Abstract: According to the present invention an S-parameter file input section inputs S-parameters for each device constituting a system subject to a transmission analysis, a port position correspondence conversion section converts the input S-parameters so as to correspond to preset port positions to be connected, an S-parameter/T-parameter conversion section converts S-parameters to T-parameters, a connection calculation section carries out a connection calculation of T-parameters to obtain T-parameters of the entire system, a T-parameter/S-parameter conversion section converts T-parameters of the entire system to S-parameters of the entire system and an S-parameter file output section outputs S-parameters of the entire system.

Abstract: A method of detecting small changes to a complex integrated circuit measuring RF/microwave scattering parameters between every pin over a wide frequency range. The data from a characterization of a known good integrated circuit is stored and compared to each subsequent integrated circuit of unknown background.

Abstract: A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (FL) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional digital samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A single ended line testing method for qualifying an electrically conducting line, including the steps of sending a plurality of randomized excitation signals from a first end of the line towards a second end of the line, subsequently taking measurements, at the first end of the line, of each reflection of the plurality of randomized excitation signals, and then inversely randomizing the measurements. Line qualification is determined based on an average of the inversely randomized measurements.

Abstract: A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric constant of the composite structure may be compared to the dielectric constant of one or more sample structures to determine the presence of thermal degradation or improper curing in the structure. In this regard, a system for inspecting a composite structure comprises a transmitter, a receiver, and a controller. The transmitter may be capable transmitting microwave energy directed toward the structure. The receiver may be capable of receiving microwave energy scattered from the structure. The controller may be capable of determining a dielectric constant of the structure using an inverse scattering algorithm and comparing the dielectric constant of the structure to a dielectric constant of at least one sample structure.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A network analysis system and methods facilitate a match-corrected signal power measurement using a vector network analyzer (VNA). The network analysis system includes the VNA and a computer program stored in memory and executed by a controller. The computer program has instructions that implement one or both of calibrating a test port of the VNA to determine the match-corrected signal power measurement and correcting a power measured for a signal received at the test port of the VNA using corrected error terms of a port calibration of the test port to yield a corrected measured power. The corrected error terms are determined from error terms of the port calibration using a switch term and an incident power calibration, both of the test port. A method 100 determines the match-corrected signal power measurement and a method 300 calibrates the VNA test port to determine the measurement.

Abstract: A method of obtaining a material property of a pavement material from a microwave field generally includes generating a microwave frequency electromagnetic field of a first mode about the pavement material. The frequency response of the pavement material in the electromagnetic field can be measured, such as by a network analyzer. The measurement of the frequency response permits correlating the frequency response to a material property of the pavement material sample, such as the density. A method of correcting for the roughness of a pavement material divides the pavement into a shallow layer and a deep layer. Two planar microwave circuits measure the permittivity of the shallow and deep layer. The permittivities are correlated to correct for roughness. An apparatus for obtaining the density of a pavement sample includes a microwave circuit and a network analyzer. The network analyzer measures the frequency response to determine the density of the pavement material.

Abstract: A two-port S-parameter calibration between a first port and a second port of a test system having a multi-port vector network analyzer is performed to provide a first S-parameter calibration of the test system. A transfer device is connected between the first and second ports of the test system. A port of the test system is changed to provide a second state of the test system, and a plurality of ratioed un-corrected parameters of the transfer device are measured with the test system in the second state. A second S-parameter calibration of the test system in the second state is determined using the ratioed un-corrected parameters and S-parameter data.

Abstract: An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.

Abstract: In one embodiment, a vector network analyzer (VNA) comprises a plurality of ports for coupling to a device under test (DUT), at least one reference receiver for measuring signals associated with the DUT, and logic for processing measurement data from the at least one reference receiver to compensate for transmission line effects, wherein the logic for processing evaluates a function, of several controllable variables, that is a sum of multiple transmission line models, wherein each of the controllable variables is related to a respective transmission line length associated with a corresponding transmission line model.

Abstract: In one embodiment, the present invention includes a method for simulating a first stimulus into a device under test and measuring first single-ended scattering parameters caused thereby, and directly calculating a differential scattering parameter from the first single-ended scattering parameters. In certain embodiments, second single-ended scattering parameters may be obtained from a second stimulus into the device under test, and the results used to calculate the differential scattering parameter, for example, where a device under test is non-homogeneous.

Abstract: A method, apparatus and article of manufacture for manufacturing a balanced circuit obtains S-parameters for the balanced circuit and determines a delay value embedded at one of the single-ended terminals of the balanced circuit that reduces a differential to common mode conversion mixed-mode transmission S-parameter.

Abstract: A multiport vector network analyzer calibration employs measurements of an asymmetric reciprocal device to determine a value of a defining parameter of a calibration standard in a set of calibration standards. A method of determining a parameter value determines and reports the parameter value. A method of compensating a calibration determines the parameter value and employs the determined parameter value to optimize a set of error coefficients of an error model of the multiport vector network analyzer. A multiport vector network analyzer that includes a controller, a test set, and computer program executed by the controller, compensates a calibration using the determined parameter value and a set of optimized error coefficients. A calibration compensation system that includes a multiport vector network analyzer, a computer, and a computer program executed by the computer, determines and reports the parameter value.

Abstract: A system and method of characterizing a device under test wherein a signal is injected into the device under test, the response to the injected signal is measured to determine the impedance of the device under test in the frequency domain, the impedance is converted to the time domain, and the voltage noise of the device under test is calculated based on the impedance of the device under test in the time domain.

Abstract: One disclosed embodiment may include a method that includes providing a first set S-parameters for a path of a first substrate having a first port and a second port and providing a second set of S-parameters for a path of a second substrate having a first port and a second port. Waveform parameters are measured for an aggregate path that includes the path of the first substrate, the path of the second substrate, and a structure interconnecting the first and second substrates to provide a third set of S-parameters. A fourth set of S-parameters is calculated for the structure interconnecting the first and second substrates based on the first, second, and third sets of S-parameters.

Abstract: A system and method for providing improved isolation between sampling channels in a vector network analyzer and sampling circuit. A vector network analyzer sampling channel includes a non-linear transmission line, an isolation device, a band-pass filter, and a sampler. The nonlinear transmission line receives a continuous-wave driving signal and generates a shockwave from which a pulse signal is generated. The pulse signal is used to gate the sampler and thus sample an RF signal. The isolation device and band-pass filter provide reverse isolation for RF signals traveling in the reverse direction within the channel and prevent RF signal leakage between vector network analyzer channels. The isolation device may include an isolator, amplifier or other reverse isolation device, and is used in conjunction with a band-pass filter. The band-pass filter is used to pass a frequency band for driving the non-linear transmission line.

Abstract: Consistent with an example embodiment, there is a method for calibrating an N terminal microwave measurement network. The method including the measurement of network parameter values of a load device depends on the knowledge of the parasitic impedance of the load device. According to the example embodiment, the accuracy of the method is improved by at least approximately determining the parasitic impedances of the load device. This may be achieved by measuring network parameter values of an auxiliary open device, having substantially identical parasitic impedance as that of the load device. The accuracy is further increased by measuring network parameter values of an auxiliary short device, having substantially identical parasitic impedance as that of the load device. A similar principle can be used for de-embedding a device under test. A load device, an auxiliary open device and an auxiliary short device each having substantially identical parasitic impedances are disclosed.

Abstract: Embodiments of the present invention are directed towards systems, methods, and computer readable media for performing multiport vector network analysis. Embodiments of the present invention relate to a multiport network analysis that is derived from a family of two port calibration techniques including Thru/Reflect/Line (TRL), Thru/Reflect/Match (TRM), Line/Reflect/Line (LRL), Line/Reflect/Match (LRM) and several others. An improved calibration method enables the use of a simplified switch matrix to perform accurate vector network analysis in communications and networking systems. After determining some characteristics through conventional methods, a two tier load match correction is performed on the results. The improved correction mechanism enables the system to perform comparably to systems with more complicated switch matrices.

Abstract: A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the measured calibration standards. S-parameters of the DUT are measured and corrected based upon the error coefficients. A reference plane is shifted for each element of the corrected S-parameter matrix to a measurement reference plane, and ? SA_portn ? LA_portm = S 21 ? _thru ? _nm ? S 12 ? _thru ? _nm wherein S21—thru—nm is equal to S12—thru—mn and an argument of both solutions for S21—thru—nm is fit to a straight line, the solution having a y-intercept closest to zero being a correct solution and a resulting argument of the correct solution being the electrical delay.

Abstract: A vector network analyzer calibration employs measurements of an asymmetric reciprocal device to determine a value of a defining parameter of a calibration standard in a set of calibration standards. A method of determining a parameter value determines and reports the parameter value. A method of compensating a calibration determines the parameter value and employs the determined parameter value to optimize a set of error coefficients of an error model of the vector network analyzer. A vector network analyzer that includes a controller, a test set, and computer program executed by the controller, compensates a calibration using the determined parameter value and a set of optimized error coefficients. A calibration compensation system that includes a vector network analyzer, a computer, and a computer program executed by the computer, determines and reports the parameter value.

Abstract: System for testing attenuators by a flatness and standing wave ratio tests which includes a vector network analyzer (VNA) adapted to be coupled to a device under test (DUT) and which provides an input stimulus signal for the DUT and, when certain conditions are satisfied, receives an output signal from the DUT, and a calibration receiver adapted to be coupled to the DUT via a down-converter. When certain conditions are satisfied, the output signal from the DUT is sent to the calibration receiver (through the down-converter to be possibly modified thereby depending on the testing frequency). A signal generator provides a local oscillator (LO) signal for the down-converter. A control unit is connected to the instruments and embodies software which analyzes the testing conditions, i.e., the attenuator value being tested, and selects whether the network analyzer or the calibration receiver will measure the output signal from the DUT.

Abstract: A power calibration method for a multi-port vector network analyzer (VNA) performs a two-port S-parameter calibration between a pair of ports of the multi-port VNA, and performs a power calibration of one of the ports in the pair of ports. From the two-port S-parameter calibration and the power calibration at the one port, power can be determined at one or more ports of a device under test (DUT) coupled to the ports of the multi-port VNA.

Abstract: Combination metal-dielectric microwave probes are sliding on the central conductor of an electro-mechanical microwave two-probe load pull tuner and create higher reflection factor over a wider frequency bandwidth than was previously possible using pure dielectric probes. The microwave probes are made of a combination of metal and dielectric materials in form of a square metallic slug body with a dielectric cylindrical core embedded inside. The cylindrical dielectric core also guides the probes and allows them to slide smoothly on the central conductor of the tuner airline without major alignment. The probes are positioned horizontally using a remote translation mechanism and allow continuous coverage of the Smith chart over a high frequency and VSWR (reflection factor) range. The mutual horizontal distance between the probes determines the amplitude of the reflection factor, whereas their common distance from the tuner test port determines its phase.

Abstract: The values of the 6 complex parameters of a large-signal S-parameter model of a high frequency device-under-test are determined by using a frequency-offset probe-tone method. A relatively large one tone signal is applied to the input port of the device and a relatively small one tone signal having a frequency offset relative to the frequency of this large one tone signal is applied to the output port of the device. The 6 large-signal S-parameters are found by measuring and processing the spectral components of the incident and the scattered voltage waves at the device signal ports. These spectral components appear at 3 frequencies: at the frequency of the large one tone signal, at the frequency of the small one tone signal and at the frequency of the large one tone signal minus the frequency offset of the small one tone signal.

Abstract: A method and apparatus for calibrating a multiport measurement path using through, high reflect and line calibration standards presents the through standard between no more than N?1 other pairs of measurement ports where at least one of the other pairs is a proximal pair.

Abstract: The accuracy of a method for calibrating an N terminal microwave measurement network (10), the method comprising the measurement of network parameter values of a load device (43), depends on the knowledge of the parasitic impedance of the load device (43). According to the invention, the accuracy of the method is improved by at least approximately determining the parasitic impedances of the load device (43). In one embodiment this is achieved by measuring network parameter values of an auxiliary open device (44), having a substantially identical parasitic impedance as the load device (43). The accuracy is further increased by measuring network parameter values of an auxiliary short device (45), having a substantially identical parasitic impedance as the load device (43). A similar principle can be used for de-embedding a device under test. A load device (43), an auxiliary open device (44) and an auxiliary short device (45) having substantially identical parasitic impedances are disclosed.

Abstract: A method and system of calibrating first and second adapters comprises the steps of calibrating coaxial ports of a vector network analyzer to traceable standards and connecting a symmetrical through circuit path between the coaxial ports. The through circuit path comprises a cascaded combination of the first and second adapters. The first adapter is passive and substantially identical to the second adapter and uncascaded first and second adapters comprise a measurement device path. The through circuit path and the measurement device path have substantially equivalent S-parameters. S-parameters of the through circuit path are measured and then the first and second adapters are characterized based upon the measured S-parameters. The method and system may be applied to two port adapters and devices under test and may also be scaled for multi-port adapters and devices under test.

Abstract: A method for vector characterization of a frequency translation device (“FTD”) includes coupling a first signal from a first signal source through a reference directional coupler and through a test directional coupler of an electronic test set to a first port of the FTD. A second signal from the reference directional coupler is coupled to a first receiver of a vector network analyzer (“VNA”). A third signal is coupled from the test directional coupler to a second receiver of the VNA; and a vector parameter of the first port of the FTD is measured with the VNA.

Abstract: A system and method can be utilized to determine S-parameters of a network. In one embodiment a system includes an S-parameter calculator that computes the S-parameters of the network based on waveform parameters determined from single port measurements. At least one of the single port measurements corresponds to measurements at one of the plural ports while a matched load is applied to at least another of the plural ports.

Abstract: A calibration system and method determines magnitudes of traveling-waves at a non-coaxial plane of a scattering (S) parameter measurement device that includes an adapter link between the non-coaxial plane and a coaxial plane. A calibration is conducted at an interface between the adapter link and the coaxial plane to derive coaxial error terms for the S-parameter measurement device. In addition, a power meter measurement is conducted at the coaxial plane to obtain power wave measurements using the coaxial error terms. A calibration is also conducted at an interface between the adapter link and the non-coaxial plane to derive non-coaxial error terms for the S-parameter measurement device. The power wave measurements, coaxial error terms and non-coaxial error terms are used to calculate the magnitude of one of the traveling-waves at the non-coaxial plane.

Abstract: A measuring device (e.g., a vectorial network analyzer) by means of at least two ports can be connected to a device under test and has associated excitation/receiving units (ERUs), each thereof having one port. At least one ERU has a signal generator, which can apply an excitation signal onto a device under test. Each ERU possesses two receiving apparatuses (each with a mixer in connection with an oscillator signal) to receive the excitation signal, the reflected signal from the associated port or the signal transmitted to the associated port and converts said signal into an intermediate signal. Each ERU exhibits its own oscillator separate from the signal generator, and generates the oscillator signal for the mixer of the receiving apparatus of the ERU, whereby the frequency and/or phase of the oscillator signals, can be adjusted independently of the frequency and/or phase of oscillator signals of the oscillators of other ERUs.

Abstract: Testing is performed on a device under test. A first port of a first calibration module is connected to the device under test. A second port of the first calibration module is connected to a network analyzer. A first port of a second calibration module is connected to the device under test. A second port of the second calibration module is connected to the network analyzer. A measurement calibration and testing are performed without disconnecting the first port and the second port of the first calibration module and without disconnecting the first port and the second port of the second calibration module.

Abstract: A system for de-embedding electrical characteristics to obtain the intrinsic electrical characteristics of a device under test. The system includes obtaining a set of S parameter data from measurements of a thru test structure and partitioning that set into a set of input S parameters and a set of output S parameters. The set of input S parameters and the set of output S parameters are converted to sets of input ABCD parameters and output ABCD parameters, respectively. An inverse matrix of the set of input ABCD parameters is cascaded with a matrix of a set of ABCD parameters representative of the electrical characteristics of a test structure including the device under test. The resultant matrix is then cascaded with the inverse matrix of the set of output ABCD parameters to obtain a set of device ABCD parameters representative of the intrinsic electrical characteristics of the device under test.

Abstract: An S-parameter measurement technique allows measurement of devices under test (DUTs), such as power amplifiers, which require a modulated power tone drive signal for proper biasing, in combination with a probe tone test signal, wherein both the modulated and probe tone signals operate in the same frequency range. The technique uses a stochastic drive signal, such as a CDMA or WCDMA modulated signal in combination with a low power probe tone signal. A receiver in a VNA having a significantly narrower bandwidth than the modulated signal bandwidth enables separation of the modulated and probe tone signals. VNA calibration further improves the measurement accuracy. For modulated signals with a significant power level in the frequency range of the probe tone signal, ensemble averaging of the composite probe tone and power tone signals is used to enable separation of the probe tone signal for measurement.

Abstract: A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured responses are corrected with calibration data to characterize the multiport device.

Abstract: A generator (6) directs microwave signals to a waveguide (1) having a linear array of slots (2), and the signals are received by measuring device (5). The local permittivity or moisture content of material adjacent the waveguide (1), such as a stack of timber, may be determined at each slot (2) via regression analysis. The total permittivity or moisture may be determined by averaging measurements obtained for both transmission directions of the waveguide (1). The apparatus may be used for controlling drying parameters, such as drying time, for the material.

Abstract: An imaging system for medical and other applications in which the internal structures of an overall object must be seen without invading or damaging the object. The system works by transmitting electromagnetic waves of single or a multiplicity of frequencies through the object (for example the human body) and measuring the absorption and scattering of these waves by the various structures and inhomogeneities of the object, using scanning sub-wavelength resolution detectors.

Abstract: A system and method for determining the dielectric properties associated with a substrate. In one embodiment, a network analyzer measures scattering parameters for at least two lines of substantially identical cross-section embedded within the substrate over a specified frequency range. A first engine determines a complex propagation constant based on the scattering parameters and defines the complex propagation constant in terms of an attenuation component and a phase component. A second engine, responsive to the phase component, determines a relative permittivity parameter associated with the substrate over the specified frequency range. A third engine, responsive to the attenuation component and the relative permittivity parameter, performs a least squares analysis to determine a loss tangent parameter associated with the substrate over the specified frequency range.

Abstract: A distortion measurement method uses alternative measurements to determine the distortion of a DUT, depending on the ratio of the distortion at an output of the DUT to distortion of a source stimulating the DUT. The method includes calibrating the VNA at a distortion frequency, measuring a first gain of the DUT with the source and the receivers of the VNA set to the distortion frequency, and measuring a second gain of the DUT with the source of the VNA set to a fundamental frequency and the receivers of the VNA set to the distortion frequency. When the second gain is less than a predesignated threshold, a match-corrected source signal is acquired and used with the first gain and the second gain to determine the distortion of the DUT. When the second gain is not less than the predesignated threshold, a match-corrected DUT output signal is measured and used with the first gain and the second gain to determine the distortion of the DUT.

Abstract: A method for measuring a material's complex permittivity is provided where a near-field microwave probe is positioned a predetermined distance from a first and a second standard sample for measuring a relative resonant frequency shift of the near-field microwave probe for standard samples. Based on measurements, calibration coefficients are calculated. A relative resonant frequency shift of the near-field microwave probe for a sample under study is measured by fast frequency sweep technique while the distance between the tip of the probe and the sample under the study is maintained nominally at the distance between the tip of the probe and each standard sample during a calibration procedure by a shear-force based distance control mechanism. Also, the change in the quality factor of the probe for unloaded and loaded resonator is measured.

Abstract: A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration standard and a through calibration standard between each one of N direct pairs of the measurement ports and measuring forward and reverse reflection and transmission responses and calculating a load match error coefficient for each measurement port, and presenting only the through calibration standard between indirect pairs of measurement ports and calculating the forward and reverse transmission tracking for each indirect pairs of measurement ports.

Abstract: High reflection load pull tuners are proposed, which include two or more RF probes, placed in series into the same slotted airline (slabline) and being controlled simultaneously horizontally and vertically by remote electric control, allowing the creation of controlled reflection factors which are distributed over and cover the entire Smith Chart, from very low reflection factors up to very high reflection factors and a method allowing to align such tuners and to calibrate such tuners on a vector network analyzer.

Abstract: The values of the parameters of a large-signal S-parameter model of a device-under-test are determined by using a frequency-offset probe-tone method and by measuring and processing the spectral components of the scattered voltage waves with frequencies equal to the fundamental frequency, the fundamental frequency plus the said frequency offset and the fundamental frequency minus the said frequency offset.

Abstract: A recording medium includes a computer readable program for controlling a computer. The program comprises (a) code for calculating a current distribution by using a strength and phase of magnetic field measured from a measuring object; (b) code for calculating a first electric field strength at a measuring point from the current distribution; (c) code for calculating a second electric field strength at the measuring point by using a current distribution of a predetermined position on a part of the current distribution of the measuring object; and (d) code for calculating a ratio related to the first electric field strength in association with the second electric field strength.

Abstract: Apparatus and methods of obtaining information concerning a substance (57) is provided by applying pulses (91, 92, 93) of electromagnetic energy to the substance (57) and evaluating the response of the substance to the electromagnetic energy. The pulses (91, 92, 93) generated by a source (51) are of sufficiently short duration to generate a very broad frequency band of energy. The pulsed energy is directed to the substance (57) to be processed and energy pulses (91, 92, 93) passing through the substance (57) are received (56) and analyzed (66) to determine the properties of substance (57).

Abstract: A microwave holographic measuring method is disclosed. A first electrical signal S of microwave frequency is provided. A first part S1 of the first signal S is directed to a first antenna (101). Predetermined changes of phase and amplitude are applied to a second part S2 of the first signal S to produce a second electrical signal S4 which is coherent with the first part S1 of the first signal S. Microwave radiation is detected at a plurality of locations by means of a second antenna (107) to generate a third electrical signal S5 at each location. The second S4 and third S5 electrical signals are combined to produce a fourth electrical signal.

Abstract: According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenting three reflection standards with the automatic calibration device to each port of the N-port multiport test system. The method also consists of providing with the automatic calibration device, N−1 through conditions of a possible N(N−1)/2 possible through conditions, between corresponding ports of the N-port multiport test system, and making measurements with the N-port multiport test system of the three reflection standards at each port and the N−1 through conditions between the corresponding ports. The method further consists of determining all of systematic error coefficients for all of the ports of N-port multiport test system.