Lens Or Reflective Image Former Testing Patents (Class 356/124)
  • Patent number: 11002978
    Abstract: A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).
    Type: Grant
    Filed: July 28, 2015
    Date of Patent: May 11, 2021
    Assignee: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Peter Euteneuer, Ralf Krueger
  • Patent number: 10977514
    Abstract: A method and apparatus for template matching to find a predetermined pattern in an image is disclosed. A first visual boundary is detected in the captured image, and a second boundary concentric with the first boundary is calculated. The first and second boundaries define a portion of the captured image. The portion of the captured image is incrementally scanned about the center of the second boundary for a predetermined pattern having a predetermined orientation within the portion that match a template image. Alternatively, the portion of the captured image is unwrapped into a linear band image such that the first and second boundaries form a linear top and linear bottom of the linear band image, and the linear band image of the portion of the captured image is scanned for a predetermined pattern that matches a template image.
    Type: Grant
    Filed: November 16, 2018
    Date of Patent: April 13, 2021
    Assignee: Zebra Technologies Corporation
    Inventors: Miroslav Trajkovic, Heng Zhang
  • Patent number: 10969300
    Abstract: The present disclosure relates to a detector system for imaging an optical signal received by a graded index (GRIN) optical element to account for known variations in a graded index distribution of the GRIN optical element. The detector system incorporates a plurality of optical detector elements configured to receive optical rays received by the GRIN optical element at specific locations on a plane of the GRIN optical element. Ray tracing software is configured to receive and map the optical rays to a plurality of additional specific locations on the plane based on the known variations in the graded index distribution of the GRIN optical element. A processor uses algorithms for diagonalization of a linear system matrix to determine information on both an intensity and an angle of the received optical rays at each one of the plurality of specific locations on the plane.
    Type: Grant
    Filed: May 29, 2020
    Date of Patent: April 6, 2021
    Assignee: Lawrence Livermore National Security, LLC
    Inventors: Jeffrey D. Bude, Eyal Feigenbaum
  • Patent number: 10942087
    Abstract: The invention relates to an apparatus (2) for detecting imaging quality of an optical system (4) with at least one lens (6) or lens group. The apparatus (2) includes an MTF measuring apparatus (10) for measuring a modulation transfer function at a plurality of field points in the field of view of the optical system (4), and a centering measuring apparatus (18) for measuring a centered state of the optical system (4). Furthermore, the invention relates to a method for detecting imaging quality of an optical system (4) having such a apparatus (2).
    Type: Grant
    Filed: May 28, 2018
    Date of Patent: March 9, 2021
    Assignee: Trioptics GmbH
    Inventors: Eugen Dumitrescu, Patrik Langehanenberg, Iris Erichsen, Alexander Bai, Simon Zilian, Aiko Ruprecht
  • Patent number: 10939817
    Abstract: Provided is an imaging method for correcting aberration generated when imaging an object to be inspected. The imaging method includes: irradiating an imaging area with a first light beam which is scanned by a scan unit and taking an image of the object to be inspected based on return light of the first light beam; detecting a moving amount of the object to be inspected; comparing the detected moving amount with a predetermined threshold value; and adjusting the imaging area to be irradiated with the first light beam. The adjusting includes determining in accordance with a result of the comparison to change the imaging area by at least one of: using the scan unit, and using an aberration correcting unit.
    Type: Grant
    Filed: July 28, 2017
    Date of Patent: March 9, 2021
    Assignee: Canon Kabushiki Kaisha
    Inventors: Koji Nozato, Tomoyuki Makihira, Kazuhide Miyata
  • Patent number: 10931942
    Abstract: An evaluation system includes an input unit that inputs a test chart image acquired by imaging a test chart including a plurality of characters, an evaluation unit that evaluates performance of an imaging unit using the test chart image, an image generation unit that generates an evaluation image representing an evaluation of the evaluation unit at each position on the test chart image with a color, and a display unit that displays the evaluation image along with the test chart image or in a superimposed manner on the test chart image.
    Type: Grant
    Filed: March 12, 2019
    Date of Patent: February 23, 2021
    Assignee: FUJIFILM Corporation
    Inventors: Yasunobu Kishine, Tatsuro Iwasaki
  • Patent number: 10885621
    Abstract: An inspection system and method to detect the presence or absence of ophthalmic lenses in a plastic shell just before the seal is applied comprising a high resolution imaging device suitably integrated with an optical module; a UV illumination module suitably mounted below the ophthalmic lens holder; a Visible LED based Top lighting module suitably mounted on Top of the Ophthalmic lens holder; the inspection system which captures images of the lens immersed in a saline solution in a the plastic shell; analyzing the image and determining the characteristics of the lens perimeter and the optical center; making a decision to reject the inspected item if the analyzed image indicates the presence of a flipped, multiple and folded lens or the absence of the lens; making a decision to accept the inspected item, if the analyzed image indicates the presence of a single lens positioned in the correct orientation.
    Type: Grant
    Filed: February 12, 2018
    Date of Patent: January 5, 2021
    Assignee: EMAGE VISION PTE. LTD.
    Inventors: Bee Chuan Tan, Chern Fei Chua
  • Patent number: 10876921
    Abstract: Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more optical parameters of a lens of eyeglasses. For example, a product may include one or more tangible computer-readable non-transitory storage media including computer-executable instructions operable to, when executed by at least one computer processor, enable the at least one computer processor to process at least one captured image of at least one reflection of a flash on a lens of eyeglasses; and determine one or more optical parameters of the lens based at least on the at least one captured image.
    Type: Grant
    Filed: January 27, 2020
    Date of Patent: December 29, 2020
    Inventors: Ofer Limon, Shahar Levy, Alexander Zlotnik, Maya Aviv
  • Patent number: 10876924
    Abstract: A wavefront based characterization of surfaces based on reflections. An intraocular lens surface measurement system includes a light source configured to emit light that is reflected off an optical surface of an intraocular lens. A wavefront sensor is configured to receive the light that is reflected off the optical surface of the intraocular lens. A processor is configured to determine one or more characteristics of the optical surface of the intraocular lens based on a wavefront of the reflected light that is received by the wavefront sensor.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: December 29, 2020
    Assignee: AMO Groningen B.V.
    Inventors: Robert Rosen, Mihai State
  • Patent number: 10794838
    Abstract: A device for detecting a defect of a laser welding cover lens includes a coaxial light source configured to emit collimating detection light, wherein the direction of the detection light is perpendicular to a preset horizontal direction; a half transparent and half reflecting mirror arranged above the coaxial light source to reflect the detection light to a preset position; a reflecting mirror configured to reflect light from the half transparent and half reflecting mirror to the cover lens; an industrial camera parallel to the half transparent and half reflecting mirror and the reflecting mirror and configured to receive incident light from the detection light to obtain a detection image, wherein the incident light is reflected by the cover lens and passes through the reflecting mirror and the half transparent and half reflecting mirror; and a processor configured to determine whether there exists a bad point on the cover lens.
    Type: Grant
    Filed: July 21, 2017
    Date of Patent: October 6, 2020
    Assignee: ISVISION (TIANJIN) TECHNOLOGY CO., LTD
    Inventors: Meng Lv, Mengyu Guo, Lei Guo, Xiaopeng Wu, Xianyong Chen
  • Patent number: 10788393
    Abstract: A system for inspecting an ophthalmic lens comprising an optical connection: an illumination source 60, wherein the light source is arranged to project the light to wards the ophthalmic lens held in the holder; an optical lens 83, wherein the lens is arranged to condition and project the light beam to illuminate the lens; a swivel glass plate 40, which is arranged to move in and out of the optical axis 110; a bright field imaging unit, wherein the bright field imaging unit is arranged to capture an image projected by the illumination source 60; a dark field imaging unit, wherein the dark field imaging unit is arranged to capture an image projected by the illumination source 60; and at least one camera sensor operatively coupled with the swivel glass plate, wherein the at least one camera sensor is arranged to capture an image of the light penetrating through the optical lens 83 contained at the bottom of the container 50 and the optical module 20 positioned in line with the optical axis 110.
    Type: Grant
    Filed: May 12, 2015
    Date of Patent: September 29, 2020
    Assignee: EMAGE VISION PTE. LTD
    Inventors: Bee Chuan Tan, Lew Siang Charles Cher
  • Patent number: 10773478
    Abstract: A testing device includes a positioning assembly and a testing assembly. The positioning assembly positions a workpiece. The testing assembly tests the workpiece. The positioning assembly includes a mounting seat defining a receiving slot for receiving and positioning the workpiece. The mounting seat includes a first positioning surface and a second positioning surface. The positioning assembly includes a side pusher configured to move toward the receiving slot. The side pusher includes a first pushing surface and a second pushing surface. When the side pusher is driven to move toward the receiving slot, the first pushing surface and the second pushing surface push two surfaces of the workpiece to make opposite two surfaces of the workpiece come in contact with the first positioning surface and the second positioning surface to position the workpiece in the receiving slot.
    Type: Grant
    Filed: August 21, 2019
    Date of Patent: September 15, 2020
    Assignee: TRIPLE WIN TECHNOLOGY (SHENZHEN) CO. LTD.
    Inventor: Ying-Quan Zhao
  • Patent number: 10756429
    Abstract: Methods and systems are provided for dynamically adjusting the beamform of an antenna array. A first beamform produced by an emission from a first antenna and an emission from a second antenna are determined, each of the first antenna and the second antenna having separate power supplies. Positions of user devices served by the cell of the antenna array are determined and compared to the first beamform. If it is determined that a second beamform would provide better coverage to any one or more of the user devices served by the cell, any one or more of the power supplies to individual antennas may be modified. Any one or more power supplies may utilize changes in the phase and/or amplitude of the power supplied to an antenna to change the emission of at least one antenna, producing a second beamform. The second beamform, in particular, may permit dynamic targeting of various vertical distributions of user devices within the cell.
    Type: Grant
    Filed: March 22, 2018
    Date of Patent: August 25, 2020
    Assignee: Sprint Communications Company L.P.
    Inventors: Sreekar Marupaduga, Rajveen Narendran
  • Patent number: 10739686
    Abstract: The present invention allows more freely setting of the polarization direction of illumination light on an illumination surface of an exposure device. A beam transmission system (121) that transmits, to an exposure device (130), a linearly polarized optical beam (L) output from a free electron laser device (10) includes: an optical beam splitting unit (50) configured to split the optical beam (L) into a first optical beam (L1) and a second optical beam (L2); and a first polarization direction rotating unit (51) configured to rotate the linear polarization direction of the first optical beam (L1).
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: August 11, 2020
    Assignee: Gigaphoton Inc.
    Inventors: Akiyoshi Suzuki, Osamu Wakabayashi
  • Patent number: 10702891
    Abstract: By using an offset parabolic concave mirror as a concave mirror, and arranging a lens having an entrance pupil at the geometric focal point of the offset parabolic concave mirror, a group of rays incident parallel to the optical axis of the offset parabolic concave mirror become chief rays which are telecentric with respect to an object plane orthogonal to the optical axis of the offset parabolic concave mirror, and diverging light from each object point on the object plane can be detected on a quadric image plane formed by the lens at the focal point of the offset parabolic concave mirror without blind spots. An image of the target object is detected after the beams reflected by the offset parabolic concave mirror are bent by the reflecting mirrors and made incident on the lens to reduce the size and cost of the device.
    Type: Grant
    Filed: August 29, 2016
    Date of Patent: July 7, 2020
    Assignees: SATAKE CORPORATION, GENESIA CORPORATION
    Inventors: Yoichi Kawamura, Nobuyoshi Ikeda, Norihide Takeyama, Yoshikazu Kanai
  • Patent number: 10672362
    Abstract: A media engine includes modules to retrieve a first graphics object and a second graphics object to be displayed on a screen, and perform asynchronous pixel transfers of the first graphics object and the second graphics object such that the first graphics object and the second graphics object are shown independently in a single frame, and the asynchronous pixel transfers include batching of draw calls based on the similarity of meshes in the first graphics object and the second graphic object to generate a batch of draw calls.
    Type: Grant
    Filed: August 17, 2018
    Date of Patent: June 2, 2020
    Assignee: FFIPCO, LLC
    Inventors: Patrick McKeever, Richard Ferdinand, Cornelius Shea
  • Patent number: 10634562
    Abstract: According to a first aspect, there is provided a method of holographic wavefront sensing, the method including: receiving a light beam, which has a wavefront to be analyzed, on a transparent, flat substrate, which is provided with a lattice of opaque dots, wherein the substrate is arranged above an image sensor; detecting by the image sensor an interference pattern formed by diffracted light, being scattered by the opaque dots, and undiffracted light of the light beam received by the image sensor; processing the detected interference pattern to digitally reconstruct a representation of a displaced lattice of opaque dots, which would form the interference pattern on the image sensor upon receiving the light with a known wavefront; and comparing the representation of the displaced lattice to a known representation of the lattice of opaque dots on the substrate to determine a representation of the wavefront form of the received light beam.
    Type: Grant
    Filed: November 24, 2017
    Date of Patent: April 28, 2020
    Assignee: IMEC VZW
    Inventors: Abdulkadir Yurt, Ziduo Lin, Richard Stahl, Geert Vanmeerbeeck
  • Patent number: 10627309
    Abstract: Provided is a micro-distance lens detection device adapted to detect a tested lens with a surface from a micro distance. The micro-distance lens detection device includes a light source module, a diffuser, a pattern test card, a collimator unit and an image pickup module which are arranged sequentially. The tested lens is disposed between the pattern test card and the collimator unit. The surface of the tested lens is separated from the light-emitting side of the pattern test card by the micro distance. The micro distance is less than 25 mm. Given the micro distance between the tested lens and the pattern test card, the optical resolution modulation transfer function (MTF) of the tested lens is correctly measured. Therefore, the lens detection device takes up little space.
    Type: Grant
    Filed: December 25, 2018
    Date of Patent: April 21, 2020
    Assignee: NEWMAX TECHNOLOGY CO., LTD.
    Inventors: Wei-Chun Shih, Yi-Huan Chu, Tsung-Chien Chiang
  • Patent number: 10607335
    Abstract: A method of measuring the thickness of an ophthalmic lens includes providing an ophthalmic lens having a light absorptive component, and passing light having a wavelength through the ophthalmic lens whereupon the light absorptive component absorbs some of the light as the light passes through the ophthalmic lens. After the light has passed through the ophthalmic lens, the light is used to generate a digital image for the ophthalmic lens that has pixel intensity data that corresponds to the shape of the ophthalmic lens. Information about the light prior to passing through the ophthalmic lens, the light absorptive component of the ophthalmic lens, and the pixel intensity data is used to calculate a thickness profile for the ophthalmic lens.
    Type: Grant
    Filed: June 20, 2017
    Date of Patent: March 31, 2020
    Assignee: Johnson & Johnson Vision Care, Inc.
    Inventors: Michael F. Widman, Peter W. Sites, Jasmin G. Laferriere, D. Scott Dewald, Bradley W. Walker
  • Patent number: 10598220
    Abstract: A bearing device and an ion implantation device are provided. The bearing device includes a bearing table configured to bear a substrate, and a plurality of supporting components configured to support the substrate, each supporting component is movably arranged on the bearing table, to support the substrate at an adjustable position.
    Type: Grant
    Filed: November 17, 2017
    Date of Patent: March 24, 2020
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Chenliang Liu, Donghua Jiang, Yongyi Fu, Chao Tan, Xuewei Wang, Rujian Li, Kang Luo, Yongzhou Ling, Yin Xie, Jianbo Yang, Fei Li
  • Patent number: 10591747
    Abstract: Disclosed is an inspection and system method and system for determining the orientation of a contact lens on a lens support, particularly in an automated contact lens manufacturing line.
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: March 17, 2020
    Assignee: Alcon Inc.
    Inventors: Steffen Paulekuhn, Susanne Fechner, Sarah Unterkofler, Daniel Kessler, Evgeni Schumm, Matthias Schwab
  • Patent number: 10582972
    Abstract: An intraoral 3D scanner includes a probe light source configured to generate a probe light such that the probe light is transmitted towards the dental situation; a camera including an array of sensor elements, the camera being arranged such that the probe light from the dental situation is transmitted to the array of sensor elements, wherein the camera is configured to create images of the dental situation from which a point cloud is generated, and a guiding system configured to guide relative movement of the intraoral 3D scanner towards the dental situation, wherein the camera is part of the guiding system, the camera is configured to record images from which a relative position of the intraoral 3D scanner and the dental situation is determined, such that based on the relative position, the guiding system is configured to provide a positioning signal in the form of a positioning color code.
    Type: Grant
    Filed: April 16, 2019
    Date of Patent: March 10, 2020
    Assignee: 3Shape A/S
    Inventors: Nikolaj Deichmann, Rune Fisker
  • Patent number: 10551250
    Abstract: Disclosed are display panel test device and method. The device comprises: a color analyser including a host and a measuring probe, wherein the measuring probe can obtain optical information of a positional point of a light emitting surface of display panel, the positional point being a point to which the measuring probe is aligned on the light emitting surface, and the host can determine optical characteristics of the positional point according to the optical information; and a position determination component, configured to determine a positional identifier of the positional point on the light emitting surface, the positional identifier being capable of indicating a relative position of the positional point on the light emitting surface. Since the position determination component determines the position of the to-be-tested point, it is not necessary to visually place the measuring probe over the to-be-tested point, thereby improving the determination accuracy of the to-be-tested point.
    Type: Grant
    Filed: April 24, 2018
    Date of Patent: February 4, 2020
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Lixin Zhu, Ke Dai, Chunyang Nie
  • Patent number: 10533925
    Abstract: A process is provided for determining characteristics of a lens, the process including obtaining a captured image of a pattern through a corrective lens; transforming the captured image to an ideal coordinate system; processing the captured image to determine an overall distortion from a reference pattern to the pattern of the captured image; determining a distortion of the captured pattern attributable to the corrective lens; and measuring at least one characteristic of the corrective lens. In some embodiments, the overall distortion is determined by detecting, in the captured image, at least one captured pattern landmark; determining a transformation from at least one ideal pattern landmark to the at least one captured pattern landmark; and determining for the corrective lens, from the transformation, a spherical power measurement, a cylinder power measurement, and an astigmatism angle measurement.
    Type: Grant
    Filed: June 28, 2018
    Date of Patent: January 14, 2020
    Assignee: JAND, INC.
    Inventors: David Howard Goldberg, Joseph Carrafa
  • Patent number: 10502545
    Abstract: A measurement arrangement and a method for measuring a wavefront aberration of an imaging optical system (10) of a microlithographic projection exposure apparatus. The method includes separate measurement of respective wavefront aberrations of different partial arrangements (M1; M2; M3; M1, M3) of the optical elements.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: December 10, 2019
    Assignee: CARL ZEISS SMT GMBH
    Inventors: Ulrich Wegmann, Hans-Michael Stiepan, Jochen Hetzler
  • Patent number: 10502967
    Abstract: The disclosure is related to a method for rendering a three-dimensional image, an imaging method and a system. The system receives three-dimensional image information regarding. A reference image with respect to the three-dimensional image can be created based on the information. According to the physical information relating to multiple optical elements of a display device, an element image corresponding to each optical element is calculated. The multiple elements images corresponding to the multiple optical elements render an integral image. The integral image is used to render the three-dimensional image through the multiple optical elements. In one embodiment, the optical element is a lens set. The integral image is inputted to a display driving unit of the display device so as to render the element image for every lens set. The display device then displays the integral image so as to from the three-dimensional image through a lens array.
    Type: Grant
    Filed: January 10, 2018
    Date of Patent: December 10, 2019
    Assignee: CHERAY CO. LTD.
    Inventors: Chun-Hsiang Yang, Yi-Pai Huang, Kai-Chieh Chang, Chih-Hung Ting, Jui-Yi Wu
  • Patent number: 10495865
    Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.
    Type: Grant
    Filed: April 18, 2016
    Date of Patent: December 3, 2019
    Assignee: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Werner Knebel, Frank Sieckmann, Florian Fahrbach
  • Patent number: 10455169
    Abstract: The disclosure addresses the vignetting effect caused on an image captured by lightfield camera. A method to compensate for the vignetting effect for a lightfield camera comprising an image sensor array including plurality of photosites. The method includes the operations of obtaining luminance values from the each photosite; obtaining a set of weight values for compensating the vignetting effect for the each photosite being associated with a present setting of the lightfield camera; and changing the luminance values of the each photosite based on the obtained a set of the weight values.
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: October 22, 2019
    Assignee: INTERDIGITAL CE PATENT HOLDINGS
    Inventors: Mozhdeh Seifi, Valter Drazic, Paul Kerbiriou
  • Patent number: 10444112
    Abstract: A wavefront measurement apparatus includes a light source unit, a holding unit, a light reception optical system, a wavefront measurement unit, and a wavefront data generation unit. The light source unit is configured to apply light beams toward the subject optical system. The wavefront measurement unit is configured to measure light beams transmitted through the subject optical system. The wavefront data generation unit is configured to generate wavefront aberration data from results of the measurement by the wavefront measurement unit. A neighborhood of the opening portion and a neighborhood of the wavefront measurement unit are made to be optically conjugate with each other by the light reception optical system. The measurement of the light beams includes at least measurement of the light beams in a state in which a center of the opening portion is separated away from the measurement axis by a predetermined distance.
    Type: Grant
    Filed: September 27, 2017
    Date of Patent: October 15, 2019
    Assignee: OLYMPUS CORPORATION
    Inventor: Yosuke Sato
  • Patent number: 10444512
    Abstract: An optical characterization system tests optical elements of head-mounted displays (HMD) such as lenses. The system emits a test pattern of light through an aperture of a hollow truncated cone. The hollow truncated cone may be rotated to different angles of test positions, for example, to mimic rotation of a human eye of a user wearing an HMD. The emitted light is refracted by a test lens and captured by a detector assembly. Using images captured by the detector assembly, the system determines one or more quality metrics of the test lens. Quality metrics may describe various types of optical aberrations, which may be determined as a function of the test positions (e.g., angle and/or position of the hollow truncated cone relative to the test lens). In addition, the system may generate an optical profile of the test lens using the quality metrics.
    Type: Grant
    Filed: January 9, 2018
    Date of Patent: October 15, 2019
    Assignee: Facebook Technologies, LLC
    Inventors: Daozhi Wang, Ning Yeung Chan, Youngshik Yoon, Shizhe Shen, Torin Ross Herndon
  • Patent number: 10408705
    Abstract: The present disclosure relates to a method for imaging an optical signal received by a graded index (GRIN) optical element to account for known variations in a graded index distribution of the GRIN optical element. The method may involve using a plurality of optical detector elements to receive optical rays received by the GRIN optical element at a plane, where the plane forms a part of the GRIN optical element or is downstream of the GRIN optical element relative to a direction of propagation of the optical rays. The optical rays are then traced to a plurality of additional specific locations on the plane based on the known variations in the graded index distribution of the GRIN optical element. A processor may be used to determine information on both an intensity and an angle of the received optical rays at each one of the plurality of specific locations on the plane of the GRIN optical element.
    Type: Grant
    Filed: December 21, 2017
    Date of Patent: September 10, 2019
    Assignee: Lawrence Livermore National Security, LLC
    Inventors: Eyal Feigenbaum, Jeffrey D. Bude
  • Patent number: 10401145
    Abstract: A method for calibrating an optical arrangement for determining dimensional properties of a measurement object and a coordinate measuring machine implementing the method are disclosed. The optical arrangement has a camera and a projector for projecting a first periodic pattern onto a projection area. The optical arrangement is moveable relative to a workpiece table along a first axis. A matte surface is arranged on the workpiece table at a first position relative to the optical arrangement. A second periodic pattern, which is separate from the first periodic pattern, is provided and shifted on the matte surface. Images of the second pattern are recorded using the camera and at least one distortion aberration of the camera is determined using the second periodic pattern.
    Type: Grant
    Filed: June 5, 2017
    Date of Patent: September 3, 2019
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Frank Hoeller, Oliver Paul, Frank Widulle
  • Patent number: 10393651
    Abstract: Provided are an attachment for liquid sample measurement which is capable of effectively reducing a consumption amount of a liquid sample, a refractive index measuring device and a refractive index measuring method. An attachment (100) is disposed on a V-block prism (1) formed on a V-shaped groove (11) for keeping a sample so as to enter the groove (11). A body (110) of the attachment (100) forms an enclosing space (107) for enclosing the liquid sample between the body and a surface of the groove (11) formed on the V-block prism (1), and makes the liquid sample enclosed in the enclosing space (107) contact directly with the surface of the groove (11).
    Type: Grant
    Filed: August 10, 2018
    Date of Patent: August 27, 2019
    Assignee: SHIMADZU CORPORATION
    Inventor: Tetsuya Nagai
  • Patent number: 10339836
    Abstract: A demonstrator (1) of qualities of a spectacle lens material, includes a hollow base (10) which is open through an observation window (13), and a lens (20) which closes the observation window and includes at least one part (21) made of the spectacle lens material. The demonstrator includes at least two separate demonstration elements selected from the following list: an electrostatic element (50) that can move under the action of an electrostatic attraction; an ultraviolet mark (43) which allows the ultraviolet light to be viewed with the naked eye; and an abrasive element (30) suitable for scratching the demonstrator lens (20).
    Type: Grant
    Filed: April 7, 2014
    Date of Patent: July 2, 2019
    Assignee: ESSILOR INTERNATIONAL
    Inventors: Carole Nadolny, Fabien Calandrini
  • Patent number: 10309903
    Abstract: An ICP emission spectrophotometer includes an inductively coupled plasma device, a spectroscope, and a computer. The spectroscope includes an incidence window, an incidence side slit, a diffraction grating, an emission window, an emission side slit, and a detector. Measurement conditions including diffraction condition and a measurement result are displayed on a display device. In a case where there are a plurality of diffraction conditions each including a combination of a diffraction grating and a diffraction order for measuring desired diffracted light, comparison information including at least an intensity and a resolution of emitted light in the diffraction condition is displayed on the display device. A measurer selects diffraction conditions in which resolution is higher from among the diffraction conditions, and selects a diffraction condition in which an intensity is obtained from among the selected diffraction conditions.
    Type: Grant
    Filed: March 20, 2018
    Date of Patent: June 4, 2019
    Assignee: Hitachi High-Tech Science Corporation
    Inventor: Yutaka Ikku
  • Patent number: 10306218
    Abstract: An exemplary camera calibration apparatus includes a movable, e.g., rotatable, support structure which is controllably positioned to allow for image capture of different test patterns and image capture of the same pattern at different distances by a mounted camera. A first test pattern is mounted on a wall, e.g., a pyramid shaped 4 sided wall formed by panels surrounding the camera under calibration. The movable support structure has a first mirror attached to a first side and has a second test pattern attached to a second side. A second mirror mounted on an internal sidewall of the calibration apparatus housing facilities a different image path distance between the camera capturing the image of the first test pattern and the first test pattern. The exemplary camera calibration apparatus is well suited for efficiently calibrating camera devices including a plurality of camera modules, e.g., optical chains, in a relatively small area.
    Type: Grant
    Filed: June 24, 2016
    Date of Patent: May 28, 2019
    Assignee: LIGHT LABS INC.
    Inventors: Nitesh Shroff, Weiguang Si, Nagilla Dikpal Reddy, John Sasinowski, Nghi Phan, Jiamin Bai, Harpuneet Singh, Rajiv Laroia
  • Patent number: 10279425
    Abstract: A method of preparing an apparatus for material processing by generating optical breakthroughs in an object. The apparatus includes a variable focus adjustment device. A contact element is mounted to the apparatus, the contact element has a curved contact surface having a previously known shape. The position of the contact surface is determined prior to processing the object, by focusing measurement laser radiation near or on the surface by the variable focus adjustment device, and the focus position is adjusted in a measurement surface intersecting the expected position of the contact surface. Radiation from the focus of the measurement laser radiation is confocally detected. The position of points of intersection between the measurement surface and the contact surface is determined from the confocally detected radiation to determine the position of the contact surface from the position of the points of intersection and the previously known shape of the contact surface.
    Type: Grant
    Filed: February 24, 2016
    Date of Patent: May 7, 2019
    Assignee: Carl Zeiss Meditec AG
    Inventors: Mark Bischoff, Gregor Stobrawa
  • Patent number: 10241425
    Abstract: A level sensor to determine a height level of a substrate, that includes a projection unit including a projection grating having a period P, the projection grating configured to provide a patterned measurement beam, to the substrate, having a periodically varying intensity distribution in a first direction having the period P; a detection unit to receive a reflected patterned measurement beam after reflection on the substrate, the reflected patterned measurement beam having a periodically varying intensity distribution in a second direction, having the period P, wherein the detection unit has a sensor array to receive the reflected patterned measurement beam, the sensor array including a plurality of sensing elements arranged along the second direction at a pitch p smaller than or equal to half the period P, and a processing unit to determine the height level of the substrate based on a signal from the sensor.
    Type: Grant
    Filed: November 19, 2015
    Date of Patent: March 26, 2019
    Assignee: ASML Netherlands B.V.
    Inventor: Marinus Petrus Reijnders
  • Patent number: 10180374
    Abstract: A test device for testing a first contact lens classified as a specific type of contact lens is disclosed. The test device includes a light emitting unit and a detection unit. The light emitting unit emits a first incident light to the first contact lens to generate a first reflected light having a first light intensity, and the detection unit receives the first reflected light, in response to the first light intensity generates a first light intensity value, and implements a specific water content algorithm based on the first light intensity value to estimate an actual water content associated with the first contact lens, wherein the specific water content algorithm is constructed based on a water content reference data associated with the specific type of contact lens and a corresponding light intensity measurement data associated with the water content reference data.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: January 15, 2019
    Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
    Inventors: Yu-Hsuan Lin, Hsin-Yi Tsai, Kuo-Cheng Huang, Min-Wei Hung
  • Patent number: 10142561
    Abstract: A handheld device includes: an input control configured to control and modify a virtual scene including a virtual camera; and a display that shows a representation of the controlled and modified virtual scene generated by the virtual camera. A system includes: a computer system configured to execute program instructions for generating a virtual scene including a virtual camera; and handheld device configured to communicate with the computer system for controlling and modifying the virtual scene, the handheld device comprising: an input control configured to control and modify the virtual scene; and a display that shows a representation of the controlled and modified virtual scene generated by the virtual camera.
    Type: Grant
    Filed: March 20, 2017
    Date of Patent: November 27, 2018
    Assignee: Lucasfilm Entertainment Company Ltd.
    Inventors: Spencer Reynolds, Michael Sanders, Kevin Wooley, Steve Sullivan, Adam Schnitzer
  • Patent number: 10109045
    Abstract: An apparatus divides a photographed image of a sheet-like inspection object into blocks each of which has a size of a predetermined number of pixels by a predetermined number of pixels, calculates a longitudinal variance based on pixel values in a longitudinal direction in each block and a lateral variance based on pixel values in a lateral direction in the block, determines whether the block is a defect candidate using the longitudinal variance and the lateral variance as sheet-like inspection object defect determination evaluation values, and determines, based on one of a length and an area of the blocks determined as the defect candidates, whether the sheet-like inspection object has defect.
    Type: Grant
    Filed: July 6, 2016
    Date of Patent: October 23, 2018
    Assignee: Ricoh Company, Ltd.
    Inventors: Hiroaki Kobayashi, Makoto Hino, Keiichi Miyamoto
  • Patent number: 10101149
    Abstract: Methods and systems are disclosed for analyzing the adhesiveness of enamel frits using topography. One method includes analyzing a topography of a defined area of an enamel frit surface having a plurality of peaks and determining a topographical parameter of the defined area based on peak shape and/or density. The determined topographical parameter may be compared to a threshold value. The method may then include applying an adhesive to the enamel frit and bonding the enamel frit to a substrate if the determined topographical parameter is below the threshold value. The analysis of the topography may be performed using a non-contact profilometer, such as an optical profilometer. In one embodiment, the topographical parameter may be developed interfacial roughness (Sdr). The method may be integrated into a manufacturing/assembly line for vehicle glass components, such as windshields or side windows.
    Type: Grant
    Filed: April 12, 2017
    Date of Patent: October 16, 2018
    Assignee: Ford Global Technologies, LLC
    Inventors: Larry Paul Haack, Shannon Christine Bollin, Ann Marie Straccia, Sabrina Louise Peczonczyk, Steven J. Simko, Patricia Karen Konopka
  • Patent number: 10078258
    Abstract: A laser light source (110) emits a light that is a laser light. A projection control unit (120) controls, on the basis of image information, the intensity distribution of a light to be projected, thereby generating an image. A projection unit (130) projects the light as controlled by the projection control unit (120). A measurement unit (140) measures the intensity of the light projected from the projection unit (130). A distribution calculation unit (150) calculates, on the basis of the image information, the intensity distribution of the light to be projected from the projection unit (130). A selection unit (160) selects that partial evaluation area of the image which is to be used for determination. A determination unit (170) determines, on the basis of both the light intensity distribution, in the evaluation area, calculated by the distribution calculation unit (150) and the light intensity, in the evaluation area, measured by the measurement unit (140), whether any abnormal projection has occurred.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: September 18, 2018
    Assignee: NEC CORPORATION
    Inventor: Fujio Okumura
  • Patent number: 10072971
    Abstract: A beam delivery technology for high power laser systems, like laser peening systems, for work pieces which may have compound curvatures, includes placing an optical assembly having a receiving optic, beam formatting optics and a scanner mounted thereon, in a position to receive laser pulses from a laser source and within an operating range of the process area. Polarized laser pulses are delivered to the receiving optic while the position of the optical assembly remains unchanged. The pulses proceed through the beam formatting optics to the scanner, and are direct to respective impact areas having nominal shapes and locations on the work piece. The scanning process includes for each laser pulse, setting direction, divergence, polarization, rotation and aspect ratio of the laser pulses output from the scanner, to control the polarization, shape and location on respective impact areas.
    Type: Grant
    Filed: November 12, 2010
    Date of Patent: September 11, 2018
    Assignee: METAL IMPROVEMENT COMPANY, LLC
    Inventors: C. Brent Dane, Edward W. H. Lao, Fritz B. Harris, Jr., Randall L. Hurd, Jon Rankin, Scott N. Fochs
  • Patent number: 10048164
    Abstract: A method for automated in-line determination of the center thickness of an ophthalmic lens including providing an inspection cuvette (2) having an optically transparent bottom (21) and a concave inner surface (210) and containing the lens immersed in a liquid, providing an interferometer having a light source and a focusing probe (30) focusing light coming from the light source to a set position (310) of the lens. Focusing probe (30) also directs light reflected at the boundary between the back surface of the lens and the liquid as well as light reflected at the boundary between the front surface of the lens and the liquid or at the boundary between the front surface of the lens and the concave inner surface (210) to a detector of the interferometer. The center thickness of the lens is determined using the light reflected at the respective boundary at the back surface and at the front surface of the lens.
    Type: Grant
    Filed: September 26, 2013
    Date of Patent: August 14, 2018
    Assignee: Novartis AG
    Inventors: Roger Biel, Matthias Schwab
  • Patent number: 10024790
    Abstract: Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article.
    Type: Grant
    Filed: October 4, 2013
    Date of Patent: July 17, 2018
    Assignee: Seagate Technology LLC
    Inventors: Joachim Walter Ahner, David M. Tung, Samuel Kah Hean Wong, Henry Luis Lott, Stephen Keith McLaurin, Maissarath Nassirou, Florin Zavaliche
  • Patent number: 10020879
    Abstract: An optical transmission apparatus may include a coherent detector, a photoelectric converter, an amplifier, a gain controller, and an optical power monitor. The coherent detector may perform a coherent detection on received light including a plurality of wavelengths to select light having any one of the wavelengths. The photoelectric converter may convert the light having the selected wavelength to an electrical signal. The amplifier may amplify the electrical signal. The gain controller may control a gain of the amplifier depending on an output amplitude of the amplifier. The optical power monitor may calculate an optical power level of the selected wavelength based on the gain and the output amplitude.
    Type: Grant
    Filed: October 21, 2016
    Date of Patent: July 10, 2018
    Assignee: FUJITSU LIMITED
    Inventors: Taku Saito, Taketo Endo, Kosuke Komaki
  • Patent number: 10012911
    Abstract: A projection exposure apparatus includes a projection lens, a wavefront manipulator and a wavefront measuring device for measuring a wavefront in the projection lens. The wavefront measuring device includes a Moiré grating arrangement having an object grating and an image grating which are designed to be arranged in an object plane and an image plane, respectively, of the projection lens. The object grating and the image grating are coordinated with one another in a manner true to scale in such a way as to generate a Moiré superimposition pattern from an imaging of the object grating onto the image plane and the image grating. The Moiré grating arrangement is designed in such a way as to simultaneously generate the Moiré superimposition pattern for a plurality of field points of an object field in the object plane and/or of an image field in the image plane.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: July 3, 2018
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Michael Arnz, Sascha Bleidistel, Toralf Gruner, Joachim Hartjes, Markus Schwab
  • Patent number: 9995689
    Abstract: Parameters of a sample are measured using a model-based approach that utilizes the difference between experimental spectra acquired from the sample and experimental anchor spectra acquired from one or more reference samples at the same optical metrology tool. Anchor parameters of the one or more reference samples are determined using one or more reference optical metrology tools. The anchor spectrum is obtained and the target spectrum for the sample is acquired using the optical metrology tool. A differential experimental spectrum is generated based on a difference between the target spectrum and the anchor spectrum. The parameters for the sample are determined using the differential experimental spectrum and the anchor parameters, e.g., by comparing the differential experimental spectrum to a differential simulated spectrum, which is based on a difference between spectra simulated using a model having the parameters and a spectrum simulated using a model having the anchor parameters.
    Type: Grant
    Filed: May 22, 2015
    Date of Patent: June 12, 2018
    Assignee: Nanometrics Incorporated
    Inventor: Pedro Vagos
  • Patent number: 9976931
    Abstract: An optical imaging arrangement includes an optical projection system and a support structure system. The optical projection system includes a group of optical elements configured to transfer, in an exposure process using exposure light along an exposure light path, an image of a pattern of a mask onto a substrate. The support structure system includes an optical element support structure and a metrology support structure. The optical element support structure supports the group of optical elements, while the metrology support structure supports a group of metrology devices associated with the group of optical elements and configured to capture status information representative of at least one of a position and an orientation of each of the optical elements in at least one degree of freedom up to all six degrees of freedom.
    Type: Grant
    Filed: November 10, 2014
    Date of Patent: May 22, 2018
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Yim-Bun Patrick Kwan, Erik Ruinemans