Profile Patents (Class 33/551)
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Patent number: 7784333Abstract: An approach controller (234) of a coordinate measuring instrument enables a position control loop (RP) and drives an actuator (133) so that a force sensor (1) is brought to a close position under a position control. When recognizing that the force sensor (1) reaches the close position, a contact controller (235) controls a switch (227) to enable a force control loop (RF) and drives the actuator (133) to bring the force sensor (1) into contact with a workpiece under a force control.Type: GrantFiled: May 14, 2007Date of Patent: August 31, 2010Assignee: Mitutoyo CorporationInventors: Kentaro Nemoto, Takeshi Yamamoto
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Patent number: 7779551Abstract: A testing apparatus for testing perpendicularity of an end surface of a workpiece is disclosed. The testing apparatus includes an electrically conductive first reference piece defining two guide holes, and two testing units. The testing units are slidably engaged in the guide holes, so as to form two testing circuits. At a normal state, each testing circuit is closed, and each testing unit extends out of the guide hole for a distance, wherein the distance corresponds to an allowable perpendicularity tolerance. Each testing unit can be pushed to retract back to the guide holes by the end of the workpiece to cause the testing circuit to be opened. The opened state or closed state of each of the testing circuits will help show the status of the perpendicularity of the end surface of the workpiece.Type: GrantFiled: September 5, 2008Date of Patent: August 24, 2010Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventor: Bing-Jun Zhang
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Patent number: 7774952Abstract: A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.Type: GrantFiled: October 17, 2006Date of Patent: August 17, 2010Assignee: A-Metrics, LLCInventors: Bonifatijs Lubgins, Leonids Bekers
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Patent number: 7769560Abstract: In profiling control of a contact type probe in which a contact point is moved along a surface of an object to be measured, while being in contact with the object by a constant measurement force F, a contact determination level is provided for detecting a predetermined force smaller than a target measurement force is applied to the contact point, contact determination is performed at the time when force applied to the contact point reaches the contact determination level during approach, and the contact point is shifted from position control to force control for bringing the contact point into contact with the object by the target measurement force. Thereby contact trace is prevented from occurring on the object to be measured without reducing approach speed as much as possible and lowering measurement efficiency.Type: GrantFiled: January 30, 2008Date of Patent: August 3, 2010Assignee: Mitutoyo CorporationInventors: Shiro Igasaki, Masaoki Yamagata
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Patent number: 7748134Abstract: A measuring device includes a base, a holding member mounted to the base and having a notch for holding a cylinder, a guide rod connected to the base and defining an axial direction parallel to an axial direction of the cylinder, and a gauge mounted with the guide rod and defining a measuring direction perpendicular to the axial direction of the cylinder. As a result, the measuring device of the present invention has the advantage of proving a simple way to measure the roundness of the cylinder.Type: GrantFiled: March 9, 2009Date of Patent: July 6, 2010Inventor: Yao-Chung Wang
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Patent number: 7743525Abstract: An exemplary apparatus for testing planeness of a workpiece is provided. The apparatus includes a platform for supporting the workpiece thereon, a bracket vertically mounted to the platform, and a testing system mounted to the bracket for testing the workpiece. The testing system includes a testing member, a test dial indicator having a sliding pole, and a fine-tuning member for controlling the movement of the testing member. One end of the testing member is connected to the sliding pole. When testing, the fine-tuning member drives the testing member to move toward the workpiece, until the testing member contacts the workpiece. The sliding pole extends together with the testing member. A value is shown by the test dial indicator that indicates the moving distance of the testing member. A distortion value of the workpiece can be obtained according to the value.Type: GrantFiled: April 25, 2008Date of Patent: June 29, 2010Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Bing-Jun Zhang, Lian-Zhong Gong
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Publication number: 20100139107Abstract: A method of measuring a three-dimensional shape of a connection assembly of a stator coil in a turbine generator, includes first measuring a three-dimensional shape of a measurement area of the connection assembly of the stator coil in a measurement range set in advance by a laser non-contact three-dimensional shape measurement device, second measuring a three-dimensional shape of a measurement area of the connection assembly of the stator coil in a measurement range set in advance by a multi-joint contact three-dimensional shape measurement device, the multi-joint contact three-dimensional shape measurement device including a plurality of arms being coupled via a joint including a built-in encoder, and integrally synthesizing the three-dimensional shape data measured in the first measurement, the three-dimensional shape data measured in the second measurement, and shape measurement data of a local area measured manually, thereby drafting a plan of the stator connection assembly.Type: ApplicationFiled: December 7, 2009Publication date: June 10, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Hiroaki Koinuma, Kazuyuki Sasaki, Yuichiro Gunji
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Patent number: 7726035Abstract: A measuring device, includes a guiding rail, a sliding unit levitatedly slidably engaged with the guiding rail, and a measuring unit fixed to the sliding unit and comprising at least one dial gauge mounted thereto.Type: GrantFiled: February 24, 2008Date of Patent: June 1, 2010Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Chih-Kuang Chang, Sen Zhang, Jin-Kui Zeng
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Patent number: 7676944Abstract: A shape inspection device is adapted for a curved resin hose having a hose body including a bent portion. The shape inspection device has a first fixing portion for fixing one longitudinal end portion of the curved resin hose, a second fixing portion for fixing the other longitudinal end portion of the curved resin hose, and an inspecting portion between the first and the second fixing portions. The inspecting portion has an inspecting and verifying arrangement along a pathway of the hose body of the curved resin hose as designed. The inspecting and verifying arrangement has verifying members disposed outside the pathway and spaced from the pathway.Type: GrantFiled: December 28, 2007Date of Patent: March 16, 2010Assignee: Tokai Rubber Industries, Ltd.Inventor: Kazuhiro Kato
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Publication number: 20100018298Abstract: A surface texture measuring instrument includes: a measuring device that includes a detector for detecting surface texture of a workpiece and an X-axis movement mechanism for moving the detector in a measurement direction; an elevation inclination adjuster capable of adjusting an elevation position and an inclination angle of a table on which the measuring device is mounted; a stage on which the workpiece is mounted; and a controller that controls the measuring device and the elevation inclination adjuster. The controller includes: a measurement controller that controls the X-axis movement mechanism to conduct a preliminary measurement and main measurement of the workpiece; a computing unit that acquires a result of the preliminary measurement from the detector and obtains an inclination angle of the workpiece at which the workpiece is inclined to the measurement direction; and a positioning controller for adjusting the inclination angle of the table based on the obtained inclination angle.Type: ApplicationFiled: July 28, 2009Publication date: January 28, 2010Applicant: MITUTOYO CORPORATIONInventors: Toshihiro Kanematsu, Hideki Mishima, Nobuyuki Hama
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Patent number: 7562464Abstract: A device for measuring a vane surface contour of a propeller includes a shaft extending through a hub of the propeller and rotatable about a vertical axis. A measuring rod is movable in a direction parallel to the vertical axis to abut a measuring end thereof against a surface of one of a plurality of vanes on the hub. The measuring end moves in the direction parallel to the vertical axis in response to a surface contour of the surface when the shaft rotates. The measuring rod is movable in a radial direction perpendicular to the vertical axis such that the measuring end of the measuring rod is movable between an innermost radial position and an outermost radial position of the surface. The measuring end is pivotable relative to the vertical axis about a movable portion thereof to adjust an angle between the measuring rod and the vertical axis.Type: GrantFiled: December 14, 2007Date of Patent: July 21, 2009Inventor: Fu-Kue Chang
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Publication number: 20090151182Abstract: A measuring device, includes a guiding rail, a sliding unit levitatedly slidably engaged with the guiding rail, and a measuring unit fixed to the sliding unit and comprising at least one clock gauge mounted thereto.Type: ApplicationFiled: February 24, 2008Publication date: June 18, 2009Applicants: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.Inventors: Chih-Kuang Chang, Sen Zhang, Jin-Kui Zeng
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Patent number: 7540096Abstract: A spherometer for measuring at least one physical parameter of the workpiece includes at least on fluid-actuated linearly extensible probe member having an output indicative of an amount of linear travel and a chamber housing the linearly extensible probe member. The chamber has an aperture for supporting a workpiece and a vacuum line is coupled to the chamber for creating a vacuum. The probe member is activated as a result of the vacuum in the chamber, causing it to extend linearly toward the workpiece until touching it. The linear extension of the probe may be used as a measurement of distance. The distance measured to a workpiece may be compared to a standard to determine a physical parameter of the workpiece.Type: GrantFiled: September 20, 2007Date of Patent: June 2, 2009Assignee: Hardin Optical Co.Inventor: Larry C. Hardin
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Patent number: 7513027Abstract: A process for machining a blank from all directions with a machine tool, such as a milling machine, involves the machining from all directions being based on a three-dimensional template. In a first step, the three-dimensional form and, if need be, also the surface finish of the three-dimensional template may be automatically measured, and the associated data may be saved. In a second step, a blank may be held by at least one clamping adapter and a first region is brought into its final, ready to use partial form by the machine tool or the milling machine using said data for numerical control. In a third step, the partially machined blank may be held by at least one clamping adapter in the first, finally machined region and the remaining region may be brought into its final, ready to use overall form by the same machine tool or milling machine.Type: GrantFiled: July 29, 2005Date of Patent: April 7, 2009Assignee: ALSTOM Technology LtdInventors: Hans Volker Boehm, Volker Dietmar Harr, Josef Scherer
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Patent number: 7503125Abstract: A measuring method and system involving a measuring coordinate probe, which can be moved precisely, by appropriate actuators, with respect to a positioning platform (60) on which the probe is mounted; and whose position relative capable to said positioning platform (60) can be measured, by suitable encoders (780). The invention can be carried out with probes, actuators and encoders of different nature. The actuators (730) preferably allow the motion of the probe according to two or more independent degrees of freedom, so that the probe itself can be moved in a plane, or in a three-dimensional region of space, and its orientation can be chosen, within some suitable limits. The method and system of the invention provide very exact local measurement, even if the platform (60) does not deliver the very best precision.Type: GrantFiled: April 29, 2008Date of Patent: March 17, 2009Assignee: Hexagon Metrology ABInventors: Pascal Jordil, Bo Pettersson
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Patent number: 7472490Abstract: A linked transport mechanism and method that uses a single source of motive force to synchronously position multiple displaceable sensors of a shape-measuring assembly onto a roll received in a roll grinding machine. At least two sensors (28, 29) are mounted on linear slides on at least one measuring arm (1). The complete shape-measuring assembly includes at least three sensors (27, 28, 29) or measuring points to allow the calculation of the cross-sectional shape of the roll and the extraneous error movement of the roll. At least one measuring arm is connected to a linear guide (4) of the frame (3). The linear motor is connected between the frame and the measuring arms. The linked transport mechanism assures the synchronous accurate positioning of the sensors, each at a fixed angle through the roll center, over the entire range of roll diameters that the grinding machine may receive.Type: GrantFiled: March 2, 2006Date of Patent: January 6, 2009Assignee: HCC/KPM LLCInventors: Samuel C. Kube, Albert A. Plekker
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Patent number: 7461462Abstract: A device is provided for measuring roundness of a mechanical object even if the mechanical object performs an orbit movement. The orbital movement and the surface roundness are separated. It is even possible to divide the orbital movement into an x component and a y component. The measurement is accomplished in a single measurement. After measuring it is possible to decide what to indicate: the orbit of the mechanical object, the deviation from a nominally round surface, or the combination of both. This is possible since once the data has been obtained it is then possible to use the data once or a number of times to indicate the orbit of the mechanical object, the deviation from a nominally round surface, or the combination of both.Type: GrantFiled: February 28, 2006Date of Patent: December 9, 2008Assignee: Aktiebolaget SKFInventors: Jan-Olof Bankestrom, Goran Gabrielsson, Anders Gothberg
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Patent number: 7436523Abstract: An eyeglass frame measurement apparatus includes a holding unit; a rotational base and a tracing stylus arranged on the rotational base. Three-dimensional shape of a frame is measured by detecting the movement of the tracing stylus in a radius direction and a warpage direction. Slit place is integrally arranged with the stylus and a light-projection-and-receiving unit that includes a light-emitting portion and a two-dimensional sensor capable of selecting a received pixel is arranged on the base. The two-dimensional sensor includes first and second light-receiving lines not parallel to each other, and includes a first slit not parallel to the first light-receiving line and a second slit not parallel to the second light-receiving line. The movement of the stylus is detected based on a projection position of the first and second slits detected by the first and second light-receiving lines.Type: GrantFiled: March 7, 2007Date of Patent: October 14, 2008Assignee: Nidek Co., Ltd.Inventors: Motoshi Tanaka, Yoshinori Matsuyama
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Publication number: 20080216336Abstract: In-process non-contact measurement systems and methods for automated lapping systems are disclosed. In an embodiment, a moveable frame can be controllably positioned proximate to a lapped work product. A control component can provide first control signals to control a movement of the moveable frame relative to the lapped work product. A non-contact measuring device can be coupled to the moveable frame measures a surface of the lapped work product and can transmit measurement data of the surface of the lapped work product to the control component. The control component can further provide second control signals to control a movement of the non-contact measuring device relative to the moveable frame.Type: ApplicationFiled: March 6, 2007Publication date: September 11, 2008Applicant: The Boeing CompanyInventors: Jeffrey H. Wood, Thomas R. Berkel, Robert E. Bender
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Publication number: 20080201974Abstract: A shape inspection device is adapted for a curved resin hose having a hose body including a bent portion. The shape inspection device has a first fixing portion for fixing one longitudinal end portion of the curved resin hose, a second fixing portion for fixing the other longitudinal end portion of the curved resin hose, and an inspecting portion between the first and the second fixing portions. The inspecting portion has an inspecting and verifying arrangement along a pathway of the hose body of the curved resin hose as designed. The inspecting and verifying arrangement has verifying members disposed outside the pathway and spaced from the pathway.Type: ApplicationFiled: December 28, 2007Publication date: August 28, 2008Applicant: Tokai Rubber Industries, ltd.Inventor: Kazuhiro Kato
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Publication number: 20080184579Abstract: On a machine tool, a program receives data from a scanning or analogue probe, measuring a feature of a workpiece. This data is combined with assumed machine position data during the scanning movement. This avoids having to break into the servo feedback loop to get actual measured machine position data. The assumed machine position data can be derived from a part program which controls the scanning movement. Several ways are described for compensating for errors between the assumed machine position values and the actual values.Type: ApplicationFiled: March 31, 2008Publication date: August 7, 2008Applicant: Renishaw plcInventor: Geoffrey McFarland
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Patent number: 7392692Abstract: A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the surface condition of a workpiece are provided. The surface scan measuring device includes a radius of curvature computing section (543) for computing the radius of curvature of the scanning point from the measurement data acquired during the ongoing scanning operation, a moving speed deciding section (544) for deciding the moving speed of the scanning probe according to the computed radius of curvature and a sampling pitch deciding section (546) for deciding the sampling pitch according to the computed radius of curvature.Type: GrantFiled: May 26, 2005Date of Patent: July 1, 2008Assignee: Mitutoyo CorporationInventor: Takashi Noda
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Patent number: 7386408Abstract: A parallel kinematic machine has a parallel kinematic mechanism including an end effecter and a parallel link mechanism. A numerical control device controls a position and orientation of the end effecter based on kinematics of the parallel kinematic mechanism. A posture setter sets an adjustment tool on the end effecter in a known posture in a reference coordinate system defined outside the parallel kinematic mechanism based on a measurement method. A data acquirer acquires data in accordance with a measurement method selecting code for designating the measurement method used by the posture setter in setting the adjustment tool in the known posture, and defines a correlation between kinematic parameters for the parallel kinematic mechanism and the reference coordinate system. A calculator calculates the kinematic parameters based on the acquired data by using a relational expression describing forward kinematics of the parallel kinematic mechanism.Type: GrantFiled: September 25, 2006Date of Patent: June 10, 2008Inventors: Nobutaka Nishibashi, Kazuaki Yagi
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Patent number: 7377047Abstract: The present invention provides a machine tool with a workpiece measuring instrument which prevents the workpiece measuring instrument from being affected by chips or cutting heat during non-machining, while enabling a workpiece W to be measured near a machining position. A machine tool has a bed 9 and a cover 3 surrounding a machining area R. Workpiece supporting means 6, machining means 7, and workpiece measuring instrument 31 are provided in the machining area R. Position switching means 32 is provided which moves the workpiece measuring instrument 31 between a position inside the machining area R and a storage position B outside the machining area R. The workpiece supporting means 6 is movable in a lateral direction. The workpiece measuring instrument 31 is movable forward and backward so as to freely switch its position, and measures the workpiece W.Type: GrantFiled: October 17, 2006Date of Patent: May 27, 2008Assignee: Murata Kikai Kabushiki KaishaInventor: Hiroshi Kawai
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Patent number: 7376261Abstract: A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table (53) and a profile analysis unit (54). The compensation table stores, as compensation data, compensation coefficients to correct counter values of a probe counter (415), and compensation radiuses “r” to the workpiece surface concerning central coordinate values of a contact portion, for respective contact directions. The profile analysis unit has a contact direction calculation unit (542), a compensation data selection unit (543), a compensation calculation unit (544). The contact direction calculation unit calculates the contact direction along which the scanning probe comes into contact with a workpiece W, and the compensation data selection unit selects compensation data set up in the compensation table based on thus calculated contact direction.Type: GrantFiled: November 22, 2004Date of Patent: May 20, 2008Assignee: Mitutoyo CorporationInventors: Takashi Noda, Katsuyuki Ogura
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Patent number: 7357814Abstract: A sizing apparatus and a method for ascertaining a size for a cardiac prosthesis are disclosed. Specifically, the sizing is implemented by positioning a contact member at a patient's heart valve for engagement by one or more viable leaflets of the patient's valve. The size is determined based on the engagement between the contact member and the leaflet (or leaflets) of the patient's valve.Type: GrantFiled: May 18, 2005Date of Patent: April 15, 2008Inventor: Shlomo Gabbay
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Patent number: 7353616Abstract: A shape measuring instrument is provided as being capable of measuring a surface shape of a target with a small contact force while changing the contact force. A measuring probe 32 is supported while a tilt ? is provided. A retracting force of the measuring force 32 is produced by the tilt ?, and thus, is obtained as mgsig ? which is much small as compared with a self weight “m”. On the other hand, biasing is provided with an extruding force Fc by means of an air cylinder 40. Thus, a contact force of the measuring probe 32 relevant to a work piece W is obtained as a difference between a measuring probe self weight tilt component mgsig? and the extruding force Fc of the air cylinder 40 (F=Fc?mgsig?), thus making it possible to reduce a contact force to be very small.Type: GrantFiled: May 25, 2006Date of Patent: April 8, 2008Assignee: JTEKT CorporationInventors: Takashi Matsumoto, Yasuo Niino, Toshiyuki Okita, Yoshiji Yamamoto
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Patent number: 7346999Abstract: Methods and apparatus for inspecting a component are provided. The method includes receiving a plurality of data points that define a shape of the component, fitting the received data points to a curve that defines a predetermined model shape, and comparing the received data points to the curve defining the predetermined model shape to determine a break radius of the component.Type: GrantFiled: January 18, 2005Date of Patent: March 25, 2008Assignee: General Electric CompanyInventors: Douglas Edward Ingram, Francis Howard Little, Melvin Howard Wilkins
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Patent number: 7346997Abstract: This invention provides a validating device for validating at least one dimension of a part as being at least a minimum magnitude. It may also validate a dimension of a part as being no greater than a maximum magnitude or between a minimum magnitude and maximum magnitude. The validating device includes a frame having a cavity and employs a plunger and a sensor. One portion of the plunger engages the part and another portion activates the sensor. When the sensor activates, it indicates that the dimension of the part is at least the minimum magnitude. The cavity for receiving the part may be sized to correspond with maximum magnitudes for the same dimension and/or other dimensions for the part such that the part cannot fit in the cavity if a dimension exceeds its maximum magnitude and therefore the sensor cannot be activated and the part cannot be validated.Type: GrantFiled: April 10, 2006Date of Patent: March 25, 2008Inventor: Olaf Rest
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Patent number: 7345773Abstract: In a flatness measurement apparatus, a sensor unit having a flatness-detection sensor is slidable along the linear guide rail. A support system supports the linear guide rail such that the linear guide rail is rotatable in a horizontal plane, whereby a surface of a wafer stage to be measured is scanned all over with the sensor unit having the flatness-detection sensor so as to ensure a flatness measurement of the whole surface of the wafer stage.Type: GrantFiled: October 12, 2005Date of Patent: March 18, 2008Assignee: NEC Electronics CorporationInventor: Katsuhiro Yano
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Patent number: 7340843Abstract: An exemplary verticality examining apparatus (1) includes three first sensors, two second sensors, and a plurality of sensor-indicators. Outmost extremities of the first sensors cooperatively define an imaginary single plane, and are configured for physically contacting a first side of an object to be examined. The second sensors are configured for simultaneously physically contacting a second side of the object when the first side of the object contacts the first sensors if the object has verticality as between the first side and the second side thereof. The sensor-indicators are electrically connected to the first and second sensors and are configured for indicating states of the first and second sensors with respect to any physical contact with the object.Type: GrantFiled: March 26, 2007Date of Patent: March 11, 2008Assignees: Innocom Technology (Shenzhen) Co., Ltd., Innolux Display Corp.Inventors: Bing-Jun Zhang, Yu-Ping Wu
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Patent number: 7328518Abstract: The present invention provides a surface roughness/contour shape measuring apparatus that can move a probe relative to a workpiece within an orthogonal X-Y plane while employing a relatively inexpensive construction. In the surface roughness/contour shape measuring apparatus (1), the probe (6, 7) and a driving unit (4) for driving the probe (6, 7) in one predesignated direction are connected together by a connecting member (8) capable of moving the probe (6, 7) in one predesignated direction relative to the driving unit (4).Type: GrantFiled: September 15, 2005Date of Patent: February 12, 2008Assignee: Tokyo Seimitsu Co., Ltd.Inventors: Nobuyuki Taniuchi, Kazuhiro Kubota
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Patent number: 7290348Abstract: The invention provides a circularity and cylindrical shape measuring device that can decrease the measurement errors generated due to the weight of a measured workpiece.Type: GrantFiled: September 15, 2005Date of Patent: November 6, 2007Assignee: Tokyo Seimitsu Co., LtdInventor: Shozo Katamachi
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Patent number: 7266900Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching the mechanical piece to be checked, a fulcrum for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. Various components of the head can be adjusted and/or replaced from the exterior of the casing. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.Type: GrantFiled: February 17, 2006Date of Patent: September 11, 2007Assignee: Marposs Societa' Per AzioniInventors: Carlo Dall'Aglio, Luciano Ventura
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Patent number: 7262593Abstract: A device for monitoring the tolerances of a workpiece has a measuring probe with two separate inductive coils arranged in a housing. A non-magnetizable sensing stylus designed to rest on a workpiece surface to be measured is arranged in the coils and has a deflector body that is a sleeve. The stylus and the deflector body are loaded into a measuring position. The housing has two essentially identical housing halves each having a plane surface with which the housing halves are connected to one another. The housing halves each have a recess and one of the inductive coils is inserted into one of the recesses, respectively. The opposed ends of the housing halves are provided with aligned bores that open into the recesses, respectively. The stylus is arranged coaxially in the inductive coils and has opposed stylus ends projecting through the bores outwardly from the two housing halves.Type: GrantFiled: February 8, 2006Date of Patent: August 28, 2007Inventor: Horst Knäbel
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Patent number: 7254462Abstract: A system for measuring a figure of a workpiece includes an application server (2). The application server includes a hardware detecting module (200) for detecting hardware after system activation and for determining whether any error occurs in the hardware. An error prompting module (200) is provided for generating a dialog box to prompt a user to maintain the system. A measuring module (202) is provided for measuring the figure of the workpiece, and for comparing measuring results. A measuring result output module (203) is provided for outputting measuring results in text form. A related method is also provided.Type: GrantFiled: December 2, 2005Date of Patent: August 7, 2007Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Chih-Kuang Chang, Li Jiang, Hua-Wei Yang, Xiao-Chao Sun
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Patent number: 7243437Abstract: An electronic device includes a housing and a catheter having a proximal end seated within the housing and a distal end positioned to an exterior thereof. The catheter distal end has an arcuate shape, assisting the user to scan an internal plug cavity, and a cylindrical cross-section provided with a suitable diameter such that the catheter can be probed through a lock plug without contacting pin pairs. A mechanism is included for detecting a point where the pins come together and line up with a shear line. LEDs are coupled to the detecting mechanism and are illuminated when the catheter is displaced along the lower and upper pin pairs. A mechanism is included for automatically adjusting the catheter's position as the point of each of pin pair is detected. A mechanism is included for displaying numeric values on the housing that correspond to the points identified by the detecting mechanism.Type: GrantFiled: March 13, 2006Date of Patent: July 17, 2007Inventor: Armando Estrada
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Patent number: 7243439Abstract: A touch sensor using a Hall IC is provided. To this end, in a cantilever mechanism 15 of a parallel link by two plate springs 16, a coupling member 18 on the fixed side is fixed to a supporting block 24 which penetrates through the center of a plate spring 16 on a lower side and uprightly provided on a pedestal 22. A movable portion 28 on the free end side is a lightweight coupling member 19 provided by bend-processing an aluminum thin plate, to which a rare-earth magnet 25 is adhered. An elastic part 20a of a Hall IC supporting member 20 is fixed to the coupling member 18 on the fixed side, and a rigid part 20b with a rib 17a is supported by an adjusting rod 36 to fine-adjust relative position of a Hall IC 26 provided on the free end with respect to the magnet 25.Type: GrantFiled: November 14, 2003Date of Patent: July 17, 2007Assignee: ASA Electronics Industry Co., Ltd.Inventor: Yukihiro Asa
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Patent number: 7243438Abstract: The invention relates to a template for checking the geometry of shaped and/or bent profiles (T) having rectilinear sections and bent sections. This template comprises a support plate (2), in which holes (8-10) are provided, and a superstructure comprised of, for each rectilinear section of the profile, a bracket (12) and at least one reinforcement (24) consisting of planar plates provided with lugs (16, 17, 29, 30) adapted for being inserted into the holes (8-10) of the support plate (2) and of assembling means (20, 30) that permit said bracket and reinforcement to be fit together in a position in which they extend perpendicularly. In addition, each bracket (12) is provided with at least one guiding element (45, 46) of the rectilinear section of the profile (T).Type: GrantFiled: September 3, 2004Date of Patent: July 17, 2007Assignee: JaubJaub ConsultingInventor: Philippe Jaubert
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Patent number: 7207119Abstract: The present invention relates to a controller comprising: at least two input terminals, each of which is configured to receive one of at least two input signals comprising information on a positioning of a scanner relative to a reference medium, and an output terminal, which is connectable to the scanner and configured to transmit an output signal, which is used for controlling the positioning of the scanner, wherein the controller further comprises: a processing unit being operable to designate a corresponding weighting function to each of the at least two input signals, a magnitude of the corresponding weighting function being selected to be in accordance with a noise profile of the input signal to which it has been designated; the processing unit further being operable to simultaneously use the at least two input signals, each with the corresponding weighting function designated thereto, to design a transfer function of the controller for use in the production of the output signal.Type: GrantFiled: December 8, 2005Date of Patent: April 24, 2007Assignee: International Business Machines CorporationInventors: Evangelos S. Eleftheriou, Angeliki Pantazi, Charalampos Pozidis, Abu Sebastian
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Patent number: 7197836Abstract: Positions of a plurality of reference points arranged on a reference plate (200) having a larger area than a measurement area of a measuring machine (300) are obtained as coordinate points on a standardized reference coordinate system. First, the plurality of reference points are grouped according to the measurement area of the measuring machine (300). At this time, the reference points are grouped so that one of the groups shares a predetermined number or more of the reference points with the other one of the groups (a grouping step). The reference points are measured for each of the groups (a measuring step).Type: GrantFiled: August 9, 2005Date of Patent: April 3, 2007Assignee: Mitutoyo CorporationInventor: Naoya Kikuti
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Patent number: 7191540Abstract: A work piece holder includes a base plate, a slide plate, a rotary indexing device, a support assembly, a spindle, and a pallet receiver. The slide plate is manually slidable over the base plate between a plurality of predetermined positions. The rotary indexing device is affixed to the slide plate, and has the support assembly secured thereto and rotated thereby into a desired angular orientation about a first axis of rotation. The spindle is secured to the support assembly, and defines a second axis of rotation that is generally perpendicular to the first axis of rotation. The spindle is manually rotatable about the second axis of rotation between a plurality of predetermined rotary positions. The pallet receiver, which is secured to the spindle and is rotatable therewith about the first and second axes, is adapted to releasably receive a pallet to which a work piece is mounted.Type: GrantFiled: October 31, 2005Date of Patent: March 20, 2007Assignee: Mitutoyo CorporationInventors: Robert J. Brewer, James A. Christian
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Patent number: 7140119Abstract: Rotational motions between a displacement-measuring probe and an optical test surface define a spherical or near spherical datum surface against which measurements of the probe are taken. The probe has a measurement axis that is maintained substantially normal to the optical test surface during the course of measurement.Type: GrantFiled: April 23, 2004Date of Patent: November 28, 2006Assignee: Corning IncorporatedInventors: Vivek G. Badami, John H. Bruning
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Patent number: 7121013Abstract: A length measuring probe that includes a base body, a guide element and a probe pin having a touch scanning element for touch scanning a measuring object, the probe pin is seated, displaceable in relation to the base body in a measuring direction opposite a spring force F via the guide element. A detection device detects a position of the probe pin with respect to the base body and a first spring element and a second spring element arranged behind the first spring element in the measuring direction so as to prestress the probe pin. The guide element is arranged between the first and second spring elements, on which facing end areas of the first and second spring elements are fixed in place, and wherein the at least one guide element is seated, displaceable in the measuring direction, on the probe pin and on the base body.Type: GrantFiled: March 28, 2002Date of Patent: October 17, 2006Assignee: Dr. Johannes Heidenhain GmbHInventors: Peter Herkt, Ludwig Böge
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Patent number: 7107696Abstract: A freestanding micrometer and method for determining the diameter of a cylindrical body, including measuring variations in diameter along a longitudinal length thereof, such as a roll used in the production of metal and paper sheet products. The micrometer comprises a housing supported on a circumferential surface of the cylindrical body. A first sensing element is movably supported by the housing and adapted for sensing a first surface point of the cylindrical body laterally spaced apart from the housing and disposed in a cross-sectional plane of the cylindrical body. A second sensing element is mounted to the housing for contact with a second surface point of the cylindrical body disposed in the cross-sectional plane of the cylindrical body. The first and second surface points locate, respectively, a terminal and midpoint of a chord lying in the cross-section plane of the cylindrical body, from which the diameter of the cylindrical body is determined.Type: GrantFiled: October 18, 2004Date of Patent: September 19, 2006Assignee: Harford Industries, Inc.Inventor: William E. Melander
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Patent number: 7107695Abstract: A hand-operated feeler includes a rod on a crossed movement table mounted on a support fitted with an immobilization device at a fixed reference as compared to the part to be measured and a processing unit configured to store and process the results. Such a device results in rapidly measuring the contours of parts including deep and sunken honeycomb cells.Type: GrantFiled: March 25, 2004Date of Patent: September 19, 2006Assignee: Snecma MoteursInventors: Bernard Paillarse, Pierre Jamault, Dominique Thibault
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Patent number: 7100429Abstract: A surface profile measuring instrument for measuring a surface profile of a workpiece has: a probe having a stylus provided with a measuring portion for measuring a surface of a workpiece at a tip end thereof and a detector for outputting a detection signal which varies depending on a measurement condition between the surface of the workpiece and the measuring portion; a scanning mechanism for relatively moving the measuring portion along the surface of the workpiece; a memory (46) that stores a position information of the contact portion when the detection signal reaches a predetermined reference signal value; a vibration inclination angle calculator (51) that calculates a response variation factor (vibration inclination angle ?) that applies variation to the detection signal from the surface of the workpiece; and a profile processor (53) that corrects the position information to obtain an actual profile of the surface of the workpiece using the response variation factor.Type: GrantFiled: July 8, 2003Date of Patent: September 5, 2006Assignee: Mitutoyo CorporationInventors: Kaoru Matsuki, Kazuhiko Hidaka
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Patent number: 7076882Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching the mechanical piece to be checked, a fulcrum for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. Various components of the head can be adjusted and/or replaced from the exterior of the casing. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.Type: GrantFiled: June 15, 2005Date of Patent: July 18, 2006Assignee: Marposs Societa' per AzioniInventors: Carlo Dall'Aglio, Luciano Ventura
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Patent number: 7047657Abstract: An apparatus for recording the contour of a surface of a body is provided in accordance with the present invention. The apparatus comprises a carrier on which at least one distance measuring element is disposed. The at least one distance measuring element is capable of determining a distance between the carrier and a location on the surface of the body. A navigation system with marking elements is provided. The marking elements are fixable on the carrier and on the body, such that positional data regarding the position of the body and the carrier can be determined by the navigation system. A data-processing device device is also provided, which is adapted to calculate the contour of the surface from the positional data of the body and of the carrier and the distance measurements of the at least one distance measuring element.Type: GrantFiled: March 3, 2005Date of Patent: May 23, 2006Assignee: Aesculap AG & Co. KGInventors: Andreas Goeggelmann, Josef Kozak
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Patent number: RE41057Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.Type: GrantFiled: April 5, 2006Date of Patent: December 29, 2009Assignee: Insitutec, Inc.Inventors: Stuart T. Smith, Marcin B. Bauza, Pavan Jain, Shane C. Woody