Where Energy Is Reflected (e.g., Reflectometry) Patents (Class 324/642)
-
Patent number: 6867600Abstract: The invention relates to an electronic circuit and method for testing a line (10). According to the invention the signal generator (20, 30) comprises a random bit series generating means for generating a spread spectrum test signal and the evaluating unit comprises means (60-90, 200-230) for calculating and evaluating the correlation function of the test signal and the reflected signal.Type: GrantFiled: September 23, 2000Date of Patent: March 15, 2005Assignee: Nokia CorporationInventors: Matti Iskanius, Ari-Petteri Pisila
-
Patent number: 6868357Abstract: A frequency domain reflectometer that is in electrical communication with a cable under test in order to determine cable characteristics including cable length and load characteristics such as capacitance, inductance, resistance, impedance (which is characterized as an open or short circuit condition), and the location of an open or short circuit, wherein the FDR cable testing is performed in-situ when the system is installed at the time of installation of the cable to thereby enable testing of cable without having to remove it and risk damage, wherein FDR cable testing is performed passively so as not to interfere with normal operation of the cable even if the FDR cable testing system should fail, wherein a system is taught that can detect faults that are difficult to detect out of an operating environment, and wherein FDR cable testing is performed to detect cable fray conditions, wherein the cable may be grounded or coupled to air.Type: GrantFiled: July 5, 2002Date of Patent: March 15, 2005Inventor: Cynthia M. Furse
-
Patent number: 6856936Abstract: Systems and methods to identify an event(s) representing a discontinuity in the impedance of a transmission line such as a wire cable using time domain reflectrometry (TDR) are presented. According to an exemplary embodiment, multiple layers of digital signal processing techniques are implemented in an algorithm that combats the smearing effect of a wide launch pulses with the reflection due to an event. The algorithm focuses on wavelet decomposition and additional post processing to produce a well-defined signal that allows easy identification of the reflected signal while preserving critical information, such as the location of the event and relative signal strength.Type: GrantFiled: July 31, 2002Date of Patent: February 15, 2005Assignee: Turnstone Systems, Inc.Inventors: Franz Chen, Kuo-Chung Lin
-
Patent number: 6853200Abstract: A method for retrieving predetermined locations in sewer and pipeline systems after application or deposition of a layer of material. A carrier vehicle having a microwave sensor emits microwave signals and receives backscattered microwave signals. A first run is conducted inside the sewer or pipeline system before application or deposition of the layer of material. A first temporal signal profile of the backscattered microwave signals is recorded and the sought locations are marked in the first signal profile. After the application or deposition of the layer of material, a second run is conducted. A second temporal signal profile of the backscattered signals is recorded. The current position of the vehicle in the sewer or pipeline system relative to the sought locations is determined by comparison with the first signal profile.Type: GrantFiled: March 16, 2001Date of Patent: February 8, 2005Assignee: Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.Inventors: Roland Munser, Helge-Björn Kuntze, Matthias Hartrumpf
-
Patent number: 6850076Abstract: High reflection load pull tuners are proposed, which include two or more RF probes, placed in series into the same slotted airline (slabline) and being controlled simultaneously horizontally and vertically by remote electric control, allowing the creation of controlled reflection factors which are distributed over and cover the entire Smith Chart, from very low reflection factors up to very high reflection factors and a method allowing to align such tuners and to calibrate such tuners on a vector network analyzer.Type: GrantFiled: December 23, 2002Date of Patent: February 1, 2005Inventor: Christos Tsironis
-
Patent number: 6847267Abstract: Systems and methods are described for transmitting a waveform having a controllable attenuation and propagation velocity. An exemplary method comprises: generating an exponential waveform, the exponential waveform (a) being characterized by the equation Vin=De?ASD(x?vSDt), where D is a magnitude, Vin is a voltage, t is time, ASD is an attenuation coefficient, and VSD is a propagation velocity; and (b) being truncated at a maximum value. An exemplary apparatus comprises: an exponential waveform generator; an input recorder coupled to an output of the exponential waveform generator; a transmission line under test coupled to the output of the exponential waveform generator; an output recorder coupled to the transmission line under test; an additional transmission line coupled to the transmission line under test; and a termination impedance coupled to the additional transmission line and to a ground.Type: GrantFiled: August 20, 2002Date of Patent: January 25, 2005Assignee: Board of Regents, The University of Texas SystemInventors: Robert H. Flake, John F. Biskup
-
Publication number: 20040239338Abstract: A method and an apparatus is described to measure at least one physical parameter of a substance such as moisture and salt content. This is done by transmitting a microwave beam through the material to be measured and detect only a reflection of a predetermined polarity of the transmitted waves. To accomplish this a polarizing plate is used so that only cross-polarised microwaves, which pass through the substance are detected and the co-polar reflections from surrounding structures are excluded. The object can either be moving as on a conveyer belt or in a rest position.Type: ApplicationFiled: April 28, 2004Publication date: December 2, 2004Inventors: Olafur H. Jonsson, Jon Thor Thorgeirsson
-
Patent number: 6812714Abstract: An apparatus for collecting RF signal measurement data at signal ports of an RF and microwave device-under-test (DUT). The apparatus comprises means for measuring incident and reflected RF signals at the signal ports of the DUT. Synthesizer means for generating RF signals at a fundamental frequency and higher harmonics. Tuner means arranged for loading the DUT under different impedance conditions for the fundamental frequency and higher harmonics, and means for feeding the RF signals of the synthesizer means to the signal ports of the DUT. The apparatus may form part of a Non-linear Network Measurement System (NNMS).Type: GrantFiled: September 24, 2002Date of Patent: November 2, 2004Assignee: Agilent Technologies, Inc.Inventors: Jan Verspecht, Ewout Vandamme
-
Publication number: 20040207409Abstract: A method and apparatus for monitoring a condition having a known relation to, or influence on, the transit time of a cyclically-repeating energy wave moving through a transmission channel, by: (a) transmitting a cyclically-repeating energy wave through the transmission channel from a transmitter at one end to a receiver at the opposite end; (b) continuously changing the frequency of the transmitter according to changes in the monitored condition while maintaining the number of waves in the transmission channel as a whole integer; and (c) utilizing the changes in frequency of the transmitter to provide a continuous indication of the monitored condition. Operation (b) is preferably performed by detecting a predetermined fiducial point in each cyclically-repeating energy wave received by the receiver, but may also be performed by the use of a phase-locked loop circuit, to maintain the number of energy waves in the loop of the transmission channel as a whole integer.Type: ApplicationFiled: May 13, 2004Publication date: October 21, 2004Applicant: Nexense Ltd.Inventors: Arie Ariav, Vladimir Ravitch
-
Patent number: 6801043Abstract: According to some embodiments, time domain reflectometry based transmitter equalization is provided. For example, a reflection detector in a transmitter may detect a reflection signal associated with a calibration signal that was transmitted via an interconnect. The reflection detector may then provide filter information to a transmitting unit to facilitate a transmission of data to a remote receiver via the interconnect. According to some embodiments, the receiver adjusts a termination impedance before the calibration signal is transmitted.Type: GrantFiled: December 20, 2002Date of Patent: October 5, 2004Assignee: Intel CorporationInventors: Alok Tripathi, Ken Drottar
-
Patent number: 6801131Abstract: A device and method for detecting the presence of insects in a structure utilize a plurality of transceivers, each of which generates separate and distinct microwave signals and receives separate and distinct signals reflected from a structure being tested. The reflected signals received by each of the transceivers are processed, for instance by a microprocessor, so as to provide output signals that indicate the presence or absence of insects in the structure. If most or all of the transceivers receive positive signals indicative of the possible presence of insects in the structure, which is a false indication of the presence of insects, the microprocessor distinguishes this false indication from an actual indication of the presence of insects, thereby enabling the detection of insects despite the existence of motion signals caused by non-insect motion.Type: GrantFiled: December 3, 2002Date of Patent: October 5, 2004Assignee: Trustees of Stevens Institute of TechnologyInventors: Dimitri Donskoy, Nikolay Sedunov
-
Patent number: 6798212Abstract: A probe having a built-in reference plane for use with TDR testing includes a conductive sheet member such as a wire mesh which is attached to a ground input of a TDR system. The conductive sheet is located proximate the tip of the test probe and extends radially from an axis of the test probe thereby providing its own reference ground plane.Type: GrantFiled: May 23, 2002Date of Patent: September 28, 2004Assignee: Texas Instruments IncorporatedInventors: Roger Joseph Stierman, Charles Anthony Odegard, Rebecca Lynn Holdford
-
Patent number: 6791339Abstract: An apparatus for contactless measurement of carrier concentration and mobility includes a microwave source, a circular waveguide for transmitting microwave radiation to a sample, such as a semiconductor wafer or panel for flat panel displays, at a measurement location, a first detector for detecting the forward microwave power, a second detector for detecting the microwave power reflected from the sample, and a third detector for detecting the Hall effect power. A circular waveguide, carrying only the TE11 mode, is terminated by the sample behind which a short is located. Perpendicular to the plane of the sample (and along the axis of the circular waveguide), a magnetic field is applied. In this configuration, a given incident TE11 wave will cause two reflected waves. One is the ordinary reflected wave in the same polarization as the incident one. A detector is provided to measure this reflected radiation. The other reflected wave is caused by the Hall effect.Type: GrantFiled: May 1, 2002Date of Patent: September 14, 2004Assignee: Lehighton Electronics, Inc.Inventors: Jerome C. Licini, Nikolai Eberhardt
-
Patent number: 6788244Abstract: The invention is a device for inspecting an assembly including a surface coating containing magnetic radar-absorbing materials on a conductive surface. In detail, the device includes a first system for transmitting an electromagnetic signal to the assembly, which includes a first waveguide made of a conductive material coupled in series to a second waveguide made of a dielectric material. A second system is provided for receiving the portion of the electromagnetic signal reflected from the assembly, which includes a third waveguide made of a conductive material coupled in series to a fourth waveguide made of a dielectric material. Thus the electromagnetic signal is transmitted from the first waveguide to the second waveguide on to the assembly and the portion of the electromagnetic signal reflected off the assembly is received by the fourth-waveguide and transmitted to the third, waveguide.Type: GrantFiled: July 11, 2003Date of Patent: September 7, 2004Assignee: Northrop Grumman CorporationInventor: Kent K. Tam
-
Patent number: 6788073Abstract: A data processing system having mismatched impedance components and method of use is disclosed. In one embodiment, the method includes exciting a printed circuit board circuit having mismatched impedance printed circuit board components. Measuring at least one impedance of the circuit with a time domain reflectometer. In response to the measured at least one impedance of the circuit, adjusting at least one printed circuit board circuit element.Type: GrantFiled: September 6, 2002Date of Patent: September 7, 2004Assignee: Dell Products L.P.Inventors: Douglas E. Wallace, Steven J. Lash, Stephanus D. Saputro
-
Patent number: 6784854Abstract: Apparatus and methodology utilizing nearfield microwave technology to detect contraband/forbidden substances concealed within metallic containers. Apparatus and methodologic microwave operating frequency determines the metallic thickness through which detection is possible, and also the expectable “depths” for detection within a metallic container. Special and important attention is paid to the appropriate positional and distance locating of the invention apparatus relative to a suspected “substance-containing” metallic container for detection to be most effective. Preferably, this distance is substantially equal to the closest distance from the central radiating plane of a lens/antenna (which is employed, according to a preferred practice of the invention) at which a conductive, metallic surface will regeneratively parasitize the lens/antenna.Type: GrantFiled: March 12, 2003Date of Patent: August 31, 2004Assignee: Spatial Dynamics, Ltd.Inventor: Tex Yukl
-
Patent number: 6782328Abstract: An apparatus for measuring concentration of a material in a process fluid includes an antenna configured to contact the process fluid and a pulse generator coupled to the antenna to generate a microwave transmit pulse through the antenna. A pulse receiver receives a reflected pulse from the antenna and the concentration of the material is calculated as a function of the reflected pulse.Type: GrantFiled: October 29, 2001Date of Patent: August 24, 2004Assignee: Rosemount Inc.Inventors: Eric R. Lovegren, Mark S. Schumacher, James A. Johnson, Kurt C. Diede
-
Publication number: 20040145376Abstract: A method according to one embodiment may include transmitting, via a network, to a node comprised in the network a relatively small portion of a signal propagated via a first buried transmission line. The network may be coupled to the transmission line and may be at least partially buried. The node may be capable of being coupled to a device that is capable of determining, based at least in part upon one or more characteristics of the relatively small portion of the signal received at the node, one or more characteristics of the signal propagated via the transmission line. The relatively small portion of the signal may have a magnitude that is relatively small compared to a magnitude of the signal. Of course, many modifications and variations are possible without departing from this embodiment.Type: ApplicationFiled: January 24, 2003Publication date: July 29, 2004Inventor: Su Mi Sam
-
Publication number: 20040113633Abstract: Disclosed herein is a method of measuring a dielectric constant of a Printed Circuit Board (PCB) for a Rambus Inline Memory Module (RIMM), which includes the steps of measuring a length of a Rambus product of a PCB, applying an input waveform to the Rambus product at a certain probing position and obtaining a cross point of rising times of the input waveform and an output waveform generated by reflection of the input waveform, obtaining time corresponding to the cross point, and calculating a dielectric constant by substituting the measured length of the Rambus product and the obtained time for corresponding variables of a dielectric constant calculating equation.Type: ApplicationFiled: May 28, 2003Publication date: June 17, 2004Inventors: Young-Woo Kim, Byoung-Ho Rhee, Dek-Gin Yang, Young-Sang Cho, Dong-Hwan Lee
-
Patent number: 6750657Abstract: A combination includes a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding the high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back. The feedthrough element includes at least one guiding element (6), into which the electric high-frequency signal is to be fed at an inlet point (10), and which transmits at an outlet point (17) the electric high-frequency signal to a probe (7) adapted to guide the high-frequency signal, a one-part or multipart mechanical carrier element (1), and a one-part or multipart insulation (11, 12) present between the carrier element (1) and the guiding element (6). In the combination the impedance of the feedthrough element and the impedance of the probe (7) following the outlet point (17) are substantially matched to each other at the outlet point (17).Type: GrantFiled: November 19, 2001Date of Patent: June 15, 2004Assignee: VEGA Grieshaber KGInventors: Karl Griessbaum, Josef Fehrenbach, Jurgen Motzer
-
Publication number: 20040104733Abstract: A method and apparatus of measuring a predetermined parameter having a known relation to the transit time of movement of an energy wave through a medium, by transmitting from a first location in the medium a cyclically-repeating energy wave; receiving the cyclically-repeating energy wave at a second location in the medium; detecting a predetermined fiducial point in the cyclically-repeating energy wave received at the second location; continuously changing the frequency of transmission of the cyclically-repeating energy wave from the first location to the second location in accordance with the detected fiducial point of each received cyclically-repeating energy wave received at the second location such that the number of waves received at the second location from the first location is a whole integer; and utilizing the change in frequency to produce a measurement of the predetermined parameter.Type: ApplicationFiled: July 10, 2003Publication date: June 3, 2004Inventor: Arie Ariav
-
Publication number: 20040100280Abstract: The invention provides a noncontact measuring system for electrical conductivity, which uses a microwave. In the measuring system for electrical conductivity, the microwave generated in a network analyzer (NA) 110 is guided to a surface of a silicon wafer (sample) 160 through a waveguide 130 and a sensor 140. The surface of the silicon wafer 160 is irradiated with the microwave, and the sensor 140 receives the reflected microwave. The electrical conductivity of the silicon wafer 160 is measured in such a manner that a computer (personal computer) 120 calculates the electrical conductivity from an amplitude ratio A and phase difference &thgr; to a reflected wave of the silicon wafer 160, which is determined with the network analyzer 110. The computer 120 performs not only the calculation of the measurement but also whole control of the measuring system such as positioning of the sample.Type: ApplicationFiled: May 20, 2003Publication date: May 27, 2004Applicant: TOHOKU TECHNO ARCH CO., LTD.Inventors: Yang Ju, Masumi Saka, Hiroyuki Abe
-
Patent number: 6722261Abstract: A piston position in a cylinder of a hydraulic assembly is measured using microwave pulses. The microwave pulses are launched along a conductor coupled to the piston or cylinder. A sliding member is slidably coupled to the conductor and moves with the piston or cylinder. Position is determined as a function of a reflection from the end of the conductor and the sliding member. Various aspects include signal processing, fudicial pulse identification control and input/output circuitry, and a three conductor configuration.Type: GrantFiled: December 11, 2002Date of Patent: April 20, 2004Assignee: Rosemount Inc.Inventors: Gregory C. Brown, James A. Johnson, Eric R. Lovegren
-
Patent number: 6724197Abstract: A fill-level detector operating by the radar principle gauges the fill-level of the lower of two substances layered one atop the other in a container. The detector incorporates first and second essentially straight, parallel electrical conductors having a signal generator and a transducer mounted to the upper ends of the conductors with the lower ends of the conductors protruding into the lower substance. The generator delivers a signal to the first conductor which signal is conducted into the lower substance with a portion of that signal being reflected at the interface of the two substances which signal portion is captured by the transducer. The detector is able to determine to fill level of the lower substance even when the upper substance displays a high dielectric constant.Type: GrantFiled: August 5, 2002Date of Patent: April 20, 2004Assignee: Krohne S.A.Inventors: Joseph Neven, Achim Bletz
-
Patent number: 6722260Abstract: A piston position in a cylinder of a hydraulic assembly is measured using microwave pulses. The microwave pulses are launched along a conductor coupled to the piston or cylinder. A sliding member is slidably coupled to the conductor and moves with the piston or cylinder. Position is determined as a function of a reflection from the end of the conductor and the sliding member.Type: GrantFiled: December 11, 2002Date of Patent: April 20, 2004Assignee: Rosemount Inc.Inventor: Gregory C. Brown
-
Publication number: 20040020314Abstract: A synthetic wave is obtained which represents the synthesis of a transmitted wave radiated from a sensor and a reflected wave returned from a breathing human body, and the presence or absence of a human in the vehicle is detected from the envelope of the synthetic wave. When the presence of a human is detected continuously for a predetermined length of time, it is determined that a human is present in the vehicle.Type: ApplicationFiled: April 23, 2003Publication date: February 5, 2004Inventors: Choichiro Tsuchihashi, Yasushi Shinojima
-
Patent number: 6674293Abstract: The present invention is an adaptable pre-matched tuner system and calibration method for measuring reflection factors above &Ggr;=0.85 for a DUT. The system includes a first and second large-band microwave tuners connected in series, the first and second large-band tuners being mechanically and electronically integrated; and a controller for controlling the two large-band tuners. The first tuner is adapted to act as a pre-matching tuner and the second tuner is adapted to investigate an area of a Smith Chart that is difficult to characterise with a single tuner, so that the combination of the first and second large-band tuners permits the measurement of reflection factors above &Ggr;=0.85. The pre-matched tuner system allows the generation of a very high reflection factor at any point of the reflection factor plane (Smith Chart).Type: GrantFiled: June 13, 2000Date of Patent: January 6, 2004Inventor: Christos Tsironis
-
Patent number: 6646451Abstract: A computer-based method and computer-readable medium containing computer-executable instructions for assimilating data collected by a time domain reflectometer and displaying more than two waves representing reflections of a pulse on conductors is provided. The method includes a means for wave reversal, wave shifting, multi-wave display, segmented velocity of propagation adjustment, multi-cursor option multi-flagging options and calculating of the total length of wet cable. The combination of these functions provides a highly accurate means for identifying the location of splices, faults, corrosion, cable damage and other anomalies that are typically found on any length of conductor cable. The ability of this method to display a greater number of waves simultaneously adds additional benefit to a technician attempting to locate particular anomalies with multi-conductor cables.Type: GrantFiled: December 6, 2000Date of Patent: November 11, 2003Assignee: Utilx CorporationInventor: Keith W. Lanan
-
Patent number: 6633170Abstract: A new method and apparatus for detecting and measuring the level of metal present on the surface of a substrate is achieved. Energy, in the form of rf or light or microwave energy, is directed at the surface of a wafer, the reflected energy or the energy that passes through the semiconductor substrate is captured and analyzed for energy level and/or frequency content. Based on this analysis conclusions can be drawn regarding presence and type of metal on the surface of the wafer. Furthermore, by inclusion of metal within the resonating circuit of an rf generator changes the frequency of the vibration and therefore detects the presence of metal.Type: GrantFiled: September 30, 2002Date of Patent: October 14, 2003Assignee: Chartered Semiconductor Manufacturing Ltd.Inventors: Sik On Kong, Tsui Ping Chu
-
Patent number: 6632534Abstract: A probe adapted for use with a time domain reflectrometry device in primarily measuring the moisture content in soils and other mediums. This probe can however be used in may differing measurement applications involving materials of specific dielectric constants as well as apparent dielectric constants that are derived from a matrix of several differing dielectrics. In the probe according to the present invention, the inner core of the probe is composed of an inner conductive element, a conductor that is used to transmit a broadband pulse. A dielectric liquid, solid or gel surrounds this inner conductive core, and assists in retaining broadband signal strength. The dielectric material is then encased in a metallic outer shell that serves as a protective housing for the probe. This outer shell is electronically transparent to the electromagnetic pulse transmitted by the active inner conductive core and surrounding dielectric.Type: GrantFiled: August 30, 2001Date of Patent: October 14, 2003Assignee: Soilmoisture Equipment Corp.Inventors: Whitney Skaling, Laszlo Rudolics
-
Patent number: 6630833Abstract: Systems, methods, and probe devices for electronic monitoring and characterization using absorbent media confined by a metallic mesh. The mesh allows a stream of liquid or gas to pass through the structure, so that the media will adsorb the material to which it is specific. This changes the permittivity of the media in which the electromagnetic field is propagating. This change in permittivity can be seen through the use of classical microwave methods such as phase shift, amplitude changes, frequency changes in a cavity or the frequency of an unbuffered oscillator. Some embodiments use a two cylinder structure, where an outer cylinder contains a material which selectively removes a chemical which may be in conflict with or would contaminate the sensing of the desired chemical. This outer cylinder does not play a part in the measurement because it is outside the metal shield which contains the measurement adsorbent, and is thus outside the electromagnetic field.Type: GrantFiled: March 9, 2001Date of Patent: October 7, 2003Assignee: Phase Dynamics, Inc.Inventor: Bentley N. Scott
-
Publication number: 20030169053Abstract: The present invention provides an electromagnetic prober comprising a transmission antenna, a reception antenna, a reception signal processing section for generating an analytic signal on the basis of a detection signal of the reception antenna, and an analytic processing section for performing a predefined analytic process on the basis of the analytic signal, wherein the analytic processing section includes in-medium dielectric constant calculation means which divides the analytic signal into a plurality of time-based ranges and performs a predefined computation on average cycle periods in the respective time-based ranges of the analytic signal to calculate average dielectric constants in depth ranges of the medium corresponding to the respective time-based ranges. Thus, even an unskilled person can easily measure a dielectric constant at each depth level in the medium to determine a depth at which an object to be surveyed is present.Type: ApplicationFiled: March 13, 2003Publication date: September 11, 2003Inventor: Masahiro Fujiwara
-
Patent number: 6608489Abstract: A system is provided for detecting accumulation of material concurrently on multiple areas of a surface in real time. In one embodiment, it is used for detecting icing of airframes while in use or on the ground while awaiting use. It may use either Time Domain Reflectometry (TDR) or Frequency Modulated Continuous Wave (FM-CW) sources to provide a known energizing signal to a transmission line sensor. The system ascertains the signal's round trip travel time in the transmission line. As material accumulates around the transmission line sensor, the medium through which the signal propagates is indicated by the change in time for the signal to propagate in relation to propagation in a reference medium, e.g., air. By employing pre-specified spectral analysis algorithms and referencing to the dielectric constant of media of interest, a determination of the occurrence, location, and the rate and type of material accumulation can be made.Type: GrantFiled: December 17, 2001Date of Patent: August 19, 2003Assignee: The United States of America as represented by the Secretary of the ArmyInventors: Norbert E. Yankielun, Charles C. Ryerson
-
Publication number: 20030146840Abstract: A device and method for detecting the presence of insects in a structure utilize a plurality of transceivers, each of which generates separate and distinct microwave signals and receives separate and distinct signals reflected from a structure being tested. The reflected signals received by each of the transceivers are processed, for instance by a microprocessor, so as to provide output signals that indicate the presence or absence of insects in the structure. If most or all of the transceivers receive positive signals indicative of the possible presence of insects in the structure, which is a false indication of the presence of insects, the microprocessor distinguishes this false indication from an actual indication of the presence of insects, thereby enabling the detection of insects despite the existence of motion signals caused by non-insect motion.Type: ApplicationFiled: December 3, 2002Publication date: August 7, 2003Inventors: Dimitri Donskoy, Nikolay Sedunov
-
Patent number: 6590399Abstract: A method for taking measurements using a vector network analyzer (VNA) enables a reduction in interference created when the VNA is operated in the presence of external signals. For the method, three measurements are taken, one at a desired measurement frequency, another at a frequency slightly less than the desired measurement frequency, and another at a slightly greater frequency than the desired measurement frequency. An interfering signal may occur at or near the frequency of one of the three measurements. To eliminate measurement error from the interfering signal, the measurement signal with the median, or middle, magnitude is selected to provide the measurement results.Type: GrantFiled: April 27, 2000Date of Patent: July 8, 2003Assignee: Anritsu CompanyInventors: Eric Branden Karl, Yuenie Lau
-
Patent number: 6588313Abstract: A piston position in a cylinder of a hydraulic assembly is measured using microwave pulses. The microwave pulses are launched along a conductor coupled to the piston or cylinder. A sliding member is slidably coupled to the conductor and moves with the piston or cylinder. Position is determined as a function of a reflection from the end of the conductor and the sliding member.Type: GrantFiled: November 19, 2001Date of Patent: July 8, 2003Assignee: Rosemont Inc.Inventors: Gregory C. Brown, Brian E. Richter
-
Patent number: 6559657Abstract: A method and apparatus for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable for a material in a vessel. The method includes the steps of determining a reference signal along a probe in the vessel, establishing a first fiducial reference point, a reference end of probe location, a measuring length and a maximum probe length. The method also includes the steps of periodically detecting a TDR signal along the probe, establishing a second fiducial reference point, a detected end of probe location, an end of probe peak to peak amplitude, and attempting to determine a process variable reflection on the TDR signal. The method indicates a broken cable condition, a loss of high frequency connection, a low amplitude reflection condition, an empty vessel condition.Type: GrantFiled: January 12, 1999Date of Patent: May 6, 2003Assignee: Endress+Hauser GmbH+Co.Inventors: William Patrick McCarthy, Kenneth L. Perdue, Donald D. Cummings, Gerd Wartmann
-
Patent number: 6538454Abstract: A microwave microscope having a resonant slit formed in a highly conductive end of a microwave waveguide forming a probe tip. A short dielectric rod is fit into the waveguide near its conductive end. A longer dielectric rod is placed in back of the short dielectric rod with a small gap between the two rods. The length of the shorter rod and the size of the gap are chosen to form a dielectric resonator at the microwave frequency adjacent to the probe tip. Thereby, the impedance of the waveguide can be matched to the generally high impedance of the slit probe tip. Preferably, the dielectric constant of the materials is high, thereby reducing the size of the waveguide and probe tip relative to the microwave wavelength.Type: GrantFiled: September 8, 2000Date of Patent: March 25, 2003Assignee: Yissum Research Development Company of the Hebrew University JerusalemInventors: Avraham Frenkel, Dan Davidov, Michael Golosovsky
-
Patent number: 6525545Abstract: A frequency domain measurement device multi-phase modulates an RF frequency signal with a broadband signal, such as a pseudo random number, to produce an RF spread spectrum signal that encompasses a frequency range of interest. The RF spread spectrum signal is transmitted to a device under test, and a corresponding reflected signal from the device under test is correlated with the RF spread spectrum signal to produce information from which location of and distance to a fault in the device under test may be determined. A FIR filter is used as part of the correlation process to determine magnitude and phase versus frequency over the frequency range of interest for the device under test as well as location of and distance to the fault.Type: GrantFiled: February 28, 2001Date of Patent: February 25, 2003Assignee: Tektronix, Inc.Inventor: Thomas C. Hill
-
Patent number: 6515465Abstract: A method for measuring harmonic load-pull including supplying a fundamental frequency signal to a frequency multiplication device under test and obtaining a target even-order multiplied frequency signal. The fundamental load impedance and an even-harmonic load impedance are independently controlled with a load mechanical tuner having an open-ended stub that is one-quarter wavelength long at the fundamental frequency and satisfies a short-circuit condition with respect to the fundamental signal. A fundamental source impedance and an even-harmonic source impedance of an input signal applied to the device under test are independently controlled with a source mechanical tuner having a short-circuit stub that is one-quarter wavelength long at the fundamental frequency and satisfies a short-circuit condition with respect to even-harmonics.Type: GrantFiled: March 22, 2001Date of Patent: February 4, 2003Assignee: Communications Research Laboratory, Independant Administration InstitutionInventors: Masahiro Kiyokawa, Toshiaki Matsui
-
Patent number: 6512377Abstract: The present invention relates to a via parasitics testing and extracting method for Gigabit multi-layered PCB boards. The method of the present invention is a unique test and extraction process that utilizes a TDR measurement and processes the output data therefrom externally. The testing aspect involves obtaining a TDR module waveform and obtaining a text file with output data, whereas the extraction aspect involves analysis of the data in the text file. This method can be used directly to ascertain a Gigabit via structure without the limitations that are imposed by the conventional methods discussed above, and has been theoretically proven to be highly accurate and much faster than any of the existing methods. The method of the present invention has the potential to be included as a built-in testing feature in high-speed TDR meters, and may also be used in order to design an optimized via.Type: GrantFiled: June 29, 2001Date of Patent: January 28, 2003Assignee: Nortel Networks LimitedInventors: Shuhui Deng, Stephen S Brazeau, Xiao-Ding Cai
-
Publication number: 20030016028Abstract: A method and apparatus for electrically testing a pipe-in-pipe pipeline during the construction, installation, commissioning, operation, or dismantling phases of an electrically heated pipe-in-pipe subsea pipeline. One embodiment is directed to a high voltage qualification test of the electrical integrity of a segment of a pipe-in-pipe pipeline. Another embodiment is directed to a method and an apparatus for performing a high voltage pulse test of the electrical integrity of a pipe-in-pipe pipeline. Yet another embodiment of the present invention is directed to a method and an apparatus for performing a low voltage pulse test of the electrical integrity of a pipe-in-pipe pipeline, which may be performed during the operation phase of an electrically heated pipe-in-pipe pipeline.Type: ApplicationFiled: July 20, 2001Publication date: January 23, 2003Inventor: Ronald M. Bass
-
Patent number: 6499346Abstract: This level measuring instrument which operates with microwaves, has a radiation characteristic with a pronounced forward lobe and can be used to transmit and/or receive microwaves with a large frequency bandwidth. A housing section is designed as a waveguide short-circuited at one side and one end by a rear wall, and is virtually completely filled with an insert made of a dielectric. An exciter element, projects into the housing section and is connected to a microwave source. An antenna adjoins the housing section, for transmitting and/or receiving microwaves. A gap is arranged in the insert between the exciter element and the antenna. The gap forms a filter which is essentially non-transparent to higher modes of the waveguide.Type: GrantFiled: November 28, 2000Date of Patent: December 31, 2002Assignee: Endress + Hauser GmbH + Co.Inventors: Andreas Wien, Klaus-Peter Oberle, Alexander Hardell, Stefan Burger
-
Publication number: 20020186025Abstract: A fill-level detector operating by the radar principle gauges the fill-level of the lower of two substances layered one atop the other in a container. The detector incorporates first and second essentially straight, parallel electrical conductors having a signal generator and a transducer mounted to the upper ends of the conductors with the lower ends of the conductors protruding into the lower substance. The generator delivers a signal to the first conductor which signal is conducted into the lower substance with a portion of that signal being reflected at the interface of the two substances which signal portion is captured by the transducer. The detector is able to determine to fill level of the lower substance even when the upper substance displays a high dielectric constant.Type: ApplicationFiled: August 5, 2002Publication date: December 12, 2002Inventors: Joseph Neven, Achim Bletz
-
Patent number: 6477474Abstract: Disclosed is a method of using a low power radar level transmitter to calculate a dielectric constant of a product in a tank. Low Power Time Domain Reflectometry Radar (LPTDRR) circuitry is controlled to calculate a time delay between transmission of microwave energy down a termination extending into the product in the tank and reflection of the microwave energy. In some embodiments, the dielectric constant of the product is calculated as a function of the time delay. In other embodiments, the dielectric constant is calculated by controlling the LPTDRR circuitry to calculate amplitudes of transmit and receive pulses. The dielectric of the product is calculated as a function of the amplitudes of the transmit and receive pulses.Type: GrantFiled: January 21, 1999Date of Patent: November 5, 2002Assignee: Rosemount Inc.Inventor: Kurt C. Diede
-
Publication number: 20020158639Abstract: There are provided a laminate with an inside layer circuit for use as a multilayer printed circuit board, a method for measuring a circuit impedance of the laminate, and a measuring device that enables a nondestructive impedance measurement accurately. The laminate with the inside layer circuit has a dielectric substrate, a first conductive layer disposed on an upper surface of the dielectric substrate to form a high frequency circuit, a second conductive layer disposed on a lower surface of the dielectric substrate, and a third conductive layer disposed over a first dielectric layer on the upper surface of the dielectric substrate. A test conductor is formed independently of the inside layer circuit within the first conductive layer.Type: ApplicationFiled: December 26, 2001Publication date: October 31, 2002Inventors: Toru Nakashiba, Yukio Matsushita, Tatsumi Iwaishi, Masanobu Takedomi, Mitsuhide Nagaso, Motoyuki Akamatsu, Tokio Yoshimitsu, Kanji Kurata
-
Patent number: 6472883Abstract: Pulse propagation analysis to ascertain whether and anomaly such as surface corrosion exists on a section of conductive member such as pipe. Anomalies such as surface corrosion result in localized velocity changes of pulses propagating along a conductive member. These localized velocity changes exhibit themselves in changes in waveform, rise and fall time, amplitude, and time delay of a pulse with respect to a fixed time reference. To allow such anomalies to be located, two pulses are generated such that they intersect at intersecting locations along the conductive member. The resulting modified pulses are analyzed for perturbations indicative of localized velocity changes.Type: GrantFiled: June 6, 2000Date of Patent: October 29, 2002Assignee: Profile Technologies, Inc.Inventor: Gale D. Burnett
-
Patent number: 6459279Abstract: A hand held diagnostic test device enables determination of the integrity of low observable (L.O.) properties in structures or surfaces of a structure, and includes a housing containing a first component for coupling energy signals into the structure or a surface of the structure, a second component for detecting the response energy signals, a third component for determining whether the response energy signals indicate flaws in the surface of the structure, and a fourth component for signaling an operator of the diagnostic test device of the results. The energy signal is an RF signal, and a microprocessor in the test device enables determination of the integrity of the structure of surface by comparing the returned signals against a stored acceptable signal. Acceptability or non-acceptability is signaled to the operator of the diagnostic test device by indicator lamps located on the sensor housing and/or a digital display.Type: GrantFiled: June 13, 2001Date of Patent: October 1, 2002Assignee: Lockheed Martin CorporationInventor: Tom Moyes
-
Patent number: 6452400Abstract: A probe (6) is brought into contact with a plasma produced by ionizing Ar gas, a saturation current (Ies2) at which current flowing through the probe is saturated when the potential of the probe is changed in a potential region where the potential of the probe is higher than a ground potential, and a saturation current (Iis2) at which current flowing through the probe is saturated when the potential of the probe is changed in a potential region where the potential of the probe is lower than the ground potential. Similarly, saturation currents (Ies2, Iis2) are measured by bringing the probe (6) into contact with a plasma produced by ionizing a mixed gas containing Ar gas and a process gas, such as C4F8 gas, and changing the potential of the probe (6). The negative ion density of the plasma produced by ionizing C4F8 gas is determined by using saturation current ratios (Iis1/Iis2, Ies1/Ies2).Type: GrantFiled: June 19, 2000Date of Patent: September 17, 2002Assignee: Tokyo Electron LimitedInventors: Yoshinobu Kawai, Yoko Ueda, Nobuo Ishii, Satoru Kawakami
-
Publication number: 20020121907Abstract: The invention relates to a combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back. The feedthrough element comprises at least one guiding element (6), into which the electric high-frequency signal is to be fed at an inlet point (10), and which transmits at an outlet point (17) the electric high-frequency signal to a probe (7) meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element (1), and a one-part or multipart insulation (11, 12) present between the carrier element (1) and the guiding element (6). The mentioned combination is characterized in that the impedance of the feedthrough element and the impedance of the probe (7) following the outlet point (17) are substantially matched to each other at the outlet point (17).Type: ApplicationFiled: November 19, 2001Publication date: September 5, 2002Inventors: Karl Griessbaum, Josef Fehrenbach, Jurgen Motzer