Profile Patents (Class 33/551)
  • Patent number: 7784333
    Abstract: An approach controller (234) of a coordinate measuring instrument enables a position control loop (RP) and drives an actuator (133) so that a force sensor (1) is brought to a close position under a position control. When recognizing that the force sensor (1) reaches the close position, a contact controller (235) controls a switch (227) to enable a force control loop (RF) and drives the actuator (133) to bring the force sensor (1) into contact with a workpiece under a force control.
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: August 31, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Kentaro Nemoto, Takeshi Yamamoto
  • Patent number: 7779551
    Abstract: A testing apparatus for testing perpendicularity of an end surface of a workpiece is disclosed. The testing apparatus includes an electrically conductive first reference piece defining two guide holes, and two testing units. The testing units are slidably engaged in the guide holes, so as to form two testing circuits. At a normal state, each testing circuit is closed, and each testing unit extends out of the guide hole for a distance, wherein the distance corresponds to an allowable perpendicularity tolerance. Each testing unit can be pushed to retract back to the guide holes by the end of the workpiece to cause the testing circuit to be opened. The opened state or closed state of each of the testing circuits will help show the status of the perpendicularity of the end surface of the workpiece.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: August 24, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventor: Bing-Jun Zhang
  • Patent number: 7774952
    Abstract: A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: August 17, 2010
    Assignee: A-Metrics, LLC
    Inventors: Bonifatijs Lubgins, Leonids Bekers
  • Patent number: 7769560
    Abstract: In profiling control of a contact type probe in which a contact point is moved along a surface of an object to be measured, while being in contact with the object by a constant measurement force F, a contact determination level is provided for detecting a predetermined force smaller than a target measurement force is applied to the contact point, contact determination is performed at the time when force applied to the contact point reaches the contact determination level during approach, and the contact point is shifted from position control to force control for bringing the contact point into contact with the object by the target measurement force. Thereby contact trace is prevented from occurring on the object to be measured without reducing approach speed as much as possible and lowering measurement efficiency.
    Type: Grant
    Filed: January 30, 2008
    Date of Patent: August 3, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Shiro Igasaki, Masaoki Yamagata
  • Patent number: 7748134
    Abstract: A measuring device includes a base, a holding member mounted to the base and having a notch for holding a cylinder, a guide rod connected to the base and defining an axial direction parallel to an axial direction of the cylinder, and a gauge mounted with the guide rod and defining a measuring direction perpendicular to the axial direction of the cylinder. As a result, the measuring device of the present invention has the advantage of proving a simple way to measure the roundness of the cylinder.
    Type: Grant
    Filed: March 9, 2009
    Date of Patent: July 6, 2010
    Inventor: Yao-Chung Wang
  • Patent number: 7743525
    Abstract: An exemplary apparatus for testing planeness of a workpiece is provided. The apparatus includes a platform for supporting the workpiece thereon, a bracket vertically mounted to the platform, and a testing system mounted to the bracket for testing the workpiece. The testing system includes a testing member, a test dial indicator having a sliding pole, and a fine-tuning member for controlling the movement of the testing member. One end of the testing member is connected to the sliding pole. When testing, the fine-tuning member drives the testing member to move toward the workpiece, until the testing member contacts the workpiece. The sliding pole extends together with the testing member. A value is shown by the test dial indicator that indicates the moving distance of the testing member. A distortion value of the workpiece can be obtained according to the value.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: June 29, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Bing-Jun Zhang, Lian-Zhong Gong
  • Publication number: 20100139107
    Abstract: A method of measuring a three-dimensional shape of a connection assembly of a stator coil in a turbine generator, includes first measuring a three-dimensional shape of a measurement area of the connection assembly of the stator coil in a measurement range set in advance by a laser non-contact three-dimensional shape measurement device, second measuring a three-dimensional shape of a measurement area of the connection assembly of the stator coil in a measurement range set in advance by a multi-joint contact three-dimensional shape measurement device, the multi-joint contact three-dimensional shape measurement device including a plurality of arms being coupled via a joint including a built-in encoder, and integrally synthesizing the three-dimensional shape data measured in the first measurement, the three-dimensional shape data measured in the second measurement, and shape measurement data of a local area measured manually, thereby drafting a plan of the stator connection assembly.
    Type: Application
    Filed: December 7, 2009
    Publication date: June 10, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Hiroaki Koinuma, Kazuyuki Sasaki, Yuichiro Gunji
  • Patent number: 7726035
    Abstract: A measuring device, includes a guiding rail, a sliding unit levitatedly slidably engaged with the guiding rail, and a measuring unit fixed to the sliding unit and comprising at least one dial gauge mounted thereto.
    Type: Grant
    Filed: February 24, 2008
    Date of Patent: June 1, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Sen Zhang, Jin-Kui Zeng
  • Patent number: 7676944
    Abstract: A shape inspection device is adapted for a curved resin hose having a hose body including a bent portion. The shape inspection device has a first fixing portion for fixing one longitudinal end portion of the curved resin hose, a second fixing portion for fixing the other longitudinal end portion of the curved resin hose, and an inspecting portion between the first and the second fixing portions. The inspecting portion has an inspecting and verifying arrangement along a pathway of the hose body of the curved resin hose as designed. The inspecting and verifying arrangement has verifying members disposed outside the pathway and spaced from the pathway.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: March 16, 2010
    Assignee: Tokai Rubber Industries, Ltd.
    Inventor: Kazuhiro Kato
  • Publication number: 20100018298
    Abstract: A surface texture measuring instrument includes: a measuring device that includes a detector for detecting surface texture of a workpiece and an X-axis movement mechanism for moving the detector in a measurement direction; an elevation inclination adjuster capable of adjusting an elevation position and an inclination angle of a table on which the measuring device is mounted; a stage on which the workpiece is mounted; and a controller that controls the measuring device and the elevation inclination adjuster. The controller includes: a measurement controller that controls the X-axis movement mechanism to conduct a preliminary measurement and main measurement of the workpiece; a computing unit that acquires a result of the preliminary measurement from the detector and obtains an inclination angle of the workpiece at which the workpiece is inclined to the measurement direction; and a positioning controller for adjusting the inclination angle of the table based on the obtained inclination angle.
    Type: Application
    Filed: July 28, 2009
    Publication date: January 28, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Toshihiro Kanematsu, Hideki Mishima, Nobuyuki Hama
  • Patent number: 7562464
    Abstract: A device for measuring a vane surface contour of a propeller includes a shaft extending through a hub of the propeller and rotatable about a vertical axis. A measuring rod is movable in a direction parallel to the vertical axis to abut a measuring end thereof against a surface of one of a plurality of vanes on the hub. The measuring end moves in the direction parallel to the vertical axis in response to a surface contour of the surface when the shaft rotates. The measuring rod is movable in a radial direction perpendicular to the vertical axis such that the measuring end of the measuring rod is movable between an innermost radial position and an outermost radial position of the surface. The measuring end is pivotable relative to the vertical axis about a movable portion thereof to adjust an angle between the measuring rod and the vertical axis.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: July 21, 2009
    Inventor: Fu-Kue Chang
  • Publication number: 20090151182
    Abstract: A measuring device, includes a guiding rail, a sliding unit levitatedly slidably engaged with the guiding rail, and a measuring unit fixed to the sliding unit and comprising at least one clock gauge mounted thereto.
    Type: Application
    Filed: February 24, 2008
    Publication date: June 18, 2009
    Applicants: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Chih-Kuang Chang, Sen Zhang, Jin-Kui Zeng
  • Patent number: 7540096
    Abstract: A spherometer for measuring at least one physical parameter of the workpiece includes at least on fluid-actuated linearly extensible probe member having an output indicative of an amount of linear travel and a chamber housing the linearly extensible probe member. The chamber has an aperture for supporting a workpiece and a vacuum line is coupled to the chamber for creating a vacuum. The probe member is activated as a result of the vacuum in the chamber, causing it to extend linearly toward the workpiece until touching it. The linear extension of the probe may be used as a measurement of distance. The distance measured to a workpiece may be compared to a standard to determine a physical parameter of the workpiece.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: June 2, 2009
    Assignee: Hardin Optical Co.
    Inventor: Larry C. Hardin
  • Patent number: 7513027
    Abstract: A process for machining a blank from all directions with a machine tool, such as a milling machine, involves the machining from all directions being based on a three-dimensional template. In a first step, the three-dimensional form and, if need be, also the surface finish of the three-dimensional template may be automatically measured, and the associated data may be saved. In a second step, a blank may be held by at least one clamping adapter and a first region is brought into its final, ready to use partial form by the machine tool or the milling machine using said data for numerical control. In a third step, the partially machined blank may be held by at least one clamping adapter in the first, finally machined region and the remaining region may be brought into its final, ready to use overall form by the same machine tool or milling machine.
    Type: Grant
    Filed: July 29, 2005
    Date of Patent: April 7, 2009
    Assignee: ALSTOM Technology Ltd
    Inventors: Hans Volker Boehm, Volker Dietmar Harr, Josef Scherer
  • Patent number: 7503125
    Abstract: A measuring method and system involving a measuring coordinate probe, which can be moved precisely, by appropriate actuators, with respect to a positioning platform (60) on which the probe is mounted; and whose position relative capable to said positioning platform (60) can be measured, by suitable encoders (780). The invention can be carried out with probes, actuators and encoders of different nature. The actuators (730) preferably allow the motion of the probe according to two or more independent degrees of freedom, so that the probe itself can be moved in a plane, or in a three-dimensional region of space, and its orientation can be chosen, within some suitable limits. The method and system of the invention provide very exact local measurement, even if the platform (60) does not deliver the very best precision.
    Type: Grant
    Filed: April 29, 2008
    Date of Patent: March 17, 2009
    Assignee: Hexagon Metrology AB
    Inventors: Pascal Jordil, Bo Pettersson
  • Patent number: 7472490
    Abstract: A linked transport mechanism and method that uses a single source of motive force to synchronously position multiple displaceable sensors of a shape-measuring assembly onto a roll received in a roll grinding machine. At least two sensors (28, 29) are mounted on linear slides on at least one measuring arm (1). The complete shape-measuring assembly includes at least three sensors (27, 28, 29) or measuring points to allow the calculation of the cross-sectional shape of the roll and the extraneous error movement of the roll. At least one measuring arm is connected to a linear guide (4) of the frame (3). The linear motor is connected between the frame and the measuring arms. The linked transport mechanism assures the synchronous accurate positioning of the sensors, each at a fixed angle through the roll center, over the entire range of roll diameters that the grinding machine may receive.
    Type: Grant
    Filed: March 2, 2006
    Date of Patent: January 6, 2009
    Assignee: HCC/KPM LLC
    Inventors: Samuel C. Kube, Albert A. Plekker
  • Patent number: 7461462
    Abstract: A device is provided for measuring roundness of a mechanical object even if the mechanical object performs an orbit movement. The orbital movement and the surface roundness are separated. It is even possible to divide the orbital movement into an x component and a y component. The measurement is accomplished in a single measurement. After measuring it is possible to decide what to indicate: the orbit of the mechanical object, the deviation from a nominally round surface, or the combination of both. This is possible since once the data has been obtained it is then possible to use the data once or a number of times to indicate the orbit of the mechanical object, the deviation from a nominally round surface, or the combination of both.
    Type: Grant
    Filed: February 28, 2006
    Date of Patent: December 9, 2008
    Assignee: Aktiebolaget SKF
    Inventors: Jan-Olof Bankestrom, Goran Gabrielsson, Anders Gothberg
  • Patent number: 7436523
    Abstract: An eyeglass frame measurement apparatus includes a holding unit; a rotational base and a tracing stylus arranged on the rotational base. Three-dimensional shape of a frame is measured by detecting the movement of the tracing stylus in a radius direction and a warpage direction. Slit place is integrally arranged with the stylus and a light-projection-and-receiving unit that includes a light-emitting portion and a two-dimensional sensor capable of selecting a received pixel is arranged on the base. The two-dimensional sensor includes first and second light-receiving lines not parallel to each other, and includes a first slit not parallel to the first light-receiving line and a second slit not parallel to the second light-receiving line. The movement of the stylus is detected based on a projection position of the first and second slits detected by the first and second light-receiving lines.
    Type: Grant
    Filed: March 7, 2007
    Date of Patent: October 14, 2008
    Assignee: Nidek Co., Ltd.
    Inventors: Motoshi Tanaka, Yoshinori Matsuyama
  • Publication number: 20080216336
    Abstract: In-process non-contact measurement systems and methods for automated lapping systems are disclosed. In an embodiment, a moveable frame can be controllably positioned proximate to a lapped work product. A control component can provide first control signals to control a movement of the moveable frame relative to the lapped work product. A non-contact measuring device can be coupled to the moveable frame measures a surface of the lapped work product and can transmit measurement data of the surface of the lapped work product to the control component. The control component can further provide second control signals to control a movement of the non-contact measuring device relative to the moveable frame.
    Type: Application
    Filed: March 6, 2007
    Publication date: September 11, 2008
    Applicant: The Boeing Company
    Inventors: Jeffrey H. Wood, Thomas R. Berkel, Robert E. Bender
  • Publication number: 20080201974
    Abstract: A shape inspection device is adapted for a curved resin hose having a hose body including a bent portion. The shape inspection device has a first fixing portion for fixing one longitudinal end portion of the curved resin hose, a second fixing portion for fixing the other longitudinal end portion of the curved resin hose, and an inspecting portion between the first and the second fixing portions. The inspecting portion has an inspecting and verifying arrangement along a pathway of the hose body of the curved resin hose as designed. The inspecting and verifying arrangement has verifying members disposed outside the pathway and spaced from the pathway.
    Type: Application
    Filed: December 28, 2007
    Publication date: August 28, 2008
    Applicant: Tokai Rubber Industries, ltd.
    Inventor: Kazuhiro Kato
  • Publication number: 20080184579
    Abstract: On a machine tool, a program receives data from a scanning or analogue probe, measuring a feature of a workpiece. This data is combined with assumed machine position data during the scanning movement. This avoids having to break into the servo feedback loop to get actual measured machine position data. The assumed machine position data can be derived from a part program which controls the scanning movement. Several ways are described for compensating for errors between the assumed machine position values and the actual values.
    Type: Application
    Filed: March 31, 2008
    Publication date: August 7, 2008
    Applicant: Renishaw plc
    Inventor: Geoffrey McFarland
  • Patent number: 7392692
    Abstract: A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the surface condition of a workpiece are provided. The surface scan measuring device includes a radius of curvature computing section (543) for computing the radius of curvature of the scanning point from the measurement data acquired during the ongoing scanning operation, a moving speed deciding section (544) for deciding the moving speed of the scanning probe according to the computed radius of curvature and a sampling pitch deciding section (546) for deciding the sampling pitch according to the computed radius of curvature.
    Type: Grant
    Filed: May 26, 2005
    Date of Patent: July 1, 2008
    Assignee: Mitutoyo Corporation
    Inventor: Takashi Noda
  • Patent number: 7386408
    Abstract: A parallel kinematic machine has a parallel kinematic mechanism including an end effecter and a parallel link mechanism. A numerical control device controls a position and orientation of the end effecter based on kinematics of the parallel kinematic mechanism. A posture setter sets an adjustment tool on the end effecter in a known posture in a reference coordinate system defined outside the parallel kinematic mechanism based on a measurement method. A data acquirer acquires data in accordance with a measurement method selecting code for designating the measurement method used by the posture setter in setting the adjustment tool in the known posture, and defines a correlation between kinematic parameters for the parallel kinematic mechanism and the reference coordinate system. A calculator calculates the kinematic parameters based on the acquired data by using a relational expression describing forward kinematics of the parallel kinematic mechanism.
    Type: Grant
    Filed: September 25, 2006
    Date of Patent: June 10, 2008
    Inventors: Nobutaka Nishibashi, Kazuaki Yagi
  • Patent number: 7377047
    Abstract: The present invention provides a machine tool with a workpiece measuring instrument which prevents the workpiece measuring instrument from being affected by chips or cutting heat during non-machining, while enabling a workpiece W to be measured near a machining position. A machine tool has a bed 9 and a cover 3 surrounding a machining area R. Workpiece supporting means 6, machining means 7, and workpiece measuring instrument 31 are provided in the machining area R. Position switching means 32 is provided which moves the workpiece measuring instrument 31 between a position inside the machining area R and a storage position B outside the machining area R. The workpiece supporting means 6 is movable in a lateral direction. The workpiece measuring instrument 31 is movable forward and backward so as to freely switch its position, and measures the workpiece W.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: May 27, 2008
    Assignee: Murata Kikai Kabushiki Kaisha
    Inventor: Hiroshi Kawai
  • Patent number: 7376261
    Abstract: A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table (53) and a profile analysis unit (54). The compensation table stores, as compensation data, compensation coefficients to correct counter values of a probe counter (415), and compensation radiuses “r” to the workpiece surface concerning central coordinate values of a contact portion, for respective contact directions. The profile analysis unit has a contact direction calculation unit (542), a compensation data selection unit (543), a compensation calculation unit (544). The contact direction calculation unit calculates the contact direction along which the scanning probe comes into contact with a workpiece W, and the compensation data selection unit selects compensation data set up in the compensation table based on thus calculated contact direction.
    Type: Grant
    Filed: November 22, 2004
    Date of Patent: May 20, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Takashi Noda, Katsuyuki Ogura
  • Patent number: 7357814
    Abstract: A sizing apparatus and a method for ascertaining a size for a cardiac prosthesis are disclosed. Specifically, the sizing is implemented by positioning a contact member at a patient's heart valve for engagement by one or more viable leaflets of the patient's valve. The size is determined based on the engagement between the contact member and the leaflet (or leaflets) of the patient's valve.
    Type: Grant
    Filed: May 18, 2005
    Date of Patent: April 15, 2008
    Inventor: Shlomo Gabbay
  • Patent number: 7353616
    Abstract: A shape measuring instrument is provided as being capable of measuring a surface shape of a target with a small contact force while changing the contact force. A measuring probe 32 is supported while a tilt ? is provided. A retracting force of the measuring force 32 is produced by the tilt ?, and thus, is obtained as mgsig ? which is much small as compared with a self weight “m”. On the other hand, biasing is provided with an extruding force Fc by means of an air cylinder 40. Thus, a contact force of the measuring probe 32 relevant to a work piece W is obtained as a difference between a measuring probe self weight tilt component mgsig? and the extruding force Fc of the air cylinder 40 (F=Fc?mgsig?), thus making it possible to reduce a contact force to be very small.
    Type: Grant
    Filed: May 25, 2006
    Date of Patent: April 8, 2008
    Assignee: JTEKT Corporation
    Inventors: Takashi Matsumoto, Yasuo Niino, Toshiyuki Okita, Yoshiji Yamamoto
  • Patent number: 7346999
    Abstract: Methods and apparatus for inspecting a component are provided. The method includes receiving a plurality of data points that define a shape of the component, fitting the received data points to a curve that defines a predetermined model shape, and comparing the received data points to the curve defining the predetermined model shape to determine a break radius of the component.
    Type: Grant
    Filed: January 18, 2005
    Date of Patent: March 25, 2008
    Assignee: General Electric Company
    Inventors: Douglas Edward Ingram, Francis Howard Little, Melvin Howard Wilkins
  • Patent number: 7346997
    Abstract: This invention provides a validating device for validating at least one dimension of a part as being at least a minimum magnitude. It may also validate a dimension of a part as being no greater than a maximum magnitude or between a minimum magnitude and maximum magnitude. The validating device includes a frame having a cavity and employs a plunger and a sensor. One portion of the plunger engages the part and another portion activates the sensor. When the sensor activates, it indicates that the dimension of the part is at least the minimum magnitude. The cavity for receiving the part may be sized to correspond with maximum magnitudes for the same dimension and/or other dimensions for the part such that the part cannot fit in the cavity if a dimension exceeds its maximum magnitude and therefore the sensor cannot be activated and the part cannot be validated.
    Type: Grant
    Filed: April 10, 2006
    Date of Patent: March 25, 2008
    Inventor: Olaf Rest
  • Patent number: 7345773
    Abstract: In a flatness measurement apparatus, a sensor unit having a flatness-detection sensor is slidable along the linear guide rail. A support system supports the linear guide rail such that the linear guide rail is rotatable in a horizontal plane, whereby a surface of a wafer stage to be measured is scanned all over with the sensor unit having the flatness-detection sensor so as to ensure a flatness measurement of the whole surface of the wafer stage.
    Type: Grant
    Filed: October 12, 2005
    Date of Patent: March 18, 2008
    Assignee: NEC Electronics Corporation
    Inventor: Katsuhiro Yano
  • Patent number: 7340843
    Abstract: An exemplary verticality examining apparatus (1) includes three first sensors, two second sensors, and a plurality of sensor-indicators. Outmost extremities of the first sensors cooperatively define an imaginary single plane, and are configured for physically contacting a first side of an object to be examined. The second sensors are configured for simultaneously physically contacting a second side of the object when the first side of the object contacts the first sensors if the object has verticality as between the first side and the second side thereof. The sensor-indicators are electrically connected to the first and second sensors and are configured for indicating states of the first and second sensors with respect to any physical contact with the object.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: March 11, 2008
    Assignees: Innocom Technology (Shenzhen) Co., Ltd., Innolux Display Corp.
    Inventors: Bing-Jun Zhang, Yu-Ping Wu
  • Patent number: 7328518
    Abstract: The present invention provides a surface roughness/contour shape measuring apparatus that can move a probe relative to a workpiece within an orthogonal X-Y plane while employing a relatively inexpensive construction. In the surface roughness/contour shape measuring apparatus (1), the probe (6, 7) and a driving unit (4) for driving the probe (6, 7) in one predesignated direction are connected together by a connecting member (8) capable of moving the probe (6, 7) in one predesignated direction relative to the driving unit (4).
    Type: Grant
    Filed: September 15, 2005
    Date of Patent: February 12, 2008
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventors: Nobuyuki Taniuchi, Kazuhiro Kubota
  • Patent number: 7290348
    Abstract: The invention provides a circularity and cylindrical shape measuring device that can decrease the measurement errors generated due to the weight of a measured workpiece.
    Type: Grant
    Filed: September 15, 2005
    Date of Patent: November 6, 2007
    Assignee: Tokyo Seimitsu Co., Ltd
    Inventor: Shozo Katamachi
  • Patent number: 7266900
    Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching the mechanical piece to be checked, a fulcrum for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. Various components of the head can be adjusted and/or replaced from the exterior of the casing. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.
    Type: Grant
    Filed: February 17, 2006
    Date of Patent: September 11, 2007
    Assignee: Marposs Societa' Per Azioni
    Inventors: Carlo Dall'Aglio, Luciano Ventura
  • Patent number: 7262593
    Abstract: A device for monitoring the tolerances of a workpiece has a measuring probe with two separate inductive coils arranged in a housing. A non-magnetizable sensing stylus designed to rest on a workpiece surface to be measured is arranged in the coils and has a deflector body that is a sleeve. The stylus and the deflector body are loaded into a measuring position. The housing has two essentially identical housing halves each having a plane surface with which the housing halves are connected to one another. The housing halves each have a recess and one of the inductive coils is inserted into one of the recesses, respectively. The opposed ends of the housing halves are provided with aligned bores that open into the recesses, respectively. The stylus is arranged coaxially in the inductive coils and has opposed stylus ends projecting through the bores outwardly from the two housing halves.
    Type: Grant
    Filed: February 8, 2006
    Date of Patent: August 28, 2007
    Inventor: Horst Knäbel
  • Patent number: 7254462
    Abstract: A system for measuring a figure of a workpiece includes an application server (2). The application server includes a hardware detecting module (200) for detecting hardware after system activation and for determining whether any error occurs in the hardware. An error prompting module (200) is provided for generating a dialog box to prompt a user to maintain the system. A measuring module (202) is provided for measuring the figure of the workpiece, and for comparing measuring results. A measuring result output module (203) is provided for outputting measuring results in text form. A related method is also provided.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: August 7, 2007
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Li Jiang, Hua-Wei Yang, Xiao-Chao Sun
  • Patent number: 7243437
    Abstract: An electronic device includes a housing and a catheter having a proximal end seated within the housing and a distal end positioned to an exterior thereof. The catheter distal end has an arcuate shape, assisting the user to scan an internal plug cavity, and a cylindrical cross-section provided with a suitable diameter such that the catheter can be probed through a lock plug without contacting pin pairs. A mechanism is included for detecting a point where the pins come together and line up with a shear line. LEDs are coupled to the detecting mechanism and are illuminated when the catheter is displaced along the lower and upper pin pairs. A mechanism is included for automatically adjusting the catheter's position as the point of each of pin pair is detected. A mechanism is included for displaying numeric values on the housing that correspond to the points identified by the detecting mechanism.
    Type: Grant
    Filed: March 13, 2006
    Date of Patent: July 17, 2007
    Inventor: Armando Estrada
  • Patent number: 7243439
    Abstract: A touch sensor using a Hall IC is provided. To this end, in a cantilever mechanism 15 of a parallel link by two plate springs 16, a coupling member 18 on the fixed side is fixed to a supporting block 24 which penetrates through the center of a plate spring 16 on a lower side and uprightly provided on a pedestal 22. A movable portion 28 on the free end side is a lightweight coupling member 19 provided by bend-processing an aluminum thin plate, to which a rare-earth magnet 25 is adhered. An elastic part 20a of a Hall IC supporting member 20 is fixed to the coupling member 18 on the fixed side, and a rigid part 20b with a rib 17a is supported by an adjusting rod 36 to fine-adjust relative position of a Hall IC 26 provided on the free end with respect to the magnet 25.
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: July 17, 2007
    Assignee: ASA Electronics Industry Co., Ltd.
    Inventor: Yukihiro Asa
  • Patent number: 7243438
    Abstract: The invention relates to a template for checking the geometry of shaped and/or bent profiles (T) having rectilinear sections and bent sections. This template comprises a support plate (2), in which holes (8-10) are provided, and a superstructure comprised of, for each rectilinear section of the profile, a bracket (12) and at least one reinforcement (24) consisting of planar plates provided with lugs (16, 17, 29, 30) adapted for being inserted into the holes (8-10) of the support plate (2) and of assembling means (20, 30) that permit said bracket and reinforcement to be fit together in a position in which they extend perpendicularly. In addition, each bracket (12) is provided with at least one guiding element (45, 46) of the rectilinear section of the profile (T).
    Type: Grant
    Filed: September 3, 2004
    Date of Patent: July 17, 2007
    Assignee: JaubJaub Consulting
    Inventor: Philippe Jaubert
  • Patent number: 7207119
    Abstract: The present invention relates to a controller comprising: at least two input terminals, each of which is configured to receive one of at least two input signals comprising information on a positioning of a scanner relative to a reference medium, and an output terminal, which is connectable to the scanner and configured to transmit an output signal, which is used for controlling the positioning of the scanner, wherein the controller further comprises: a processing unit being operable to designate a corresponding weighting function to each of the at least two input signals, a magnitude of the corresponding weighting function being selected to be in accordance with a noise profile of the input signal to which it has been designated; the processing unit further being operable to simultaneously use the at least two input signals, each with the corresponding weighting function designated thereto, to design a transfer function of the controller for use in the production of the output signal.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: April 24, 2007
    Assignee: International Business Machines Corporation
    Inventors: Evangelos S. Eleftheriou, Angeliki Pantazi, Charalampos Pozidis, Abu Sebastian
  • Patent number: 7197836
    Abstract: Positions of a plurality of reference points arranged on a reference plate (200) having a larger area than a measurement area of a measuring machine (300) are obtained as coordinate points on a standardized reference coordinate system. First, the plurality of reference points are grouped according to the measurement area of the measuring machine (300). At this time, the reference points are grouped so that one of the groups shares a predetermined number or more of the reference points with the other one of the groups (a grouping step). The reference points are measured for each of the groups (a measuring step).
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: April 3, 2007
    Assignee: Mitutoyo Corporation
    Inventor: Naoya Kikuti
  • Patent number: 7191540
    Abstract: A work piece holder includes a base plate, a slide plate, a rotary indexing device, a support assembly, a spindle, and a pallet receiver. The slide plate is manually slidable over the base plate between a plurality of predetermined positions. The rotary indexing device is affixed to the slide plate, and has the support assembly secured thereto and rotated thereby into a desired angular orientation about a first axis of rotation. The spindle is secured to the support assembly, and defines a second axis of rotation that is generally perpendicular to the first axis of rotation. The spindle is manually rotatable about the second axis of rotation between a plurality of predetermined rotary positions. The pallet receiver, which is secured to the spindle and is rotatable therewith about the first and second axes, is adapted to releasably receive a pallet to which a work piece is mounted.
    Type: Grant
    Filed: October 31, 2005
    Date of Patent: March 20, 2007
    Assignee: Mitutoyo Corporation
    Inventors: Robert J. Brewer, James A. Christian
  • Patent number: 7140119
    Abstract: Rotational motions between a displacement-measuring probe and an optical test surface define a spherical or near spherical datum surface against which measurements of the probe are taken. The probe has a measurement axis that is maintained substantially normal to the optical test surface during the course of measurement.
    Type: Grant
    Filed: April 23, 2004
    Date of Patent: November 28, 2006
    Assignee: Corning Incorporated
    Inventors: Vivek G. Badami, John H. Bruning
  • Patent number: 7121013
    Abstract: A length measuring probe that includes a base body, a guide element and a probe pin having a touch scanning element for touch scanning a measuring object, the probe pin is seated, displaceable in relation to the base body in a measuring direction opposite a spring force F via the guide element. A detection device detects a position of the probe pin with respect to the base body and a first spring element and a second spring element arranged behind the first spring element in the measuring direction so as to prestress the probe pin. The guide element is arranged between the first and second spring elements, on which facing end areas of the first and second spring elements are fixed in place, and wherein the at least one guide element is seated, displaceable in the measuring direction, on the probe pin and on the base body.
    Type: Grant
    Filed: March 28, 2002
    Date of Patent: October 17, 2006
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Peter Herkt, Ludwig Böge
  • Patent number: 7107696
    Abstract: A freestanding micrometer and method for determining the diameter of a cylindrical body, including measuring variations in diameter along a longitudinal length thereof, such as a roll used in the production of metal and paper sheet products. The micrometer comprises a housing supported on a circumferential surface of the cylindrical body. A first sensing element is movably supported by the housing and adapted for sensing a first surface point of the cylindrical body laterally spaced apart from the housing and disposed in a cross-sectional plane of the cylindrical body. A second sensing element is mounted to the housing for contact with a second surface point of the cylindrical body disposed in the cross-sectional plane of the cylindrical body. The first and second surface points locate, respectively, a terminal and midpoint of a chord lying in the cross-section plane of the cylindrical body, from which the diameter of the cylindrical body is determined.
    Type: Grant
    Filed: October 18, 2004
    Date of Patent: September 19, 2006
    Assignee: Harford Industries, Inc.
    Inventor: William E. Melander
  • Patent number: 7107695
    Abstract: A hand-operated feeler includes a rod on a crossed movement table mounted on a support fitted with an immobilization device at a fixed reference as compared to the part to be measured and a processing unit configured to store and process the results. Such a device results in rapidly measuring the contours of parts including deep and sunken honeycomb cells.
    Type: Grant
    Filed: March 25, 2004
    Date of Patent: September 19, 2006
    Assignee: Snecma Moteurs
    Inventors: Bernard Paillarse, Pierre Jamault, Dominique Thibault
  • Patent number: 7100429
    Abstract: A surface profile measuring instrument for measuring a surface profile of a workpiece has: a probe having a stylus provided with a measuring portion for measuring a surface of a workpiece at a tip end thereof and a detector for outputting a detection signal which varies depending on a measurement condition between the surface of the workpiece and the measuring portion; a scanning mechanism for relatively moving the measuring portion along the surface of the workpiece; a memory (46) that stores a position information of the contact portion when the detection signal reaches a predetermined reference signal value; a vibration inclination angle calculator (51) that calculates a response variation factor (vibration inclination angle ?) that applies variation to the detection signal from the surface of the workpiece; and a profile processor (53) that corrects the position information to obtain an actual profile of the surface of the workpiece using the response variation factor.
    Type: Grant
    Filed: July 8, 2003
    Date of Patent: September 5, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka
  • Patent number: 7076882
    Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching the mechanical piece to be checked, a fulcrum for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. Various components of the head can be adjusted and/or replaced from the exterior of the casing. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.
    Type: Grant
    Filed: June 15, 2005
    Date of Patent: July 18, 2006
    Assignee: Marposs Societa' per Azioni
    Inventors: Carlo Dall'Aglio, Luciano Ventura
  • Patent number: 7047657
    Abstract: An apparatus for recording the contour of a surface of a body is provided in accordance with the present invention. The apparatus comprises a carrier on which at least one distance measuring element is disposed. The at least one distance measuring element is capable of determining a distance between the carrier and a location on the surface of the body. A navigation system with marking elements is provided. The marking elements are fixable on the carrier and on the body, such that positional data regarding the position of the body and the carrier can be determined by the navigation system. A data-processing device device is also provided, which is adapted to calculate the contour of the surface from the positional data of the body and of the carrier and the distance measurements of the at least one distance measuring element.
    Type: Grant
    Filed: March 3, 2005
    Date of Patent: May 23, 2006
    Assignee: Aesculap AG & Co. KG
    Inventors: Andreas Goeggelmann, Josef Kozak
  • Patent number: RE41057
    Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.
    Type: Grant
    Filed: April 5, 2006
    Date of Patent: December 29, 2009
    Assignee: Insitutec, Inc.
    Inventors: Stuart T. Smith, Marcin B. Bauza, Pavan Jain, Shane C. Woody