Plural Sensors Patents (Class 324/242)
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Publication number: 20040178790Abstract: An eddy current probe and associated method of inspecting a structure are provided that are capable of generating a two-dimensional image of the structure, generally in real time. The eddy current probe includes an eddy current probe array having a plurality of first and second coils that cross one another to define a plurality of sensing elements. The eddy current probe array may also include a plurality of magnetically permeable core elements located coincident with respective sensing elements and at least partially encircled by respective first and second coils. The eddy current probe may also include an alternating current source electrically connected to the first coils and sense electronics for sensing current induced in the second coils. In operation, the current sensed in the second coils represents at least one characteristic of the structure, such as the electrical conductivity of the structure.Type: ApplicationFiled: March 14, 2003Publication date: September 16, 2004Inventors: Carl B. Gifford, Clyde T. Uyehara
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Patent number: 6791319Abstract: An exciting coil is constructed by winding a winding in a groove formed on the outer circumference of a circular ring member, and a detecting coil in the shape of a polygon (such as a triangle and a pentagon) when seen from the front is positioned. One side of the detecting coil is placed in a diameter direction of the exciting coil, inside the exciting coil, and the vertex opposite to the one side is placed apart from the exciting coil so that the detecting coil is orthogonal to the exciting coil. A side surface of the exciting coil on the side opposite to the vertex is placed to face the surface of a test material, and used as a flaw detection surface.Type: GrantFiled: October 1, 2002Date of Patent: September 14, 2004Assignee: Marktec CorporationInventor: Tatsuo Hiroshima
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Publication number: 20040174157Abstract: A process control method is described which uses measurements from magnetic field sensors to monitor the condition of material, such as from a heat treatment process. The sensors can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. The sensors can be exposed to the same process conditions as the material, such as elevated temperatures, or the shielding layers can be placed between the test material and the sensors to reduce sensor exposure to the processing conditions. Additional property measurements, such as sensor lift-off, can be used to ensure proper sensors operation.Type: ApplicationFiled: January 21, 2004Publication date: September 9, 2004Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein
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Patent number: 6784662Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.Type: GrantFiled: March 19, 2002Date of Patent: August 31, 2004Assignee: Jentek Sensors, Inc.Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
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Patent number: 6781370Abstract: The present invention relates to a testing device for detecting and determining material inhomogeneities in electrically conductive samples (10), comprising a support (30) for the samples (10) to be tested, a temperature regulating device (30, 50, 60) for configuring a temperature profile in the sample (10), a drive connected to the support (30) for changing the position of the sample (10) and at least one measuring sensor (20) for contactless measurement of the magnetic field outside the sample (10).Type: GrantFiled: February 1, 2002Date of Patent: August 24, 2004Inventors: Johann H. Hinken, Yury Tavrin
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Patent number: 6774627Abstract: A soft-magnetic material is installed on the opposite side of the magnetism sensing face of magnetism sensing devices. This soft-magnetic material is larger than the magnetism sensing face. Then the detection coverage per sensor is enlarged, and the number of sensors and signal processing circuits are reduced across the width of the strip.Type: GrantFiled: August 26, 2002Date of Patent: August 10, 2004Assignees: Kawasaki Steel Corporation, System Hitec, Ltd.Inventors: Hiroyuki Yokota, Yasuo Tomura, Hideaki Unzaki, Shigetoshi Tsuruoka
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Patent number: 6734669Abstract: A digital synthesizer generates an electrical digital carrier that drives probe coil to generate an electromagnetic wave propagated into a test material proximate the probe coil. A return electromagnetic wave generated by eddy currents in the material includes signatures of material defects modulated on the return carrier electromagnetic wave. The return wave is detected by one or more probe coils, amplified, converted from an analog signal to a digital signal and then digitally mixed with digital sine and cosine functions also generated by the digital synthesizer to yield sum and difference values, mathematically expressing various eddy current signals received by the probe in a complete set of orthogonal functions. A low pass filter then removes all but the difference values. A direct current reference component is subtracted from the mixed digital signal, which translates the signal to center about a zero axis for ease of display and analysis.Type: GrantFiled: June 11, 2002Date of Patent: May 11, 2004Assignee: Zetec, IncInventor: Estell Lopez
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Patent number: 6727690Abstract: A method for determining a “safe-operation” point for a metal structural element subjected to repeated loading, the same or different, generating variable levels of strain and residual stress in the worked element; and, predicting the imminent failure of the structural element. The surface of the metal element is worked to provide a residual strain, for example, by shot-peening. Measurements of electrical conductivity are compared at various chosen frequencies corresponding to different depths in the “near-surface” of the element. Similar measurements are made in the near-surface of a “standard” and a first difference is computed between the conductivity of the shot-peened surface and the “standard” surface. This first difference provides a basis for comparison of the effects of residual stress after successive loadings of the shot-peened metal element.Type: GrantFiled: August 20, 2002Date of Patent: April 27, 2004Inventor: Jack Arbuthnott Soules
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Patent number: 6727691Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.Type: GrantFiled: January 15, 2002Date of Patent: April 27, 2004Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
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Publication number: 20040075429Abstract: An exciting coil is constructed by winding a winding in a groove formed on the outer circumference of a circular ring member, and a detecting coil in the shape of a polygon (such as a triangle and a pentagon) when seen from the front is positioned. One side of the detecting coil is placed in a diameter direction of the exciting coil, inside the exciting coil, and the vertex opposite to the one side is placed apart from the exciting coil so that the detecting coil is orthogonal to the exciting coil. A side surface of the exciting coil on the side opposite to the vertex is placed to face the surface of a test material, and used as a flaw detection surface.Type: ApplicationFiled: October 10, 2003Publication date: April 22, 2004Applicant: MARKTEC CORPORATIONInventor: Tatsuo Hiroshima
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Patent number: 6720775Abstract: A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.Type: GrantFiled: June 12, 2001Date of Patent: April 13, 2004Assignee: General Electric CompanyInventors: Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Curtis Wayne Rose, Thomas James Batzinger, Kenneth Gordon Herd
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Publication number: 20040066188Abstract: Inductive sensors measure the near surface properties of conducting magnetic materials. The sensors generally include parallel winding segments to induce a spatially periodic magnetic field in a material under test. The sensors may provide a directionally dependent measure with measurements made in varying orientations of the sensor with respect to the material property variation directions. The sensors may be thin, conformable sensors that can be mounted on a test material and, for example, monitor crack initiation under the sensor. A second sensor may be left in air to provide a reference measurement, or the temperature of the material under test can be varied to verify the response of the individual sensing elements. Sensors can be mounted to materials under test in order to not modify the environment that is causing the stress being monitored.Type: ApplicationFiled: August 4, 2003Publication date: April 8, 2004Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik
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Publication number: 20040056654Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: ApplicationFiled: May 20, 2003Publication date: March 25, 2004Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
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Publication number: 20040056656Abstract: The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.Type: ApplicationFiled: September 24, 2002Publication date: March 25, 2004Applicant: General Electric CompanyInventors: William Stewart McKnight, Shridhar Champaknath Nath, Sandie Elizabeth Gresham, Richard Lloyd Trantow, Douglas Edward Ingram, John William Ertel, Thomas James Batzinger, Curtis Wayne Rose, Francis Howard Little
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Patent number: 6710595Abstract: The directed field array comprises a cylindrical solenoid 10 and a base 20 located transverse the solenoid axis 11. An array of mutually spaced apart posts 24 extends from the base 20 such that the magnetic field 22 passes through the base 20 and into the array of posts 24, dividing and focusing the magnetic field into discretized magnetic field divisions 22′ through the several posts. In a first configuration, the base 20 is disposed transverse the end of the coil center or core 12 with the array of posts 24 extending from the base 20 away from the solenoid 10 longitudinally with the solenoid axis 11. In an alternative configuration, at least one base 20″ locates at a solenoid end 30 transverse the solenoid axis 11 with an array of posts 24″ extending radially from the base 20, equally spaced apart circumferentially about the base. Multiple bases are typically aligned with their posts staggered.Type: GrantFiled: August 27, 2002Date of Patent: March 23, 2004Inventor: Christopher Hils
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Publication number: 20040041561Abstract: The directed field array comprises a cylindrical solenoid 10 and a base 20 located transverse the solenoid axis 11. An array of mutually spaced apart posts 24 extends from the base 20 such that the magnetic field 22 passes through the base 20 and into the array of posts 24, dividing and focusing the magnetic field into discretized magnetic field divisions 22′ through the several posts. In a first configuration, the base 20 is disposed transverse the end of the coil center or core 12 with the array of posts 24 extending from the base 20 away from the solenoid 10 longitudinally with the solenoid axis 11. In an alternative configuration, at least one base 20″ locates at a solenoid end 30 transverse the solenoid axis 11 with an array of posts 24″ extending radially from the base 20, equally spaced apart circumferentially about the base. Multiple bases are typically aligned with their posts staggered.Type: ApplicationFiled: August 27, 2002Publication date: March 4, 2004Inventor: Christopher Hils
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Patent number: 6697710Abstract: A gas pipe explorer formed of a plurality of connecting elements, and an articulation element between the connected elements. The connected elements include drive capabilities, and the articulation element allows the connected elements to traverse gas pipes of arbitrary shapes and sizes. A sensor may sends the characteristics of the gas pipe, and the communication element may send back those sends characteristics. The communication can be wired, over a tether connecting the device to a remote end. Alternatively, the connection can be wireless, driven by either a generator or a battery.Type: GrantFiled: March 28, 2001Date of Patent: February 24, 2004Assignee: California Institute of TechnologyInventor: Brian Wilcox
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Publication number: 20040021461Abstract: Methods and apparatus are described for the inspection of materials and the detection and characterization of hidden objects, features, or flaws. Sensors and sensor arrays are used to image form two-dimensional images suitable for characterizing the hidden features. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and conducting materials, while capacitive sensors can be used for dielectric materials. Enhanced drive windings and electrode structures permit nulling or cancellation of local fields in the vicinity of the sense elements to increase sensor sensitivity. The addition of calibration windings, which are not energized during measurements, allows absolute impedance and material property measurements with nulled sensors. Sensors, sensor arrays, and support fixtures are described which permit relative motion between the drive and sense elements. This facilitates the volumetric reconstruction of hidden features and objects.Type: ApplicationFiled: June 3, 2003Publication date: February 5, 2004Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh
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Patent number: 6683452Abstract: A display apparatus of magnetic flux density for detecting an internal crack of a metal or a shape of the metal includes a three-dimensional magnetic flux focusing unit installed near the metal, for concentrating magnetic flux generated by the metal, a magnetic flux density measurement unit installed near the magnetic flux focusing unit, for measuring changes in magnetic flux density concentrated by the magnetic flux focusing unit, and a display unit electrically connected with the magnetic flux measurement unit, for real-time displaying and storing changes in the magnetic flux density.Type: GrantFiled: November 30, 2001Date of Patent: January 27, 2004Assignee: Lacomm Co., Ltd.Inventors: Jin-yi Lee, Won-ha Choi, Min-soo Kim, Dae-jung Kim, Moon-phil Kang
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Publication number: 20040004475Abstract: Apparatus and methods are described for the improved throughput and increased reliability for inspection of critical surfaces on aircraft engine disks. Eddy current sensor arrays allow two-dimensional images to be generated for detection of cracks in regions with fretting damage. Background variations due to fretting damage and stress variations are also accommodated. These arrays are combined with instrumentation that permits parallel data acquisition for each sensing element and rapid inspection rates. Inflatable support structures behind the sensor array improve sensor durability and reduce fixturing requirements for the inspection.Type: ApplicationFiled: April 18, 2003Publication date: January 8, 2004Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, J. Stephen Cargill, Darrell E. Schlicker, Ian C. Shay, Andrew P. Washabaugh, Vladimir Tsukernik, David C. Grundy, Mark D. Windoloski
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Patent number: 6657429Abstract: Inductive sensors measure the near surface properties of conducting magnetic materials. The sensors generally include parallel winding segments to induce a spatially periodic magnetic field in a material under test. The sensors may provide a directionally dependent measure with measurements made in varying orientations of the sensor with respect to the material property variation directions. The sensors may be thin, conformable sensors that can be mounted on a test material and, for example, monitor crack initiation under the sensor. A second sensor may be left in air to provide a reference measurement, or the temperature of the material under test can be varied to verify the response of the individual sensing elements. Sensors can be mounted to materials under test in order to not modify the environment that is causing the stress being monitored.Type: GrantFiled: September 20, 2000Date of Patent: December 2, 2003Assignee: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Vladimir A. Zilberstein
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Patent number: 6633159Abstract: A method and system for detecting or measuring defects in a rope having ferromagnetic tension members includes a magnetic field exciter and an array of magnetic flux sensors corresponding to the tension members in a known relationship. Measurements of magnetic flux leakage are indicative of defects. Another aspect of the invention includes a method and system for detecting or measuring defects in an elevator rope having electrically conductive tension members, whereby measured electrical resistance in the tension members is indicative of defects.Type: GrantFiled: March 29, 1999Date of Patent: October 14, 2003Assignee: Otis Elevator CompanyInventors: Terry M. Robar, William A. Veronesi, Paul A. Stucky, Jack F. Gieras
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Publication number: 20030169035Abstract: The invention relates to a method of determining a surface profile of an electrically conductive object, using a probe having a transmitter/receiver arrangement for inducing transient eddy currents in the object, for providing a signal indicative of a magnetic field property, the method having the following steps:Type: ApplicationFiled: February 26, 2003Publication date: September 11, 2003Inventor: Paulus Carolus Nicolaas Crouzen
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Publication number: 20030155914Abstract: Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.Type: ApplicationFiled: January 21, 2003Publication date: August 21, 2003Applicant: JENTEK Sensors, Inc.Inventors: Vladimir Tsukernik, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker, Karen E. Walrath, Eric Hill, Vladimir A. Zilberstein
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Patent number: 6583617Abstract: A Barkhausen probe includes a magnetizing field generator, a magnetoresistive magnetic field sensor, a direct current power supply for biasing the magnetoresistive magnetic field sensor and signal conditioning electronics. The Barkhausen probe is capable of generating and sensing the Barkhausen noise emanating from the surface of a cyclic magnetized specimen. The conditioned Barkhausen noise output of the signal conditioning electronics is usable as input to various analysis systems where textural analysis of the material can be performed.Type: GrantFiled: August 28, 2001Date of Patent: June 24, 2003Assignee: Kemp CorporationInventors: Gerald C. LeVert, Francis E. LeVert
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Publication number: 20030071615Abstract: An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.Type: ApplicationFiled: March 19, 2002Publication date: April 17, 2003Applicant: JENTEK SensorsInventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Karen E. Walrath, Ian C. Shay, David C. Grundy, Mark Windoloski
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Patent number: 6549005Abstract: A method and apparatus for high speed magnetic detection of surface fatigue cracks in railway rails. The magnetic material of the rail is magnetized by touch magnetization using a permanent magnet (31), leaving a remanent magnetic field. A sensor head (30, 50) having a plurality of Hall effect sensors (32) senses stray flux generated in the vicinity of surface fatigue in the rail head by the remanent magnetic field. The sensor head (30, 50) may incorporate a proximity sensor (60) to compensate for variations in sensor height. The apparatus may be mounted on a conventional track recording vehicle (TRV) for use in routinely monitoring the surface fatigue severities in rail along a railway.Type: GrantFiled: June 1, 1999Date of Patent: April 15, 2003Assignee: Technological Resources Pty. Ltd.Inventors: Sid Hay, Robert Street, Robert Gordon Vanselow
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Patent number: 6545467Abstract: Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.Type: GrantFiled: October 27, 2000Date of Patent: April 8, 2003Assignee: General Electric CompanyInventors: Thomas James Batzinger, James Paul Fulton, Curtis Wayne Rose, Lee Cranford Perocchi
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Patent number: 6545469Abstract: An embedded eddy current inspection apparatus includes a substrate having an opening, and a test eddy current coil (“test coil”) affixed to the substrate near the opening. An internally inspected multilayer component structure includes an upper layer, a lower layer, and an eddy current probe embedded between the upper and lower layers. The eddy current probe includes the test coil facing a subject layer selected from the upper and lower layers. A method of inspecting a multilayer component structure includes simultaneously energizing the test coil and a reference eddy current coil (“reference coil”) embedded between the upper and lower layers and facing the subject layer. The reference coil is located in a reference region of the multilayer structure. A test signal from the test coil is compared with a reference signal from the reference coil, to determine whether a flaw is present in the subject layer near the test coil.Type: GrantFiled: October 31, 2001Date of Patent: April 8, 2003Assignee: General Electric CompanyInventors: Thomas James Batzinger, Shridhar Champaknath Nath, Kenneth Gordon Herd
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Patent number: 6538435Abstract: Detecting the presence of an anomaly in or near an object using a probe comprises: a) selecting a set of points on the near surface which are to be inspected, and selecting a first direction and a second direction; b) selecting a first inspection point from the set; c) positioning the probe at the selected inspection point in the first direction, inducing eddy currents in the object and determining a characteristic value of the electromagnetic field; d) positioning the probe in the second direction at the selected inspection point, inducing eddy currents in the object and determining a characteristic value of the electromagnetic field; e) selecting a next inspection point from the set and repeating steps c) and d) until all inspection points have had their turn; and f) inferring that an anomaly is present at an inspection point if a combination of the characteristic values in the first and second direction deviates significantly from a norm.Type: GrantFiled: August 17, 2001Date of Patent: March 25, 2003Assignee: Shell Oil CompanyInventors: Paulus Carolus Nicolaas Crouzen, Mark Theodoor Looijer, Johan van der Steen
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Publication number: 20030025497Abstract: The present invention provides a method for the direct measurement and quantification of the material volume loss on and beneath a first surface of a substrate and thus provides an accurate depiction of the profile of the substrate. The method of the invention comprises inducing multiple eddy currents in a test substrate to determine volume loss.Type: ApplicationFiled: June 10, 2002Publication date: February 6, 2003Applicant: The Boeing CompanyInventors: Michael R. Collingwood, Steven G. Keener
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Patent number: 6501267Abstract: The present invention relates to an eddy current testing probe, which is suitable for used in a nondestructive test. The eddy current testing probe is provided with an excitation coil (2, 2a, 2b) which generates an alternating magnetic field to generate an eddy current (12) in a specimen (10), and a pair of detection coils (1a, 1b) differentially connected and arranged in phase. A central portion (C1) of the pair of detection coils and a central portion (C2) of the excitation coil (2, 2a, 2b) are arranged to be located at an identical or an almost identical position in a plan view taken in the direction toward the specimen (10), and a flaw (11) on the specimen (10) is detected based on a difference between voltages generated in the pair of detection coils (1a, 1b) due to the eddy current (12).Type: GrantFiled: February 29, 2000Date of Patent: December 31, 2002Assignee: Mitsubishi Heavy Industries, Ltd.Inventors: Masaaki Kurokawa, Mitsuyoshi Matsumoto
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Patent number: 6492808Abstract: A magnetic non-destructive method and an apparatus for measurement of cross sectional area of elongated ferrous objects such as steel wire ropes and for detecting local flaws is disclosed. A section of a wire rope is magnetized by longitudinally spaced magnetic poles. A magnetic field parameter, e.g. magnetic flux density, is measured in, by at least, one pair of points between the poles of magnetizing device (in an inter-pole area) at the object under test surface. The pair of points is formed by two sensors placed in the inter-pole area along a direct line parallel to the rope axis. The rope cross sectional area corresponds to a sum of the sensor pair signals. Local flaws, such as broken wires and pitting corrosion in the rope, is detected by a first differences of signals of the sensor pair.Type: GrantFiled: June 29, 2000Date of Patent: December 10, 2002Assignee: Intron Plus, Ltd.Inventors: Vasily Vasilievich Sukhorukov, Serguei Borisovich Belitsky
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Patent number: 6483302Abstract: An apparatus for the magnetic inspection of ferrous conduit for signs of wear includes a housing having a first end, a second end and a conduit travel passage extending through the housing from the first end to the second end. At least one coil is positioned within the housing encircling the conduit travel passage. The coil is disposed at an angle to the conduit travel passage so as to create a transverse flux component. Sensor supports are positioned along the conduit travel passage encircled by the coil. At least one sensor array is mounted on the sensor supports. The sensor array is oriented to detect flux patterns which extend transversely relative to the conduit travel passage. A computer is in communication with the sensor array to receive and interpret signals from the sensor array.Type: GrantFiled: July 7, 2000Date of Patent: November 19, 2002Assignee: R.D. Tech Inc.Inventors: David Grant Rusnell, Timothy Dayn Rogers, William John Woods, Ian Thomas Moss
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Publication number: 20020163333Abstract: An apparatus that measures electrical impedance. The apparatus includes a signal generator controlled by a master microcontroller, a plurality of data acquisition channels, each channel containing a microcontroller, a host computer that processes and stores measured values, and a communication line between the host computer and the master microcontroller.Type: ApplicationFiled: May 23, 2002Publication date: November 7, 2002Applicant: JENTEK Sensors, Inc.Inventors: Darrell E. Schlicker, Neil J. Goldfine, Eric L. Miller
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Patent number: 6476605Abstract: Inductive sensor for non-contact detection of discontinuities of a conductive or ferromagnetic target for determination of target position, movement and speed, or generally of a magnetic image, including a plurality of receiving secondary windings associated with each exciting primary winding, configured to obtain electric signals optimized as a function of the discontinuities of the target. The sensor, combined with a suitable electric measuring circuit, allows global analysis of the signals provided by the secondary windings and configuration of a network in accordance with a predefined selection. An adaptive circuit allows auto-calibration of the sensor.Type: GrantFiled: March 13, 2000Date of Patent: November 5, 2002Assignee: CSEM Centre Suisse d'Electronique et de Microtechnique SAInventor: Yves de Coulon
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Patent number: 6456066Abstract: A pipeline inspection vehicle which can be towed through a pipeline via a cable. The vehicle includes a power unit, a master processor module, and a coil which generates an eddy current field which passes along the pipe. The resultant field is detected by a master sensor ring and slave sensor ring. Information on an amplitude and phase of the detected field together with vehicle orientation information is sent to a base station which has a computer. A distance encoder also is provided to assist in locating the position of any detected faults.Type: GrantFiled: May 25, 2000Date of Patent: September 24, 2002Assignee: Lattice Intellectual Property LimitedInventors: John Ferris Burd, James Edward Ramshaw
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Publication number: 20020121896Abstract: The present invention provides a leakage flux flaw detecting method in which a ferromagnetic substance such as a steel sheet or coil is magnetized by a plurality of magnetic fields with different intensity and magnetic flux leaking from the ferromagnetic substance having been magnetized is detected by a magnetic sensor, and output signals of the magnetic sensor after the detection of leakage flux are processed so that a signal caused by a flaw in the ferromagnetic substance is highlighted. Since this leakage flux flaw detecting method makes it possible to detect flaws with high accuracy, a scaled or descaled hot rolled steel sheet or coil in which the accurate flaw information such as location, density, size, and the like is known can be provided by applying this method to the manufacturing of hot rolled steel sheet or coil.Type: ApplicationFiled: January 7, 2002Publication date: September 5, 2002Applicant: NKK CorporationInventors: Hiriharu Kato, Junichi Yotsuji, Akio Nagamune
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Publication number: 20020105325Abstract: A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.Type: ApplicationFiled: January 15, 2002Publication date: August 8, 2002Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh
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Patent number: 6420867Abstract: An apparatus and a method of detecting wide spread fatigue damage (WFD) on aircraft using the absolute conductivity of the metal. A meandering winding magnetometer (MWM) having a plurality of parallel spaced linear conductor elements are placed in proximity to the aircraft. An electromagnetic field is imposed on the aircraft and the resulting response is sensed. The response is transformed to determine the conductivity of the aircraft structure. The mapping of the conductivity of the aircraft structure produces an indication where microcracks are located in the structure. These early indications of the density, spatial distribution and spatial orientation, as well as the size, of the microcracks give the user an indication of WFD.Type: GrantFiled: March 13, 1998Date of Patent: July 16, 2002Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis
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Patent number: 6414483Abstract: A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.Type: GrantFiled: July 27, 2000Date of Patent: July 2, 2002Assignee: General Electric CompanyInventors: Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose, Paul Peter Stryjek
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Patent number: 6400146Abstract: A sensor head with multiple sensors for ACFM based crack detection and sizing. An alternating current electromagnetic yoke is used to induce a uniform magnetic field on the surface of the test piece. A reference coil in the sensor head detects the background field strength of the magnetic field. Multiple sensors, the axis of each of which is in an angled relationship to the reference coil, detect variations in the magnetic field. The sensor coil axes can be chosen to detect and size both angled and straight cracks.Type: GrantFiled: September 12, 2000Date of Patent: June 4, 2002Assignee: Her Majesty the Queen in right of Canada as represented by the Ministry of Natural ResourcesInventor: George Roy
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Patent number: 6377040Abstract: An eddy current-based test probe is used for checking especially the edges of rolled steel rods. It detects defects both in the transverse and also the longitudinal direction of these rods. The probe has a combination of several coils with which magnetic flux differences can be detected. The simultaneous sensitivity of the probe in the transverse and longitudinal directions of the test specimen is induced by its executing rotary motion around its vertical axis. An electrical induction motor is used as the drive for rotary motion. The electrical feed and receiving signals of the probe system are coupled and decoupled without contact via a rotary transformer.Type: GrantFiled: July 26, 1999Date of Patent: April 23, 2002Assignee: Pruftechnik Dieter Busch AGInventor: Ludwig ter Hell
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Patent number: 6373244Abstract: An apparatus for locating positions on a surface of a structural member indicating the presence of elements within and below the surface of the structural member by means of a detector (1) including a scanning head (3), a position measuring device (4) and an evaluation unit (5) all located within a housing (2). A marking device (6) is connected to and interacts with the evaluation unit (5) for automatically placing a visible marking on the surface of the structural member at the location of the elements scanned by the detector.Type: GrantFiled: April 21, 1999Date of Patent: April 16, 2002Assignee: Hilti AktiengesellschaftInventor: Hansjörg Nipp
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Patent number: 6351120Abstract: A meandering winding magnetometer (MWM) includes a meandering primary winding and at least one sensing winding or coil on a membrane to be pressed against a test surface. The membrane may be supported on a flexible carrier which is translatable into a probe. Abutments in the probe press the carrier against the test surface but allow the carrier and membrane to conform to the test surface. One MWM circuit includes meandering primary and secondary windings. The return leads from the secondary winding return to connector pads in close alignment with the test array, while leads from the primary winding are spaced at least one wavelength from the array. In another MWM circuit, individual sensing loops are positioned within the meandering primary winding. The MWM circuit may be provided on an adhesive tape which may be cut to length.Type: GrantFiled: December 28, 2000Date of Patent: February 26, 2002Assignee: JENTEK Sensors, Inc.Inventor: Neil J. Goldfine
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Patent number: 6344739Abstract: In an eddy current testing probe, efficiency is improved by multiplexing, at the probe head, signals to and from a large number of coils on the probe head onto a reduced number of signal conductors, and by reusing coils in different measurement configurations in order to provide a higher density of inspection coverage.Type: GrantFiled: July 9, 1999Date of Patent: February 5, 2002Assignee: R/D Tech Inc.Inventors: Florian Hardy, Rock Samson
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Patent number: 6316937Abstract: An apparatus for detecting and measuring axially extending defects in ferrous tube includes a magnetizing coil for inducing a longitudinal magnetic field in the ferrous tube. Linear magnetic transducers are used to detect parallel non-linking flux leakage that occurs from axially extending defects. An analog to digital converter digitizes the measured signals representing the amount of parallel non-linking flux leakage detected. A processor subtracts signals typical of ferrous tube with no axially extending defects from the measured signals. The processor further processes the resulting signals after subtraction, by separating the alternating AC components from the constant DC components to remove the effects of perpendicular flux leakage, which may exist in the measured signals. The processor then calculates the percentage of missing material due to the axially extending defects by applying a proportionality equation to the remaining DC components of the measured signals.Type: GrantFiled: October 13, 1999Date of Patent: November 13, 2001Assignee: Oilfield Equipment Marketing, Inc.Inventor: Brian Wade Edens
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Patent number: 6310476Abstract: This invention prevents the failure of detection for horizontal and oblique lift-offs in a probe for an eddy current flaw detection test. A plurality of probes are provided, and each probe includes four detection coils. Two adjacent eddy current flaw detecting probes commonly own (share) one of the four coils. The detection coils are connected to a bridge circuit for picking up a flaw signal. The detection coils are adjusted so that interlinkage magnetic fluxes generated inside the detection coils by the eddy current become equal. An excitation coil for inducing the eddy current in a test piece by AC driving can be disposed over the detection coils. The center of the excitation coil is positioned on the center axes of the detection coils. An oscillator for applying an AC current to this excitation coil is connected to the coil.Type: GrantFiled: May 24, 2000Date of Patent: October 30, 2001Assignee: Mitsubishi Heavy Industries, Ltd.Inventors: Seiichi Kawanami, Masaaki Kurokawa, Takeo Kamimura
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Patent number: 6291992Abstract: A device is disclosed for inspecting an object of electrically conductive material, in which a non-static-signal transmitter generates an electromagnetic field in the object, and a receiver measures the variations of the eddy current generated by the non-static electromagnetic field and produces a signal representing the decay of the eddy current. The non-static-signal transmitter is provided with at least two laterally spaced-apart emitters for emitting an electromagnetic field, which emitters are, during normal operation, so driven that the resulting electromagnetic field in the central region between the emitters is intensified.Type: GrantFiled: June 30, 1997Date of Patent: September 18, 2001Assignee: Shell Oil CompanyInventors: Petrus Willem van Andel, Maarten Lorenz, Ricky Eduardo Ricardo Meyer
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Patent number: 6291991Abstract: The present invention relates to a device for continuously monitoring the junction of a conveyor belt which is made of rubber or a rubber-type plastic material and which comprises supports inserted therein for reinforcing the same. In an advantageous embodiment, the device essentially comprises the following constituent members for the junction area: mainly four reference marks, two addresses as well as four detection heads, the heads being located above the carrier surface of the conveyor belt. This invention further relates to other advantageous embodiments of this device.Type: GrantFiled: February 11, 2000Date of Patent: September 18, 2001Assignee: Phoenix AktiengesellschaftInventor: Wolfgang Schnell