Abstract: Provided is an analyzing apparatus including a charge amount analyzing unit configured to analyze, by using a device simulator configured to simulate a transient change of a charge in a semiconductor device having a first main terminal and a second main terminal, a change of a charge amount at any one of the terminals when a power source voltage applied between the first main terminal and the second main terminal is changed by a displacement voltage smaller than an initial voltage after a current flowing between the first main terminal and the second main terminal is stabilized with the semiconductor device being set to an ON state and the power source voltage being set to the initial voltage, and a capacitance calculating unit configured to compute a terminal capacitance at any one of the terminals based on the change of the charge amount analyzed by the charge amount analyzing unit.

Abstract: In at least selected embodiments, an industrial size continuous Hipot testing system has defect mapping capability capable of finding pinholes, weak spots, and/or embedded conductive particles in non-conductive sheet materials. Continuous testing is made possible through a pair of uniquely designed rollers, such as conductive polymer rollers. Automatic defect mapping is also incorporated into the system through the integration of the Hipot testing and line scan camera systems. The unit potentially has wide applications in many industries, such as, for example, semi-conductors and electronics, medical, high end packaging, and so forth.

Abstract: A metal-to-metal leakage and breakdown testing structure for semiconductor structures and method of using the testing structure is disclosed. The testing structure includes plurality of resistor bridges connected to respective two terminal devices. The testing structure further includes a plurality of switches each having a voltage node provided between resistors of a respective one of the plurality of resistor bridges. The voltage node is read at a circuit pad when a respective one of the plurality of switches is in an on state. The testing structure further includes a device turning on and off each of the plurality of switches, individually.

Abstract: A time-to-breakdown for a dielectric layer in a semiconductor device is determined based upon a sudden change in capacitance. An alternating voltage, greater in magnitude than an operating voltage of the device, is applied to the semiconductor device, capacitance is measured across the dielectric layer during the application of the voltage until a sudden change in capacitance occurs, thereby indicating a breakdown in the dielectric layer, and the breakdown time is scaled to the operating voltage.

Abstract: A method for measuring degradation of electrical power system device insulation utilizes a conductive composite sensor. A selected polymeric matrix of the conductive composite provides a sensor resistance response that correlates to degradation of the insulation. The sensor may be embedded in the windings, core or stator of the electrical power system device and wired to a connector on the electrical power system device for interrogation by an ohmmeter.

Abstract: A valuation method of a dielectric breakdown lifetime of a gate insulating film for evaluating the dielectric breakdown lifetime of the gate insulating film of a MOS type element includes the steps of: deciding a Weibull slope of lifetime distribution until reaching a soft breakdown of the gate insulating film of the MOS type element; deciding a detection condition of the soft breakdown from the decided Weibull slope after the above step; and executing a dielectric breakdown test by using the decided detection condition.

Abstract: A method for measuring degradation of electrical power system device insulation utilizes a conductive composite sensor. A selected polymeric matrix of the conductive composite provides a sensor resistance response that correlates to the mechanical degradation of the insulation. The sensor may be embedded in the windings, core or stator of the electrical power system device and wired to a connector on the electrical power system device for interrogation by an ohmmeter.

Abstract: An automated test system is provided for evaluating characteristics of photoreceptors used in the electrophotographic process. The test system includes a dielectric material support adapted to receive said dielectric material one or more electrodes adapted to apply electrical energy from a source to a two dimensional area adjacent the support for storage by the dielectric material and a sensor for the electrical energy stored in the dielectric material and providing an output representation of the dielectric relaxation of the material in response to the stored energy over the two dimensional area. This test system provides advantages over conventional Electrostatic Charge Decay (ECD) methods by eliminating corona pre-charging and a moving detector when a full-length array is used. Also, this test system utilizes a lower cost current detector in comparison to conventionally used voltage detectors.

Abstract: A stray field electrode (1) includes a base material (2) and a conductive filler material (3). The base material is preferably an insulating material, such as a silicone elastomer film. The conductive filler material is preferably a metal, such as silver particles dispersed in the silicone elastomer film. A set of stray field electrodes (16, 17, 18) may be used to determine the presence of water in a material (8), such as electrical generator insulation (14), by comparing a phase angle for the electric field (19, 20) between the electrodes with a predetermined phase angle for a dry material (8).

Abstract: For the electrical testing of base material for manufacturing printed circuit boards, firstly smooth edges to the copper layers of the base material, free of deformation, are produced, preferably in a milling process, which base material is subsequently subjected to testing for a sufficiently high level of electrical resistance between the two copper layers. Successful resistance testing is followed by testing for the dielectric strength of the insulating layer of the base material by measuring the current conduction produced as a result of a disruptive breakdown. This process serves to reduce the amount of processed base material which is rejected, on which, at the present state of the art, there is no electrical testing prior to processing.

Abstract: A method of determining the position and condition of reinforcing steel embedded in concrete is described. The method is non-invasive. Electrodes are use to carry out the method by contacting the outer surface of the concrete. The method measures the impedance of selected regions of the concrete by measuring the voltage generated across said selected regions by a current flowing through the concrete.

Abstract: A process is disclosed for ascertaining the microdefect levels of an electrophotographic imaging member comprising the steps of measuring either the differential increase in charge over and above the capacitive value or measuring reduction in voltage below the capacitive value of a known imaging member and of a virgin imaging member and comparing differential increase in charge over and above the capacitive value or the reduction in voltage below the capacitive value of the known imaging member and of the virgin imaging member.

Abstract: An apparatus for testing a dielectric sample for susceptibility to surface electrical failure due to tracking. The apparatus includes an enclosure continuously purged of air-borne contaminants, which eliminates external drafts, and a base disposed within the enclosure for supporting the dielectric sample. A pair of electrodes are operably interconnected with a variable voltage power supply and adapted to engage the dielectric sample on a first side with a mutual separation. A source of water and water borne contaminants intermittently discharges the water and water-borne contaminants in droplet form onto the dielectric test sample between the electrodes.

Abstract: An accurate dielectric breakdown prediction method and a prediction method in which accurate time dependent dielectric breakdown (TDDB) characteristics can be obtained on the basis of dielectric breakdown prediction by a step stress method are provided. In this method, dielectric breakdown is predicted on the basis of a plurality of reference currents in accordance with an applied voltage, or a reference current I.sub.cr is varied as the function of the applied voltage. In the step stress TDDB prediction, a Chen-Holland-Hu model or improved Chen-Holland-Hu model is employed. Since TDDB characteristics can be obtained from only dielectric breakdown prediction, this method is advantageous for early reliability prediction.

Abstract: A detector for continuously monitoring the integrity of a coating on a piece of material. The detector includes an upper bar and a lower bar held near the surfaces of the material. Each bar carries multiple conductive probes in contact with the corresponding surface and electrically connected to an electronic detection circuit. Adjacent probes are connected to electric terminals having different voltage potentials. When probes from the same bar carrying different voltages short together, such as by contacting the surface of conductive sheet material, the detection circuit signals an insufficiently coated area has been found. The short between probes must be large enough to cause a short for more than a predetermined time. The upper probe bar is rotatable to prevent damage to the upper probes by a bent edge on a sheet of material.

Abstract: To determine the stabilized surface insulation resistance (SIR) of a printed circuit board substrate, a test printed circuit board is provided which has desirable clean surface conditions. This surface bears a predetermined circuit board test pattern and has a known SIR characteristic resulting in a known stabilized SIR. The test board is then subjected to a soldering step which is performed in the same in-line production with commercial boards. After the soldering step, the SIR characteristic of the soldered test board is determined for a time period sufficient for a comparison with the SIR characteristic of the clean test board to enable the stabilized SIR of the soldered test board to be determined.

Abstract: A power apparatus has a network formed by a plurality of interconnected components being, e.g., one or more high voltage conductors in a casing of a metal filled with an insulating gas. Detectors are provided which detect electromagnetic waves, which are generated if there is a fault. The electromagnetic waves are analyzed to detect the location of the fault. The analysis may make use of attenuation coefficients corresponding to each component of the network to extrapolate between detectors on either side of the fault and/or to compare with predetermined wave strengths. A map of the network may be stored in a suitable memory to assist in the calculation of the fault location, and the memory may also store the attenuation coefficients themselves. The location of the fault may then be displayed by a suitable display, to give the time variation of the fault.

Abstract: A detector for detecting conductive materials contained in a stringy material sensitively, which is a cylindrical microwave cavity resonator (1) comprising a peripheral part (9) and two circular plates (10) covering the ends of the peripheral part. At least one of the circular plates has cylindrical protrusion (4) at its center. In the peripheral part, an antenna (5) for the generation of discharge is provided. In the protrusion (4) a detecting means (6) for discharge is provided. Paths (3,8) or a notched part (7) for the stringy material to be measured which passes through a high electric field formed by the protrusions and penetrate the cylindrical microwave cavity resonator oscillating at a fixed frequency, discharges are generated by the strong electric fields concentrated on the very small metals. Since sounds, light, and electromagnetic waves are generated at this time, the very small metals can be detected sensitively with discharge detecting means such as a microphone, a photodetector and an antenna.

Abstract: A method and apparatus for determining the properties of a particular insulation layer wherein an ion source is directly at the insulation layer. An electrode is provided between the insulation layer mounted on a support, and the ion source. A voltage U is generated across the electrode and the support and a particular current ratio is maintained between the electrode, the voltage generator and the support by adjusting the voltage U. The time behavior of this voltage U would determine the properties of the insulation layer.

Abstract: A method for evaluating characteristics of a printed wiring board by measuring the alternating current impedance spectra of the printed wiring board conductor pattern. The method is useful in evaluating a number of different characteristics, such as moisture content, delamination, interlayer thickness and surface characteristics.

Abstract: A test method is used for examining a sample insulating film to determine an expected value of time for the sample insulating film to undergo dielectric breakdown. A varying electric stress is applied to a sample insulating film to flow therethrough a varying electric current. The varying electric current is monitored until catastrophic dielectric breakdown occurs in the sample insulating film to measure a critical electric current which flows through the sample insulating film immediately before the breakdown occurs. The expected value of time to breakdown is determined according to the measured critical electric current.

Abstract: A method and apparatus for determining the rate of flow of a leak through a geomembrane is set forth. In the preferred and illustrated embodiment, a surrounding lower skirt having a peripheral weight thereabout is placed on the bottom to surround the location of the leak. The skirt supports a cover. A portion of the skirt or cover is made of an ionic and electrically permeable membrane to permit current flow. A second liquid is defined to be miscible with the first liquid and to have a markedly different electrical conductivity. The rate of flow of the second liquid out of the lower skirt and cover is determined by measuring the electrical potential between liquid in the impoundment and the second liquid within the skirt as the electrical conductivity of the surrounding earth is altered by invasion of the second liquid into the soil under the geomembrane liner. The apparatus utilizes a reservoir of the second liquid which is delivered through a suitable valve and fill hose into the lower skirt and cover.