Deflecting Or Interrupting Optical Path Patents (Class 356/126)
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Patent number: 11184844Abstract: In user terminal 10 of the present invention, connection-cell-selection controlling section 110 measures reception quality of signals respectively transmitted from cells and received by antenna section 108, corrects the reception quality of each of the cells based on a positional relationship between each of the cells and user terminal 10 and based on a moving direction of user terminal 10, and determines a connection cell for user terminal 10 (base station in communication with user terminal 10) based on the corrected reception quality. This configuration lowers a cell switching frequency, while preventing degradation of throughput and the like in a future radio communication system (multilayer cellular radio network).Type: GrantFiled: December 18, 2017Date of Patent: November 23, 2021Assignee: NTT DOCOMO, INC.Inventors: Akira Kishida, Yoshifumi Morihiro, Takahiro Asai, Yukihiko Okumura
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Patent number: 10690816Abstract: Systems and methods reduce temperature induced drift effects on a liquid lens used in a vision system. A feedback loop receives a temperature value from a temperature sensor, and based on the received temperature value, controls a power to the heating element based on a difference between the measured temperature of the liquid lens and a predetermined control temperature to maintain the temperature value within a predetermined control temperature range to reduce the effects of drift. A processor can also control a bias signal applied to the lens or a lens actuator to control temperature variations and the associated induced drift effects. An image sharpness can also be determined over a series of images, alone or in combination with controlling the temperature of the liquid lens, to adjust a focal distance of the lens.Type: GrantFiled: August 29, 2017Date of Patent: June 23, 2020Assignee: COGNEX CORPORATIONInventors: Laurens Nunnink, Mario Joußen, Jörg Kesten, Michael Haardt
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Patent number: 9030671Abstract: A measuring assembly for measuring an inside of a lens frame of a spectacle frame, said lens frame at least partially delimiting an inscribed surface area F that corresponds to a lens shape, comprising a holding device for mounting the spectacle frame, at least one light source for generating a light beam to be projected on a region of the lens frame to be evaluated, and at least one sensor that can be coupled to an evaluation unit for detecting the reflected light beam, wherein the holding device can be rotated about a rotational axis r and moved in the direction of a movement axis x, and the movement axis x comprises at least one movement component in a direction perpendicular to the rotational axis r. The holding device is used to fix the spectacle frame by spectacle frame bows, wherein at least one free space is provided in the region of the holding device, said free space being used to receive the spectacle frame bows of a spectacle frame to be held which are not folded in or cannot be folded in.Type: GrantFiled: March 3, 2011Date of Patent: May 12, 2015Assignee: Schneider GmbH & Co. KGInventors: Gunter Schneider, Torsten Gerrath, Ulf Boerner
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Patent number: 9001314Abstract: A method of rating eyewear includes providing eyewear to be rated, measuring a physical property of the eyewear selected from a group that includes ultraviolet radiation absorption, blue light radiation absorption, infrared radiation absorption, and light blocking capability, transforming the physical property into a rating value, and informing a prospective consumer of the rating value.Type: GrantFiled: September 13, 2013Date of Patent: April 7, 2015Assignee: Roxy Development, LLCInventor: Gary W. Hall
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Patent number: 8928870Abstract: A lens meter includes a measurement optical system having a light source, measurement target plate, and light receiving sensor. A lens table has an opening where a measurement optical axis of the measurement optical system passes. A frame support member includes a support plate that contacts a left rim and right rim of a spectacle frame. The support plate is moved toward the lens table by a guide mechanism. The frame support member further includes a cutout portion in the support plate that allow the lens, placed on the lens table, to measure a point near an edge of the lens located on the support plate side. A pad contacts and prevents the rim from entering the cutout portion. The pad is provided in at least a part of the cutout portion. A pad moving mechanism moves the pad from the contact surface.Type: GrantFiled: September 7, 2011Date of Patent: January 6, 2015Assignee: Nidek Co., Ltd.Inventors: Noritsugu Nozawa, Hikaru Miyabayashi
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Patent number: 8854611Abstract: A method comprises providing a lens blank, a precision positioning device, an illumination device, and a vision system, wherein the lens blank includes at least one feature whose position is known relative to a position of an optic center of the lens blank, and wherein the vision system comprises an image sensor and a processor; mounting the lens blank on the precision positioning device; illuminating the lens blank with the illumination device; viewing the lens blank with image sensor of the vision system; determining the position of the at least one feature using the processor; and determining the position of the optic center of the lens blank based on the position of the at least one feature using the processor.Type: GrantFiled: October 25, 2012Date of Patent: October 7, 2014Assignee: Benz Research and Development CorporationInventors: Patrick H. Benz, Andrew Larson, Stephen E. Brauner
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Patent number: 8717571Abstract: An optical measurement apparatus includes a connector where a base end portion of a measurement probe introduced into a subject is connected, a light source unit that emits illumination light irradiated from a leading end of the measurement probe, an optical measurement unit that measures reflection light and/or scattering light of the illumination light incident through the measurement probe, a first optical path that transmits the illumination light emitted by the light source unit to the optical measurement unit, a second optical path that transmits, to the measurement probe, the illumination light emitted by the light source unit and transmits, to the optical measurement unit, reflection light and/or scattering light of the illumination light incident through the measurement probe, and an optical path switching unit that switches an optical path for transmitting the illumination light into the first optical path or the second optical path.Type: GrantFiled: April 23, 2013Date of Patent: May 6, 2014Assignees: Olympus Corporation, Olympus Medical Systems CorporationInventors: Hideyuki Takaoka, Kazuhiro Gono, Takeshi Suga
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Patent number: 8687179Abstract: A wavefront aberration measuring apparatus comprising: an illumination optical system provided to an incident side of a test lens; and a measuring optical system provided to an exit side of the test lens, the illumination optical system including an aperture stop capable of being opened and closed, and the illumination optical system being movable along an optical axis of the illumination optical system so as to adjust positions of the aperture stop and an entrance pupil of the test lens to have an optically conjugate relation with each other. Accordingly, it becomes possible to provide a wavefront aberration measuring apparatus capable of suppressing errors in measured result.Type: GrantFiled: September 10, 2013Date of Patent: April 1, 2014Assignee: Nikon CorporationInventor: Tatsuro Otaki
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Patent number: 8576390Abstract: This invention provides a system and method for determining and controlling focal distance in a lens assembly of a vision system camera using an integral calibration assembly that provides the camera's image sensor with optical information that is relative to focal distance while enabling runtime images of a scene to be acquired along the image axis. The lens assembly includes a variable lens located along an optical axis that provides a variable focus setting. The calibration assembly generates a projected pattern of light that variably projects upon the camera sensor based upon the focus setting of the variable lens. That is, the appearance and/or position of the pattern varies based upon the focus setting of the variable lens. This enables a focus process to determine the current focal length of the lens assembly based upon predetermined calibration information stored in association with a vision system processor running the focus process.Type: GrantFiled: July 31, 2012Date of Patent: November 5, 2013Assignee: Cognex CorporationInventor: Laurens Nunnink
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Patent number: 8169603Abstract: One embodiment of the invention provides a lens-testing apparatus being used for testing a lens device. The lens-testing apparatus comprises a light module, at least one first and second image sensors, and at least one image sensor module. The light module generates a patterned light beam passing the lens device. The first and second image sensors receive first and second portions of the patterned light beam; the first image sensor is disposed between the second image sensor and the lens device. The image sensor module receives a substantially parallel third portion of the patterned light beam, and comprises a third image sensor and a collimator. The third portion of the patterned light beam is focused onto the third image sensor by the collimator; the distance between the first image sensor and the lens device is smaller than the distance between the second image sensor and the lens device.Type: GrantFiled: August 14, 2009Date of Patent: May 1, 2012Assignee: UMA Technology Inc.Inventors: Chang Yuan Lee, Wen Wen Teng, Chungying Kuo
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Patent number: 7936451Abstract: The invention relates to a method for machining and estimating an optical lens which is designed as a semi-finished product, with a pre-finished form of a first side and a second side to be machined, in which a pre-specified form of a surface of the second side to be machined is estimated, wherein prior to estimating the pre-specified form of the surface of the second side, an actual form of the surface of the first side is measured using measuring means and is incorporated into the estimation of the pre-specified form of the surface of the second side.Type: GrantFiled: December 4, 2009Date of Patent: May 3, 2011Assignee: Schneider GmbH & Co. KGInventors: Gunter Schneider, Helwig Buchenauer, Stephan Huttenhuis
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Patent number: 7755748Abstract: A scattered light measurement device includes an illumination mask providing measuring radiation on an entrance side (1a) of a test component (1) and a detection part (3-6) for detection of light scattered by the test component and disposed on an exit side (1b) of the test component. The illumination mask includes at least one scattered light measurement structure, wherein the scattered light measurement structure has a scattered light marker zone and wherein the scattered light marker zone has a rotationally non-symmetric shape.Type: GrantFiled: July 29, 2008Date of Patent: July 13, 2010Assignee: Carl Zeiss SMT AGInventors: Michael Arnz, Oswald Gromer, Gerd Klose, Joachim Stuehler, Matthias Manger
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Patent number: 7749666Abstract: A method of using an in-situ aerial image sensor array is disclosed to separate and remove the focal plane variations caused by the image sensor array non-flatness and/or by the exposure tool by collecting sensor image data at various nominal focal planes and by determining best focus at each sampling location by analysis of the through-focus data. In various embodiments, the method provides accurate image data at best focus anywhere in the exposure field, image data covering an exposure-dose based process window area, and a map of effective focal plane distortions. The focus map can be separated into contributions from the exposure tool and contributions due to topography of the image sensor array by suitable calibration or self-calibration procedures. The basic method enables a wide range of applications, including for example qualification testing, process monitoring, and process control by deriving optimum process corrections from analysis of the image sensor data.Type: GrantFiled: August 2, 2006Date of Patent: July 6, 2010Assignee: ASML Netherlands B.V.Inventors: Michael J. Gassner, Stefan Hunsche, Yu Cao, Jun Ye, Moshe E. Preil
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Patent number: 7742158Abstract: The measurement apparatus includes: a support arranged to receive a lens; lighting element including an optical system for generating a collimated light beam directed towards the lens under measurement installed on the support; detachment elements for detaching light rays from the light beam, for detaching a localized group of at least three non-coplanar light rays grouped together about a measurement axis in a measurement cylinder of section substantially smaller than the section of the lens under measurement; acquisition elements for identifying the deflections imparted by the lens on the detached light rays and for delivering a signal representative of the deflections; and an electronic and computer system programmed to deduce from said deflections the value of the refractive characteristic of the lens at the measurement point.Type: GrantFiled: November 24, 2005Date of Patent: June 22, 2010Assignee: Essilor International (Compagnie Generale d'Optique)Inventors: Fabien Divo, James Thepot
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Patent number: 7732217Abstract: When detecting fluorescence of a bead chip array, reflected light from a bead is detected at the same time, so as to recognize the bead position. The reflected light can be detected in a similar manner for all beads, regardless of the presence or absence of a fluorescent substance. If the positions of all beads are detected, accurate detection can be achieved by quantifying only the fluorescence at the detected positions. The fluorescence wavelength alone is detected by a first detector using a wavelength selection filter. Other wavelengths are detected by a second detector, thereby obtaining the reflected light. Data on the reflected light is processed into an image for obtaining the bead profile, the bead position is recognized by detecting the center position based on the profile, and the fluorescence is quantified based on the bead position.Type: GrantFiled: May 25, 2006Date of Patent: June 8, 2010Assignee: Hitachi Software Engineering Co., Ltd.Inventors: Hiroshi Kishida, Masaomi Uchida
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Publication number: 20100060883Abstract: An apparatus and a method for determining the focus of an optical system on a substrate are disclosed. A light source emits an auxiliary light beam into an auxiliary beam path, wherein the auxiliary light beam, after splitting, is offset in relation to an optical axis of a measuring objective. At least one optical switch is provided in the auxiliary beam path for switching the path of the auxiliary beam path from one side offset from the optical axis to the other side offset from the optical axis of the measuring objective.Type: ApplicationFiled: September 8, 2009Publication date: March 11, 2010Applicant: VISTEC Semiconductor Systems GmbHInventor: Michael Heiden
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Patent number: 7619722Abstract: A method for replacing a lens having refractive power in a first projection optical system includes measuring a wavefront of measuring light passing through the first projection optical system in a state in which the lens having refractive power or a master lens is mounted in the first projection optical system, measuring a wavefront of measuring light passing through a second projection optical system in a state in which the master lens or an alternative lens is mounted in the second projection optical system, processing the alternative lens in accordance with measurement results, and replacing the lens having refractive power in the first projection optical system with the processed alternative lens.Type: GrantFiled: August 20, 2008Date of Patent: November 17, 2009Assignee: Canon Kabushiki KaishaInventors: Jun Moizumi, Ryo Koizumi
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Patent number: 7501645Abstract: An apparatus for measuring characteristics of a substance is provided. The apparatus includes a light source to generate light to form an image. A splitter transmits the light from the light source to a first lens, which collimates the light. A second lens receives the collimated light and is adapted to oscillate with respect to the substance and adapted to transmit and focus the light to a focal region within the substance, such that the oscillation will cause the focal region to pass back and forth through the substance and its surfaces/interfaces. A sensor receives light reflected from the focal region and provides a signal indicative of characteristics of the substance at the focal region.Type: GrantFiled: November 15, 2006Date of Patent: March 10, 2009Assignee: Campbell Science Group, Inc.Inventor: Jesse H. Shaver
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Publication number: 20080277566Abstract: An image forming state detection device comprises a micro-lens array that is disposed at a position set apart from a predetermined focal plane of an image forming optical system by a specific distance and includes a plurality of micro-lenses arrayed with a predetermined pitch, a light-receiving portion array that includes a plurality of light-receiving portions each corresponding to one of the micro-lenses in the micro-lens array and receives an image on the predetermined focal plane via the individual micro-lenses, a signal string extracting means that extracts a pair of signal strings corresponding to images, formed with light fluxes having passed through different pupil areas of the image forming optical system, based upon light reception outputs obtained from the plurality of light-receiving portions, and an image forming state calculating means that calculates an image forming state at the image forming optical system by detecting an offset with regard to the phases of the pair of signal strings extracteType: ApplicationFiled: May 30, 2006Publication date: November 13, 2008Inventor: Ken Utagawa
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Patent number: 7400388Abstract: A method for determining at least one of distortion and de-focus for an optical imaging system. The method includes determining wavefront aberrations in a pupil plane of the optical imaging system by a wavefront measurement method, determining focus offset measured values in an xy-direction and/or z-direction for one or more different illumination settings by a test pattern measurement method with imaging and comparative evaluation of test patterns for the optical imaging system, and determining values for one or more aberration parameters that relate to the distortion and/or image surface from a prescribed relationship between the determined wavefront aberrations and the determined focus offset measured values.Type: GrantFiled: May 27, 2005Date of Patent: July 15, 2008Assignee: Carl Zeiss SMT AGInventors: Wolfgang Emer, Uwe Schellhorn, Manfred Dahl, Rainer Hoch
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Patent number: 7324190Abstract: The system comprises a light source, supplying an incident light beam illuminating the ophthalmic lens. On the optical path of the incident beam, reflecting means are arranged downstream from the ophthalmic lens and a collimation and magnifying lens is arranged upstream from the ophthalmic lens. A camera, the lens, the ophthalmic lens and the reflecting means are arranged on the same main optical axis. The reflecting means comprise a plurality of flat reflecting faces, arranged in the form of at least one cube corner block open in the direction of the ophthalmic lens. The flat faces can form a matrix of adjacent cube corner blocks made of plastic.Type: GrantFiled: April 5, 2004Date of Patent: January 29, 2008Assignee: TECOPTIQUEInventors: Henri Dominico Demarchi, Joseph Naccarato
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Patent number: 7245363Abstract: An optical detection system according to the present invention includes: a spatial light modulator for modulating the phase of incoming light; a photodetector having a plurality of photosensitive areas to receive the light of which the phase has been modulated by the spatial light modulator; a photosensor selecting section for selecting at least one of the photosensitive areas and activating the selected photosensitive area effectively; and a modulation control section for providing a modulation pattern, associated with the photosensitive area that has been selected by the photosensor selecting section, for the spatial light modulator.Type: GrantFiled: February 12, 2004Date of Patent: July 17, 2007Assignee: Matsushita Electric Industrial Co., Ltd.Inventor: Yoshihiro Mushika
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Patent number: 7154111Abstract: An apparatus for measuring characteristics of a substance is provided. The apparatus includes a light source to generate light to form an image. A splitter transmits the light from the light source to a first lens, which collimates the light. A second lens receives the collimated light and is adapted to oscillate with respect to the substance and adapted to transmit and focus the light to a focal region within the substance, such that the oscillation will cause the focal region to pass back and forth through the substance and its surfaces/interfaces. A sensor receives light reflected from the focal region and provides a signal indicative of characteristics of the substance at the focal region.Type: GrantFiled: October 15, 2003Date of Patent: December 26, 2006Assignee: Campbell Science Group, Inc.Inventor: Jesse H. Shaver
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Patent number: 6819414Abstract: An aberration measuring apparatus has a converging lens L disposed on the light path of light beam to converge light beam traveling through a measurement target optical system PL on a predetermined surface IP, an aperture stop AP disposed on the light path of light beam to transmit a part of the light beams, a converging position detection unit DET disposed on the predetermined surface to detect a positional deviation of a converging position P of a part of the light beams traveling through the aperture stop on the predetermined surface IP, a moving unit M connected the aperture stop to move the aperture stop within the light beam, and an arithmetic processing unit connected the converging position detection unit to calculate an aberration of the measurement target optical system PL on the basis of an output signal from the converging position detection unit DET.Type: GrantFiled: November 17, 2000Date of Patent: November 16, 2004Assignee: Nikon CorporationInventor: Hitoshi Takeuchi
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Patent number: 6703988Abstract: A display system or monitor arrangement for stereoscopic displaying of images includes a pair of displays for providing respective left eye and right eye images and arranged in perpendicular intersecting planes, a beam splitter for combining the images from the displays in a common light path, and a means to discriminate between respective images to present the respective left and right eye images to the eyes of a viewer for viewing. Image discriminating functions may be obtained using plane polarized light characteristics and/or circular polarized light characteristics. A package arrangement retains the display a system components for storage or use; and a cubical mount structure may provide alignment and positioning of respective parts of the display system. Display methods for displaying stereoscopic images in a common light path are included.Type: GrantFiled: July 7, 2000Date of Patent: March 9, 2004Assignee: Fergason Patent Properties, LLCInventor: James L. Fergason
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Patent number: 6346981Abstract: A lens testing device comprises a holder, fitted on a stand, for mounting a lens specimen, a test object illuminated from the rear, an imaging objective and a detector for evaluating the image of the test object. The imaging objective can be combined with the detector to form a unit. The lens specimen is an objective specimen and the test object is arranged in the focal plane of the objective specimen inside the holder. The imaging objective is a collimator objective and the detector is arranged in the focal plane of the collimator objective. Either the holder or the unit is pivotably supported on the stand and the holder and the unit can be pivoted relative to one another.Type: GrantFiled: November 22, 1999Date of Patent: February 12, 2002Assignee: Leica Camera A.G.Inventors: Peter Karbe, Rolf Crema, Joachim Kühn, Bernd Harand
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Patent number: 6177986Abstract: An assemblage and method for testing a lens having a plurality of field angles employs an improved modulation transfer function (MTF) design system for evaluating image quality produced by the lens being tested. A reflecting surface capable of translational and rotational movements is arranged along a predetermined optical path for receiving a collimated array of light rays and then directing the collimated array of light rays to the lens being tested.Type: GrantFiled: August 31, 1999Date of Patent: January 23, 2001Assignee: Eastman Kodak CompanyInventor: Thomas L. Stockton
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Patent number: 5973773Abstract: A lens distortion measurement system has a first grating of a first pitch on a transparent support such as a quartz reticle. The reticle is disposed between an illumination source and the lens system whose distortion is to be measured. An image sensor is provided within the image projection field of the lens system. A second grating of a second (different) pitch is provided on another transparent support, disposed between the lens system and the image sensor. Optionally, a relay lens is disposed between the second support and the image sensor. Illumination propagates from the illumination source through the first support, through the lens system, through the second support and is incident on the image sensor. The illumination forms a Moire fringe having a pitch orders of magnitude greater than the pitches of the first and second gratings.Type: GrantFiled: January 12, 1998Date of Patent: October 26, 1999Assignee: Nikon CorporationInventor: Naoyuki Kobayashi
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Patent number: 5602640Abstract: A lensmeter accessory is disclosed for supporting and positioning a corneal contact lens in a light path of a lensmeter. The accessory comprises a generally planer body with a tapered slot therein having a slot wall defining a recessed groove for receiving and removably holding a contact lens. The accessory may be placed on an adjustable lens platform of a lensmeter to position the contact lens in the lensmeter light path.Type: GrantFiled: June 22, 1995Date of Patent: February 11, 1997Assignee: Leica Inc.Inventor: Christopher J. Percival
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Patent number: 5148231Abstract: An apparatus for measuring a refracting power of an optical system which comprises: a beam projecting optical system which projects a predetermined moving luminous flux to an optical system to be inspected; a beam condensing optical system in which a photoelectric conversion element receives a luminous flux transmitted through the optical system to be inspected; and a processing system which obtains the refracting power of the optical system to be inspected, based on an output from the beam condensing optical system; wherein a rotating plate having at least one tooth of a converging shape, which is protruded outwardly from a center of the rotating plate, is disposed in a beam path of the beam projecting system; and a luminous flux, both edges, in a moving direction thereof, of which are inclined to the moving direction with angles being different with each other and correspond to both sides of the tooth, irradiates the optical system to be inspected, by intermittently blocking the beam path by the tooth.Type: GrantFiled: June 26, 1991Date of Patent: September 15, 1992Assignee: Tomey Corp.Inventors: Shinji Ishiguro, Toshiharu Morino
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Patent number: 4702596Abstract: An optical system to be inspected is scanned with slit-shaped illuminating beams. The beams from the optical system are received with two or more pairs of photoelectric converting elements and the refractive power of the above mentioned optical system is measured on the basis of the phase difference of the output signals between the photoelectric converting elements forming the respective pairs. The angle of inclination of the slit-shaped illuminating beams to the scanning direction is made in two or more different known angles. An output device omitting the discriminating signal of the angle of inclination of the illuminating beams is provided and the discriminating signal and phase difference inputted to an operating circuit to obtain a refractive power.Type: GrantFiled: October 28, 1985Date of Patent: October 27, 1987Assignee: Sun High Teck Kabushiki KaishaInventor: Masao Nohda
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Patent number: 4526451Abstract: An apparatus in which an optical system to be examined is periodically scanned by a slit-like illuminating light beam and the light beam from the optical system is received by two pairs of photoelectric converters and the refractive power of the optical system is measured on the basis of the phase difference between the output signals of the photoelectric converters forming each of said pairs includes projection means capable of alternatively scanning the illuminating light beam from two known directions, output means adapted to put out a discrimination signal of the scanning direction of the illuminating light beam, and operational means for receiving the discrimination signal and the phase difference as inputs and obtaining a refractive power.Type: GrantFiled: March 29, 1982Date of Patent: July 2, 1985Assignee: Nippon Kogaku K.K.Inventor: Masao Nohda
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Patent number: 4241996Abstract: The invention is an apparatus for determining the quality of optical equipment through measurement of the modulation transfer function of the equipment. The apparatus includes an elongated, opaque sheet member or reticle, uniformly curved about an axis substantially perpendicular to the longitudinal centerline thereof, which has a data pattern comprising at least one bar pattern of discrete spatial frequency positioned longitudinally thereon. Each of the data patterns has optical transmission characteristics that vary periodically along its length according to a predetermined spatial frequency distribution. A rotatable mirror with its axis of rotation coincident with the center of curvature of the reticle is mounted so that it reflects an incident image onto the stationary reticle.Type: GrantFiled: September 5, 1978Date of Patent: December 30, 1980Assignee: Exotech, IncorporatedInventor: Sidney Weiser
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Patent number: 4173398Abstract: An objective eye examination apparatus generates rotating pencil rays of infrared light and focuses one of them on the eye pupil via an adjustable wedge reflector 55, 57 for varying the effective length of the optical axis. Light reflected back by the retina and returned into the optical system is passed through an image rotator 41 onto a quadrant photocell 43. The wedge reflector is adjusted until the differential outputs from the photocell reach a desired value, whereby the necessary reflector adjustment is indicative of refractive power. Unfocusable fogging light is also introduced into the eye via a dichroic mirror 39, and a further photocell 35 is disposed to receive light reflected back from the cornea only when the eye is properly positioned and open.Type: GrantFiled: March 9, 1978Date of Patent: November 6, 1979Assignee: Asahi Kogaku Kogyo Kabushiki KaishaInventors: Ikuzo Okamoto, Osamu Shindo
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Patent number: 4033696Abstract: A lens meter includes a target, a collimator lens system for forming an image of the target, a member having a reflecting surface facing the collimator lens system, and an indicating plate disposed at the focal point of the collimator lens system, and at a side opposite to the reflecting member relative to collimator lens system. The reflecting member is placed on the optical axis of the collimator lens system at a side opposite to the target relative to the collimator lens system. The reflecting member is movable along the optical axis and the target is placed at the focal point of the collimator lens system. The lens meter may further include a beam splitter for dividing the optical axes into two optical axes. In this case, the target is placed on one of the divided axes and the indicating member is placedon the other divided axis. Further improvement may be attained by providing in a suitable arrangement two polarizing plates and a quarter-wave plate.Type: GrantFiled: February 3, 1975Date of Patent: July 5, 1977Assignee: Nippon Kogaku K.K.Inventor: Masao Nohda
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Patent number: 4011446Abstract: A light focus sensor having first and second grids comprised of interlaced light transmissive and light reflective portions and a rotating optical modulator comprised of a plurality of alternate light transparent and light opaque portions. The modulator portions are half the size of the reflective portions of the grids and the modulator is positioned in relation to the grids such that the phase relationship between the portions of one grid and the portions of the modulator is 180.degree. different than the phase relationship between the portions of the other grid and the portions of the modulator such that the composite signal passing through the modulator is indicative of the directional movement required to achieve focus.Type: GrantFiled: April 18, 1975Date of Patent: March 8, 1977Assignee: Xerox CorporationInventor: Melvin E. Swanberg
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Patent number: 3960450Abstract: A lens meter for measuring the focal length of a sample lens with the sample lens disposed in a collimated light beam comprises a target, a first lens for forming an image of the target, light beam splitter means in the light beam on the image forming side of the first lens for splitting the light beam to form a second target image, a second lens having its focal points on the first and second target images through the light beam splitter means, target orthogonalizing means provided between the first and second lenses for making the first and second target images orthogonal to each other, a third lens for focusing the orthogonal target images collimated by the second lens, and target viewing means disposed at the focal point of the third lens.Type: GrantFiled: June 24, 1975Date of Patent: June 1, 1976Assignee: Nippon Kogaku K.K.Inventor: Masao Nohda
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Patent number: 3941996Abstract: An optical focus detecting apparatus for an optical system includes a focus scanning and spatial frequency filter comprising a rotating chopper disc. The disc is arranged at an angle with respect to the axis thereof whereby the disc focus position is oscillated back and forth through a predetermined plane, which plane may comprise the film plane of a camera. The disc includes a plurality of transparent and opaque radial sector pairs, the widths of the sectors of any pair being the same and randomly different from the widths of the sectors of adjacent pairs. The sector pairs are so relatively arranged that sector pairs of substantially identical widths are repeated at positions displaced 180.degree. on the disc whereby the modulation of the image optical spectrum is random in nature. The distribution of transparent and opaque sectors is such that the average transmission of light by the disc is 50 percent of the incident light.Type: GrantFiled: August 27, 1974Date of Patent: March 2, 1976Assignee: Honeywell Inc.Inventor: Norman L. Stauffer