Material Flaw Testing Patents (Class 324/237)
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Patent number: 12078692Abstract: A magneto-optic imaging apparatus adapted for use with an imaging device, such as a smartphone, tablet computer, or borescope, for visually detecting defects in the surface or subsurface of a component using a magneto-optic effect. The magneto-optic imaging apparatus includes a housing with an interface for connection with the imaging device such that a camera and light source of the imaging device may be implemented for magneto-optic visualization. The housing includes optical elements including one or more filters, a polarizer, a magneto-optic or garnet film, and an analyzer. The housing also includes a flexible coil or electrical terminals for inducing a magnetic field in the component. The magneto-optic imaging apparatus may include a translucent or transparent body of conformable material or materials to conform the magneto-optic film and flexible coil to a non-planar surface of the component.Type: GrantFiled: October 17, 2022Date of Patent: September 3, 2024Assignee: General Electric CompanyInventors: Manoj Kumar Koyithitta Meethal, Vikram Melapudi, Aparna Chakrapani Sheila-Vadde, Satya Mohan Vamsi Andalam
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Patent number: 11841245Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.Type: GrantFiled: January 6, 2023Date of Patent: December 12, 2023Assignee: JENTEK Sensors, Inc.Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
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Patent number: 11774495Abstract: The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe. The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.Type: GrantFiled: January 17, 2019Date of Patent: October 3, 2023Assignee: ATG LUTHER & MAELZER GMBHInventors: Stefan Weiss, Oleh Yuschuk, Christian Weindel
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Patent number: 11761927Abstract: A device for detecting a crack in a battery cell, comprising: an inspection unit comprising a first sensor inducing an eddy current and a second sensor sensing a signal of the eddy current induced by the first sensor, and performing an inspection of the battery by using the eddy current while the battery cell is driven; a transfer unit for sequentially transferring a plurality of battery cells from a point where the battery cells are introduced to a point where the battery cells are taken out; and a control unit which is electrically connected to the inspection unit and receives, evaluates, and controls the eddy current signal sensed by the inspection unit.Type: GrantFiled: March 25, 2020Date of Patent: September 19, 2023Assignee: LG Energy Solution, Ltd.Inventors: Seok Jin Kim, Sang Hyun Koo, Cha Hun Ku, Jung Hoon Lee
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Patent number: 11674927Abstract: The eddy current flaw detection apparatus includes: a pair of detecting coils 10a, 10b arranged in coaxial and spaced relation with a specimen 3; and a bridge circuit two sides of which are constituted by the detecting coils so that magnetic fields generated by these detecting coils 10a, 10b are in opposite phases to each other. A pair of exciting coils 11a, 11b are arranged coaxially with the detecting coils 10a, 10b in a manner to sandwich the pair of detecting coils 10a, 10b therebetween. A distance D between the detecting coil and the exciting coil adjacent thereto is set to a distance where a vibrational noise signal excited in the exciting coil and detected by its adjacent detecting coil is in opposite phase to that of a vibrational noise signal excited in the detecting coil and detected by the detecting coil.Type: GrantFiled: January 13, 2021Date of Patent: June 13, 2023Assignee: Tex Riken Co., Ltd.Inventors: Yuji Kumakura, Nobuhiko Konishi
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Patent number: 11656200Abstract: A first-order resistor-inductor (RL) circuit is allowed to alternate a direct-current excitation response and a zero-input response so that a direct-current magnetic field generated by an inductor magnetizing coil changes alternately in magnetic field intensity with a change in magnitude of current. After a testing object is placed in the direct-current magnetic field changing alternately in magnetic field intensity, the testing object is magnetized and also causes a change in inductance of the magnetic field. Whether a change occurs in electromagnetic properties of the testing object can be determined and detected by detecting the inductance change of the magnetizing coil or detecting electrical characteristic change caused by the inductance change of the magnetizing coil, thereby determining whether quality defects such as steel wire cracks and wire breakage in a steel wire rope occur. Alternatively, the properties such as a sectional area or a zinc layer thickness can be analyzed.Type: GrantFiled: November 14, 2022Date of Patent: May 23, 2023Assignee: Jiangyin Tianrun Information Technology Co., LtdInventor: Zhouyi Hu
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Patent number: 11549831Abstract: A measurement system, its assembly and use are disclose. The system may include an instrument for making sensor measurements. The instrument has a substantially cylindrical housing. The shape and size allow the instrument to easily fit in an average hand enabling handheld operation. The housing houses a board stack of electronic boards. These electronics drive an electrical signal in at least one drive channel and measure responses from at least two sensing channels. These responses are provided to a processor for analysis. The instrument has a sensor connector that enables simultaneous electrical and mechanical attachment of an end effector.Type: GrantFiled: September 16, 2019Date of Patent: January 10, 2023Assignee: JENTEK Sensors, Inc.Inventors: Neil J Goldfine, Todd M Dunford, Scott A Denenberg, Kevin P Dixon, Yanko K Sheiretov, Saber Bahranifard, Stuart D Chaplan, Mark Windoloski
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Patent number: 10851013Abstract: A glass sheet acquisition and positioning system and associated method are utilized in a glass sheet optical inspection system installed in-line in a glass sheet processing system. The acquisition and positioning system include an exterior support frame and a moveable glass sheet support frame connected to the exterior support frame such that the glass sheet support frame may be selectively positioned from first orientation whereby a glass sheet is removed from a conveyor and retained on the support frame, to a second orientation whereby the glass sheet is positioned for processing by the optical inspection system. The system may also include a glass sheet part identifier and a programmable control including logic for analyzing acquired image data and identifying the glass sheet as one of a set of known part types and thereafter securing and positioning the glass sheet on the glass sheet support frame based upon the part-shape analysis.Type: GrantFiled: March 5, 2015Date of Patent: December 1, 2020Assignee: GLASSTECH, INC.Inventors: Michael Vild, Jason Addington, Benjamin Moran
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Patent number: 10444983Abstract: An instrument is described which comprises an input for receiving a signal, a data processing unit for analyzing said received signal and providing data to be displayed, and a touch enabled display screen for displaying said data to be displayed and receiving commands directed to said data processing unit. Said commands comprise commands that determine how said data is displayed on the touch enabled display screen and commands that determine operations that are performed by said instrument and/or said data processing unit. Said commands are specified by control gestures on said touch enabled display screen. Said control gestures are unambiguously related to certain commands. Said data processing unit recognizes said control gestures wherein said data processing unit is configured to determine a corresponding command specified by said detected control gesture and to process said determined command. Said instrument is a test instrument for measuring and/or analyzing said received signal.Type: GrantFiled: September 20, 2016Date of Patent: October 15, 2019Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Laddie Zarsuelo, Roland Dingal
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Patent number: 9964519Abstract: A device for discovering, identification and monitoring, of mechanical flaws in metallic structures is disclosed, based on magneto-graphic/magnetic tomography technique to identify stress-related defects. The device can determine the position of the defect or stress including depth information. The device includes registration means that optimized for use with metallic structures of various types, shapes, and sizes. Applications include a real-time quality control, monitoring and emergency alarms, as well structural repairs and maintenance work recommendations and planning. Examples of the device implementation include pipes for oil and gas industry monitoring, detection of flaws in roiled products in metallurgical industry, welding quality of heavy duty equipment such as ships, reservoirs, bridges, etc. It is especially important for loaded constructions, such as pressured pipes, infrastructure maintenance, nuclear power plant monitoring, bridges, corrosion prevention and environment protection.Type: GrantFiled: January 11, 2017Date of Patent: May 8, 2018Inventors: Valerian Goroshevskiy, Svetlana Kamaeva, Igor Kolesnikov
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Patent number: 9413407Abstract: The invention relates to frequency conversion systems, in particular for use as up-converters or down-converters in radiofrequency (RF) receivers or transmitters, exemplary embodiments including a radiofrequency receiver including an RF signal input; a mixing module including a first plurality of IF amplifiers each connected to the RF signal input via a switch; a multi-phase local oscillator signal generator configured to provide a switching signal to each switch; and a summing module configured to receive output signals from each of the IF amplifiers and to provide a second plurality of output IF signals from a weighted sum of the IF amplifier output signals, wherein the second plurality is different to the first plurality.Type: GrantFiled: July 8, 2011Date of Patent: August 9, 2016Assignee: NXP B.V.Inventors: Jan van Sinderen, Johannes Hubertus Antonius Brekelmans, Frank Harald Erich Ho Chung Leong, Nenad Pavlovic
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Patent number: 8884613Abstract: A water-chamber working apparatus 1 according to the present invention includes a movable body that can move along a tube plate 12 of a steam generator 10, an extendable member 21 that extends and retracts in a direction in which a first coupling portion 21d approach each other and a direction in which these portions move away from each other, where the first coupling portion 21d is attached to a maintenance hatch 15 via a first joint 23a including two rotation axes intersecting with each other, and the second coupling portion 21e is attached to the movable body via a second joint 23b including two rotation axes intersecting with each other, which are different from the rotation axes of the first joint 23a.Type: GrantFiled: January 19, 2011Date of Patent: November 11, 2014Assignee: Mitsubishi Heavy Industries, Ltd.Inventor: Jun Fujita
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Patent number: 8823369Abstract: A non-destructive inspection system that has particular application for inspecting a bore in a valve for defects. The system includes an inspection yoke having a ferromagnetic core, where a first coil is wound around the core in one direction and a second coil is wound around the core in an orthogonal direction so that orthogonal electromagnetic fields can be generated within the bore. A controller provides a current flow through the coils to generate the electromagnetic fields to detect defects in the bore.Type: GrantFiled: May 17, 2011Date of Patent: September 2, 2014Assignee: Siemens Energy, Inc.Inventors: David S. Segletes, Erik A. Lombardo
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Patent number: 8581578Abstract: A magnetic pattern detection device for use with a medium having at least one magnetic pattern of a plurality of types of magnetic patterns whose residual magnetic flux density and permeability are different on a basis of both of a level of residual magnetic flux density and a level of permeability may include a common sensor part structured to detect presence/absence of each of the plurality of types of magnetic patterns, and a signal processing section structured to extract a first signal corresponding to the level of the residual magnetic flux density and a second signal corresponding to the level of the permeability from a signal outputted from the sensor part.Type: GrantFiled: December 19, 2008Date of Patent: November 12, 2013Assignee: Nidec Sankyo CorporationInventor: Shogo Momose
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Patent number: 8552718Abstract: In a method for the nondestructive testing of pipes made of ferromagnetic steel for flaws by means of stray flux, the pipe is magnetized by a constant field and the discontinuities in the near-surface region of the outer or inner surface of the pipe cause magnetic stray fluxes, which exit the pipe surface and are detected by probes of a test unit, wherein the association of the detected amplitude signals is performed on the basis of the amplitude height and/or the frequency spectrum with respect to an external or internal flaw via defined flaw thresholds respectively. For this, prior to associating the detected amplitude signals to an external or internal flaw, the angular position of the flaw relative to the respective magnetic field direction is determined, and a correction of the signals is carried out via a previously determined correction factor for amplitudes and/or frequencies of a perpendicular angular position.Type: GrantFiled: April 2, 2009Date of Patent: October 8, 2013Assignee: V & M Deutschland GmbHInventors: Andreas Groos, Stefan Nitsche
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Patent number: 8552717Abstract: It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1. The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested.Type: GrantFiled: March 17, 2008Date of Patent: October 8, 2013Assignee: Nippon Steel & Sumitomo Metal CorporationInventors: Shigetoshi Hyodo, Yoshiyuki Nakao
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Patent number: 8513943Abstract: An apparatus, system, and method are disclosed for maintaining normalcy of a sensor with respect to a structure. The apparatus includes a driving member, a driven member, and a sensor. The driving member includes a first engaging element and a second engaging element. The driven member includes a third engaging element and a fourth engaging element. The third engaging element of the driven member is engaged with the first engaging element of the driving member. The fourth engaging element of the driven member is engaged with the second engaging element of the driving member. The sensor is coupled to the driven member, which is rotatably drivable by the driving member. Engagement between the first and third engaging elements facilitates three-dimensional adjustment of the driven member relative to the driving member. Engagement between the second and fourth engaging elements facilitates co-rotation of the driving member and the driven member.Type: GrantFiled: August 24, 2010Date of Patent: August 20, 2013Assignee: United Western Technologies CorporationInventors: Mark Gehlen, Gary Brockman, Steve Hubbard
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Patent number: 8493064Abstract: An apparatus, system, and method are disclosed for scanning metallic surfaces. The apparatus, in one embodiment, comprises a shaft and a rotating member. The rotating member may comprise a sensing end and a featuring engaging element. The shaft further comprises a first coupling element and the rotating member further comprises a second coupling element. The first coupling element may be coupleable with the second coupling element such that the rotating member is pivotable at any three-dimensional angle with respect to the shaft to orient the sensing surface parallel to the scanned surface.Type: GrantFiled: August 24, 2010Date of Patent: July 23, 2013Assignee: United Western Technologies CorporationInventors: Mike Setbacken, Mark Gehlen, Steve Hubbard, Fred Perrin
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Patent number: 8486545Abstract: Systems and methods for flaw detection and monitoring at elevated temperatures with wireless communication using surface embedded, monolithically integrated, thin-film, magnetically actuated sensors, and methods for fabricating the sensors. The sensor is a monolithically integrated, multi-layered (nano-composite), thin-film sensor structure that incorporates a thin-film, multi-layer magnetostrictive element, a thin-film electrically insulating or dielectric layer, and a thin-film activating layer such as a planar coil. The method for manufacturing the multi-layered, thin-film sensor structure as described above, utilizes a variety of factors that allow for optimization of sensor characteristics for application to specific structures and in specific environments. The system and method integrating the multi-layered, thin-film sensor structure as described above, further utilizes wireless connectivity to the sensor to allow the sensor to be mounted on moving components within the monitored assembly.Type: GrantFiled: September 28, 2006Date of Patent: July 16, 2013Assignee: Southwest Research InstituteInventors: Bruce R. Lanning, Glenn M. Light, Stephen J. Hudak, Jr., James A. Moryl
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Patent number: 8358126Abstract: A method of testing for defects in the bottom of an above ground storage tank, the tank bottom having a lip extending outwardly from the tank wall around the circumference of the tank. A special magnetostrictive sensor is designed to be placed on this lip. The sensor is placed over a strip of magnetostrictive material, which generally conforms in length and width to the bottom of the probe, with a couplant being applied between the strip and the lip surface. The sensor is then operated in pulse echo mode to receive signals from defects in the bottom of the tank. It is incrementally moved around the circumference of the tank.Type: GrantFiled: January 14, 2010Date of Patent: January 22, 2013Assignee: Southwest Research InstituteInventors: Glenn M Light, Alan R Puchot, Adam C Cobb, Erika C Laiche
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Patent number: 8339130Abstract: The surface length of a metal subject to be inspected is evaluated by detecting an eddy current without using a combination of a scale and visual or liquid penetrant inspection. An exciting coil and a detecting coil are scanned above the subject in a length direction. An eddy current detector measures an output voltage corresponding to scanning positions based on an output from the detecting coil. Based on an output voltage distribution curve indicating a distribution of output voltages corresponding to the scanning positions, position information is extracted corresponding to values which are within a differential voltage range and lower by 12 dB than a maximum value of the output voltages on the left and right sides of the distribution. A distance between the positions included in the extracted information is calculated to evaluate the length of a slit which is a defect present on the subject surface.Type: GrantFiled: February 16, 2011Date of Patent: December 25, 2012Assignee: Hitachi, Ltd.Inventors: Akira Nishimizu, Yoshio Nonaka, Isao Yoshida, Motoyuki Nakamura, Akihiro Taki, Masahiro Koike
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Patent number: 8319494Abstract: A pipeline inspection tool includes two pole magnets oriented at an oblique angle relative to the central longitudinal axis of the tool body. An array of sensor coil sets is located between opposing edges of the two pole magnets and oriented perpendicular to the central longitudinal axis. Each sensor coil set includes a transmitter coil and two opposing pairs of receiver coils that are gated to receive reflections from the wall of a tubular member. Because the line of sensor coils is rotated relative to the magnetic bias field, the receiver coils are in-line with, and have the same angular orientation as, the transmitter coil. The tool provides improved sensitivity to small defects, substantial decrease in RF pulser power requirements, full circumferential coverage, self-calibration of the transmitted signals, and less interference between transmitter coils caused by acoustic ring around.Type: GrantFiled: December 18, 2009Date of Patent: November 27, 2012Assignee: TDW Delaware Inc.Inventors: James Simek, Jed Ludlow, John H. Flora, Syed M. Ali, Huidong Gao
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Patent number: 8283918Abstract: A detection apparatus for an eddy current in a heat generating tube using a permeability measurement method, and a method using the apparatus are provided. In the detection apparatus, a bobbin type probe acquires detection information with respect to a magnetic flux change by a magnetic phase occurring in the heat generating tube using a coil which is wound in an axis direction of at least one yoke located in a perpendicular direction with a bobbin of the bobbin type probe, and a material having a corresponding magnetic phase and a circumferential defect, which is difficult to be detected by the bobbin type probe, are detected based on the detection information.Type: GrantFiled: January 23, 2007Date of Patent: October 9, 2012Assignee: Korea Atomic Energy Research InstituteInventors: Duck-Gun Park, Derac Son, Kwon-Sang Ryu, Dae-hyuk Jyung, Whung-whoe Kim
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Patent number: 8274278Abstract: An automated, non-destructive anhysteretic magnetization characterization method for studying and modeling soft magnetic materials. This measurement method employs a “reading-waveform” that allows multiple points of reference to be established in tracing out the B waveform. In using the reference values from this waveform, the components of B that cannot be measured directly may be calculated with precision. In turn, the initial magnitude of the B waveform is identified as the unknown component of the anhysteretic state. The processes can be repeated for different values of static fields as well as a function of temperature to produce a family of anhysteretic magnetization curves. The core characterization was performed without physically altering the core, so that the true anhysteretic magnetization curve, and the true B-H loop under applied bias H, is measured.Type: GrantFiled: December 10, 2009Date of Patent: September 25, 2012Assignee: University of South FloridaInventors: Jeremy Walker, Stephen E Saddow
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Patent number: 8008913Abstract: Variations in the lift-off separation between a probe and the surface of a structure to be tested often mask the detection of defects in the structure. A method and apparatus for automatically classifying and compensating for variations in the lift-off is described. A reference signal at a known lift-off may be weighted by a corresponding calculated ratio parameter and subtracted from a test signal to compensate for lift-off. A number of reference signals are preferably obtained and the largest magnitude gradient for each reference signal is preferably determined. The largest magnitude gradient for subsequent test signals is also obtained and the corresponding reference signal with the closest largest magnitude gradient to the test signal is identified and the corresponding reference signal is selected in the related compensation procedure. Such a method has been found to restore the signal such that lift-off is removed and defects are easily identified.Type: GrantFiled: June 6, 2008Date of Patent: August 30, 2011Assignee: GE Inspection Technologies, LtdInventors: Xiaoyu Qiao, John Hansen
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Patent number: 7994778Abstract: An inductive sensor or detector includes as its sensitive element, preferably defining a front working plane of the sensor, a coil system forming an air-core transformer arrangement with a primary coil or winding (2) and a secondary coil or winding (3). The primary coil or winding of the system is associated with a capacitive component (4) in order to constitute a LC oscillating circuit whose oscillation is sustained by an adapted generator (5) in the form of an operational amplifier (6) and an associated resistance arrangement (R, R5, R13). The sensor also includes a signal processing circuit, for example signal adding (8), amplifying, converting (9) and/or evaluating circuits (10), fed by at least one signal provided by at least one component of the coil system. The inductive sensor comprises a direct or indirect feedback line (11) from the secondary coil or winding (3) to the input of the operational amplifier (6) of the generator (5).Type: GrantFiled: February 27, 2008Date of Patent: August 9, 2011Assignee: Senstronic SAInventors: Rémy Kirchdoerffer, Vladimir Frolov
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Patent number: 7911206Abstract: The surface length of a metal subject to be inspected is evaluated by detecting an eddy current without using a combination of a scale and visual or liquid penetrant inspection. An exciting coil and a detecting coil are scanned above the subject in a length direction. An eddy current detector measures an output voltage corresponding to scanning positions based on an output from the detecting coil. Based on an output voltage distribution curve indicating a distribution of output voltages corresponding to the scanning positions, position information is extracted corresponding to values which are within a differential voltage range and lower by 12 dB than a maximum value of the output voltages on the left and right sides of the distribution. A distance between the positions included in the extracted information is calculated to evaluate the length of a slit which is a defect present on the subject surface.Type: GrantFiled: June 29, 2007Date of Patent: March 22, 2011Assignee: Hitachi, Ltd.Inventors: Akira Nishimizu, Yoshio Nonaka, Isao Yoshida, Motoyuki Nakamura, Akihiro Taki, Masahiro Koike
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Patent number: 7898246Abstract: A method and apparatus for nondestructive inspection of interwoven wire fabric components. The apparatus comprises a probe, a power source, and a display system. The probe is capable of creating a magnetic field for a plurality of wires in an interwoven wire fabric component such that disturbances of the magnetic field caused by the plurality of wires can be detected. The power is a source connected to the probe and is capable of sending an alternating current through the probe to generate the magnetic field for the wire. The display system is connected to the probe and is capable of displaying results from detecting the magnetic field and disturbances of the magnetic field.Type: GrantFiled: August 1, 2007Date of Patent: March 1, 2011Assignee: The Boeing CompanyInventors: Gary E. Georgeson, James H. Lee
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Patent number: 7808330Abstract: A high-frequency oscillator includes a high-frequency oscillation element having a magnetization pinned layer whose magnetization direction is pinned substantially in one direction, an oscillation layer formed of a magnetic material which generates a high-frequency oscillation phenomenon when a current is supplied, an intermediate layer provided between the magnetization pinned layer and the oscillation layer, the intermediate layer having an insulation layer and current paths which pass through the insulation layer in a thickness direction, and a pair of electrodes which supply a current perpendicularly to a plane of a stacked film including the magnetization pinned layer, the intermediate layer and the oscillation layer.Type: GrantFiled: February 7, 2008Date of Patent: October 5, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Hideaki Fukuzawa, Hiromi Yuasa, Hitoshi Iwasaki
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Patent number: 7711499Abstract: A method of synthesizing nondestructive examination data of a component that combines data sets acquired at least two different frequencies. At least one of the data sets is interpolated or extrapolated to the equivalent of data acquired at one of the other frequencies employing a third, reference set of eddy current inspection data that is acquired at each of the inspection frequencies being combined.Type: GrantFiled: December 11, 2007Date of Patent: May 4, 2010Assignee: Westinghouse Electric Co LLCInventors: Warren R. Junker, Thomas W. Nenno, Daniel J. Yaklich, Ronald J. Pocratsky
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Patent number: 7696497Abstract: Apparatus for focusing a charged particle beam onto a surface, including a charged particle beam generator which is adapted to project the charged particle beam onto a location on the surface, thereby causing charges to be emitted from the location. The apparatus further includes an imaging detector which is adapted to receive the charges so as to form an image of the location, and an aberrating element which is positioned before the imaging detector and which is adapted to produce an aberration in the image. A processor is adapted to receive the image and to adjust at least one of the charged particle beam generator and a position of the surface in response to the aberration.Type: GrantFiled: August 24, 2005Date of Patent: April 13, 2010Assignees: Applied Materials Israel, Ltd., Carl Zeiss AGInventor: Steven Robert Rogers
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Publication number: 20090234590Abstract: A method of predicting at least one physical change in crack geometry based on ILI operating pressure, the method comprising a) performing a first test on a pipeline at a first pressure P1; b) obtaining a first set of test data on the pipeline at P1; c) performing a second test on the pipeline at a second pressure P2; d) obtaining a second set of test data on the pipeline at P2; and e) analyzing the first and second sets of test data for difference in feature signature at P1 vs. P2.Type: ApplicationFiled: March 14, 2008Publication date: September 17, 2009Inventors: Richard Clark McNealy, Ming Gao
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Patent number: 7576534Abstract: The system (10) and the method are used for forecasting the electrical conductivity of an anode (12) for aluminum production before the anode (12) is baked. In the system (10), at least one receiving coil (20,22) is coupled to an electromagnetic field emitting unit (14,18). A sensing device (30) is connected to the receiving coil (20,22), the sensing device (30) outputting a signal indicative of a variation of the electromagnetic field received by the receiving coil (20,22) as the crude anode (12), or a portion thereof, passes inside the receiving coil (20,22). A value indicative of the electrical conductivity of the anode (12) is then calculated using the signal from the sensing device (30) and signals previously obtained using reference anodes (12). This way, the electrical conductivity of the anodes (12) can be forecasted before the crude anodes (12) are baked.Type: GrantFiled: December 10, 2004Date of Patent: August 18, 2009Assignee: Universite Du Quebec A ChicoutimiInventors: Daniel Audet, Luc Parent
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Patent number: 7518359Abstract: A non-planar part has a non-planar surface such as an edge, and may contain an anomaly such as a crack. The non-planar part is inspected using an eddy current technique. The method includes providing the non-planar part having the non-planar surface thereon, driving an eddy current probe at two or more frequencies, measuring an eddy current response signal of the non-planar part at each frequency, and performing a multifrequency phase analysis on the eddy current response signals.Type: GrantFiled: January 12, 2006Date of Patent: April 14, 2009Assignee: General Electric CompanyInventors: Changting Wang, Ui Suh
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Patent number: 7504898Abstract: A high-frequency oscillator includes a high-frequency oscillation element having a magnetization pinned layer whose magnetization direction is pinned substantially in one direction, an oscillation layer formed of a magnetic material which generates a high-frequency oscillation phenomenon when a current is supplied, an intermediate layer provided between the magnetization pinned layer and the oscillation layer, the intermediate layer having an insulation layer and current paths which pass through the insulation layer in a thickness direction, and a pair of electrodes which supply a current perpendicularly to a plane of a stacked film including the magnetization pinned layer, the intermediate layer and the oscillation layer.Type: GrantFiled: September 21, 2006Date of Patent: March 17, 2009Assignee: Kabushiki Kaisha ToshibaInventors: Hideaki Fukuzawa, Hiromi Yuasa, Hitoshi Iwasaki
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Patent number: 7466126Abstract: An aspect of the invention is directed to a variable sensor head for use in multiple electric machines with varying slot openings comprising a ferromagnetic core; a first adjustable portion and a second adjustable portion positioned in communication with the ferromagnetic core wherein the first adjustable portion and the second adjustable portion are adjusted to fit between a plurality of slot openings of varying widths between a pair of lamination teeth of an electric machine. According to another embodiment, the first and second adjustable portions are sliding portions where the sliding portions may be spring biased to provide a close fit between the pair of lamination teeth. According to another embodiment, the first and second adjustable portions are adjustable screws.Type: GrantFiled: July 12, 2004Date of Patent: December 16, 2008Assignee: General Electric CompanyInventors: Edith Kliman, legal representative, Ralph James Carl, Jr., Manoj Ramprasad Shah, Sang-Bin Lee, Gerald Burt Kliman
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Patent number: 7403872Abstract: A method and system are provided for inspecting manufactured parts such as cartridges and cartridge cases and sorting the inspected parts. The system includes an illumination assembly for evenly illuminating a plurality of annular, exterior side surfaces of a part when the part is located in a circumference vision station with rings of strobed radiation to generate corresponding reflected radiation signals. A plurality of imaging detectors in the form of CCD cameras are located at the vision station to generate a plurality of side images. The system further includes at least one side image processor for processing the side images of each part to identify parts having an unacceptable defect. The system further includes a mechanism for directing parts identified as having an unacceptable defect to a defective part area and directing parts not identified as having an unacceptable defect to an acceptable part area.Type: GrantFiled: April 13, 2007Date of Patent: July 22, 2008Assignee: GII Acquisition, LLCInventors: James W. St. Onge, Joseph W. Priskorn, John D. Spalding, John V. McKowen, Kenneth S. Kolodge, Brett J. Lee
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Patent number: 7356421Abstract: A new approach for locating an underground line described herein remains accurate in the face of bleedover by including both amplitude and phase from at least two magnetic field strength sensors in the measurement set. A numerical optimization step is introduced to deduce the positions and currents of each of several cables, of which one is the targeted cable and the others are termed bleedover cables. Furthermore, some embodiments of the method accounts for practical problems that exist in the field that relate to reliable estimation of cable positions, like the phase transfer function between transmitter and receiver, the estimation of confidence bounds for each estimate, and the rejection of false positive locates due to the presence of noise and interference.Type: GrantFiled: April 6, 2005Date of Patent: April 8, 2008Assignee: Metrotech Corporation, Inc.Inventors: Thorkell Gudmundsson, Jim Waite, Johan Överby, Stevan Polak, Niklas Lindstrom
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Patent number: 7250757Abstract: A material analysis system configured to determine whether a circuit is defective includes a magnetic field generator configured to generate a first magnetic field that is configured to induce at least one eddy current in a conductive portion of the circuit, wherein the eddy current induces a second magnetic field; a set of magnetic field sensors configured to detect the second magnetic field and generate a set of image information therefrom; a database that includes circuit information for the circuit; and a computing device configured to receive the image information from the set of magnetic field sensors and retrieve the circuit information from the database, wherein the computing device is configured to compare the image information to the circuit information to determine whether the circuit is defective.Type: GrantFiled: May 2, 2005Date of Patent: July 31, 2007Assignee: Radiation Monitoring Devices, Inc.Inventor: Tim Tiernan
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Patent number: 6975108Abstract: A non-contact printed circuit board (PCB) electromagnetic testing system comprises at least one high resolution transducer operative to induce multi-frequency, multi-amplitude eddy currents in a tested PCB, each such transducer including both a high frequency excitation coil that serves also as a sensing coil and a direct current (DC) bias coil operative to provide an optimal transducer operating regime; a multi-frequency generator for providing AC and DC bias signals to each transducer; and a control mechanism for driving the transducer. Optionally, the system further comprises an external ferrite concentrator that enhances a magnetic field flux focus and depth of focus on the inspected PCB. The multi-frequency, multi-amplitude methods enable three-dimensional mapping of various features in the PCB with both high sensitivity and high resolution in respective operating regimes.Type: GrantFiled: November 13, 2003Date of Patent: December 13, 2005Inventors: Yuli Bilik, Eytan Keydar, Vladimir Boroda
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Patent number: 6966816Abstract: A chemical mechanical polishing apparatus and method can use an eddy current monitoring system and an optical monitoring system. Signals from the monitoring systems can be combined on an output line and extracted by a computer. A thickness of a polishing pad can be calculated. The eddy current monitoring system and optical monitoring system can measure substantially the same location on the substrate.Type: GrantFiled: May 2, 2001Date of Patent: November 22, 2005Assignee: Applied Materials, Inc.Inventors: Boguslaw A Swedek, Manoocher Birang, Nils Johansson
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Patent number: 6657430Abstract: A magnetic head wear-rate measuring apparatus for measuring the rate of head wear in noncontact form arranged to be opposed to a magnetic head and to serve as a part of oscillating elements of an oscillator circuit. A magnetic resistance of a magnetic circuit at a rotational position where the magnetic head faces the magnetic sensor, changes according to the degree of extension of the magnetic head from the surface of the drum, and the change in magnetic resistance acts as a variation in oscillating frequency. A counter is supplied with a pulse of a measured oscillating frequency and produces a pulse having a pulse width up to the counting of a predetermined number of pulses. The counter output is supplied to a second counter where the number of reference clocks lying within the pulse width is counted and used as measured data.Type: GrantFiled: October 25, 2001Date of Patent: December 2, 2003Assignee: Sony CorporationInventors: Seiichi Sakai, Hiroshi Yamauchi
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Patent number: 6643909Abstract: Method of making a proximity probe including providing a preform having an interior cavity accessible by an opened rearward end; coupling a coil to the preform proximate a forward most end of the preform for defining an assembly; locating a single support pin through the rearward end such that the support pin extends within the interior cavity while having an end emanating from the rearward end; cantilevering the emanating end between an upper and a lower mold plate defining a mold cavity for supporting the assembly; injecting moldable material into the mold cavity for molding an encapsulation of material over the assembly for defining an encapsulated probe tip, allowing the encapsulated probe tip to cure; removing the encapsulated probe tip from the mold cavity; removing the support pin from the assembly, and coupling a cable to the encapsulated probe tip for forming the proximity probe.Type: GrantFiled: April 10, 2001Date of Patent: November 11, 2003Assignee: Bently Nevada LLCInventor: Robert Ivan Rose
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Publication number: 20020105323Abstract: Disclosed herein is a magnetic head wear-rate measuring apparatus for measuring the rate of head wear in noncontact form and with high accuracy. A magnetic sensor is disposed so as to be opposed to a magnetic head and serves as a part of oscillating elements of an oscillator circuit. A magnetic resistance of a magnetic circuit at a rotational position where the magnetic head faces the magnetic sensor, changes according to the degree of extension of the magnetic head from the surface of a drum, and the change in magnetic resistance acts as a variation in oscillating frequency. The change in frequency is converted into a counter output. A counter is supplied with a pulse Pd of a measured oscillating frequency and correspondingly produces a pulse (counter output) Px having a pulse width up to the counting of a predetermined number of pulses. Thereafter, the counter output Px is supplied to a second counter where the number of reference clocks lying within the pulse width is counted.Type: ApplicationFiled: October 25, 2001Publication date: August 8, 2002Applicant: SONY CORPORATIONInventors: Seiichi Sakai, Hiroshi Yamauchi
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Publication number: 20020003421Abstract: A method for evaluation of an eddy current testing signal is provided. The method includes the steps of generating a feature amount based on a sample eddy current testing signal obtained by measuring a standard specimen, the feature amount including a feature highly correlated to a secondary factor which is other than a depth of the flaw and which affects the waveform of the signal; generating an evaluation parameter by using the feature amount, the evaluation parameter being a parameter for outputting a value with a sufficiently small error relative to correct answer data on the sample eddy current testing signal; and estimating the depth of a flaw, expressed by an actual measurement eddy current testing signal, by use of the evaluation parameter.Type: ApplicationFiled: January 9, 2001Publication date: January 10, 2002Inventors: Kayoko Kawata, Masaaki Kurokawa, Yoshihiro Asada
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Publication number: 20010017540Abstract: In a non-destructive inspection device of the present invention which detects in a non-destructive manner a defect of a member to be inspected, based on a change in magnetic fluxes due to eddy currents that are generated by an inspection probe having a coil, a driving section which adjusts a position of the inspection probe, and measuring device for, based on a detection signal of the inspection probe, measuring a lift-off between the inspection probe and the member to be inspected are disposed. The driving section is controlled in accordance with a result of measurement of the measuring device, whereby a control of making the lift-off constant is performed.Type: ApplicationFiled: December 20, 2000Publication date: August 30, 2001Inventor: Makoto Arai
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Patent number: 6198280Abstract: Flexible eddy current probes that allow an inspector to interrogate the blade roots or disk slots of different types of blades and disks while using a limited number of probes. The probe includes a rectangular-shaped block assembly, a rectangular-shaped loading platform having a slot therein, and stabilizing slide rods that couple the loading platform to the block assembly. The slide rods are adapted to slide through the block assembly as the block assembly is urged towards the loading platform. The probe further includes a flexible coil within a flexible membrane that produces a magnetic field during the inspection. The flexible coil extends from the block assembly and remains within the device, that is, between the loading platform and the block assembly, when not deployed. When deployed, the flexible coil passes through the slot in the loading platform to allow contact with the surface being inspected. Outriggers within the probe guide the flexible coil onto the surface during deployment.Type: GrantFiled: April 27, 1998Date of Patent: March 6, 2001Assignee: Siemens Westinghouse Power CorporationInventors: Gary Lee Hensley, David Justin Watson, Larry Stephen Price
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Patent number: 5963030Abstract: An openable ring assembly is externally centered around and moved parallel to the centerline of a stationary pipe. As a low-frequency EM source signal is applied to the ring assembly, the time and/or frequency shifts of a detected EM signal from the source signal can be correlated to pipe wall thickness without removal of external pipe insulation and metal cladding, if present. The ring assembly may be opened or expandably segmented to allow pipe thickness detection around obstructions or larger diameter pipe. Centering is preferably accomplished by using rollers circumferentially attached to the ring assembly.Type: GrantFiled: March 30, 1998Date of Patent: October 5, 1999Assignee: Union Oil Company of CaliforniaInventor: Mitchel A. Stark
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Patent number: 5841277Abstract: A probe, such as an eddy current probe, which can be moved by hand to a surface to be tested. A toroidal-shaped first resilient member contacts the bottom face of a support member. An elastic membrane extends over the bore of the first resilient member, contacts the bottom lateral surface of the first resilient member, and is unattached to the radially-inward-facing surface of the first resilient member. A more elastic, second resilient member is placed in the bore, is unattached to the first resilient member, and contacts the bottom surface of the elastic membrane. A flexible, surface-conformable, eddy current sensing coil overlies a portion of the bottom side of the second resilient member.Type: GrantFiled: February 21, 1997Date of Patent: November 24, 1998Assignee: General Electric CompanyInventors: Kristina Helena Valborg Hedengren, John David Young, Thomas Burrows Hewton, Carl Granger, Jr.
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Patent number: 5748003Abstract: A method and apparatus for determining fatigue/surface crack features on metal surfaces is disclosed wherein the cracks may be empty, filled, or covered with a dielectric (e.g., paint). The present invention includes a microwave waveguide having an aperture for scanning over a surface and thereby characterizing changes in a standing wave within the waveguide when a crack is scanned. In particular, crack related data resulting from standing wave perturbations can be analyzed for determining crack geometric features such as crack width, crack depth, crack length and crack tips. These features are determinable with high precision in comparison to the size of the aperture. When locating and/or sizing the geometric features of a crack, voltage changes induced by higher order modes generated by various orientations of the crack in relation to the aperture are utilized for generating the crack related data.Type: GrantFiled: May 14, 1996Date of Patent: May 5, 1998Assignee: Colorado State University Research FoundationInventors: Reza Zoughi, Chin-Yung Yeh, Stoyan I. Ganchev, Christian Huber