Where Energy Is Reflected (e.g., Reflectometry) Patents (Class 324/642)
  • Patent number: 7375602
    Abstract: Systems and methods are described for transmitting a waveform having a controllable attenuation and propagation velocity. An exemplary method comprises: generating an exponential waveform, the exponential waveform (a) being characterized by the equation Vin=De?ASD[x?vSDt], where D is a magnitude, Vin is a voltage, t is time, ASD is an attenuation coefficient, and vSD is a propagation velocity; and (b) being truncated at a maximum value. An exemplary apparatus comprises: an exponential waveform generator; an input recorder coupled to an output of the exponential waveform generator; a transmission line under test coupled to the output of the exponential waveform generator; an output recorder coupled to the transmission line under test; an additional transmission line coupled to the transmission line under test; and a termination impedance coupled to the additional transmission line and to a ground.
    Type: Grant
    Filed: December 10, 2004
    Date of Patent: May 20, 2008
    Assignee: Board of Regents, The University of Texas System
    Inventors: Robert H. Flake, John F. Biskup, Su-liang Liao
  • Patent number: 7369598
    Abstract: A waveform-adaptive ultra-wideband (UWB) transmitter and noise-tracking UWB receiver for use in communications, object detection and radar applications. In one embodiment, the output of an oscillator is gated by a low-level impulse generator either directly or through an optional filter. In a special case of that embodiment wherein the oscillator is zero frequency and outputs a DC bias, a low-level impulse generator impulse-excites a bandpass filter to produce an UWB signal having an adjustable center frequency and desired bandwidth based on a characteristic of the filter. In another embodiment, the low-level impulse signal is approximated by a time-gated continuous-wave oscillator to produce an extremely wide bandwidth pulse with deterministic center frequency and bandwidth characteristics. The low-level impulse signal can be generated digitally. The UWB signal may be modulated to carry data, or may be used in object detection or ranging applications.
    Type: Grant
    Filed: October 13, 2005
    Date of Patent: May 6, 2008
    Assignee: Multispectral Solutions, Inc.
    Inventors: Robert J. Fontana, J. Frederick Larrick, Jr.
  • Publication number: 20080061798
    Abstract: The present invention provides microcoaxial probes fabricated from semiconductor heterostructures that include strained semiconductor bilayers. The microcoaxial probes are well suited for use as scanning probes in scanning probe microscopy, including scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning microwave microscopy, or a combination thereof.
    Type: Application
    Filed: September 11, 2006
    Publication date: March 13, 2008
    Inventor: Robert H. Blick
  • Patent number: 7342531
    Abstract: A method and system for determining a product level in a tank which determine a first level measure using emission of electromagnetic waves into the tank, detect a differential pressure, determine an observed density based on the detected differential pressure and the first level measure, and determine a second level measure based on the observed density and a currently measured differential pressure. The present invention is based on the realization that a level measurement based on differential pressure and an observed density can provide a valuable redundant level measurement, which can provide increased reliability and enable detection of errors.
    Type: Grant
    Filed: February 21, 2006
    Date of Patent: March 11, 2008
    Assignee: Rosemount Tank Radar AB
    Inventors: Lennart Hagg, Lars Ove Larsson, Mikael Kleman, Per Holmberg
  • Patent number: 7307428
    Abstract: A single ended line testing method for qualifying an electrically conducting line, including the steps of sending a plurality of randomized excitation signals from a first end of the line towards a second end of the line, subsequently taking measurements, at the first end of the line, of each reflection of the plurality of randomized excitation signals, and then inversely randomizing the measurements. Line qualification is determined based on an average of the inversely randomized measurements.
    Type: Grant
    Filed: September 25, 2006
    Date of Patent: December 11, 2007
    Assignee: Alcatel
    Inventor: Paul Henri Marie Cautereels
  • Patent number: 7292047
    Abstract: A high-frequency power source supplies high-frequency power to a load whose reflection characteristic for the power varies with time. The power source includes a frequency-variable power generator, a power detector for detecting the power into the load and the power from the load, a reflection coefficient calculator for calculating a reflection coefficient based on the detection of the power into and from the load, a frequency detector causing the power generator to generate high-frequency powers at various frequencies within a predetermined frequency range for obtaining the frequency that gives a minimum value to the calculated reflection coefficient, and a power supply controller for causing the power generator to generate a high-frequency power of the frequency obtained by the frequency detector and for supplying the high-frequency power to the load.
    Type: Grant
    Filed: March 28, 2006
    Date of Patent: November 6, 2007
    Assignee: Daihen Corporation
    Inventors: Ryohei Tanaka, Hiroshi Matoba
  • Patent number: 7280012
    Abstract: The present invention discloses a class of RF corrugated probes to be used in load-pull slide-screw tuner consisting of a radio-frequency (RF) or microwave slotted airline (slabline) comprising at least one RF corrugated probe controlled horizontally and vertically by remote electric control, allowing the creation of impedances which are distributed over and cover the entire Smith chart, from perfect transparency to high reflection factors. The class of RF corrugated probes disclosed in this invention includes a single RF tuning element composed of at least two RF probes fixed together with a separate probe holder.
    Type: Grant
    Filed: January 24, 2006
    Date of Patent: October 9, 2007
    Inventor: Philippe Boulerne
  • Patent number: 7271575
    Abstract: A system, apparatus and method for performing differential return loss measurements and other measurements as a function of frequency uses a digital storage oscilloscope (DSO) having spectral analysis functions. A waveform generator generates a differential test signal in the form of a series of pulses where each pulse includes spectral components associated with each of a plurality of frequencies of interest. A test fixture presents the differential test waveform to a load including at least one of a device under test (DUT), a short circuit, an open circuit and a balanced load. A signal acquisition device differentially measures the test waveform during each of the load conditions. The signal acquisition device computes an error correction parameter using measurements made during the short circuit, open circuit and balanced load conditions. The correction parameter tends to offset signal acquisition errors within measurements made during the DUT load condition.
    Type: Grant
    Filed: August 7, 2003
    Date of Patent: September 18, 2007
    Assignee: Tektronix, Inc.
    Inventors: John J. Pickerd, Laudie J. Doubrava
  • Patent number: 7248866
    Abstract: An automatic, frequency selective microwave tuner, used for load pull transistor testing, is capable of generating independently controllable reflection factors, both in amplitude and phase, at several, harmonic or not, frequencies simultaneously. The tuner employs horizontally and vertically adjustable high Q resonant probes and replaces, when used in harmonic load pull set-ups, otherwise required combinations of wide-band tuners with harmonic rejection tuners or wide-band tuners and frequency discriminators (diplexers or triplexers).
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: July 24, 2007
    Inventor: Christos Tsironis
  • Patent number: 7221169
    Abstract: Embodiments cause interaction of an ultra-wide band signal with a substance over a broad range of frequencies simultaneously to obtain a response signal whose distortion is indicative of a composition of the substance.
    Type: Grant
    Filed: October 18, 2005
    Date of Patent: May 22, 2007
    Assignee: Rhino Analytics, L.P.
    Inventors: Buford Randall Jean, Frederick Lynn Whitehead, John Lee Daniewicz
  • Patent number: 7221168
    Abstract: Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying, drawing or any other technique. Barcode information is encoded using different lengths, angles, or positions of dielectric bars. A microwave readable dielectric barcode system includes a barcode fabricated from a dielectric material, a transmitter with an antenna, and a sensor that senses the effect produced by the dielectric barcode on the microwave signal. The dielectric barcode system can use multiple microwave signals that differ in one or more respects, such as polarization or frequency.
    Type: Grant
    Filed: June 8, 2006
    Date of Patent: May 22, 2007
    Assignee: Somark Innovations, Inc.
    Inventors: Alexander M. Grishin, Ramos M. Mays
  • Patent number: 7208959
    Abstract: Methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance and inductance of one or more I/O leads of an integrated circuit package, the measured parasitic capacitances and inductances providing an indication of the susceptibility of the integrated circuit package to mutual coupling between electrical leads of the package or between an electrical lead and other components of the integrated circuit package.
    Type: Grant
    Filed: November 7, 2005
    Date of Patent: April 24, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Mark T. Van Horn, Richard N. Hedden, David R. Cuthbert, Aaron M. Schoenfeld
  • Patent number: 7205774
    Abstract: Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying, drawing or any other technique. Barcode information is encoded using different lengths, angles, or positions of dielectric bars. A microwave readable dielectric barcode system includes a barcode fabricated from a dielectric material, a transmitter with an antenna, and a sensor that senses the effect produced by the dielectric barcode on the microwave signal. The dielectric barcode system can use multiple microwave signals that differ in one or more respects, such as polarization or frequency.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: April 17, 2007
    Assignee: Somark Innovations, Inc
    Inventors: Alexander M. Grishin, Ramos M. Mays
  • Patent number: 7190177
    Abstract: An apparatus for inspecting a sample for defects includes a signal generator for generating a signal and a device for splitting the signal into two separate signals which have substantially equal phase and magnitude. A sensor radiates the two signals on the sample and receives the two signals reflected from the sample. A device is provided for determining a difference between the two signals reflected from the sample without unwanted influence of variations of distance between the sensor and sample, and reflections from nearby sample edges and boundaries. A defect is determined to exist when a difference is found between the two reflected signals.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: March 13, 2007
    Assignee: The Curators of the University of Missouri
    Inventors: Reza Zoughi, Sergiy Kharkivskiy, Mohammad Tayeb Ahmad Ghasr
  • Patent number: 7187183
    Abstract: A method and an apparatus is described to measure at least one physical parameter of a substance such as moisture and salt content. This is done by transmitting a microwave beam through the material to be measured and detect only a reflection of a predetermined polarity of the transmitted waves. To accomplish this a polarizing plate is used so that only cross-polarized microwaves, which pass through the substance are detected and the co-polar reflections from surrounding structures are excluded. The object can either be moving as on a conveyer belt or in a rest position.
    Type: Grant
    Filed: May 31, 2002
    Date of Patent: March 6, 2007
    Assignee: Intelscan Orbylgjutaekni enf.
    Inventors: Olafur H. Jonsson, Jon Thor Thorgeirsson, Alan John Sangster
  • Patent number: 7180304
    Abstract: Presented is a system and method for reading a microwave readable barcode formed from a pattern of dielectric material. The dielectric pattern creates a strong microwave contrast with the surrounding media selectively resonating with or scattering an interrogating microwave signal. Dielectric bars can be fabricated by inkjet printing, injection, spraying, drawing or any other technique. Barcode information is encoded using different lengths, angles, or positions of dielectric bars. A microwave readable dielectric barcode system includes a barcode fabricated from a dielectric material, a transmitter with an antenna, and a sensor that senses the effect produced by the dielectric barcode on the microwave signal. The dielectric barcode system can use multiple microwave signals that differ in one or more respects, such as polarization or frequency.
    Type: Grant
    Filed: June 8, 2006
    Date of Patent: February 20, 2007
    Assignee: Somark Innovations, Inc.
    Inventors: Alexander M. Grishin, Ramos M. Mays
  • Patent number: 7161358
    Abstract: An impedance analyzer includes a reference signal, a first converter a first coupler, a second converter, a second coupler, a modification circuit, a reference signal detector, and a reflected signal detector. The first coupler couples the reference signal to the first converter. The first converter produces a reference intermediate frequency signal. The second coupler couples a reflected signal to the second converter. The second converter produces a reflected intermediate frequency signal. A reflection coefficient for a device under test is determined by using a reflected value detected by the reflected signal detector and a reference value detected by the reference signal detector. In a first operating mode of the impedance analyzer, the reflected intermediate frequency signal is forwarded directly to the reflected signal detector.
    Type: Grant
    Filed: March 13, 2006
    Date of Patent: January 9, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Hassan Tanbakuchi, Loren Cole Betts, David Blackham
  • Patent number: 7145349
    Abstract: The invention relates to methods and a circuit for increasing the interference resistance of a time frame reflectometer, in particular with respect to high frequency irradiation. A transmitted pulse (XS) is generated at a pulse repeater frequency (fprf) and coupled to a wave guide (4). A return signal (Xprobe) is returned to the wavwguide (4) by a reflector (14) which is connected to said waveguide (4) and is scanned for time-expanded representation as a reflection profile with scan pulses (XA) which are repeated at a scan frequency (fA) and measurement values are continuously calculated from said reflection profiles, expressing the distance from the reflector (14) to the process connection.
    Type: Grant
    Filed: October 15, 2000
    Date of Patent: December 5, 2006
    Assignee: Endress + Hauser GmbH + Co. KG
    Inventors: Stefan Cramer, Markus Hertel, Bernd Krieger
  • Patent number: 7141986
    Abstract: A system for detecting connector compatibility with a time domain reflectometry (TDR) circuit on a peripheral device. A cable connects the peripheral device and a second peripheral device. A first connector is for mating to a second connector on the second peripheral device. The time domain reflectometry can be used to detect electrical compatibility of the first and second connectors. The first connector can be an RJ11 connector. The second connector can be an RJ45 connector. The first connector can be a plug, and the second connector can be a socket. The number of pins of the first and second connectors can be different. The first connector can be a telco connector, and the second connector can be an Ethernet connector. The TDR circuit can be part of the peripheral device diagnostics.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: November 28, 2006
    Assignee: Broadcom Corporation
    Inventors: James M. Muth, Peiqing Wang, Manolito M. Catalasan
  • Patent number: 7135941
    Abstract: An automatic, electromechanical microwave tuner, used for load pull transistor testing, employs three horizontally and vertically adjustable RF probes; the tuner creates very low mechanical vibrations, because it is capable of generating all microwave reflection factors required for complete load pull and noise measurement operations, using only vertical probe movement; it also provides high tuning dynamic range, large frequency bandwidth and continuous choice of tuning target areas.
    Type: Grant
    Filed: May 24, 2004
    Date of Patent: November 14, 2006
    Inventor: Christos Tsironis
  • Patent number: 7119546
    Abstract: The present invention relates to a single ended line testing method for qualifying an electrically conducting line. This method includes the steps of sending a plurality of excitation signals from a first end of the line towards a second end of the line and before the sending of this plurality of excitation signals, randomizing each excitation signal of the plurality of excitation signals. Subsequently, measurements are performed, at the first end of the line, of each reflection of the plurality of excitation signals sent towards the second end of the line. Then an inverse randomization on each of the measurements of reflections is performed which is succeeded by determining an average of all the measurements of reflections of the excitation signals. Finally, from the average a qualification of the electrically conducting line is determined.
    Type: Grant
    Filed: July 2, 2004
    Date of Patent: October 10, 2006
    Assignee: Alcatel
    Inventor: Paul Henri Marie Cautereels
  • Patent number: 7112971
    Abstract: In a method and apparatus for determining the moisture content of a material with a measuring line extending through the material and having a proximal end connected to a signal generator for supplying a pulse signal to the measuring line, which pulse signal is reflected and returned back to the proximal end of the measuring line to which a comparator is connected for measuring the travel time of the signal supplied, and the reflected signal returned, to the proximal end of the measuring line and its amplitude is with compared with an amplitude corresponding to a threshold, an adjustable threshold value generator and controller are provided generating a threshold value signal which depends on the amplitude of the reflected signal.
    Type: Grant
    Filed: September 16, 2004
    Date of Patent: September 26, 2006
    Assignee: Imko Intelligente Micromodule Köhler GmbH
    Inventors: Kurt Köhler, Robin Fundinger
  • Patent number: 7102457
    Abstract: A mechanically balanced automatic microwave tuner is used in on-wafer device testing. Using low loss rigid airlines to connect the tuner and the devices improves the tuning range at the DUT reference plane but causes mechanical movements of the wafer probes, when the tuner mobile carriage moves horizontally. Balancing the tuner by means of exactly positioned and dimensioned mobile counterweights, driven by the same mechanism as the tuner carriage itself, allows for compensation of the probe movement and safe on wafer operation.
    Type: Grant
    Filed: April 6, 2004
    Date of Patent: September 5, 2006
    Inventor: Christos Tsironis
  • Patent number: 7098671
    Abstract: A microwave measurement system is utilized for the determination of displacement of a piston in a fluid filled cylindrical structure. The piston plus cylindrical encasement of the hydraulic system is modeled as a uniform cylindrical waveguide terminated in a metal plate. A novel shaped probe antenna to measure the slope of the relative phase of the reflected equivalent voltage wave with respect to frequency. The idea to measure the slope of the relative phase is novel and requires a new antenna structure. Instead of using the phase slope with respect to frequency, the total phase shift in a given frequency range is used to determine the location of the piston in the cylindrical chamber. Simulation and measurement will be used to determine the impedance of the antenna as well as the electromagnetic field at different locations inside the cylinder. In addition, the antenna will be analyzed to optimize its design, which ought to result in minimizing the reflections.
    Type: Grant
    Filed: March 5, 2004
    Date of Patent: August 29, 2006
    Inventors: Fred Bassali, John Cosenza
  • Patent number: 7098646
    Abstract: A radio frequency power generation and power measurement system includes power sensors to measure both the radio frequency (RF) power transmitted by radio equipment under test, and the RF power received by the radio equipment under test. Power sensors are mounted in a separate assembly remote from the main power measurement and generation. The RF power sensors and other components in the remote assembly are interconnected to allow measurement of both received and transmitted RF power at the RF connector or connectors of the radio equipment under test. The main assembly and the remote assembly are connected by a flexible link.
    Type: Grant
    Filed: February 18, 2003
    Date of Patent: August 29, 2006
    Assignee: Racal Instruments Wireless Solutions Limited
    Inventor: Ian Michael Rose
  • Patent number: 7075315
    Abstract: A non-destructive inspection apparatus includes a transmitting section, a reception section and a processing unit. The transmission section irradiates an electromagnetic wave signal toward an inspection target. The reception section receives a reflected electromagnetic wave signal from the inspection target to generate a received wave signal. The processing unit generates a fundamental reflected wave signal predicted to be received from each reflection point of the inspection target, and determines the existence or nonexistence of any defects in the inspection target and the details of the defect, if it exists, based on a pattern matching between a waveform of the received wave signal and a waveform of a linear combination of fundamental reflected wave signals.
    Type: Grant
    Filed: November 8, 2002
    Date of Patent: July 11, 2006
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventor: Shogo Tanaka
  • Patent number: 7076213
    Abstract: An apparatus and method for testing a voltage standing wave ratio (VSWR) in a wideband code division multiple access (W-CDMA) mobile communication system. Upon detecting a VSWR test request, a controller determines an oscillation frequency information and a power level information of a test signal for a VSWR test, and generates a test signal generation request including the determined oscillation frequency information and power level information. Upon detecting the test signal generation request, a test signal generator generates a test signal corresponding to the oscillation frequency information and power level information, and provides the generated test signal to an antenna. A VSWR detector receives the test signal and a reflected signal of the test signal from the antenna, and calculates a VSWR using the received test signal and reflected signal.
    Type: Grant
    Filed: March 26, 2003
    Date of Patent: July 11, 2006
    Assignee: Samsung Electronics Co., Ltd.
    Inventor: Jin-Su Lee
  • Patent number: 7075480
    Abstract: Described is a radar filling level measuring device for non-contact measurement of a filling level of a filling matter in a vessel. A radar filling level measuring device including an electronics unit for generating transmission signals and for evaluating receiving signals reflected for a filling matter, an antenna unit connected to the electronics unit and adapted to radiate the transmission signals generated by the electronics unit in the direction of the filling matter and to receive the receiving signals reflected from the filling matter surface and to pass them on to the electronics unit, and a housing forming a cavity which is at least tight with respect to the atmosphere within the vessel and in which the electronics unit and antenna unit are acommodated. By this structure both the antenna unit and the electronics unit are protected in a technically simple and cheap way against aggressive ambient conditions and against chemical and mechanically abrasive aggression.
    Type: Grant
    Filed: April 9, 2003
    Date of Patent: July 11, 2006
    Assignee: Vega Grieshaber KG
    Inventors: Josef Fehrenbach, Juergen Motzer, Daniel Schultheiss, Karl Griessbaum
  • Patent number: 7061251
    Abstract: A multi-port junction is used in combination with an Inverse Fourier Transform to detect distance to fault in an RF transmission line or waveguide without the use of heterodyne down-conversion circuits. To provide an ultra-wide bandwidth frequency domain reflectometer the output ports of the multi-port junction are used to calculate distance to fault and return loss. The Inverse Fourier Transform algorithm is modified to take into account both phase shift per unit length of the transmission line and attenuation per unit of length in the transmission line, with the output of the modified Inverse Fourier Transform being applied to a module that subtracts out the effect of previous faults by solving for the distances ahead of time before knowing amplitudes and for solving for amplitude at each prior fault starting with the first fault. The output of this module is then used thresholded to remove the effects of noise, secondary reflections and inconsequential peaks.
    Type: Grant
    Filed: April 20, 2005
    Date of Patent: June 13, 2006
    Assignee: Bae Systems Information and Electronic Systems Integration Inc.
    Inventors: Matthew A. Taylor, Kevin S. Bassett, Paul E. Gili
  • Patent number: 7042233
    Abstract: The present invention discloses a harmonic rejection tuner system consisting of a radio-frequency (RF) or microwave transmission line having a longitudinal axis, containing at least one harmonic resonator sliding on the central conductor, said harmonic resonator is a pair of shorted-stubs, said shorts are adjustable, making the electromagnetic length of the shunt shorted-stubs variable, therefore making the resonant frequency of the harmonic resonator variable. The harmonic resonator will reflect a harmonic frequency nF0 of a base frequency F0. The harmonic rejection tuner of this invention has an input and output, and is connected in series between the DUT and the large band fundamental tuner.
    Type: Grant
    Filed: April 27, 2005
    Date of Patent: May 9, 2006
    Inventor: Philippe Boulerne
  • Patent number: 7034629
    Abstract: Automatic microwave pre-matching tuners with new zero positioning capability allowing for a minimum idle airline section between pre-matching and tuning section, thus minimizing insertion loss and enhancing high reflection tuning capability at high frequencies and tuner calibration algorithm of the pre-matching section over one half of a wavelength and of the tuning section over one full wavelength at each operation frequency and associated tuning and measurement operation algorithms.
    Type: Grant
    Filed: December 31, 2002
    Date of Patent: April 25, 2006
    Inventor: Christos Tsironis
  • Patent number: 7034545
    Abstract: A monitoring system for an transmission line, such as a multi-channel television broadcasting antenna feed line, gathers data about the physical and electrical condition of the line in real time. The system can detect and localize deterioration and other time-dependent faults in the transmission line by the tendency of faults to produce reflections back to the transmitter that were not part of the original characterization of a particular installation. Some kinds of faults, identified early enough, can be corrected without replacing components, and especially without shutting down the transmission line during prime viewing hours. Other faults can be detected in time to order replacement parts before the underlying problem becomes severe, and to allow servicing during periods of low demand.
    Type: Grant
    Filed: December 30, 2003
    Date of Patent: April 25, 2006
    Assignee: SPX Corporation
    Inventors: Jeffrey M. Brown, John L. Schadler, William A. DeCormier, Andre J. Skalina
  • Patent number: 7019510
    Abstract: A handheld Vector Network Analyzer (VNA) is provided with circuitry capable of providing operation over a very wide bandwidth. The VNA includes two reflectometers, a first high frequency reflectometer (150) such as the model S331 Site Master™ and a second lower frequency reflectometer (50) such as the model S820 Site Master™, both the S331 and S820 being manufactured by Anritsu Company of Morgan Hill Calif. The high frequency reflectometer (150) includes a forward coupler (109) having a coupling path connected to a high frequency impulse signal source (102), and a through path connecting the test port (3) and incident and reflected signal measurement couplers (110,112) to a load (107). To connect the high and low frequency reflectometers (150,50), a diplexer (170) is connected between the load (107) and an output of the low frequency reflectometer (50).
    Type: Grant
    Filed: December 14, 2004
    Date of Patent: March 28, 2006
    Assignee: Anritsu Company
    Inventor: Donald Anthony Bradley
  • Patent number: 7012437
    Abstract: The invention relates to a TDR fill level measuring device. A surface waveguide, along which the measuring signals are guided, is composed of a plurality of segments, which are arranged to telescope into, and out of, one another.
    Type: Grant
    Filed: November 30, 2002
    Date of Patent: March 14, 2006
    Assignee: Endress & Hauser GmbH & Co. KG
    Inventor: Peter Klöfer
  • Patent number: 7009408
    Abstract: A fill level measuring device working with microwaves, having an antenna for transmitting, or for transmitting and receiving, microwaves. The antenna has a metallic outer conductor and a ceramic inner conductor. The inner conductor is secured in a pressure-tight and gas-sealed manner in the outer conductor. A coating of a fluorothermoplastic is provided on the inner conductor or in the outer conductor. The inner conductor is secured in the outer conductor by means of a warm-pressed fit, and the inner conductor and the outer conductor have conical surfaces of equal shape in the region of the pressed fit.
    Type: Grant
    Filed: November 30, 2002
    Date of Patent: March 7, 2006
    Assignee: Endress + Hauser GmbH + Co. KG
    Inventor: Winfried Maier
  • Patent number: 7009463
    Abstract: The present invention discloses a harmonic reflective tuner system consisting of a radio-frequency (RF) or microwave transmission line having a longitudinal axis, containing two harmonic resonators sliding on the central conductor, where the harmonic resonators are comprising a pair of identical RF slugs, mechanically attached together. The two harmonic resonators will reflect two harmonic frequencies of a base frequency F0. The harmonic reflective tuner of this invention has an input and output, said input being connected to the DUT trough a diplexer in parallel with the fundamental tuner.
    Type: Grant
    Filed: August 2, 2004
    Date of Patent: March 7, 2006
    Assignee: Boulerne Philippe
    Inventor: Philippe Boulerne
  • Patent number: 6998834
    Abstract: A method for reducing drift in a step stimulus from a sampling system, such as an oscilloscope, is described having an initial step of setting a calibration repetition rate. A step stimulus stabilization calibration is performed to acquire a reference mid-crossing time and the current mid-crossing time. Acquisition cycles of TDR/TDT waveform samples are acquired equal to the repetition rate with the initial strobe delay interval in the sampling system being adjusted by the difference between the reference mid-crossing time and the current mid-crossing time. The step stimulus stabilization calibration is performed again to acquire a new current mid-crossing time and initial strobe delay interval and more acquisition cycles of TDR waveform samples are acquired equal to the repetition rate. The process continues until a stop command is activated for the sampling system.
    Type: Grant
    Filed: May 24, 2004
    Date of Patent: February 14, 2006
    Assignee: Tektronix, Inc.
    Inventors: Maria Agoston, Kenneth J. Lester
  • Patent number: 6995569
    Abstract: A device for electromagnetic characterization of a tested structure elevates, on a predetermined frequency band, distribution parameters of the structure and parameters characteristic of the spurious rays of the structure. The device includes an electric signal generator and an analyzer for analyzing the signal transmitted by the generator and signals reflected by the structure and signals transmitted by the structure. In addition, the electric signal generator is a pulsed signal generator whereof the spectrum is at least as broad as the predetermined frequency band, and the analyzer includes a filter for temporal filtering of the signals it receives, to eliminate spurious signals.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: February 7, 2006
    Assignee: Centre National de la Recherche Scientifique (C.N.R.S.)
    Inventors: Bernard Jean Yves Jecko, Edson Antoine André Martinod, Michèle Marie Lalande-Guionie, Alain Jean Louis Reineix
  • Patent number: 6993438
    Abstract: An apparatus includes a device under test, a network analyzer, an internal amplifier, a first switch, a second switch, a third switch, a first air-line directional coupler, and a first attenuator. A method of characterization measurement includes providing a harmonics signal from the device under test to a spectrum analyzer, providing a generated signal and a reflected signal to a first receiver disposed within a network analyzer, and recording a parameter deviation of the network analyzer.
    Type: Grant
    Filed: March 24, 2005
    Date of Patent: January 31, 2006
    Assignee: Agilent Technologies, Inc .
    Inventors: Robert E. Jacobsen, Murthy S. Upmaka
  • Patent number: 6992538
    Abstract: The present invention discloses an interferometric load-pull tuner system consisting of a radio-frequency (RF) or microwave transmission line containing a pair of identical RF slugs sliding on the central conductor, said slugs surrounding partially the central conductor, being extractable from the transmission line, and the corresponding exact three-terms cascade procedure based on the scattering transfer parameters (T-Parameters) multiplication in order to calculate the scattering parameters (S-Parameters) of the interferometric load-pull tuner for any positions of the two slugs in the transmission line. The interferometric load-pull tuner of this invention provides improved measurement accuracy, enhanced reliability, and allows lower cost of manufacture and maintenance.
    Type: Grant
    Filed: July 20, 2004
    Date of Patent: January 31, 2006
    Inventor: Philippe Boulerne
  • Patent number: 6980064
    Abstract: The present invention discloses a load-pull slide-screw tuner consisting of a radio-frequency (RF) or microwave slotted airline (slabline) containing a single corrugated RF slug, said corrugated RF slug being controlled horizontally and vertically by remote electric control, allowing the creation of impedances which are distributed over and cover the entire Smith chart, from perfect transparency to high reflection factors. The corrugation structure of the RF slug of this invention provides the slide-screw tuner, with a single RF slug, the same electromagnetic performances than double slugs slide-screw tuner, i.e. same frequency bandwidth of use and equivalent high gamma performances, at a much lower cost of manufacturing.
    Type: Grant
    Filed: July 20, 2004
    Date of Patent: December 27, 2005
    Inventor: Philippe Boulerne
  • Patent number: 6956383
    Abstract: A method and apparatus are provided for implementing automated electronic package transmission line characteristic impedance verification. A sinusoidal voltage source is coupled to a transmission line test structure for generating a selected frequency. Impedance measuring circuitry is coupled to the transmission line test structure for measuring an input impedance with an open-circuit termination and a short-circuit termination. Characteristic impedance calculation circuitry is coupled to the impedance measuring circuitry receiving the input impedance measured values for the open-circuit termination and the short-circuit termination for calculating characteristic impedance. Logic circuitry is coupled to the characteristic impedance calculation circuitry for comparing the calculated characteristic impedance with threshold values for verifying acceptable electronic package transmission line characteristic impedance.
    Type: Grant
    Filed: November 13, 2003
    Date of Patent: October 18, 2005
    Assignee: International Business Machines Corporation
    Inventors: Gerald Keith Bartley, Paul Eric Dahlen, Philip Raymond Germann, Andrew B. Maki, Mark Owen Maxson
  • Patent number: 6940295
    Abstract: Apparatus and methods for materials inspection using microwave sensing are disclosed. In one aspect, a system for detecting corrosion of a workpiece includes a scanning assembly having a support assembly adapted to be coupled to the workpiece, and a first translation device coupled to the support assembly. A microwave sensor is coupled to the first translation device. The first translation device is adapted to translate the microwave sensor along at least a first direction, and the microwave sensor is adapted to transmit incident microwave signals onto the workpiece and to receive reflected microwave signals reflected from the workpiece. In an alternate aspect, a system may further include a second translation device that is adapted to translate the microwave sensor along at least a second direction that is transverse to the first direction.
    Type: Grant
    Filed: June 11, 2003
    Date of Patent: September 6, 2005
    Assignee: The Boeing Company
    Inventors: Roger W. Engelbart, David F. Fortner, Nancy L. Wood
  • Patent number: 6937030
    Abstract: Method is provided for testing electrically heated subsea pipelines that are “electrical-ready,” that is, equipped for applying electrical power when it is needed for heating the pipeline at any time during the life of the pipeline. Time domain reflectometer apparatus in a water-tight enclosure can be deployed subsea. Electrical connections are made with the pipeline using wet-mateable connectors. Reflected signals from the segment of the pipeline being tested are transmitted to an interface at the surface, where the time domain reflectometer is controlled to send a selected pulse. Reflected signals may be interpreted by observing pulse form and time of receipt or by comparison of pulse forms received at different times during the life of a pipeline. Apparatus for electrically connecting a time domain reflectometer to an electrical-ready pipeline is provided.
    Type: Grant
    Filed: November 8, 2002
    Date of Patent: August 30, 2005
    Assignee: Shell Oil Company
    Inventors: David J. Liney, David M. March
  • Patent number: 6919845
    Abstract: In an apparatus for measuring a specific absorption rate (SAR) for use in a radio apparatus, a first near magnetic field of a radio wave radiated from a reference radio apparatus is measured in free space, and an SAR of the radio wave radiated from the reference radio apparatus by using a predetermined phantom according to a predetermined measurement method. A transformation factor ? is calculated by dividing the measured SAR by a square value of the measured first near magnetic field, and a second near magnetic field of a radio wave radiated from a radio apparatus to be measured is measured in free space. Then an SAR of the radio wave radiated from the radio apparatus to be measured is estimated and calculated by multiplying a square value of the measured second near magnetic field by the calculated transformation factor ?.
    Type: Grant
    Filed: April 22, 2003
    Date of Patent: July 19, 2005
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Akihiro Ozaki, Koichi Ogawa, Yoshio Koyanagi, Yutaka Saito, Shoichi Kajiwara, Yoshitaka Asayama, Atsushi Yamamoto
  • Patent number: 6895343
    Abstract: An apparatus includes a device under test, a network analyzer, an internal amplifier, a first switch, a second switch, a third switch, a first air-line directional coupler, and a first attenuator. A method of characterization measurement includes providing a harmonics signal from the device under test to a spectrum analyzer, providing a generated signal and a reflected signal to a first receiver disposed within a network analyzer, and recording a parameter deviation of the network analyzer.
    Type: Grant
    Filed: July 12, 2002
    Date of Patent: May 17, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Robert E. Jacobsen, Murthy S. Upmaka
  • Patent number: 6891381
    Abstract: A body scanning measurement, typing and profiling apparatus and method utilizing microwave energy. Microwaves are used to measure the size and shape of an individual. An array of miniaturized transmitting antennas direct RF energy to a similarly sized array of receiving antennas. Microwaves are directed toward an object, such as a human being, to be measured and the unabsorbed energy of the microwaves transmitted is measured and converted to a signal representative of the size and shape of the object being measured. A computer processor generates vital body measurements and stores such measurements for future use.
    Type: Grant
    Filed: December 29, 2000
    Date of Patent: May 10, 2005
    Assignee: Secure Logistix
    Inventors: Kenneth S Bailey, Fernando A Barrera
  • Patent number: 6885191
    Abstract: An imaging system for medical and other applications in which the internal structures of an overall object must be seen without invading or damaging the object. The system works by transmitting electromagnetic waves of single or a multiplicity of frequencies through the object (for example the human body) and measuring the absorption and scattering of these waves by the various structures and inhomogeneities of the object, using scanning sub-wavelength resolution detectors.
    Type: Grant
    Filed: February 12, 2002
    Date of Patent: April 26, 2005
    Inventor: Stuart M. Gleman
  • Patent number: 6882161
    Abstract: Disclosed herein is a method of measuring a dielectric constant of a Printed Circuit Board (PCB) for a Rambus Inline Memory Module (RIMM), which includes the steps of measuring a length of a Rambus product of a PCB, applying an input waveform to the Rambus product at a certain probing position and obtaining a cross point of rising times of the input waveform and an output waveform generated by reflection of the input waveform, obtaining time corresponding to the cross point, and calculating a dielectric constant by substituting the measured length of the Rambus product and the obtained time for corresponding variables of a dielectric constant calculating equation.
    Type: Grant
    Filed: May 28, 2003
    Date of Patent: April 19, 2005
    Assignee: Samsung Electro-Mechanics Co., Ltd.
    Inventors: Young-Woo Kim, Byoung-Ho Rhee, Dek-Gin Yang, Young-Sang Cho, Dong-Hwan Lee
  • Patent number: 6879167
    Abstract: The invention provides a noncontact measuring system for electrical conductivity, which uses a microwave. In the measuring system for electrical conductivity, the microwave generated in a network analyzer (NA) 110 is guided to a surface of a silicon wafer (sample) 160 through a waveguide 130 and a sensor 140. The surface of the silicon wafer 160 is irradiated with the microwave, and the sensor 140 receives the reflected microwave. The electrical conductivity of the silicon wafer 160 is measured in such a manner that a computer (personal computer) 120 calculates the electrical conductivity from an amplitude ratio A and phase difference ? to a reflected wave of the silicon wafer 160, which is determined with the network analyzer 110. The computer 120 performs not only the calculation of the measurement but also whole control of the measuring system such as positioning of the sample.
    Type: Grant
    Filed: May 20, 2003
    Date of Patent: April 12, 2005
    Assignee: Tohoku Techno Arch Co., Ltd.
    Inventors: Yang Ju, Masumi Saka, Hiroyuki Abe