Of Individual Circuit Component Or Element Patents (Class 324/537)
- By capacitive means (Class 324/750.17)
- By information on device under test (Class 324/750.18)
- Adjustable support for device under test (Class 324/750.19)
- Testing device mounted for multi-directional movement (Class 324/750.22)
- Using optical means (Class 324/750.23)
- By electrical contact means (Class 324/750.24)
- By mechanical means (Class 324/750.25)
- Packaged integrated circuits (Class 324/762.02)
- Integrated circuit die (Class 324/762.03)
- Semiconductor wafer (Class 324/762.05)
- Multiple chip module (Class 324/762.06)
- Diode (Class 324/762.07)
- Bipolar transistor (Class 324/762.08)
- Field effect transistor (Class 324/762.09)
- With barrier layer (Class 324/762.1)