Profile Patents (Class 33/551)
  • Patent number: 7036238
    Abstract: A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: May 2, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Tsukasa Kojima, Junji Sakurada, Toshiyuki Tamai, Sadayuki Matsumiya, Takafumi Kano, Kazushi Noguchi
  • Patent number: 7006213
    Abstract: In a process for the inspection of the surface of a cylindrical body and more especially that of a mill roll, at least one zone of the surface is observed by means of an inspection device having an optical axis oriented towards this zone of the surface with a view to determining the state of the surface. To this end, at least one image of the zone supplied by the inspection device is captured, at least one of the images captured is analysed, the analysis of the image or images captured is compared with the analysis of a reference image, the differences between the analysis of the image or images captured and the analysis of the reference image are detected, and at least the orientation of the optical axis is adjusted so as at least to reduce and preferably to eliminate the differences found. The device can include mechanical and/or optical means of adjusting the orientation of the optical axis.
    Type: Grant
    Filed: April 23, 2002
    Date of Patent: February 28, 2006
    Assignee: Centre de Recherches Metallurgiques, A.S.B.L.
    Inventors: Roger Franssen, Marc Schyns, Hugo Uijtdebroeks
  • Patent number: 6997046
    Abstract: A method and apparatus is provided for making impressions of edges and profiling the edges using a profiling machine. The apparatus allows the impressionable material used for forming the impression to be held in a fixed position while the impression of the edge is formed, and then allows the impression to be withdrawn in a manner that leaves the impression substantially unchanged and substantially true to the profile of the edge. The apparatus also comprises fittings to make the apparatus compatible with a profiling machine and allows the impression to be positioned in the profiling machine in substantially the same orientation every time an impression is taken.
    Type: Grant
    Filed: August 1, 2003
    Date of Patent: February 14, 2006
    Assignee: General Electric Company
    Inventors: Jason Brian Fascinato, Timothy Michael Martinkovic, Jeffrey Stanley Keller
  • Patent number: 6952884
    Abstract: An apparatus for checking the diameter and the roundness of pins, for example crankpins and main journals of a crankshaft rotating about its main axis of rotation (8), includes a measuring device, coupled to a Vee-shaped reference device (20) and including a feeler (17) axially movable along the bisecting line of the Vee, or a direction slightly sloping with respect to it, and a movable support device for the reference Vee. The support device includes a support element (5) and a coupling mechanism that carries the reference Vee (20). The coupling mechanism includes, for example, two support sections (e.g. parallelogram structures) in series and enables plain translation displacements of the reference Vee. While checking an orbitally rotating crankpin, the Vee-shaped device maintains proper contact with the surface of the pin by virtue of the force of gravity, and the angular arrangement of the direction along which the feeler (17) moves remains substantially unchanged.
    Type: Grant
    Filed: February 26, 2002
    Date of Patent: October 11, 2005
    Assignee: Marposs Societa' per Azioni
    Inventor: Franco Danielli
  • Patent number: 6920698
    Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching the mechanical piece to be checked, a fulcrum for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. Various components of the head can be adjusted and/or replaced from the exterior of the casing. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: July 26, 2005
    Assignee: Marposs, S.p.A.
    Inventors: Carlo Dall′Aglio, Luciano Ventura
  • Patent number: 6901677
    Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.
    Type: Grant
    Filed: May 5, 2004
    Date of Patent: June 7, 2005
    Assignee: University of North Carolina at Charlotte
    Inventors: Stuart T. Smith, Marcin B. Bauza, Pavan Jain, Shane C. Woody
  • Patent number: 6901678
    Abstract: A measuring head is provided with a retracting device for a sensing pin, comprising an electric motor-driven feed screw, a nut shifted by the feed screw and an inclined face formed on the nut; a seesaw member to which the sensing pin is fitted is swung by the linear motion of the inclined face to retract the sensing pin; not only can the retracting speed and the returning speed of the sensing pin be controlled as desired but also can the retracting action of the sensing pin be stopped on the way to make possible its fine positioning. Further, the electric motor may be provided with a manual knob, and the sensing pin would be thereby enabled to be manually retracted.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: June 7, 2005
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Kazuhiro Kubota
  • Patent number: 6883242
    Abstract: Methods and apparatuses for aligning the component parts of a drum assembly are disclosed. One aspect of the invention relates to tools for measuring and aligning the component parts of the drum assembly. By way of example, the tools may include indicator tools for measuring the relative position of the component parts, as well as alignment tools for aligning the component parts in accordance with the measurements. Another aspect of the invention relates to methods of measuring and aligning the component parts of the drum assembly. By way of example, some methods may pertain to aligning the upper drum and/or the drum support of the drum assembly.
    Type: Grant
    Filed: November 19, 2003
    Date of Patent: April 26, 2005
    Assignee: Athan Corporation
    Inventors: George Athanasiou, Constantine Athanasiou
  • Patent number: 6874243
    Abstract: Centroid moments of components of an arm (220) are calculated based on three-dimensional model data and mass of the components, the centroid moments being combined to calculate a centroid position (G) of the entirety of the arm (220). The arm (220) is adjusted and swingably supported so that a stylus (222D) provided on an end of the arm (220) being swingably supported by a support (210) that moves relative to a workpiece (1) touches the workpiece (1) with a predetermined measuring force and the centroid position (G) is located on a horizontal plane including the fulcrum when the support (210) is inclined by an angle in the middle of an angle range within which the support (210) is rotated by a moving section (130). The measuring force is hardly fluctuated when the support (210) is inclined.
    Type: Grant
    Filed: February 18, 2004
    Date of Patent: April 5, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Nobuyuki Hama, Ichirou Okamoto, Hideo Tanada
  • Patent number: 6862814
    Abstract: An inspection device includes a mount that secures the inspection device to the object for travel along the object, a sensor attached to the mount that measures characteristics of the object, and a position indicator attached to the mount that determines the position of the inspection device on the object.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: March 8, 2005
    Assignee: The Boeing Company
    Inventors: Stephen J. Bennison, Bruce S. Howard, Vincent Thompson, Paul E. Jennerjohn
  • Patent number: 6848315
    Abstract: A stylus structure (40) integrally incorporating a stylus (2), a vibrator (4), a detector (6), a first secondary magnetic circuit (12) and a second primary magnetic circuit (21), and a stylus support (30) integrally incorporating a first primary magnetic circuit (11) and a second secondary magnetic circuit (22) are mutually fittable, thereby achieving signal transmission by the respective magnetic circuits using no electrical contact.
    Type: Grant
    Filed: February 14, 2002
    Date of Patent: February 1, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka, Kiyokazu Okamoto
  • Patent number: 6820347
    Abstract: A freestanding micrometer and method for determining the diameter of a cylindrical body, including measuring variations in diameter along a longitudinal length thereof, such as a roll used in the production of metal and paper sheet products. The micrometer comprises a housing supported on a circumferential surface of the cylindrical body. A first sensing element is movably supported by the housing and adapted for sensing a first surface point of the cylindrical body laterally spaced apart from the housing and disposed in a cross-sectional plane of the cylindrical body. A second sensing element is mounted to the housing for contact with a second surface point of the cylindrical body disposed in the cross-sectional plane of the cylindrical body. The first and second surface points locate, respectively, a terminal and midpoint of a chord lying in the cross-section plane of the cylindrical body, from which the diameter of the cylindrical body is determined.
    Type: Grant
    Filed: April 3, 2003
    Date of Patent: November 23, 2004
    Assignee: Harford Industries, Inc.
    Inventor: William E. Mellander
  • Publication number: 20040221465
    Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.
    Type: Application
    Filed: May 5, 2004
    Publication date: November 11, 2004
    Applicant: University of North Carolina at Charlotte
    Inventors: Stuart T. Smith, Marcin B. Bauza, Pavan Jain, Shane C. Woody
  • Publication number: 20040168332
    Abstract: Centroid moments of components of an arm (220) are calculated based on three-dimensional model data and mass of the components, the centroid moments being combined to calculate a centroid position (G) of the entirety of the arm (220). The arm (220) is adjusted and swingably supported so that a stylus (222D) provided on an end of the arm (220) being swingably supported by a support (210) that moves relative to a workpiece (1) touches the workpiece (1) with a predetermined measuring force and the centroid position (G) is located on a horizontal plane including the fulcrum when the support (210) is inclined by an angle in the middle of an angle range within which the support (210) is rotated by a moving section (130). The measuring force is hardly fluctuated when the support (210) is inclined.
    Type: Application
    Filed: February 18, 2004
    Publication date: September 2, 2004
    Applicant: MITUTOYO CORPORATION
    Inventors: Nobuyuki Hama, Ichirou Okamoto, Hideo Tanada
  • Publication number: 20040154178
    Abstract: A length measuring probe that includes a base body, a guide element and a probe pin having a touch scanning element for touch scanning a measuring object, the probe pin is seated, displaceable in relation to the base body in a measuring direction opposite a spring force F via the guide element. A detection device detects a position of the probe pin with respect to the base body and a first spring element and a second spring element arranged behind the first spring element in the measuring direction so as to prestress the probe pin. The guide element is arranged between the first and second spring elements, on which facing end areas of the first and second spring elements are fixed in place, and wherein the at least one guide element is seated, displaceable in the measuring direction, on the probe pin and on the base body.
    Type: Application
    Filed: April 26, 2004
    Publication date: August 12, 2004
    Inventors: Peter Herkt, Ludwig Boge
  • Patent number: 6772529
    Abstract: An automated contact gage system for gaging a workpiece or device has a left spindle, a right spindle and a stylus arm for contacting the workpiece or device in the same Y plane as the probe. A bearing arrangement is used to contact the stylus arm so as to guide and support the stylus arm during contact gaging of the device. The bearing arrangement comprises a spherical race, derived from three spherical elements, contacting a bearing so as to provide for multi-dimensional movement and measurement of movement of the stylus arm. First, and second sensors sense and measure movement of the stylus arm and/or workpiece in two dimensions, while a third sensor senses and measures rotation of the workpiece by the right spindle.
    Type: Grant
    Filed: July 18, 2001
    Date of Patent: August 10, 2004
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Gerald J. McGrath
  • Patent number: 6754973
    Abstract: The peripheral surface shape measuring apparatus can simply and accurately measure a peripheral surface shape of a roll-like object. The peripheral surface shape of a roll-like object is measured by moving a displacement amount measuring device which pinches a diameter direction of the roll-like object with a sensor part and a reference point part arranged opposite to each other in the diameter direction of the roll-like object, from one end side to the other end side in an axial direction of the roll-like object by using a moving device.
    Type: Grant
    Filed: November 27, 2001
    Date of Patent: June 29, 2004
    Assignee: Fuji Photo Film Co., Ltd.
    Inventor: Shinsuke Takahashi
  • Patent number: 6745616
    Abstract: In advance to measuring texture of the workpiece by a surface texture measuring machine (1), a workpiece orientation adjustment stage (10) is manually moved by the surface texture measuring machine (1) in accordance with calculated orientation correction amount of the workpiece, thus adjusting orientation of the workpiece. Since it is only necessary for an operator to operate respective adjustment means until reaching a displayed correction amount, operation thereof can be facilitated and orientation thereof can be highly accurately adjusted without impairing operability.
    Type: Grant
    Filed: October 18, 2000
    Date of Patent: June 8, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Minoru Katayama, Hideki Mishima, Toshihiro Kanematsu, Hiroomi Honda, Hiroyuki Hidaka, Kazushige Ishibashi
  • Patent number: 6718645
    Abstract: A measuring device for measuring the concentricity of cartridges (30, 31), more particularly rifle cartridges, is essentially composed of a main body (1) provided with chambers (2) for cartridges of one or a plurality of calibers. The cartridges are radially retained in the chambers by so-called diameter compensators (9) but rotatable about their longitudinal axis. In the area of the point (39) of the projectile, an access for a measuring means (3) is provided, e.g., a dial gauge, the latter indicating the deviation of the projectile from perfect concentricity by the magnitude of its deflection variation when the cartridge (30, 31) is rotated. An aligning device (4) that is preferably also provided allows to exert a lateral pressure on the projectile in order to obtain an improved concentricity.
    Type: Grant
    Filed: December 2, 2002
    Date of Patent: April 13, 2004
    Inventor: Heinz Berger
  • Patent number: 6671973
    Abstract: A method of adjusting the relative attitude of a work in a surface texture measuring instrument for measuring the work having a feature region includes a measurement step of performing measurement of the feature region along an X-axis direction after positioning a detector in a Y-axis direction and the X-axis direction, a determination step of repeating the measurement which is performed while changing the position in the X-axis direction, and a step of adjusting the attitude of the work on the basis of the amount of relative attitude correction. Therefore, the direction of the feature region in the work is adjusted so as to be parallel to the Y axis.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: January 6, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Fumihiro Takemura, Minoru Katayama
  • Patent number: 6629373
    Abstract: There is described a metrological instrument for measuring a characteristic of a surface of a workpicce, the instrument comprising a measurement unit and a user-interface unit separate from the measurement unit. The measurement unit has a sensor which follows a measurement path across a surface and means for deriving a signal indicative of a characteristic of the surface as the sensor follows the surface. The user-interface unit has means for providing a user with an indication of a surface characteristic measured by the sensor. The measurement unit and the user-interface unit have communication means for enabling remote communication of information relating to a measurement between the measurement and user-interface units. Preferably, the measurement unit and the user-interface unit can be connected together when not in use in a manner such that the sensor of the measurement unit is protected.
    Type: Grant
    Filed: November 14, 2001
    Date of Patent: October 7, 2003
    Assignee: Taylor Hobson Limited
    Inventor: James Andrew Donaldson
  • Publication number: 20030159302
    Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching the mechanical piece to be checked, a fulcrum for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. Various components of the head can be adjusted and/or replaced from the exterior of the casing. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector. A checking apparatus, including at least a gauging or measuring head, includes a stationary structure and at least a support structure for the head, coupled to the stationary structure in an adjustable and removable way.
    Type: Application
    Filed: January 21, 2003
    Publication date: August 28, 2003
    Inventors: Carlo Dall'Aglio, Luciano Ventura
  • Patent number: 6604295
    Abstract: A fine feed mechanism (50) and a coarse feed mechanism (60) respectively for minutely and greatly displacing a stylus (12) is provided to a microscopic geometry measuring device (1), so that the respective mechanisms (50, 60) are combinedly actuated for easily controlling the movement of the stylus (12) in a wide range at a short time. Further, a movable balancing portion (53) moving in a direction opposite to a movable driving portion (52) is provided to the fine feed mechanism (50). Since a reaction force caused by the movement of the movable driving portion (52) is cancelled by another reaction force caused by the movement of the movable balancing portion (53) at a fixed portion (51), no mechanical interference is caused between the respective mechanisms (50, 60), thus accurately controlling the movement of the stylus (12).
    Type: Grant
    Filed: March 13, 2001
    Date of Patent: August 12, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kunitoshi Nishimura, Kazuhiko Hidaka, Kiyokazu Okamoto
  • Patent number: 6564466
    Abstract: A measuring apparatus for a pulley which features a workpiece holding post, a slide table and a measuring post which are controlled and moved by a controlling board. A probe tip extends from a detecting head of the measuring post and, in operation, is brought into contact with the portion to be measured to carry out the copying measurement which involves one or more measurements directed at the groove diameter of the ball groove, angle of the intersection, a divided angle, over-ball diameter, between diameter, lead deviation, run-out, concentricity, tapered angle of the conical surface, straightness of the conical surface, and deviation of the conical surface.
    Type: Grant
    Filed: September 26, 2001
    Date of Patent: May 20, 2003
    Assignee: Fuji Jukogyo Kabushiki Kaisha
    Inventor: Chiaki Uwai
  • Patent number: 6553681
    Abstract: A system and method to facilitate thickness measurement of bio-material workpiece, preferably a sheet, and to topographically map the sheet into similar thickness zones for later use. In particular, the system may include a three-axis programmable controller for manipulating a bio-material workpiece with respect to a thickness measurement head. The measurement head may include a plurality of sensors for simultaneous measurement of a plurality of points, with the sensors being adapted to contact the sheet or not. A robust human-machine interface is also provided for process control, preferably including a touch-screen monitor. A marking head may be provided for marking the zones or otherwise indicating the thickness in different areas. Two platens are desirably used in parallel for increased thoughput; the workpiece on one platen may be measured while the other is marked. The system and method are especially suited for assessing and marking pericardial tissue for forming heart valve leaflets.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: April 29, 2003
    Inventors: Carl Roger Ekholm, Jr., Son Nguyen, Richard L. Peloquin, Robert Gliniecki, Todd Baeten, Suzanne E. Graumlich, Steven Eric Backer
  • Patent number: 6546642
    Abstract: A head for the linear dimension checking of mechanical pieces including a casing, an arm carrying a feeler for touching a surface of the mechanical piece to be checked, a fulcrum, coupled to the casing and the arm, for enabling displacements of the arm with respect to the casing and a transducer for providing signals depending on the position of the arm with respect to the casing. The head has specific flexibility and modularity features, thanks to the possibility of operating from the exterior for adjusting and replacing various components. The transducer is of the inductive, half-bridge type, with multiple windings. An integral element for the electric connection to a processing unit includes the windings of the transducer, a cable and a connector, and the latter comprises a rapid locking/unlocking device. The ends of the cable are connected between the windings of the transducer and the connector by means of an over-molding process of a plastic material.
    Type: Grant
    Filed: August 24, 2000
    Date of Patent: April 15, 2003
    Assignee: Marposs Societa' per Azioni
    Inventors: Carlo Dall′Aglio, Luciano Ventura
  • Patent number: 6539642
    Abstract: A probe head 10 and a laser interferometric displacement meter 20 are provided. The probe head supports a probe 2 that is capable of contacting a workpiece 1, that is free to move in the direction of the workpiece, and drives the probe towards the workpiece. The displacement meter measures the displacement of the probe with a high accuracy without contact. The probe head 10 is also provided with a probe shaft 12 with steps 11a, 11b at intermediate portions thereof and air bearings 14a, 14b that support the probe shaft on each side of the steps. The air bearings have a high stiffness in the radial direction, and the probe shaft is made to float by using compressed air, thus the resistance of the shaft to sliding is reduced. In addition, another compressed air is supplied to the location of the step and produces a driving force in the direction of the workpiece due to the difference of cross sectional areas on each side of the step, that provides a very small load within a predetermined range.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: April 1, 2003
    Assignee: Riken
    Inventors: Sei Moriyasu, Yutaka Yamagata, Hitoshi Ohmori, Shinya Morita
  • Patent number: 6516528
    Abstract: A system and method are disclosed for determining properties of a feature located at a surface of a substrate. A plurality of probe tips are operable to traverse a surface of the substrate and provide measurement data indicative of topographical features scanned thereby. The measurement data obtained from the plurality of probe tips is aggregated and processed to determine feature properties, such as may include line edge roughness and/or linewidth.
    Type: Grant
    Filed: February 26, 2001
    Date of Patent: February 11, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Bryan K. Choo, Bhanwar Singh
  • Patent number: 6516669
    Abstract: A stylus 20 is mounted directly on detector 32 and the detector 32 is mounted directly on a holder 10. Thus, an vibration-type contact detection sensor 1 is formed in a state in which the holder 10 and the stylus 20 are placed out of contact with each other and the stylus 20 and the detector 32 are placed in contact with each other. Therefore, attenuation of vibration and status change of the stylus 20 by the holder 10 can be circumvented and vibration and status change of the stylus 20 can be propagated directly to the detector 32, so that the detector 32 can detect vibration and status change of the stylus 20 with high sensitivity, and contact with a workpiece can be detected with high sensitivity.
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: February 11, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka, Masanori Arai
  • Patent number: 6505141
    Abstract: A position-to-electrical transducer circuit primarily intended for use in meteorological instruments for measuring a characteristic of a surface of a workpiece. An excitation signal generator provides to a transducer an excitation signal whose voltage varies in a known manner with time and a processor analyzes an electrical signal from the transducer to generate a measurement signal. The processor corrects for any phase shift between excitation signal and the electrical signal to provide an accurate measurement. A meteorological instrument for measuring a characteristic of a surface of a workpiece in which a pivotably-mounted arm holding a stylus is traversed relative to the surface of the workpiece and a variable transducer converts the position of the stylus into a corresponding electrical signal.
    Type: Grant
    Filed: January 9, 2001
    Date of Patent: January 7, 2003
    Assignee: Taylor Hobson Limited
    Inventors: Anthony Paul Smith, Simon Mark Smith
  • Patent number: 6484571
    Abstract: A surface configuration measuring method is provided, the surface configuration measuring method being characterized in having the steps of: moving a touch signal probe by a command velocity vector to touch a surface of the workpiece to be measured; scanning the surface of the workpiece to be measured, the touch signal probe being moved along the surface to be measured while controlling the distance relative to the surface to be measured so that detected amplitude value of a detection signal outputted by the detecting circuit becomes a predetermined reference value, thus outputting the detected amplitude value and corresponding measuring position; and calculating an estimated surface position based on the detected amplitude value and the measuring position estimated to be obtained when surface is scanned to keep the detected amplitude value constant.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: November 26, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Hidaka, Akinori Saito, Kiyokazu Okamoto
  • Publication number: 20020170196
    Abstract: A method of adjusting the relative attitude of a work in a surface texture measuring instrument for measuring the work having a feature region includes a measurement step of performing measurement of the feature region along an X-axis direction after positioning a detector in a Y-axis direction and the X-axis direction, a determination step of repeating the measurement which is performed while changing the position in the X-axis direction, and a step of adjusting the attitude of the work on the basis of the amount of relative attitude correction. Therefore, the direction of the feature region in the work is adjusted so as to be parallel to the Y axis.
    Type: Application
    Filed: May 10, 2002
    Publication date: November 21, 2002
    Applicant: MITUTOYO CORPORATION
    Inventors: Fumihiro Takemura, Minoru Katayama
  • Patent number: 6481109
    Abstract: A control system is provided for a pivotally actuated tracer which traces an object (e.g., a frame mount of an eyeglass frame, a lens, or a lens pattern) while the object is held in a more-vertical-than-horizontal orientation. The control system comprises a trace control element and a gravity compensation element. The trace control element applies control signals to the pivotally actuated tracer. In response, the object engager of the tracer is pivotally actuated against and along the object to be traced with a biasing force toward the object. The gravity compensation element is adapted to compensate for the effects of gravity on the object engager by causing a varying pivoting force to be exerted on the object engager. The pivoting force varies depending on the rotational orientation of the object engager to keep the biasing force substantially constant along the object. Also provided is a data acquisition system for the tracer.
    Type: Grant
    Filed: June 26, 2001
    Date of Patent: November 19, 2002
    Assignee: National Optronics, Inc.
    Inventors: Kimber W. Rarick, Don S. Wills, Martin A. Moon, Ryan J. Davis, John T. Rathbone
  • Patent number: 6477783
    Abstract: An angle measuring device for use in a gyratory compactor. The device is a self-contained unit which is placed in the bottom of the mold and the asphalt or other material being compacted is placed on top of it. Inside the device is a carrier which has two vertically aligned probes which project out from it and touch the walls of the mold. One probe is fixed to the carrier; the other can move independently of the carrier. The difference in extension between the two probes is related to the angle of compaction.
    Type: Grant
    Filed: September 19, 2000
    Date of Patent: November 12, 2002
    Assignee: The United States of America as represented by the Secretary of Transportation
    Inventors: Thomas Philip Harman, Paul Andrew Fuchs, Jr., Thomas Emil Brovold
  • Publication number: 20020157271
    Abstract: A system and method to facilitate thickness measurement of bio-material workpiece, preferably a sheet, and to topographically map the sheet into similar thickness zones for later use. In particular, the system may include a three-axis programmable controller for manipulating a bio-material workpiece with respect to a thickness measurement head. The measurement head may include a plurality of sensors for simultaneous measurement of a plurality of points, with the sensors being adapted to contact the sheet or not. A robust human-machine interface is also provided for process control, preferably including a touch-screen monitor. A marking head may be provided for marking the zones or otherwise indicating the thickness in different areas. Two platens are desirably used in parallel for increased thoughput; the workpiece on one platen may be measured while the other is marked. The system and method are especially suited for assessing and marking pericardial tissue for forming heart valve leaflets.
    Type: Application
    Filed: April 30, 2002
    Publication date: October 31, 2002
    Inventors: Carl Roger Ekholm, Son Nguyen, Richard L. Peloquin, Robert Gliniecki, Todd Baeten, Suzanne E. Graumlich, Steven Eric Backer
  • Patent number: 6460264
    Abstract: A test fixture for rapidly checking the measurements of identical parts at various points on the parts comprises a mounting mechanism for mounting the part securely in a predetermined position; a rail or track defining a guide path that extends past selected points on the part; a car that is positioned on the guide path for movement past the selected points on the part; and an indicator mounted on the car for detecting the position of selected points on the part relative to selected locations on the guide path.
    Type: Grant
    Filed: September 3, 1996
    Date of Patent: October 8, 2002
    Assignee: Advantage Industries, Inc.
    Inventors: William R. Bos, Lee Oosterbaan
  • Patent number: 6457249
    Abstract: An apparatus for determining physical and geometrical defects in motor vehicle wheel rims and tires comprises at least one measurement unit to be associated with a self-centering unit of the vertical axis of a tire removal machine, in order to occupy a rest position in which it lies outside the operational region of the self-centering unit and a working position in which it can assume a first measuring configuration in which it is in light contact with a bead retaining flange of the wheel rim of that wheel at that moment, mounted on the moving self-centering unit, and a second configuration in which it is in light contact with the tread of the tire of the mounted wheel, the at least one measurement unit being connected to a system for collecting and displaying the data obtained.
    Type: Grant
    Filed: April 25, 2000
    Date of Patent: October 1, 2002
    Assignee: Corghi S.p.A.
    Inventor: Remo Corghi
  • Publication number: 20020124427
    Abstract: A fine feed mechanism (50) and a coarse feed mechanism (60) respectively for minutely and greatly displacing a stylus (12) is provided to a microscopic geometry measuring device (1), so that the respective mechanisms (50, 60) are combinedly actuated for easily controlling the movement of the stylus (12) in a wide range at a short time. Further, a movable balancing portion (53) moving in a direction opposite to a movable driving portion (52) is provided to the fine feed mechanism (50). Since a reaction force caused by the movement of the movable driving portion (52) is cancelled by another reaction force caused by the movement of the movable balancing portion (53) at a fixed portion (51), no mechanical interference is caused between the respective mechanisms (50, 60), thus accurately controlling the movement of the stylus (12).
    Type: Application
    Filed: March 13, 2001
    Publication date: September 12, 2002
    Applicant: Mitutoyo Corporation
    Inventors: Kunitoshi Nishimura, Kazuhiko Hidaka, Kiyokazu Okamoto
  • Publication number: 20020095808
    Abstract: The peripheral surface shape measuring apparatus can simply and accurately measure a peripheral surface shape of a roll-like object. The peripheral surface shape of a roll-like object is measured by moving a displacement amount measuring device which pinches a diameter direction of the roll-like object with a sensor part and a reference point part arranged opposite to each other in the diameter direction of the roll-like object, from one end side to the other end side in an axial direction of the roll-like object by using a moving device.
    Type: Application
    Filed: November 27, 2001
    Publication date: July 25, 2002
    Applicant: FUJI PHOTO FILM CO., LTD.
    Inventor: Shinsuke Takahashi
  • Patent number: 6421929
    Abstract: A tapered part measuring apparatus and method measures male and female tapered or conical parts. The apparatus and method use non-contact linear measurement technology for accurate and repeatable measurements, particularly of tapered parts with large deviations from their desired measurements. The tapered part suspends in non-contact position to the non-contact linear measurement probe on a true vertical axis to accurately assume the same position on replicate measurements.
    Type: Grant
    Filed: December 21, 2000
    Date of Patent: July 23, 2002
    Assignee: Command Tooling Systems
    Inventor: William R. Keefe
  • Patent number: 6418390
    Abstract: A method and mobile unit facility is provided for testing the packaging of material during the transport of the material from one location to another location. The method includes instrumenting a unit of packaged material for measuring deflection and acceleration of the packaged material during the transport, loading the unit of packaged material into a bed of the mobile unit facility and filling the remainder of the bed with weighted material which is weighted and sized to simulate other units of the actual packaged material, and then driving the mobile unit facility from the one known location to the other location while recording deflection and acceleration data of the unit of packaged material.
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: July 9, 2002
    Inventor: David M. Wahl
  • Patent number: 6405449
    Abstract: A method and apparatus for data disks adapted to compensate for effects of shock loads imparted to a disk drive which are of sufficient magnitude to cause disk shifts. A series of topographical features are formed on the disk surface or edge to cause signal fluctuation in a sensor during read-back mode operation. An initial signal profile is stored as a map indicative of track or disk alignment with respect to the actuator assembly. Selectively, such as after a known shock event, the topographical features are re-profiled. A comparison of the profiles provides a measure of any track distortion which must be compensated for in future read-write operations by adjustments to data track servo follower algorithms.
    Type: Grant
    Filed: February 7, 2001
    Date of Patent: June 18, 2002
    Assignee: Seagate Technology, LLC
    Inventors: Ramesh Sundaram, Wei Yao, Li-Ping Wang, David Shiao-Min Kuo
  • Patent number: 6401349
    Abstract: A stylus is carried at one end of a support arm mounted so as to be pivotable about a pivot axis to allow the stylus to follow a surface during relative movement between the stylus and the surface. A drive arrangement is responsive to pivotal movement of the support arm to drive the support arm to maintain the support arm at a substantially constant attitude. A measuring arrangement is provided for measuring the displacement of the stylus. The measuring arrangement uses a measuring element mounted to one end of the support arm adjacent the stylus. The measuring arrangement may be an interferometer and the measuring element a corner cube mounted so as to be aligned with the tip of the stylus.
    Type: Grant
    Filed: August 4, 1998
    Date of Patent: June 11, 2002
    Assignee: Taylor Hobson Limited
    Inventor: Peter Dean Onyon
  • Publication number: 20020050069
    Abstract: An electronic profile acquisition system for measuring variations in the diameter of a cylindrical body, such as a roll used in the production of metal and paper sheet products. The system comprises a container mounted on wheels, and to which at least two arm assemblies are pivotally mounted so that the container is beneath the arm assemblies. Each of the arm assemblies comprises arms to which probes are mounted. The container encloses a power supply and data acquisition means for receiving output signals from the probes and storing the output signals as data. Finally, the system includes a computer that is separate from and outside the container for processing the data stored by the data acquisition means and representing the data on a screen.
    Type: Application
    Filed: November 1, 2001
    Publication date: May 2, 2002
    Inventor: William E. Mellander
  • Patent number: 6378221
    Abstract: A system and method to facilitate thickness measurement of bio-material workpiece, preferably a sheet, and to topographically map the sheet into similar thickness zones for later use. In particular, the system may include a three-axis programmable controller for manipulating a bio-material workpiece with respect to a thickness measurement head. The measurement head may include a plurality of sensors for simultaneous measurement of a plurality of points, with the sensors being adapted to contact the sheet or not. A robust human-machine interface is also provided for process control, preferably including a touch-screen monitor. A marking head may be provided for marking the zones or otherwise indicating the thickness in different areas. Two platens are desirably used in parallel for increased thoughput; the workpiece on one platen may be measured while the other is marked. The system and method are especially suited for assessing and marking pericardial tissue for forming heart valve leaflets.
    Type: Grant
    Filed: February 29, 2000
    Date of Patent: April 30, 2002
    Assignee: Edwards Lifesciences Corporation
    Inventors: Carl Roger Ekholm, Jr., Son Nguyen, Richard L. Peloquin, Robert Gliniecki, Todd Baeten, Suzanne E. Graumlich, Steven Eric Backer
  • Patent number: 6367159
    Abstract: Method for measuring the surface shape of a thin element such as a silicon wafer measures the surface shapes of one surface and the other surface of the thin element by independently measuring the distance each to one surface and to the other surface of the thin element by rotating or moving the thin element within a single plane and independently moving the first and second measuring means along the first and second guide shafts. Apparatus for measuring the surface shape of the thin element measures the surface shapes of one surface and the other surface of the thin element by rotating or moving the thin element supported within the same plane by a supporting means, and independently measuring the distance each to one surface and to the other surface of the thin element by the first and second measuring means while independently moving the first and second sliders along the first and second guide shafts.
    Type: Grant
    Filed: March 30, 1999
    Date of Patent: April 9, 2002
    Assignee: Kuroda Precision Industries, Ltd.
    Inventors: Kaoru Naoi, Kenichi Shindo, Shinju Ito
  • Patent number: 6354012
    Abstract: The present invention relates to an arrangement for determining dimensions in a three-dimensional object. According to the invention, the arrangement includes a pillar (2), an arm (3) which is mounted fro linear movement in a rotatable guide member (4) that is carried by the pillar and rotatable about the longitudinal axis (Z—Z) of the pillar and also about an axis (X—X) perpendicular to the longitudinal axis (Z—Z). The arrangement further includes a measuring probe attached to one end of the arm, and angle indicators (8, 9) for measuring rotation of the rotatable guide member about its rotational axes, and a scale (10) for measuring linear movement of the arm.
    Type: Grant
    Filed: July 2, 1998
    Date of Patent: March 12, 2002
    Assignee: C E Johansson AB
    Inventor: Bo Pettersson
  • Patent number: 6356069
    Abstract: A calibration standard for calibrating an eddy current inspection probe sized and shaped to inspect a preselected non-planar feature of a manufactured part. The feature extends in a longitudinal direction and in a lateral direction. Further, the feature has an end profile as viewed in the longitudinal direction having a substantially invariant shape and orientation. The calibration standard includes a body having a non-planar surface extending in a longitudinal direction and in a lateral direction. The standard also has an end profile as viewed in the longitudinal direction of the surface substantially identical to the profile of the feature. The surface of the body has an elongate narrow opening extending into the body substantially normal to the surface and traversing the surface of the body at a substantially constant angle with respect to the longitudinal direction of the surface as viewed normal to the surface.
    Type: Grant
    Filed: December 2, 1999
    Date of Patent: March 12, 2002
    Assignee: General Electric Company
    Inventors: Richard L. Trantow, Francis H. Little, Gigi O. Gambrell, John W. Ertel
  • Publication number: 20010049880
    Abstract: A carrier shape measurement device includes: a stage which supports a carrier which is to be a subject of measurement; and a measurement section which measures a shape of the carrier, and the stage comprises kinematic coupling pins to support the carrier by a kinematic coupling.
    Type: Application
    Filed: May 24, 2001
    Publication date: December 13, 2001
    Applicant: Nikon Corporation
    Inventors: Fusao Shimizu, Atsuhiro Fujii
  • Patent number: RE37695
    Abstract: A measuring device for the measurement of workplaces has a base frame with a workpiece receiver to receive a workpiece to be measured, and at least one measuring unit for the measurement of the workpiece. In order to utilize the measuring device as flexibly as possible, and permit the measurement of different workplaces in as simple a manner as possible, the measuring unit can be brought into at least two different positions.
    Type: Grant
    Filed: January 25, 2000
    Date of Patent: May 14, 2002
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Werner Leitenberger, Sabine Ott