Abstract: A method of detecting small changes to a complex integrated circuit measuring RF/microwave scattering parameters between every pin over a wide frequency range. The data from a characterization of a known good integrated circuit is stored and compared to each subsequent integrated circuit of unknown background.

Abstract: An electro-mechanical microwave impedance tuner operates as a stand-alone instrument and includes on-board digital processor, firmware, memory, digital display and human control interface, in form of a joystick, mouse, keyboard or tactile (touch sensitive) screen in order to recognize and execute commands for moving the tuner motors and probes, generating required microwaves impedances and calculating losses and de-embedding to reference planes different than the tuner ports. Before being used in operations the tuner can also be controlled by a control computer in order to be calibrated on a network analyzer and the data can be uploaded into the on-board memory in order to be used in the above calculations. During measurement and tuning operations the tuner is therefore stand-alone and totally independent of a control computer.

Abstract: A reflection element determination device derives error factors in a first signal source and a second signal source based on measurement results of a signal in respective states in which reflection elements are respectively connected to the first signal source and the second signal source, and measurement results of a signal in a state in which the first signal source and the second signal source are connected with each other via a transmission element, derives transmission characteristics of the transmission element based on the measurement results of a signal in the state in which the first signal source and the second signal source are connected with each other via the transmission element and the derived error factors, and determines whether the reflection elements realize predetermined reflection states based on the derived transmission characteristics of the transmission element and transmission characteristics of the transmission element which have been known before the derivation, where the transmissi

Abstract: A method of detecting small changes to a complex integrated circuit measuring RF/microwave scattering parameters between every pin over a wide frequency range. The data from a characterization of a known good integrated circuit is stored and compared to each subsequent integrated circuit of unknown background.

Abstract: Microwave examination of individuals is carried out by transmitting microwave signals from multiple antenna locations into an individual and receiving the backscattered microwave signals at multiple antenna locations to provide received signals from the antennas. The received signals are processed to remove the skin interface reflection component of the signal and the corrected signal data are provided to a hypothesis testing process. In hypothesis testing for detecting tumors, image data are formed from the test statistic used to perform a binary hypothesis test at each voxel. The null hypothesis asserts that no tumor is present at a candidate voxel location. The voxel threshold is determined by specifying a false discovery rate to control the expected proportion of false positives in the image. When the test statistic value associated with a voxel is greater than the threshold, the null hypothesis is rejected and the test statistic is assigned to the voxel.

Abstract: Second and third ports of a network analyzer are individually connected via cables to predetermined connection points on a differential transmission circuit on an object to be measured. A differential cable is connected to the differential transmission circuit. An antenna for receiving an electromagnetic wave radiated from the differential cable is connected to a first port of the network analyzer via a first cable. The network analyzer measures a three-port S parameter of the first, second, and third ports and calculates common-mode and normal-mode components of noise radiated from the differential cable. As a result, the source of noise in an electronic apparatus can be determined, and common-mode noise and normal-mode noise can be separately measured.

Abstract: The invention relates to a method for measuring objects for measurement, by means of a network analyzer with several measurement ports, at least one signal generator, for stimulating the object for measurement and at least one local oscillator, for measurement of the signal transmitted or reflected from the object for measurement by the superposition principle. According to the invention, on a frequency change, only the frequency of the local oscillator or the frequency of the signal generator is changed but not the frequency of the local oscillator and the signal generator simultaneously.

Abstract: The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of transmission lines. A voltage mesh and a ground mesh in a metal layer are connected symmetrically to a reference ground (RG) in the layer at all ends.

Abstract: A measuring device comprises a microwave transmitter, a microwave receiver, at least one antenna, a control device and a dielectric extension. The dielectric extension is disposed between the antenna and an object to be investigated. The control device controls the microwave transmitter and the microwave receiver. The microwave transmitter transmits a microwave signal by means of the antenna and the dielectric extension into the object to be investigated. The object to be investigated scatters the microwave signal. The microwave receiver receives the scattered microwave signal by means of the antenna and the dielectric extension. The length and the dielectric constant of the dielectric extension in this context are dimensioned in such a manner that the object to be investigated is disposed in the remote field of the antenna.

Abstract: Pulses of signals in the terahertz region are generated using an apparatus made up of a mode-locked semiconductor laser diode with a short duty cycle that is optically coupled to a biased Auston switch. The output from the mode-locked semiconductor laser diode may first be supplied to a pulse compressor, and the resulting compressed pulses supplied to the Auston switch. Preferably, the mode-locking of the semiconductor laser diode is controllable, i.e., it is an active mode-locking semiconductor laser, so that the phase of the output optical signal from the laser is locked to the phase of an input control signal.

Abstract: An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.

Abstract: A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output having at least one unwanted spectral component. The method includes the further step of using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition.

Abstract: The invention relates to a network analyzer comprising a signal generator for generating an excitation signal which can be supplied to a measuring object connectable to a network analyzer by means of a measuring line, and a measuring bridge which is connected to the measuring line by means of signal transmission. A reference signal corresponding to the excitation signal can be extracted from a reference channel, and a measuring signal corresponding to a signal corresponding to a signal reflected from the measuring object can be extracted from a measuring channel. the measuring bridge comprises a resistive bridge and at least one hybrid coupler which is connected to the resistive bridge in series. the measuring bridge is operated as a resistive bridge in a low frequency range and as a hybrid coupler in a upper frequency range.

Abstract: A method of determining the intrinsic electrical characteristics of a device under test (DUT) includes determining a set of test measurements for a test structure including the device and determining test measurements for a number of de-embedding test structures. Based on the test measurements, DUT measurements are determined using both open-short and three-step de-embedding processes. The DUT measurements are combined to determine an imperfection error, which is used to adjust the calculations of a four-port de-embedding method. The adjusted calculations provide for a more accurate measurement of the parasitic elements in the test structure, thereby improving the determination of the intrinsic electrical characteristics of the device.

Abstract: A method and a device for measuring dielectric characteristics by generating a microwave signal, dividing the signal into reference and sounding signals, irradiating a body with the microwave signal, receiving the reflected, reference and total signals and in detecting said signals. The irradiation is carried out by a waveguide wave, the wave number of which in the free space filled with dielectric, is selected within a range from 1.0 to 1.07 the propagation number of the waveguide wave.

Abstract: A method and system for measuring the input (loading) impedance of measurement systems using a test fixture. This is done by first measuring the characteristics of an unloaded test fixture to obtain scattering parameters of the test fixture and using a splitting algorithm to calculate the scattering parameters of each transmission line leg of the test fixture. The test fixture is then measured with a measurement system attached. The test fixture effects defined by the scattering parameters are then removed from the measurement to yield the scattering parameters of the measurement system alone (measurement system effects).

Abstract: Systems and methods to determine electromagnetic properties are provided. A particular method includes directing electromagnetic energy toward an article under test. The method also includes taking measurements of electromagnetic energy scattered by the article under test. The method further includes determining expected baseline values of at least one electromagnetic property of the article under test. The expected baseline values are based on electromagnetic energy scattered by a control article. The method also includes determining output data based on a difference between the expected baseline values and characteristic values of the article under test determined based on the measurements of electromagnetic energy scattered by the article under test. The output data includes values indicative of inhomogeneous distribution of an electromagnetic property of the article under test.

Abstract: A microwave imaging process, and a system controlled by an associated software product, illuminate a target with microwaves from a transmitting antenna. Receiving antennas receive microwaves scattered by the target, and form microwave data. The illumination and receiving repeat over multiple transmitting antennas and multiple microwave frequencies. The microwave data is processed to form permittivity and conductivity images by selecting a background dispersion model for permittivity and conductivity. Permittivity and conductivity dispersion coefficients are determined, and permittivity and conductivity distributions are calculated, for each of the microwave frequencies. Forward solutions at multiple frequencies are determined from property distributions, and a dispersion coefficient based Jacobian matrix is determined. Dispersion coefficient updates are determined using the microwave data, and the dispersion coefficients are updated.

Abstract: Embodiments describe methods of correcting S-parameter measurements for a DUT. The method includes coupling at least one tracking module associated with a set of electrical standards to a S-parameter measurement device to form a test system. An initial calibration for the test system is then determined. This may include measuring the S-parameters of the electrical standards, generating a calibration along a calibration plane, generating a calibration along a correction plane and determining at least one error adapter from the calibrations. The DUT is coupled to the test system and the S-parameters of the DUT are measured. Changes in the initial calibration are tracked using the tracking modules. Tracking may include measuring the S-parameters of the electrical standards, generating a correction plane calibration and generating a corrected calibration plane calibration from the correction plane calibration and the error adapter(s). The measured S-parameters are corrected using the tracked changes.

Abstract: S-parameter data is measured on an embedded device test structure, an open dummy, and a short dummy. A 4-port network of the pad set parasitics of the embedded device test structure is modeled by a parameterized netlist containing a lumped element network having at least one parameterized lumped element. The S-parameter data across a range of measurement frequencies is fitted with the parameterized netlist employing the at least one parameterized lumped element as at least one fitting parameter for the S-parameter data. Thus, the fitting method is a multi-frequency fitting for the at least one parameterized lumped element. A 4-port Y-parameter (admittance parameter) is obtained from the fitted parameterized netlist. The Y-parameter of the device under test is obtained from the measured admittance of the embedded device test structure and the calculated 4-port Y parameter.

Abstract: A method for manufacturing an equalizer used to compensate a digital signal passed by a transmission line, in which the digital signal can be presented as a frequency-domain function. The method includes measuring a the transmission line scattering-parameter; performing an integration and a differentiation about the transmission line scattering-parameter, the frequency-domain function, the ideal gain, and an equalizer scattering-parameter to get the component impedances of the equalizer; and manufacturing the equalizer circuit with the derived component impedances.

Abstract: The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

Abstract: An antenna and its associated components are consolidated in a small measurement box, and multiple tests are competed simultaneously, with a single vector network analyzer. This can be done by treating the “Far Field” measurements (typically measured on antenna/RCS ranges) as another port of a larger passive network. After characterization of one ideal “gold” unit (or a sample set of “gold” units), the S-parameters of subsequent units are measured in the same passive test box environment. The results of these subsequent tests are compared to the results of the “gold unit's” test, and if they are repeated to within some tolerance, electrical similarity can be proven.

Abstract: In one method of calibrating an instrument having N ports, where N>=2, cables of a first type are characterized by connecting a first cable between two of the ports; performing an “unknown-thru” full two-port calibration between the two ports; obtaining a S-parameter of the first cable; saving the S-parameter of the first cable; and then repeating the connecting, performing, obtaining and saving for additional cables having the first type. The cables having the first type are then disconnected from one of the two ports and a measurement plane is transferred from the connected end of the cable to the disconnected end of the cable. Cables of a second type are then characterized by connecting a second cable between the second of the two ports and the disconnected end of the first cable; measuring a S-parameter of the second cable; and saving the S-parameter of the second cable.

Abstract: The invention provides for a method of using a network analyzer and a test controller for measuring S-parameters of a device, which can assume a plurality of states, and which can switch very fast from one state to another. The test controller sends a trigger to the analyzer, which starts a frequency sweep when it receives this trigger. The frequency sweep, having substantially the same start and stop frequency, is provided to the device. The analyzer then executes a measurement of at least one S-parameter of the device, stores the S-parameter data from the measurement and provides the test controller with a trigger. The test controller then updates the device to the next state in a predetermined sequence of states when it receives the trigger from the analyzer. These steps are repeated until all states in the predetermined sequence of states have been measured.

Abstract: A method for determining the composition and water salinity of a multi-component mixture of a gas and at least one liquid, including water, in a pipe (1), the method comprising the following steps: a. electromagnetic phase measurements are performed between two receiving antennas (4) located at different distances from a sending antenna (3), b. based on an empirically determined constant(s) and the above measurements, the effective and imaginary dielectric constants are determined, c. the mixture density is determined, d. the temperature and pressure are determined e. based on the knowledge of densities, effective dielectric constants and imaginary dielectric constants of the components of the fluid mixture and the results of the above steps a-d, the volume fractions of the gas and liquid or liquids of the fluid mixture and salinity of the water are calculated. An apparatus for performing the method is also disclosed.

Abstract: A measuring apparatus that measures a characteristic of a device under measurement is provided. The measuring apparatus includes: a signal generating section that outputs a forward signal to the device under measurement through a device side terminal; a directional coupler that outputs a backward split signal obtained by splitting a part of a backward signal inputted from the device under measurement through the device side terminal; a backward mixer that outputs a backward detection signal obtained by multiplying a local signal having a predetermined frequency by the backward split signal; and an analysis section that analyzes a characteristic of the device under measurement based on the backward detection signal. The directional coupler is included in a multilayer substrate, and the backward mixer is included in a chip provided on a surface of the multilayer substrate.

Abstract: A method and system utilizing a network analyzer and a test controller for measuring scattering parameters (S-parameters) of a microwave device that rapidly switches through a plurality of states. The test controller sends a trigger to the analyzer, which starts a frequency sweep having substantially the same start and stop frequency, and provides the sweep to the device. The analyzer then measures and stores at least one S-parameter of the device and provides the test controller with a trigger. The test controller updates the device to the next state in a predetermined sequence of states and the above steps are iteratively repeated until S-parameters for all of the states in the sequence have been measured.

Abstract: A measuring method and measurement system that includes a signal source that applies a signal to a device under test, a scalar measuring instrument that measures a reflected wave reflected from the device under test or a transmitted wave transmitted through the device under test as a scalar value, and a superimposing signal system that superimposes three different vector signals whose relation values are specified in advance on the reflected wave or the transmitted wave of the device under test. The three vector signals are superimposed on the reflected wave or the transmitted wave of the device under test, and the superimposed signals are each measured as a scalar value by the electric-power measuring instrument. The three measured scalar values are converted into a single vector value using the specified relation values of the three vector signals, thereby obtaining a transmission coefficient of the device under test.

Abstract: Microwave imaging via space-time beamforming is carried out by transmitting microwave signals from multiple antenna locations into an individual to be examined and receiving the backscattered microwave signals at multiple antenna locations to provide received signals from the antennas. The received signals are processed in a computer to remove the skin interface reflection component of the signal at each antenna to provide corrected signal data. The corrected signal data is provided to a beamformer process that time shifts the received signals to align the returns from a scatterer at a candidate location, and then passes the time aligned signals through a bank of filters, the outputs of which are summed, time-gated and the power therein calculated to produce the beamformer output signal at a candidate location. The beamformer is then scanned to a plurality of different locations in the individual by changing the time shifts, filter weights and time-gating of the beamformer process.

Abstract: The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

Abstract: The invention related to a method and circuit that is used to compensate for S-parameters of a passive circuit which do not satisfy passivity. The method includes the following steps: (1) getting S-parameters which do not satisfy passivity, these S-parameters being composed of an S-parameter matrix S; (2) computing matrix [S×S?], wherein matrix S? is a complex conjugate transposed matrix of the S-parameter matrix S; (3) computing the eigenvalues of the matrix [S×S?], and choosing an eigenvalue ? whose real part real(?) is the biggest; (4) computing a compensating value ?, the compensating value ? being equal to real(?)1/2×(1+?), wherein the ? is a very small positive number; and (5) dividing each of the S-parameters by the compensating value ? to get the compensated S-parameters.

Abstract: A measurement and correction method provides for a complete full correction of a true-mode system using only the single ended error matrix developed for 4 port correction of single ended measurements. The degree of misalignment of the balanced sources may be determined from these measurements.

Abstract: A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method involves a modified Line-Reflect-Line (LRL) calibration routine that uses a Thru-Reflect-Line to LRL shift to eliminate the need for a precisely characterized reflect standard used during a conventional LRL calibration. The method further involves de-embedding the non-ideal effects of the non-zero length thru standard used during the calibration routine to improve measurement accuracy of the tester. The apparatus may involve the use of RF relays to allow multiple wafer probe needles to share RF test ports.

Abstract: Embodiments of the present invention relate to circuits to be inserted in a signal path between a signal generator and a test port of a vector network analyzer (VNA), where the circuits enable the VNA to make scattering parameter measurements for a load (RL) connected to the test port when the signal generator generates signals having frequencies that are below a low frequency limit (e.g., 2 MHz) of an actual dual directional coupler of the VNA. Embodiments of the present invention are also directed to a VNA that includes such circuits.

Abstract: There is reduced labor to directly connect two ports selected from ports of a network analyzer in order to measure transmission tracking errors. A network analyzer, to which a test set which branches four ports to nine ports (main port group: three ports, and sub port groups: three ports ×2) is connected, includes transmission/reception ports, a transmission tracking error determining unit which determines transmission tracking errors of a combination of one of possible connections in the main port group and one of possible connections in the sub port groups for all the possible connections in the main port group based on signals before transmitted by the transmission/reception ports and reception signals, and a transmission tracking error deriving unit which derives other transmission tracking errors based on the transmission tracking errors determined by the transmission tracking error determining unit.

Abstract: The errors related to the resistance of test conductors and sense/load resistances for a pulse I-V measurement system are determined by making open circuit and through circuit measurements using a combination of DC and pulse instrument measurements.

Abstract: A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an offset stimulus source that provides a plurality of stimulus signals and a vector network analyzer. At least one stimulus signal is offset from another stimulus signal of the plurality in one or both of frequency and time-varying phase. The offset stimulus source includes a first signal source and a second signal source that respectively provides the offset stimulus signals. The method of measuring includes generating the offset stimulus signals and applying the offset stimulus signals to a balanced port of the DUT to stimulate the DUT. The performance parameters are determined from measurements of the offset stimulus signals and one or more response signals from the stimulated DUT.

Abstract: A probe includes a tubular conductor having an aperture at one end thereof. An electromagnetic wave transmitting unit for transmitting an electromagnetic wave, via the tubular conductor, to a position distant from the aperture is disposed at one of the inside and the outside of the tubular conductor, and an electromagnetic wave receiving unit for receiving an electromagnetic wave, via the tubular conductor, from the position distant from the aperture is disposed in the other of the inside and the outside of the tubular conductor. The size of the aperture is smaller than or equal to the wavelength of the electromagnetic waves. The electromagnetic waves transmitted and received at the outside and the inside of the tubular conductor are coupled through the aperture. When an analyte to be observed is disposed so as to face the aperture, information of the analyte is obtained on the basis of a change in the coupling of the electromagnetic waves through the aperture.

Abstract: A device for measuring electrical properties, including permittivity, of a material is disclosed. The device includes a first conduit and second conduit terminating at open ends and respectively connected to a first and second connector port. Annuli are formed by the open ends to encompass portions of a flange of the device. The flange as well the portions make firm contact with the material under test, permitting simultaneous measurements of the complex scattering parameters of the material when an electromagnetic field is transmitted through the first connector port. Electrical characteristics of the material can be computed using the measurements received at the first connector port and the second connector port. Shorting screws are used for calibration by selectively opening or shorting the conduits.

Abstract: The present invention provides microcoaxial probes fabricated from semiconductor heterostructures that include strained semiconductor bilayers. The microcoaxial probes are well suited for use as scanning probes in scanning probe microscopy, including scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning microwave microscopy, or a combination thereof.

Abstract: The invention relates to a network analyzer comprising a signal generator for generating an excitation signal which can be supplied to a measuring object connectable to a network analyzer by means of a measuring line, and a measuring bridge which is connected to the measuring line by means of signal transmission. A reference signal corresponding to the excitation signal can be extracted from a reference channel, and a measuring signal corresponding to a signal corresponding to a signal reflected from the measuring object can be extracted from a measuring channel. the measuring bridge comprises a resistive bridge and at least one hybrid coupler which is connected to the resistive bridge in series. the measuring bridge is operated as a resistive bridge in a low frequency range and as a hybrid coupler in a upper frequency range.

Abstract: A tissue-sensing adaptive radar method of detecting tumours in breast tissue uses microwave backscattering to detect tumours which have different electrical properties than healthy breast tissue. The method includes steps for reducing skin reflections and for constructing a three-dimensional image using synthetic focusing which shows the presence or absence of microwave reflecting tissues.

Abstract: A module determines the mismatch corrected power output of a generator. Loads within the module provide at least three different load values. At least one power sensor detects at least a portion of the power output by the generator for each of the load values. Input electrical paths transmit power from the generator to the loads. At least one output electrical path transmits signals from the at least one power sensor indicative of power received when the generator is electrically connected to the different load values.

Abstract: A measuring method and measuring apparatus for vector-measuring a scattering coefficient of a device under test substantially using a scalar measuring instrument while enabling a reduction in the size of the measuring instrument and the cost. The measurement system includes a signal source that applies a signal to a device under test, a scalar measuring instrument that measures a reflected wave reflected from the device under test or a transmitted wave transmitted through the device under test as a scalar value, and a superimposing signal system that superimposes three different vector signals whose relation values are specified in advance on the reflected wave or the transmitted wave of the device under test. The three vector signals are superimposed on the reflected wave or the transmitted wave of the device under test, and the superimposed signals are each measured as a scalar value by the electric-power measuring instrument.

Abstract: The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of transmission lines. A voltage mesh and a ground mesh in a metal layer are connected symmetrically to a reference ground (RG) in the layer at all ends.

Abstract: A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under test from a device under test is coupled to a test probe and used with selectable impedance loads in the test probe to acquires sets of samples for characterizing transfer parameters of the device under test and compute open circuit voltages at the test probe. Other probes are coupled to the device under test and a set of measurement samples are acquired via the test probe. An equalization filter in either the frequency or time domain is computed from the open circuit voltage and measurement samples for reducing signal errors attributable to the measurement loading of the device under test by the test probe and other probes.

Abstract: An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (?L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional digital samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.