Where Energy Is Reflected (e.g., Reflectometry) Patents (Class 324/642)
  • Patent number: 6867600
    Abstract: The invention relates to an electronic circuit and method for testing a line (10). According to the invention the signal generator (20, 30) comprises a random bit series generating means for generating a spread spectrum test signal and the evaluating unit comprises means (60-90, 200-230) for calculating and evaluating the correlation function of the test signal and the reflected signal.
    Type: Grant
    Filed: September 23, 2000
    Date of Patent: March 15, 2005
    Assignee: Nokia Corporation
    Inventors: Matti Iskanius, Ari-Petteri Pisila
  • Patent number: 6868357
    Abstract: A frequency domain reflectometer that is in electrical communication with a cable under test in order to determine cable characteristics including cable length and load characteristics such as capacitance, inductance, resistance, impedance (which is characterized as an open or short circuit condition), and the location of an open or short circuit, wherein the FDR cable testing is performed in-situ when the system is installed at the time of installation of the cable to thereby enable testing of cable without having to remove it and risk damage, wherein FDR cable testing is performed passively so as not to interfere with normal operation of the cable even if the FDR cable testing system should fail, wherein a system is taught that can detect faults that are difficult to detect out of an operating environment, and wherein FDR cable testing is performed to detect cable fray conditions, wherein the cable may be grounded or coupled to air.
    Type: Grant
    Filed: July 5, 2002
    Date of Patent: March 15, 2005
    Inventor: Cynthia M. Furse
  • Patent number: 6856936
    Abstract: Systems and methods to identify an event(s) representing a discontinuity in the impedance of a transmission line such as a wire cable using time domain reflectrometry (TDR) are presented. According to an exemplary embodiment, multiple layers of digital signal processing techniques are implemented in an algorithm that combats the smearing effect of a wide launch pulses with the reflection due to an event. The algorithm focuses on wavelet decomposition and additional post processing to produce a well-defined signal that allows easy identification of the reflected signal while preserving critical information, such as the location of the event and relative signal strength.
    Type: Grant
    Filed: July 31, 2002
    Date of Patent: February 15, 2005
    Assignee: Turnstone Systems, Inc.
    Inventors: Franz Chen, Kuo-Chung Lin
  • Patent number: 6853200
    Abstract: A method for retrieving predetermined locations in sewer and pipeline systems after application or deposition of a layer of material. A carrier vehicle having a microwave sensor emits microwave signals and receives backscattered microwave signals. A first run is conducted inside the sewer or pipeline system before application or deposition of the layer of material. A first temporal signal profile of the backscattered microwave signals is recorded and the sought locations are marked in the first signal profile. After the application or deposition of the layer of material, a second run is conducted. A second temporal signal profile of the backscattered signals is recorded. The current position of the vehicle in the sewer or pipeline system relative to the sought locations is determined by comparison with the first signal profile.
    Type: Grant
    Filed: March 16, 2001
    Date of Patent: February 8, 2005
    Assignee: Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
    Inventors: Roland Munser, Helge-Björn Kuntze, Matthias Hartrumpf
  • Patent number: 6850076
    Abstract: High reflection load pull tuners are proposed, which include two or more RF probes, placed in series into the same slotted airline (slabline) and being controlled simultaneously horizontally and vertically by remote electric control, allowing the creation of controlled reflection factors which are distributed over and cover the entire Smith Chart, from very low reflection factors up to very high reflection factors and a method allowing to align such tuners and to calibrate such tuners on a vector network analyzer.
    Type: Grant
    Filed: December 23, 2002
    Date of Patent: February 1, 2005
    Inventor: Christos Tsironis
  • Patent number: 6847267
    Abstract: Systems and methods are described for transmitting a waveform having a controllable attenuation and propagation velocity. An exemplary method comprises: generating an exponential waveform, the exponential waveform (a) being characterized by the equation Vin=De?ASD(x?vSDt), where D is a magnitude, Vin is a voltage, t is time, ASD is an attenuation coefficient, and VSD is a propagation velocity; and (b) being truncated at a maximum value. An exemplary apparatus comprises: an exponential waveform generator; an input recorder coupled to an output of the exponential waveform generator; a transmission line under test coupled to the output of the exponential waveform generator; an output recorder coupled to the transmission line under test; an additional transmission line coupled to the transmission line under test; and a termination impedance coupled to the additional transmission line and to a ground.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: January 25, 2005
    Assignee: Board of Regents, The University of Texas System
    Inventors: Robert H. Flake, John F. Biskup
  • Publication number: 20040239338
    Abstract: A method and an apparatus is described to measure at least one physical parameter of a substance such as moisture and salt content. This is done by transmitting a microwave beam through the material to be measured and detect only a reflection of a predetermined polarity of the transmitted waves. To accomplish this a polarizing plate is used so that only cross-polarised microwaves, which pass through the substance are detected and the co-polar reflections from surrounding structures are excluded. The object can either be moving as on a conveyer belt or in a rest position.
    Type: Application
    Filed: April 28, 2004
    Publication date: December 2, 2004
    Inventors: Olafur H. Jonsson, Jon Thor Thorgeirsson
  • Patent number: 6812714
    Abstract: An apparatus for collecting RF signal measurement data at signal ports of an RF and microwave device-under-test (DUT). The apparatus comprises means for measuring incident and reflected RF signals at the signal ports of the DUT. Synthesizer means for generating RF signals at a fundamental frequency and higher harmonics. Tuner means arranged for loading the DUT under different impedance conditions for the fundamental frequency and higher harmonics, and means for feeding the RF signals of the synthesizer means to the signal ports of the DUT. The apparatus may form part of a Non-linear Network Measurement System (NNMS).
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: November 2, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Jan Verspecht, Ewout Vandamme
  • Publication number: 20040207409
    Abstract: A method and apparatus for monitoring a condition having a known relation to, or influence on, the transit time of a cyclically-repeating energy wave moving through a transmission channel, by: (a) transmitting a cyclically-repeating energy wave through the transmission channel from a transmitter at one end to a receiver at the opposite end; (b) continuously changing the frequency of the transmitter according to changes in the monitored condition while maintaining the number of waves in the transmission channel as a whole integer; and (c) utilizing the changes in frequency of the transmitter to provide a continuous indication of the monitored condition. Operation (b) is preferably performed by detecting a predetermined fiducial point in each cyclically-repeating energy wave received by the receiver, but may also be performed by the use of a phase-locked loop circuit, to maintain the number of energy waves in the loop of the transmission channel as a whole integer.
    Type: Application
    Filed: May 13, 2004
    Publication date: October 21, 2004
    Applicant: Nexense Ltd.
    Inventors: Arie Ariav, Vladimir Ravitch
  • Patent number: 6801043
    Abstract: According to some embodiments, time domain reflectometry based transmitter equalization is provided. For example, a reflection detector in a transmitter may detect a reflection signal associated with a calibration signal that was transmitted via an interconnect. The reflection detector may then provide filter information to a transmitting unit to facilitate a transmission of data to a remote receiver via the interconnect. According to some embodiments, the receiver adjusts a termination impedance before the calibration signal is transmitted.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: October 5, 2004
    Assignee: Intel Corporation
    Inventors: Alok Tripathi, Ken Drottar
  • Patent number: 6801131
    Abstract: A device and method for detecting the presence of insects in a structure utilize a plurality of transceivers, each of which generates separate and distinct microwave signals and receives separate and distinct signals reflected from a structure being tested. The reflected signals received by each of the transceivers are processed, for instance by a microprocessor, so as to provide output signals that indicate the presence or absence of insects in the structure. If most or all of the transceivers receive positive signals indicative of the possible presence of insects in the structure, which is a false indication of the presence of insects, the microprocessor distinguishes this false indication from an actual indication of the presence of insects, thereby enabling the detection of insects despite the existence of motion signals caused by non-insect motion.
    Type: Grant
    Filed: December 3, 2002
    Date of Patent: October 5, 2004
    Assignee: Trustees of Stevens Institute of Technology
    Inventors: Dimitri Donskoy, Nikolay Sedunov
  • Patent number: 6798212
    Abstract: A probe having a built-in reference plane for use with TDR testing includes a conductive sheet member such as a wire mesh which is attached to a ground input of a TDR system. The conductive sheet is located proximate the tip of the test probe and extends radially from an axis of the test probe thereby providing its own reference ground plane.
    Type: Grant
    Filed: May 23, 2002
    Date of Patent: September 28, 2004
    Assignee: Texas Instruments Incorporated
    Inventors: Roger Joseph Stierman, Charles Anthony Odegard, Rebecca Lynn Holdford
  • Patent number: 6791339
    Abstract: An apparatus for contactless measurement of carrier concentration and mobility includes a microwave source, a circular waveguide for transmitting microwave radiation to a sample, such as a semiconductor wafer or panel for flat panel displays, at a measurement location, a first detector for detecting the forward microwave power, a second detector for detecting the microwave power reflected from the sample, and a third detector for detecting the Hall effect power. A circular waveguide, carrying only the TE11 mode, is terminated by the sample behind which a short is located. Perpendicular to the plane of the sample (and along the axis of the circular waveguide), a magnetic field is applied. In this configuration, a given incident TE11 wave will cause two reflected waves. One is the ordinary reflected wave in the same polarization as the incident one. A detector is provided to measure this reflected radiation. The other reflected wave is caused by the Hall effect.
    Type: Grant
    Filed: May 1, 2002
    Date of Patent: September 14, 2004
    Assignee: Lehighton Electronics, Inc.
    Inventors: Jerome C. Licini, Nikolai Eberhardt
  • Patent number: 6788244
    Abstract: The invention is a device for inspecting an assembly including a surface coating containing magnetic radar-absorbing materials on a conductive surface. In detail, the device includes a first system for transmitting an electromagnetic signal to the assembly, which includes a first waveguide made of a conductive material coupled in series to a second waveguide made of a dielectric material. A second system is provided for receiving the portion of the electromagnetic signal reflected from the assembly, which includes a third waveguide made of a conductive material coupled in series to a fourth waveguide made of a dielectric material. Thus the electromagnetic signal is transmitted from the first waveguide to the second waveguide on to the assembly and the portion of the electromagnetic signal reflected off the assembly is received by the fourth-waveguide and transmitted to the third, waveguide.
    Type: Grant
    Filed: July 11, 2003
    Date of Patent: September 7, 2004
    Assignee: Northrop Grumman Corporation
    Inventor: Kent K. Tam
  • Patent number: 6788073
    Abstract: A data processing system having mismatched impedance components and method of use is disclosed. In one embodiment, the method includes exciting a printed circuit board circuit having mismatched impedance printed circuit board components. Measuring at least one impedance of the circuit with a time domain reflectometer. In response to the measured at least one impedance of the circuit, adjusting at least one printed circuit board circuit element.
    Type: Grant
    Filed: September 6, 2002
    Date of Patent: September 7, 2004
    Assignee: Dell Products L.P.
    Inventors: Douglas E. Wallace, Steven J. Lash, Stephanus D. Saputro
  • Patent number: 6784854
    Abstract: Apparatus and methodology utilizing nearfield microwave technology to detect contraband/forbidden substances concealed within metallic containers. Apparatus and methodologic microwave operating frequency determines the metallic thickness through which detection is possible, and also the expectable “depths” for detection within a metallic container. Special and important attention is paid to the appropriate positional and distance locating of the invention apparatus relative to a suspected “substance-containing” metallic container for detection to be most effective. Preferably, this distance is substantially equal to the closest distance from the central radiating plane of a lens/antenna (which is employed, according to a preferred practice of the invention) at which a conductive, metallic surface will regeneratively parasitize the lens/antenna.
    Type: Grant
    Filed: March 12, 2003
    Date of Patent: August 31, 2004
    Assignee: Spatial Dynamics, Ltd.
    Inventor: Tex Yukl
  • Patent number: 6782328
    Abstract: An apparatus for measuring concentration of a material in a process fluid includes an antenna configured to contact the process fluid and a pulse generator coupled to the antenna to generate a microwave transmit pulse through the antenna. A pulse receiver receives a reflected pulse from the antenna and the concentration of the material is calculated as a function of the reflected pulse.
    Type: Grant
    Filed: October 29, 2001
    Date of Patent: August 24, 2004
    Assignee: Rosemount Inc.
    Inventors: Eric R. Lovegren, Mark S. Schumacher, James A. Johnson, Kurt C. Diede
  • Publication number: 20040145376
    Abstract: A method according to one embodiment may include transmitting, via a network, to a node comprised in the network a relatively small portion of a signal propagated via a first buried transmission line. The network may be coupled to the transmission line and may be at least partially buried. The node may be capable of being coupled to a device that is capable of determining, based at least in part upon one or more characteristics of the relatively small portion of the signal received at the node, one or more characteristics of the signal propagated via the transmission line. The relatively small portion of the signal may have a magnitude that is relatively small compared to a magnitude of the signal. Of course, many modifications and variations are possible without departing from this embodiment.
    Type: Application
    Filed: January 24, 2003
    Publication date: July 29, 2004
    Inventor: Su Mi Sam
  • Publication number: 20040113633
    Abstract: Disclosed herein is a method of measuring a dielectric constant of a Printed Circuit Board (PCB) for a Rambus Inline Memory Module (RIMM), which includes the steps of measuring a length of a Rambus product of a PCB, applying an input waveform to the Rambus product at a certain probing position and obtaining a cross point of rising times of the input waveform and an output waveform generated by reflection of the input waveform, obtaining time corresponding to the cross point, and calculating a dielectric constant by substituting the measured length of the Rambus product and the obtained time for corresponding variables of a dielectric constant calculating equation.
    Type: Application
    Filed: May 28, 2003
    Publication date: June 17, 2004
    Inventors: Young-Woo Kim, Byoung-Ho Rhee, Dek-Gin Yang, Young-Sang Cho, Dong-Hwan Lee
  • Patent number: 6750657
    Abstract: A combination includes a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding the high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back. The feedthrough element includes at least one guiding element (6), into which the electric high-frequency signal is to be fed at an inlet point (10), and which transmits at an outlet point (17) the electric high-frequency signal to a probe (7) adapted to guide the high-frequency signal, a one-part or multipart mechanical carrier element (1), and a one-part or multipart insulation (11, 12) present between the carrier element (1) and the guiding element (6). In the combination the impedance of the feedthrough element and the impedance of the probe (7) following the outlet point (17) are substantially matched to each other at the outlet point (17).
    Type: Grant
    Filed: November 19, 2001
    Date of Patent: June 15, 2004
    Assignee: VEGA Grieshaber KG
    Inventors: Karl Griessbaum, Josef Fehrenbach, Jurgen Motzer
  • Publication number: 20040104733
    Abstract: A method and apparatus of measuring a predetermined parameter having a known relation to the transit time of movement of an energy wave through a medium, by transmitting from a first location in the medium a cyclically-repeating energy wave; receiving the cyclically-repeating energy wave at a second location in the medium; detecting a predetermined fiducial point in the cyclically-repeating energy wave received at the second location; continuously changing the frequency of transmission of the cyclically-repeating energy wave from the first location to the second location in accordance with the detected fiducial point of each received cyclically-repeating energy wave received at the second location such that the number of waves received at the second location from the first location is a whole integer; and utilizing the change in frequency to produce a measurement of the predetermined parameter.
    Type: Application
    Filed: July 10, 2003
    Publication date: June 3, 2004
    Inventor: Arie Ariav
  • Publication number: 20040100280
    Abstract: The invention provides a noncontact measuring system for electrical conductivity, which uses a microwave. In the measuring system for electrical conductivity, the microwave generated in a network analyzer (NA) 110 is guided to a surface of a silicon wafer (sample) 160 through a waveguide 130 and a sensor 140. The surface of the silicon wafer 160 is irradiated with the microwave, and the sensor 140 receives the reflected microwave. The electrical conductivity of the silicon wafer 160 is measured in such a manner that a computer (personal computer) 120 calculates the electrical conductivity from an amplitude ratio A and phase difference &thgr; to a reflected wave of the silicon wafer 160, which is determined with the network analyzer 110. The computer 120 performs not only the calculation of the measurement but also whole control of the measuring system such as positioning of the sample.
    Type: Application
    Filed: May 20, 2003
    Publication date: May 27, 2004
    Applicant: TOHOKU TECHNO ARCH CO., LTD.
    Inventors: Yang Ju, Masumi Saka, Hiroyuki Abe
  • Patent number: 6722261
    Abstract: A piston position in a cylinder of a hydraulic assembly is measured using microwave pulses. The microwave pulses are launched along a conductor coupled to the piston or cylinder. A sliding member is slidably coupled to the conductor and moves with the piston or cylinder. Position is determined as a function of a reflection from the end of the conductor and the sliding member. Various aspects include signal processing, fudicial pulse identification control and input/output circuitry, and a three conductor configuration.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: April 20, 2004
    Assignee: Rosemount Inc.
    Inventors: Gregory C. Brown, James A. Johnson, Eric R. Lovegren
  • Patent number: 6724197
    Abstract: A fill-level detector operating by the radar principle gauges the fill-level of the lower of two substances layered one atop the other in a container. The detector incorporates first and second essentially straight, parallel electrical conductors having a signal generator and a transducer mounted to the upper ends of the conductors with the lower ends of the conductors protruding into the lower substance. The generator delivers a signal to the first conductor which signal is conducted into the lower substance with a portion of that signal being reflected at the interface of the two substances which signal portion is captured by the transducer. The detector is able to determine to fill level of the lower substance even when the upper substance displays a high dielectric constant.
    Type: Grant
    Filed: August 5, 2002
    Date of Patent: April 20, 2004
    Assignee: Krohne S.A.
    Inventors: Joseph Neven, Achim Bletz
  • Patent number: 6722260
    Abstract: A piston position in a cylinder of a hydraulic assembly is measured using microwave pulses. The microwave pulses are launched along a conductor coupled to the piston or cylinder. A sliding member is slidably coupled to the conductor and moves with the piston or cylinder. Position is determined as a function of a reflection from the end of the conductor and the sliding member.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: April 20, 2004
    Assignee: Rosemount Inc.
    Inventor: Gregory C. Brown
  • Publication number: 20040020314
    Abstract: A synthetic wave is obtained which represents the synthesis of a transmitted wave radiated from a sensor and a reflected wave returned from a breathing human body, and the presence or absence of a human in the vehicle is detected from the envelope of the synthetic wave. When the presence of a human is detected continuously for a predetermined length of time, it is determined that a human is present in the vehicle.
    Type: Application
    Filed: April 23, 2003
    Publication date: February 5, 2004
    Inventors: Choichiro Tsuchihashi, Yasushi Shinojima
  • Patent number: 6674293
    Abstract: The present invention is an adaptable pre-matched tuner system and calibration method for measuring reflection factors above &Ggr;=0.85 for a DUT. The system includes a first and second large-band microwave tuners connected in series, the first and second large-band tuners being mechanically and electronically integrated; and a controller for controlling the two large-band tuners. The first tuner is adapted to act as a pre-matching tuner and the second tuner is adapted to investigate an area of a Smith Chart that is difficult to characterise with a single tuner, so that the combination of the first and second large-band tuners permits the measurement of reflection factors above &Ggr;=0.85. The pre-matched tuner system allows the generation of a very high reflection factor at any point of the reflection factor plane (Smith Chart).
    Type: Grant
    Filed: June 13, 2000
    Date of Patent: January 6, 2004
    Inventor: Christos Tsironis
  • Patent number: 6646451
    Abstract: A computer-based method and computer-readable medium containing computer-executable instructions for assimilating data collected by a time domain reflectometer and displaying more than two waves representing reflections of a pulse on conductors is provided. The method includes a means for wave reversal, wave shifting, multi-wave display, segmented velocity of propagation adjustment, multi-cursor option multi-flagging options and calculating of the total length of wet cable. The combination of these functions provides a highly accurate means for identifying the location of splices, faults, corrosion, cable damage and other anomalies that are typically found on any length of conductor cable. The ability of this method to display a greater number of waves simultaneously adds additional benefit to a technician attempting to locate particular anomalies with multi-conductor cables.
    Type: Grant
    Filed: December 6, 2000
    Date of Patent: November 11, 2003
    Assignee: Utilx Corporation
    Inventor: Keith W. Lanan
  • Patent number: 6633170
    Abstract: A new method and apparatus for detecting and measuring the level of metal present on the surface of a substrate is achieved. Energy, in the form of rf or light or microwave energy, is directed at the surface of a wafer, the reflected energy or the energy that passes through the semiconductor substrate is captured and analyzed for energy level and/or frequency content. Based on this analysis conclusions can be drawn regarding presence and type of metal on the surface of the wafer. Furthermore, by inclusion of metal within the resonating circuit of an rf generator changes the frequency of the vibration and therefore detects the presence of metal.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: October 14, 2003
    Assignee: Chartered Semiconductor Manufacturing Ltd.
    Inventors: Sik On Kong, Tsui Ping Chu
  • Patent number: 6632534
    Abstract: A probe adapted for use with a time domain reflectrometry device in primarily measuring the moisture content in soils and other mediums. This probe can however be used in may differing measurement applications involving materials of specific dielectric constants as well as apparent dielectric constants that are derived from a matrix of several differing dielectrics. In the probe according to the present invention, the inner core of the probe is composed of an inner conductive element, a conductor that is used to transmit a broadband pulse. A dielectric liquid, solid or gel surrounds this inner conductive core, and assists in retaining broadband signal strength. The dielectric material is then encased in a metallic outer shell that serves as a protective housing for the probe. This outer shell is electronically transparent to the electromagnetic pulse transmitted by the active inner conductive core and surrounding dielectric.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: October 14, 2003
    Assignee: Soilmoisture Equipment Corp.
    Inventors: Whitney Skaling, Laszlo Rudolics
  • Patent number: 6630833
    Abstract: Systems, methods, and probe devices for electronic monitoring and characterization using absorbent media confined by a metallic mesh. The mesh allows a stream of liquid or gas to pass through the structure, so that the media will adsorb the material to which it is specific. This changes the permittivity of the media in which the electromagnetic field is propagating. This change in permittivity can be seen through the use of classical microwave methods such as phase shift, amplitude changes, frequency changes in a cavity or the frequency of an unbuffered oscillator. Some embodiments use a two cylinder structure, where an outer cylinder contains a material which selectively removes a chemical which may be in conflict with or would contaminate the sensing of the desired chemical. This outer cylinder does not play a part in the measurement because it is outside the metal shield which contains the measurement adsorbent, and is thus outside the electromagnetic field.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: October 7, 2003
    Assignee: Phase Dynamics, Inc.
    Inventor: Bentley N. Scott
  • Publication number: 20030169053
    Abstract: The present invention provides an electromagnetic prober comprising a transmission antenna, a reception antenna, a reception signal processing section for generating an analytic signal on the basis of a detection signal of the reception antenna, and an analytic processing section for performing a predefined analytic process on the basis of the analytic signal, wherein the analytic processing section includes in-medium dielectric constant calculation means which divides the analytic signal into a plurality of time-based ranges and performs a predefined computation on average cycle periods in the respective time-based ranges of the analytic signal to calculate average dielectric constants in depth ranges of the medium corresponding to the respective time-based ranges. Thus, even an unskilled person can easily measure a dielectric constant at each depth level in the medium to determine a depth at which an object to be surveyed is present.
    Type: Application
    Filed: March 13, 2003
    Publication date: September 11, 2003
    Inventor: Masahiro Fujiwara
  • Patent number: 6608489
    Abstract: A system is provided for detecting accumulation of material concurrently on multiple areas of a surface in real time. In one embodiment, it is used for detecting icing of airframes while in use or on the ground while awaiting use. It may use either Time Domain Reflectometry (TDR) or Frequency Modulated Continuous Wave (FM-CW) sources to provide a known energizing signal to a transmission line sensor. The system ascertains the signal's round trip travel time in the transmission line. As material accumulates around the transmission line sensor, the medium through which the signal propagates is indicated by the change in time for the signal to propagate in relation to propagation in a reference medium, e.g., air. By employing pre-specified spectral analysis algorithms and referencing to the dielectric constant of media of interest, a determination of the occurrence, location, and the rate and type of material accumulation can be made.
    Type: Grant
    Filed: December 17, 2001
    Date of Patent: August 19, 2003
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Norbert E. Yankielun, Charles C. Ryerson
  • Publication number: 20030146840
    Abstract: A device and method for detecting the presence of insects in a structure utilize a plurality of transceivers, each of which generates separate and distinct microwave signals and receives separate and distinct signals reflected from a structure being tested. The reflected signals received by each of the transceivers are processed, for instance by a microprocessor, so as to provide output signals that indicate the presence or absence of insects in the structure. If most or all of the transceivers receive positive signals indicative of the possible presence of insects in the structure, which is a false indication of the presence of insects, the microprocessor distinguishes this false indication from an actual indication of the presence of insects, thereby enabling the detection of insects despite the existence of motion signals caused by non-insect motion.
    Type: Application
    Filed: December 3, 2002
    Publication date: August 7, 2003
    Inventors: Dimitri Donskoy, Nikolay Sedunov
  • Patent number: 6590399
    Abstract: A method for taking measurements using a vector network analyzer (VNA) enables a reduction in interference created when the VNA is operated in the presence of external signals. For the method, three measurements are taken, one at a desired measurement frequency, another at a frequency slightly less than the desired measurement frequency, and another at a slightly greater frequency than the desired measurement frequency. An interfering signal may occur at or near the frequency of one of the three measurements. To eliminate measurement error from the interfering signal, the measurement signal with the median, or middle, magnitude is selected to provide the measurement results.
    Type: Grant
    Filed: April 27, 2000
    Date of Patent: July 8, 2003
    Assignee: Anritsu Company
    Inventors: Eric Branden Karl, Yuenie Lau
  • Patent number: 6588313
    Abstract: A piston position in a cylinder of a hydraulic assembly is measured using microwave pulses. The microwave pulses are launched along a conductor coupled to the piston or cylinder. A sliding member is slidably coupled to the conductor and moves with the piston or cylinder. Position is determined as a function of a reflection from the end of the conductor and the sliding member.
    Type: Grant
    Filed: November 19, 2001
    Date of Patent: July 8, 2003
    Assignee: Rosemont Inc.
    Inventors: Gregory C. Brown, Brian E. Richter
  • Patent number: 6559657
    Abstract: A method and apparatus for processing a time domain reflectometry (TDR) signal having a plurality of reflection pulses to generate a valid output result corresponding to a process variable for a material in a vessel. The method includes the steps of determining a reference signal along a probe in the vessel, establishing a first fiducial reference point, a reference end of probe location, a measuring length and a maximum probe length. The method also includes the steps of periodically detecting a TDR signal along the probe, establishing a second fiducial reference point, a detected end of probe location, an end of probe peak to peak amplitude, and attempting to determine a process variable reflection on the TDR signal. The method indicates a broken cable condition, a loss of high frequency connection, a low amplitude reflection condition, an empty vessel condition.
    Type: Grant
    Filed: January 12, 1999
    Date of Patent: May 6, 2003
    Assignee: Endress+Hauser GmbH+Co.
    Inventors: William Patrick McCarthy, Kenneth L. Perdue, Donald D. Cummings, Gerd Wartmann
  • Patent number: 6538454
    Abstract: A microwave microscope having a resonant slit formed in a highly conductive end of a microwave waveguide forming a probe tip. A short dielectric rod is fit into the waveguide near its conductive end. A longer dielectric rod is placed in back of the short dielectric rod with a small gap between the two rods. The length of the shorter rod and the size of the gap are chosen to form a dielectric resonator at the microwave frequency adjacent to the probe tip. Thereby, the impedance of the waveguide can be matched to the generally high impedance of the slit probe tip. Preferably, the dielectric constant of the materials is high, thereby reducing the size of the waveguide and probe tip relative to the microwave wavelength.
    Type: Grant
    Filed: September 8, 2000
    Date of Patent: March 25, 2003
    Assignee: Yissum Research Development Company of the Hebrew University Jerusalem
    Inventors: Avraham Frenkel, Dan Davidov, Michael Golosovsky
  • Patent number: 6525545
    Abstract: A frequency domain measurement device multi-phase modulates an RF frequency signal with a broadband signal, such as a pseudo random number, to produce an RF spread spectrum signal that encompasses a frequency range of interest. The RF spread spectrum signal is transmitted to a device under test, and a corresponding reflected signal from the device under test is correlated with the RF spread spectrum signal to produce information from which location of and distance to a fault in the device under test may be determined. A FIR filter is used as part of the correlation process to determine magnitude and phase versus frequency over the frequency range of interest for the device under test as well as location of and distance to the fault.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: February 25, 2003
    Assignee: Tektronix, Inc.
    Inventor: Thomas C. Hill
  • Patent number: 6515465
    Abstract: A method for measuring harmonic load-pull including supplying a fundamental frequency signal to a frequency multiplication device under test and obtaining a target even-order multiplied frequency signal. The fundamental load impedance and an even-harmonic load impedance are independently controlled with a load mechanical tuner having an open-ended stub that is one-quarter wavelength long at the fundamental frequency and satisfies a short-circuit condition with respect to the fundamental signal. A fundamental source impedance and an even-harmonic source impedance of an input signal applied to the device under test are independently controlled with a source mechanical tuner having a short-circuit stub that is one-quarter wavelength long at the fundamental frequency and satisfies a short-circuit condition with respect to even-harmonics.
    Type: Grant
    Filed: March 22, 2001
    Date of Patent: February 4, 2003
    Assignee: Communications Research Laboratory, Independant Administration Institution
    Inventors: Masahiro Kiyokawa, Toshiaki Matsui
  • Patent number: 6512377
    Abstract: The present invention relates to a via parasitics testing and extracting method for Gigabit multi-layered PCB boards. The method of the present invention is a unique test and extraction process that utilizes a TDR measurement and processes the output data therefrom externally. The testing aspect involves obtaining a TDR module waveform and obtaining a text file with output data, whereas the extraction aspect involves analysis of the data in the text file. This method can be used directly to ascertain a Gigabit via structure without the limitations that are imposed by the conventional methods discussed above, and has been theoretically proven to be highly accurate and much faster than any of the existing methods. The method of the present invention has the potential to be included as a built-in testing feature in high-speed TDR meters, and may also be used in order to design an optimized via.
    Type: Grant
    Filed: June 29, 2001
    Date of Patent: January 28, 2003
    Assignee: Nortel Networks Limited
    Inventors: Shuhui Deng, Stephen S Brazeau, Xiao-Ding Cai
  • Publication number: 20030016028
    Abstract: A method and apparatus for electrically testing a pipe-in-pipe pipeline during the construction, installation, commissioning, operation, or dismantling phases of an electrically heated pipe-in-pipe subsea pipeline. One embodiment is directed to a high voltage qualification test of the electrical integrity of a segment of a pipe-in-pipe pipeline. Another embodiment is directed to a method and an apparatus for performing a high voltage pulse test of the electrical integrity of a pipe-in-pipe pipeline. Yet another embodiment of the present invention is directed to a method and an apparatus for performing a low voltage pulse test of the electrical integrity of a pipe-in-pipe pipeline, which may be performed during the operation phase of an electrically heated pipe-in-pipe pipeline.
    Type: Application
    Filed: July 20, 2001
    Publication date: January 23, 2003
    Inventor: Ronald M. Bass
  • Patent number: 6499346
    Abstract: This level measuring instrument which operates with microwaves, has a radiation characteristic with a pronounced forward lobe and can be used to transmit and/or receive microwaves with a large frequency bandwidth. A housing section is designed as a waveguide short-circuited at one side and one end by a rear wall, and is virtually completely filled with an insert made of a dielectric. An exciter element, projects into the housing section and is connected to a microwave source. An antenna adjoins the housing section, for transmitting and/or receiving microwaves. A gap is arranged in the insert between the exciter element and the antenna. The gap forms a filter which is essentially non-transparent to higher modes of the waveguide.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: December 31, 2002
    Assignee: Endress + Hauser GmbH + Co.
    Inventors: Andreas Wien, Klaus-Peter Oberle, Alexander Hardell, Stefan Burger
  • Publication number: 20020186025
    Abstract: A fill-level detector operating by the radar principle gauges the fill-level of the lower of two substances layered one atop the other in a container. The detector incorporates first and second essentially straight, parallel electrical conductors having a signal generator and a transducer mounted to the upper ends of the conductors with the lower ends of the conductors protruding into the lower substance. The generator delivers a signal to the first conductor which signal is conducted into the lower substance with a portion of that signal being reflected at the interface of the two substances which signal portion is captured by the transducer. The detector is able to determine to fill level of the lower substance even when the upper substance displays a high dielectric constant.
    Type: Application
    Filed: August 5, 2002
    Publication date: December 12, 2002
    Inventors: Joseph Neven, Achim Bletz
  • Patent number: 6477474
    Abstract: Disclosed is a method of using a low power radar level transmitter to calculate a dielectric constant of a product in a tank. Low Power Time Domain Reflectometry Radar (LPTDRR) circuitry is controlled to calculate a time delay between transmission of microwave energy down a termination extending into the product in the tank and reflection of the microwave energy. In some embodiments, the dielectric constant of the product is calculated as a function of the time delay. In other embodiments, the dielectric constant is calculated by controlling the LPTDRR circuitry to calculate amplitudes of transmit and receive pulses. The dielectric of the product is calculated as a function of the amplitudes of the transmit and receive pulses.
    Type: Grant
    Filed: January 21, 1999
    Date of Patent: November 5, 2002
    Assignee: Rosemount Inc.
    Inventor: Kurt C. Diede
  • Publication number: 20020158639
    Abstract: There are provided a laminate with an inside layer circuit for use as a multilayer printed circuit board, a method for measuring a circuit impedance of the laminate, and a measuring device that enables a nondestructive impedance measurement accurately. The laminate with the inside layer circuit has a dielectric substrate, a first conductive layer disposed on an upper surface of the dielectric substrate to form a high frequency circuit, a second conductive layer disposed on a lower surface of the dielectric substrate, and a third conductive layer disposed over a first dielectric layer on the upper surface of the dielectric substrate. A test conductor is formed independently of the inside layer circuit within the first conductive layer.
    Type: Application
    Filed: December 26, 2001
    Publication date: October 31, 2002
    Inventors: Toru Nakashiba, Yukio Matsushita, Tatsumi Iwaishi, Masanobu Takedomi, Mitsuhide Nagaso, Motoyuki Akamatsu, Tokio Yoshimitsu, Kanji Kurata
  • Patent number: 6472883
    Abstract: Pulse propagation analysis to ascertain whether and anomaly such as surface corrosion exists on a section of conductive member such as pipe. Anomalies such as surface corrosion result in localized velocity changes of pulses propagating along a conductive member. These localized velocity changes exhibit themselves in changes in waveform, rise and fall time, amplitude, and time delay of a pulse with respect to a fixed time reference. To allow such anomalies to be located, two pulses are generated such that they intersect at intersecting locations along the conductive member. The resulting modified pulses are analyzed for perturbations indicative of localized velocity changes.
    Type: Grant
    Filed: June 6, 2000
    Date of Patent: October 29, 2002
    Assignee: Profile Technologies, Inc.
    Inventor: Gale D. Burnett
  • Patent number: 6459279
    Abstract: A hand held diagnostic test device enables determination of the integrity of low observable (L.O.) properties in structures or surfaces of a structure, and includes a housing containing a first component for coupling energy signals into the structure or a surface of the structure, a second component for detecting the response energy signals, a third component for determining whether the response energy signals indicate flaws in the surface of the structure, and a fourth component for signaling an operator of the diagnostic test device of the results. The energy signal is an RF signal, and a microprocessor in the test device enables determination of the integrity of the structure of surface by comparing the returned signals against a stored acceptable signal. Acceptability or non-acceptability is signaled to the operator of the diagnostic test device by indicator lamps located on the sensor housing and/or a digital display.
    Type: Grant
    Filed: June 13, 2001
    Date of Patent: October 1, 2002
    Assignee: Lockheed Martin Corporation
    Inventor: Tom Moyes
  • Patent number: 6452400
    Abstract: A probe (6) is brought into contact with a plasma produced by ionizing Ar gas, a saturation current (Ies2) at which current flowing through the probe is saturated when the potential of the probe is changed in a potential region where the potential of the probe is higher than a ground potential, and a saturation current (Iis2) at which current flowing through the probe is saturated when the potential of the probe is changed in a potential region where the potential of the probe is lower than the ground potential. Similarly, saturation currents (Ies2, Iis2) are measured by bringing the probe (6) into contact with a plasma produced by ionizing a mixed gas containing Ar gas and a process gas, such as C4F8 gas, and changing the potential of the probe (6). The negative ion density of the plasma produced by ionizing C4F8 gas is determined by using saturation current ratios (Iis1/Iis2, Ies1/Ies2).
    Type: Grant
    Filed: June 19, 2000
    Date of Patent: September 17, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Yoshinobu Kawai, Yoko Ueda, Nobuo Ishii, Satoru Kawakami
  • Publication number: 20020121907
    Abstract: The invention relates to a combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back. The feedthrough element comprises at least one guiding element (6), into which the electric high-frequency signal is to be fed at an inlet point (10), and which transmits at an outlet point (17) the electric high-frequency signal to a probe (7) meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element (1), and a one-part or multipart insulation (11, 12) present between the carrier element (1) and the guiding element (6). The mentioned combination is characterized in that the impedance of the feedthrough element and the impedance of the probe (7) following the outlet point (17) are substantially matched to each other at the outlet point (17).
    Type: Application
    Filed: November 19, 2001
    Publication date: September 5, 2002
    Inventors: Karl Griessbaum, Josef Fehrenbach, Jurgen Motzer