Lamp Beam Direction Or Pattern Patents (Class 356/121)
  • Publication number: 20130088711
    Abstract: A method for aiming headlamps on a vehicle achieves a reduced variation in beam heights without making any changes to existing test equipment. A cutoff height of a first headlamp is measured. The first headlamp is adjusted until a first measured cutoff height is within a predetermined range centered on a predetermined fixed height. A cutoff height of a second headlamp is measured. The second headlamp is adjusted until a second measured cutoff height is within the predetermined range centered on the first measured cutoff height.
    Type: Application
    Filed: October 10, 2011
    Publication date: April 11, 2013
    Applicant: FORD GLOBAL TECHNOLOGIES, LLC
    Inventors: Albert Ekladyous, John W. Wilds, Arun Kumar, Venkatesan Balaraman, Sleiman N. Abdelnour, Mahendra S. Dassanayake, Candace C. Glasgow
  • Patent number: 8415599
    Abstract: The present invention relates to a device for measuring defects of an imaging instrument with a sensor that is accurate, simple to produce and implement and inexpensive. According to the invention, this device comprising at least one second sensor, similar to the first, inclined relative thereto and imaging the same region as the first sensor, and a device for calculating the defocusing of each element of this other sensor.
    Type: Grant
    Filed: November 7, 2008
    Date of Patent: April 9, 2013
    Assignee: Thales
    Inventors: Olivier Pigouche, Didier Dantes
  • Patent number: 8416400
    Abstract: Embodiments of the present invention relate to a wavefront imaging sensor (WIS) comprising an aperture layer having an aperture, a light detector having a surface and a transparent layer between the aperture layer and the light detector. The light detector can receive a light projection at the surface from light passing through the aperture. The light detector can also separately measure amplitude and phase information of a wavefront at the aperture based on the received light projection. The transparent layer has a thickness designed to locate the surface of the light detector approximately at a self-focusing plane in a high Fresnel number regime to narrow the light projection.
    Type: Grant
    Filed: June 2, 2010
    Date of Patent: April 9, 2013
    Assignee: California Institute of Technology
    Inventors: Xiquan Cui, Changhuei Yang
  • Patent number: 8400623
    Abstract: Machines and methods measure an unknown characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the unknown characteristic based on the comparison of the output signal and the computationally determined response of the detector. Another method receives an output signal from an optical detector detecting one or more optical signals, accesses a predetermined characteristic curve of detector response, compares the output signal from the detector to the predetermined characteristic curve of detector response, and calculates at least one unknown characteristic of one or more optical signals based on results of the comparing step.
    Type: Grant
    Filed: November 11, 2011
    Date of Patent: March 19, 2013
    Assignee: Newport Corporation
    Inventors: Prakash Kasturi, Adrian Nastase
  • Publication number: 20130063719
    Abstract: A method for locating the centre of a beam profile, comprises the steps of: providing a beam profile; selecting one or more strips through the beam profile; identifying distinct regions of intensity along the one or more strips and labelling them consistently; calculating a combined average intensity for each labelled region, using data from the one or more strips; plotting the average intensity against the labelled regions and comparing the results with a plot of the actual intensity obtained by taking a cross-section through the centre of at least one of the one or more strips; and optimising the location of the centre of at least one of the one or more strips so as to obtain the best fit between the average intensity plot and the actual intensity plot to thereby identify the centre of the beam profile.
    Type: Application
    Filed: May 26, 2011
    Publication date: March 14, 2013
    Applicant: NIGHTINGALE-EOS LIMITED
    Inventor: Stephen Morris
  • Patent number: 8394490
    Abstract: A film-like structural color body comprises a front surface layer disposed on a front surface side, a back surface layer disposed on a back surface side, and an intermediate layer disposed between the front surface layer and the back surface layer, the front surface layer, the back surface layer and the intermediate layer contain block copolymers and have micro-phase separated structures including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, a maximum value of predetermined distances in the micro domains of the front surface layer and a maximum value of predetermined distances in the micro domains of the back surface layer are larger than the wavelength in the visible light range, and predetermined distances in the micro domains of the intermediate layer are equal to or less than the wavelength in the visible light range.
    Type: Grant
    Filed: June 27, 2012
    Date of Patent: March 12, 2013
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Shigeo Hara, Takahiko Yamanaka
  • Publication number: 20130027690
    Abstract: The spot shape of a laser beam is detected by moving a table holding a detection substrate having a luminescent substance in an X direction and a Y direction with a laser beam focused by a lens applied to an area of the detection substrate where the luminescent substance is located. The intensity of light emitted from the luminescent substance is detected during the movement of the table, and a light intensity map is prepared indicating the light intensities detected in the light intensity detecting step at all of the X and Y coordinates of the luminescent substance. Spot shape images of the laser beam are formed according to a plurality of light intensity maps obtained by positioning the focusing lens at a plurality of detection positions changed in a Z direction perpendicular to a holding surface of the table.
    Type: Application
    Filed: July 20, 2012
    Publication date: January 31, 2013
    Applicant: DISCO CORPORATION
    Inventor: Keiji Nomaru
  • Publication number: 20120314210
    Abstract: A method for characterizing a laser beam profile is provided. The method includes disposing a laser target, moving the surface of the target, directing a laser to emit the beam at the surface, measuring a reflection from the surface as intensities, and averaging the intensities. The target's surface is disposed substantially perpendicular to an incident direction. The surface is reflective at a wavelength corresponding to the laser beam. The travel direction is substantially parallel to the surface. The laser beam travels along said incident direction to the surface. The reflection represents a plurality of intensities having a distribution of positions along the surface and during a temporal interval. The intensities are averaged over the temporal interval for each position of the distribution to produce an analyzed beam profile. Each position corresponds to a speed along the travel direction based on movement of the surface.
    Type: Application
    Filed: March 2, 2011
    Publication date: December 13, 2012
    Applicant: United States Government, as represented by the Secretary of the Navy
    Inventor: Peter L. Wick, JR.
  • Patent number: 8310662
    Abstract: A method for detecting misalignment of a vehicle headlight using a camera system is specified. For this purpose, the headlight is in a predefined position and the camera system is arranged on or in the vehicle and is oriented in such a manner that the light distribution pattern of the headlight in front of the motor vehicle is detected. With a predefined headlight position, an actual light distribution pattern of the headlight is recorded using the camera system and is compared with a desired light distribution pattern for the predefined headlight position. If the actual light distribution pattern differs from the desired light distribution pattern, misalignment of the headlight is detected.
    Type: Grant
    Filed: May 12, 2009
    Date of Patent: November 13, 2012
    Assignee: ADC Automotive Distance Control Systems GmbH
    Inventors: Wilfried Mehr, Thomas Fechner, Stefan Heinrich
  • Patent number: 8289504
    Abstract: A Shack Hartmann (“SH”) wavefront sensor comprising an optical device, such as a wave front dissector including a lenslet array, for transmitting, dissecting and focusing an incoming optical wave, an optical system, including, for example, an optical sensor, for receiving the transmitted incoming optical wave, and a removable kinematic mount for repeatable precision mounting of the optical device to the optical system.
    Type: Grant
    Filed: July 20, 2010
    Date of Patent: October 16, 2012
    Assignee: Thorlabs, Inc.
    Inventors: Alex E. Cable, Egbert Krause, John Taranto
  • Publication number: 20120224171
    Abstract: A vehicle headlight aiming apparatus and method is provided which includes a housing that is vertically and horizontally adjustable along vertical and horizontal tracks. The housing includes a lens for receiving and focusing a headlight beam of a vehicle and forming an image on an internal screen, and a control unit mounted on the housing that is vertically and horizontally pivotable relative to the housing. The housing and the control unit each emit laser beams to configure and measure an alignment of the apparatus to the vehicle. The control unit compensates for an unlevel supporting surface of the apparatus and/or the vehicle and indicates whether the headlight is properly aimed according to a selected aiming standard based on the image, the configuration of the vehicle and the apparatus, and any compensation of any unlevel supporting surface(s) of the apparatus and/or the vehicle.
    Type: Application
    Filed: March 2, 2011
    Publication date: September 6, 2012
    Applicant: AMERICAN AIMERS, INC.
    Inventors: Gregory A. Yotz, John Jay Humbard
  • Patent number: 8259375
    Abstract: The present invention comprises a light modulation optical system having a first element which forms a desired light intensity gradient distribution to an incident light beam and a second element which forms a desired light intensity minimum distribution with an inverse peak shape to the same, and an image formation optical system which is provided between the light modulation optical system and a substrate having a polycrystal semiconductor film or an amorphous semiconductor film, wherein the incident light beam to which the light intensity gradient distribution and the light intensity minimum distribution are formed is applied to the polycrystal semiconductor film or the amorphous semiconductor film through the image formation optical system, thereby crystallizing a non-crystal semiconductor film. The pattern of the first element is opposed to the pattern of the second element.
    Type: Grant
    Filed: May 4, 2010
    Date of Patent: September 4, 2012
    Assignee: Dai Nippon Printing Co., Ltd.
    Inventors: Yukio Taniguchi, Masakiyo Matsumura, Noritaka Akita
  • Patent number: 8258449
    Abstract: A system for calibrating a broadband detector includes a first narrowband telescope for viewing a celestial body, and an earth viewing telescope. The broadband detector is selectively coupled to the first narrowband telescope or the earth viewing telescope. A first narrowband filter is selectively inserted in an optical path of the first narrowband telescope, or the earth viewing telescope. A processor is configured to calibrate the broadband detector based on viewing the celestial body with the first narrowband telescope or the earth viewing telescope, and selectively inserting the first narrowband filter in the optical path. The first narrowband telescope includes a first narrowband filter inside its optical train. The first narrowband filter, which is selectively inserted in the optical path, is spectrally similar to the first narrowband filter inside the optical train of the first narrowband telescope.
    Type: Grant
    Filed: August 18, 2009
    Date of Patent: September 4, 2012
    Assignee: Exelis, Inc.
    Inventor: Grant Matthews
  • Patent number: 8253087
    Abstract: A system for measuring the wavefront characteristics of a powerful laser close to an emitting or transmitting surface of the laser. The system includes a beam sampler that has a sampling aperture for sampling radiation from a sampled area along the emitting or transmitting surface. The beam sampler includes a reflector for directing un-sampled radiation onto an absorber, which absorbs un-sampled radiation. Radiation sampled by the beam sampler is sensed using a sensor.
    Type: Grant
    Filed: August 29, 2007
    Date of Patent: August 28, 2012
    Assignee: Powerphotonic Ltd
    Inventors: Howard Baker, Jesus F. Monjardin-Lopez, Francisco J. Villarreal-Saucedo, Roy McBride
  • Patent number: 8243268
    Abstract: In a method of obtaining an optical constant of each the films of a film-stacked structure formed on a substrate, a basic process obtains an optical constant of each of the films by successively providing the films one by one as a target film from bottom to top and obtaining an optical constant of the target film by using a previously obtained optical constant of a below-located film that is located below the target film and a re-obtaining process re-obtains the optical constant of each of the films by correcting the previously obtained optical constant of the below-located film and the optical constant of the target film obtained in the basic process.
    Type: Grant
    Filed: August 19, 2009
    Date of Patent: August 14, 2012
    Assignee: Tokyo Electron Limited
    Inventor: Toshihiko Kikuchi
  • Patent number: 8237922
    Abstract: An apparatus that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a high power laser beam. The apparatus employs the optics used in a process application, including a focus lens and cover glass. An attenuation module includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. A beam dump is positioned out of a path of travel of the laser beam and in receiving relation to light reflected by the first and second mirrors. A camera detects spots of light that pass through the first and second mirrors. A high power attenuator formed by a highly reflective mirror pair is positioned between the source and the attenuation module. A second embodiment includes a single mirror plate having highly reflective surfaces.
    Type: Grant
    Filed: April 8, 2010
    Date of Patent: August 7, 2012
    Assignee: Haas Laser Technologies, Inc.
    Inventor: Michael J. Scaggs
  • Patent number: 8217326
    Abstract: A method for calibrating a spectrometer, while orbiting a celestial body, includes the steps of: (a) obtaining an estimate of radiance emanating from the celestial body; (b) raster scanning the celestial body using the spectrometer; (c) measuring filtered radiance of the celestial body based on step (b); and (d) determining gain of the spectrometer using steps (a) and (c). A calibrated spectrometer of the present invention is based on the determined gain of step (d). The method includes the step of: (e) raster scanning another celestial body to determine the albedo radiance of the other celestial body, after determining gain of the spectrometer in step (d). The celestial body may be the moon and the other celestial body may be the Earth.
    Type: Grant
    Filed: August 10, 2010
    Date of Patent: July 10, 2012
    Assignee: Exelis, Inc.
    Inventor: Grant Matthews
  • Publication number: 20120146517
    Abstract: The invention describes a light sensor (1) comprising a filter arrangement (11), which filter arrangement (11) comprises a number of spectral filters (F1, F2, . . . , Fn) for filtering incident light (L), wherein a spectral filter (F1, F2, . . . , Fn) is realized to pass a distinct component of the incident light (L), an aperture arrangement (12) for admitting a fraction of the incident light (L), and a sensor arrangement (13) realized to collect the admitted filtered light (L?), which sensor arrangement (13) comprises an array of sensor elements (130) for generating image-related signals (S, S1, S2, . . . , Sn) and which sensor array is sub-divided into a number of regions (R1, R2, . . . , Rn), wherein a region (R1, R2, . . . , Rn) of the sensor array is allocated to a corresponding spectral filter (Fi, F2, . . . , Fn) such that an image-related signal (S) generated by a sensor element (130) of a particular region (R1, R2, . . .
    Type: Application
    Filed: August 25, 2010
    Publication date: June 14, 2012
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Hendrikus Hubertus Petrus Gommans, Marcellinus Petrus Carolus Michael Krijn, Hugo Johan Cornelissen
  • Patent number: 8184275
    Abstract: Vehicle headlamp illumination is monitored and data is communicated to a host control unit. The host control unit implements a network accessible user interface to communicate with a user computer, which can include a graphical display of illumination information as well as a numerical indication of an automatically detected location of the edge of the headlamp beam. The network accessible user interface can also include the capability to manually audit the headlamp beam by allowing a user to specify a headlamp beam location, which will then update system parameters. The network accessible user interface may be a web-based interface where the host control unit implements a web server and the user computer is running a web browser. The system can include a collection of intelligent, independent sensor units, each incorporating a vertical array of sensing elements capable of detecting headlamp illumination.
    Type: Grant
    Filed: August 22, 2011
    Date of Patent: May 22, 2012
    Inventor: Stephen Waller Melvin
  • Publication number: 20120120390
    Abstract: A direction sensor (200) includes sensor cells (215) that respectively correspond to different directions. Each of the sensor cells (215) includes a light sensor (130, 140) and a grating (120) that couples incident light into the light sensor (130, 140) when the incident light has a specific wavelength and is incident on the grating (120) along the direction corresponding to the sensor cell (215).
    Type: Application
    Filed: July 31, 2009
    Publication date: May 17, 2012
    Inventors: David A. Fattal, Raymond G. Beausoleil, Joanna Duligall, Radu Ionicioiu
  • Patent number: 8156830
    Abstract: A plurality of fluorescent lamps 30 are in a decentered layout so as to be placed in a peripheral part of an upper space of an environmental test chamber 11 above a sample loading surface 21. The irradiance distribution of light from the fluorescent lamps 30 over the sample loading surface 21 is in the range of ±25% relative to the irradiance at the center of the sample loading surface 21.
    Type: Grant
    Filed: November 5, 2007
    Date of Patent: April 17, 2012
    Assignee: Nagano Science Co., Ltd.
    Inventors: Ryuichi Kaji, Satoshi Koide, Kenji Matsushita
  • Patent number: 8125628
    Abstract: A light baffle arrangement for sensors is used to limit the sensing field of view. Arranging multiple said limited view sensors in a linear array provides a means to accurately locate and analyze the position of a beam pattern along said array axis as in checking vehicle headlamp beam alignment.
    Type: Grant
    Filed: January 17, 2009
    Date of Patent: February 28, 2012
    Inventor: Joe J. Lones
  • Publication number: 20120002193
    Abstract: A joulemeter is capable of non-destructively measuring multiple characteristics of a laser beam. The joulemeter comprises a series of parallel probe beams, which are directed though a transparent media adjacent to an absorbing media that the tested beams pass through. Arrays of optical sensors or a chirp sensor are used to intercept and measure deflections the probe beams. A control unit renders measurements on selected properties of the laser.
    Type: Application
    Filed: August 11, 2008
    Publication date: January 5, 2012
    Inventors: William Rowe Elliott, Randolph D. Glickman, Norman Barsalou, Saher M. Maswadi
  • Publication number: 20110317152
    Abstract: A mirror structure is provided in which at least a portion of a wavefront sensor is integrated with a mirror. In particular, a mirror structure is provided in which a Hartmann mask or a microlens array of a Shack-Hartmann wavefront sensor is integrated with a mirror to provide a very compact wavefront detector/corrector in a single device. Such a mirror structure may be used in a laser cavity to simplify adaptive optics in the cavity. Furthermore, a Hartmann Mask may be integrated with self deforming mirror comprising an active PZT layer bonded to a passive mirror substrate, wherein the Hartmann Mask comprises an array of apertures formed through the active PZT layer.
    Type: Application
    Filed: November 16, 2009
    Publication date: December 29, 2011
    Inventors: Michael Stewart Griffith, Leslie Charles Laycock, Peter Blyth
  • Publication number: 20110315897
    Abstract: Disclosed herein is a method and apparatus for automatic correction of beam waist position drift in real time, using wafer inspection data taken during normal tool operation. Also disclosed herein is an improved laser astigmatism corrector for use either internal or external to the laser.
    Type: Application
    Filed: June 6, 2011
    Publication date: December 29, 2011
    Inventors: Anatoly Romanovsky, George Kren, Bret Whiteside
  • Publication number: 20110298912
    Abstract: Devices and approaches for addressing wavefront corruption in biometric applications. A biometric imaging system may have a laser, a wavefront sensor, and an optical system. The laser may be configured to project a laser spot onto a skin portion of a human face, and the optical system may be configured to collect scattered light from the laser spot and relay the light to the wavefront sensor. The biometric imaging system may also have an adaptive optical element and a controller configured to provide actuation commands to the adaptive optical element based at least in part upon a wavefront distortion measurement output from the wavefront sensor. The optical system may further be configured to relay image light to an image camera of the optical system. The image camera may be an iris camera configured for obtaining iris images suitable for biometric identification.
    Type: Application
    Filed: June 2, 2010
    Publication date: December 8, 2011
    Applicant: HONEYWELL INTERNATIONAL INC.
    Inventors: Jan Jelinek, Kendall Lee Belsley
  • Patent number: 8072587
    Abstract: A machine and methods measure a characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the characteristic based on a relationship between the output signal and the computationally determined response. Another method observes an output signal from an optical detector detecting one or more optical signals, accesses a characteristic curve of detector response, compares the observed output signal to the characteristic curve, and calculates at least one characteristic of one or more optical signals based on a relationship of the observed output signal and the characteristic curve.
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: December 6, 2011
    Assignee: Newport Corporation
    Inventors: Prakash Kasturi, Adrian Nastase
  • Patent number: 8064058
    Abstract: A disclosed optical testing apparatus comprises: a plurality of optical fibers, each optical fiber having a collection end in optical communication with an output end; and a support member supporting the collection ends of the optical fibers so as to simultaneously view an examination region from different angles. A disclosed optical testing apparatus comprises a plurality of optical fibers having collection ends arranged to simultaneously view an examination region from a plurality of different angles. A disclosed optical testing apparatus comprises a plurality of optical fibers, each optical fiber having a collection end, the collection ends of the optical fibers arranged in fixed spatial relationship respective to one another to simultaneously view an examination region from different angles.
    Type: Grant
    Filed: July 15, 2008
    Date of Patent: November 22, 2011
    Assignee: GE Lighting Solutions, LLC
    Inventors: Boris Kolodin, Emil Radkov, Mark J. Mayer
  • Patent number: 8059266
    Abstract: Systems and methods for measuring stray light in a lithographic apparatus are described using Radiometric Kirk Test (also known as Scanning SAMOS Test). The Radiometric Kirk Test of the present invention involves a test pattern having an isolated dark area within a much larger bright field. The radiometric Kirk test includes at least two continuous or stepped scans of an aperture of a detector in an image plane of a lithographic system. During a dark area measurement, the aperture of the detector is positioned such that at least at one point the aperture of the detector is centered within an image of the dark area. During a bright area measurement, the aperture of the detector is positioned within the image of the bright field. The integrated detector signal is correspondingly computed for the dark area measurement and the bright area measurement.
    Type: Grant
    Filed: September 23, 2008
    Date of Patent: November 15, 2011
    Assignees: ASML Holding N.V., ASML Netherlands B.V.
    Inventors: David A. Hult, Heine Melle Mulder, Minne Cuperus
  • Patent number: 8049874
    Abstract: A method for measuring illuminance of a lamp utilizes at least one illuminance meter and a rotary apparatus. The lamp is installed on the rotary apparatus. The lamp emits light and projects onto an irradiation area. A measurement area is defined from within the irradiation area. The measurement area is evenly divided into n sub-measurement areas, wherein n is a natural number. The n sub-measurement areas are centrosymmetric. At least one illuminance meter measuring illuminance of the lamp is disposed on one of the n sub-measurement areas. The rotary apparatus drives the lamp to rotate 360/n° in turn. The single illuminance meter measures illuminance of the lamp in other (n?1) sub-measurement areas.
    Type: Grant
    Filed: December 9, 2008
    Date of Patent: November 1, 2011
    Assignee: Hon Hai Precision Industry Co., Ltd.
    Inventor: Sei-Ping Louh
  • Publication number: 20110249256
    Abstract: An apparatus that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a high power laser beam. The apparatus employs the optics used in a process application, including a focus lens and cover glass. An attenuation module includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. A beam dump is positioned out of a path of travel of the laser beam and in receiving relation to light reflected by the first and second mirrors. A camera detects spots of light that pass through the first and second mirrors. A high power attenuator formed by a highly reflective mirror pair is positioned between the source and the attenuation module. A second embodiment includes a single mirror plate having highly reflective surfaces.
    Type: Application
    Filed: April 8, 2010
    Publication date: October 13, 2011
    Inventor: Michael J. Scaggs
  • Publication number: 20110242526
    Abstract: The present invention relates to light sensors for measuring light characteristics. In particular, the present invention relates to a light directionality sensor that is capable of measuring light characteristics such as the light direction, light collimation, and light distribution. According to a first aspect of the present invention there is provided a light directionality sensor comprising a photo-sensor (2), comprising a plurality of photo-sensitive elements (3), and a plurality of light-absorbing light selecting structures (1) arranged on the photo-sensor so as to form an array of light-absorbing light selecting structures. In the array of light-absorbing light selecting structures, a succession of at least some of the light-absorbing light selecting structures has varying structural characteristics.
    Type: Application
    Filed: October 6, 2009
    Publication date: October 6, 2011
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Ties Van Bommel, Eduard J. Meijer, Rifat A. M. Hikmet, Hendrik A. Van Sprang, Marcus A. Verschuuren
  • Publication number: 20110211190
    Abstract: A mirror structure is provided in which at least a portion of a wavefront sensor is integrated with a mirror. In particular, a mirror structure is provided in which a Hartmann mask or a microlens array of a Shack-Hartmann wavefront sensor is integrated with a mirror to provide a very compact wavefront detector/corrector in a single device. Such a mirror structure may be used with a tip-tilt stage in a laser cavity to provide much simplified adaptive optics in the cavity. Furthermore, a Hartmann Mask may be integrated with self deforming mirror comprising an active PZT layer bonded to a passive mirror substrate, wherein the Hartmann Mask comprises an array of apertures formed through the active PZT layer.
    Type: Application
    Filed: November 5, 2009
    Publication date: September 1, 2011
    Inventors: Michael Stewart Griffith, Leslie Charles Laycock, Peter Blyth
  • Patent number: 8009280
    Abstract: A system, for determining characteristics of a beam wavefront and reshaping such wavefront, including: apparatus for sampling the wavefront curvature and generating outputs; apparatus for reshaping the wavefront; and apparatus for receiving the outputs, proportioning the outputs to match the inputs need to drive controls for the reshaping apparatus, and sending the proportioned outputs to the reshaping apparatus. The reshaping apparatus is, preferably, a deformable mirror. The sampling apparatus includes a distorted grating. The method includes: positioning the sampling apparatus in the bean path; positioning a reshaping apparatus in the beam path; sampling the curvature of the wavefront and generating outputs representative of the curvature thereof; sending the generated outputs to the proportioning apparatus; proportioning the outputs to match the inputs needed to drive the controls of the reshaping apparatus; and sending the proportioned outputs to the reshaping apparatus to change the shape thereof.
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: August 30, 2011
    Inventors: Gavin R. G. Erry, Paul Harrison, Boyd Hunter, Eugene W. Butler
  • Patent number: 8004663
    Abstract: Headlamp alignment is detected using a collection of intelligent, independent sensor units, each of which incorporates a vertical array of sensing elements capable of detecting headlamp illumination. The sensor units are networked together and can be coupled to a host controller. The host controller can provide a user interface via a touch screen and a Web server, and can further communicate with a plant network for interfacing with manufacturing databases. The network of sensor units can accommodate four or more sensors, which allows multiple vehicles and multiple headlamp types to be audited without physical movement of the sensor units. The sensor units are low in power consumption and can receive power over the same cable providing network communication. Incorporation of non-volatile memory within the sensor units allows factory data to be recorded within each sensor unit and permits convenient replacement of units in the field.
    Type: Grant
    Filed: January 25, 2011
    Date of Patent: August 23, 2011
    Inventor: Stephen Waller Melvin
  • Patent number: 7990520
    Abstract: The disclosure relates to microlithography systems, such as EUV microlithography illumination systems, as well as related components, systems and methods.
    Type: Grant
    Filed: December 17, 2007
    Date of Patent: August 2, 2011
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Berndt Warm, Guenther Dengel
  • Publication number: 20110176069
    Abstract: Embodiments of the present invention generally relate to circuits, systems and methods that can be used to detect light beam misalignment, so that compensation for such misalignment can be performed. In accordance with an embodiment, a circuit includes a photo-detector (PD) having a plurality of electrically isolated PD segments. Additionally, the circuit has circuitry, including switches, configured to control how currents indicative of light detected by the plurality of electrically isolated PD segments are arithmetically combined. When the switches are in a first configuration, a signal produced by the circuitry is indicative of vertical light beam alignment. When the switches are in a second configuration, the signal produced by the circuitry is indicative of horizontal light beam alignment. The signals indicative of vertical light beam alignment and horizontal light beam alignment can be used detect light beam misalignment, so that compensation for such misalignment can be performed.
    Type: Application
    Filed: August 25, 2010
    Publication date: July 21, 2011
    Applicant: INTERSIL AMERICAS INC.
    Inventors: Daryl Chamberlin, Dong Zheng
  • Publication number: 20110134415
    Abstract: A method for correcting a wave front analyzer, in which the analyzer detects a signal from an incident wave front to be analyzed (FO), the detected signal providing phase and intensity local information. The method includes correcting the phase computation according to intensity space variations. A wave front analyzer for implementing the method is also described.
    Type: Application
    Filed: October 16, 2007
    Publication date: June 9, 2011
    Applicant: IMAGINE OPTIC
    Inventors: Xavier Levecq, Guillaume Dovillaire
  • Publication number: 20110122385
    Abstract: A two-stage homogenizer comprising a first homogenizer stage and a second homogenizer stage. The first homogenizer stage includes a pair of microlens arrays and associated focusing optics. The second homogenizer stage includes a second pair of microlens arrays and associated focusing optics. The second homogenizer stage is positioned to receive radiation which is output from the first homogenizer stage.
    Type: Application
    Filed: October 21, 2010
    Publication date: May 26, 2011
    Applicant: ASML Netherlands B.V.
    Inventors: Bert Jan CLAESSENS, Marcel Mathijs Theodore Marie DIERICHS, Herman Philip GODFRIED
  • Patent number: 7928351
    Abstract: System and method for estimating and correcting an aberration of an optical system. The method includes capturing a first plurality of images on a first plurality of planes. The first plurality of images is formed by at least the optical system. Additionally, the method includes processing at least information associated with the first plurality of images, and determining a first auxiliary function based upon at least the information associated with the first plurality of images. The first auxiliary function represents a first aberration of the optical system. Moreover, the method includes adjusting the optical system based upon at least information associated with the first auxiliary function.
    Type: Grant
    Filed: May 10, 2004
    Date of Patent: April 19, 2011
    Assignee: Lockheed Martin Corporation
    Inventors: Gopal Vasudevan, Robert Duncan Reardon, Eric Hartel Smith, Kenneth John Triebes
  • Patent number: 7916769
    Abstract: An optical package includes a semiconductor laser, an adjustable mirror and a wavelength conversion device comprising a waveguide portion. The semiconductor laser, adjustable mirror, and wavelength conversion device are oriented to form an optical pathway between an output of the semiconductor laser and an input of the wavelength conversion device. The beam of the semiconductor laser is directed along the optical pathway and onto the adjustable mirror where the beam is reflected by the adjustable mirror onto the waveguide portion of the wavelength conversion device. The adjustable mirror may also be either thermally or mechanically deformable such that, when the adjustable mirror is deformed, the path of the beam along the optical pathway is altered thereby focusing the beam on the waveguide portion of the wavelength conversion device. The adjustable mirror may be adjusted such that the beam of the semiconductor laser is positioned on the waveguide portion of the wavelength conversion device.
    Type: Grant
    Filed: April 22, 2009
    Date of Patent: March 29, 2011
    Assignee: Corning Incorporated
    Inventors: Jacques Gollier, Garrett Andrew Piech
  • Patent number: 7916310
    Abstract: A measurement apparatus disclosed that has a radiation source configured to provide a measurement beam of radiation such that an individually controllable element of an array of individually controllable elements capable of modulating a beam of radiation, is illuminated by the measurement beam and redirects the measurement beam, and a detector arranged to receive the redirected measurement beam and determine the position at which the redirected measurement beam is incident upon the detector, the position at which the redirected measurement beam is incident upon the detector being indicative of a characteristic of the individually controllable element.
    Type: Grant
    Filed: August 26, 2010
    Date of Patent: March 29, 2011
    Assignee: ASML Netherlands B.V.
    Inventor: Eduard Martinus Klarenbeek
  • Publication number: 20110069303
    Abstract: A method for detecting misalignment of a vehicle headlight using a camera system is specified. For this purpose, the headlight is in a predefined position and the camera system is arranged on or in the vehicle and is oriented in such a manner that the light distribution pattern of the headlight in front of the motor vehicle is detected. With a predefined headlight position, an actual light distribution pattern of the headlight is recorded using the camera system and is compared with a desired light distribution pattern for the predefined headlight position. If the actual light distribution pattern differs from the desired light distribution pattern, misalignment of the headlight is detected.
    Type: Application
    Filed: May 12, 2009
    Publication date: March 24, 2011
    Applicant: ADC AUTOMOTIVE DISTANCE CONTROL SYSTEMS GMBH
    Inventors: Wilfried Mehr, Thomas Fechner, Stefan Heinrich
  • Patent number: 7907261
    Abstract: An optical axis inspection apparatus is provided with: a camera for capturing a light distribution pattern of a light source device projected on a screen; an image processing device for finding a cutoff line in the light distribution pattern; an acceptance reference cutoff line setting unit; and a shade having an oblong slit and arranged to be opposed to a projection lens of the projection type light source device. Whether or not an optical axis is proper is inspected based oh a shift of the cutoff line with respect to the acceptance reference cutoff line. Only a transmissive light passing through a substantially central portion in a vertical direction of a projection lens including an optical axis of the projection lens is guided onto the screen by the shade.
    Type: Grant
    Filed: September 11, 2008
    Date of Patent: March 15, 2011
    Assignee: Koito Manufacturing Co., Ltd.
    Inventor: Tetsuaki Inaba
  • Patent number: 7876427
    Abstract: Headlamp alignment is detected using a collection of intelligent, independent sensor units, each of which incorporates a vertical array of sensing elements capable of detecting headlamp illumination. The sensor units are networked together and can be coupled to a host controller. The host controller can provide a user interface via a touch screen and a Web server, and can further communicate with a plant network for interfacing with manufacturing databases. The network of sensor units can accommodate four or more sensors, which allows multiple vehicles and multiple headlamp types to be audited without physical movement of the sensor units. The sensor units are low in power consumption and can receive power over the same cable providing network communication. Incorporation of non-volatile memory within the sensor units allows factory data to be recorded within each sensor unit and permits convenient replacement of units in the field.
    Type: Grant
    Filed: January 17, 2009
    Date of Patent: January 25, 2011
    Inventor: Stephen Waller Melvin
  • Publication number: 20110013178
    Abstract: A Shack Hartmann (“SH”) wavefront sensor comprising an optical device, such as a wave front dissector including a lenslet array, for transmitting, dissecting and focusing an incoming optical wave, an optical system, including, for example, an optical sensor, for receiving the transmitted incoming optical wave, and a removable kinematic mount for repeatable precision mounting of the optical device to the optical system.
    Type: Application
    Filed: July 20, 2010
    Publication date: January 20, 2011
    Applicant: THORLABS, INC.
    Inventors: Alex E. Cable, Egbert Krause, John Taranto
  • Publication number: 20110013177
    Abstract: An apparatus and method for verifying a laser etch on a rubber sample. In one embodiment, the apparatus includes a tire production line, a sample holding device, a laser having a diode, and a servo-assembly. The laser of the apparatus is configured to etch indicia on a sidewall of a tire on the tire production line and is further configured to etch at least one line in a rubber sample on the sample holding device. In one embodiment, the method includes etching a production tire with a laser, interrupting the laser, moving the laser to a laser diode testing location, loading a rubber sample in a holding device, etching at least one line into the rubber sample with the laser, manually or automatically measuring a depth of the at least one line, and comparing the depth of the at least one line to an acceptable line depth range.
    Type: Application
    Filed: July 16, 2009
    Publication date: January 20, 2011
    Applicant: BRIDGESTONE AMERICAS TIRE OPERATIIONS, LLC
    Inventor: J. Daniel Crim
  • Publication number: 20110001960
    Abstract: The present invention relates to a wavefront sensor using a pair of screens, each having a two-dimensional array of circular apertures, to achieve Moiré effects, and its use to measure the slope of a wavefront.
    Type: Application
    Filed: October 29, 2008
    Publication date: January 6, 2011
    Applicant: WF Systems, LLC
    Inventor: Anthony Y. Van Heugten
  • Publication number: 20100309457
    Abstract: Embodiments of the present invention relate to a wavefront imaging sensor (WIS) comprising an aperture layer having an aperture, a light detector having a surface and a transparent layer between the aperture layer and the light detector. The light detector can receive a light projection at the surface from light passing through the aperture. The light detector can also separately measure amplitude and phase information of a wavefront at the aperture based on the received light projection. The transparent layer has a thickness designed to locate the surface of the light detector approximately at a self-focusing plane in a high Fresnel number regime to narrow the light projection.
    Type: Application
    Filed: June 2, 2010
    Publication date: December 9, 2010
    Inventors: Xiquan Cui, Changhuei Yang
  • Patent number: 7804603
    Abstract: A measurement apparatus disclosed that has a radiation source configured to provide a measurement beam of radiation such that an individually controllable element of an array of individually controllable elements capable of modulating a beam of radiation, is illuminated by the measurement beam and redirects the measurement beam, and a detector arranged to receive the redirected measurement beam and determine the position at which the redirected measurement beam is incident upon the detector, the position at which the redirected measurement beam is incident upon the detector being indicative of a characteristic of the individually controllable element.
    Type: Grant
    Filed: October 3, 2006
    Date of Patent: September 28, 2010
    Assignee: ASML Netherlands B.V.
    Inventor: Eduard Martinus Klarenbeek