Abstract: Systems and methods for sensing vibrational absorption induced photothermal effect via a visible light source. A Mid-infrared photothermal probe (MI-PTP, or MIP) approach achieves 10 mM detection sensitivity and sub-micron lateral spatial resolution. Such performance exceeds the diffraction limit of infrared microscopy and allows label-free three-dimensional chemical imaging of live cells and organisms. Distributions of endogenous lipid and exogenous drug inside single cells can be visualized. MIP imaging technology may enable applications from monitoring metabolic activities to high-resolution mapping of drug molecules in living systems, which are beyond the reach of current infrared microscopy.

Abstract: Disclosed is a method for determining a parameter of an optical device including at least an optical lens, the method including: an optical system providing step, during which an optical system including a visual target, the optical device and an image acquisition module is provided in an initial configuration state, a parameter determining step during which a parameter of the optical device is determined based on the blur level of the images of the visual target acquired by the image acquisition module through the optical device in at least two different configuration states.

Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.

Abstract: Systems and methods for measuring a curvature radius of a sample. The methods comprise: emitting a light beam from a laser source in a direction towards a beam expander; expanding a size of the light beam emitted from the laser source to create a broad laser beam; reflecting the broad laser beam off of a curved surface of the sample; creating a plurality of non-parallel laser beams by passing the reflected broad laser beam through a grating mask or a biprism; using the plurality of non-parallel laser beams to create an interference pattern at a camera image sensor; capturing a first image by the camera image sensor; and processing the first image by an image processing device to determine the curvature radius of the sample.

Abstract: A methods and system for testing of eyeglasses using a background object are disclosed. The method includes obtaining an image of a background object, whereby in at least a part of the image the background object is captured as viewed through a lens of a pair of eyeglasses, and analyzing at least a part of the image showing the background object being captured through a lens of the eyeglasses, and identifying a property of the lens based on the analyzing.

Abstract: A method of 3D measurement is performed using a first camera and a second camera located at different distances from the projector. The method includes projecting a known projection pattern that includes at least two non-crossing lines to form a first band and a second band on a surface of an object. The method includes recording first and second images of the object using the first and second cameras, respectively. The method includes determining a first longitudinal coordinate of a first point within the first band and a first vertical coordinate of the first point within the first band; determining a second longitudinal coordinate of the first point within the first band; and determining a second vertical coordinate of the first point within the first band. The method includes determining a final vertical coordinate of the first point by comparing the first longitudinal coordinate to the second longitudinal coordinate.

Abstract: A multi-aperture camera system having an auto focusing function comprises: multiple apertures; an image sensor that creates multiple images by processing light signals introduced through the multiple apertures, respectively; and an auto focusing unit that determines a distance by which the image sensor moves relative to the multiple apertures by using the multiple images for auto focusing, wherein at least one of the multiple apertures has a central position that is misaligned with those of the remaining apertures other than the at least one aperture.

Abstract: An apparatus and a method for measuring individual data of spectacles arranged in a measurement position are disclosed. The spectacles have a left and/or a right spectacle lens. The apparatus has a display for displaying a test structure. The apparatus contains an image capture device for capturing the test structure with an imaging beam path which passing through the left spectacle lens and/or the right spectacle lens of the spectacles. Further, the apparatus includes a computer unit with a computer program for determining a refractive power distribution for at least a section of the left spectacle lens and/or the right spectacle lens from the image of the test structure captured by the image capture device and a known spatial orientation of the display relative to the image capture device. To measure individual data of spectacles, the spectacles are arranged in a measurement position.

Abstract: The purpose of the present invention is to more quickly and easily measure the shape of an object to be measured.

Abstract: In illustrative implementations of this invention, a lensometer includes a small aperture camera for capturing an image of light that travels from a display surface, through a subject lens and to the camera. One or more computers are programmed to perform calculations that take the image as an input and that compute, for each respective region in a set of regions of the subject lens, a refractive attribute of the respective region.

Abstract: An inspection method determines values of profile parameters of substrate patterns. A baseline substrate with a baseline pattern target (BP) is produced that has a profile described by profile parameters, for example CD (median critical dimension), SWA (side wall angle) and RH (resist height). Scatterometry is used to obtain first and second signals from first and second targets. Values of differential pattern profile parameters are calculated using a Bayesian differential cost function based on a difference between the baseline pupil and the perturbed pupil and dependence of the pupil on pattern profile parameters. For example, the difference is measured between a baseline process and a perturbed process for stability control of a lithographic process. Fed-forward differential stack parameters are also calculated from observations of stack targets on the same substrates as the pattern targets.

Abstract: Methods and respective modules which reduce sample size and measurement duration of metrology parameters by selecting a relatively small subset of measured targets to represent a distribution of parameter measurements of a large number of targets. The subset is selected by sampling a substantially equal number of measurements from each of a selected number of quantiles of the distribution. The methods and modules allow identification of targets which represent correctly the whole target measurement distribution. The methods and modules optimize quantiles and sample size selections, using accuracy scores and estimations of the robustness of the selections. Sampling and selections may be carried out iteratively to reach specified criteria that match the results which can be derived when considering the whole distribution.

Abstract: A lithography apparatus is disclosed, which comprises a mirror having at least two mirror segments which are joined together in such a way that an interspace is formed between the mirror segments, and a sensor for detecting the relative position of the mirror segments, wherein the sensor is arranged in the interspace between the mirror segments.

Abstract: This invention discloses a handheld apparatus for measuring surface power or radius of prescription ophthalmic spectacle lenses, optical lenses or molds blocked with or without chuck during Rx production, and after comparing measurement results with designed data, providing correction data to the processing machines via wireless connection for correction processing if needed. The handheld apparatus integrates an optical measurement head into a monolithic optical system.

Abstract: An optical communication technique transmits an optical signal at a higher bit rate using an optical transceiver interface couplable to a set of optical transmitters, each operating at a lower bit rate over a plurality of channels, by demultiplexing the optical signals from the transmitters such that some of the resulting optical signals have wavelengths that are specified as center wavelengths by an optical communication standard for the lower bit rate optical transmission and the rest of the resulting optical signals have wavelengths offset from the specified center wavelengths, then multiplexing the resulting optical signals into the higher bit rate optical signal. Related optical communication techniques involve using the reciprocal method to receive the higher bit rate optical signal and to produce multiplexed optical signals at the lower bit rate.

Abstract: An optical mask can be made by providing a transparent mask substrate; depositing a first layer of opaque material, forming an aperture in the first layer; depositing a second layer of transparent material, depositing a third layer of transparent material; patterning the third layer to produce a disc-shaped region, heating the third layer until the disc-shaped region reflows into a lens-shaped region and cross-links, depositing a fourth layer, patterning the fourth layer to produce a cavity extending to the surface of the lens-shaped region, and dry etching the end of the cavity until the second layer develops a shape corresponding to the lens-shaped region.

Abstract: Method for determining lithographic quality of a structure produced by a lithographic process using a periodic pattern, such as a grating, detects lithographic process window edges and optimum process conditions.

Abstract: This invention relates to a method for estimating the optical power of corrective lenses in a pair a eyeglasses worn by a spectator, characterized in that it comprises the following steps: acquire two consecutive images of this spectator's face located in front of a means for acquiring these two images, one of these images being acquired with eyeglasses and the other without, calibrate one of the two acquired images with respect to the other, identify the position of the iris of each eye in each image, evaluate the size magnification or size reduction of each imaged iris, and estimate the optical power of the corrective lenses based on the evaluated magnification or reduction.

Abstract: Method of determining at least one refractive characteristic of an ophthalmic lens, includes: a) placing the lens on a support having at least one prop element contacting one of the main faces of the lens in a contact zone area smaller than that of the main faces; b) lighting the lens placed on its support with lighting elements; c) capturing an image of the prop element of the support lighted by light rays that have passed through the lens, the image being captured in an image capture plane substantially perpendicular to an optical axis of the lens; d) in the image, identifying the image of the prop element of the support and determining at least one characteristic representative of the geometry of the image of the prop element; and e) from the characteristic representative of the geometry of the image of the prop element, deducing the looked-for refractive characteristic.

Abstract: A measuring assembly for measuring an inside of a lens frame of a spectacle frame, said lens frame at least partially delimiting an inscribed surface area F that corresponds to a lens shape, comprising a holding device for mounting the spectacle frame, at least one light source for generating a light beam to be projected on a region of the lens frame to be evaluated, and at least one sensor that can be coupled to an evaluation unit for detecting the reflected light beam, wherein the holding device can be rotated about a rotational axis r and moved in the direction of a movement axis x, and the movement axis x comprises at least one movement component in a direction perpendicular to the rotational axis r. The holding device is used to fix the spectacle frame by spectacle frame bows, wherein at least one free space is provided in the region of the holding device, said free space being used to receive the spectacle frame bows of a spectacle frame to be held which are not folded in or cannot be folded in.

Abstract: A method for detecting a parfocality of a zoom-stereo microscope includes: acquiring four highest definitions corresponding to a plurality of images with a cooperation of four definition judging functions, acquiring a relatively clearest position according to the four highest definitions, comparing a definition in the relatively clearest position with a definition in a parfocal position to judge whether the relatively clearest position is the parfocal position, then adjusting a magnification of the zoom-stereo microscope to acquire the parfocal positions at a finite number of the discrete magnifications, and finally fitting a parfocal curve at the continuous magnifications. The method according to the present invention implements a parfocality detection of the stereo microscope automatically and effectively and increases a productivity, and has a high detecting precision. In addition, the method according to the present invention has a good robustness, so that users needn't intervene and adjust frequently.

Abstract: A method of predicting clinical performance of an ophthalmic optical correction using simulation by imaging a series of objects of different sizes by each of a plurality of eye optical systems, each of the eye optical systems including the ophthalmic optical correction, the method providing an output value representing the resolution and contrast performance of the optical design at that vergence for the eye optical systems.

Abstract: A lens meter includes a measurement optical system having a light source, measurement target plate, and light receiving sensor. A lens table has an opening where a measurement optical axis of the measurement optical system passes. A frame support member includes a support plate that contacts a left rim and right rim of a spectacle frame. The support plate is moved toward the lens table by a guide mechanism. The frame support member further includes a cutout portion in the support plate that allow the lens, placed on the lens table, to measure a point near an edge of the lens located on the support plate side. A pad contacts and prevents the rim from entering the cutout portion. The pad is provided in at least a part of the cutout portion. A pad moving mechanism moves the pad from the contact surface.

Abstract: An optical measuring instrument for measuring aspheric surfaces includes an optical measuring arm and a multi-axis drive platform. The optical measuring arm provides for illuminating and imaging the aspheric surfaces. The multi-axis drive platform relatively moves the optical measuring arm with respect to the aspheric surfaces through a plurality of subaperture measurement positions. A focus of adjustable focusing optic is maintained at a nominal center of curvature of the aspheric surfaces. A variable optical aberrator adds aberration to an illumination wavefront to match the illumination wavefront to the intended local shape of the aspheric surface. Fitted low-frequency shape information is distinguished from a remainder of the local shape information yielding mid-frequency topographic measurements of the subapertures, which can be assembled to construct a profile measurement of the aspheric surface.

Abstract: A machining head of a laser machining apparatus comprises focusing optics which focus laser radiation in a focal spot. A measuring device measures changes of the focal length of the focusing optics. The measuring device has a light source for generating measuring light that is different from the laser radiation. A light-exit window for the measuring light is imaged, with the assistance of the focusing optics or a part thereof, onto a reflecting reference surface which is arranged to be stationary relative to the light-exit window and the focusing optics. A light sensor detects measuring light that has emerged from the light-exit window, has passed through the focusing optics or the part thereof, was reflected on the reflecting surface, and has again passed through the focusing optics or the part thereof. An evaluating device ascertains the change in the focal length of the focusing optics from measuring signals made provided by the light sensor.

Abstract: Lens module testing device for testing a lens module includes a testing platform, a light source, a testing board, a sensing element, a processor, a driving element, and a position feedback unit. The light source, the testing board, and the sensing element are arranged in order on the testing platform along an optical axis of the lens module. The lens module is positioned between the testing board and the sensing element. The light source emits testing light to the testing board, and the sensing element senses an image of the testing board and sends the image to the processor. The processor determines whether the testing board is in a focal plane of the lens module, controls the driving element to adjust a position of the testing board relative to the lens module, and obtains position information from the position feedback unit to generate a focal length of the lens module.

Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.

Abstract: A system and method of determining a focal position for an objective positioned at a measurement location of a sample holder in a microscopy imaging system are provided. The objective is moved to a position relative to the sample holder that corresponds to a distance between the objective and the sample holder. The sample holder has a conditioned upper surface. A focusing light beam is projected onto the sample holder when the objective is located at the position, and the objective focuses the focusing light beam on the sample holder. A reflected light beam resulting from reflection of the focusing light beam off the conditioned upper surface is observed. The focal position for the objective is determined based on the reflected light beam such that the objective produces an in focus image of a microscopy sample when the objective is located at the focal position.

Abstract: A method for calibrating a focus point for a camera lens may include capturing a reflection of a focus point measuring device that is affixed to the camera. The method may include evaluating a captured image of the reflection to measure a calibration amount for a focus point, and adjusting a focus point of a lens of the camera by the calibration amount. The focus point measuring device may include a substantially planar target surface defining a plane, and a ruled target surface inclined at substantially 45° to the substantially planar target and extending through the plane thereof, marked to indicate respective distances in front of and behind the plane. The device may further include a fixture for holding the substantially planar target surface and the ruled target surface in a defined orientation to the camera, enabling performance of the method.

Abstract: A method for detecting a parfocality of a zoom-stereo microscope includes: acquiring four highest definitions corresponding to a plurality of images with a cooperation of four definition judging functions, acquiring a relatively clearest position according to the four highest definitions, comparing a definition in the relatively clearest position with a definition in a parfocal position to judge whether the relatively clearest position is the parfocal position, then adjusting a magnification of the zoom-stereo microscope to acquire the parfocal positions at a finite number of the discrete magnifications, and finally fitting a parfocal curve at the continuous magnifications. The method according to the present invention implements a parfocality detection of the stereo microscope automatically and effectively and increases a productivity, and has a high detecting precision. In addition, the method according to the present invention has a good robustness, so that users needn't intervene and adjust frequently.

Abstract: An instrument (1) for characterizing an optical system, includes: at least one primary source (3) for emitting an illumination light beam (FE); an optical device for directing the illumination beam (FE) onto the optical system (L) to be characterized; a wave front analyzer (4) adapted for receiving a beam from the optical system (L); and a unit for processing the measure signals from the wave front analyzer (4), adapted for providing characterization information of the optical system (L). The instrument further includes a scattering member (22) substantially provided in the focal plane of the optical system (L) so as to create a secondary source generating a secondary beam flowing through the optical system (L) and further directed towards the wave front analyzer.

Abstract: The present invention discloses a system and method for nondestructively measuring the refractive index and the central thickness of a lens. The system comprises a radius measurement module arranged for measuring the curvature radius of the first surface of the lens; a focus measurement module arranged for measuring the best focus distance of the first surface of the lens; and a calculation module arranged for performing the first or the second calculation process according to the lensmaker's formula. Wherein, when the central thickness is given, the calculation module performs the first calculation process according to the curvature radius, the best focus distance and the central thickness to calculate the refractive index. On the contrary, when the refractive index is given, the calculation module performs the second calculation process according to the curvature radius, the best focus distance and the refractive index to calculate the central thickness.

Abstract: A method for measuring focal distance of a thermal lens located in an analyte, the method including: providing an exciting optical beam passing through the analyte and creating the thermal lens therein; emitting a coherent probe optical beam passing through the analyte and being propagated substantially perpendicular to the exciting optical beam; intercepting the probe optical beam by a detector after passing through the analyte; focusing the probe optical beam upstream or downstream of the thermal lens such that only a fraction of the probe optical beam passes through the thermal lens; acquiring an interference image by the detector; and processing the interference image to calculate the focal distance of the thermal lens. Such a method may find application in physico-chemical analysis of the analyte.

Abstract: This invention relates to a method for estimating the optical power of corrective lenses in a pair a eyeglasses worn by a spectator, characterized in that it comprises the following steps: acquire two consecutive images of this spectator's face located in front of a means for acquiring these two images, one of these images being acquired with eyeglasses and the other without, calibrate one of the two acquired images with respect to the other, identify the position of the iris of each eye in each image, evaluate the size magnification or size reduction of each imaged iris, and estimate the optical power of the corrective lenses based on the evaluated magnification or reduction.

Abstract: An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component under test. The light directors and test pattern displays are arranged such that, in use, light directed from different illuminated test pattern displays travel different distances to reach the optical component under test.

Abstract: A method and system are for measuring and correcting shifts in the boresight, effective focal length, and focus of an optical system that are caused by temperature variations. The method can be used for systems which can be expected to operate in situations where the temperature variations are large, e.g. a FLIR system of a fighter plane, and also where the temperature variations can be very small however high accuracy is needed. The invention is based on placing radiation emitting sources before and as close as possible to the first optical element of the optical system and measuring the thermally induced shifts of the locations of the images of the radiation emitting sources on the surface of the detector of the optical system.

Abstract: A method for calibrating a focus point for a camera lens may include capturing a reflection of a focus point measuring device that is affixed to the camera. The method may include evaluating a captured image of the reflection to measure a calibration amount for a focus point, and adjusting a focus point of a lens of the camera by the calibration amount. The focus point measuring device may include a substantially planar target surface defining a plane, and a ruled target surface inclined at substantially 45° to the substantially planar target and extending through the plane thereof, marked to indicate respective distances in front of and behind the plane. The device may further include a fixture for holding the substantially planar target surface and the ruled target surface in a defined orientation to the camera, enabling performance of the method.

Abstract: One embodiment of the invention provides a lens-testing apparatus being used for testing a lens device. The lens-testing apparatus comprises a light module, at least one first and second image sensors, and at least one image sensor module. The light module generates a patterned light beam passing the lens device. The first and second image sensors receive first and second portions of the patterned light beam; the first image sensor is disposed between the second image sensor and the lens device. The image sensor module receives a substantially parallel third portion of the patterned light beam, and comprises a third image sensor and a collimator. The third portion of the patterned light beam is focused onto the third image sensor by the collimator; the distance between the first image sensor and the lens device is smaller than the distance between the second image sensor and the lens device.

Abstract: A method for measuring focal distance of a thermal lens located in an analyte, the method including: providing an exciting optical beam passing through the analyte and creating the thermal lens therein; emitting a coherent probe optical beam passing through the analyte and being propagated substantially perpendicular to the exciting optical beam; intercepting the probe optical beam by a detector after passing through the analyte; focusing the probe optical beam upstream or downstream of the thermal lens such that only a fraction of the probe optical beam passes through the thermal lens; acquiring an interference image by the detector; and processing the interference image to calculate the focal distance of the thermal lens. Such a method may find application in physico-chemical analysis of the analyte.

Abstract: To reduce the effect of directly reflected light on a contact-surface side of a contact member, a biological information detector includes a light-emitting part, a light-receiving part, a reflecting part, a protecting part for protecting the light-emitting part, and a substrate. The protecting member is formed from a material that is transparent with respect to a wavelength of the light emitted by the light-emitting part and has a contact member provided with a contact surface in contact with the detection site. Light emitted from the light-emitting part is inhibited from reflecting once on a contact-surface side of the contact member of the protecting part and being incident on a light-receiving region of the light-receiving part.

Abstract: A system for measuring a focal length of an optical lens includes an image processing device and an operating platform. The image processing device is configured for capturing a light spot image of the optical lens. The operating platform includes a mount, a holder and a measurer. The mount is configured for mounting the image processing device. The holder is configured for holding the optical lens. The mount is moved back and forth along the direction towards and away from the optical lens held by the holder. The measurer is configured for measuring and recording a distance between image processing device and the optical lens when a minimal light spot image of the optical lens is obtained. The distance is the focal length of the optical lens.

Abstract: An instrument (1) for characterizing an optical system, includes: at least one primary source (3) for emitting an illumination light beam (FE); an optical device for directing the illumination beam (FE) onto the optical system (L) to be characterized; a wave front analyzer (4) adapted for receiving a beam from the optical system (L); and a unit for processing the measure signals from the wave front analyzer (4), adapted for providing characterization information of the optical system (L). The instrument further includes a scattering member (22) substantially provided in the focal plane of the optical system (L) so as to create a secondary source generating a secondary beam flowing through the optical system (L) and further directed towards the wave front analyzer.

Abstract: By repeatedly executing a predetermined measurement at set intervals, data on a predetermined performance (a best focus position) of a predetermined apparatus and data on variation factors of the performance are obtained (Steps 204 to 214). Based on the obtained data, multivariate analysis is performed and a model equation that is used to predict a variation amount of the performance and includes at least one of the variation factors as a variable is derived (Step 214). Therefore, after deriving the model equation, a variation amount of the performance can be predicted using the model equation by obtaining data on the variation factor that serves as the variable (Step 238). Accordingly, it becomes possible to maintain the performance described above with good accuracy in accordance with the prediction results and also optimize the implementation timing of maintenance and the like.

Abstract: In a scatterometric method differential targets with different sensitivities to parameters of interest are printed in a calibration matrix and difference spectra obtained. principal component analysis is applied to the difference spectra to obtain a calibration function that is less sensitive to variations in the underlying structure than a calibration function obtained from spectra obtained from a single target.

Abstract: The evaluating apparatus evaluates a restoration-premised lens which is employed in an image forming system that converts an optical image into an electronic image and then enforces a restoration processing on the electronic image in order to obtain a sharp image, is actually manufactured based on such design as premised on the restoration processing. The evaluating apparatus includes an evaluating corrective optical system, measuring section and evaluating section. The evaluating corrective optical system, when it is combined with a lens manufactured just as designed, forms a sharp optical image. The measuring section measures the optical characteristics of a composite optical system provided by combining together the evaluating corrective optical system and the manufactured lens. The evaluating section evaluates the manufactured lens according to measured results provided by measuring section.

Abstract: Provided are a three-dimensional image measuring method and apparatus for an LCD color filter automatic grinder. It is possible to measure a three-dimensional image of an LCD color filter, even though textures for recovering the three-dimensional image are insufficient, by irradiating illumination passed through a patterned filter to the LCD color filter. In addition, it is possible to measure a three-dimensional image of an LCD color filter by obtaining a plurality of image sequences along an optical axis of a camera composed of CCD or CIS. Illumination is irradiated to an LCD color filter to be measured through a patterned filter.

Abstract: Early techniques for object inspection relied on human inspectors to visually examine objects for defects. However, automated object inspection techniques were subsequently developed due to the labour intensive and subjective nature of human operated inspections. Additionally, object characteristics such as object power and object thickness need to be determined after the objects have been examined for defects. Conventionally, corresponding inspection stations are along the manufacturing lines for determining each of the object characteristics. However, the need for human intervention and time spent to move the objects from one inspection station to another adversely affect the efficiency of the object manufacturing process. An embodiment of the invention disclosed describes a high-resolution object inspection system for performing object inspection.