Abstract: In an embodiment of the disclosure, there is provided an apparatus for calibrating a laser projection system. The apparatus has a structural frame assembly extending along three mutually orthogonal axes. The apparatus further has a plurality of non-movable reflective targets disposed on the structural frame assembly. The apparatus further has at least three positioning stages coupled to the structural frame assembly respectively about each of the three mutually orthogonal axes. At least one movable reflective target is disposed on each positioning stage. The non-movable reflective targets and the at least one movable reflective target are each configured to reflect a laser beam from a laser projection system.

Abstract: A laser patterning examining apparatus includes a fixing plate, a rotating plate configured to move vertically with respect to the fixing plate and to rotate, a housing connected to the rotating plate, a laser emission unit over the fixing plate and emits a laser beam, a prism unit on the housing and refracts a first portion of the laser beam received from the laser emission unit and transmits a second portion of the laser beam, and a beam profiler on the housing and analyzes the pattern of the first portion refracted by the prism unit.

Abstract: The disclosure relates to a scanning device for detecting the contour of an object. The scanning device has a light source for generating a light pattern on the surface area of the object, and a camera for detecting the light pattern on the surface area of the object. The disclosure describes that the one light source includes at least one incoherent spot light source, and that between the at least one spot light source and the object, a shadow caster defines the light pattern on the surface area of the object. The disclosure also relates to a method for detecting the contour of an object.

Abstract: An aligning method is provided. The aligning method includes: fixing a plurality of lenses and a beam combining unit in a fixing base; respectively disposing a plurality of light emitting units in a plurality of holders; leaning the holders on the fixing base, and respectively corresponding locations of the light emitting units to locations of the lenses; turning on the light emitting units, and enabling the light beams respectively emitted by the light emitting units to be combined by the beam combining unit after respectively passing through the lenses; and respectively adjusting positions of at least part of the light emitting units by using at least one jig to respectively hold the at least part of the light emitting units until an overlapping degree of the light beams combined by the beam combining unit matches a preset requirement. In addition, an optical apparatus is provided as well.

Abstract: A system for obtaining a propagation factor for determining the performance of a light beam (32) includes a light sensor (10), a lens element (30) operable to focus a beam from a light source to be tested towards the sensor element (10); wherein the lens element is a variable focus lens (30).

Abstract: A system and method for searching an incident light field for atypical regions (e.g., hot spots or cool spots or spectrally distinctive regions) within the incident light field using a light modulator and a spectral sensing device. Once the atypical regions are identified, the light modulator may be used to mask the incident light field so that the spectral sensing device can make spatially-concentrated measurements of the wavelength spectrum of the atypical regions (or alternatively, the exterior of the atypical regions). Furthermore, in a compressive imaging mode, a sequence of spatial patterns may be supplied to the light modulator, and a corresponding sequence of wavelength spectra may be collected from the spectral sensing device. The wavelength spectra comprise a compressed representation of the incident light field over space and wavelength. The wavelength spectra may be used to reconstruct a multispectral (or hyperspectral) data cube.

Abstract: A system for determining the spatial orientation of a movable apparatus includes at least one optical angle-of-arrival (OAOA) sensor array, each of which comprises multiple OAOA sensors arranged to provide a 360° field-of-view (FOV). At least one sensor array is mounted on and has a known spatial relationship to a movable apparatus, the spatial orientation of which is to be determined. Point sources are located at one or more stationary positions within the FOV of at least one of the mounted arrays. An initial-north-finding/initial-vertical-finding (INF/INV) system determines the spatial orientation of at least one of the point sources. Processing circuitry coupled to the INF/INV system and the sensor arrays derives the spatial orientation of the mounted arrays—and thereby the spatial orientation of the apparatus—based on the angular positions of the stationary point sources detected by the mounted arrays.

Abstract: An analyzer of the spatial intensity distribution of a laser beam focused or transmitted by an optical fiber comprises: a shaping lens; a device for taking a partial sample of the beam; a heat sink; a photodiode; an imaging lens to form images of the plane on an image sensor; a motorization of the shaping lens to translate along the optical axis; a motorization of the imaging lens to translate in a plane perpendicular to the optical axis; a motorization of the image sensor to translate along the optical axis; an electronic unit controlling each motorization; an electronic unit synchronizing the image sensor, connected to the photodiode to synchronize image capture with the laser pulses or in the pulses; an electronic unit adjusting the aperture and/or gain of the image sensor; and a software interface parameterizing and piloting the electronic control units, equipped with an image processing unit.

Abstract: A joulemeter is capable of non-destructively measuring multiple characteristics of a laser beam. The joulemeter comprises a series of parallel probe beams, which are directed though a transparent media adjacent to an absorbing media that the tested beams pass through. Arrays of optical sensors or a chirp sensor are used to intercept and measure deflections the probe beams. A control unit renders measurements on selected properties of the laser.

Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

Abstract: Methods, systems, and structures for monitoring incident beam position in a wafer inspection system are provided. One structure includes a feature formed in a chuck configured to support a wafer during inspection by the wafer inspection system. The chuck rotates the wafer in a theta direction and simultaneously translates the wafer in a radial direction during the inspection. An axis through the center of the feature is aligned with a radius of the chuck such that a position of the axis relative to an incident beam of the wafer inspection system indicates changes in the incident beam position in the theta direction.

Abstract: Disclosed is a method for operating a test apparatus for an LED lamp. The method includes: forming a self-holding circuit by switching on a first switching means such that an up and down shifter provided in the test apparatus for the LED lamp moves down; moving down and stopping the up and down shifter from a determined initial position to a measurement position; measuring the quality of the LED lamp equipped with the test apparatus for the LED lamp; releasing the self-holding circuit by switching on the second switching means such that the up and down shifter moves up; and moving up and down shifter from the measurement position to the determined initial position.

Abstract: Disclosed is test structure for measuring wave-front aberration of an extreme ultraviolet (EUV) inspection system. The test structure includes a substrate formed from a material having substantially no reflectivity for EUV light and a multilayer (ML) stack portion, such as a pillar, formed on the substrate and comprising a plurality of alternating pairs of layers having different refractive indexes so as to reflect EUV light. The pairs have a count equal to or less than 15.

Abstract: A light distribution characteristic measurement apparatus includes: a detecting unit for detecting light from a light source; a mirror for reflecting the light from the light source to direct the light to the detecting unit; a movement mechanism for moving the detecting unit and the mirror relatively to the light source; a rotation mechanism for rotating the mirror while maintaining an optical path length from the light source to the detecting unit; and a processor adapted to calculate the light distribution characteristic of the light source, based on a plurality of measurement results that are detected by the detecting unit under a condition that the detecting unit and the mirror are arranged at a plurality of measurement positions relative to the light source and the mirror is oriented at different rotational angles for each measurement position.

Abstract: Various systems and methods for estimating the position of a radiation source in three-dimensional space, together with sensors for use in such systems are described. In some embodiments, the systems include a plurality of radiation sensors. The three-dimensional position of the radiation source is estimated relative to each sensor using an aperture that casts shadows on a radiation detector as a function of the incident angle of the incoming radiation. In some embodiments, the ratio of a reference radiation intensity to a measured radiation intensity is used to estimate direction of the radiation source relative to the sensor. When the angular position of the radiation source is estimated relative to two sensors, the position of the radiation source in three dimensions can be triangulated based on the known relative positions of the two sensors.

Abstract: An apparatus and method for measuring the aim of vehicle headlamps including measuring the light intensity of a light beam emitted by a vehicle headlamp to check the aim of the vehicle headlamp. The apparatus includes a linear photosensitive array having a plurality of individual photo sensors positioned between a plurality of baffles. The array is movably mounted to a frame whereby it can be positioned at predetermined locations to measure light beam intensity and correspondingly determine the beam pattern and aim point of a headlamp.

Abstract: A wavefront measuring method using a Shack-Hartmann sensor includes the steps of provisionally determining one of a plurality of light receiving elements as a center-of-gravity position in a spot having a light intensity distribution of light condensed on the light receiving element, calculating a distance between the provisionally determined center-of-gravity position and an adjacent center-of-gravity position, setting an area smaller than and inside of a spot that partially overlaps another spot, and setting a spot that does not overlap another spot to the area, calculating a center-of-gravity position for each area, and calculating the wavefront based upon a shift amount between an ideal center-of-gravity position when parallel light enters the micro lens array and the center-of-gravity position of each area.

Abstract: In a method for determining the focal point or the beam profile of a laser beam, which can be deflected in the x and y directions by a scanner optic or an x-y-movement unit and can be displaced in the z direction by a focusing optic or a z-movement unit, at a plurality of measurement points in the two-dimensional working field or three-dimensional working space of the laser beam. An aperture diaphragm, followed by a detector, is arranged at each measurement point. At each measurement point, for x-y-focal point or beam profile measurements, the laser beam is moved by the scanner optic or the x-y-movement unit in an x-y-grid over the measurement aperture in the aperture diaphragm, and, at each grid point, the laser power is measured by the detector, the scanner axis of the scanner optic or the x-y-movement unit being stationary. For z-focal point measurements, the laser beam is displaced by the focusing optic or the z-movement unit in the z direction within the measurement aperture in the aperture diaphragm.

Abstract: This invention relates to a light angle selecting light detector device comprising a detector unit which is arranged to receive light selected by a selector unit. The device comprising at least one set of light passing areas. Each set of light passing areas consists of a first light passing area having a first size, which first light passing area is located on a first surface, and a second light passing area having a second size, which second light passing area is located on a second surface. The first light passing area and the second light passing area are arranged with a lateral displacement and form a light path from the first surface to the second surface for light having an incident angle between a maximum angle and a minimum angle.

Abstract: An apparatus having a linear structure that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a low power laser beam. A laser beam source transmits a laser beam through a focusing lens, a Fabry-Perot resonator, a pair of polarizers and a camera that detects spots of light that pass through the first and second mirrors and the polarizers. The resonator includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. The polarizers are disposed at an opposite angle of incidence and are rotationally adjustable to enable intensity adjustment of the camera.

Abstract: A vehicle headlight aiming apparatus and method is provided which includes a housing that is vertically and horizontally adjustable along vertical and horizontal tracks. The housing includes a lens for receiving and focusing a headlight beam of a vehicle and forming an image on an internal screen, and a control unit mounted on the housing that is vertically and horizontally pivotable relative to the housing. The housing and the control unit each emit laser beams to configure and measure an alignment of the apparatus to the vehicle. The control unit compensates for an unlevel supporting surface of the apparatus and/or the vehicle and indicates whether the headlight is properly aimed according to a selected aiming standard based on the image, the configuration of the vehicle and the apparatus, and any compensation of any unlevel supporting surface(s) of the apparatus and/or the vehicle.

Abstract: A method for accurately aiming vehicle headlamps, with apparatus for practicing the method. A vision system, including a digital camera, is positioned in front of a headlamp, in communication with a control device. The control device employs pattern recognition to identify the optical axis indicia within the headlamp, and based on the identified location of that indicia, the control system accurately aligns a beamsetter with the optical axis of the headlamp.

Abstract: A micro-cavity measuring method and equipment based on micro focal-length collimation are provided. The equipment can be used to measure irregular micro-cavities and “sub-macro” micro-cavities. Wherein a cylindrical or spherical lens with micro focal-length is combined with a fiber probe(11,12) to form a collimating and imaging optical system of a point light source(8), and the collimating and imaging optical system transforms the two or three dimensional movement of the fiber probe(11,12) into a change in image ultra-highly sensitively. A lot of advantages are obtained, i.e., micro measuring force, high aspect ratio, easy miniaturization, high resolution, simple construction and high speed.

Abstract: A light distribution characteristic measurement apparatus for measuring the light distribution characteristic of a light source is provided. The apparatus includes a plurality of detectors arranged so that they have a predetermined relative relationship with each other. One detector has a detection range at least partially overlapping a detection range of another detector adjacent to the former detector. The apparatus further includes a drive unit that drives a plurality of detectors as one unit to update a positional relationship of the plurality of detectors relative to the light source, and a calculation unit that calculates the light distribution characteristic of the light source by performing a process depending on at least one of a relative relationship between a plurality of detectors and overlapping of respective detection ranges thereof, based on respective results of detection that have been acquired by the plurality of detectors at the same timing.

Abstract: A method for determining a radiation characteristic for a vehicle illumination device to be produced from possible radiation characteristics based on a parameter is provided. The parameter is selected from an illumination geometry that can be generated by the device in a surroundings of the device, a device position, and a person-related type of perception. The method includes determining a first value of a light intensity that can be generated for a first point located within an illuminatable area based on the parameter. A second value of the light intensity that can be generated by the illumination device is determined for second points based on the first value. The second points are arranged in the surroundings of the illumination device. A light distribution that can be generated by the illumination device is determined based on the first and second values and the light distribution is outputted to an interface.

Abstract: A goniophotometer includes an arc reflector; a holder for positioning a light source at the center of the arc reflector; a stationary detector substantially disposed at the center of the arc reflector and aimed at an arc reflective surface of the reflector; a driving device for rotating the holder with respect to the reflector and the detector about an axis of the light source; and a computing unit configured to convert a detection result of the detector into a measurement value.

Abstract: A structural color body is film-like and comprises a front surface layer disposed on a front surface side and a back surface layer disposed on a back surface side, the front surface layer and the back surface layer contain block copolymers and have micro-phase separated structures including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, a maximum value of distances predetermined in the micro domains of the front surface layer is larger than the wavelength in the visible light range, and distances predetermined in the micro domains of the back surface layer are equal to or less than the wavelength in the visible light range.

Abstract: System(s), apparatus(es), and method(s) are provided for control of quality of light emitted from a group of solid-state light (SSL) sources that are part of an illumination fixture. The control is based at least in part on regulation of the spectral power distribution (SPD) of the light to match a SPD of a reference light source. A spectroscopic analyzer collects electromagnetic (EM) radiation emitted from the group of SSL sources and EM radiation substantially emitted from the reference light source. A first controller analyzes spectroscopic data related to SPDs of the group of SSL sources and the reference light source and, based on the analysis issues a configuration of the group of SSL sources. Implementation of the configuration causes the group of SSL sources to emit EM radiation with a SPD that nearly matches the SPD of the EM radiation substantially emitted from the reference light source.

Abstract: A micro heater includes a first electrode, a second electrode, a first carbon nanotube, and a second carbon nanotube. The first carbon nanotube extends from the first electrode. The second carbon nanotube branches from the second electrode. The first carbon nanotube and the second carbon nanotube intersect with each other to define a node therebetween.

Abstract: A system and method for commissioning a lighting system is provided in which signals from light sensors are filtered in order to determine whether light is received from light fixtures in the lighting system or from external light sources. Alternatively or in addition, signals from light sensors may be filtered to determine the amount of light from external light sources. By filtering the signals from the light sensors, an identification of which light fixtures are colocated with which light sensors may be made even in the presence of light received from external light sources or light from multiple light fixtures in the lighting system. Physical locations of light fixtures and/or sensors may be determined based on detecting the amount of light received from external light sources.

Abstract: The present invention relates to light sensors for measuring light characteristics. In particular, the present invention relates to a light directionality sensor that is capable of measuring light characteristics such as the light direction, light collimation, and light distribution. According to a first aspect of the present invention there is provided a light directionality sensor comprising a photo-sensor (2), comprising a plurality of photo-sensitive elements (3), and a plurality of light-absorbing light selecting structures (1) arranged on the photo-sensor so as to form an array of light-absorbing light selecting structures. In the array of light-absorbing light selecting structures, a succession of at least some of the light-absorbing light selecting structures has varying structural characteristics.

Abstract: An exposure system includes an exposure apparatus, a mask, a test pattern portion and a uniformity measuring part. The exposure apparatus includes a first module and a second module. The first and second modules each emit light and are overlapped in an overlapping area. The mask includes a plurality of transmission portions which are spaced apart from each other. Each of the transmission portions has a width less than a width of the overlapping area. The test pattern portion includes a plurality of test patterns which are patterned by using the light transmitted through the transmission portions of the mask. The uniformity measuring part measures a uniformity of the test patterns.

Abstract: A method for characterizing a laser beam profile is provided. The method includes disposing a laser target, moving the surface of the target, directing a laser to emit the beam at the surface, measuring a reflection from the surface as intensities, and averaging the intensities. The target's surface is disposed substantially perpendicular to an incident direction. The surface is reflective at a wavelength corresponding to the laser beam. The travel direction is substantially parallel to the surface. The laser beam travels along said incident direction to the surface. The reflection represents a plurality of intensities having a distribution of positions along the surface and during a temporal interval. The intensities are averaged over the temporal interval for each position of the distribution to produce an analyzed beam profile. Each position corresponds to a speed along the travel direction based on movement of the surface.

Abstract: A structural color body is film-like and formed of a resin layer containing a block copolymer, the resin layer has a micro-phase separated structure including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, and in each of the micro domains, a maximum value of distances in the direction between the tops of convexities and the bottoms of concavities is larger than the wavelength in the visible light range.

Abstract: An apparatus that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a high power laser beam. The apparatus employs the optics used in a process application, including a focus lens and cover glass. An attenuation module includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. A beam dump is positioned out of a path of travel of the laser beam and in receiving relation to light reflected by the first and second mirrors. A camera detects spots of light that pass through the first and second mirrors. A high power attenuator formed by a highly reflective mirror pair is positioned between the source and the attenuation module. A second embodiment includes a single mirror plate having highly reflective surfaces.

Abstract: A headlamp aiming system is provided for aiming a headlamp of a vehicle. An aimer includes a CCD camera for receiving illumination produced by the headlamp to produce a beam pattern image. A controller receives the beam pattern image from the aimer to determine an aiming correction to move the detected beam pattern to a predetermined position. An adjuster is operatively coupled to the vehicle for executing adjustments of the headlamp in response to the aiming correction. The CCD camera captures an initial image using an initial exposure time, measures a light accumulation value corresponding to the initial image, determines a final exposure time in response to the measured light accumulation value and a predetermined light accumulation value, and captures the beam pattern image using the final exposure time.

Abstract: A method for aiming headlamps on a vehicle achieves a reduced variation in beam heights without making any changes to existing test equipment. A cutoff height of a first headlamp is measured. The first headlamp is adjusted until a first measured cutoff height is within a predetermined range centered on a predetermined fixed height. A cutoff height of a second headlamp is measured. The second headlamp is adjusted until a second measured cutoff height is within the predetermined range centered on the first measured cutoff height.

Abstract: Embodiments of the present invention relate to a wavefront imaging sensor (WIS) comprising an aperture layer having an aperture, a light detector having a surface and a transparent layer between the aperture layer and the light detector. The light detector can receive a light projection at the surface from light passing through the aperture. The light detector can also separately measure amplitude and phase information of a wavefront at the aperture based on the received light projection. The transparent layer has a thickness designed to locate the surface of the light detector approximately at a self-focusing plane in a high Fresnel number regime to narrow the light projection.

Abstract: The present invention relates to a device for measuring defects of an imaging instrument with a sensor that is accurate, simple to produce and implement and inexpensive. According to the invention, this device comprising at least one second sensor, similar to the first, inclined relative thereto and imaging the same region as the first sensor, and a device for calculating the defocusing of each element of this other sensor.

Abstract: Machines and methods measure an unknown characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the unknown characteristic based on the comparison of the output signal and the computationally determined response of the detector. Another method receives an output signal from an optical detector detecting one or more optical signals, accesses a predetermined characteristic curve of detector response, compares the output signal from the detector to the predetermined characteristic curve of detector response, and calculates at least one unknown characteristic of one or more optical signals based on results of the comparing step.

Abstract: A method for locating the centre of a beam profile, comprises the steps of: providing a beam profile; selecting one or more strips through the beam profile; identifying distinct regions of intensity along the one or more strips and labelling them consistently; calculating a combined average intensity for each labelled region, using data from the one or more strips; plotting the average intensity against the labelled regions and comparing the results with a plot of the actual intensity obtained by taking a cross-section through the centre of at least one of the one or more strips; and optimising the location of the centre of at least one of the one or more strips so as to obtain the best fit between the average intensity plot and the actual intensity plot to thereby identify the centre of the beam profile.

Abstract: A film-like structural color body comprises a front surface layer disposed on a front surface side, a back surface layer disposed on a back surface side, and an intermediate layer disposed between the front surface layer and the back surface layer, the front surface layer, the back surface layer and the intermediate layer contain block copolymers and have micro-phase separated structures including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, a maximum value of predetermined distances in the micro domains of the front surface layer and a maximum value of predetermined distances in the micro domains of the back surface layer are larger than the wavelength in the visible light range, and predetermined distances in the micro domains of the intermediate layer are equal to or less than the wavelength in the visible light range.

Abstract: The spot shape of a laser beam is detected by moving a table holding a detection substrate having a luminescent substance in an X direction and a Y direction with a laser beam focused by a lens applied to an area of the detection substrate where the luminescent substance is located. The intensity of light emitted from the luminescent substance is detected during the movement of the table, and a light intensity map is prepared indicating the light intensities detected in the light intensity detecting step at all of the X and Y coordinates of the luminescent substance. Spot shape images of the laser beam are formed according to a plurality of light intensity maps obtained by positioning the focusing lens at a plurality of detection positions changed in a Z direction perpendicular to a holding surface of the table.

Abstract: A method for characterizing a laser beam profile is provided. The method includes disposing a laser target, moving the surface of the target, directing a laser to emit the beam at the surface, measuring a reflection from the surface as intensities, and averaging the intensities. The target's surface is disposed substantially perpendicular to an incident direction. The surface is reflective at a wavelength corresponding to the laser beam. The travel direction is substantially parallel to the surface. The laser beam travels along said incident direction to the surface. The reflection represents a plurality of intensities having a distribution of positions along the surface and during a temporal interval. The intensities are averaged over the temporal interval for each position of the distribution to produce an analyzed beam profile. Each position corresponds to a speed along the travel direction based on movement of the surface.

Abstract: A method for detecting misalignment of a vehicle headlight using a camera system is specified. For this purpose, the headlight is in a predefined position and the camera system is arranged on or in the vehicle and is oriented in such a manner that the light distribution pattern of the headlight in front of the motor vehicle is detected. With a predefined headlight position, an actual light distribution pattern of the headlight is recorded using the camera system and is compared with a desired light distribution pattern for the predefined headlight position. If the actual light distribution pattern differs from the desired light distribution pattern, misalignment of the headlight is detected.

Abstract: A Shack Hartmann (“SH”) wavefront sensor comprising an optical device, such as a wave front dissector including a lenslet array, for transmitting, dissecting and focusing an incoming optical wave, an optical system, including, for example, an optical sensor, for receiving the transmitted incoming optical wave, and a removable kinematic mount for repeatable precision mounting of the optical device to the optical system.

Abstract: A vehicle headlight aiming apparatus and method is provided which includes a housing that is vertically and horizontally adjustable along vertical and horizontal tracks. The housing includes a lens for receiving and focusing a headlight beam of a vehicle and forming an image on an internal screen, and a control unit mounted on the housing that is vertically and horizontally pivotable relative to the housing. The housing and the control unit each emit laser beams to configure and measure an alignment of the apparatus to the vehicle. The control unit compensates for an unlevel supporting surface of the apparatus and/or the vehicle and indicates whether the headlight is properly aimed according to a selected aiming standard based on the image, the configuration of the vehicle and the apparatus, and any compensation of any unlevel supporting surface(s) of the apparatus and/or the vehicle.

Abstract: A system for calibrating a broadband detector includes a first narrowband telescope for viewing a celestial body, and an earth viewing telescope. The broadband detector is selectively coupled to the first narrowband telescope or the earth viewing telescope. A first narrowband filter is selectively inserted in an optical path of the first narrowband telescope, or the earth viewing telescope. A processor is configured to calibrate the broadband detector based on viewing the celestial body with the first narrowband telescope or the earth viewing telescope, and selectively inserting the first narrowband filter in the optical path. The first narrowband telescope includes a first narrowband filter inside its optical train. The first narrowband filter, which is selectively inserted in the optical path, is spectrally similar to the first narrowband filter inside the optical train of the first narrowband telescope.

Abstract: The present invention comprises a light modulation optical system having a first element which forms a desired light intensity gradient distribution to an incident light beam and a second element which forms a desired light intensity minimum distribution with an inverse peak shape to the same, and an image formation optical system which is provided between the light modulation optical system and a substrate having a polycrystal semiconductor film or an amorphous semiconductor film, wherein the incident light beam to which the light intensity gradient distribution and the light intensity minimum distribution are formed is applied to the polycrystal semiconductor film or the amorphous semiconductor film through the image formation optical system, thereby crystallizing a non-crystal semiconductor film. The pattern of the first element is opposed to the pattern of the second element.

Abstract: A system for measuring the wavefront characteristics of a powerful laser close to an emitting or transmitting surface of the laser. The system includes a beam sampler that has a sampling aperture for sampling radiation from a sampled area along the emitting or transmitting surface. The beam sampler includes a reflector for directing un-sampled radiation onto an absorber, which absorbs un-sampled radiation. Radiation sampled by the beam sampler is sensed using a sensor.