Calibration Patents (Class 324/202)
  • Patent number: 6885190
    Abstract: A method for measuring conductance of a sample using an eddy current probe with a sensing coil. The method includes N repetitions of measuring first and second voltage pairs including in-phase and quadrature components of an induced AC voltage in the sensing coil, calibrating the first signal based on the measured second signal at a different separation from the sample and reference material, determining a conductance function relating conductance with location along the selected curve, processing the calibrated first voltage pairs to generate a lift-off curve, determining an intersection voltage pair representing intersection of the lift-off curve with a selected curve, and determining the conductance of the sample from the intersection voltage pair and the conductance function.
    Type: Grant
    Filed: July 21, 2003
    Date of Patent: April 26, 2005
    Assignee: KLA-Tencor Corporation
    Inventors: Kurt R. Lehman, Shing M. Lee, Walter Halmer Johnson, III, John Fielden
  • Patent number: 6876195
    Abstract: A process for measuring the thickness of a layer of oxide on a rod cladding in a fuel assembly comprising a bundle of rods parallel to each other and held in a framework comprising spacer grids for transversely holding rods distributed in an axial direction of the bundle.
    Type: Grant
    Filed: December 19, 2001
    Date of Patent: April 5, 2005
    Assignee: Framatome ANP
    Inventors: Jérôme Pigelet, Michel Pain
  • Patent number: 6844720
    Abstract: A calibration apparatus for calibrating a linear variable differential transformer (LVDT) having an armature positioned in au LVDT armature orifice, and the armature able to move along an axis of movement. The calibration apparatus includes a heating mechanism with an internal chamber, a temperature measuring mechanism for measuring the temperature of the LVDT, a fixture mechanism with an internal chamber for at least partially accepting the LVDT and for securing the LVDT within the heating mechanism internal chamber, a moving mechanism for moving the armature, a position measurement mechanism for measuring the position of the armature, and an output voltage measurement mechanism. A method for calibrating an LVDT, including the steps of: powering the LVDT; heating the LVDT to a desired temperature; measuring the position of the armature with respect to the armature orifice; and measuring the output voltage of the LVDT.
    Type: Grant
    Filed: August 12, 2002
    Date of Patent: January 18, 2005
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Robert J. Pokrywka
  • Publication number: 20040251897
    Abstract: A magnetometer for measuring a magnetic field, comprising a fluxgate sensor with at least one ferromagnetic core, a primary, electrically conducting coil arranged around the core for periodical magnetisation of the core into magnetic saturation by an alternating electric current through the primary coil, and a secondary, electrically conducting coil arranged around the at least one ferromagnetic core for producing a measurable electromotive force as a response signal, wherein the magnetometer has means for rotating the at least one core of the fluxgate sensor with a steady rotation inside the coils during the measurement of the magnetic field.
    Type: Application
    Filed: June 16, 2003
    Publication date: December 16, 2004
    Applicant: DanMag ApS
    Inventor: Erik Horsdal Pedersen
  • Publication number: 20040239322
    Abstract: In order to create a circuit configuration for a gradiometric current sensor with a bridge circuit in the form of a Wheatstone bridge for measuring gradients of the magnetic field strength of a current-carrying conductor, with four magnetoresistive resistors, two of which resistors form a sub-bridge in each case, while the sub-bridges are arranged symmetrically in relation to sub-conductors of the current-carrying conductor, and with a compensating circuit associated with the bridge circuit, which compensating circuit comprises compensating conductors associated with the magnetoresistive resistors, to which compensating conductors a compensating current can be applied, by means of which circuit configuration mounting tolerances can be compensated in a simple manner, it is provided that the sub-bridges (22, 24) can each have a separate compensating current (Icomp1, Icomp2) applied to them.
    Type: Application
    Filed: March 10, 2004
    Publication date: December 2, 2004
    Inventor: Reinhard Buchhold
  • Patent number: 6822171
    Abstract: An article handling system and method comprising a flow path along which articles travel and a metal detection system to detect the passage of metal items along the flow path. The system has a metal detector test system to support a metal test piece and positively move it along the flow path, and a metal detector to detect the metal test piece.
    Type: Grant
    Filed: May 25, 2001
    Date of Patent: November 23, 2004
    Assignee: Ishida Co., Ltd.
    Inventors: Robert Bennett, Masahiko Muramiya, Michihiko Yonetsu, Takumi Kawamura, Ryoichi Sato
  • Publication number: 20040217756
    Abstract: A modified hybrid Hall effect device is provided which is the combination of a conventional Hall effect device and a second Hall effect device having a Hall plate coupled to a ferromagnetic layer. The hybrid Hall effect device can be used to determine the independent magnetic field vector components comprising a vector magnetic field, such as for determining the {circumflex over (x)} and the {circumflex over (z)} components of a magnetic field, or for measuring the total magnitude of a vector magnetic field of any orientation. The modified Hall Effect device can be adapted for use as a magnetic field sensor for the detection of macroscopic objects that have associated magnetic fields, or for microscopic objects that have been tagged by microscopic magnetic particles.
    Type: Application
    Filed: May 21, 2004
    Publication date: November 4, 2004
    Inventors: Mark B. Johnson, Michael Miller, Brian Bennett
  • Publication number: 20040207393
    Abstract: A lifecycle analyzer includes a heating element for heating a plurality of magnetoresistive (MR) elements, which maybe, e.g., in bar form. At one location the MR elements are in contact with a stress probe card for applying a bias voltage or current stress. The MR elements are moved to a separate location, where there is a test probe card and magnetic field generator for testing the MR elements after being stressed. In one embodiment, a subset of the plurality of MR elements is tested at a time. The lifecycle analyzer includes an in-situ abrasive element that is used to abrade the probe pins of the stress probe card to remove oxidation that results from extended contact with the heated MR elements.
    Type: Application
    Filed: April 17, 2003
    Publication date: October 21, 2004
    Inventors: Henry Patland, Wade A. Ogle
  • Publication number: 20040207400
    Abstract: A magnetic-sensing apparatus and methods of making and using thereof are disclosed. The sensing apparatus may have one or more magneto-resistive-sensing elements, one ore more reorientation elements for adjusting the magneto-resistive-sensing elements, and semiconductor circuitry having driver circuitry for controlling the reorientation elements. The magneto-resistive-sensing elements, reorientation elements and semiconductor circuitry may be disposed in single package and/or monolithically formed on a single chip. Alternatively, some of the semiconductor circuitry may be monolithically formed on a first chip with the magneto-resistive-sensing elements, while a second portion of the semiconductor circuitry may be formed on a second chip. The first and second chips may be placed in close proximity and electrically connected together. Alternatively the chips may have no intentional electrical interaction.
    Type: Application
    Filed: January 8, 2004
    Publication date: October 21, 2004
    Applicant: Honeywell International Inc.
    Inventors: William F. Witcraft, Mark D. Amundson
  • Publication number: 20040207397
    Abstract: The invention relates to a device for setting an operating point of a magnetic field sensor having a periodic characteristic, in particular for a device for detecting a magnetic field and/or flux, having a SQUID as magnetic field sensor and a control unit which is connected downstream of the SQUID, has a control time constant (t) and has a feedback loop which acts on the SQUID and is designed such that it is active about a number of operating points of the SQUID, where flux quantum pump means are provided which are assigned to the SQUID, have a signal generation unit for generating a control and/or regulation signal for the SQUID and are designed such that, in order to pump at least one flux quantum into and out of the SQUID, a signal form of the control and/or regulation signal, generated by the signal generation unit, is different and, referred to a rising and a falling edge of a signal form, is unsymmetrical, where in each case only one of the edges of a signal form is short referred to the control time co
    Type: Application
    Filed: February 19, 2004
    Publication date: October 21, 2004
    Inventors: Christoph Ludwig, Wolfgang Ludwig
  • Publication number: 20040201379
    Abstract: The magnetometer includes a magnetic core (1) with at least one branch (2, 3), at least one exciting coil (4, 5) and one take-up coil (10) sensitive to ambient fields thanks to the excitation field (B). An additional magnetic field, to advantage perpendicular to the previous ones, is added to eliminate very low frequency noises, without it being measured.
    Type: Application
    Filed: January 26, 2004
    Publication date: October 14, 2004
    Inventors: Bernard Guilhamat, Jean-Michel Leger
  • Patent number: 6802202
    Abstract: An accelerator pedal is positioned at a kickdown position. Then, an output value of a measurement device of an accelerator pedal position sensor is measured. Thereafter, the measured output value of the measurement device is stored in a correction output value storage of the accelerator pedal position sensor along with a corresponding correction value, which is used to correct the measured output value of the measurement device. A couple of fully opened position stop members is provided and is engaged with the accelerator pedal when the accelerator pedal is rotated to a fully opened position. Furthermore, a couple of fully closed position stop members is provided and is engaged with the accelerator pedal when the accelerator pedal is rotated to a fully closed position.
    Type: Grant
    Filed: July 22, 2002
    Date of Patent: October 12, 2004
    Assignee: Denso Corporation
    Inventors: Yasunari Kato, Masahiro Makino
  • Publication number: 20040189292
    Abstract: A magnetic sensor package having a biasing mechanism involving a coil-generated, resistor-controlled magnetic field for providing a desired biasing effect. In a preferred illustrated embodiment, the package broadly comprises a substrate; a magnetic sensor element; a biasing mechanism, including a coil and a first resistance element; an amplification mechanism; a filter capacitor element; and an encapsulant. The sensor is positioned within the coil. A current applied to the coil produces a biasing magnetic field. The biasing magnetic field is controlled by selecting a resistance value for the first resistance element which achieves the desired biasing effect. The first resistance element preferably includes a plurality of selectable resistors, the selection of one or more of which sets the resistance value.
    Type: Application
    Filed: March 25, 2003
    Publication date: September 30, 2004
    Inventor: David R. Kautz
  • Patent number: 6798193
    Abstract: A calibrated, low-profile magnetic sensor and method for forming such a sensor are described herein. Generally, a magnetic sensing device is formed within a housing, wherein the magnetic sensing device comprises at least one magnet. The magnetic sensor includes a compact integrated circuit package such as, for example, a small outline integrated circuit package (SOIC). A magnetic sensing element is generally mounted to the compact integrated circuit package. The magnetic sensing device can be configured to additionally incorporate a printed circuit board (PCB) having a hole formed therein such that the compact integrated circuit package can be surface mounted off-center on the printed circuit board, so that the hole can be located within the printed circuit board to match a shape of the magnet, allowing the magnet to pass through the circuit board adjacent to the SOIC to complete the magnetic circuit.
    Type: Grant
    Filed: August 14, 2002
    Date of Patent: September 28, 2004
    Assignee: Honeywell International Inc.
    Inventors: Mike W. Zimmerman, Lamar F. Ricks, Curtis B. Johnson, Joel D. Stolfus, Douglas L. Mueller
  • Publication number: 20040174157
    Abstract: A process control method is described which uses measurements from magnetic field sensors to monitor the condition of material, such as from a heat treatment process. The sensors can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. The sensors can be exposed to the same process conditions as the material, such as elevated temperatures, or the shielding layers can be placed between the test material and the sensors to reduce sensor exposure to the processing conditions. Additional property measurements, such as sensor lift-off, can be used to ensure proper sensors operation.
    Type: Application
    Filed: January 21, 2004
    Publication date: September 9, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
  • Patent number: 6788048
    Abstract: A position sensor including: a reduction gear train having an input gear and an output gear. The input gear is configured for coupling to an output shaft of a drive motor for driving a vehicle seat on an associated seat track, and a magnet disposed on the output gear for rotation therewith. A Hall Effect sensor is disposed adjacent the magnet for providing a sensor output signal in response to rotation of the magnet. A lock out mechanism for a position sensor, a method of sensing the position of a vehicle seat, and a method of calibrating a vehicle seat position sensor are also provided.
    Type: Grant
    Filed: October 10, 2002
    Date of Patent: September 7, 2004
    Assignee: Stoneridge Control Devices Inc.
    Inventors: Kayvan Hedayat, Gerald Tromblee, Norman Poirier
  • Publication number: 20040164734
    Abstract: A magnetic sensor system and a method for installing magnetic sensors for detecting metal objects that allows ease of manipulation, control and access. A carrier conduit is used to position a magnetic sensor in an outer conduit. The outer conduit may be disposed beneath a surface where objects to be detected may be positioned. Alternatively, a conduit having multiple channels may be placed in a pathway. Magnetic sensors may be placed in the channels and a top placed over the conduit. Multiple embodiments for orienting the magnetic sensor systems are provided.
    Type: Application
    Filed: February 20, 2003
    Publication date: August 26, 2004
    Applicant: Sensonix, Inc.
    Inventors: Robert T. Fayfield, Charles R. Dolezalek
  • Publication number: 20040149004
    Abstract: A method and apparatus is disclosed for improving the accuracy of directional surveys using magnetometers and accelerometers. The method corrects errors in bias, scale-factor, misalignment of cross-axial magnetometers, and bias or scale-factor of axial magnetometer by requiring the magnitude of measured cross-axial magnetic field to be as constant as possible over several tool face angles at a survey point in a wellbore and the magnitude of the measured total magnetic field and dip angle equal to the reference values, respectively. The axial component of the measured magnetic field is also determined. The method also corrects accelerometers similarly. The calibration parameters obtained at one survey point are applied to measurements at other survey points to improve the accuracy of surveys and the efficiency of drilling operations.
    Type: Application
    Filed: February 4, 2003
    Publication date: August 5, 2004
    Inventor: Jian-Qun Wu
  • Publication number: 20040113609
    Abstract: Techniques for calibrating an electromagnetic logging tool equipped with a plurality of antennas, with at least one antenna having its axis at an angle with respect to a tool axis, include disposing a test loop about the tool such that an axis of the tool and a plane on which the test loop lies form a tilt angle that is between about 0 and 90 degrees. An induced signal is measured at one of the antennas by energizing another of the antennas. Embodiments analyze the induced signal corresponding to a max or min extrema associated with a coupling effect due to the test loop. In other embodiments a corrected signal is compared with a calculated signal.
    Type: Application
    Filed: July 10, 2003
    Publication date: June 17, 2004
    Inventors: Dean M. Homan, Richard A. Rosthal, Gerald N. Minerbo, Thomas D. Barber
  • Publication number: 20040104725
    Abstract: A method and apparatus are provided for measuring a thickness of a nonconductive coating disposed over portions of first and second conductive surfaces that intersect at an intersection angle. The apparatus is a thickness measurement gauge having an eddy current sensor. The thickness measurement gauge includes an eddy current sensor and electronic analyzer. The thickness gauge may be provided with a pressure enclosure. A method of calibrating a thickness measurement gauge and a calibration stand are also provided. The calibration stand has third and fourth conductive surfaces intersecting at the intersection angle. The conductivities of the third and fourth surfaces correspond to the conductivities of the first and second surfaces.
    Type: Application
    Filed: December 2, 2002
    Publication date: June 3, 2004
    Applicant: The Boeing Company
    Inventors: Edward G. Sergoyan, Ronald A. Bradley
  • Patent number: 6734664
    Abstract: The present invention relates to a compliant laminar eddy current sensitivity standard which comprises a sheet of nonconductive, nonmagnetic material having at least one strand of highly conductive metallic material embedded in the sheet and an adhesive layer attached to a surface of the nonconductive, nonmagnetic material to allow the standard to be adhered to a surface of a part to be inspected. A method using the compliant laminar eddy current sensitivity standard is also described.
    Type: Grant
    Filed: July 30, 2001
    Date of Patent: May 11, 2004
    Assignee: United Technologies Corporation
    Inventors: David A. Bryson, Chris Vargas
  • Patent number: 6724184
    Abstract: A device and a method for determining a magnetic field with respect to its intensity and direction at at least one detection location, and uses a first arrangement for superimposing an auxiliary magnetic field, known at least in intensity, on the magnetic field, and a second arrangement for measuring at least the direction of the magnetic field resulting from the superimposition of the magnetic field to be determined and of the auxiliary magnetic field at the detection location. The magnetic field is determined at the detection location in that the resultant magnetic field produced by the magnetic field to be determined and the auxiliary magnetic field is determined with respect to its direction for at least two different auxiliary magnetic fields; and the magnetic field to be determined is calculated therefrom. The method is especially suited for determining the intensity and direction of a magnetic field in the immediate vicinity of the surface of a magnet.
    Type: Grant
    Filed: November 5, 2001
    Date of Patent: April 20, 2004
    Assignee: Robert Bosch GmbH
    Inventors: Klaus Marx, Hartmut Kittel
  • Patent number: 6703830
    Abstract: A tunable magnetic device which includes a permanent magnet in the shape of a ring, an inner aperture, a tuning member, and a field sensor secured to the permanent magnet. The tuning member may be a ferrous or magnetic material and may be secured to a non-magnetic tuning device. The inner aperture is preferably small compared to the permanent magnet. The magnetic device provides a magnetic field that is sensitive to the proximity of a ferrous object and provides a tunable mechanism to locally balance the magnetic field where the field sensor is located.
    Type: Grant
    Filed: February 18, 2002
    Date of Patent: March 9, 2004
    Assignee: Phoenix America, Inc.
    Inventor: John M. Kaste
  • Patent number: 6696830
    Abstract: A method for inspecting a metallic component comprises providing an inspection standard having an eddy current signature substantially similar to an eddy current signature of the metallic component, wherein the inspection standard body is fabricated from a non-metallic material. The method also comprises inspecting the metallic component with an eddy current probe with reference to the inspection standard.
    Type: Grant
    Filed: February 5, 2002
    Date of Patent: February 24, 2004
    Assignee: General Electric Company
    Inventors: Dominick A. Casarcia, Douglas E. Ingram, William S. McKnight
  • Publication number: 20040021461
    Abstract: Methods and apparatus are described for the inspection of materials and the detection and characterization of hidden objects, features, or flaws. Sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.
    Type: Application
    Filed: June 3, 2003
    Publication date: February 5, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh
  • Patent number: 6686585
    Abstract: There is provided a measurement system in which the calibration data is easily incorporated into or obtained by the position sensing and/or displacement sensing system's processing unit. A scale-based encoder has a signal processor that corrects for scale inaccuracy based on a limited set of correction coefficients. The correction coefficients are the slopes and offsets that define a piecewise linear correction curve corresponding to the errors inherent in the scale. Several ways for communicating the coefficients to the processor are envisioned. Correction is applicable to linear or rotary encoders.
    Type: Grant
    Filed: September 19, 2001
    Date of Patent: February 3, 2004
    Assignee: Microe Systems Corporation
    Inventors: Donald L. Grimes, Stuart E. Schechter, Donald K. Mitchell
  • Patent number: 6686733
    Abstract: A method for offset compensation of a magnetoresistive position or angular position measuring system includes at least one Wheatstone bridge with four locally offset magnetoresistive resistors to which a DC voltage is applied and past which a permanent magnet is moved, wherein the respective bridge voltage is measured, by which method a subsequent offset compensation of magnetoresistive position or angular position measuring systems is also possible on site. Provision is made for a calibration cycle to be run through upon start-up of the measuring system, by moving the permanent magnet past the bridge(s) for a measuring cycle, evaluating the extreme values of the bridge voltages measured during this procedure by deriving the mean values thereof, and deriving from these mean values corresponding compensation values in the form of offset values to be taken into consideration by the measuring system, the compensation values being stored in a register.
    Type: Grant
    Filed: October 1, 2002
    Date of Patent: February 3, 2004
    Assignee: Koninklijke Philips Electronics N.V.
    Inventor: Michael Muth
  • Patent number: 6670808
    Abstract: A self referencing eddy current probe for determining conductive coating thickness includes a housing having a reference sample area, for accommodating a reference sample, and a testing edge, for positioning on a component during a coating thickness measurement. The eddy current probe further includes a reference eddy current coil situated in the housing adjacent to the reference sample area and a test eddy current coil, which is located at the testing edge. A self referencing eddy current measurement system, for measuring a thickness of a conductive coating on a component, includes the self referencing eddy current probe. The system further includes a signal generator for energizing the test and reference coils and a comparison module for comparing a test signal received from the test coil and a reference signal received from the reference coil and outputting a compared signal.
    Type: Grant
    Filed: August 27, 2001
    Date of Patent: December 30, 2003
    Assignee: General Electric Company
    Inventors: Shridhar Champaknath Nath, Curtis Wayne Rose, Carl Stephen Lester, Thomas James Batzinger
  • Patent number: 6661223
    Abstract: A method is disclosed for determining the presence of response abnormalities in magnetic sensors. The method includes placing the sensor in an applied magnetic field and collecting sensor resistance information as the magnitude and direction of the applied field is altered. The resistance values are then examined to determine the presence of response abnormalities.
    Type: Grant
    Filed: January 7, 2002
    Date of Patent: December 9, 2003
    Assignee: International Business Machines Corporation
    Inventors: Peter Cheng-I Fang, Christopher Dana Keener, Kenneth Donald Mackay, Frederick William Stukey, Jr.
  • Patent number: 6650107
    Abstract: Improved calibrations associated with superconducting quantum interference devices (SQUIDs) are accomplished using a single calibration ring that is placed on an outer dewar wall. During initial calibration, a standard current is passed through the calibration ring and channel responses are measured and recorded. During re-calibration, any channel responses that have changed from the original value U to a new value U′, are identified and the corresponding empirical coefficients for these channels are changed from an old value of C to a new value C′ given by: C′=(U′/U)C Channel responses in subsequent measurements are divided by these coefficients C′ in order to make them equal for equal magnetic field inputs, or to provide equal channel sensitivities.
    Type: Grant
    Filed: February 25, 2003
    Date of Patent: November 18, 2003
    Assignee: Cariomag Imaging, Inc.
    Inventor: Alexander A. Bakharev
  • Publication number: 20030164697
    Abstract: An inductive proximity sensor or switch and a method of using same. The sensor or switch includes an Application Specific Integrated Circuit (“ASIC”) and a plurality of external components. The ASIC is implemented in CMOS technology and has an oscillator. A switch point of the sensor or switch is predetermined by selection of a bias voltage to a potential node of the oscillator.
    Type: Application
    Filed: January 16, 2003
    Publication date: September 4, 2003
    Inventor: David Hardie
  • Publication number: 20030151404
    Abstract: The invention relates to a device for measuring magnetic field(s). This device comprises at least one measurement acquisition pathway (221, 222, 223; 231, 232, 233) comprising a measurement current generator (24), a coil (25), a measurement resistor (26), at least one amplifier (27) and at least one antialiasing filter, delivering a measurement voltage.
    Type: Application
    Filed: October 15, 2002
    Publication date: August 14, 2003
    Inventor: Jean-Louis Lescourret
  • Patent number: 6605940
    Abstract: A linear variable differential transformer (LVDT) assembly comprises a housing. A tube extends into the housing. An armature mounts inside of the tube and can move longitudinally within the tube. A coil assembly, which includes a primary coil and two secondary coils mounts on the outside of the tube. The coil assembly has adjustable connection with the housing. Consequently, the coil assembly can be adjusted longitudinally with respect to the armature until the LVDT is in the null position. That occurs when the differential voltage from alternating current through the secondary coils is zero.
    Type: Grant
    Filed: April 12, 2000
    Date of Patent: August 12, 2003
    Assignee: Kavlico Corporation
    Inventors: Sohail Tabrizi, Hedayatollah Shakibai, Leonard J. Marella
  • Publication number: 20030146746
    Abstract: Improved calibrations associated with superconducting quantum interference devices (SQUIDs) are accomplished using a single calibration ring that is placed on an outer dewar wall. During initial calibration, a standard current is passed through the calibration ring and channel responses are measured and recorded.
    Type: Application
    Filed: February 25, 2003
    Publication date: August 7, 2003
    Inventor: Alexander A. Bakharev
  • Publication number: 20030146745
    Abstract: A method for inspecting a metallic component comprises providing an inspection standard having an eddy current signature substantially similar to an eddy current signature of the metallic component, wherein the inspection standard body is fabricated from a non-metallic material. The method also comprises inspecting the metallic component with an eddy current probe with reference to the inspection standard.
    Type: Application
    Filed: February 5, 2002
    Publication date: August 7, 2003
    Inventors: Dominick A. Casarcia, Douglas E. Ingram, William S. McKnight
  • Publication number: 20030128025
    Abstract: A method is disclosed for determining the presence of response abnormalities in magnetic sensors. The method includes placing the sensor in an applied magnetic field and collecting sensor resistance information as the magnitude and direction of the applied field is altered. The resistance values are then examined to determine the presence of response abnormalities.
    Type: Application
    Filed: January 7, 2002
    Publication date: July 10, 2003
    Applicant: International Business Machines Corporation
    Inventors: Peter Cheng-I Fang, Christopher Dana Keener, Kenneth Donald Mackay, Frederick William Stukey
  • Patent number: 6591202
    Abstract: An apparatus and method that tests an NMR system, including MRI scanners, by taking H-B measurements for the apparatus at any stage during the manufacture thereof, to thereby detect any defects of the NMR system at any point during the manufacture thereof.
    Type: Grant
    Filed: November 22, 2000
    Date of Patent: July 8, 2003
    Assignee: Fonar Corporation
    Inventors: Joseph F. Rimkunas, William Wahl, Gordon Danby
  • Publication number: 20030107373
    Abstract: The sensor for measuring a magnetic field comprises a substrate (1), a first magnetic element (2), a second magnetic element (3), a third magnetic element (4) and a fourth magnetic element (5) in a bridge configuration on the substrate (1), a first bridge portion (8), wherein the first element (2) and the second element (3) are connected in series, and a second bridge portion (9), wherein the third element (4) and the fourth element (5) are connected in series, being situated between a first contact (6) and a second contact (7).
    Type: Application
    Filed: April 9, 2002
    Publication date: June 12, 2003
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventor: Joannes Baptist Adrianus Dionisius Van Zon
  • Publication number: 20030107366
    Abstract: A method and system for calibrating a magnetic sensor having at least one magnet and at least one sensing element incorporated therein is disclosed. A magnetization direction of a magnet is altered in at least one axis until a sensing element is balanced. The magnet can be calibrated separately from the electronic components associated with the magnetic sensor to thereby achieve an improved calibration over temperature variations associated with the magnetic sensor. The magnetic sensor can be configured to include one or more magnets and one or more sensing elements. Such magnets may be calibrated according to the methods and systems disclosed herein, in association with such sensing elements. Each magnet may be calibrated separately from the electronics associated with the magnetic sensor. The magnetization direction of the magnet may be altered in one or more axis until the sensing element is balanced. The magnetic sensor may, for example, comprise a gear tooth sensor or a wheelspeed sensor.
    Type: Application
    Filed: December 6, 2001
    Publication date: June 12, 2003
    Inventors: Nicholas F. Busch, Joseph K. Murdock
  • Publication number: 20030090261
    Abstract: A method and a device for detecting mispolarization in a signal transducer is described, with which the output signal of the signal transducer—that has at least one singularity—is converted into a square-wave signal. Intervals between specifiable signal-level changes are monitored in the region of the singularity, or plausibility windows are set, within which specifiable events must occur. If the intervals do not correspond to the expected intervals, or if specifiable events do not occur within the specifiable time windows or plausibility windows, mispolarization is detected. The method for detecting mispolarization is used, for example, in the case of a signal transducer having a plurality of uniform angular points and one reference point, but it is not limited to such transducers.
    Type: Application
    Filed: September 16, 2002
    Publication date: May 15, 2003
    Inventors: Joern Beckmann, Ralf Klewin, Armin Sayer, Athanasios Hailas
  • Patent number: 6563309
    Abstract: A method and apparatus for non-destructively measuring the depth of a crack with precision and accuracy in a workpiece using an eddy current process. The method involves empirically creating a response curve of the eddy current response produced from crack(s) in a sample workpiece(s), wherein the depth of the crack(s) in the sample workpiece(s) may be modified a plurality of times and an eddy current response reading is taken at each different crack depth. The response curve is then used to interpolate the depth of a crack in a workpiece composed of the same material non-destructively by measuring the eddy current response in the workpiece crack and then obtaining the predetermined crack depth value form the response curve.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: May 13, 2003
    Assignee: The Boeing Company
    Inventors: James S. Kachelries, Louis R. Truckley, Douglas P. Knapp
  • Patent number: 6552536
    Abstract: A reference standard and method for inspecting dual-layered coatings. The reference standard has a first layer adherent to a substrate, the first layer has a predetermined thickness that increases in one direction. Adherent to the first layer is a second layer, the second layer has a predetermined thickness that increases in a direction orthogonal with the first layer. The orientation of the first and second layers of the reference standard provides a spectrum of the possible variations of the dual-layered coating.
    Type: Grant
    Filed: June 17, 2002
    Date of Patent: April 22, 2003
    Assignee: General Electric Company
    Inventor: Richard L. Trantow
  • Patent number: 6545468
    Abstract: A method of calibrating the magnetic coils of a magnetically enhanced reactive ion etcher includes taking magnetic field measurements outside of a closed plasma chamber and correlating such measurements to the magnetic field within the chamber. One or more factors are established which when applied to measurements taken externally yield results representative of measurements taken internally.
    Type: Grant
    Filed: August 2, 2001
    Date of Patent: April 8, 2003
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Hui Ming Kuo, Strellson Cheng
  • Patent number: 6534985
    Abstract: An electromagnetic sensing apparatus which has an electromagnetic transmitter, at least one receiver device, at least one calibration device, a switch and a processor. The transmitter generates a transmitter signal. The receiver device is spaced from the transmitter, senses an electromagnetic field proximate thereto and generates a receiver signal. The calibration device senses an electromagnetic field proximate thereto and generates a calibration signal. The calibration device is positioned such that the distance between the transmitter and the receiver device is greater than the distance between the transmitter and the calibration device. The switch is connected between the receiver device and the calibration device. The processor includes a first input for receiving a signal from one of the at least one receiver device and the calibration device and a second input for receiving a signal from the switch and compares the first input and second input and monitors distortions in the transmitter signal.
    Type: Grant
    Filed: December 15, 2000
    Date of Patent: March 18, 2003
    Assignee: Geosensors Inc.
    Inventors: John Scott Holladay, III, James Leonard Corbett Lee
  • Patent number: 6532791
    Abstract: The invention relates to a method for increasing the positioning accuracy of an element (13) which is movably arranged relative to a stator (10). At least two sensors (11, 12) are provided in the stator (10), a first sensor (11) and a second sensor (12), which are arranged at a distance (a) from one another in the stator (10), with respect to the movement direction (P) of the movably arranged element (13). The element (13) which is arranged such that it can move relative to the stator (10) is provided with encoders (130) which can move together with the movable element (13) and, when the element (13) carries out a movement relative to the stator (10), firstly produce a sensor signal (S11) in the first sensor (11) and then, as the movement of the element progresses, produce a sensor signal (S12) in the second sensor (12). First of all, in a calibration run, the movable element (13) is moved over the entire possible range of movement.
    Type: Grant
    Filed: October 1, 2001
    Date of Patent: March 18, 2003
    Assignee: NTI AG
    Inventors: Kuno Schmid, Daniel Ausderau, Marco Hitz, Ronald Rohner
  • Patent number: 6528988
    Abstract: A system and method for programming a Hall effect sensor while the sensor is connected into the circuitry for a given application. The system includes a fixture for receiving the printed circuit board to which the sensor is mounted. A plurality of contacts, such as pogo pins, are arranged to contact the circuit board at desired pads that permit programming of the sensor, reduction of the voltage applied to the overall circuit during programming, and measurement of the sensor and circuit output. The system includes a voltage limiting circuitry that is electrically connected, via appropriate pogo pins, to the circuitry intermediate the subject sensor and potentially damaged circuit components.
    Type: Grant
    Filed: December 21, 2001
    Date of Patent: March 4, 2003
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Daniel J. Bolda, Steven T. Haensgen, John L. Scheele, Craig Muschinski
  • Publication number: 20030034773
    Abstract: A method of calibrating the magnetic coils of a magnetically enhanced reactive ion etcher includes taking magnetic field measurements outside of a closed plasma chamber and correlating such measurements to the magnetic field within the chamber. One or more factors are established which when applied to measurements taken externally yield results representative of measurements taken internally.
    Type: Application
    Filed: August 2, 2001
    Publication date: February 20, 2003
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Hui Ming Kuo, Strellson Cheng
  • Publication number: 20030020462
    Abstract: The present invention relates to a compliant laminar eddy current sensitivity standard which comprises a sheet of nonconductive, nonmagnetic material having at least one strand of highly conductive metallic material embedded in the sheet and an adhesive layer attached to a surface of the nonconductive, nonmagnetic material to allow the standard to be adhered to a surface of a part to be inspected. A method using the compliant laminar eddy current sensitivity standard is also described.
    Type: Application
    Filed: July 30, 2001
    Publication date: January 30, 2003
    Inventors: David A. Bryson, Chris Vargas
  • Patent number: 6504360
    Abstract: The present invention relates to a method for checking or determining the installation air slot between an active sensor and an encoder, wherein the maximum size of the air slot (maximum air slot) which still ensures trouble-free operation of the sensor depends on the level of the supply voltage of the sensor at least within a range of said supply voltage, and which is more particularly characterized by the following method steps: reducing the supply voltage of the sensor to at least one value by which the maximum air slot is each time decreased by a desired test measure, and comparing the at least one test measure with a desired difference between the maximum air slot and the existing air slot by sensing a variation of the sensor output signal by the reduction of the supply voltage, as well as evaluating the comparison result by signaling and/or storing. A corresponding device is also described.
    Type: Grant
    Filed: April 20, 2001
    Date of Patent: January 7, 2003
    Assignees: Continental Teves AG & Co., OGH HDT Industrieplanung GmbH
    Inventors: Peter Lohberg, Klaus Hildebrandt
  • Patent number: 6501262
    Abstract: The invention relates to a method for applying to a carrier a marking serving to measure length, angle cr the like, such as, for example, a magnetic tape (4), by means of which the accuracy of the measurements is improved. In the case of such methods, in one marking step a means for producing a track with markings, for example a writing head (9), is guided over the carrier and, by virtue of the fact that the carrier is acted upon, markings, for example magnetic north and south poles, are applied therein at predetermined positions of the carrier.
    Type: Grant
    Filed: December 1, 1999
    Date of Patent: December 31, 2002
    Assignee: Schneeberger Holding AG
    Inventors: Hans-Martin Schneeberger, Frederic L. Way