Plural Probes Patents (Class 33/557)
-
Patent number: 10234272Abstract: Optical sensors are adapted for distance measurement by emission and capture of measuring radiation reflected from an object to be measured. The optical sensors can be used with measuring devices, including coordinate measuring machines. The optical sensors have an optomechanical coupling unit, configured for automated coupling of the optical sensor to the measuring device and for bidirectional measuring radiation transmission between measuring device and optical sensor. The optical sensors have a first optical measuring channel, by which bidirectional measuring radiation transmission is provided between the measuring device and a first exit window of the optical sensor.Type: GrantFiled: April 25, 2017Date of Patent: March 19, 2019Assignee: TESA SAInventors: Thomas Jensen, Patrick Ilg, Julien Chardonnens, Lorenz Leimgruber, Alessandro Nardulli
-
Patent number: 9673823Abstract: A semiconductor device using a programming unit with is provided. A highly reliable semiconductor device using the programming unit is provided. A highly integrated semiconductor device using the programming unit is provided. In a semiconductor circuit having a function of changing a structure of connections between logic cells such as PLDs, connection and disconnection between the logic cells or power supply to the logic cells is controlled by a programming unit using an insulated gate field-effect transistor with a small amount of off-state current or leakage current. A transfer gate circuit may be provided in the programming unit. To lower driving voltage, a capacitor may be provided in the programming unit and the potential of the capacitor may be changed during configuration and during operation.Type: GrantFiled: May 9, 2012Date of Patent: June 6, 2017Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventor: Yasuhiko Takemura
-
Patent number: 9347759Abstract: A method to fixture and inspect contoured aerodynamic surfaces of a part, such as an engine inlet lip skin, is provided. A controlled preload is applied to one or more discrete locations along the contoured surface to constrain the lip skin at the locations the lip skin would be constrained upon assembly on the airplane. The contoured surfaces are then inspected to dimensional requirements. The controlled preload can be applied by use of magnets or elastic bumpers.Type: GrantFiled: July 17, 2013Date of Patent: May 24, 2016Assignee: THE BOEING COMPANYInventor: Daniel J. Kane
-
Patent number: 8464434Abstract: A method and apparatus for measuring diameters of holes and countersinks. A tip of a countersink measurement system may be moved to engage a countersink for a hole. A diameter of the countersink may be measured in response to the tip of the countersink measurement system engaging the countersink. A probe may be moved through the tip of the countersink measurement system into a channel for the hole, while the tip is engaged with the countersink. A number of diameters for the channel may be measured as the probe moves in the hole.Type: GrantFiled: September 15, 2010Date of Patent: June 18, 2013Assignee: The Boeing CompanyInventors: Paul G. Kostenick, Dario I. Valenzuela, James Niemann Buttrick, Arlen Ray Pumphrey, Michael M. Stepan
-
Patent number: 8336223Abstract: A roundness measuring apparatus includes a stylus stocker and a controller. The stylus stocker stores plural types of styli prepared corresponding to shapes of measurement sites of a measurement target object. The stylus stocker can store styli in such a manner that each stylus can be held thereon and taken out thereof. The stylus stocker is provided outside a measurement region, which is determined on the basis of the operation range of a turntable and a detector driving mechanism. The detector driving mechanism can move the detector to the outside of the measurement region. When a measurement command is given, the controller carries out roundness measurement of the object while controlling the turntable and the detector driving mechanism. When a stylus replacement command is given, the controller carries out stylus replacement operation between a detector main unit and the stylus stocker while controlling the detector driving mechanism.Type: GrantFiled: May 21, 2010Date of Patent: December 25, 2012Assignee: Mitutoyo CorporationInventors: Tatsuki Nakayama, Hideki Shindo
-
Patent number: 8272141Abstract: An exemplary probe apparatus includes a fixture, a first probe assembly, a motor, a lead screw, two guide members, a second probe, and a reduction gear unit. The first probe assembly is fixedly attached to the fixture and includes a first probe. The motor has a drive shaft attached to the fixture. The lead screw is coupled to the fixture. The two guide members are attached to the fixture and parallel to the lead screw. The second probe assembly is moveably attached to the lead screw and the at least one guide member, and includes a second probe. The reduction gear unit is coupled to the drive shaft and the lead screw to transmit power from the motor to the second probe assembly through the lead screw. The second probe assembly is configured for moving the second probe towards or away from the first probe along the two guide members.Type: GrantFiled: May 21, 2010Date of Patent: September 25, 2012Assignee: Hon Hai Precision Industry Co., Ltd.Inventors: Shen-Chun Li, Shou-Kuo Hsu, Hsien-Chuan Liang, Ying-Tso Lai
-
Patent number: 8166664Abstract: A method of aligning arm reference systems of a multiple-arm measuring machine having at least two measuring units, each having a movable arm; the method including the steps of aligning the reference systems of the measuring units when setting up the machine, and periodically updating alignment of the reference systems by detecting, by means of one measuring unit, a reference member carried by another measuring unit and moved successively by the other measuring unit into a number of positions at an intersection of the measuring volumes of the two measuring units.Type: GrantFiled: September 14, 2007Date of Patent: May 1, 2012Assignee: Hexagon Metrology S.p.A.Inventors: Michele Verdi, Emanuele Ricci
-
Patent number: 7946050Abstract: The present invention discloses a three-dimensional microprobe array assembly structure, wherein spacers are used in assembling edge-type microprobe arrays to form a three-dimensional structure, and the spacers reveal conductive pads of the edge-type microprobe arrays to benefit wire bonding. The present invention detects depths and angles and thus increases detection reliability. Besides, in the present invention, the related IC is integrated with the spacer to achieve circuit integration and reduce cost.Type: GrantFiled: May 29, 2008Date of Patent: May 24, 2011Assignee: National Chiao Tung UniversityInventors: Jin-Chern Chiou, Chih-Wei Chang
-
Patent number: 7895764Abstract: A measuring instrument includes: an XY stage on which an object to be measured is placed; a probe holder having a plurality of probes; and a relative moving mechanism that relatively moves the XY stage and the probe holder. The probe holder is provided with a probe selection mechanism that has two guide rails obliquely arranged and advances and retracts at least two of the probes to be selectively positioned at and away from a probe selection position.Type: GrantFiled: March 2, 2009Date of Patent: March 1, 2011Assignee: Mitutoyo CorporationInventors: Kazuhiro Ishizu, Takeshi Yamamoto
-
Patent number: 7712355Abstract: A displacement detector capable of making a measurement in two directions of measurement 180 degrees different from each other without the need of a switching operation has been disclosed.Type: GrantFiled: January 5, 2007Date of Patent: May 11, 2010Assignee: Tokyo Seimitsu Co., Ltd.Inventor: Ryo Takanashi
-
Patent number: 7624510Abstract: One aspect of the present invention comprises a coordinate measurement apparatus that includes an articulated arm having a first end, a second end, and plurality of jointed arm segments therebetween, each arm segment including at least one position transducer. A measurement probe assembly is coupled to the second end of the arm. The measurement probe assembly comprises a first joint providing a first axis of rotation between the second end of the arm and a body of the measurement probe assembly. An encoder includes an encoder housing and an encoder shaft. The encoder housing is configured to rotate about a second axis with respect to the encoder shaft, which is rigidly coupled to the body. A probe is rigidly coupled to the encoder shaft. A measurement device is coupled to the encoder housing such that the measurement device rotates about a second axis with respect to the probe.Type: GrantFiled: December 21, 2007Date of Patent: December 1, 2009Assignee: Hexagon Metrology, Inc.Inventor: Paul Ferrari
-
Publication number: 20090077824Abstract: A spherometer for measuring at least one physical parameter of the workpiece includes at least on fluid-actuated linearly extensible probe member having an output indicative of an amount of linear travel and a chamber housing the linearly extensible probe member. The chamber has an aperture for supporting a workpiece and a vacuum line is coupled to the chamber for creating a vacuum. The probe member is activated as a result of the vacuum in the chamber, causing it to extend linearly toward the workpiece until touching it. The linear extension of the probe may be used as a measurement of distance. The distance measured to a workpiece may be compared to a standard to determine a physical parameter of the workpiece.Type: ApplicationFiled: September 20, 2007Publication date: March 26, 2009Inventor: Larry C. Hardin
-
Publication number: 20090025241Abstract: An exemplary measuring device includes a standard element, a first contour measuring probe, and a controller. The standard element has a first standard plane opposite to a measured object. The first contour measuring probe has a tip extension. The controller is electrically connected to the first contour measuring probe. The tip extension contacts the first standard plane during a measuring process. In addition, a method for using the measuring device is also provided.Type: ApplicationFiled: December 28, 2007Publication date: January 29, 2009Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO. LTD., HON HAI PRECISION INDUSTRY CO., LTD.Inventors: QING LIU, JUN-QI LI
-
Patent number: 7386408Abstract: A parallel kinematic machine has a parallel kinematic mechanism including an end effecter and a parallel link mechanism. A numerical control device controls a position and orientation of the end effecter based on kinematics of the parallel kinematic mechanism. A posture setter sets an adjustment tool on the end effecter in a known posture in a reference coordinate system defined outside the parallel kinematic mechanism based on a measurement method. A data acquirer acquires data in accordance with a measurement method selecting code for designating the measurement method used by the posture setter in setting the adjustment tool in the known posture, and defines a correlation between kinematic parameters for the parallel kinematic mechanism and the reference coordinate system. A calculator calculates the kinematic parameters based on the acquired data by using a relational expression describing forward kinematics of the parallel kinematic mechanism.Type: GrantFiled: September 25, 2006Date of Patent: June 10, 2008Inventors: Nobutaka Nishibashi, Kazuaki Yagi
-
Patent number: 7296363Abstract: The present invention provides for a sensor array having at least one field-measuring sensor and at least one curvature-measuring sensor within a flexible substrate, the field-measuring sensors capable of providing orientation data of the flexible substrate relative to a field and the curvature-measuring sensors capable of providing relative orientation data within the substrate, for measuring dynamic and static shapes and vibration of geotechnical, structural and biological bodies.Type: GrantFiled: June 22, 2005Date of Patent: November 20, 2007Assignee: N.B. Inc.Inventors: Lee Danisch, Murray Lowery-Simpson
-
Publication number: 20040255703Abstract: A unit damper apparatus 18 is used as a damper apparatus 18 which absorbs an impact and a vibration conveyed from a contact 14 to a seesaw member 12, and a structure of this unit damper apparatus 18 is the structure which absorbs circular movement of the seesaw member 12 or performs the circular movement in accordance with that of the seesaw member 12, where a damper effect does not fluctuate according to an angle of inclination of the seesaw member 12.Type: ApplicationFiled: June 22, 2004Publication date: December 23, 2004Inventor: Nozomi Takai
-
Patent number: 6772527Abstract: The invention provides a modular measurement device 100 having, attachable to the quill 12 of a CMM, any one of a plurality of stylus support modules 120ab, 120cd, or 120ef. Attachable to a stylus support module is a range of stylus modules 110a-f. The stylus support modules have different spring rates to ensure that a near optimum response can be obtained for each stylus module used. The stylus modules may be configured so that each cannot be mistakenly fitted to the wrong stylus support module. The modules are held together by magnetic attraction, and the strength of attraction is cascaded so that the stylus module is removed first if pulled off.Type: GrantFiled: April 9, 2003Date of Patent: August 10, 2004Assignee: Renishaw PLCInventors: Andrew G Butter, Graham A Hellen
-
Patent number: 6718737Abstract: An automatic packaging apparatus has an arraying and supplying station, a sorting station and a packaging station. The arraying and supplying station forcibly arrays and supplies encased products to orient their caps in one direction. The sorting station selectively sorts the arrayed encased products to a first feed path for feeding the encased products to package the encased products in a abreast-arrayed attitude and a second feed path for feeding the encased products to package the encased products in a tandem-arrayed attitude. The packaging station automatically packages the encased products by a shrink sheet in the abreast-arrayed attitude or the tandem-arrayed attitude.Type: GrantFiled: December 10, 2001Date of Patent: April 13, 2004Assignee: Fuji Photo Film Co., Ltd.Inventors: Takao Otsuka, Sakae Kagawa, Rie Aoki
-
Patent number: 6701633Abstract: There is provided a shape measuring apparatus which defines an XYZ-axis coordinate and measures a surface shape of an object, the apparatus including a plurality of probes arranged in a Y-axis direction, the probes contacting a surface of the object, and moving in a Z-axis direction according to the surface shape of the object, a probe holder for holding each of the plurality of probes movable in the Z-axis direction, a moving mechanism for moving the probe holding mechanism in an X-axis direction relative to the object, first and second measuring instruments for measuring positions of each probe in the X-axis and Y-axis directions, a third measuring instrument for measuring a position of each probe in the Z-axis direction; and a computing unit for calculating the surface shape of the object based on measuring results from the first, second, and third measuring instruments.Type: GrantFiled: February 28, 2002Date of Patent: March 9, 2004Assignee: Canon Kabushiki KaishaInventor: Masaru Ohtsuka
-
Patent number: 6470587Abstract: A system for part measurement and verification is disclosed. The system comprises a set of design criteria specifying a part and a fixture with gage blocks for positioning the part, where each of the gage blocks represents a known position. At least one probe is operable to measure the scalar values of the part and the gage blocks. A handheld information processor or computer is coupled to the probe for receiving the measurements and is operable to transform the measurements and compare those measurements to the design criteria to in order to verify the part. A method for part measurement and verification is disclosed. The method comprises eight steps. Step one calls for specifying the part with a set of design criteria. Step two requires storing the design criteria in a handheld information processor. Step three provides placing the part in a fixture with gage blocks at known locations. In step four, the method provides for configuring the handheld information processor to receive part measurements.Type: GrantFiled: July 9, 1999Date of Patent: October 29, 2002Assignee: Vought Aircraft Industries, Inc.Inventors: Clifton Dale Cunningham, James McKinnon Fitch, James Jeffery Howard, James Paul Koesters, Michael Alan Leenhouts, Eric Dewayne Moore
-
Patent number: 6330753Abstract: A large diameter gauge consists of a series of measuring units. Each measuring unit comprises two positioning elements(11,12), a fastener(14) and a body(13). These series of measuring units are placed and fixed sequentially and head to end or end to head around the circumference of the cylinder or hole to be measured during measuring until the remained space is not large enough to be put into another one measuring unit. Measuring the distance between the first measuring unit and the last measuring unit, the diameter to be measured can be obtained through the geometric relations between the gauges and the cylinder or hole to be measured.Type: GrantFiled: March 30, 1999Date of Patent: December 18, 2001Assignee: Southeast UniversityInventor: Bin Li
-
Publication number: 20010042395Abstract: Apparatus which can be used to calibrate, or provide measurement data on, a machine. The apparatus comprises two structures each with three spherical supports spaced in a triangular array thereon. The supports may be balls or sockets. The structures are interconnected by six members and each support has the ends of two members connected to it. The members are passive extensible measuring bars and the structures are respectively connected to fixed and movable parts of a machine so that movement of the machine parts causes relative movement between the structures and varies the lengths of the measuring bars. From measurements of the lengths of the measuring bars the actual movement of the machine part can be determined. Calibration of the spherical supports is carried out using a measuring bar which is pre-calibrated in a Zerodur jig.Type: ApplicationFiled: March 13, 2001Publication date: November 22, 2001Applicant: Renishaw PLCInventor: David R. McMurtry
-
Patent number: 6226884Abstract: Apparatus which can be used to calibrate, or provide measurement data on, a machine. The apparatus comprises two structures each with three spherical supports spaced in a triangular array thereon. The supports may be balls or sockets. The structures are interconnected by six members and each support has the ends of two members connected to it. The members are passive extensible measuring bars and the structures are respectively connected to fixed and movable parts of a machine so that movement of the machine parts causes relative movement between the structures and varies the lengths of the measuring bars. From measurements of the lengths of the measuring bars the actual movement of the machine part can be determined. Calibration of the spherical supports is carried out using a measuring bar which is pre-calibrated in a Zerodur jig.Type: GrantFiled: July 3, 1997Date of Patent: May 8, 2001Assignee: Renishaw PLCInventor: David R McMurtry
-
Patent number: 6065220Abstract: A body 1 placed thereon with a table 35 put thereon with an object to be measured W, and a portal frame 41 supporting both ends of rail 43 to the body through pillars 42A and 42B, the rail being placed above the table 35 and extending along a moving direction of a pair of probes 91A and 91B, are provided. A pair of sliders 51A and 51B are movably supported by the rail 43. The pair of the probes are extended downward from the sliders 51A and 51B to be abutted to the object W put on the table 35. The flexural deformation of the probes 91A and 91B is decreased due to the shorter length of the probes 91A and 91B, so that the high accurate measurement is achieved and a relative measurement is omitted.Type: GrantFiled: May 6, 1998Date of Patent: May 23, 2000Assignee: Mitutoyo CorporationInventors: Yukiharu Ohtsuka, Yoshio Saruki, Yoshio Moriya
-
Patent number: 5883313Abstract: A gauge for measuring parts and presenting a number of reconfigurable supporting elements, each having a first portion positionable on a reference surface, and a second portion positionable in relation to the first portion in a direction perpendicular to the reference surface; and a number of orientable measuring modules, each fitted to the second portion of a respective supporting element and presenting a respective linear position transducer; the supporting elements and respective measuring modules being so arranged as to define a number of discrete points for supporting the part for measurement; and each transducer detecting any departure of the actual position of a respective point of the part from a theoretical reference position of the point.Type: GrantFiled: October 18, 1996Date of Patent: March 16, 1999Assignee: DEA-Brown & Sharpe S.p.A.Inventors: Maurizio Ercole, Enrico Garau
-
Patent number: 5867916Abstract: A coordinate measuring machine has a measuring arm on which a collision protector is provided that can be deflected transversely of the longitudinal axis of the measuring arm when the measuring sensor system collides with an object. To operate the coordinate measuring machine with different measuring sensor systems and machining units, the coordinate measuring machine includes an identification unit that automatically identifies the measuring sensor system or machining unit. A securing unit is connected to the identification unit and adjusts the torque required to deflect the collision protector in response to identification of the measuring sensor system or machining unit by the identification unit.Type: GrantFiled: July 15, 1997Date of Patent: February 9, 1999Assignee: Carl-Zeiss-StiftungInventor: Berthold Matzkovits
-
Patent number: 5822877Abstract: A multi-probe system for dimensional metrology. This system utilizes a probe base that is attachable to a coordinate measuring machine and that includes a plurality of probes mounted at spaced-apart locations on the base. The probes are interconnected with the coordinate measuring machine and generate measurement signals based upon interaction with a workpiece. By providing a plurality of probes on a single assembly, multiple measurements can be made on a workpiece in a single measurement cycle.Type: GrantFiled: June 20, 1996Date of Patent: October 20, 1998Assignee: Brown & Sharpe Manufacturing CompanyInventor: YuZhong Dai
-
Patent number: 5806199Abstract: A three-dimensional part measurement system includes a base; at least two guides in the base extending along a first dimension of the part to be measured; a carriage; at least three followers supporting the carriage and movable along the guides to follow the part in the first dimension; and a first gauge mounted on the carriage for measuring deviations of the part in a second dimension and a second gauge mounted on the carriage for measuring deviation of the part in a third dimension.Type: GrantFiled: November 26, 1996Date of Patent: September 15, 1998Assignee: Everett Pattern & Manufacturing Inc.Inventor: Charles W. King
-
Patent number: 5619805Abstract: A device for measuring the wrenching height of hexagonal head fasteners has a height indicator having an indicator shaft which extends therefrom. The height indicator is actuable by reciprocal movement. A gaging element housing is coupled to the height indicator and has an interior bore with a longitudinal axis with indicator shaft extending into the interior bore. A gaging ring is fixed to gaging element housing and has a central opening of a size selected as a minimum diameter for receiving a hexagonal head of a fastener to be measured. At least three gaging pins are received within pin holes of the gaging ring. Thin gaging pins reciprocate within the pin holes between an inward and outward position. By positioning the gaging ring over a hexagonal head of the fastener being measured, the gaging pins will engage a washer surface so that they are forced inward, actuating the indicator shaft of the height indicator so that the wrenching height of the hexagonal head fastener is measured.Type: GrantFiled: June 28, 1995Date of Patent: April 15, 1997Inventor: Joe E. Greenslade
-
Patent number: 5477618Abstract: A frame has sensors mounted thereon for engaging selected portions of a sand core and generating signals proportional to sensed dimensions of the sand core. A control unit compares the sensor signals with a zero reference dimension and a dimensional tolerance range for each sensed dimension of the sand core and generates an indication of acceptable/unacceptable core dimensions. A computer monitor and/or light panel is activated by the control unit and provides a visual indication for each sensed dimension by means of numeric data, color, directional arrows or distinct illuminated lights of an acceptable/unacceptable and even a marginally acceptable sand core.Type: GrantFiled: May 3, 1994Date of Patent: December 26, 1995Inventors: Stephen P. Gibson, Robert A. Kook
-
Patent number: 5276976Abstract: An interchangeable indicator tip device for a dial indicator gauge features a rotatable turret having a plurality of indicator tips. Each indicator tip is rotatable to position a selected indicator tip into a measurement position where the selected tip functions as the indicator tip for the dial indicator gauge.Type: GrantFiled: September 15, 1992Date of Patent: January 11, 1994Inventor: Hollis D. Hawkes
-
Patent number: 5228205Abstract: The sensing head of a coordinate measuring machine includes sensing pin combinations or sensing pins which are changeably fastened with high precision in respect to their spatial position. The receiver contains an isostatic three-point bearing against which the connecting body of the sensing pin is drawn by a pneumatically operated clamping arrangement. In the preferred embodiment the clamping arrangement consists of a suction cup and arresting elements for maintaining attachment of the receiving device to the connecting body when there is no subpressure acting upon the suction cup.Type: GrantFiled: October 9, 1992Date of Patent: July 20, 1993Assignee: Dr.-Ing. Hofler MeBgeratebau GmbHInventors: Hans-Ulrich Bertz, Willi Meder, Albert Neuthinger
-
Patent number: 5201131Abstract: A gage assembly has a frame including a base fastened to a fixture on a table to which workpieces are to be brought for gaging. Digital electronic gages are secured to the frame and have gage-operating plungers extending in the X-axis and Y-axis directions. The plunger axes are coplanar and intersect in the center of a hole in the frame base through which a pneumatically-operated conical ended probe extends. The gage plungers are resiliently biased against a probe ring that is coaxial with the probe cone and is mounted on articulated pivot arms so that the gages are operated in response to random horizontal movement of the probe ring as the probe point enters and centers in a hole whose location in a workpiece is being checked to about a second axis parallel to the first axis.Type: GrantFiled: April 23, 1990Date of Patent: April 13, 1993Inventor: Larry C. Wilkins
-
Patent number: 5193286Abstract: A flexible, modular gage system is presented for statistical process control to compare the delta dimensional difference between a master part with known dimensional values to one or more manufactured production parts. A main feature of the invention is the gage that holds measurement devices, such as a transducer probe. The components of the modular auto gage allow position of analog, digital or mechanical measurement devices in virtually any position, being limited only by the part-holding device or interference with other measurement devices. Measurement devices once positioned can remain stationary or attached to a precision pneumatic slide. The pneumatic slide retracts the measurement device to allow easy loading and unloading of the part to be gaged.Type: GrantFiled: April 21, 1992Date of Patent: March 16, 1993Inventor: Kevin E. Collier
-
Patent number: 5163232Abstract: The planarity of semiconductor device pins is measured simultaneously by multiple pneumatic comparator circuits by detecting pressure changes proportional to pin position.Type: GrantFiled: February 16, 1990Date of Patent: November 17, 1992Assignee: Texas Instruments IncorporatedInventors: David Gonzales, Jr., Anthony M. Chiu
-
Patent number: 5116234Abstract: There is specified a measuring arrangement for rotationally symmetrical workpieces with an adjustable clamping device which carriers the workpiece, and with a movable measuring slide which carries at least one measuring head which measures the workpiece with a sensing pin in a radial direction or an axial direction or both, as the disadvantage is avoided that with a change of the measuring assignment another sensing pin adapted to the new measuring assignment must be reoutfitted in a complicated manner. To accomplish this task the measuring head is equipped with a sensing pin carrier that carries several sensing pins and is turnable. Thus, the sensing pins can be turned rapidly into the measuring position. There they are held fast by a stopping device.Type: GrantFiled: September 5, 1991Date of Patent: May 26, 1992Assignee: Dr.-Ing. Hofler Messgeratebau GmbHInventors: Hans-Ulrich Bertz, Willi Meder
-
Patent number: 5088206Abstract: The geometrical features of a part (6) having center seats are electronically checked by processing signals of gauging heads (14-17) that relate to linear dimensions of the part together with signals of other gauging heads (30, 31) adapted to define a reference geometrical axis. In order to obtain checkings of high accuracy, the reference geometrical axis is defined by means of two gauging heads (30, 31), each of which has a feeler (67, 72) movable along the three directions that is adapted to cooperate with a respective center seat.Type: GrantFiled: July 24, 1990Date of Patent: February 18, 1992Assignee: Marposs Societa' per AzioniInventor: Guido Golinelli
-
Patent number: 5048195Abstract: An apparatus for aligning adjacent surfaces for coplanarity and angle is described. The apparatus comprises a base plate, a plurality of support legs coupled to the base plate, a plurality of depth gauges coupled to the base plate, an angle coupled to the base plate, and leveling means coupled to an inclined surface. The inclined surface of the angle plate slopes towards the plurality of depth gauges. The inclined surface has a predetermined angle. A method for aligning first and second adjacent surfaces for coplanarity and relative angle is also described. The alignment apparatus is placed on a flat surface. The apparatus is calibrated so that all of the plurality of depth gauges read a first value. The apparatus is placed on the first and second adjacent process modules such that the support legs rest on the first adjacent process module and the plurality of depth gauges rest on the second adjacent process module.Type: GrantFiled: August 6, 1990Date of Patent: September 17, 1991Assignee: Intel CorporationInventor: Mark A. Leonov
-
Patent number: 5014440Abstract: A device and method are provided for measuring the deformations of a sample, with the deformations resulting more particularly from the relaxation of the stresses to which the samples were subjected prior to the measurement, and with the sample having an axis corresponding to a main deformation direction. The device comprises at least five displacement sensors each having a measurement direction, with the measurement directions being substantially perpendicular to the axis of the sample.Type: GrantFiled: June 29, 1988Date of Patent: May 14, 1991Assignee: Institut Francais du PetroleInventors: Jacques Lessi, Philippe Perreau, Daniel Bary, Guy Grard
-
Patent number: 5009512Abstract: A device and method for measuring the deformations of a sample, which deformations particularly result from the relaxation of the stresses to which the samples was previously subjected. The device and method include the use of a cell inside which the sample is placed with the cell containing a thermal mass whose heat capacity and/or thermal conductibility are appreciably greater than those of air under normal temperature and pressure conditions.Type: GrantFiled: May 9, 1990Date of Patent: April 23, 1991Assignee: Institute Francais du PetroleInventors: Jacques Lessi, Philippe Perreau, Daniel Bary, Guy Grard
-
Patent number: 4986004Abstract: For the purposes of measuring the configuration of cylinder bores, at least one measuring probe with a plurality of measuring sensors each having respective radially projecting sensing pins is introduced into the cylinder bore, without the sensing pins touching the cylinder bore, and the sensing pins are then brought into contact with the cylinder wall by relative displacement of the workpiece and the measuring probe with respect to each other. Thereupon the measuring head is fixed with respect to the workpiece and that fixing is maintained by means of a biasing force, whereupon, with the workpiece resiliently seated and with the measuring head decoupled from members which produced the advance movement thereof, the configuration of the cylinder bores is measured by sensing by means of the sensing pins on adjacent parallel circles.Type: GrantFiled: January 3, 1990Date of Patent: January 22, 1991Assignee: PAT Messtechnik GmbHInventors: Rudolf Hartmann, Knud Overlach, Gunter Suchanek
-
Patent number: 4953306Abstract: A flexible CNC-multiposition measuring installation, which represents a combination of components from the coordinate measuring technique with elements from the multiposition measuring technique and the counter testing technique, which are joinable with each other in a common measuring installation. Such CNC-multiposition measuring installation are, in particular, adapted for the integration thereof into a manufacturing or production process.Type: GrantFiled: April 20, 1988Date of Patent: September 4, 1990Assignee: Mauser-Werke Oberndorf GmbHInventors: Albert Weckenmann, Hans-Jurgen Mordhorst
-
Patent number: 4934062Abstract: An apparatus for checking the overall lengths of workpieces or the lengths of portions of workpieces, particularly shafts or the like, includes a base in the form of a profiled rod (12). The base has two clamping faces (18, 20) which are oriented at a right angle (22) to one another and to the workpiece (14) to be checked. The base has T-shaped grooves (24, 26) which open onto the clamping faces (18, 20). Each of the clamping faces (18, 20) is provided with a respective clamping strip (30, 32) which is guided longitudinally in the respective T-groove (24, 26) by a respective protrusion (29) and which can be fixed by screws (31) in any desired position on the respective clamping face (18, 20). The clamping strips (30, 32) can be equipped with measuring devices (34), for example measuring sensors, and/or with supporting elements (36). The workpiece (14) may also be clamped into spindle sleeve mounts (46) which are mounted via the T-grooves (24, 26).Type: GrantFiled: March 15, 1989Date of Patent: June 19, 1990Assignee: Rheinmetall GmbHInventor: Horst Knabel
-
Patent number: 4831741Abstract: Present invention is a manufacturing gauging system for statistical process control including a gauging fixture for holding a manufacturing part in a fixed location and orientation and for positioning a transducer probe in a predetermined relationship to a manufactured dimension of the part, a non-volatile memory for storing a set of tolerance dimensions relative to the manufactured dimensions of the part and a data processing system which receives sequential signals from the transducer probe relating to measurements of manufacturing dimensions of the part and stores them in the non-volatile memory. The gauging fixture includes a plurality of zero-based measurement stations. Each zero-based measurement station enables positioning of a transducer probe in a predetermined location and orientation relative to the part for providing a reference to a specified measure of the manufactured dimension of the part.Type: GrantFiled: May 2, 1988Date of Patent: May 23, 1989Inventor: Kaloust P. Sogoian
-
Patent number: 4785545Abstract: Plural switch-type probe heads used in a coordinate-measuring machine are electrically connected in parallel, and each probe head contains a resistor (106) which is series-connected to its switch contact (103/110). In addition, each probe head has a measurement resistor (108) which is independent of switch contacts, and the measurement resistors of all probe heads are also connected in parallel. The operative work-contacting switch signal is produced from a comparison of the currents flowing through the measurement resistors (108) and the series resistors (106).Type: GrantFiled: October 8, 1987Date of Patent: November 22, 1988Assignee: Carl-Zeiss-Stiftung, Heidenheim/BrenzInventor: Karl-Eugen Aubele
-
Patent number: 4776103Abstract: The control device according to the invention comprises three controlling elements secured to a structure or frame and each comprising a fixed guide, a movable tubular socket and a feeler rod or probe connected to a core of a displacement sensor of which the body is integral with the tubular socket, the tubular socket and the rod being applied by springs against G2 and the cathode respectively.Type: GrantFiled: December 22, 1986Date of Patent: October 11, 1988Assignee: VideocolorInventor: Daniel Cote
-
Patent number: 4776102Abstract: A tool (10) is used for detecting whether material (14) on a reference surface (12) has exceeded a predetermined height. The tool (10) includes a housing (32) having a bottom surface with at least one opening (34) therein for receiving the material (14) whose height is to be tested. A probe means (44) is slideably mounted within the housing (32) and has one end located in the opening (34) for contacting the material (14). A circuit (18, 22) includes a pair of contacts (30) spaced a given distance from a predetermined portion of the probe (44). An indicator (66) is coupled to the circuit for signaling that the height of the material (14) exceeds the predetermined height when the probe (44) slide a sufficient distance so that the portion thereof closes the contacts (30).Type: GrantFiled: August 14, 1987Date of Patent: October 11, 1988Assignee: Hughes Aircraft CompanyInventor: Thomas A. Carroll
-
Patent number: 4699551Abstract: An apparatus and method are provided for on-line measurement of a lathe cing tool position using a measuring head with a rotatable square plate engaged with three cylindrical plungers and a positioning mechanism for pivoting the measuring head. The positioning mechanism includes a movable member mounted on a base on the lathe headstock and a rotating unit for rotating the movable member about an axis. A stop member is provided to stop the movable member at a locating position. The measuring head includes a square plate supported inside a housing and rotatable about a y-axis therein. The plungers extend into the housing to contact the plate near its corners. In response to a force applied by a cutting tool mounted in a turret, the plungers move respectively in +x, -x, -z directions relative to the housing to cause the square plate to rotate correspondingly.Type: GrantFiled: March 11, 1986Date of Patent: October 13, 1987Assignee: The United States of America as represented by the Secretary of CommerceInventor: James P. Peris
-
Patent number: 4687979Abstract: In a control system for a robotic gripper a processing circuit (10) controls movement of the gripper (20) on a prearranged path. An article (A) held by gripper (20) comes into contact with the probe member (32) of a "known-down" sensor (30). A support assembly (33), on which the probe member (32) is mounted, is displaced with respect to a base member (31) allowing a continuous, uninhibited movement of the gripper along the path, even after contact has been established. In an alternative arrangement the sensor is mounted on the gripper and establishes contact with an article located at a fixed work station.Type: GrantFiled: January 10, 1986Date of Patent: August 18, 1987Assignee: EMI LimitedInventors: Mark Ashton, Godfrey N. Hounsfield
-
Patent number: 4680842Abstract: An apparatus for simultaneously working a plurality of workpieces comprising a support wheel defining a rotary axis and a periphery, means for rotatably indexing said support wheel in preselected angular steps about said axis, receiving means on said support wheel periphery for receiving one each said workpieces in similar orientation; retaining means for fixedly retaining said workpieces in said receiving means, first working means for simultaneously similarly working a preselected plurality of the workpieces retained in said receiving means, said plurality corresponding in number to one of said angular steps, to define a plurality of partially worked workpieces, sensing means for simultaneously sensing the condition of each of the worked workpieces and preventing further indexing of said suport wheel in the event an undesirable condition of any of the workpieces is sensed, second working means for further working said workpieces subsequent to sensing of the condition thereof by said sensing means, and meansType: GrantFiled: August 15, 1985Date of Patent: July 21, 1987Assignee: Automation Associates, Inc.Inventor: William D. Moyer