources is disclosed. In addition to the helicon plasma source(s), the ion source also includes a diffusion chamber. The diffusion chamber has an extraction aperture oriented along the same axis as the dielectric cylinder of the helicon plasma source. In one embodiment, dual helicon plasma sources, located on opposing ends of the diffusion chamber are used to create a more uniform extracted ion beam. In a further embodiment, a multicusp magnetic field is used to further improve the uniformity of the extracted ion beam.
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: March 27, 2012
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Costel Biloiu, Alexander Perel, Jay Scheuer
  • Patent number: 8143788
    Abstract: An apparatus and method for achieving an efficient central cathode in a Hall effect thruster is disclosed. A hollow insert disposed inside the end of a hollow conductive cathode comprises a rare-earth element and energized to emit electrons from an inner surface. The cathode employs an end opening having an area at least as large as the internal cross sectional area of the rare earth insert to enhance throughput from the cathode end. In addition, the cathode employs a high aspect ratio geometry based on the cathode length to width which mitigates heat transfer from the end. A gas flow through the cathode and insert may be impinged by the emitted electrons to yield a plasma. One or more optional auxiliary gas feeds may also be employed between the cathode and keeper wall and external to the keeper near the outlet.
    Type: Grant
    Filed: August 30, 2008
    Date of Patent: March 27, 2012
    Assignee: California Institute of Technology
    Inventors: Richard R. Hofer, Dan M. Goebel, Ronnie M. Watkins
  • Patent number: 8143590
    Abstract: An ion source apparatus has an ion source assembly and a neutralizer. The ion source assembly has a body, a heat-dissipating device, an anode chunk and a gas distributor. The heat-dissipating device has a thermal transfer plate and a first thermal side sheet. The thermal transfer plate has a top, a protrusion and an annular disrupting recess. The protrusion is formed at the top of the thermal transfer plate. The disrupting recess is radially formed around the protrusion. The first thermal side sheet surrounds the protrusion. The gas distributor is mounted securely in the protrusion. Because the protrusion is located between the gas distributor and the first thermal side sheet and the disrupting recess is radially formed around the protrusion, accumulated ions, molecules and deposition film particles are longitudinally disrupted and do not form a short circuit between the gas distributor and the first thermal side sheet.
    Type: Grant
    Filed: July 16, 2010
    Date of Patent: March 27, 2012
    Inventors: Tsai-Cheng Wang, Chin-Chung Yang, An-Ting Hsiao, Yu-Li Tsai
  • Publication number: 20120062118
    Abstract: A discharge apparatus (1) including a discharge electrode used to generate charged water microparticles or ions. A discharge passage (5) discharges the charged water microparticles or ions into a discharge target zone (3). The discharge passage (5) includes an upstream end (5a) that draws in the charged water microparticles or ions. Two or more branching passages (6) located downstream of the upstream end (5a) each have a discharge port (4) in communication with the discharge target zone (3).
    Type: Application
    Filed: June 22, 2010
    Publication date: March 15, 2012
    Applicant: Panasonic Electric Works Co., LTD.
    Inventors: Shinjirou Seto, Akihide Sugawa
  • Patent number: 8134130
    Abstract: An ion source may include first, second, and third electrodes. The first electrode may be a repeller having a V-shaped groove. The second electrode may be an electron emitter filament disposed adjacent the base of the V-shaped groove. The third electrode may be an anode that defines an enclosed volume with an aperture formed therein adjacent the electron emitter filament. A potential of the first electrode may be less than a potential of the second electrode, and the potential of the second electrode may be less than a potential of the third electrode. A fourth electrode that is disposed between the electron emitter filament and the anode may be used to produce a more collimated electron beam.
    Type: Grant
    Filed: July 19, 2010
    Date of Patent: March 13, 2012
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Federico A. Herrero, Patrick A. Roman