Abstract: A standard unit (100) for a system on chip design includes a plurality of semiconductor devices and is configured to implement a basic logic function. The standard unit (100) includes a first transistor (110) of a first threshold type and a second transistor (120) of a second threshold type, the second threshold type is different from the first threshold type, wherein a threshold range of the first threshold type is different from that of the second threshold type.

Abstract: Techniques for control of power switches in a USB Power Delivery (USB-PD) system are described herein. In an example embodiment, an integrated circuit comprises a programmable gate control circuit coupled to a provider field effect transistor (FET) and a consumer FET to provide control signals to the provider and consumer FETs in response to system conditions and application requirements of the USB-PD system. A pulldown current control circuit may provide additional control to slew rate for the slow turn-ON of provider and consumer FETs.

Abstract: A memory device includes a memory cell array comprising a plurality of memory cells wherein each of the plurality of memory cells is configured to be in a data state, and a physically unclonable function (PUF) generator. The PUF generator further includes a first sense amplifier, coupled to the plurality of memory cells, wherein while the plurality of memory cells are being accessed, the first sense amplifier is configured to compare accessing speeds of first and second memory cells of the plurality of memory cells, and based on the comparison, provide a first output signal for generating a first PUF signature.

Abstract: A subscriber station for a bus system and a method for reducing line-related emissions in a bus system are provided. The subscriber station includes an edge controller for symmetrizing switching edges in the bus system. The edge controller includes an element for generating a setpoint voltage characteristic on a bus in the bus system and a current mirror for transmitting the generated setpoint voltage characteristic to the bus.

Abstract: The invention relates to a method and an apparatus for detecting at least one interfering body in a system for inductive energy transmission, wherein the system includes at least one primary coil unit, wherein the apparatus includes at least one interfering body detector means, wherein the at least one interfering body detector means includes at least one field coil means and at least one detector coil means which is assigned to the at least one field coil means, wherein the apparatus includes at least one evaluation means, wherein the interfering body is detectable depending on the state of coupling and/or the change in the state of coupling, wherein the apparatus includes at least one compensation means.

Abstract: The present disclosure is directed to attack detection through signal delay monitoring. An example system may comprise at least one device including a physical interface. At least one signal delay monitor may determine whether a signal being transmitted to the device is received as expected at the physical interface and indicate a potential attack when the signal is determined to not be received as expected. Determining whether the signal is received as expected may include determining whether the signal is received within a window defining a time period in which receipt of the signal is expected. An example signal monitor may comprise at least a new data reception monitoring module and an expected reception window monitoring module. These modules may include logic to determine whether the signal is received within the window. An indication of a potential attack may trigger, for example, security-related actions in the system.

Abstract: A system and method for a high-side power switch includes a gate driver configured to be coupled to a power switch, a voltage measurement circuit configured to be coupled directly to the power switch, a switch monitoring circuit configured to be coupled to the power switch, the switch monitoring circuit configured to measure an output current of the power switch, a current limitation circuit coupled to the gate driver and the switch monitoring circuit, the current limitation circuit configured to regulate gate-source voltage of the gate driver when the output current exceeds a threshold value, and a controller coupled to the current limitation circuit and the voltage measurement circuit, the controller configured to determine a mode of operation according to a startup voltage measured by the voltage measurement circuit during a startup sequence, the controller further configured to provide the threshold value to the current limitation circuit according to the mode of operation and a switch voltage measured by

Abstract: A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.

Abstract: A method for protecting analog or mixed signal ICIP uses adjustment requirements of analog circuits to provide an obfuscated mechanism for preventing unauthorized use of an analog or mixed-signal IC (“AIC”) by disabling the AIC until application of an adjustment signal that is within a narrow enabling subrange. Embodiments significantly increase the adjustment range beyond the enabling subrange, and/or omit AIC tuning outputs that are not required for operation of the IC. Embodiments include “clipping” circuits that render the AIC outputs unresponsive to tuning signals outside of the enabling subrange. Information regarding the enabling subrange and/or a separate enabling IC can be provided to authorized users, and/or enabling bits of a digital adjustment input can be permanently set by the ICIP owner after AIC manufacture. The ICIP can be further protected by a security feature that can be unique to each AIC, and/or by using a two-foundry production method.

Abstract: Systems and methods for latch-up detection and mitigation. One aspect includes a method implemented in a system divided into a plurality of power blocks, where each power block is powered by a corresponding power rail and includes a voltage droop monitoring circuitry. The method comprises receiving frequency information from the plurality of voltage droop monitoring circuitries; normalizing the received frequency information from each of the plurality of voltage droop monitoring circuitries; creating a matrix of cross-correlation values based on the normalized frequency information between each pair of the plurality of power blocks; determining deviations in the cross-correlation values indicating an occurrence of voltage droop; determining an abnormal variation based on the determined deviations to identify a first power block, out of the plurality of power blocks, experiencing a latch-up event; and resetting power to the first power block without interrupting power to rest of the plurality of power blocks.

Abstract: A semiconductor element drive device includes a drive circuit which drives a semiconductor element configuring a power conversion device; an alarm generation circuit which generates alarm signals with pulse widths corresponding to protection factors in accordance with the outputs of detection circuits which detect information necessary for the operation of protecting the semiconductor element; an output circuit which externally outputs the alarm signals at a predetermined level; a protection cancellation circuit which generates a protection cancellation signal over a fixed period in accordance with the inverting output of a drive stop signal generation circuit, which stops the drive of the semiconductor element by the drive circuit in accordance with the outputs of the detection circuits, and with the output of the alarm generation circuit; and an output control circuit which changes the signal output level of the output circuit in accordance with the protection cancellation signal.

Abstract: A driver integrated circuit (IC) device. The driver device can include a front-end module, a pre-driver module, and a driver module coupled to a transmission line path. The pre-driver module can be coupled to the front-end module and can include one or more delay adjust capacitor modules, and one or more pull-down control modules. The driver module can be coupled to the pre-driver module, the driver module including one or more pull-down control logic modules. This driver device can configured in several implementations to provide control and programmability of a driver slew rate to maximize a signal integrity eye opening.

Abstract: Methods and apparatuses for implementing a Physically Unclonable Function (PUF) and random number generator capabilities comprising providing a device under test comprising a plurality of bits comprising integrated circuits each including a capacitor; placing the bits in a first state with charge on selected bit capacitors; stopping bit refresh for a first predetermined time; re-enabling refresh for a second predetermined time to read and refresh charge on all bits; reading all bits and recording addresses of bits that have experienced bit flip from a first state to a second state comprising from “1” to “0” state; performing selecting a plurality of said recorded addresses to generate a PUF or cryptographic key; and performing an operation comprising a test or verification operation with said generated information PUF or key. Various hardware elements are also provided as well as machine readable instructions for implementing and controlling aspects of the invention.

Abstract: In some embodiments, provided is a processor chip including self deactivation logic to deactivate the processor chip after a threshold of qualified events have been monitored.

Abstract: A method, non-transitory computer readable medium, and apparatus for preventing accelerated aging of a physically unclonable function (PUF) circuit are disclosed. For example, the method monitors an environmental condition associated with the physically unclonable function circuit, detects a change in the environmental condition associated with the physically unclonable function circuit, and, in response to the change in the environmental condition, implements a security function for preventing the accelerated aging of the physically unclonable function circuit.

Abstract: A current-mode-logic gate designed to have a first electronic path and a second electronic path. Each electronic path has a pair of transistors. The second electronic path is physically separated and identical to the first electronic path. In operation, a first input signal is transmitted through the first electronic path of the current-mode-logic gate to produce a first output signal. Similarly, a second input signal is transmitted through the second electronic path of the current-mode-logic gate to produce a second output signal.

Abstract: A circuit and methods for mitigating radiation-induced Single Event Effects (SEE) in Silicon-on-Insulator (SOI) Complementary Metal-Oxide-Semiconductor (CMOS) integrated circuits are presented. A primary logic output is generated from a primary logic gate in response to an input. A redundant logic output is generated from a redundant logic gate that duplicates the primary logic output in response to the input if an SEE is not present. An interleaved C-gate output is generated from an interleaved C-gate that emulates an inverter output when the primary logic output and the redundant logic output match, and does not changes its output when the primary logic output and the redundant logic output do not match during the SEE.

Abstract: A device for sensing a binary signal includes a device configured to measure a signal level of the signal, a device configured to determine whether the measured signal level is “low” or “high”, a device configured to provide a variable input impedance, and a device configured to control the input impedance in response to the measured signal level. The variable input impedance may be provided by way of a transistor and a resistor, and by controlling the duty ratio of the transistor using pulse width modulation. Preferably, the input impedance is controlled to be low for low signal levels and to be high for high signal levels, which results in a more reliable sensing of binary signals. The device may be used for detecting the state of contact transducers suffering from parasitic resistances caused by moist and/or polluted environments. Further, a method of sensing a binary signal is provided.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function, providing for the IC to continue the same functioning despite defects which may arise during operation.

Abstract: Power isolation during time intervals of sensitive operations is disclosed. In one embodiment, a programmable chip package includes a programmable chip configured to perform a sensitive operation, and a switch configured to selectively couple a main power source to the programmable chip. The programmable chip package may also include an alternate power source and a controller that is configured to control the switch to decouple the main power source from the programmable chip during a time interval of the sensitive operation, wherein the programmable chip is configured to draw power from the alternate power source during the time interval. The controller is further configured to control the switch to couple the main power source to the programmable chip after the time interval.

Abstract: Systems and methods are provided for destroying or erasing circuitry elements, data, or both, such as transistors, volatile keys, or fuse blocks, located in an integrated circuit device. An initiation signal may be provided to induce latch-up in a circuitry element in response to a user command, a tampering event, or both. As a result of the latch-up effect, the circuitry element, data, or both may be destroyed or erased.

Abstract: Systems and methods for reducing power distribution network noise are provided. For example, in one embodiment, a method includes determining delay variations of a user design via a delay sensor of an integrated circuit (IC). The delay variations are associated with voltage variations of the user design. Low frequency components of the voltage variations are filtered via control logic of the IC to obtain an AC response of the user design. An artificial current load is introduced to the IC to negate the AC response of the user design.

Abstract: Approaches for estimating a derating factor for a plurality of potential soft errors in a circuit implementation of a circuit design. A plurality of respective estimated toggle rates are determined for a plurality of circuit elements for implementing the circuit design. A derating factor of the circuit design is determined as a function of the estimated toggle rates of the plurality of circuit elements. The derating factor is an estimation of a fraction of the plurality of potential soft errors that would cause functional failure of the circuit design.

Abstract: Various embodiments relate to an anti-tampering circuit for a secure device including: a signal delay detector; a clock delay detector; a clock duty cycle detector; and a protection unit that receives an error indication from the signal delay detector, clock delay detector, and the clock duty cycle detector, wherein the protection unit indicates tampering to a secure device upon receiving the error indication.

Abstract: Disclosed is a closed-loop feedback system for controlling the soft error rate (SER) due to radiation strikes on electronic circuitry. A variable sensitivity soft error rate detector provides and output corresponding to the soft error rate. This output is supplied to a voltage control. The output of the voltage control is fed back to the sensitivity control of the sensor—thus forming a feedback loop. The output of the voltage control may be the power supply of the soft error rate sensor. The output of the soft error rate sensor may also be used to enable and disable fault tolerant schemes or alert a user.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements. Provision is made for applying the method to logic designs implemented in programmable logic integrated circuit devices.

Abstract: In order to protect an integrated circuit provided with a cryptoprocessor from attacks aiming to reveal secrets, it is anticipated to use a component sensitive to the activation of a parasitic (latchup) thyristor and/or to the activation of a parasitic bipolar transistor, or to design a circuit having this property. If the component is stressed due to the presence of this circuit, it is immediately deactivated, actually preventing the revelation of the secrets thereof.

Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: A semiconductor integrated circuit device includes a target circuit of a low power consumption mode having at least one flip-flop circuit to which a clock signal is supplied in a normal operation mode and in a low power consumption mode, and a logic circuit to which each output of the at least one flip-flop circuit is input, wherein each of the flip-flop circuits includes a selector that selects a normal data signal in the normal operation mode, selects an inverted output of the flip-flop circuit in the low power consumption mode, based on an operation-mode switching signal that designates switching between the normal operation mode and the low power consumption mode, and inputs the selected signal to a data input terminal of the flip-flop circuit.

Abstract: A method and apparatus for aligning the phases of digital clock signals are disclosed. For example, a phase alignment circuit according to one embodiment includes a frequency adjuster comprising a first plurality of inputs, where at least some of the first plurality of inputs are coupled to an output of a digital clock of an integrated circuit, a phase adjuster comprising a second plurality of inputs, where at least some of the second plurality of inputs are coupled to a plurality of outputs of the frequency adjuster, and an XOR gate comprising a third plurality of inputs, each of the third plurality of inputs being coupled to one of the plurality of outputs of the frequency adjuster.

Abstract: The present invention includes a circuit-level system and method for preventing the propagation of soft errors in logic cells. A radiation jammer circuit in accordance with the present invention, including an RC differentiator and a depletion mode MOS circuit, when inserted at the output of a logic cell, significantly reduces the propagation of transient glitches. The radiation jammer circuit is a novel transistor-level optimization technique, which has been used to reduce soft errors in a logic circuit. A method to insert radiation jammer cells on selective nodes in a logic circuit for low overheads in terms of delay, power, and area is also introduced.

Abstract: A semiconductor integrated circuit includes: a ladder resistor; a ROM decoder; and a test circuit. The ladder resistor includes a plurality of resistors series-connected to each other and is supplied with a correction voltage at least one of both ends of the series connection and a plurality of connection points in the series connection to generate a plurality of gradation voltages at the plurality of connection points. The ROM decoder selects one of the plurality of gradation voltages generated by the ladder resistor, based on a supplied data signal. The test circuit measures a leakage current in the ROM decoder. The test circuit includes: a plurality of separation units, and a control unit. The plurality of separation units separates the series connection, which is respectively supplied with different power source voltages at both ends, at a certain portion, when the leakage current is measured. The control unit controls separation of the plurality of separation unit corresponding to the data signal.

Abstract: A metastability-hardened storage circuit includes at least one inverting circuit. The inverting circuit has a logical input. The logical input of the inverting circuit is split into a pair of physical inputs.

Abstract: In one embodiment of the present invention, a programmable interconnect circuit is provided. The programmable interconnect circuit includes first and second static random access memory cells, each having a first output and a second output. The second output is an inversion of the first output. First and second pass gates are each coupled to one of the first and second outputs of the respective first and second memory cells. First and second lock-state circuits are coupled to the respective first and second memory cells. In response to a configuration status signal and the first output of one of the memory cells being asserted to a low voltage, the respective lock-state circuit is configured to maintain the one of the outputs of the respective memory cell at the low voltage.

Abstract: The present invention includes a circuit-level system and method for preventing the propagation of soft errors in logic cells. A radiation jammer circuit in accordance with the present invention, including an RC differentiator and a depletion mode MOS circuit, when inserted at the output of a logic cell, significantly reduces the propagation of transient glitches. The radiation jammer circuit is a novel transistor-level optimization technique, which has been used to reduce soft errors in a logic circuit. A method to insert radiation jammer cells on selective nodes in a logic circuit for low overheads in terms of delay, power, and area is also introduced.

Abstract: Reducing electromagnetic radiation from semiconductor devices. At least some of the illustrative embodiments are methods comprising driving a Boolean state to a signal pad of a semiconductor device (the driving through a transistor with a first drain-to-source impedance during the driving), and maintaining the Boolean state applied to the signal pad through the transistor with a second drain-to-source impedance, higher than the first drain-to-source impedance.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, such as the type introduced through radiation or, more broadly, single-event effects (SEEs). SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits, among others.

Abstract: An embodiment of the invention relates to a circuit for distributing an initial signal, comprising an input node receiving the initial signal, a plurality of terminal nodes each providing at least one resulting signal to a circuit component, and different connection branches between the input node and the plurality of terminal nodes, to which a plurality of intermediate nodes is connected, wherein connection branch is duplicated, so that each node among the input node and the intermediate nodes comprises two inputs and two outputs allowing double propagation of the initial signal towards the terminal nodes through duplicated connection branches, each terminal node terminal node receiving two input signals, images of the initial signal and providing the resulting initial signal: an image of the input signals if said input signals are identical, or inactive, if the input signals are different from each other.

Abstract: The present invention provides a radiation hardened flip-flop formed from a modified temporal latch and a modified dual interlocked storage cell (DICE) latch. The temporal latch is configured as the master latch and provides four output storage nodes, which represent outputs of the temporal latch. The DICE latch is configured as the slave latch and is made of two cross-coupled inverter latches, which together provide four DICE storage nodes. The four outputs of the temporal latch are used to write the four DICE storage nodes of the DICE latch. The temporal latch includes at least one feedback path that includes a delay element, which provides a delay.

Abstract: An integrated system mitigates the effects of a single event upset (SEU) on a reprogrammable field programmable gate array (RFPGA). The system includes (i) a RFPGA having an internal configuration memory, and (ii) a memory for storing a configuration associated with the RFPGA. Logic circuitry programmed into the RFPGA and coupled to the memory reloads a portion of the configuration from the memory into the RFPGA's internal configuration memory at predetermined times. Additional SEU mitigation can be provided by logic circuitry on the RFPGA that monitors and maintains synchronized operation of the RFPGA's digital clock managers.

Abstract: A constant voltage generator device provides a first and a second transistor having their main current path coupled serially via a common terminal for providing a constant output voltage at the common terminal of said transistors. The device provides one or more potential dividers having a plurality of serially connected resistive elements. A first voltage is obtained from a first combination of resistive elements of the potential divider and a second voltage obtained from a second combination of resistive elements of the potential divider. The first and the second voltages are supplied to the first and the second voltage at the control terminals of the first and the second transistors, respectively.

Abstract: Devices and methods are disclosed for logic gate devices to provide reduced leakage while improving performance. The device is configured for low leakage logic application where high threshold voltage devices are used to reduce leakage at the expense of reduced logic speed. Better performance is achieved than a high threshold voltage stack.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: An integrated circuit such as a programmable logic device integrated circuit is provided that contains body-biased metal-oxide-semiconductor transistors and latch-up prevention circuitry to prevent latch-up from occurring in metal-oxide-semiconductor transistors. Body bias signals can be received from an external source or generated internally. Body bias paths are used to distribute the body bias signals to the body terminals of the metal-oxide-semiconductor transistors. The latch-up prevention circuitry may include active n-channel and p-channel metal-oxide-semiconductor transistor latch-up prevention circuitry. The latch-up prevention circuitry monitors the states of power supply signals to determine whether a potential latch-up condition is present.

Abstract: A low voltage differential signaling transceiver includes a transmitter and a receiver, the transmitter having a first terminal in signal communication with a transmission line, a source resistance in signal communication with the first terminal, a switch in signal communication with the source resistance and in switchable signal communication from ground or an input voltage, a voltage regulator in switchable signal communication with the switch for providing the input voltage to the switch, and a voltage controller in signal communication between the first terminal and the voltage regulator for controlling the input voltage to provide a controlled voltage to a receiver; and the receiver having an amplifier having a first input, a first pad in signal communication with the first input, a load resistance, and a second pad in signal communication with the load resistance, where the first and second pads are both in signal communication with one end of a first transmission line.

Abstract: In some embodiments, a chip includes first and second nodes, a variable voltage source, and transmitter and control circuitry. The transmitter includes a driver coupled to the first and second nodes, and first and second resistive structures coupled between the first and second nodes, respectively, and the variable voltage source. The control circuitry selects an impedance level for the first and second resistive structures, and detect coupling of a remote receiver to the transmitter through interconnects and detect decoupling of the remote receiver from the transmitter. Other embodiments are described and claimed.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: An integrated circuit such as a programmable logic device integrated circuit is provided that contains body-biased metal-oxide-semiconductor transistors and latch-up prevention circuitry to prevent latch-up from occurring in metal-oxide-semiconductor transistors. Body bias signals can be received from an external source or generated internally. Body bias paths are used to distribute the body bias signals to the body terminals of the metal-oxide-semiconductor transistors. The latch-up prevention circuitry may include active n-channel and p-channel metal-oxide-semiconductor transistor latch-up prevention circuitry. The latch-up prevention circuitry monitors the states of power supply signals to determine whether a potential latch-up condition is present.