Material Flaw Testing Patents (Class 324/238)
  • Patent number: 7474092
    Abstract: Methods and devices for inspecting waterwall tubes for the detection of fire side damage over a long length of the tube are described. The system of the invention uses a magnetostrictive strip and a flat coil-type plate magnetostrictive sensor (MsS) that are held in place on the waterwall using a specially designed frame and an electromagnetic circuit. The magnetostrictive strip and plate type MsS are positioned against a tube in the waterwall using an elastomeric pad or a fluid filled bladder to achieve close contact and good mechanical coupling between the magnetostrictive strip and the tube surface. When current activated, the electromagnet holds the entire assembly in place and provides a DC bias magnetic field required for plate magnetostrictive sensor probe operation. Long-range guided-waves are pulsed into the tube and reflected signals are detected within the same sensor structure.
    Type: Grant
    Filed: July 16, 2007
    Date of Patent: January 6, 2009
    Assignee: Southwest Research Institute
    Inventors: Hegeon Kwun, Hirotoshi Matsumoto, James F. Crane
  • Publication number: 20080278157
    Abstract: An eddy current probe moves along a longitudinal axis and includes a support structure defining a surface, the surface including a set of panels. Conductor coils are distributed across said surface, each panel includes at least one coil section, each coil section lies transverse to the longitudinal axis.
    Type: Application
    Filed: May 21, 2004
    Publication date: November 13, 2008
    Inventor: Jason Scott Zimmerman
  • Publication number: 20080265878
    Abstract: Using eddy currents for automatic inspection of a rectilinear hole formed in a metal part. An eddy-current probe is carried by a drive system associated with a positioning baseplate that carries a calibration part including a hole similar to the hole for inspection and in alignment with an orifice thereof.
    Type: Application
    Filed: April 17, 2008
    Publication date: October 30, 2008
    Applicant: SNECMA
    Inventors: Sadia Bousquet, Patrick Cabanic, Luc Ravize, Jose Claude Jacques Robin
  • Patent number: 7443156
    Abstract: Apparatus and associated method for identifying defects on objects provide for—under computer driving—the AC voltage energization of at least one transmitting coil to be simultaneously effected by a carrier signal, and for an essentially amplitude-modulated received signal to be received by means of at least one receiving coil; what is carried out, furthermore, is a demodulation not only of the carrier signal contained in the received signal by means of magnitude and phase formation, but also a demodulation of the harmonics of the carrier which are contained in the received signal, likewise by means of respectively associated magnitude and phase formation, to be precise preferably by using a Fourier or wavelet transformation method.
    Type: Grant
    Filed: July 18, 2005
    Date of Patent: October 28, 2008
    Assignee: Pruftechnik Dieter Busch AG
    Inventors: Roland Hoelzl, Michael Hermann
  • Patent number: 7436992
    Abstract: A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
    Type: Grant
    Filed: July 30, 2004
    Date of Patent: October 14, 2008
    Assignee: General Electric Company
    Inventors: Ui Won Suh, Gigi Olive Gambrell, John William Ertel, William Stewart McKnight
  • Publication number: 20080211493
    Abstract: An eddy current probe adapted for detecting cracks in material directly beneath a raised-head fastener is disclosed. The probe comprises an eddy current coil and a support means for carrying the coil in an orientation suitable for introducing eddy currents into material directly beneath a raised-head fastener.
    Type: Application
    Filed: October 7, 2005
    Publication date: September 4, 2008
    Inventors: Edward Hohman, Dennis Roach, Rirk Rackow, Phil Walkington, Sohan Singh
  • Patent number: 7414395
    Abstract: The method for detecting stress corrosion cracking (SCC) of pipelines, comprising the steps of: identifying pipeline locations and pipeline conditions that are amenable to inspection by a magnetic flux inline tool and by a TFI tool; performing two inspections on the pipeline, one inspection performed using the magnetic flux inline (MFL) tool and an other inspection performed using the TFI tool; aligning signal features resulting from the two inspections; identifying TFI signals occurring above a specified threshold; identifying MFL signals for a section of pipeline corresponding to the identified TFI signals; for the identified TFI signals, determining whether the MFL signals are below a second threshold level; designating the sections of the pipeline corresponding to identified TFI signals above the threshold and below the second threshold as a potential corrosion feature; identifying TFI signals that exceed a defined metal loss percentage; measuring a width and length of the signal features, and if the widt
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: August 19, 2008
    Assignee: General Electric Company
    Inventors: Ming Gao, Sergio Limon, Richard Clark McNealy, Ron Sherstan
  • Publication number: 20080191693
    Abstract: A system for detecting a condition of a package, the package comprising a sensor responsive to electromagnetic induction and having response characteristics dependent on said condition, the system comprising: an excitation coil magnetically couplable to said sensor; and a receiving coil system magnetically couplable to said sensor, the receiving coil system being connectable to a processing system for determining the sensor response, wherein the receiving coil system is arranged so as to control the electromagnetic coupling between at least part of the receiving coil system and said excitation coil.
    Type: Application
    Filed: March 9, 2006
    Publication date: August 14, 2008
    Applicant: GLAXO GROUP LIMITED
    Inventors: Anthony Patrick Jones, Martyn Edward Stopps
  • Patent number: 7397238
    Abstract: Apparatus and methods for inspecting materials such as cylindrical and tubular members are disclosed. One apparatus includes a frame that supports a magnetic coil and a detector assembly, the detector assembly having one or more magnetic detectors adapted to be spaced a first distance from the material being inspected by one or more substantially frictionless members. This abstract allows a searcher or other reader to quickly ascertain the subject matter of the disclosure. It will not be used to interpret or limit the scope or meaning of the claims.
    Type: Grant
    Filed: July 28, 2005
    Date of Patent: July 8, 2008
    Inventors: William T. Walters, Xiaowen Wu
  • Publication number: 20080129287
    Abstract: It is possible to accurately and stably inspect a scratch in the vicinity of a surface of a cell external case formed by a cylindrical copper plate by using a simple device. The cell external case (1) is rotated around the center axis of the cylindrical shape by a rotation device (2) and a magnetic flux is applied to the rotating cell external case from both ends of a frame (4). When a scratch is present on the cell external case (1), leak magnetic flux is generated which is detected by a magnetic sensor (6) arranged in the vicinity of the cell external case (1) and displayed on a display device (12) via a signal processing device (11). Since the cylindrical cell external case (1) rotates around its center axis, the distance between its surface and the magnetic sensor (6) is not changed and a scratch can be detected stably.
    Type: Application
    Filed: October 25, 2005
    Publication date: June 5, 2008
    Inventor: Osami Matsumura
  • Patent number: 7375514
    Abstract: A non-destructive testing device has an excitation coil with a plurality of conductor ribbons attached to a flexible membrane. A frame supports the membrane and incorporates wheels for translation across a surface to be inspected and resilient suspension for maintaining the membrane with the excitation coil and wheels in intimate contact with the surface, the membrane flexing to maintain contact with a smoothly curved surface as found in aircraft structures. A magnetoresitive (MR) array is supported within the frame inserted in the membrane to be in close proximity to the surface. The MR array detects the magnetic field resulting from the eddy currents created by the excitation coil for identification of cracks or features beneath the surface under inspection.
    Type: Grant
    Filed: November 1, 2005
    Date of Patent: May 20, 2008
    Assignee: The Boeing Company
    Inventors: Raymond D. Rempt, George A. Perry
  • Patent number: 7368907
    Abstract: An electric current perturbation probe includes at least one driver coil and at least one receiver. The at least one driver coil produces an omni-directional magnetic field. The at least one receiver is decoupled from the omni-directional magnetic field. In one example, the at least one driver coil includes a first driver coil that defines a first effective coil axis which is positioned orthogonally to a second effective coil axis of a second driver coil. The first driver coil is provided with a first electrical excitation signal which is phase shifted by 90 degrees from a second electrical excitation signal used to drive the second driver coil.
    Type: Grant
    Filed: July 18, 2006
    Date of Patent: May 6, 2008
    Assignee: United Technologies Corporation
    Inventors: David A. Raulerson, Kevin D. Smith
  • Patent number: 7355395
    Abstract: A system for non-destructive non-contact quality inspection of dry electrode units of energy storage includes an eddy current-based inspection system having a conveyor belt, and a hollow dielectric shell. An outer surface of the shell has a plurality of spaced apart measuring transducers. Each of the transducers include a feed-through eddy current probe and at least two strap capacitors spatially linked therewith. In the related method, an electrode unit to be inspected is placed on the conveyor belt and enters and moves through the dielectric shell. The electrode unit is excited using a magnetic field from the eddy current probe as it passes by each of the plurality of transducers, where eddy currents at a plurality of frequencies are induced in the electrode unit. The modulation characteristics of impedance at a plurality of frequencies are measured by the probes, and from the impedance data it is determined whether the electrode unit is defective.
    Type: Grant
    Filed: October 6, 2005
    Date of Patent: April 8, 2008
    Assignee: Enerize Corporation
    Inventors: Volodymyr Redko, Volodymyr Khandetskyy, Peter Novak, Elena Shembel, Satoshi Kohara
  • Publication number: 20080079426
    Abstract: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 3, 2008
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Patent number: 7348771
    Abstract: Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.
    Type: Grant
    Filed: September 18, 2006
    Date of Patent: March 25, 2008
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukemik
  • Patent number: 7312607
    Abstract: At least one measurement coil of an eddy current part inspection system is oriented relative to a track surface so that the longitudinal axis of the magnetic field generated by the at least one measurement coil is skewed relative to the track surface so as to be substantially aligned with the longitudinal axis of a part on the track surface which can move thereon through the at least one measurement coil.
    Type: Grant
    Filed: July 20, 2005
    Date of Patent: December 25, 2007
    Assignee: General Inspection LLC
    Inventor: George Nygaard
  • Patent number: 7312608
    Abstract: Systems and methods for inspecting electrical conductivity in composite materials having conductive structures are disclosed. In one embodiment, a system of inspecting electrical conductivity in an electrical bonding region includes a coil coupled to an alternating current source that is configured to induce a current in a conductive structure within the region. A processor is coupled to the coil that is operable to detect an impedance property value from the coil that results from the current induced in the conductive structure.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: December 25, 2007
    Assignee: The Boeing Company
    Inventors: Gary E. Georgeson, Joseph L. Hafenrichter, Everett A. Westerman
  • Patent number: 7304474
    Abstract: There is provided an inspection device for the detection of flaws in a component. The inspection device comprises a magnetic field generator, a first array of magnetoresistive sensors and a second array of magnetoresistive sensors, in which the second array is substantially orthogonal to the first array. The signals generated by the first and second arrays are utilized by a processing element to determine a curl of the magnetic field signals effected by the eddy currents including the eddy currents encountering a flaw in the component. The curl of the magnetic field signals is then used to better illustrate the existence of the flaw and various parameters of the flaw. The magnetic field generator comprises a coil or linear arrays of conductors. The inspection device is preferably contained (1) within a hand-held housing or (2) mounted on any automated inspection platform, and advantageously comprises a display for illustration of the detected flaw.
    Type: Grant
    Filed: November 29, 2005
    Date of Patent: December 4, 2007
    Assignee: The Boeing Company
    Inventor: Raymond Doak Rempt
  • Patent number: 7295004
    Abstract: An eddy current probe includes a plurality of deformable substrates each having a pair of coils wound coaxially thereabout in spaced relation and a housing supporting said plurality of substrates adjacent to each other with each substrate compressed in a direction laterally to the axis of the pair of coils wound thereabout. Desirably, the axis of each pair of coils is positioned spaced from a longitudinal axis of the housing and parallel to a tangent to an exterior surface of the housing.
    Type: Grant
    Filed: March 3, 2006
    Date of Patent: November 13, 2007
    Inventor: Gary Kroner
  • Patent number: 7289913
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: October 30, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
  • Patent number: 7250757
    Abstract: A material analysis system configured to determine whether a circuit is defective includes a magnetic field generator configured to generate a first magnetic field that is configured to induce at least one eddy current in a conductive portion of the circuit, wherein the eddy current induces a second magnetic field; a set of magnetic field sensors configured to detect the second magnetic field and generate a set of image information therefrom; a database that includes circuit information for the circuit; and a computing device configured to receive the image information from the set of magnetic field sensors and retrieve the circuit information from the database, wherein the computing device is configured to compare the image information to the circuit information to determine whether the circuit is defective.
    Type: Grant
    Filed: May 2, 2005
    Date of Patent: July 31, 2007
    Assignee: Radiation Monitoring Devices, Inc.
    Inventor: Tim Tiernan
  • Patent number: 7235967
    Abstract: An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.
    Type: Grant
    Filed: January 6, 2006
    Date of Patent: June 26, 2007
    Assignee: Hitachi, Ltd.
    Inventors: Akira Nishimizu, Tetsuya Matsui, Masahiro Koike, Yoshio Nonaka, Isao Yoshida
  • Patent number: 7218101
    Abstract: A pressure vessel penetration sidewall adjacent a tube installed in the penetration by a clearance fit is inspected by passing an eddy current probe having a pair of circumferential coils through the tube. Eddy currents are induced in the pressure vessel as the probe passes through the penetration tube and degradation of the pressure vessel adjacent the clearance is determined based upon the eddy currents induced in the pressure vessel by the probe.
    Type: Grant
    Filed: December 8, 2004
    Date of Patent: May 15, 2007
    Assignee: Westinghouse Electric Co. LLC
    Inventors: Zoran R. Kuljis, Richard J. Vannucci
  • Patent number: 7215118
    Abstract: A method and an apparatus for structural diagnosis, which generates torsional waves upon a shaft, beam or pipe having arbitrary cross-sections, such as a circular cross-section, and senses existence or location of the cracks through analyzing reflected waves are disclosed. A magnetostrictive transducer comprises a plurality of ferromagnetic strips attached around a circumference of a member having a arbitrary cross-section with a fixed inclination; a first housing disposed to surround the ferromagnetic strips, the first housing being made of insulating material; and a coil would around the first housing. The magnetostrictive transducer can generate torsional waves upon a member when a current is supplied to the coil, and can measure reflected torsional waves.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: May 8, 2007
    Assignee: Seoul National University Industry Foundation
    Inventors: Chan Il Park, Seung Hyun Cho, Soon Woo Han, Yoon Young Kim
  • Patent number: 7190162
    Abstract: A method for inspecting a gas turbine engine rotor disk, wherein the rotor disk includes a plurality of dovetail slots, includes providing a probe assembly including an eddy current probe and a probe fixture, wherein the eddy current probe includes a body portion and a tip portion including an eddy current probe coil. The method also includes inserting the eddy current probe into the probe fixture, coupling the probe fixture to the rotor disk such that at least a portion of the probe fixture is coupled to at least one of the dovetail slots, and such that the eddy current probe is positioned adjacent the rotor disk, generating an eddy current in the rotor disk using the eddy current probe coil, and inspecting the rotor disk using the probe assembly.
    Type: Grant
    Filed: July 23, 2004
    Date of Patent: March 13, 2007
    Assignee: General Electric Company
    Inventors: Brenda Catherine Tenley, Michael Leonard Dziech, Joseph Anthony Traxler
  • Patent number: 7183764
    Abstract: Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.
    Type: Grant
    Filed: August 28, 2003
    Date of Patent: February 27, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian C. Shay, David C. Grundy, Andrew P. Washabaugh
  • Patent number: 7161350
    Abstract: Material condition monitoring may be performed by electromagnetic sensors and sensor arrays mounted to the material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. They can also be mounted such that they do not significantly modify the environmental exposure conditions for the test material, such as by creating stand-off gaps between the sensor and material surface or by perforating the sensor substrate.
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: January 9, 2007
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
  • Patent number: 7154264
    Abstract: The system and method provides a means for inspecting pipelines that have obstructions which prevent conventional inspection pigs from passing the obstructions. The invention uses remote-field eddy current inspection techniques and a uniquely configured excitation coil for inline inspection of pipelines having valves and other fittings that severely restrict or prevent the use of conventional inspection pigs. A unique collapsible excitation coil and a collapsible sensor array enables an inspection pig using these features to pass pipeline obstructions that prevent passage by conventional inspection pigs. The collapsible coil and sensor array provide means for reducing the diameter of an inspection pig to enable it to pass obstructions in the pipeline.
    Type: Grant
    Filed: April 14, 2004
    Date of Patent: December 26, 2006
    Assignee: Southwest Research Institute
    Inventors: Gary L. Burkhardt, Alfred E. Crouch, Jay L. Fisher
  • Patent number: 7123004
    Abstract: The non-destructive inspection method, wherein the non-destructive inspection method supplies currents to a conductive inspection subject and evaluates the rear surface flaw and the embedded flaw of these the inspection subject, or the material characteristic using a DC electric potential method, and an inspection sensitivity to the rear surface flaw, the embedded flaw, or the material characteristic is increased by changing the electric resistivity distribution inside the inspection subject by locally heating a front surface of the inspection subject, thereby increasing an electric resistivity of the front surface of the inspection subject compared with an electric resistivity of the rear surface thereof, resulting in increasing currents supplied on a rear surface side compared with a case without the front surface being heated.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: October 17, 2006
    Assignee: Tohoku Techno Arch Co., Ltd.
    Inventors: Masumi Saka, Hironori Tomyo, Yasuko Saito
  • Patent number: 7107863
    Abstract: A system for inspecting a pipe weld from within a pipe through use of magnetic particle imaging “MPI” includes an apparatus having a head unit that carries a wire wheel brush for cleaning an inspection area along an inner diameter of a pipe weld, and an MPI medium dispenser for spraying an MPI medium upon the inspection area, both controlled by an operator. The head unit also includes a video inspection device controlled by the operator and used for viewing at least portions of the inspection area after being sprayed with the MPI medium and when under the influence of a magnetic field to determine if the weld has any defects. The head unit is connected to a drive unit. The drive unit includes a frame having a longitudinal axis and mounted on a set of drive wheels, and a set of support wheels spaced axially from the drive wheels.
    Type: Grant
    Filed: May 7, 2004
    Date of Patent: September 19, 2006
    Assignee: Vetco Gray Inc.
    Inventors: Larry K. Harthorn, Pedro A. Dioquino
  • Patent number: 7106055
    Abstract: Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition while the sample is being processed. These sample typically have real cracks in or around holes, on curved surfaces, in and under coatings, and on shot peened or otherwise preconditioned surfaces. Processing, such as mechanical or thermal loading to introduce fatigue damage, is stopped once the material condition reaches a predetermined level.
    Type: Grant
    Filed: November 15, 2004
    Date of Patent: September 12, 2006
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 7098655
    Abstract: An eddy-current sensor for nondestructive testing according to the present invention includes a planar exciting coil having a pair of current lines in parallel with each other through which exciting currents flow in opposite directions to each other during the testing, for generating an alternative magnetic field applied to a subject to be nondestructively tested by the exciting currents, and at least one MR element positioned on a central axis between the pair of current lines and on the opposite side to the subject in relation to the exciting coil, for detecting a magnetic field generated newly from the subject by an eddy-current induced by the alternative magnetic field.
    Type: Grant
    Filed: March 29, 2004
    Date of Patent: August 29, 2006
    Assignees: Kanazawa University, TDK Corporation
    Inventors: Sotoshi Yamada, Shigeru Shoji
  • Patent number: 7042223
    Abstract: A method of inspecting a conduit and a conduit inspection device are disclosed. The method relates to producing a primary magnetic field to induce a current in the conduit so that the currents produce a decaying secondary magnetic field influenced by the conduit. The secondary magnetic field is analysed by time domain analysis to provide an indication of the state of the conduit. The device which produces the primary magnetic field can be moved relative to the conduit so that the secondary magnetic field is detected at different positions along the conduit so that the state of the conduit at various positions along the conduit can be determined. The device for producing the primary magnetic field comprises a transmitter having at least one winding and a detector for detecting the secondary magnetic field comprising at least one inductor coil. A storage is provided for storing the data detected by the inductor coil and is coupled to the conductor coil by a communication link.
    Type: Grant
    Filed: June 2, 2003
    Date of Patent: May 9, 2006
    Assignee: Rock Solid Research Pty. Ltd.
    Inventor: James Phillip Cull
  • Patent number: 7038446
    Abstract: An apparatus and method is disclosed for inspecting contours formed along a predetermined region of a surface on a workpiece formed of an electrically conductive material using eddy current. A probe includes a longitudinal axis and is moveable along a path of travel to a static testing position stationary with respect to the predetermined region to be inspected on a workpiece. At least two coils are spaced longitudinally from one another and supported by the probe to be electrically excited with a predetermined frequency and amplitude while at the static testing position with the stationary probe. Sensors are provided for measuring the excitation voltage of each coil as eddy currents are induced in the electrically conductive material of the workpiece by the coils supported on the probe stationary at the static testing position with respect to the workpiece.
    Type: Grant
    Filed: November 26, 2003
    Date of Patent: May 2, 2006
    Assignee: Quantech, Inc.
    Inventor: William Keely
  • Patent number: 7026811
    Abstract: An apparatus for inspecting a metallic post contoured in a single dimension for defects. The apparatus has a clamp having at least one jaw with a surface conforming to the contour to the metallic post. The conforming jaw or jaws also have a plurality of eddy current coils and the probe has at least one sensor configured to sense at least one of position or motion.
    Type: Grant
    Filed: March 19, 2004
    Date of Patent: April 11, 2006
    Assignee: General Electric Company
    Inventors: Robert Martin Roney, Jr., Thomas Francis Murphy
  • Patent number: 7019520
    Abstract: The invention provides an improved method and device for inspecting heat exchanger tubes from within the tube inside diameter that overcomes the shortcomings of the prior art. It adapts a guided-wave probe approach that makes use of a torsional wave mode instead of a longitudinal wave node disclosed in the prior art. The torsional wave mode has many advantages over the longitudinal wave mode for detecting defects. When energized by suitable instrumentation, the probe is caused to generate a torsional mode signal that is transmitted to the heat exchanger tube from the waveguide tube. When reflected signals from defects in the heat exchanger tube walls are returned to the inspection opening end of the heat exchanger tube, the reflected defect signals are transmitted to the probe waveguide tube for amplification, detection and characterization of the reflected signal.
    Type: Grant
    Filed: October 1, 2004
    Date of Patent: March 28, 2006
    Assignee: Southwest Research Institute
    Inventors: Hegeon Kwun, James F. Crane, Sang-Young Kim
  • Patent number: 6967478
    Abstract: The invention relates to apparatus and a method for detecting the condition of the material of a pipeline wall. The apparatus includes means for inducing and detecting magnetic flux at a location on the pipeline and, at said location, sensing means detect whether any change in material condition is on or near the external wall of the pipeline. By analysing the two sets of monitored values a change in condition, such as corrosion, can be detected, located and determined to be at or near the external or internal surfaces of the pipeline wall.
    Type: Grant
    Filed: May 29, 2002
    Date of Patent: November 22, 2005
    Assignee: Advanced Engineering Solutions, Ltd.
    Inventors: Malcolm Wayman, Dudley Dickson
  • Patent number: 6954064
    Abstract: A method and apparatus are provided for measuring a thickness of a nonconductive coating disposed over portions of first and second conductive surfaces that intersect at an intersection angle. The apparatus is a thickness measurement gauge having an eddy current sensor. The thickness measurement gauge includes an eddy current sensor and electronic analyzer. The thickness gauge may be provided with a pressure enclosure. A method of calibrating a thickness measurement gauge and a calibration stand are also provided. The calibration stand has third and fourth conductive surfaces intersecting at the intersection angle. The conductivities of the third and fourth surfaces correspond to the conductivities of the first and second surfaces.
    Type: Grant
    Filed: December 2, 2002
    Date of Patent: October 11, 2005
    Assignee: The Boeing Company
    Inventors: Edward G. Sergoyan, Ronald A. Bradley
  • Patent number: 6952094
    Abstract: A method and system for inspecting a turbine wheel having axial slots along a perimeter thereof that are configured for mating with and securing airfoil members to the perimeter of the wheel, and an annular slot that intersects the axial slots. The method and system make use of one or more eddy current probes that are placed in the annular slot to electromagnetically inspect the annular slot and at least one of the axial slots for cracks in surfaces thereof. The probe is part of a probe assembly that includes a mounting member for engaging at least one of the annular and axial slots. The probe assembly is operable to maintain the probe at a fixed distance from surfaces of the annular slot as the probe travels through the annular slot.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: October 4, 2005
    Assignee: General Electric Company
    Inventor: John Ruediger Mader Viertl
  • Patent number: 6933718
    Abstract: The present invention provides a method for the direct measurement and quantification of the material volume loss on and beneath a first surface of a substrate and thus provides an accurate depiction of the profile of the substrate. The method of the invention comprises inducing multiple eddy currents in a test substrate to determine volume loss.
    Type: Grant
    Filed: June 10, 2002
    Date of Patent: August 23, 2005
    Assignee: The Boeing Company
    Inventors: Michael R. Collingwood, Steven G. Keener
  • Patent number: 6924640
    Abstract: An inspection system for detecting flaws in oil and gas well borehole ferromagnetic tubulars. The inspection device operates inside the tubular by first saturating tubular wall with magnetic flux. Flaws in the wall causes flux leakage, and the magnitude of the flux leakage are measured with Hall effect sensors disposed within the inspection device. The magnitude of flux leakage is then related to the amount of ferromagnetic material loss resulting from the flaw. Eddy currents induced in the wall are also measured and combined with the Hall effect sensor measurements to define location and geometric shape of the flaw.
    Type: Grant
    Filed: November 27, 2002
    Date of Patent: August 2, 2005
    Assignee: Precision Drilling Technology Services Group Inc.
    Inventors: Gary Fickert, John Haynes
  • Patent number: 6911826
    Abstract: A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
    Type: Grant
    Filed: December 3, 2003
    Date of Patent: June 28, 2005
    Assignee: General Electric Company
    Inventors: Yuri Alexeyevich Plotnikov, Thomas James Batzinger, Shridhar Champaknath Nath, Sandeep Kumar Dewangan, Carl Stephen Lester, Kenneth Gordon Herd, Curtis Wayne Rose
  • Patent number: 6894492
    Abstract: A sensor measurement of an article having an article surface shape is performed using a hand-held senor probe having a probe housing, a sensor support rotatably mounted in the probe housing and having an orienting structure defined thereon. The orienting structure is preferably an orienting face with substantially the article surface shape. A sensor, such as a eddy current sensor, is affixed to the sensor support and is operable through the orienting face of the sensor support. The orienting face of the sensor support is pressed against the article surface to orient the sensor support and thence the sensor relative to the article surface, and the sensor measurement is performed. The sensor is preferably a ball having the orienting face thereon, and mounted to the probe housing in a ball-and-socket relationship.
    Type: Grant
    Filed: December 7, 2001
    Date of Patent: May 17, 2005
    Assignee: General Electric Company
    Inventor: Michael Leonard Dziech
  • Patent number: 6850056
    Abstract: A flaw detection device for a steel bar enabling inspection of a high temperature steel bar at a high temperature. A pre-treatment unit 31, detection unit 32, and post-treatment unit 33 are arranged along a running direction of a steel bar 10. The pre-treatment unit and post-treatment unit have the same structure. Direct current coils 312 and 332 are wound around the outside of the sleeves 311 and 331. The steel bar is magnetically saturated by the direct current magnetic field. An eddy current is generated at the surface of the steel bar by an alternating current coil 321 of a detection unit 12. The change in the magnetic field caused by the eddy current is detected by the detection windings 322 and 323. The sleeves are made of nonmagnetic materials, so the strength of the direct current magnetic field becomes flat along the running axis of the steel bar. Even when moving the steel bar at a high speed, the occurrence of noise due to changes in strength of the direct current magnetic field is suppressed.
    Type: Grant
    Filed: September 5, 2001
    Date of Patent: February 1, 2005
    Assignee: Nippon Steel Corporation
    Inventors: Keisuke Fujisaki, Kazuomi Tomita
  • Publication number: 20040257072
    Abstract: The present invention relates to a dual sensitivity eddy current test probe for inspecting a tubular member made of electrically conducting material in order to detect and localize defects in the tubular member, comprising a probe body for movement about a surface of the tubular member, a first test coil assembly for detecting and localizing defects within the tubular member, a first support for the first test coil assembly, a second test coil assembly for acquiring historical data about defects in the tubular member, a second support for the second test coil assembly, and a magnetic coupling interference eliminating system interposed between the first and second test coil assemblies. The first support is mounted on the probe body for holding the first test coil assembly at a first predetermined distance from the surface of the tubular member while the probe body moves about this surface of the tubular member.
    Type: Application
    Filed: June 19, 2003
    Publication date: December 23, 2004
    Inventor: Rock Samson
  • Publication number: 20040232911
    Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.
    Type: Application
    Filed: June 23, 2004
    Publication date: November 25, 2004
    Applicant: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
  • Patent number: 6823269
    Abstract: A method of synthesizing nondestructive examination data of a component including the steps of generating nondestructive examination data of the component in the field and separately generating nondestructive examination data of a specimen machined to simulate selected flaws in the component and combining portions of the specimen data with the field data in a combined data stream.
    Type: Grant
    Filed: April 12, 2002
    Date of Patent: November 23, 2004
    Assignee: Westinghouse Electric Company LLC
    Inventors: Warren R. Junker, Thomas W. Nenno, Hermann O. Lagally
  • Patent number: 6822443
    Abstract: Products are disclosed for measuring electromagnetic fields. One embodiment has at least two coplanar magneto-resestive sensors. Each magneto-resistive sensor has a sensitive axis in the plane of the at least two coplanar magneto-resistive sensors. The at least two magneto-resistive sensors may be orthogonally arranged about a central point to measure orthogonal components of electromagnetic fields.
    Type: Grant
    Filed: September 10, 2001
    Date of Patent: November 23, 2004
    Assignee: Albany Instruments, Inc.
    Inventor: Teodor Dogaru
  • Patent number: 6815948
    Abstract: A method and apparatus for the nondestructive detecting of tension wires in a concrete pole from a single test location without requiring scanning along the length of the pole and without requiring direct contact to the wires. The method and apparatus utilize longitudinal guided waves in tension wires that are generated and detected based on the magnetostrictive sensor principle. The detected signals from broken tension wires and from the ends of concrete pole are analyzed for the number and locations of broken wires.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: November 9, 2004
    Assignee: The Tokyo Electric Power Company, Inc.
    Inventors: Hegeon Kwun, Sang-Young Kim, Kyoichi Asano
  • Publication number: 20040217759
    Abstract: The system and method provides a means for inspecting pipelines that have obstructions which prevent conventional inspection pigs from passing the obstructions. The invention is a system and method that uses remote-field eddy current inspection techniques and a uniquely configured excitation coil for inline inspection of pipelines having valves and other fittings that severely restrict or prevent the use of conventional inspection pigs. The invention relies on a unique collapsible excitation coil and a collapsible sensor array that enables an inspection pig incorporating the invention to pass pipeline obstructions that prevent passage by conventional inspection pigs. The invention provides a means for reducing the diameter of the inspection pig to enable it to pass obstructions in the pipeline.
    Type: Application
    Filed: April 14, 2004
    Publication date: November 4, 2004
    Inventors: Gary L. Burkhardt, Alfred E. Crouch, Jay L. Fisher