Abstract: An alignment mechanism is disclosed which includes a mount, a beam having a first end affixed to the mount and a second end. The beam is an order of magnitude more rigid along its longitudinal axis than along an axis orthogonal to its longitudinal axis. The second end of the beam is affixed to a first device having a surface configured to contact a second device. The beam applies a normal force component to the second device through the first device and allows movement at the second end in directions orthogonal to the normal force component.

Abstract: A device for measuring electronic components having a plurality of conductors applied to a dielectric cable carrier, which conductors are each connected both to a contact finger and to a connection contact, such that a switch is integrated in at least one of the conductors, via which the conductor can be additionally connected to a ground connection.

Abstract: The present invention relates to a bar for the electrical contacting of an electrically conductive substrate in the form of a thin, electrically conducting and resilient contact. The bar comprises a current-collecting bar on which a plurality of contact fingers is fitted. The invention is distinguished by the contact fingers being configured resiliently in the direction of the contact to be produced.

Abstract: A virtual load board includes a connection port, a conversion circuit, and an indication unit, wherein the connection port comprises at least one terminal. The terminal receives an output voltage from the liquid crystal display control board. The conversion circuit converts the output voltage into an operating voltage for the indication unit and supplies the operating voltage to the indication unit. A test system and a test method for liquid crystal display control board are also provided. With the above-discussed arrangement, the virtual load board replaces a liquid crystal display panel to carry out a reliability test of the liquid crystal display control board, and has the advantages of small volume and low cost and can be accommodated, together with the liquid crystal display control board, in reliability test equipment in order to carry out a reliability test of the liquid crystal display control board in a specific environment.

Abstract: A spring-loaded contact may include a barrel to form a housing for the spring-loaded contact, a plunger at least partially enclosed by the barrel, a spring enclosed by the barrel, and a sphere between the plunger and the spring. A back of the plunger may be formed at an angle and to include a retention guide, the retention guide partly over the sphere such that the sphere may be in contact with the back of the plunger and the retention guide.

Abstract: A tester includes a main body and a removable probe. The main body includes a main body probe and a front panel including selectable options for selecting a tester function. The removable probe may be coupled to the main body via a cord. The removable probe is fixable to the main body via a latch assembly. The latch assembly includes a socket disposed on one of the removable probe or the main body and a mating protrusion disposed at the other of the removable probe or the main body.

Abstract: A method and structures implement an enhanced handheld transfer impedance probe including a rigid probe housing body that carries a pair of coaxial RF connectors providing connections to a network analyzer. A base member includes a respective pair of independent electrical contacts and a common interconnect electrical contact. Each of the respective electrical contacts includes a respective associated electrically conductive compressible pad. Each respective compressible pad extends between rigid stops having a set height to limit gasket compression and enable repeatable gasket compressions for repeatable measurements with the handheld transfer impedance probe. An interconnection structure includes respective interconnects connecting between the coaxial RF connectors and respective electrical contacts.

Abstract: A probe module includes a substrate having a through hole, and at least four probe-needle rows arranged on the substrate. The probe-needle rows are arranged from a first side to a second side along a first direction. Each of the probe-needle rows has at least two needles arranged along a second direction. Each of the needles has a contact segment and an arm segment having an included angle with the contact segment. An end of the arm segment is connected to the substrate, and the other end of which extends toward the through hole to connect the contact segment. The lengths of the contact segments of the needles of each of the probe-needle rows are the same. The included angles of the needles of the probe-needle rows along the first direction are gradually increased from the first side to the second side.

Abstract: Provided is a surface-mount type electric connecting terminal which is disposed between opposing conductive objects and is configured to electrically connecting the objects while easily adjusting pressing force and recovery force. The electric connecting terminal includes a cylindrical fixed member which is made from a metallic material; a cylindrical movable member which is slidably inserted in the fixed member and is made from a metallic material; and an electrical conductive spring which is accommodated in the fixed member and whose one end contacts with the bottom of the fixed member and the other end contacts with the bottom of the movable member for thereby allowing the movable member to elastically slide against the fixed member.

Abstract: A test contactor is provided. The test socket includes a printed circuit board (PCB) that transfers electrical signals through a plurality of PCB traces. The plurality of PCB traces couples a signal source to a signal destination. The test contactor also has a first test contact that couples to a first signal pathway from the plurality of PCB traces, whereby the first test contact may be utilized for transferring the electrical signals. The test contactor also has a second test contact that is coupled to a second signal pathway from the plurality of PCB traces, whereby the second test contact may be utilized to provide a ground voltage. The first test contact and the second test contact are of different lengths. A method of testing an integrated circuit is also provided.

Abstract: A plug connector set-up for a control unit includes: a pin support having a pin; and a guide element having a lead-through for positioning the pin at a circuit board of the control unit. The lead-through has an entrance opening on the side facing the pin support and an outlet opening on the side facing away from the pin support. A diameter of the entrance opening is greater than a diameter of the outlet opening. The pin includes a centering region having a diameter which is less than the diameter of the entrance opening and greater than the diameter of the outlet opening.

Abstract: Provided is a surface-mount type electric connecting terminal which is disposed between opposing conductive objects and is configured to electrically connecting the objects while easily adjusting pressing force and recovery force. The electric connecting terminal includes a cylindrical fixed member which is made from a metallic material; a cylindrical movable member which is slidably inserted in the fixed member and is made from a metallic material; and an electrical conductive spring which is accommodated in the fixed member and whose one end contacts with the bottom of the fixed member and the other end contacts with the bottom of the movable member for thereby allowing the movable member to elastically slide against the fixed member.

Abstract: A probe unit includes: contact probes; and a probe holder, each of the contact probe including a plunger and a spring coil, each of the plunger including: a contact portion contacting an electrode of a contacted body; a flange portion extending from a base end of the contact portion and having a diameter larger than a diameter of the contact portion; a boss portion extending from an end of the flange portion different from an end continuing to the contact portion and having a diameter smaller than the diameter of the flange portion; and a base end portion extending from an end of the boss portion different from an end continuing to the flange portion and having a substantially same diameter with the boss portion.

Abstract: A test apparatus includes a DUT block, at least one probe and at least one variable-length pusher. The DUT block is used for allowing the DUT to be disposed thereon. The probe is located on the DUT block. The variable-length pusher is located above the probe. The actuator is used for moving the variable-length pusher to push against the DUT to force the DUT to be in electrical contact with the probe.

Abstract: Systems and methods for high-speed compression of dynamic electrical signal waveforms to extend the measuring capabilities of conventional measuring devices such as oscilloscopes and high-speed data acquisition systems are discussed. Transfer function components and algorithmic transfer functions can be used to accurately measure signals that are within the frequency bandwidth but beyond the voltage range and voltage resolution capabilities of the measuring device.

Abstract: In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.

Abstract: A probe holding structure includes a substrate and a plurality of holding modules. The substrate has an opening and a plurality of grooves arranged around a periphery of the opening. The holding modules are connected with the grooves, respectively. Each holding modules includes a fixing member and a plurality of probes. The fixing member is connected with a corresponding groove. The probes are connected with the fixing member and pass through the corresponding groove. The probe holding structure is combined with a lens adjusting mechanism having a lens to form an optical inspection device for testing electric characteristics of chips.

Abstract: A single ended to a differential signal converter. The single ended signal is passed through a high pass filter to block DC components. A positive and a negative version of the filtered signal are used collectively as the differential output of the converter. To allow accurate measurements on the input signal without waiting for the output of the high pass filter to settle, the differential outputs are offset by a dynamically generated signal representative of the midpoint of the filtered signal. That offset is generated by capturing a value representing the midpoint when a signal is first applied. This captured value is allowed to change with a time constant matching a time constant of the high pass filter. The converter may be used to connect a test instrument to a unit under test that generates test signals in a format that the test instrument is not specifically configured to measure.

Abstract: An oscilloscope current probe system includes a probe amplifier unit, a probe head identifier, and first and second probe heads interchangeably connectable to the probe amplifier unit. Each probe head has a respective electrically-readable type identifier, a respective current input to receive a current to be measured, a respective internal sensing resistor in connected series with the current input, and a respective output at which a measurement voltage across the sensing resistor is output. The first and second probe heads differ in the resistance of their sensing resistors and the way their type identifiers read. The probe amplifier unit includes a differential amplifier to amplify the measurement voltage output by the probe head connected thereto. The probe head identifier is to read the type identifier of the probe head connected to the probe amplifier unit.

Abstract: A high voltage detection device comprises a probe comprising an electrode for contacting a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing an electrical circuit for measuring line voltage. The electrical circuit comprises an input circuit for connection to the probe. The input circuit is adapted to suppress high frequency noise pick up by the probe and develop a bipolar voltage representing measured line voltage. A voltage detection circuit comprises a differential amplifier circuit for converting the bipolar voltage to a proportionate voltage signal. A signal processing circuit receives the proportionate voltage signal and drives the display for displaying the measured line voltage.

Abstract: An adjustable measurement device includes a case, a positive contact portion, a negative contact portion, a test probe, a first wire, and a second wire. The positive contact portion is positioned on an end of the case and electrically connected to the first wire. The negative contact portion is movably received in the case and electrically connected to the second wire. A receiving hole is defined in the negative contact portion for the test probe. The test probe includes a main body electrically connected to the negative contact portion, a tip portion electrically connected to the positive contact portion, and an insulating portion positioned between the main body and the tip portion. A distance between the positive contact portion and the negative contact portion is adjustable by moving the negative contact portion. The negative contact portion and the positive contact portion are isolated from each other.

Abstract: A high frequency test prod for electrically contacting at least one contact point of a specimen, using an HF coaxial line to connect the test prod housing and the contact unit electrically and mechanically between the housing and the contact unit, the HF coaxial line having an external conductor, an internal conductor arranged coaxially to the external conductor, and a gas or vacuum dielectric arranged between the external conductor and internal conductor, the external conductor designed as a hollow profile section from a rigid, elastically deformable material, wherein the internal conductor is arranged coaxially to the hollow profile section.

Abstract: The invention relates to a hand tool system having an electrical circuit testing indicator for use in a hand held tool used by technicians to determine electric circuit conditions. In a preferred embodiment, the indicator makes use of an electric circuit condition indicating means within a hand tool device having a plurality of bits and tool ends that, in use, will indicate information to determine the circuit condition (live circuit or not). Optionally, light, vibration, and audible indications may be provided to indicate the same information to a user.

Abstract: A microwave field-detecting needle assembly includes a needle assembly. The needle assembly includes a distal portion, a proximal portion, and a junction member disposed between the distal portion and the proximal portion. The junction member includes a recess defined therein. The needle assembly also includes a rectifier element disposed in the recess. The rectifier element includes a first terminal electrically coupled to the distal portion and a second terminal electrically coupled to the proximal portion.

Abstract: A probe uses a small diameter insulated needle to accurately penetrate the jacket and thin outer semiconductor sheath of URD cable so as to capacitive couple to the high voltage center conductor and determine its energized status (live or dead) and phase attribute. A precision needle depth gauge, mechanical hard stop, and digital display ensures that the needle does not penetrate the thick center conductor insulation material and provides an indication of the center conductor voltage. The probe can be combined with either internal or external phase identification circuitry to determine the phase attribute of the URD cable.

Abstract: A method is provided for manufacturing a remote video inspection device. The method includes: applying an insulating coating to an exterior surface of a conduit; forming an imager housing on one end of the conduit using an overmolding process, the imager housing having a cavity configured to receive a circuit board assembly having an imaging device disposed thereon; feeding wires through the conduit and electrically coupling the wires to the circuit board assembly; inserting the circuit board assembly into the cavity of the imager housing; affixing a cap over the cavity of the imager housing; sliding an insulating finger guard over an opposing end of the conduit; affixing the finger guard along the conduit at a location proximate to the opposing end of the cable, such that the finger guard extends radially outward from the cable; and attaching a connector to the opposing end of the conduit. In this way, the remote inspection device has been designed to meet certain electrical safety standards.

Abstract: A tester includes a main body and a removable probe. The main body includes a main body probe and a front panel including selectable options for selecting a tester function. The removable probe may be coupled to the main body via a cord. The removable probe is fixable to the main body via a latch assembly. The latch assembly including a socket disposed on one of the removable probe or the main body and a mating protrusion disposed at the other of the removable probe or the main body, the main body having a probe support ridge associated therewith and the removable probe having an alignment ridge associated therewith, the alignment ridge and the probe support ridge lying in a same plane when the mating protrusion is inserted into the socket.

Abstract: Various exemplary embodiments provide probes, systems and methods for measuring an effective electrical resistance/resistivity with high sensitivity. In one embodiment, the measuring system can include an upper probe set and a similar lower probe set having a sample device sandwiched there-between. The device-under-test (DUT) samples can be sandwiched between two conductors of the sample device. Each probe set can have an inner voltage sense probe coaxially configured inside an electrically-isolated outer current source probe that has a large contact area with the sample device. The measuring system can also include a computer readable medium for storing circuit simulations including such as FEM simulations for extracting a bulk through-plane electrical resistivity and an interface resistivity for an effective electrical z-resistivity of the DUT, in some cases, having sub-micro-ohm resistance.

Abstract: A non-contact voltage detection panel mount assembly is provided. The assembly includes a base to mount to an electrical enclosure, the base including of four voltage portals, a test point and a test voltage generator circuit used to test a pen. The pen is operatively connected to the base and includes an electrical charge storage device, a charge indicator operatively connected to the electrical charge storage device to indicate a presence of a charge within the electrical charge storage device, and a voltage present indicator to indicate presence of a voltage. The pen has a first position for lock-out-tag-out to monitor and test for voltage in any one of the four voltage portals and a second position to determine presence of voltage in the test point.

Abstract: A voltage clamp circuit for reflecting a voltage at an input node includes a circuit for providing at least two currents at its output terminal, and at least two diodes each being connected to an output terminal of the circuit for providing at least two currents. The diodes also are connected to a line of a ground voltage and to the input node respectively. The circuit includes an alternative current path connected to an output terminal of the circuit for providing at least two currents and to a current sinking node. The voltage at the input node thus is reflected as the voltage between two output nodes when the voltage at the input node is lower than a clamping voltage and so that the voltage is fixed between the two output nodes to the clamping voltage when the voltage at the input node is higher than the clamping voltage.

Abstract: The present invention is a finger voltage sensor that includes a base finger ring worn by a user that works near an electrical source, an electricity sensor disposed on the base finger ring, the electricity sensor detects one or more electrical fields associated with the electrical source and a warning light disposed on the base finger ring, the warning light emits a constant light when the electricity sensor is activated and is in communication with the electricity sensor. The finger voltage sensor can also include a beeper instead of a warning light and a base finger ring that includes a hook and loop fastener that is releasably attached to a user's finger.

Abstract: A combined probe head being disposed in a space transformer of a vertical probe card is provided, in which the combined probe head is used for differentiating or segmenting a layout area of the probes in the vertical probe card. The combined probe head may include a locating plate and sub-probe heads. The locating plate may include fixed portions. Each sub-probe head may include corresponding sub-dies and probes inserted between the sub-dies, and each sub-probe head is assembled and fixed in the corresponding fixed portion. Therefore, the layout area of the probes in the vertical probe card can be respectively differentiated or segmented from the sub-probe heads in order to avoid mutual interference under repair process. In addition, a related method for assembling and aligning the above mentioned combined probe head is provided.

Abstract: A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end.

Abstract: The present invention is an efficient high voltage sensing mechanism that operates only when an individual needs to test the voltage across a wire. The present invention attaches around a tested wire using a jaw and a hook. The hook is tensioned using an expansion spring. The operator propels the hook outwards from the jaw, around the tested wire; thereafter, the expansion spring retracts to latch onto the tested wire against the jaw. An on-off switch is integrated into the mechanical hook device. As the hook is propelled outwards, the on-off switch moves into the “on” position, which powers the electrical processing and voltage analysis equipment. Once the hook is returned to the initial position, the on-off switch moves to the “off” position. This arrangement allows the present invention to remain unpowered for any instance a wire is not being tested. The present invention detects voltage through capacitive coupling.

Abstract: A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.

Abstract: A high voltage detection device comprises a probe comprising an electrode for sensing a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing a control for measuring parameters of line voltage. The control comprises an input module for connection to the probe to develop a voltage signal. A signal processing module receives the voltage signal and determines parameters of line voltage and drives an audio module. The audio module provides an audio output representing the determined parameters of line voltage.

Abstract: An external signal sensor uses a single sensing circuit to detect a DC voltage or an AC voltage or a contact closure. The circuit can sense different isolated signals with relatively low power consumption. According to various embodiments, an isolation transformer has a primary winding that is fed by an oscillator signal. A secondary winding of the isolation transformer is open when no contact closure or AC or DC voltage is present, but is closed when a contact closure is present or when an AC or DC voltage is present. When the secondary winding is open, a status signal at an output of the sensing circuit has a logical high value. When the secondary winding is closed, the status signal has a logical low value. In this way, the same sensing circuit can be used to detect either a contact closure or an AC or DC voltage.

Abstract: An arrangement within a plasma reactor for detecting a plasma unconfinement event is provided. The arrangement includes a sensor, which is a capacitive-based sensor implemented within the plasma reactor. The sensor is implemented outside of a plasma confinement region and is configured to produce a transient current when the sensor is exposed to plasma associated with the plasma unconfinement event. The sensor has at least one electrically insulative layer oriented toward the plasma associated with the plasma unconfined event. The arrangement also includes a detection circuit, which is electrically connected to the sensor for converting the transient current into a transient voltage signal and for processing the transient voltage signal to ascertain whether the plasma unconfinement event exists.

Abstract: This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.

Abstract: A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential.

Abstract: An AC voltage detection circuit includes a conversion module, a comparison module, and a prompt module. The conversion module connects to an AC power source and converts the AC voltage provided by the AC power source to an AC current, and then converts the AC current to a direct current (DC) voltage reflecting the AC voltage. The comparison module is connected to the conversion module, and compares the DC voltage with a first predetermined voltage and a second lesser predetermined voltage, and produces a control signal when the DC voltage is greater than the first predetermined voltage or less than the second predetermined voltage. The prompt module produces a prompt signal when receiving the control signal.

Abstract: A high voltage phasing voltmeter comprises first and second probes. Each probe comprises an insulated handheld shield supporting an electrode for contacting a high voltage electrical conductor. The electrode is connected in series with a resistor and a capacitor. A meter comprises a housing enclosing an electrical circuit for measuring phasing voltage. The electrical circuit comprises an input circuit for connection to the first and second probes and an amplifier connected between the input circuit and a display. The amplifier measures voltage across the electrodes to provide an indication on the display.

Abstract: A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

Abstract: A non-contact, hand-held voltage detector is used to determine if AC voltage is present in a tamper-resistant receptacle. The voltage detector includes a pair of pins to open both shutters of the tamper-resistant receptacle.

Abstract: A silicon chicklet pedestal for use in a wafer-level test probe of a wafer is provided and includes a main body, first and second opposing faces, and an array of vias formed through the main body to extend between the first and second faces, through which pairs of leads, respectively associated with each via at the first and second faces, are electrically connectable to one another.

Abstract: In a method for examining a state of a circuit of a motor vehicle, a state for the circuit is requested, whereafter it is checked whether the requested state is actually set. An actual value for a quantity related to the circuit is measured by a measuring unit of the motor vehicle and is compared by a control unit of the motor vehicle with values for the quantity specified for the requested state of the circuit. In parallel, corresponding steps are initiated or performed by a control unit disposed outside the motor vehicle. A message is outputted when the control unit determines that the requested state for the circuit is set. A motor vehicle using the method is also disclosed.

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract: An RF voltage probe is adapted to have a long coaxial cable to permit a measuring device to be connected remotely from the probe without distorting the voltage measurement.

Abstract: An exemplary manipulator of a robot includes a fastening seat defining two guiding grooves, a driving mechanism disposed on the fastening seat, two transmitting plates respectively received in the two guiding grooves and cooperating with the driving mechanism, and two detecting bars each fixedly connecting with a corresponding transmitting plate. A detecting pin is fixed on each of the detecting bars. Under a driving action of the driving mechanism on the transmitting plates, the transmitting plates are activated to slide in the guiding grooves to cause the detecting bars to move close to or apart from each other, whereby a distance between the two detecting pins is automatically regulated.

Abstract: An exemplary manipulator of a robot includes a detecting bar including two detecting pins and a regulating mechanism for regulating the distance between the two detecting pins, a fastening seat supporting the detecting bar, a fixing device fixed to the fastening seat, a driving mechanism disposed on the fastening seat, and an adjusting element connecting the driving mechanism with the regulating mechanism of the detecting bar. Under a driving action of the driving mechanism on the adjusting element, the adjusting element rotates to cause the regulating mechanism of the detecting bar to regulate the distance between the two detecting pins.