Abstract: A test device for testing for the presence of voltage on an electrical power cable has a manually graspable handle and a probe mounted on the handle for projecting forwardly for engaging the power cable. The housing contains an electronic detection circuit responsive to signals from the probe for detecting presence of voltage on the cable and an indicator light for providing a warning indication in response to the detection of a voltage. The probe has a v-shaped mouth for surrounding the cable and a central rod for engaging into the cable. The mouth is retracted by pressure to expose the rod. The rod engages between the exposed neutral wires of one type of cable or into a punched hole in a cable of the type having a jacket.

Abstract: The invention relates to an adhesive bond 1 for a plurality of densely packed elements 4a, 4b, 4c guided into a plate pack 3. At the plate surface 2 with the adhesive bond 1 the guidance holes 5a are made larger than the guidance holes 5b in the remainder of the plate pack (3) and the adhesive bond is effected by means of a highly viscous adhesive. Because of the larger opening 5a, an adhesive reservoir 10 is formed at the plate surface 2. This makes it possible to use high viscosity adhesives. The geometric features and the use of a highly viscous adhesive make it possible to manufacture durable and heat-resistant adhesive bonds for elements such as wires, glass fibers or micromechanical components.

Abstract: A test probe guide device 10 for use with a conventional electrical test probe 100 and an electrical wire 200 wherein the guide device 10 includes a housing member 20 dimensioned to receive the test probe 100 and spring biased plunger disk 30 and further including a wire engaging unit 13 comprising a hook member 40 dimensioned to captively engage the electrical wire 200 to allow the test probe needle 102 to be electrically connected to the electrical wire 200.

Abstract: A test point enabling hands-free diagnostic testing of electronical circuits, has a body with two planar, at least substantially parallel end surfaces which are spaced apart and face opposite directions. The end surfaces are connected with each other by a waist portion which is in electrical contact with at least one of the end surfaces.

Abstract: A hand-held ignition voltage tester for detecting voltage on a spark plug wire in an ignition system, such as a distributorless ignition system. The tester includes a housing, positive and negative power cables and a capacitive probe for capacitively coupling to the spark plug wire. The capacitive probe generates a voltage signal which is representative of the voltage on the spark plug wire. A plurality of voltage level indicators are mounted to the housing to form a bar graph, with each indicator corresponding to a selected voltage level. A measurement circuit is coupled to the power cables and the capacitive probe for activating the voltage level indicators in response to the voltage signal.

Abstract: The noise received by the unused connectors limits the accuracy of a device for measuring the leakage from a piece of electronic medical equipment. To reduce noise the device is surrounded by a Faraday shield which encloses unused connectors of the device. The shielded connector includes a post having a transverse hole near its distal end. A coil spring surrounds the post end and is connected to the Faraday shield of the device. An insulated retainer prevents the distal end of the coil spring from extending beyond the end of the post. The retainer is compressed against the coil spring to expose the transverse hole when a lead is to be attached to the connector.

Abstract: A measurement device and a method for indicating the ratio of two or more substances having different dielectric constants which form a body of material is described. The measurement device comprises an oscillator (1), a transmission line (5) connected at one end to the oscillator (1) and a probe unit (7) connected to the other end of the transmission line (5). The oscillator (1) transmits an oscillating signal via the transmission line (5) to the probe unit (7), where the probe unit (7) contacts with the body of material. The difference in voltage amplitude between two points in the transmission line (5) is measured, and is indicative of the ratio of the two or more substances.

Abstract: A polarity testing probe has a prod, a handle, an end cap, a wire, a cavity, first and second testing contacts, and a LED cartridge assembly. The prod extends from the handle. The end cap encloses the cavity within the handle. The handle is transparent through to the cavity. The wire extends from the end cap outside of the handle to a clamp. The first and second testing contacts are in the cavity and oppose one another. The first test contact is electrically connected to the prod. The second test contact is electrically connected to the wire. The assembly fits into the cavity with first and second assembly contacts to contact the first and second test contacts, respectively. The assembly has one LED connected to conduct and illuminate in one direction between the prod and the wire. The assembly has a second LED connected to conduct and illuminate in the opposite direction between the prod and the wire. The assembly has a transparent holder with wells to receive the LEDs.

Abstract: The present invention, generally speaking, provides for highly accurate correction of a sensor output using circuitry that is compact and inexpensive. In accordance with one embodiment of the invention, an output signal of a sensor having a sensitivity that varies as a function of temperature and that includes resistors connected to form a bridge is corrected by, first, modeling the sensitivity of the sensor using an expression that is the ratio of two polynomials; applying a voltage across the bridge; and controlling the applied voltage as a function of temperature substantially in accordance with the inverse expression.

Abstract: Methods and apparatus for detecting and utilizing a voltage produced by a variety of materials for process control and analysis purposes.

Abstract: A test probe contact comprises a plunger 1 having a pointed tip 4 formed into a pyramid configuration having an apex 9 and a plurality of slant faces 10--10 meeting at the apex 9 so as to form a ridge 8 between adjacent two slant faces 10 and 10. The pointed tip 4 is connectable with a check land 11 of a test member. A barrel 2 holds the plunger 1 therein so that the plunger 1 slides in an axial direction thereof. A sliding movement of the plunger 1 causes the ridge 8 of the pointed tip 4 to cut the surface of the check land 11 along a ridgeline of the ridge 8. A spring 3 resiliently supports the plunger 1 in the axial direction of the plunger 1 for giving an elastic reaction force to the plunger 1 when plunger 1 is pushed against the check land 11, thereby breaking through the surface of the check land 11 by the ridge 8 so as to establish an electrical connection between the pointed tip 4 and the metal portion of the check land 11.

Abstract: An apparatus and method for converting a voltage waveform into an optical signal is usable in a multi-channel, electromagnetically transparent, voltage probe transmission link system to monitor simultaneously a plurality of voltage signal waveforms of a device or system under test. In the present invention, a first lead provides a first voltage level, a second lead provides a virtual ground associated with the first voltage level, a circuit connected to the first and second leads provides a centertap second voltage level, first and second input circuits connected to the centertap receive the voltage waveform and respectively provide first and second output signals corresponding to the voltage waveform, a differential amplifier differentially amplifies the first and second output signals and provides a third output signal that corresponds to the difference between the first and second output signals, and the third output signal is converted to an optical signal corresponding to the voltage waveform.

Abstract: The presence of bubbles on such photographic material, as is well known, results in significant defects in the photographic materials produced so that it is important, in the manufacture of such photographic materials, to detect the presence of such bubbles in the liquid emulsion and to take appropriate remedial action. Described herein is a bubble detector comprising a conduit for liquid to be monitored, the conduit having opposing flattened, generally parallel walls, and a transducer engaged with one of the generally parallel walls and operable to apply alternating displacements to one of the generally parallel walls, at an ultrasonic frequency, in a direction generally normal to the generally parallel walls to transmit sonic or ultrasonic waves through liquid passing through the conduit.

Abstract: A cable loss simulator for a serial digital signal source adapts a constant resistance, bridged-T passive network to simulate the frequency-loss characteristics of a reference coaxial cable. The cable loss simulator is selectively coupled into the output path of the serial digital signal source to simulate the serial digital signal after transmission through the reference coaxial cable. The cable loss simulator has a resistive input section for impedance matching with the serial digital signal source and a bridged-T section with multiple breakpoints to simulate the frequency-loss characteristic of the reference coaxial cable.

Abstract: The invention presents a method and a correspondingly designed probe for achieving uniform stress distribution when experiencing deflection. The probe has a top edge, a bottom edge, a tip, and a beam portion defined by selecting an inflection point along the top edge, such that the beam portion is contained between the tip and the inflection point, and the bottom edge below the beam portion is approximately straight, while the curvature of the top edge of the beam portion is fitted to a parabola. The tip has an outer edge, an inner edge, and a point of contact at the location where the outer and inner edges join. The inner edge is approximately straight while the curvature of the outer edge is fitted to a second parabola. The probe is preferably mounted in a support structure having a groove for receiving the probe such that the beam portion is free to move vertically in the groove and constrained laterally to prevent side-buckling.

Abstract: A probe adapter may comprise an elongate body having a nose section, a tail section, and a generally U-shaped elongate slot for receiving a probe. The U-shaped elongate slot has a front end that is located a space distance from the nose section of the elongate body. A probe tip assembly mounted to the nose section of the elongate body is adapted to engage the signal input terminal of the probe so that the signal input terminal of the probe is electrically connected to the probe tip assembly when the probe is positioned within the elongate slot.

Abstract: A circuit measures the driving and circulating current in an H-bridge drive network directly and linearly. Voltage across two current sensing resistors are input to two precision half-wave rectifiers. The output of the rectifiers are input to a differential amplifier via a circuit of resistors. The output of the differential amplifier is a signal representative of the current in the H-bridge for both the driven periods and non-driven or freewheeling periods.

Abstract: This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.

Abstract: An ergonomically designed pistol grip voltage probe testing device features visual output indicators, such an LED light, as well as at least one additional or auxiliary indicator such as a buzzer. The LED advantageously changes colors depending on the potential applied to the probe conductor. Other auxiliary output feedback devices are disclosed. The device is particularly suitable for use in an automotive environment, and, in one embodiment, includes a cigarette plug adapter for connecting the device to a cigarette lighter receptacle for supplying output power and a ground reference potential to the test device.

Abstract: A system having a computer, test control logic, an electrostatic discharge unit and a high voltage probe unit is provided for performing multiple, random, asynchronous electrostatic discharge testing of machines. The test control logic includes multiple, asynchronous, random, firing logic for controlling the states of a plurality of output lines which send control signals from the computer to the electrostatic discharge unit and the high voltage probe unit. The test control logic allows a user a preference of testing modes through an interactive input graph. The user may specify either a run time experiment or a specific probability of test coverage test.

Abstract: This invention presents a method and a mechanism for contacting a set of vertical probes of a circuit testing mechanism with a set of pads or bumps of a circuit under test. The vertical probes have a circular cross section, a tip portion of length L1 and a beam portion of length L2, such that the beam portion extends at a right angle to the tip portion. The tip portion is guided through a guide hole to the pads of the circuit under test and the beam portion secured by its end. In this geometry the contact force between the probe and the pad is described by the relation: ##EQU1## where D.sub.v is a vertical deflection of the probe, I is an area moment of inertia of the probe about its axis, and E is a Young's modulus of the probe. The tip length L1 and beam length L2 are selected for each of the vertical probes in such a way the contact force F in this relation is kept constant thus ensuring that the contact force F between the vertical probes and pads remains substantially equal.

Abstract: Telescoping spring probes include a barrel having a hollow cylindrical body with a passageway extending from a closed barrel end to an open barrel end. The open barrel end is crimped radially inward into the passageway. A plunger axially disposed within the barrel passageway comprises a hollow body having an internal cavity extending from an open plunger end to a closed plunger end. The open plunger end disposed within the barrel passageway faces the closed barrel end. The plunger body has an outside surface portion with a diameter greater than the crimped barrel open end to prevent the plunger from exiting the barrel. A spring is disposed axially within the barrel passageway and the plunger cavity. In a first embodiment, the plunger body includes an inwardly deflected detent contacting one end of the spring to imposes a spring force which biases the plunger body against the barrel passageway.

Abstract: A clip is used for receiving one of a plurality of wires of various sizes. The clip includes a non-movable portion including a wire receiving surface and a movable portion disposed at least partially externally of the non-movable portion. The movable portion includes a wire engaging surface disposed opposite and facing the wire receiving surface, with the surfaces defining wire receiving jaws operable between a closed jaw condition and an open jaw condition. A biasing element is coupled to the portions biasing the surfaces to the closed jaw condition. The movable portion is reciprocally movable from the closed jaw condition to the open jaw condition against the urging of the biasing element.

Abstract: A automatic multi-function testing machine for electric appliances includes an oval annular testing table, carriers moving around on the table for carrying electrical appliances to be tested, various testers and meters fixed on a gauge panel located on an oval support base located inside the table, a first electric rail annularly located near the peripheral edge of the oval support base and insulatingly separated into five stages. Each stage is electrically connected with one of the testers and the meters on the gauge panel. Each carrier has two brushes contacting and sliding under the first rail and a socket to connect with a plug of an appliance thereon. So the appliances are tested separately by all the testers and measured by the meters in a flowing system, when moved around with the carrier on the table for one round.

Abstract: A method an apparatus for detecting icing on an aircraft particularly flight surfaces by using the electrical insulating properties of ice on a conductive wing surface utilizing a simple conductive current device engageable selectively on the suspect flight surfaces.

Abstract: An electrical test device for use by an electrician in testing circuits. The device includes a voltage sensor, display, and steady current source. The voltage sensor monitors the type of voltage (AC or DC) between the two conductors, and provides a signal to the display which responsively displays the type of voltage and the voltage level. The power supply has a steady current source that is in series with a tactile transducer, so that the test device may measure a broad range of voltages while only a limited amount of current flows through the voltage sensor. Consequently, lower cost components may be used in the voltage sensor. In another embodiment, the tester also includes a substantially independent continuity tester. The continuity tester includes its own power supply and alarm to indicate the continuity of a conductor and, thus, may operate even if the voltage sensor and display become inoperable.

Abstract: An electrical test device for use by an electrician in testing circuits. The device includes a voltage sensor, display, and steady current source. The voltage sensor monitors the type of voltage (AC or DC) between the two conductors, and provides a signal to the display which responsively displays the type of voltage and the voltage level. The power supply has a steady current source that is in series with a tactile transducer, so that the test device may measure a broad range of voltages while only a limited amount of current flows through the voltage sensor. Consequently, lower cost components may be used in the voltage sensor. In another embodiment, the tester also includes a substantially independent continuity tester. The continuity tester includes its own power supply and alarm to indicate the continuity of a conductor and, thus, may operate even if the voltage sensor and display become inoperable.

Abstract: A probe card includes an oscillator generating an AC signal, an averaged value detecting circuit receiving a signal outputted from a prescaler IC, for generating an averaged DC signal, and a plurality of switches for changing a flow of a signal among the IC tester, the prescaler IC, the oscillator and the averaged value detecting circuit. The switches is so controlled that the AC signal is supplied to the prescaler IC, and the signal outputted from the prescaler IC is supplied to the averaged value detecting circuit and converted to the averaged DC signal, whereby a non-defective/defective of the AC function of the prescaler IC is discriminated on the basis of the obtained averaged DC signal. The switches are also so controlled that a DC test signal is supplied from the IC tester to the prescaler IC and a DC output signal outputted from the prescaler IC is supplied to the IC tester.

Abstract: A converter and digital channel selector device is provided which is interconnected between a source measurement unit having a plurality of output terminal connectors and a probe station having a plurality of input probe terminal connectors. The channel selector device is used to selectively connect each one of the plurality of output terminals of the source measurement unit to corresponding one of the plurality of input probe terminal connectors, respectively. The channel selector device includes a converter for generating a plurality of digital control signals and a digital channel select logic circuit which is responsive to the digital control signals for selectively connecting respective ones of a plurality of its input channel connectors connected to the plurality of output terminal connectors to any one of a plurality of its output channel connectors connected to the plurality of input probe terminal connectors.

Abstract: An apparatus and a method for simultaneously testing or burning in all the integrated circuit chips on a product wafer. The apparatus comprises a glass ceramic carrier having test chips and means for connection to pads of a large number of chips on a product wafer. Voltage regulators on the test chips provide an interface between a power supply and power pads on the product chips, at least one voltage regulator for each product chip. The voltage regulators provide a specified Vdd voltage to the product chips, whereby the Vdd voltage is substantially independent of current drawn by the product chips. The voltage regulators or other electronic means limit current to any product chip if it has a short. The voltage regulator circuit may be gated and variable and it may have sensor lines extending to the product chip. The test chips can also provide test functions such as test patterns and registers for storing test results.

Abstract: A method is provided for more efficiently and inexpensively testing semiconductor devices by an automated process of monitoring the performance of the test equipment and certifying that it is working properly, both before and after the actual tests of the devices are conducted. If the automated process can certify that the test equipment was working properly, prior and subsequent to the actual tests of the devices, then it can be assumed that the actual tests were performed correctly and the results are valid. Those devices that "passed" the actual tests are then ready for the next step in the fabrication process, or typically ready to be shipped to the customer. If the test equipment's performance degrades significantly during the actual tests, then the results of the actual tests are considered invalid. Consequently, the test equipment can be repaired or recalibrated and all of the devices retested.

Abstract: A tester contact for providing a reliable test interface between electrical test equipment and a test item. The tester contact consists of two contact beams partially mounted within a contact body. Each of the contact beams has a first end, a second end, and is constructed of a resilient metal material.

Abstract: A semiconductor circuit element device with an arrangement for testing the device including a plurality of first logic circuits provided in correspondence with internal line groups which are formed by grouping the internal lines into a plurality of groups, a plurality of internal lines belonging to a group in question constituting the input lines of the plurality of first logic circuits, for outputting an active output signal when all of the inputs represent active signals and outputting an inactive output signal when at least one of the inputs represents an inactive signal; and a second logic circuit constituted by one or more stages of circuit structures, for receiving the outputs of the first logic circuits and sending out an output signal such that the output signal in the case where all of the inputs are inactive output signals is different from the output signal in the case where at least one of the inputs is an active output signal.

Abstract: A microwave band probing apparatus includes a wafer stage for mounting a wafer on which a plurality of microwave integrated circuits are present, an RF probe head for transmitting a microwave signal to a prescribed one of the microwave integrated circuits, and a shielding member covering the prescribed microwave integrated circuit when the RF probe head is in contact with an electrode pad of the microwave integrated circuit. Because the shielding member is electrically connected to the probe stage during probing and thereby a ground plane is produced above the microwave integrated circuit as in a packaged state, the conditions upon the measurement of microwave characteristics in the on-wafer state and in the packaged state are approximately the same.

Abstract: An electronic circuit test system for measuring the response to electrical signals applied to an electronic circuit under test is provided with a docking system for facilitating mechanical and electrical connections. A docking cone is mounted to a fixture board of the electronic circuit test system. The docking cone enters a tunnel in a test head of the electronic circuit test system as the fixture board is moved toward the test head. The docking cone guides connectors mounted to the fixture board into connection with mating connectors mounted to a load board and a connector support disk comprising the test head. The docking system increases the repeatability and reliability of mechanical and electrical connections and reduces the risk of damage to electrical connectors of the electronic circuit test system.

Abstract: A system for testing the integrity of critical circuitry, lines and wires employs a differential amplifier having an input resistance R.sub.in and a feedback loop with a resistance R.sub.fb. The critical wires being tested must be a signal wire series connected to a resistance R.sub.S, which is in turn series connected to a return wire. A test voltage source is connected to the noninverting input of the differential amplifier. The signal wire is connected to the inverting input of the differential amplifier. The test voltage source is activated by a test control unit. When activated, the test voltage source provides two distinct outputs allowing computation of a test gain in the presence of other functional signals. The test control unit measures the output V.sub.out of the differential amplifier and computes the value of the test gain. A break in either the signal wire or the return wire will result in a test gain of 1. If the signal and return wires are shorted, the test gain will be 1+R.sub.fb /R.sub.in.

Abstract: A system for locating electrically conductive features such as device terminals (104) of a semiconductor die device under test (103) includes an array of test terminals (101), an anisotropically conductive material (102) above the array of test terminals (101), and a semiconductor die (103). The array of test terminals has a pitch (203) much smaller than the pitch (204) of the device terminals (104). Individual test terminals (105) of the array of test terminals (101) are scanned to locate the device terminals (104). Once the device terminals (104) are located, the test terminals (105) are configured to send and receive functional signals required for functionally testing the device under test (103).

Abstract: A hybrid R-C component for use in oscilloscope probes of the type having a resistive element disposed on a first surface of a substrate, and having a first conductive coating disposed on a second surface of the substrate, and having a dielectric layer disposed over the first conductive coating, a second conductive coating partially disposed over a first portion of the substrate and in contact with a first end of the resistive element and with a region of the second conductive coating being partially disposed over the dielectric layer and forming a first capacitor plate, a third conductive coating disposed over a second portion of the substrate and in contact with a second end of the resistive element and with a region of the third conductive coating being partially disposed over the dielectric layer and forming a second capacitor plate, whereby the first capacitor plate and a first area of the first conductive coating in conjunction with the dielectric layer form a first capacitor C1 and the second capacitor

Abstract: A multi-channel electromagnetically transparent voltage probe transmission link system or method monitors a plurality of voltage signals at a plurality of test points of a device under test that is subject to a radiation field with at least two intensity levels. The system or method compares the monitored voltage signals at the first intensity level corresponding to the level at which the monitored voltage signals not being affected by the radiation field, and the second intensity level being greater than the first intensity level. The system or methods determines whether or not the device is affected by the radiation field by determining if the monitored voltage signals are affected by the radiation field at the second intensity level.

Abstract: An electrical probe card for parametric testing of microelectronics having reduced leakage current, includes a hydrophobic layer of a self curing silicone material coating the entire exposed surface of the ceramic card between exposed conductors. The hydrophobic layer has a thickness of less than 1 micrometer, preferably less than 0.1 micrometer and most preferably between 0.01 and 0.001 micrometers. The hydrophobic layer does not interfere with subsequent soldering to the contacts on the card, is inexpensive, solvent resistant and easily applied to new and pre-existing probe cards. The method of application involves applying an excess of the hydrophobic silicone material in its uncured state, followed by vigorously wiping excess material off to thin the layer, produce a good bond and clean the exposed conductors on the probe card.

Abstract: A supplemental monitoring device which issues an error signal when the monitoring device loses motor drive pulses is disclosed. Also disclosed is providing a manufacturing system with a normally closed relay which controls the flag, thus advantageously providing a semiconductor system which automatically interrupts the ion beam in the event of a system malfunction.

Abstract: A testing contactor is provided for testing small-size semiconductor devices with large currents at high frequencies. Each semiconductor device to be tested has a plurality of leads. The testing contactor includes a plurality of first electric contact elements. A first Kelvin contact for a lead is formed of a first electric contact element in contact with the lead. The testing contactor further includes a plurality of second electric contact elements and a plurality of electric connection elements. An electric connection element in contact with the lead effectively extends the lead. A second Kelvin contact is formed of a second electric contact element and an electric connection element, the second electric contact element in contact with the electric connection element and the electric connection element in contact with the lead.

Abstract: A semiconductor integrated circuit fault analyzing apparatus includes an electron beam tester and controller. The electron beam tester includes an electron gun assembly for generating a primary electron beam and forms a voltage contrast image on the basis of a detection amount of secondary electrons obtained by irradiating the primary electron beam from the electron gun assembly onto a semiconductor integrated circuit serving as a target to be tested and supplied with a test pattern signal, thereby specifying a faulty circuit portion of the semiconductor integrated circuit using the formed voltage contrast image.

Abstract: Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like.

Abstract: A circuit tracer for determinating the location of a conductor, such as a wire, which is either an open or closed circuit, and which may lie underground. The tracer includes a transmitter which is connected to the conductor, a hand-held probe, and a receiver which is connected to the probe. The probe has three different sensors: an electric field sensor, primarily for locating the terminus of an open-ended conductor or for distinguishing such a wire in a bundled cable of wires; a differential electric field sensor, for determining the direction to and location of an open-ended conductor located above ground; and an inductive sensor for determining the direction to and location of a current-carrying conductor, including an open-ended conductor lying below ground. A switch selectively provides the output from one of the sensors to the receiver unit, which determines the magnitude of any signal based upon the direction the probe is pointing.

Abstract: The subject clips are adapted from commercially available screw setters. Shortening of the setters and attachment of electrical conductors converts the setters to electrical test clips.

Abstract: The test probe for electrical measuring instruments, particularly for voltmeters, is characterized by an automatic holding device that automatically holds the test probe in a socket-outlet jack of any given design, which device comprises a contact spring at least partially adjacent to a contact pin and bilaterally bulging toward the tip of the contact pin. This results in a universally utilizable test probe that will hold automatically in any jack format of different socket-outlets, shock-hazard protection being ensured at all times.

Abstract: A test probe includes a probe tip electrically connected to a probe amplifier. The probe tip includes an input conductor, a shield conductor, and a middle conductor between the input conductor and the shield. The capacitance between the middle conductor and the input conductor are employed in a frequency compensation circuit. In one embodiment the three conductors form a triaxial probe tip. The middle conductor is a thin film formed along an equipotential surface defined between the input conductor and the shield with the middle conductor not present.

Abstract: A wedge connector for integrated circuits comprises tapered fingers of conductive metal separated by an insulator. The tapered fingers are wedge-shaped, in that they are thinnest at their tips, so that they may more easily enter the space between adjacent legs of an integrated circuit (IC). A row of wedges is assembled, and spaced apart to interdigitate with the legs of the IC. The IC legs have sides that face each other along the direction of the row, and that are separated by the amount of the inter-leg spacing. The tapered fingers or wedges penetrate into the inter-leg space and contact the facing sides of the IC legs. Thus, the left-hand side of a wedge entering a particular inter-leg space will come into electrical contact with the right-hand side of the IC leg on the left of that inter-leg space, and the right-hand side of that wedge will come into electrical contact with left-hand side of the IC leg on the right of that inter-leg space.

Abstract: A resistance measuring circuit (10) generates a predetermined reference voltage and impresses that reference voltage across a squib detonation device (12). The resulting current flowing through the squib is mirrored by a current mirror (42,52,54) for providing multiple mirrored currents. The mirrored currents are compared to known current sources (58,60). The output signals go high or low depending on whether the mirrored currents are greater than or less than the fixed current sources. The output signals provide an indication as to whether the measured squib resistance is within a specified resistance range. The current sources may be precisely matched to maintain high accuracy in measuring the resistance.