Frequency Comparison, (e.g., Heterodyne, Etc.) Patents (Class 324/76.41)
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Patent number: 12066487Abstract: A method for simple measurement of phase shift between a first clock signal and a second clock signal is described, each clock signal having a period T0. The method includes: feeding the first clock signal into a first input of a mixer; feeding the second clock signal into a second input of the mixer; feeding the output signal of the mixer into a low pass filter; and measuring the output signal of the low pass filter, with the aid of an output voltage that is normalized to operating voltage of the mixer. A circuit for implementing the method includes a mixer and a low pass filter. The mixer includes a first input for feeding in the first clock signal, and a second input for feeding in the second clock signal. The output of the mixer is connected to the input of the low pass filter.Type: GrantFiled: October 19, 2020Date of Patent: August 20, 2024Assignee: ROBERT BOSCH GMBHInventor: Andreas Schubert
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Patent number: 11886621Abstract: In one embodiment, an apparatus includes: a clock generator to receive a reference clock signal and generate a first clock signal using the reference clock signal; a counter coupled to the clock generator to maintain a first count regarding a number of cycles of the first clock signal; and a controller coupled to the counter. The controller may be configured to detect a potential security violation when the first count varies from a predetermined value.Type: GrantFiled: March 24, 2021Date of Patent: January 30, 2024Assignee: Silicon Laboratories Inc.Inventor: Brian Taylor Brunn
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Patent number: 11187736Abstract: A method of setting an analyzer, the method comprising: providing an analyzer with a first signal source and a second signal source; connecting the signal sources with a device under test; generating a first signal, transmitting the first signal to the device under test, measuring the first transmitted signal and a first signal reflected from the device under test, thereby obtaining first compensation parameters; generating a second signal, transmitting the second signal to the device under test, measuring the second transmitted signal and a second signal reflected from the device under test, thereby obtaining second compensation parameters; using the first and second compensation parameters to compensate the signal sources; and transmitting the first and second signals simultaneously.Type: GrantFiled: February 20, 2020Date of Patent: November 30, 2021Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Werner Held, Jan-Patrick Schultheis
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Patent number: 11177806Abstract: Logic circuitry includes a first logic circuit, second logic circuits, a third logic circuit, and fourth logic circuits. The first logic circuit inverts a first output signal relative to an input signal only in response to a first control signal having a first state that indicates that the input signal has remained in a same logic state for at least a predefined period of time. The second logic circuits are coupled in series. The second logic circuits generate a second output signal in response to the first output signal. The third logic circuit inverts a third output signal relative to the second output signal only in response to the first control signal having the first state. The fourth logic circuits are coupled in series. The fourth logic circuits generate a fourth output signal in response to the third output signal.Type: GrantFiled: June 26, 2018Date of Patent: November 16, 2021Assignee: Intel CorporationInventor: Hoong Chin Ng
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Patent number: 11159167Abstract: An integrated circuit includes first circuits that are configured to implement a user design for the integrated circuit, second circuits that are unused by the user design, and configuration circuitry that couples the second circuits together through a network of conductors. Transistors in the second circuits turn on and off in response to a varying signal that propagates through the second circuits and through the network of conductors while the first circuits implement the user design.Type: GrantFiled: September 25, 2017Date of Patent: October 26, 2021Assignee: Intel CorporationInventor: Herman Schmit
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Patent number: 10768215Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.Type: GrantFiled: October 5, 2018Date of Patent: September 8, 2020Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Martin Leibfritz, Werner Held, Thilo Bednorz, Walter Weiss, Jan-Patrick Schultheis
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Patent number: 10598729Abstract: Systems and methods for monitoring a number of operating conditions of a programmable device are disclosed. In some implementations, the system may include a root monitor including circuitry configured to generate a reference voltage, a plurality of sensors and satellite monitors distributed across the programmable device, and a network-on-chip (NoC) interconnect system coupled to the root monitor and to each of the plurality of satellite monitors. Each of the satellite monitors may be in a vicinity of and coupled to a corresponding one of the plurality of sensors via a local interconnect.Type: GrantFiled: August 8, 2019Date of Patent: March 24, 2020Assignee: XILINX, INC.Inventor: John K. Jennings
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Patent number: 10459018Abstract: Certain exemplary embodiments can provide a method, which can comprise automatically removing effects of local oscillator phase drift occurring in between two measurements of reciprocal networks as made with a vector network analyzer. The method can further comprise determining that the vector network analyzer substantially simultaneously samples all incident and reflected waves from the reciprocal networks.Type: GrantFiled: May 3, 2017Date of Patent: October 29, 2019Inventor: Alex Arsenovic
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Patent number: 10333532Abstract: Apparatuses and methods are disclosed for detecting a loop count in a delay-locked loop that uses a divide clock in a measure initialization process. An example apparatus includes a divider configured to receive a signal and produce a first divided signal and a second divided signal that is complementary to the first divided signal, a first circuit configured to count the first divided signal during a first enabled period and produce a first count value, a second circuit configured to count the second divided signal during a second enabled period and produce a second count value, and an adder configured to produce a third count value responsive to the first and second count values.Type: GrantFiled: September 7, 2017Date of Patent: June 25, 2019Assignee: Micron Technology, Inc.Inventor: Yasuo Satoh
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Patent number: 10045697Abstract: A system for measuring and converting to an observer intelligible form an internal physiological parameter of a patient. The invention allows transcutaneous telemetry of intracranial pressure via a system which includes a patient implanted sensor module and an external processing module, optically coupled to the sensor module via an external coupling module. A sensor within the sensor module transduces the measured pressure and a near infrared emitter transmits the telemetry when interrogated by the external coupling module. A set of tuned inductor-crystal circuits comprised in part of a cylindrical crystal oscillator whose resonant frequency is sensed by a dipper circuit arrangement is provided. Power for the sensor module is derived inductively through rectification of a transcutaneously-applied high-frequency alternating electromagnetic field generated within the external coupling module.Type: GrantFiled: January 22, 2014Date of Patent: August 14, 2018Inventor: Erich W. Wolf, II
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Patent number: 10016135Abstract: A system for measuring and converting to an observer intelligible form an internal physiological parameter of a patient. The invention allows transcutaneous telemetry of intracranial pressure via a system which includes a patient implanted sensor module and an external processing module, optically coupled to the sensor module via an external coupling module. A sensor within the sensor module transduces the measured pressure and a near infrared emitter transmits the telemetry when interrogated by the external coupling module. A set of tuned inductor-crystal circuits comprised in part of a cylindrical crystal oscillator whose resonant frequency is sensed by a dipper circuit arrangement is provided. Power for the sensor module is derived inductively through rectification of a transcutaneously-applied high-frequency alternating electromagnetic field generated within the external coupling module.Type: GrantFiled: January 20, 2014Date of Patent: July 10, 2018Inventor: Erich W. Wolf, II
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Patent number: 9858742Abstract: The present invention relates to an ultrasonic sensor for detecting double sheets and a method of detecting double sheets using the same, in which in configuring the ultrasonic sensor for detecting double sheets of banknotes passing through a transfer path, the ultrasonic sensor is configured to include an ultrasonic wave generator and an ultrasonic wave receiver provided in pair to face each other in a direction perpendicular to a transfer direction of the banknotes with the transfer path for transferring the banknotes interposed therebetween, and periodicity of a reception signal detected by the ultrasonic wave receiver is determined to detect whether a zero sheet, a single sheet or double sheets of the banknotes pass through the transfer path according to generation or not of the periodic signal and/or a frequency of the generation.Type: GrantFiled: December 23, 2014Date of Patent: January 2, 2018Assignee: Nautilus Hyosung Inc.Inventor: Young Bae Kim
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Patent number: 9625508Abstract: A vector network analyzer (VNA) for analyzing the response of a device under test (DUT), the VNA comprising a plurality of VNA ports configured to be connected to the DUT; a plurality of source ports configured to be connected to the VNA ports; a plurality of couplers for coupling a plurality of coupled signals, wherein said plurality of coupled signals are combined to provide a sum signal; and a receiver configured to receive said forward sum signal.Type: GrantFiled: January 26, 2015Date of Patent: April 18, 2017Assignee: VAYYAR IMAGING LTD.Inventor: Naftali Chayat
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Patent number: 9383726Abstract: A physical quantity measuring method includes: (a) generating a synchronized input signal from an input signal, wherein the synchronized input signal is synchronized with a reference clock; (b) measuring a total number (Nsum) that is the sum of pulses of the reference clock included in each of n units of the synchronized input signal; (c) generating 2n deviation signals based on a delay of the synchronized input signal with respect to the input signal; (d) generating a deviation integration signal by subtracting the total values of n rear-half deviation signals from the total values of n front-half deviation signals; (e) converting the deviation integration signal into a number of pulses of the reference clock; and (f) calculating the average number (Nrave) of pulses of the reference clock included in one unit of the input signal, based on the total number (Nsum), the number (dNsum), and the number n.Type: GrantFiled: May 23, 2013Date of Patent: July 5, 2016Assignee: YOKOGAWA ELECTRIC CORPORATIONInventors: Akihiro Ooshima, Tomohito Nouno
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Publication number: 20150061640Abstract: A method for sensorless control of a separately excited synchronous machine having a rotor includes the following steps: feeding a test signal on a parameter of an electrical current driving the rotor; measuring the parameter of the electrical current driving the rotor on an axis of the coordinate system describing the synchronous machine; determining an error signal by correlating the measured parameter of the electrical current driving the rotor with a temporally delayed test signal which is determined from the fed test signal; and adjusting a rotor angle as a reaction to the error signal if the error signal has a value not equal to zero.Type: ApplicationFiled: March 27, 2013Publication date: March 5, 2015Applicant: Continental Automotive GmbHInventor: Thomas Baumann
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Publication number: 20150008899Abstract: Precision AC and DC voltage, current, phase, power and energy measurements and calibrations with current ranges from 1 uA to 20 kA and voltage ranges from 1V to 1000 kV are now performed with accuracies of better than one part per million. Continued demand for improved accuracy has led the inventors to address remnant magetization within the current comparators that form the basis of the measuring process within many of the measurement instruments providing the precision AC and DC measurements and calibrations. Accordingly, the inventors present current comparator and measurement system architectures together with control protocols to provide for correction of this remnant magnetization.Type: ApplicationFiled: July 1, 2014Publication date: January 8, 2015Inventors: MARK EVANS, TOMASZ BARCZYK, IAIN PAGE, KENNETH MIKOLAJEK
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Patent number: 8917102Abstract: A method for measuring a capacitance using a capacitance meter. The capacitance meter includes an AC power source with a controllable frequency which is fed to a capacitor to measure its capacitance. A first measurement of the capacitance is performed by the capacitance meter using a first frequency. When the first measurement of the capacitance indicates the capacitance is below a threshold capacitance a lower capacitance measurement is performed in the capacitance meter, using a second measurement of the capacitance using a second frequency. When the first measurement of the capacitance indicates the capacitance is above a threshold capacitance, a higher capacitance measurement is performed in the capacitance meter, using a second measurement of the capacitance using a third frequency, the third frequency being lower than the second frequency.Type: GrantFiled: September 17, 2010Date of Patent: December 23, 2014Assignee: ABB Technology AGInventors: Alf Brodin, Jon Lissmats, Jerry Svedlund, Hans Olof Fröjd
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Patent number: 8901916Abstract: A method of testing an electronic device includes measuring radio frequency emissions at a plurality of positions relative to a trusted unit of a particular electronicdevice during operation of the trusted unit, and measuring radio frequency emissions at the same plurality of positions relative to a second unit of the particular electronic device. For each of the plurality of positions, the radio frequency emissions measured from the second unit are compared to the radio frequency emissions measured from the trusted unit. The method then determines whether there is any frequency at which the measured amplitude of the radio frequency emissions from the second unit and the measured amplitude of the radio frequency emissions from the trusted unit exhibit a statistically significant difference.Type: GrantFiled: December 22, 2011Date of Patent: December 2, 2014Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.Inventors: Phillip D. Jones, Thomas D. Pahel, Jr., Adam J. Parker, Adrian X. Rodriguez
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Patent number: 8901917Abstract: An element measurement circuit is provided, comprising a oscillator for generating a first oscillation clock and second oscillation clock, a frequency divider for dividing the first oscillation clock to generate a third oscillation clock and for dividing the second oscillation clock to generate a fourth oscillation clock, a frequency detector for detecting the third oscillation clock to generate a first count value and for detecting the fourth oscillation clock to generate a second count value, and a controller for generating a first oscillation period according to the first count value, for generating a second oscillation period according to the second count value, and for generating a measurement value according to the first oscillation period and the second oscillation period.Type: GrantFiled: April 20, 2012Date of Patent: December 2, 2014Assignee: Realtek Semiconductor Corp.Inventors: Ying-Yen Chen, Jih-Nung Lee, Chun-Yu Yang
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Patent number: 8866468Abstract: A dF/dT trigger system and method includes instantaneously triggering on a frequency deviation of a data signal, which can be associated with an SSC signal. After receiving a signal at an input terminal of a test and measurement instrument, the signal is low-pass filtered and transmitted to trigger circuitry. When a frequency deviation rate in the filtered signal exceeds or crosses one or more thresholds, a trigger event is produced. Also disclosed is a test and measurement instrument including an input terminal to receive the signal, input circuitry to receive and process the signal, and dF/dT trigger circuitry configured to receive the signal and produce a trigger event when a frequency deviation in the signal exceeds or crosses one or more thresholds.Type: GrantFiled: January 27, 2011Date of Patent: October 21, 2014Assignee: Tektronix, Inc.Inventors: Patrick A. Smith, Daniel G. Knierim, John C. Calvin, Shane A. Hazzard
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Patent number: 8847604Abstract: Implementations are presented herein that include a test circuit and a reference circuit.Type: GrantFiled: November 17, 2011Date of Patent: September 30, 2014Assignee: Infineon Technologies AGInventors: Thomas Baumann, Georg Georgakos, Christian Pacha, Anselme Urlick Tchegho Kamgaing
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Publication number: 20140223614Abstract: A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential.Type: ApplicationFiled: September 12, 2012Publication date: August 7, 2014Inventors: Takeshi Fukuma, Naritaka Kobayashi
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Publication number: 20140214266Abstract: Systems, media, and methods are provided for oscillation monitoring. An aircraft system includes a first oscillation monitoring module and a second oscillation monitoring module. The first oscillation monitoring module is configured to select first oscillating portions of an input signal, generate a frequency signal that indicates a frequency of the first oscillating portions, and generate a first failure signal in response to the frequency of the first oscillating portions exceeding first oscillatory fault detection requirements for the input signal. The second oscillation monitoring module is configured to select second oscillating portions of the input signal based on the frequency signal generated by the first oscillation monitoring module and to generate a second failure signal in response to a frequency of the second oscillating portions exceeding second oscillatory fault detection requirements for the input signal.Type: ApplicationFiled: January 28, 2014Publication date: July 31, 2014Applicant: Gulfstream Aerospace CorporationInventors: Ventseslav Rashkov, Michael Curtis
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Publication number: 20140176116Abstract: A first instance and a second instance of an oscillating circuit are each formed as part of an integrated circuit and are used to monitor degradation over time of one or more portions of the integrated circuit. The first instance of the oscillating circuit is configured to be coupled to a power source during normal operation of the integrated circuit and the second instance is configured to be decoupled from the power source. Over the lifetime of the integrated circuit, the first instance undergoes degradation from use while the second instance of the oscillating circuit remains unpowered, therefore experiencing essentially no use-related degradation. During a testing operation, the second instance can be used as a reference circuit that accurately quantifies use-related degradation of the first instance of the oscillating circuit and, by extension, one or more portions of the integrated circuit.Type: ApplicationFiled: December 20, 2012Publication date: June 26, 2014Applicant: NVIDIA CORPORATIONInventors: Hemant KUMAR, Matthew Raymond LONGNECKER, Brian SMITH
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Publication number: 20140145707Abstract: A voltage fluctuation detection circuit includes an oscillation circuit configured to receive an operation voltage and perform an oscillation operation, an operation voltage generation unit configured to reduce a detection target voltage and generate the operation voltage, and a fluctuation detection unit configured to measure an oscillation frequency of the oscillation circuit and detect a fluctuation of the detection target voltage.Type: ApplicationFiled: September 26, 2013Publication date: May 29, 2014Applicant: FUJITSU LIMITEDInventors: Satoshi Tanabe, Kenichi Kawasaki
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Patent number: 8705675Abstract: An RF signal reception device including: a transposition device of signals of frequency fRF to a first intermediate frequency IF1<fRF; a first bandpass filter centered on IF1; a sampler at a frequency fs<IF1; a second discrete-time filter centered on a second intermediate frequency IF2=?·fs/M+fs/(M·n); a decimation device of a factor M; an analog-digital convertor to operate at a frequency fs/M; where ?, n and M are strictly positive real numbers chosen such that: ?<fs/(2·BWch·M), and BWch/2<fs/M·n), with BWch: bandwidth of a channel of the received RF signals.Type: GrantFiled: December 16, 2010Date of Patent: April 22, 2014Assignee: Commissariat à l'énergie atomique et aux énergies alternativesInventors: Luis Lolis, Michael Pelissier
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Patent number: 8664933Abstract: A frequency measuring apparatus includes: a counter section adapted to count a signal including a pulse signal for a predetermined time period, and output a binary count value corresponding to a frequency of the signal including the pulse signal; and a low pass filter section adapted to perform a filtering process on the count value, wherein the low pass filter section includes a first stage filter and a second stage filter, the first stage filter is a moving average filter to which the count value is input, and which provides a binary output with a high-frequency component reduced, and the second stage filter performs an average value calculation on the binary output to provide an output with the high-frequency component reduced.Type: GrantFiled: May 20, 2010Date of Patent: March 4, 2014Assignee: Seiko Epson CorporationInventor: Masayoshi Todorokihara
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Patent number: 8653808Abstract: Method for frequency detection and detecting variation of frequency is disclosed. The method comprises the following steps. First of all, a pointer is provided over an electromagnetic position detection apparatus, wherein the pointer emits an electromagnetic signal with a frequency f1. Next a base integration signal is generated according to the integration of the electromagnetic signal with the frequency f1 for a current integration period x. Then a current integration signal is generated according to the integration of the electromagnetic signal with the frequency f1 for the current integration period x and a predetermined electromagnetic signal with a predetermined frequency f0 for the predetermined integration period y. Finally, a frequency variation value ?f between the frequency f1 and a current frequency fc is calculated and obtained according to the current integration signal and the base integration signal.Type: GrantFiled: February 9, 2011Date of Patent: February 18, 2014Assignee: Waltop International CorporationInventors: Yun-Hsiang Yeh, Chang-Sian Chen
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Patent number: 8648622Abstract: A method for monitoring a frequency signal provided within a unit is disclosed. The method comprises a step of receiving one or more binary signal levels of a cycle signal (CLK) or a control signal (CS) from a communication interface (CLK, CS, MOSI, MISO), wherein the communication interface (CLK, CS, MOSI, MISO) is designed to transfer information according to a communication protocol. The method further comprises a step of providing the frequency signal in the unit and comparing the frequency signal to a temporal sequence of signal levels of the cycle signal (CLK) received by the communication interface (CLK, CS, MOSI, MISO) in order to obtain a comparison result or controlling a counter by the control signal (CS) and the frequency signal in order to obtain a counter status.Type: GrantFiled: November 26, 2010Date of Patent: February 11, 2014Assignee: Robert Bosch GmbHInventors: Michael Baus, Michael Stemmler
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Publication number: 20140035560Abstract: A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.Type: ApplicationFiled: August 3, 2012Publication date: February 6, 2014Applicant: FREESCALE SEMICONDUCTOR, INC.Inventors: Alfredo Olmos, James R. Feddeler, Miten H. Nagda, Stefano Pietri
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Publication number: 20140028284Abstract: A method for obtaining electric power information is applied with a power supply and includes following steps of coupling the power supply to an AC power source; detecting a voltage of the AC power source to obtain a first voltage; detecting a frequency of the AC power source to obtain a first frequency; and estimating an electric power information of the power supply in accordance with the first voltage and the first frequency. The electric power information includes an input current, an input voltage or an input power outputted from the AC power source to the power supply.Type: ApplicationFiled: December 12, 2012Publication date: January 30, 2014Applicant: DELTA ELECTRONICS, INC.Inventors: Sheng-Hsien LIN, Chung-Ping KU
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Patent number: 8638088Abstract: In one embodiment, a method for detecting a load in a switched-mode power converter is provided. The switched-mode power converter includes high and low-side power switches which are configured to be driven respectively by high and low-side drive signals to provide a switching voltage. The high and low-side drive signals include a plurality of dead-time periods. The method includes monitoring a waveform of the switching voltage and at least one of the high and low-side drive signals. The monitored waveform of the switching voltage is compared to the monitored waveform of the at least one of the high and low-side drive signals to determine whether the switching voltage is high or low during at least one of the dead-time periods. A current measurement of the load is determined based on whether the switching voltage is high or low during the at least one of the dead-time periods.Type: GrantFiled: February 2, 2011Date of Patent: January 28, 2014Assignee: International Rectifier CorporationInventors: Jun Honda, Jong-Deog Jeong
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Publication number: 20140009140Abstract: A system for testing a real time clock (RTC) includes a frequency-dividing circuit configured to generate a frequency-dividing clock pulse signal equal to a rated frequency of a clock pulse signal generated by the RTC, and a control circuit including a processing chip. The processing chip includes a timer and a counter. The timer is used to record a test time of the RTC, the counter is used to record a pulse difference between the clock pulse signal and the frequency-dividing clock pulse signal during the test time. If a pulse rate difference between the counter and the timer is greater than a standard clock pulse difference, the RTC is unqualified, and if the pulse rate difference between the counter and the timer is less than the standard clock pulse difference, the RTC is qualified.Type: ApplicationFiled: October 31, 2012Publication date: January 9, 2014Inventor: QIANG GUO
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Patent number: 8575914Abstract: A frequency measuring apparatus includes: a counter section adapted to count a signal including a pulse signal for a predetermined time period, and output a binary count value corresponding to a frequency of the signal including the pulse signal; and a low pass filter section adapted to perform a filtering process on the count value, wherein the low pass filter section includes a first stage filter and a second stage filter, the first stage filter is a moving average filter to which the count value is input, and which provides a binary output with a high-frequency component reduced, and the second stage filter performs an average value calculation on the binary output to provide an output with the high-frequency component reduced.Type: GrantFiled: May 20, 2010Date of Patent: November 5, 2013Assignee: Seiko Epson CorporationInventor: Masayoshi Todorokihara
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Patent number: 8508213Abstract: A frequency measurement device for measuring a frequency of a signal to be measured including a pulse signal, includes: a signal multiplier section that multiplies the signal to be measured by n (n is an integer) and outputs a multiplied signal; a counter section that counts the multiplied signal with a predetermined gate time and outputs a count value of the frequency of the signal to be measured at a predetermined period; and a low-pass filter that outputs a signal corresponding to the frequency of the signal to be measured based on the count value outputted at the predetermined period.Type: GrantFiled: May 18, 2010Date of Patent: August 13, 2013Assignee: Seiko Epson CorporationInventor: Masayoshi Todorokihara
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Patent number: 8497672Abstract: The present embodiments provide an acceleration sensor, which enables highly accurate detection and has an extremely compact size. The acceleration sensor of the present embodiments is provided with a substrate, a anchor portion formed on the substrate, a support beam, which has one end connected to the anchor portion and extends across a space from the substrate, and a proof mass which is connected to the other end of the support beam and held across a space from the substrate. The acceleration sensor is further provided with first and second piezoelectric bending resonators, a comparison unit, and a calculation unit. The first and second piezoelectric bending resonators have one end connected to the anchor portion and the other end connected to the proof mass or the support beam and have a stack of a first electrode, a first piezoelectric film, and a second electrode.Type: GrantFiled: September 14, 2010Date of Patent: July 30, 2013Assignee: Kabushiki Kaisha ToshibaInventors: Takashi Kawakubo, Toshihiko Nagano, Michihiko Nishigaki, Hiroshi Ono
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Publication number: 20130162241Abstract: A method of testing an electronic device comprises measuring radio frequency emissions at a plurality of positions relative to a trusted unit of a particular electronic device during operation of the trusted unit, and measuring radio frequency emissions at the same plurality of positions relative to a second unit of the particular electronic device. For each of the plurality of positions, the radio frequency emissions measured from the second unit are compared to the radio frequency emissions measured from the trusted unit. The method then determines whether there is any frequency at which the measured amplitude of the radio frequency emissions from the second unit and the measured amplitude of the radio frequency emissions from the trusted unit exhibit a statistically significant difference.Type: ApplicationFiled: December 22, 2011Publication date: June 27, 2013Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Phillip D. Jones, Thomas D. Pahel, JR., Adam J. Parker, Adrian X. Rodriguez
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Patent number: 8466689Abstract: A method of monitoring a capacitor bank comprising a plurality of capacitor strings connected in parallel, each capacitor string comprising a plurality of capacitors connected in series is provided. The method includes energizing the capacitor bank. The method includes determining dissipation factors of each of the plurality of the capacitor strings. The method further includes comparing each of the determined dissipation factors with an expected dissipation factor and estimating a health state of the plurality of the capacitor strings based, at least in part, on the comparison of the determined and expected dissipation factors.Type: GrantFiled: March 31, 2010Date of Patent: June 18, 2013Assignee: General Electric CompanyInventors: Karim Younsi, Yingneng Zhou, Samar Shaker Soliman
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Publication number: 20130147462Abstract: A frequency comparator outputs an input reference signal and a comparison target signal as pulse-form signals, and is charged or discharged with a voltage corresponding to the reference signal to output a reference voltage having a variable first frequency range, and charged or discharged with a voltage corresponding to the comparison target signal to output a comparison target voltage having a variable second frequency range. The frequency comparator compares the reference voltage having the first frequency range and the comparison output voltage having the second frequency range.Type: ApplicationFiled: November 28, 2012Publication date: June 13, 2013Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEInventor: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
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Patent number: 8461821Abstract: A frequency measuring apparatus includes: a high-order digit calculation section adapted to measure an input signal and output a high-order digit value of a frequency value of the input signal; a low-order digit calculation section adapted to measure the input signal and output a low-order digit value of the frequency value of the input signal; and an adding section adapted to add the high-order digit value and the low-order digit value to each other to output the frequency value of the input signal.Type: GrantFiled: May 20, 2010Date of Patent: June 11, 2013Assignee: Seiko Epson CorporationInventor: Masayoshi Todorokihara
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Publication number: 20130106398Abstract: A gain measurement circuit of a receiver includes a frequency mixer that receives a reception signal, mixes the reception signal with a local signal from an oscillator, and outputs an intermediate frequency signal; and a phase controller that extracts a part of the local signal, sets a different phase for the part, and outputs the part as the reception signal; wherein, for the different phase set by the phase controller, a direct-current voltage of the intermediate frequency signal output from the frequency mixer is detected, a conversion gain of the frequency mixer is obtained, and a gain of the receiver is calculated.Type: ApplicationFiled: September 11, 2012Publication date: May 2, 2013Applicant: FUJITSU LIMITEDInventor: Masaru SATO
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Publication number: 20130088213Abstract: A current switch that can be reset when it is not powered automatically calibrates itself when the circuit monitored by the current switch is energized.Type: ApplicationFiled: July 31, 2012Publication date: April 11, 2013Applicant: VERIS INDUSTRIES, LLCInventor: David PIERSON
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Publication number: 20130057303Abstract: A device for an electric hand-held device for detecting the hand-held device being clasped by a hand, has at least one transmitting electrode, which can emit an alternating electric field, and at least one receiving electrode, in which the alternating electric field can be coupled at least partially, wherein the at least one transmitting electrode and the at least one receiving electrode can be arranged on the hand-held device such that each of them is at least partially covered by the hand when the hand-held device is being clasped by the hand. When the hand-held device is being clasped by the hand, a first portion of the alternating electric field emitted by the transmitting electrode can be coupled via the hand into the receiving electrode, wherein at least the first portion of the alternating electric field is a characteristic representative of the hand-held device being clasped by the hand.Type: ApplicationFiled: December 13, 2010Publication date: March 7, 2013Inventors: Claus Kaltner, Reinhard Unterreitmayer
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Patent number: 8384372Abstract: A method and system is disclosed to detect and analyze an electric signal based on movement between an element and a counter electrode influenced by a nonlinear electric field produced by an electrical signal impressed between the element and counter electrode. Through detection of changes in the distance between the element and the counter electrode characteristics of the element and/or the environment of the element may be ascertained. Changes in the distance between the element and the counter electrode may be monitored based on changes in the value of capacitance between the element and counter electrode. The disclosed devices and methods may be employed to detect, for instance, presence of chemical/biological species in a sample or measure physical parameters of a sample such as pressure/acceleration, density, viscosity, magnetic force, temperature, and/or extremely small masses.Type: GrantFiled: October 5, 2009Date of Patent: February 26, 2013Assignee: Clemson UniversityInventors: Herbert W. Behlow, Jr., Bevan C. Elliott, Gayatri D. Keskar, Doyl E. Dickel, Malcolm J. Skove, Apparao M. Rao
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Publication number: 20130030742Abstract: A method for monitoring a synchronous machine is described. The method includes injecting a narrowband sinusoidal signal at a first end of a field winding of the synchronous machine. The method further includes monitoring a voltage at a second end of the field winding with respect to ground. The method then identifies a resonant frequency based on the monitored voltage, and generates a winding health indicator based on the identified resonant frequency and an expected resonant frequency.Type: ApplicationFiled: July 26, 2012Publication date: January 31, 2013Inventors: Arijit Banerjee, Somakumar Ramachandrapanicker, Haiyan Sun, Subhra Samanta, Srinivas Satya Sai Mallampalli
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Patent number: 8275334Abstract: An apparatus and method for detecting solid-state electronic devices are described. Non-linear junction detection techniques are combined with spread-spectrum encoding and cross correlation to increase the range and sensitivity of the non-linear junction detection and to permit the determination of the distances of the detected electronics. Nonlinear elements are detected by transmitting a signal at a chosen frequency and detecting higher harmonic signals that are returned from responding devices.Type: GrantFiled: April 9, 2009Date of Patent: September 25, 2012Assignee: Los Alamos National Security, LLCInventors: Stephen L. Judd, Clifford M. Fortgang, David C. Guenther
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Patent number: 8269480Abstract: A method for identifying and reducing spurious frequency components is provided. A method in accordance with at least one embodiment of the present disclosure may include generating a digital sinusoidal waveform at a direct digital synthesizer (DDS) and receiving the digital sinusoidal waveform at an audio digital-to-analog converter. The method may further include converting the digital sinusoidal waveform to an analog sinusoidal waveform containing spurious frequency components, combining the analog sinusoidal waveform with an analog distortion correction waveform to generate a composite output waveform and receiving the composite output waveform at notch filter circuitry. The method may also include filtering the composite output waveform to generate a filtered composite output waveform and amplifying a difference between the filtered composite output waveform and a signal from a circuit-under-test (CUT) to generate an amplified analog signal.Type: GrantFiled: July 9, 2008Date of Patent: September 18, 2012Assignee: LTX-Credence CorporationInventors: Solomon Max, Christopher Joel Hannaford, R. Warren Necoechea
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Publication number: 20120194169Abstract: A dF/dT trigger system and method includes instantaneously triggering on a frequency deviation of a data signal, which can be associated with an SSC signal. After receiving a signal at an input terminal of a test and measurement instrument, the signal is low-pass filtered and transmitted to trigger circuitry. When a frequency deviation rate in the filtered signal exceeds or crosses one or more thresholds, a trigger event is produced. Also disclosed is a test and measurement instrument including an input terminal to receive the signal, input circuitry to receive and process the signal, and dF/dT trigger circuitry configured to receive the signal and produce a trigger event when a frequency deviation in the signal exceeds or crosses one or more thresholds.Type: ApplicationFiled: January 27, 2011Publication date: August 2, 2012Applicant: TEKTRONIX, INC.Inventors: Patrick A. SMITH, Daniel G KNIERIM, John C. CALVIN, Shane A. HAZZARD
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Patent number: 8169236Abstract: A frequency detection mechanism for a clock generation unit on an integrated circuit includes a clock generation unit and a detection unit. The clock generation unit may generate an output clock signal at a predetermined frequency that corresponds to a frequency multiple of a reference clock signal provided as an input to the clock generation unit. The detection unit may determine whether the output clock signal is at the predetermined frequency. As such, the detection unit includes a first counter that may generate a first count value based upon the reference clock signal and a second counter that may generate a second count value based upon the output clock signal. The detection unit also includes comparison logic that may perform a plurality of multiplication operations on the first and second count values and generate a final result that indicates whether the output clock signal is at the predetermined frequency.Type: GrantFiled: September 30, 2011Date of Patent: May 1, 2012Assignee: Apple Inc.Inventor: Daniel C. Murray
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Patent number: 8125250Abstract: A frequency detection mechanism for a clock generation unit on an integrated circuit includes a clock generation unit and a detection unit. The clock generation unit may generate an output clock signal at a predetermined frequency that corresponds to a frequency multiple of a reference clock signal provided as an input to the clock generation unit. The detection unit may determine whether the output clock signal is at the predetermined frequency. As such, the detection unit includes a first counter that may generate a first count value based upon the reference clock signal and a second counter that may generate a second count value based upon the output clock signal. The detection unit also includes comparison logic that may perform a plurality of multiplication operations on the first and second count values and generate a final result that indicates whether the output clock signal is at the predetermined frequency.Type: GrantFiled: March 26, 2010Date of Patent: February 28, 2012Assignee: Apple Inc.Inventor: Daniel C. Murray