Having A Movable Contact Probe Patents (Class 33/556)
  • Patent number: 11883949
    Abstract: A three-dimensional measuring device, comprising an arm having a free end provided with an interface body carrying a measuring member and a grip member enabling an operator to point the measuring member at a zone of the object that is to be measured. The interface body has a front face in which at least one electrical connector is accessible and from which there extends a projecting tubular coupling part for coupling to the measuring member, an annular grippable body being engaged on the tubular coupling part and extending over the front surface and the electrical connector, a retaining element being mounted on the grippable body to co-operate with the tubular coupling part in order to hold the grippable body pressed against the front face of the interface body.
    Type: Grant
    Filed: January 5, 2021
    Date of Patent: January 30, 2024
    Assignee: HEXAGON METROLOGY SAS
    Inventors: Laurent Desforges, Thibault Duportal, Denis Roux, Jean-Luc Famechon, Wes Inglis
  • Patent number: 11782528
    Abstract: An active stylus includes a stylus tip assembly and an elongate housing enclosing a portion of the stylus tip assembly. A winged bracket mounted within the elongate housing and affixed to a tip-distal end of the stylus tip assembly is configured to flex in response to pressure applied to the stylus tip assembly. A strain gauge disposed along the winged bracket is configured to measure strain along the winged bracket caused by pressure applied to the tip assembly.
    Type: Grant
    Filed: June 10, 2022
    Date of Patent: October 10, 2023
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Bradley Edgar Clements, Brady James Toothaker, Yuanhua Robert Shen, Jingyu Zou
  • Patent number: 11642749
    Abstract: A machine-tool including a machining module equipped with a tool-holder and a work-holder, and an optical measuring device-for the three-dimensional measurement of the relative position between the tool-holder and the work-holder. The optical measuring device includes an optical system mounted on the work-holder and a target mounted on the tool-holder. The target includes a useful face forming a positioning reference that can be placed in the optical axis of the optical system.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: May 9, 2023
    Assignee: LDI FINANCES
    Inventors: Philippe Jacot, Sebastien Laporte, Frederic Perret
  • Patent number: 11536563
    Abstract: A method for calibrating parameters includes a measurement step that obtains measurement data by scanning a defined surface; a correction step that obtains corrected data by correcting the measurement data based on the parameters; a determination step that calculates a roundness of the corrected data and determines whether the calculated roundness is equal to or less than a predetermined value; and an adjustment step that increases or reduces at least one of the parameters when the roundness is determined to be greater than the predetermined value, and the correction step, the determination step, and the adjustment step are repeated until the roundness is determined to be equal to or less than the predetermined value.
    Type: Grant
    Filed: July 22, 2020
    Date of Patent: December 27, 2022
    Assignee: MITUTOYO CORPORATION
    Inventor: Yoshiyuki Omori
  • Patent number: 11274913
    Abstract: A stylus is arranged on a coordinate measuring machine. A method for aligning a component in relation to the coordinate measuring machine includes positioning the stylus and the component in relation to one another according to a defined arrangement. The method includes acquiring at least one coordinate of the component. The method includes changing at least one of a position and an orientation of the component in relation to the coordinate measuring machine while maintaining the defined arrangement.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: March 15, 2022
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Jochen Mühlbacher, Kurt Brenner, Dominic Bulling
  • Patent number: 11268874
    Abstract: Provided is a defect judging unit for a measuring probe including: a stylus; four detection elements; and a signal processing part. The defect judging unit includes a defect judging part configured to compare four judged signals corresponding to the generated signals with predetermined thresholds when the object to be measured and the contact part are out of contact with each other and judge that a defect exists if any of the judged signals is greater than the predetermined threshold, and a judged result output part configured to output a judged result of the defect judging part. According to this configuration, the defect judging unit of the measuring probe and the defect judging method thereof capable of ensuring measurement reliability with a simple configuration are provided.
    Type: Grant
    Filed: June 4, 2020
    Date of Patent: March 8, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Akinori Saito, Satoshi Koga, Hiroyuki Kanamori
  • Patent number: 11267029
    Abstract: In the straightening of radial run-out faults or linearity faults on elongate workpieces having at least one toothed region having peaks and troughs of the teeth of said toothed region, such as on toothed shafts or toothed racks, for ascertaining deviations from the ideally straight workpiece, the locations of the surfaces of the not yet straightened workpiece that form a reference plane are scanned at least at points or in portions on or in the region on the active reference circle or pitch circle, respectively, of the toothing that lies between the peaks and troughs of the teeth. The resulting measured items of data are utilized by the straightening machine such that a workpiece that is as ideally straight as possible at least in the toothed region is achieved by the straightening.
    Type: Grant
    Filed: January 4, 2019
    Date of Patent: March 8, 2022
    Assignee: MAE Maschinin- und Apperatebau Gotzen GmbH
    Inventor: Manfred Mitze
  • Patent number: 11188562
    Abstract: A method, apparatus, and system for join operations of a plurality of relations that are distributed over a plurality of storage locations over a network of computing components.
    Type: Grant
    Filed: April 15, 2021
    Date of Patent: November 30, 2021
    Assignee: Snowflake Inc.
    Inventors: Benoit Dageville, Thierry Cruanes, Marcin Zukowski, Allison Waingold Lee, Philipp Thomas Unterbrunner
  • Patent number: 11156446
    Abstract: A position measurement method for an object in a machine tool measures a position of an object with a probe using a machine tool. The machine tool includes three or more translational axes, a rotatable main spindle, and a table. The probe is a position measurement sensor mountable to the main spindle. The position measurement method includes preliminarily obtaining compensation values of contact positions in a radial direction of the probe in at least two directions where main spindle rotation angles are different by 180°, determining the main spindle rotation angle at a contact with a measurement surface of the object corresponding to the measurement content, and calculating a measurement value of the position of the object from a position of the probe at the contact with the measurement surface and the compensation value in accordance with the determined main spindle rotation angle.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: October 26, 2021
    Assignee: Okuma Corporation
    Inventor: Reiji Kanbe
  • Patent number: 10876829
    Abstract: A compact coordinate measuring machine (CMM) probe configuration is provided for integrating complex circuits into a CMM probe. The CMM probe configuration includes a stylus position detection portion, a stylus suspension portion and a circuit board assembly. The stylus position detection portion includes an alignment frame and an optical sensing configuration. The circuit board assembly includes a rigid-flex circuit element and a three-dimensional carrier frame. The rigid-flex circuit element includes a set of board portions joined by a set of flexible bend portions. The rigid-flex circuit element is folded at the bend portions to locate some of the board portions to be proximate to and/or joined to corresponding support surfaces on the carrier frame. The circuit board assembly at least partially surrounds a majority of the stylus position detection portion and is joined thereto with the carrier frame fixed relative to the alignment frame.
    Type: Grant
    Filed: January 28, 2019
    Date of Patent: December 29, 2020
    Assignee: Mitutoyo Corporation
    Inventors: Bernadette Baqui Qi, Richard Alan Wissner
  • Patent number: 10788303
    Abstract: A sensor adjustment mechanism for a coordinate measuring machine includes a sensor, first and second joints, a change interface, and a fixing device. The first joint allows the sensor to pivot about a first axis. The second joint allows the sensor to rotate about a second axis. The change interface releasably couples the sensor adjustment mechanism to a measuring head of the coordinate measuring machine. The fixing device is configured to clamp the joints. The change interface includes a first component and a ferromagnetic second component movable relative to the first component. The change interface is configured to be fixed to the measuring head by a magnetic fixing force exerted on the second component, which causes a movement of the second component relative to the first component. The movement actuates the fixing device so as to clamp the joints and inhibit the sensor from being pivotable and rotatable.
    Type: Grant
    Filed: June 25, 2018
    Date of Patent: September 29, 2020
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Otto Ruck
  • Patent number: 10458450
    Abstract: A probe head of a coordinate measuring machine (‘CMM”) includes a sensor to detect impact of the probe head with a foreign object. The probe head is movably coupled to the CMM such that the sensor detects motion of the probe head relative to a portion of the CMM resulting from an impact event. Some embodiments cause the CMM to take action in response to detecting an impact. Probe clips allow adjustment of the position of a CMM probe relative to the portion of the CMM from which the probe is suspended. This allows the position and orientation of the CMM probe to be adapted to a variety of applications.
    Type: Grant
    Filed: March 16, 2017
    Date of Patent: October 29, 2019
    Assignee: Hexagon Metrology, Inc.
    Inventors: Gurpreet Singh, Paul Racine, John Langlais, Jie Zheng
  • Patent number: 10434715
    Abstract: In one embodiment of the present invention, a stress analysis engine efficiently computes stresses for an arbitrarily shaped three-dimension (3D) model. In operation, the stress analysis engine slices the 3D model into layers of cross-sections. The stress analysis engine then groups the cross-sections into virtual cross-sections. For each virtual cross-section, the stress analysis engine applies bending moment equilibrium-based equations to determine a corresponding structural stress for the 3D model. The efficiency of this stress analysis process enables real-time feedback of stresses to an interactive design tool that facilitates a trial-and-error design process. Using this trial-and-error process reduces the guesswork and/or over-engineering associated with conventional approaches based on finite element methods that are typically too slow for interactive feedback.
    Type: Grant
    Filed: December 2, 2014
    Date of Patent: October 8, 2019
    Assignee: AUTODESK, INC.
    Inventors: Nobuyuki Umetani, Ryan Michael Schmidt
  • Patent number: 10422628
    Abstract: A measuring probe includes a stylus having a contact part, an axial motion mechanism, and a rotary motion mechanism. The axial motion mechanism includes first diaphragm structures and a moving member that allows the contact part to move in an axial direction. The rotary motion mechanism includes a second diaphragm structure and a rotating member that allows the contact part to move along a plane perpendicular to the axial direction. The first diaphragm structures are disposed at a symmetric distance with respect to the second diaphragm structure, and the second diaphragm structure is disposed between the first diaphragm structures in the axial direction. The axial motion mechanism supports the rotary motion mechanism, or the rotary motion mechanism supports the axial motion mechanism.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: September 24, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Atsushi Shimaoka, Tomoyuki Miyazaki, Kazuhiko Hidaka
  • Patent number: 10132822
    Abstract: Disclosed is a method for forming a spacer extending at least partially within the length of a central bore passing from one side to the other of a barrel of a mounting base of an accelerometer sensor, the central bore being designed to receive a fastening element for fixing the mounting base onto a support element, the fastening element being centered by the spacer in the central bore, the mounting base being at least partially surrounded by an encapsulation of overmolded plastic material. When the plastic material is overmolded around the mounting base to form the encapsulation, a part of the plastic material passes through the barrel to form the spacer while fixing it to the encapsulation. Also described is a mounting base with at least one channel for the passage of the plastic material, and to an accelerometer sensor equipped with such a mounting base.
    Type: Grant
    Filed: March 3, 2017
    Date of Patent: November 20, 2018
    Assignees: CONTINENTAL AUTOMOTIVE FRANCE, CONTINENTAL AUTOMOTIVE GMBH
    Inventors: Xavier Vermelle, Van-Est Jeroen
  • Patent number: 10036628
    Abstract: A measuring device for an optical measuring system, comprising a rigid body which comprises a probe body or a tool and on which a first optical marker is arranged. The measuring device further comprises a holding part for holding the measuring device by hand or for clamping the measuring device in a machine. At least a second optical marker is arranged on the holding part. Still further, the measuring device comprises a spring element which connects the rigid body to the holding part.
    Type: Grant
    Filed: September 25, 2017
    Date of Patent: July 31, 2018
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Tobias Held, Dieter Kaufmann
  • Patent number: 9958249
    Abstract: Indexing head with two rotating axes, with a first rotating axis A perpendicular to the fixing direction with regard to the mode of operation of the head, and with a second rotating axis B of the fixing direction, in turn defining an upper part of the fixed head in relation to the B axis and a lower part of the head, which moves in relation to axes A and B; and which has a principal servomotor A (40) and a position locking mechanism on the A axis arranged 10 on the part of the lower head; and a principal servomotor B (21) for rotation on the B axis with a position locking mechanism on the B axis arranged on said upper part of the head.
    Type: Grant
    Filed: January 23, 2014
    Date of Patent: May 1, 2018
    Assignee: Unimetrik, S.A.
    Inventor: Borja De La Maza Uriarte
  • Patent number: 9811087
    Abstract: A method or system for controlling a vehicle comprises entering a programming mode or a guidance mode based on user input to a switch. The user can enter a guidance program in accordance with a predetermined sequence of inputs of the switch by the user, where readiness for each successive input is indicated by a light source. A guidance mode is managed for guiding a vehicle in accordance with the entered guidance program. An encoder or sensor can sense a steering angle of a steering system. The steering angle is controlled in accordance with the guidance program if the system or the data processor is operating in a guidance mode.
    Type: Grant
    Filed: May 15, 2013
    Date of Patent: November 7, 2017
    Assignee: Deere & Company
    Inventors: Frederick W. Nelson, Timothy A. Wilcox, Peter W. Kasap
  • Patent number: 9810529
    Abstract: A measuring probe includes a stylus having a contact part to be in contact with an object to be measured, an axial motion mechanism having a moving member that allows the contact part to move in an axial direction, and a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction by means of rotary motion. The measuring probe includes a main body housing that supports the axial motion mechanism, a module housing that supports the rotary motion mechanism, and a displacement detector supported by the main body housing for detecting displacement of the moving member. The measuring probe with this configuration ensures high measurement accuracy while keeping a low cost.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: November 7, 2017
    Assignee: MITOTOYO CORPORATION
    Inventors: Atsushi Shimaoka, Tomoyuki Miyazaki, Kazuhiko Hidaka
  • Patent number: 9803972
    Abstract: A scanning probe is provided for use with a coordinate measuring machine. The scanning probe includes a rotary position detection configuration which outputs X and Y position signals indicative of a rotation of a stylus coupling portion about a rotation center, and an axial position detection configuration which outputs a Z position signal indicative of the position of the stylus coupling portion along the axial direction. The Z position signal is substantially insensitive to motion of the axial detection deflector in at least one direction that is transverse to the axial direction. The X, Y and Z position signals may be processed to determine a 3D position of a contact portion of the stylus, which may include utilizing the Z position signal in combination with known trigonometry of the scanning probe to remove axial motion cross coupling components from the X and Y position signals.
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: October 31, 2017
    Assignee: Mitutoyo Corporation
    Inventor: David William Sesko
  • Patent number: 9791262
    Abstract: A scanning probe responsive in three axes is provided for use with a coordinate measuring machine. The scanning probe utilizes multiplexing techniques for producing X, Y and Z position signals. The X and Y position signals are indicative of a rotation of a stylus coupling portion about a rotation center, and the Z position signal is indicative of the position of the stylus coupling portion along the axial direction. The Z position signal is substantially insensitive to motion of the axial detection deflector in at least one direction that is transverse to the axial direction. The X, Y and Z position signals may be processed to determine a 3D position of a contact portion of the stylus, which may include utilizing the Z position signal in combination with known trigonometry of the scanning probe to remove axial motion cross coupling components from the X and Y position signals.
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: October 17, 2017
    Assignee: Mitutoyo Corporation
    Inventors: Scott Allen Harsila, David William Sesko
  • Patent number: 9618312
    Abstract: A measuring probe includes a stylus having a contact part to be in contact with an object to be measured, an axial motion mechanism having a moving member that allows the contact part to move in an axial direction, and a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction by means of rotary motion. The measuring probe includes a probe main body that incorporates the axial motion mechanism, and a probe module that is supported by the probe main body, incorporates the rotary motion mechanism, and supports the stylus. The probe main body and the probe module are detachably coupled to each other with a pair of rollers and a ball capable of positioning to each other. This allows adequate detection sensitivity and a restoring force suitable for the stylus to be obtained at a low cost.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: April 11, 2017
    Assignee: MITUTOYO CORPORATION
    Inventors: Atsushi Shimaoka, Tomoyuki Miyazaki, Kazuhiko Hidaka
  • Patent number: 9605943
    Abstract: A measuring probe includes a stylus, an axial motion mechanism, and a rotary motion mechanism. The axial motion mechanism includes a pair of first diaphragm structures that allows a moving member to be displaced, and the rotary motion mechanism includes a second diaphragm structure that allows a rotating member to be displaced. The second diaphragm structure is disposed between the pair of first diaphragm structures in an axial direction. The respective first diaphragm structures are disposed at a symmetric distance with respect to the second diaphragm structure. This can reduce the length in the axial direction and weight thereof and also reduce shape errors and improve measurement accuracy.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: March 28, 2017
    Assignee: MITUTOYO CORPORATION
    Inventors: Atsushi Shimaoka, Tomoyuki Miyazaki, Kazuhiko Hidaka
  • Patent number: 9505101
    Abstract: A sanding system may include a leading roller assembly having a first measuring device that is configured to measure a first thickness of a component at a location proximate the leading roller assembly. A trailing roller assembly may include a second measuring device that is configured to measure a second thickness of the component at a location proximate the trailing roller assembly. A sander disposed between the leading and trailing roller assemblies is configured to sand a portion of the component. A control unit is coupled to the leading roller assembly, the trailing roller assembly, and the sander. The control unit may be configured to drive the sanding system in relation to the component and operate the sander based on analysis of the first thickness measured by the first measuring device and the second thickness measured by the second measuring device.
    Type: Grant
    Filed: June 24, 2015
    Date of Patent: November 29, 2016
    Assignee: The Boeing Company
    Inventor: Justin H. Register
  • Patent number: 9471054
    Abstract: An analog probe for a machine tool apparatus, including a probe body and a stylus member movably secured to the probe body in a suspended rest position via a suspension mechanism. A sensor is provided for measuring the extent of displacement of the stylus member relative to the probe body from a rest position. The analog probe further includes a first compliant sealing member extending between the probe body and stylus member such that the sensor is contained within a chamber sealed from external contaminants. The analog probe also has for a suppressor for suppressing movement of the stylus member away from its suspended rest position induced by changes in the chamber's internal pressure and/or changes in the analog probe's operating environment.
    Type: Grant
    Filed: January 19, 2012
    Date of Patent: October 18, 2016
    Assignee: RENISHAW PLC
    Inventors: David Roberts McMurtry, David Collingwood
  • Patent number: 9458600
    Abstract: A method or system for controlling a vehicle comprises entering a programming mode or a guidance mode based on user input to a switch. The user can enter a guidance program in accordance with a predetermined sequence of inputs of the switch by the user, where readiness for each successive input is indicated by a light source. A guidance mode is managed for controlling an implement height in accordance with the entered guidance program. A height sensor can sense an observed height or elevation of an implement of the vehicle (e.g., relative to the absolute target height of the implement above the ground). The observed height is controlled in accordance with the guidance program (e.g., the target height) if the system or the data processor is operating in a guidance mode.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: October 4, 2016
    Assignee: DEERE & COMPANY
    Inventors: Frederick W. Nelson, Timothy A. Wilcox, Peter W. Kasap, Darin E. Bartholomew
  • Patent number: 9423235
    Abstract: Measuring system having a plurality of probes for measuring lengths, each probe including a probe tip connected in removable fashion relative to a casing, a transducer supplying an electric signal that is representative of the position of said probe tip relative to the casing, a digital processing unit for sampling the signal from said transducer and transforming it into a digital representation of said position, and a bidirectional interface for a wireless communication network connecting said probes with a control unit. A method including a step during which the clocks of the digital processing units of the probes are synchronized through said bidirectional wireless interface and a step during which the control unit transmits commands determining the instant at which said electric signals are sampled.
    Type: Grant
    Filed: May 16, 2011
    Date of Patent: August 23, 2016
    Assignee: TESA SA
    Inventors: Pascal Jordil, Bertrand Horchet, Serge Mariller, Pierre Pompili
  • Patent number: 9261536
    Abstract: A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips.
    Type: Grant
    Filed: August 14, 2012
    Date of Patent: February 16, 2016
    Assignee: ASM TECHNOLOGY SINGAPORE PTE LTD
    Inventors: Hing Suen Siu, Yu Sze Cheung, Chi Wah Cheng, Kai Fung Lau
  • Patent number: 9038282
    Abstract: A method of operating a coordinate positioning apparatus comprising an articulated head having at least one rotational axis. The method comprises, in any suitable order, loading at least one interchangeable task module onto the articulated head; and loading at least one interchangeable task module counterweight on the articulated head. The at least one interchangeable task module counterweight at least partially counterbalances the weight of the at least one task module on the articulated head about the at least one axis.
    Type: Grant
    Filed: April 19, 2011
    Date of Patent: May 26, 2015
    Assignee: RENISHAW PLC
    Inventors: David R. McMurtry, Nicholas J. Weston, Richard G. Dewar, Matthew H. Freeman
  • Publication number: 20150135545
    Abstract: The present disclosure is related to a method of determining a height of an upper surface of an insert relative to a top deck surface of a cylinder block. The method includes detachably coupling a fixture to the top deck surface of the cylinder block. The method also includes disposing a dial gauge on the top deck surface adjacent to each of a plurality of notches defined in the fixture. The method includes inserting a probe of a dial gauge through each of the plurality of notches to contact each of corresponding portions of the upper surface of the insert. The method also includes determining local heights of the upper surface of the insert relative to the top deck surface at the corresponding portions of the upper surface. The height of upper surface of the insert relative to the top deck surface is determined based on the local heights.
    Type: Application
    Filed: January 30, 2015
    Publication date: May 21, 2015
    Applicant: Caterpillar Inc.
    Inventor: Curtis J. Graham
  • Patent number: 9008816
    Abstract: A build up edge monitoring method is provided for performing online real-time detection and suppression of abnormal build up edges of cutters occurred in a CNC manufacturing process. Signal variation analysis and fast Fourier transform are used for analyzing signals and establishing an algorithm of diagnosing build up edges to improve the efficiency and reliability of the cutting abnormality diagnostics. A vibration acceleration signal is captured and filtered to a frequency exceeding 1.1 times of a blade passing frequency, and an occurrence of accumulated chips is determined according to a sudden increase of the vibration acceleration and whether the main vibration frequency of the current vibration signal determined by a fast Fourier transform analysis matches with the frequency of the build up edge characteristic, and a shutdown instruction is issued to a CNC controller to shut down a cutting machine.
    Type: Grant
    Filed: April 25, 2012
    Date of Patent: April 14, 2015
    Assignee: Chung Yuan Christian University
    Inventors: Shih-Ming Wang, Chien-Da Ho
  • Patent number: 8991246
    Abstract: A gear measuring method allows multi-point continuous measurement using a touch probe and is capable of reducing measuring time compared with known methods. For example, a base action for moving a sensing element of a touch probe along an ideal tooth form line of a workpiece (gear; W) or a tooth form line determined by calculation by controlling the movement of the sensing element and the rotation of the workpiece (W) and, in addition, an oscillation action for receiving first signals (ON signals or OFF signals) from the touch probe by bringing the sensing element into contact with the tooth surface of the workpiece during the base action and subsequently for receiving second signals (OFF signals or ON signals) from the touch probe by moving the touch probe in a direction along which the sensing element is separated from the tooth surface of the workpiece are continuously performed.
    Type: Grant
    Filed: September 15, 2010
    Date of Patent: March 31, 2015
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Yoko Hirono, Takahide Tokawa, Naohiro Otsuki, Yoshihiro Nose
  • Publication number: 20150075020
    Abstract: A lever-type measuring machine swinging around a supporting point includes a stylus measuring a shape of a measured object, an arm having a first end connected to the stylus and a second end connected to the supporting point, and a balancer having a first end connected to the supporting point. The balancer is formed of a material having high specific flexural rigidity. The lever-type measuring machine enables more accurate measurement.
    Type: Application
    Filed: September 11, 2014
    Publication date: March 19, 2015
    Inventors: Yasunori MORI, Takeshi YAMAMOTO, Atsushi SHIMAOKA, Tomoyuki MIYAZAKI, Kazuhiko HIDAKA
  • Patent number: 8931325
    Abstract: A measuring device 1 for measuring structures is provided, wherein the measuring device including two inertial measuring units 3, 4 arranged at a distance from each other. The measuring device can be provided with means for engaging the constructions that are measured. Also, an arrangement including a measuring device and a base station 21 providing a reference point for the measuring device is provided. Moreover, a kit including the measuring device and adaptors are provided, wherein the adaptors can provide an interface between the measuring device and a measured construction. A method for measuring a stationary construction is also provided, using a measuring device, preferably a measuring kit.
    Type: Grant
    Filed: December 15, 2009
    Date of Patent: January 13, 2015
    Assignee: Alignment Systems AB
    Inventor: Jonas Bäckman
  • Patent number: 8898919
    Abstract: A portable articulated arm coordinate measuring machine includes a distance meter to measure 3D coordinates of at least three targets to establish a position and orientation of the articulated arm within a frame of reference established by the at least three targets.
    Type: Grant
    Filed: March 24, 2014
    Date of Patent: December 2, 2014
    Assignee: FARO Technologies, Inc.
    Inventors: Robert E. Bridges, Clark H. Briggs, John M. Hoffer, Jr.
  • Patent number: 8869416
    Abstract: A system and method for measuring concentricity between a first component and a second component is provided. The system includes a fixture having a first spring element and a second spring element. The first spring element is configured to apply force in an orthogonal direction to the second spring element. A sensor is mounted to the fixture, and the sensor is configured to measure a distance to the second component. The fixture is configured to slide substantially inside a groove of the first component.
    Type: Grant
    Filed: September 28, 2012
    Date of Patent: October 28, 2014
    Assignee: General Electric Company
    Inventors: Paul Howard Davidson, Jean-Marie Georges Joseph Deschamps, Michael Wayne Rankin
  • Publication number: 20140283402
    Abstract: A contour measuring apparatus includes: an arm including a stylus in a distal end and being swingable with respect to a cabinet; an attitude change mechanism configured to change an attitude of the arm within a swing range; a stopper configured to make contact with the arm when the arm moves nearer to an installation part of an object to be measured within the swing range; and a controller configured to operate the attitude change mechanism based on a power-off command and return the arm to a mechanical limit position in which the arm makes contact with the stopper.
    Type: Application
    Filed: March 20, 2014
    Publication date: September 25, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Hiroyuki Hidaka, Mitsuhisa Nakano, Hideki Kai
  • Patent number: 8782915
    Abstract: A measuring device (10) and method for measuring a surface profile of a workpiece. A measuring carriage (15) is moved in a straight line at a distance from the workpiece surface in a moving direction (x), without accelerating a carried probe tip (25). The free probe end (40) of the probe tip (25) rests on the workpiece surface (11) with a measuring force (Fm) and is deflected during the measurement in a measuring direction (z), transverse to moving direction (x), the surface profile causes a track-dependent deflection (zT) of the probe end (49). A measured value receiver (45) detects the deflecting value (s) describing the deflection of the probe end (40) in measuring direction (z). In an analyzing unit (21), a measuring force change value describing the change of the measuring force (Fm) between the probe end (40) and the workpiece surface (11) is formed for detecting measuring errors/inaccuracies.
    Type: Grant
    Filed: November 4, 2011
    Date of Patent: July 22, 2014
    Assignee: Carl Mahr Holding GmbH
    Inventors: Matthias Reitemeyer, Heinz-Joachim Kedziora
  • Publication number: 20140196296
    Abstract: The present invention relates to an extensometer for measuring high-temperature structural deformations by magnification, the structure of the extensometer is that: two mounting block assemblies are mounted at the planar ends of two extension bars respectively, the top ends of the extension bars are connected tightly with the surface of a test piece, two connecting pieces are mounted at the inner sides of the two mounting block assemblies respectively, a deformation magnifying mechanism and a sensor bracket are mounted on the connecting pieces, a sensor is mounted on the sensor bracket, two connecting pieces are mounted on a same straight line, and the straight line is parallel to a straight line at which the top ends of the two extension bars are located, so as to ensure that the deformation of the test piece is delivered equally to the deformation magnifying mechanism on the connecting pieces.
    Type: Application
    Filed: September 28, 2011
    Publication date: July 17, 2014
    Applicant: EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Shandong Tu, Jiuhong Jia, Xiaoyin Hu, Fuzhen Xuan
  • Patent number: 8763266
    Abstract: A portable coordinate measurement device is provided. The coordinate measurement device includes at least one arm. A bracket is coupled to the arm that includes a magnetic member at one end. A probe is rotationally coupled to one end of the arm, the probe includes a first ferrous member on a first side, the probe is movable between a first position and a second position, wherein the ferrous member is adjacent the magnet when in the second position.
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: July 1, 2014
    Assignee: Faro Technologies, Inc.
    Inventors: Marc M. Barber, Clark H. Briggs
  • Publication number: 20140157564
    Abstract: A contour shape measurement method that can more accurately align an article to be measured to a predetermined position to enable high-precision evaluation even in a state where a probe measurement axis and a table rotation axis do not match with sufficient precision is provided. A spatial position of the table rotation axis relative to the probe measurement axis is obtained as a rotation axis vector. Alignment data obtained in at least two directions is coordinate-transformed around the rotation axis vector, to constitute synthesized alignment data. The article is aligned based on the synthesized alignment data. Since three-dimensional data of a surface to be measured of the article can be calculated, the article can be directly aligned to the probe measurement axis.
    Type: Application
    Filed: December 2, 2013
    Publication date: June 12, 2014
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Akinori Miyata
  • Publication number: 20140144033
    Abstract: A measurement probe, for a co-ordinate positioning apparatus such as a machine tool, is described that includes a stylus holder that is deflectably mounted to a probe housing. One or more sensors are provided for sensing deflection of the stylus holder relative to the probe housing. A processor is included for producing a trigger signal when the deflection sensed by the one or more sensors meets a trigger condition, such as a deflection threshold. The probe also includes an accelerometer for measuring acceleration of the measurement probe. The trigger condition applied by the processor is alterable, during use, in response to the acceleration measured by the accelerometer. In this manner, false triggering can be suppressed.
    Type: Application
    Filed: January 31, 2014
    Publication date: May 29, 2014
    Applicant: Renishaw PLC
    Inventors: Michael John WOOLDRIDGE, Peter Kenneth HELLIER, Robert Charles D'Olier UMFREVILLE
  • Publication number: 20140109423
    Abstract: A stylus support member extends in a first direction. A first and second elastic body attaching members are spaced aside from each other in a second direction are arranged spaced aside from the stylus support member in the first direction, and are connected to each other by first and second members. A first elastic body is arranged between a holder and the first elastic body attaching member. A second elastic body is arranged between a first member and the first elastic body attaching member. A third elastic body is arranged between a second member and the second elastic body attaching member. A fourth elastic body is arranged between the holder and the second elastic body attaching member. A detector detects displacement in the second direction of the stylus support member. The first to fourth elastic members perform lever motion of a single degree of freedom.
    Type: Application
    Filed: October 15, 2013
    Publication date: April 24, 2014
    Applicant: MITUTOYO CORPORATION
    Inventor: Kazuhiko HIDAKA
  • Publication number: 20140090262
    Abstract: A system and method for measuring concentricity between a first component and a second component is provided. The system includes a fixture having a first spring element and a second spring element. The first spring element is configured to apply force in an orthogonal direction to the second spring element. A sensor is mounted to the fixture, and the sensor is configured to measure a distance to the second component. The fixture is configured to slide substantially inside a groove of the first component.
    Type: Application
    Filed: September 28, 2012
    Publication date: April 3, 2014
    Applicant: General Electric Company
    Inventors: Paul Howard Davidson, Jean-Marie Georges Joseph Deschamps, Michael Wayne Rankin
  • Patent number: 8601704
    Abstract: A plug gauge (1) includes a support and protection frame with a handle (2) that defines a longitudinal axis and houses a position transducer (25) and electronic devices for wirelessly transmitting electrical signals indicative of a dimension to be checked. The gauge also comprises a probe (6) including a mechanical armset (7) provided with at least one movable feeler (10), and a transmission mechanism with a stem (17) transmitting movements of the feeler to the position transducer housed in the handle. The probe is connected to the handle by means of a quick coupling mechanism (5) with deformable locking portions (52), the radial arrangement of which is controlled by a clamping element (60).
    Type: Grant
    Filed: March 25, 2010
    Date of Patent: December 10, 2013
    Assignee: Marposs Societa' per Azioni
    Inventor: Mauriziò Dalla Casa
  • Patent number: 8578619
    Abstract: A contact type prove achieves a high-precision measurement of a shape of even a steeply-inclined surface in the vicinity of vertical by controlling a contact force stably. In a shape measuring method for measuring the shape of the surface of a measured object by moving a contact type probe along the surface of the measured object, a slope of the measured object surface is estimated depending on the magnitude of a component force of the contact force applied to the probe and when it is determined that the slope is in the vicinity of vertical, a probe supporting unit is moved in a direction perpendicular to the moving direction of the probe supporting unit.
    Type: Grant
    Filed: January 30, 2012
    Date of Patent: November 12, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Ryusuke Nakajima
  • Patent number: 8561309
    Abstract: A shape measuring device to measure a shape of a workpiece, wherein the shape measuring device includes: the probe; a probe support shaft to pivotally support the probe; and a probe drive device to which the probe support shaft is attached to contact the probe with a measuring position of the workpiece and to move relatively the workpiece and the probe; wherein the probe is a sphere pivotally supported by the probe support shaft and has a cut face which is a shape cut so as to be nearly vertical to the probe support shaft and a shape measurement of a workpiece surface is carried out in such a manner that the cut face of the probe is faced with a face intersecting a face containing the measuring position of the workpiece surface, and a surface of the sphere is contacted with the measuring position of the workpiece.
    Type: Grant
    Filed: February 15, 2010
    Date of Patent: October 22, 2013
    Assignee: Konica Minolta Opto, Inc.
    Inventor: Akihiro Fujimoto
  • Patent number: 8533970
    Abstract: An apparatus for measuring objects, in particular to a coordinate measuring unit, is provided. The unit has a probe which is movable relative to an object to be measured by means of an actuator to sample the surface of the object in a contacting manner, wherein a sampling body, whose front end is designed as a measuring tip for a contact with the object is supported at the probe. The relative position of the measuring tip with respect to the probe is determined. The sampling body is supported at the probe with movement play along at least one direction. A change in the inclination of the sampling body relative to the probe, or vice versa, can be detected via a measurement of a test parameter.
    Type: Grant
    Filed: April 6, 2011
    Date of Patent: September 17, 2013
    Assignee: Stotz Feinmesstechnik GmbH
    Inventor: Milan Stamenkovic
  • Patent number: 8407908
    Abstract: A profile measurement apparatus includes: a probe which includes a gauge head for measuring a profile of an object to be measured and which moves the gauge head within a given range; a movement mechanism which moves the probe; and a controller which measures the profile by controlling the movement mechanism to contact the gauge head against the object. The controller comprises: a movement amount acquisition section which acquires a movement amount of the gauge head from a reference position; a deviation acquisition section which acquires as a deviation the movement amount when the gauge head is in a non-contact state; a determination section which determines whether the deviation is greater than a first threshold value; and a resetting section which, when the deviation is greater than the first threshold value, resets the reference position to a position arrived at by combining the reference position and the deviation.
    Type: Grant
    Filed: June 24, 2011
    Date of Patent: April 2, 2013
    Assignee: Mitutoyo Corporation
    Inventor: Takashi Noda
  • Patent number: 8365426
    Abstract: A coordinate measuring machine for determining spatial coordinates on a measurement object has a frame structure on which a probe head is arranged. The probe head has a probe head sensor system, a body part and a coupling part which can move relative to the body part. The frame structure is designed to move the probe head relative to the measurement object. The probe tool has at least one stylus for making contact with the measurement object, and also has a rotating plate. The stylus is coupled to the coupling part by means of the rotating plate, such that it can rotate. At least one roll motion projection is formed on the body part. The rotating plate can be rolled along this roll motion projection by means of a movement of the coupling part in order to set a defined orientation of the stylus.
    Type: Grant
    Filed: August 5, 2011
    Date of Patent: February 5, 2013
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventor: Otto Ruck