Abstract: A system and device for measuring voltage in a conductor having a voltage provides a first electrode surrounding and spaced from the conductor, and a second electrode surrounding and spaced from both the conductor and the first electrode such that there is no contact between the conductor and the electrodes or between the first and second electrodes. The first electrode is connected to a first input of a differential amplifier circuit and the second electrode is connected to the other input of the differential amplifier circuit. The output of the differential amplifier circuit provides a voltage signal in proportion to the voltage of the conductor, thus providing a non-contact means for measuring the voltage of a conductor without requiring a connection to ground while simultaneously providing a high level of rejection of external interference.

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable with the signal cable coupled to a signal processing instrument via an input node. The input node is coupled to an input current amplifier via input circuitry. The input circuitry provides at least one of resistive and capacitive termination of the resistive center conductor signal cable. The termination of the resistive center conductor signal cable in the signal processing instrument provides a signal acquisition system where the capacitive loading of a device under test at higher frequencies is reduced by reducing the input capacitance of the probe tip circuitry resulting in an increase in the signal acquisition system bandwidth.

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract: A system for making high frequency measurements on a DUT includes a high frequency measurement instrument; a plurality of DUT probes; a first coaxial cable having a center conductor and a coaxial conductor for connection between the instrument and a first DUT probe; and a second coaxial cable having a center conductor and a coaxial conductor for connection between the instrument and a second DUT probe, at least one of the first and second cables being selectively shortable between the respective center conductor and coaxial conductor at a location near the respective DUT probe.

Abstract: A circuit tester having a multi-position probe is provided. The circuit tester includes a handle with a detent assembly that allows for positioning the probe at various angles for testing a device. Once a good connection is made with the device under test, an indicator such as a light is lit or a sound is emanated. The probe may be folded into a compartment within the handle once the testing is completed.

Abstract: A circuit tester device for testing continuity and polarity of vehicle relay circuits may include a housing and a plug carried by the housing. The circuit tester device may also have a battery lead adapted to connect to a battery terminal, and a ground lead adapted to connect to a ground. Further, the circuit tester device may have circuitry including three or more circuits connected between the battery and ground leads. Each circuit may have in series a first resistor, a first status indicator, a first diode, a test terminal, a second diode, a second status indicator and a second resistor. Each test terminal may be connected to a respective one of the pins. The circuitry may also have one or more load circuits tapped into one of the circuits between the first and second diodes. The load circuits may include in series a test switch and a load terminal.

Abstract: An electrical probe and associated method are provided to establish electrical contact with a wire. The electrical probe includes an elongate member extending between opposed first and second ends, and first and second needles connected to the elongate member and extending beyond the first end of the elongate member. The electrical probe also includes first and second conductors electrically connected to the first and second needles, respectively, and extending along the elongate member. The electrical probe also includes a bumper stop connected to the elongate member proximate the first end of the tube. Further, the electrical probe includes a movable engagement member extending lengthwise along the elongate member. The moveable engagement member includes a hook that extends beyond the first end of the elongate member and beyond the first and second needles. The hook may include a terminal portion configured to contact the bumper stop.

Abstract: A system and method uses a measurement control device and a measurement machine to measure pin voltages of electronic components installed in an electronic device. The measurement control device controls a mechanical arm of the measurement machine to move to the pins of the electronic components according to coordinates of the pins. A voltage probe installed on the end of the mechanical arm can measure voltages of the pins automatically.

Abstract: In an oscilloscope probe with a transistor amplifier constructed on a semiconductor substrate using integrated circuit technology, at least one part of the input-voltage divider is also constructed together with the amplifier using integrated-circuit technology on the semiconductor substrate.

Abstract: A circuit breaker includes an actuator, a switching device connected to the actuator, and a test unit configured to test a connection between the actuator and the switching device by detecting a first connection voltage at the connection between the actuator and the switching device. The test unit is further configured to test the operation of the switching device by turning the switching device on without operating the actuator.

Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

Abstract: Electrical currents are detected and analyzed across structural members in a structural joint, such as a fastener of a vehicle. In some aspects, printed circuit boards etched with Rogowski coil circuits are inserted proximate the structural members in the structural joint. The Rogowski coil circuits may detect an electrical current as it flows through the structural joint. An integrator may integrate a transient current to generate an output signal, such as when the vehicle is subjected to an electrical charge. The output signal may be transmitted to an Integrated Vehicle Health Management (IVHM) system for analysis. In various aspects, the IVHM system may enable recording and reporting of various aspects of the current to enable maintenance, inspection, or real time/near real time health assessment of the vehicle.

Abstract: A system and method for detecting lightning strikes on a wind turbine includes detecting and measuring a parameter that is indicative of a lightning strike, which may be current induced in a conductor as a result of the lightning strike. A current receptor may be located on a component of the wind turbine and electrically coupled to a ground conductor. A current sensor is disposed on the ground conductor and generates a primary current I(p) that is proportional to a lightning strike current flowing through the ground conductor upon a lighting strike on the receptor. A signal converter sub-system is configured to convert the primary current I(p) into a processing signal. A processing sub-system is configured to receive and use the processing signal to determine an actual lightning strike on the wind turbine.

Abstract: The invention provides a non-contact voltage detector (“NCVD”) that includes a housing, a power switch, and an LED flashlight. The housing includes an upper portion and a lower portion which are slidably attachable to one another. A voltage sense circuit is positioned within the housing and illuminates a voltage sense indicator when it detects an AC voltage. The power switch is operable to activate the voltage sense circuit and the LED flashlight. The NCVD includes a first set of rails and a second set of rails for slidably attaching the NCVD to a test and measurement device, such as a digital multimeter (“DMM”) or an infrared (“IR”) temperature gun.

Abstract: Various exemplary embodiments provide probes, systems and methods for measuring an effective electrical resistance/resistivity with high sensitivity. In one embodiment, the measuring system can include an upper probe set and a similar lower probe set having a sample device sandwiched there-between. The device-under-test (DUT) samples can be sandwiched between two conductors of the sample device. Each probe set can have an inner voltage sense probe coaxially configured inside an electrically-isolated outer current source probe that has a large contact area with the sample device. The measuring system can also include a computer readable medium for storing circuit simulations including such as FEM simulations for extracting a bulk through-plane electrical resistivity and an interface resistivity for an effective electrical z-resistivity of the DUT, in some cases, having sub-micro-ohm resistance.

Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.

Abstract: A measuring system minimizes the parasitic affects of lumped circuit elements. The system includes two or more in-situ interfaces configured to conductively link a source to an internal load and an external load. The in-situ interfaces are linked to a shunt conductor. Two or more linear and dynamic elements conductively link the in-situ interfaces in series. The dynamic elements are configured to overwhelm the parasitic self-capacitance of an input circuit coupled to at least one of the in-situ interfaces. A shield enclosing at least one of the linear and dynamic elements has a conductive surface to fields and electromagnetic interference. The shield has attenuation ratios that substantially dampen the parasitic capacitance between the linear and dynamic elements that bridge some of the in-situ interfaces.

Abstract: A probe includes a tip and a body. The tip includes three input terminals and three output terminals. A first output terminal is connected to a first input terminal via a first resistor. A second output terminal is connected to the second input terminal via a second resistor, and connected to the first output terminal via a first switch. A third output terminal is connected to the third input terminal via a third resistor, connected to the first output terminal via a second switch, and connected to the second output terminal via a third switch. The first and second input terminals are operable to receive a pair of differential signals, the third input terminal is grounded.

Abstract: Voltage measuring instruments and methods of measuring the amplitude of an input signal are disclosed. In an example method of measuring the amplitude of an input signal, in an AC measurement mode, the input signal is coupled through a capacitor, the RMS amplitude of the input signal coupled through the capacitor is determined, and a digital value corresponding to the RMS amplitude is provided. In an automatic measurement mode, the RMS amplitude of the input signal is determined without first coupling the input signal through the capacitor, and a digital value corresponding to the RMS amplitude of the input signal is provided. Further disclosed is a calibration procedure may be used to compensate for any offset of an amplifier of the voltage measuring instrument.

Abstract: A system for testing a device under test includes a probe that detects a signal from the device under test, a display device that depicts a trace based on the signal, where the trace exhibits an attribute, and an indicator that emits an indication signal based on the attribute.

Abstract: An electrical specific resistivity probing robot is directed to automatically measuring a three-dimensional electrical specific resistivity structure of an underground shallow region by installing a plurality of probing electrodes at regular intervals along a robot-moving caterpillar to measure difference of potentials of the electrodes at a ground plane. The electrical specific resistivity probing robot includes a frame, a driving member installed under the frame, a pair of insulating caterpillars installed to both sides of a lower portion of the frame and driven by the driving member, a plurality of probing electrodes installed along track circumferences of the caterpillars at regular intervals, a slip ring electrically slip-connected to the probing electrodes one by one, and a cable electrically connected to the slip ring.

Abstract: The voltage application probe and the voltage measurement probe are connected to the voltage application pad and the voltage measurement pad of the semiconductor device. The voltage application pad and the voltage measurement pad are connected by the conductor, measuring the voltage applied to the voltage application pad through the voltage measurement probe. The voltage compensation circuit in the voltage development device operates to make the voltage applied to the voltage application pad equal to the set voltage for the voltage development device. Even when the resistance between the voltage application probe and the voltage application pad increases, the accurate setting voltage is applied to the voltage application pad.

Abstract: Diagnosing electrical circuit faults can be accomplished with a variety of tools. Voltmeters are frequently used to measure voltage to determine whether a short is present, but are not well-suited for finding intermittent faults caused by corroded connectors or excessive voltage drop under operating loads. Measuring a static voltage without load using a voltmeter can yield misleading results. A diagnostic tool that is simple to use and that yields a definitive result is preferred in certain applications such as automotive electrical system diagnosis due to the varying skill level of technicians and the variation in field conditions in automotive shops. A simple, inexpensive diagnostic tool that can be used with minimal or no training allows rapid diagnosis of circuit faults that result from a the inability of a measured circuit to supply a minimum current at a minimum voltage.

Abstract: The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe.

Abstract: A polarity tester is engagable with an electronic communication port to test the polarity thereof. A connector is supported on a housing and features a plurality of electrical contacts for placement into electrical connection with a respective plurality of electrical contacts in the communication port when the connector is selectively engaged therewith. The plurality of electrical contacts include a power supply contact and a ground contact and a conductive path is defined within the housing to extend between the power supply and ground contacts. An indicator is connected within the conductive path to provide to a user of the polarity tester, when the connector is engaged with the communication port, an indication of whether electricity flows into the conductive path from the respective plurality of electrical contacts in the communication port through the power supply contact.

Abstract: Example wing-shaped support members for enhancing semiconductor device probes and methods to form the same are disclosed. A disclosed example semiconductor device probe includes a finger having a first end and a second end. The example probe further includes a tip having a base and a pointed end. The base is joined to the first end of the finger and the tip tapers from the base to the pointed end. The probe also includes a support member on the tip to increase a rigidity of the tip.

Abstract: A method and apparatus which provide for measurement of embedded EMH, HIRF, or EMI (collectively referred to herein as EMH components), non-destructive measurement of embedded EMH components, component determination using only a simple current measurement; component determination without a priori knowledge of the range of values, the architecture of the test circuit that uses three MOSFET (or equivalent), switches, current measuring circuits, and suitable timing to accurately determine the component values, measurement of an embedded capacitor with relatively unknown parallel load resistance, and/or non-destructive measurement of R/C/TPD type components for any application.

Abstract: A device for testing the operability of an AC power outlet, a DC power outlet and A/V input jacks may include an AC test circuit, a DC test circuit, an A/V test circuit, a logic circuit, and a system OK indicator. At least the AC test circuit and the DC test circuit may be operatively connected to the logic circuit such that when at least the AC plug and the DC plug are inserted in a functioning power outlets, the system OK indicator is activated.

Abstract: A probe system for connecting a measurement apparatus to a DUT includes an AC probe having an AC shield conductor and an AC probe conductor shielded by the AC shield; a first DC probe having a first DC probe conductor and a first guard conductor for guarding the first DC probe conductor when a virtual version of a voltage on the first DC probe conductor is applied to the first guard conductor; a second DC probe having a second DC probe conductor and a second guard conductor for guarding the second DC probe conductor when a virtual version of a voltage on the second DC probe conductor is applied to the second guard conductor; a first capacitive connection between the AC shield conductor and the first guard conductor; a second capacitive connection between the AC shield conductor and the second guard conductor; a third capacitive connection between the first guard conductor and the first DC probe conductor; and a fourth capacitive connection between the second guard conductor and the second DC probe conductor,

Abstract: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.

Abstract: Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.

Abstract: Described is a measuring device, in particular for measuring the pH value in foodstuffs. The measuring device comprises an extended first electrode for plunging into a material to be measured and a sheath which at least partially surrounds the first electrode. The first electrode is pivotably mounted in order to prevent breakage as a result of transversal loads exerted perpendicularly to the axial direction of the electrode.

Abstract: A voltmeter/phaser includes dual hot-stick probes, each carrying a housing including a digital display, one of the housings also having a measurement circuit for measuring the sensed voltage. A plural-conductor cable interconnects the housings and carries, in two separate conductors, current between the probes and display data between the display circuits, so that identical voltage values are always displayed on the two displays.

Abstract: Disclosed herein are a noncontact single side probe and an apparatus and method for testing open and short circuits of pattern electrodes. By feeding power to one end of each of the pattern electrodes and sensing an electrical variation value using a noncontact type single side probe device including an exciter electrode and a sensor electrode as a single module, the open and short circuits of pattern electrodes can be tested by one scanning process. Since the open and short circuits of the pattern electrodes are tested using the noncontact type single side probe device, the pattern electrode can be prevented from being damaged due to a contact failure or pressurized contact and the life span of the probe device can increase compared with a contact type probe device.

Abstract: A non-contact voltage detector having a self-test feature is provided. The non-contact voltage detector may include an antenna, a detection circuit and a self-test circuit. The self-test circuit may be configured to send a test signal through a portion of the antenna and to the detection circuit. Alternatively, the self-test circuit may be configured to send a test signal to the detection circuit without sending it through a portion of the antenna.

Abstract: In a voltage clamp circuit, a normally-on type field-effect transistor having a negative threshold voltage has a drain connected to an input node, a source connected to an output node and grounded via a resistance element, and a gate supplied with an output voltage of a variable direct-current power supply. When a voltage at the output node becomes higher than a clamping voltage because of voltage drop of the resistance element, the field-effect transistor is tuned off. Accordingly, the output voltage is limited to be at most the clamping voltage. Thus, a response speed is higher than those of conventional voltage clamp circuits using diodes or the like.

Abstract: A circuit tester in the form of a pliers includes first and second jaws with first and second probes respectively for engaging a wire to confirm circuit continuity and polarity. The probes are electrically connected in series with a bipolar or two color, light emitting diode and one of the probes may be pivoted out of the series circuit.

Abstract: A method and apparatus for generating one or more transfer functions for converting waveforms. The method comprises the steps of determining a system description, representative of a circuit, comprising a plurality of system components, each system component comprising at least one component characteristic, the system description further comprising at least one measurement node and at least one output node, each of the at least one measurement nodes representative of a waveform digitizing location in the circuit. One or more transfer functions are determined for converting a waveform from one or more of the at least one measurement nodes to a waveform at one or more of the at least one output nodes. The generated transfer functions are then stored in a computer readable medium.

Abstract: An AC/DC voltage measuring instrument is operable in a DC mode, an AC mode, or an automatic mode. In the DC mode, an input terminal is coupled directly to an analog-to-digital converter, which generates a digital output signal indicative of the amplitude of the received signal. In the AC mode, the input terminal is coupled to an RMS circuit through a capacitor. The RMS circuit generates an output signal having an amplitude indicative of the RMS amplitude of the received signal, and this output signal is coupled to the analog-to-digital converter. In the automatic mode, the input terminal is also coupled to the RMS circuit, but it is coupled to the RMS circuit without being coupled through the capacitor. The input terminal is coupled to the RMS circuit through an amplifier, and a calibration procedure is used to compensate for any offset of the amplifier.

Abstract: A potential sensor is provided in which the adhesion of toner particles to the potential sensor is reduced or prevented from occurring, reducing or preventing the occurrence of a situation that accurate detection cannot be performed. The potential sensor has a movable member, detecting electrodes formed on the movable member, a support which movably supports the movable member, a driving mechanism which drives the movable member, and a stationary member which supports the support. Between the movable member and the stationary member, a first gap is so formed as to make the movable member 101 movable. The first gap has a part that is not larger in width than the maximum size of toner particles when the movable member is not elastically deformed and is at a neutral position.

Abstract: A fuel cell voltage measurement device includes a main beam provided at two sides with a transverse slot each for slidably receiving a plurality of slides therein, and a plurality of retractable probe assemblies separately mounted on the slides to move along with the slides. Therefore, the retractable probe assemblies are applicable to contact with fuel cell bipolar plates having different heights and/or thicknesses, making the voltage measurement device highly practical for use. A voltage signal collecting unit is provided on a top of the main beam for directly collecting the measured voltage signals to obtain a voltage state of the fuel cell.

Abstract: Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

Abstract: A probe for measuring electrical characteristics of an excitation current of a plasma is provided. The probe is mounted on a conductive line that includes an inner conductor and an outer conductor. The probe includes a current sensor and a voltage sensor. The current sensor includes a groove formed in the ground of one of the conductors in order to form a detour for the current flowing through the conductor, and a point for measuring electric voltage between a ground connected to the conductor and a point of the groove. The current sensor thus is able to measure a voltage proportional to the first time derivative of intensity (Iplasma) of the excitation current. The voltage sensor is a shunt sensor capable of measuring a voltage proportional to the first time derivative of the voltage (Vplasma) of the excitation current. A plasma reactor including a probe of the aforementioned type is also provided.

Abstract: An apparatus and method for measuring and monitoring the corrosion potential of engineering alloys used in aqueous systems is disclosed and claimed. The method is applicable for a variety of alloys including, but not limited to, copper-based, iron-based, nickel-based, other metallic-based alloys, and their combinations. The corrosion potential is typically determined by measuring a voltage between a specific material in the described oxidation-reduction potential measuring device and a reference electrode. Corrosion potentials for specific materials of construction may be used for diagnostic or control purposes.

Abstract: Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the sample, and a potential measuring mechanism (circuit (K)) for measuring the surface potential of the sample caused by the contact electrification mechanism in a non-contact state of the electroconductive probe device and the surface of the sample, wherein the electrification induced by the contact electrification mechanism and the measurement of the surface potential by the potential measuring mechanism alternate in time series while the voltage applied during the contact is gradually changed, thereby measuring a correlation between the applied voltage and the surface potential.

Abstract: A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the recessed compartment. When the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened. When opened, the light source is reflected from a reflective surface of the door to illuminate a device being probed. The door may further comprise a magnifying element to allow for magnification of the area being probed by a user.

Abstract: The voltage application probe (54) and the voltage measurement probe (56) are connected to the voltage application pad (74) and the voltage measurement pad (76) of the semiconductor device (70). The voltage application pad (74) and the voltage measurement pad (76) are connected by the conductor (78), measuring the voltage applied to the voltage application pad (74) through the voltage measurement probe (56). The voltage compensation circuit (14) in the voltage development device (10) operates to make the voltage applied to the voltage application pad (74) equal to the set voltage for the voltage development device (10). Even when the resistance between the voltage application probe (54) and the voltage application pad (74) increases, the accurate setting voltage is applied to the voltage application pad (74).

Abstract: An integrated circuit, a phase locked loop, a voltage tune probe and a method of screening an integrated circuit employing a phase locked loop thereof. In one embodiment, the integrated circuit includes: (1) an input/output port configured to provide an external interface lead for the integrated circuit, (2) a phase locked loop having a voltage tune line coupled to a voltage controlled oscillator and (3) a voltage tune probe having a first switch coupled to a second switch and a capacitor coupled therebetween. The first switch is coupled to the voltage tune line and the second switch is coupled to the input/output port. The switches provide a bidirectional connection between the external interface lead and the voltage tune line.

Abstract: A current balancing circuit includes a voltage detecting circuit having a detecting diode, and a control switch having an input part and an output part, the input part is coupled in series to the detecting diode and disposed opposite to the detecting diode for detecting abnormal and/or reverse voltages and for preventing electric circuits or facilities from being damaged by the abnormal and/or reverse voltages. The input part may be a photodiode having a positive or negative side coupled to the negative or positive side of the detecting diode. A resistor or a divider diode may be used to protect the voltage detecting circuit.

Abstract: A method and apparatus for determining a voltage potential in a power switching device. The method and apparatus uses a conductive shield surrounding a coil positioned around a connector in a power switching device. The coil is used to provide a current measuring device within the power switching device. The combination of the shield, connector and the dielectric between them forms a capacitor, which is the high voltage leg of a capacitive voltage divider circuit. The capacitive voltage divider has a low voltage leg made of one or more capacitors. The capacitors of the low voltage leg may be removed in order to adjust the output of the capacitive voltage divider. The output of the voltage divider circuit is measured, converted and displayed to a user.