With Background Radiation Comparison Patents (Class 356/307)
  • Patent number: 11828705
    Abstract: Apparatuses, methods, and systems for detecting a sample are disclosed. One method includes generating, by a tunable light source, a beam of electro-magnetic radiation, wherein a wavelength of the beam of electro-magnetic radiation is tuned to operate at a plurality of wavelengths. At least a portion of the beam of electro-magnetic radiation is directed to pass through the sample and a reference substance. The system detector is configured to sense at least the portion of the beam of electro-magnetic radiation after passing through the sample and the reference substance. The processor operates to receive information related to intensity or amplitude of the sensed beam of electro-magnetic radiation after passing through the sample and the reference substance and detect an amount of the sample based on the received information related to the intensity or amplitude of the sensed beam of the electro-magnetic radiation.
    Type: Grant
    Filed: March 31, 2022
    Date of Patent: November 28, 2023
    Assignee: Sparrow Detect, Inc.
    Inventors: Eric R. Crosson, David A. Fisher
  • Patent number: 11754494
    Abstract: A device for simultaneously measuring mercury, cadmium, zinc, and lead is provided, including: a gas generating device; a quartz analysis tube connected to the gas generating device, and the quartz analysis tube includes a sample heating zone, a high-temperature packing zone and a quartz collimating tube; an atomic absorption detection device AA1 arranged behind the quartz analysis tube, where the atomic absorption detection device includes an atomic absorption detector, a flame, and a light source; a quartz catalytic tube arranged behind the atomic absorption detection device, where the quartz catalytic tube includes a flame buffer zone and an adsorption packing zone; and an atomic absorption mercury measuring device arranged behind the quartz catalytic tube, where the atomic absorption mercury measuring device includes a mercury enrichment tube, an atomic absorption detector AA2 and an air pump.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: September 12, 2023
    Assignee: CHANGSHA KAIYUAN HONGSHENG TECHNOLOGY CO., LTD
    Inventors: Li Feng, Guo Sun, Te Xiao
  • Patent number: 11175589
    Abstract: Automatic wavelength or angle pruning for optical metrology is described. An embodiment of a method for automatic wavelength or angle pruning for optical metrology includes determining a model of a structure including a plurality of parameters; designing and computing a dataset of wavelength-dependent or angle-dependent data for the model; storing the dataset in a computer memory; performing with a processor an analysis of the dataset for the model including applying an outlier detection technology on the dataset, and identifying any data outliers, each data outlier being a wavelength or angle; and, if any data outliers are identified in the analysis of the dataset of the model, removing the wavelengths or angles corresponding to the data outliers from the dataset to generate a modified dataset, and storing the modified dataset in the computer memory.
    Type: Grant
    Filed: June 2, 2014
    Date of Patent: November 16, 2021
    Assignee: KLA Corporation
    Inventors: Lie-Quan Lee, Leonid Poslavsky
  • Patent number: 10825666
    Abstract: Provided is a plasma monitoring apparatus including an objective lens configured to collect light that is emitted from plasma and passes through an optical window of a chamber, a beam splitter configured to divide the light collected by the objective lens into first light and second light, a first optical system and a second optical system that are provided on a first optical path of the first light and a second optical path of the second light, respectively, the first optical system and the second optical system having different focal lengths such that focal points of the first optical system and the second optical system are set at different regions in the plasma, and a light detector configured to detect the first light that has passed through the first optical system and the second light that has passed through the second optical system.
    Type: Grant
    Filed: April 26, 2019
    Date of Patent: November 3, 2020
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kyeong-Hun Kim, Jeong-Il Mun, Hyung-Joo Lee, Jong-Woo Sun, Dong-Kyu Kim
  • Patent number: 10557792
    Abstract: A method for spectral interpretation in absorption spectroscopy uses a nonlinear spectral fitting algorithm for interpretation of spectral features in complex absorption spectra. The algorithm combines two spectral modeling techniques for generating spectral models to be used in the curve fitting process: a line-shape model and a basis-set model. The selected models for all gas components are additively combined using a least squares minimization, allowing for quantification of multiple species simultaneously.
    Type: Grant
    Filed: December 31, 2015
    Date of Patent: February 11, 2020
    Inventors: Elena S. F. Berman, Andrew Fahrland, Manish Gupta, Douglas S. Baer, John Brian Leen
  • Patent number: 10473526
    Abstract: The invention pertains to a method of spatially resolved detection of a gas substance in an area, comprising: imaging the area on a first image sensor, in a wavelength spectrum including an absorption wavelength peak corresponding to said gas substance; imaging the area on a second image sensor, to provide for each pixel of the first image a corresponding pixel of the second image for respective on- and off-peak wavelengths relative to the absorption wavelength; and providing a difference image as a function of the two pixel values of first and second image sensors to produce an image of the spatially resolved absorption wavelength corresponding to said gas substance.
    Type: Grant
    Filed: November 13, 2015
    Date of Patent: November 12, 2019
    Assignee: NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
    Inventors: Huibert Visser, Hedser van Brug
  • Patent number: 10184886
    Abstract: There are provided an atomic absorption photometer and an atomic absorption measurement method which can easily perform background correction in a short time period by using a plurality of types of methods while suppressing the amount of samples consumed. Background correction is performing by using each of the D2 lamp method, the Zeeman method, and a self-reversal method, according to measurement data in each of measurement periods T41 to T46 obtained in one data acquisition cycle. Background correction is performed on the common measurement data (atomic absorption data) obtained in the atomic absorption measurement period T41, by using the measurement data (background data) obtained in each of the first to third background measurement periods T44, T46, and T42.
    Type: Grant
    Filed: November 11, 2014
    Date of Patent: January 22, 2019
    Assignee: SHIMADZU CORPORATION
    Inventor: Kazuo Sugihara
  • Patent number: 10161856
    Abstract: A magneto-optical bio-detection device including: a sample cell, a coil, a magnetic core, a light source and a light detection unit. The sample cell is filled with a solution containing a detection object and a magnetic biosensor capable of combining with the detection object to form a magnetic cluster. The coil is used for producing an oscillating magnetic field. The magnetic core has a guide portion, and an upper magnetic pole and a lower magnetic pole located at both ends of the guide portion; on a cross section orthogonal to the oscillating magnetic field, a cross-sectional area of the upper magnetic pole is less than a cross-sectional area of the guide portion. The light source is used for emitting light rays to penetrate the sample cell. The light detection unit is used for receiving the light rays that penetrated the sample cell to produce a detection signal.
    Type: Grant
    Filed: January 19, 2018
    Date of Patent: December 25, 2018
    Inventor: Ping-Chieh Wu
  • Patent number: 10151633
    Abstract: Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.
    Type: Grant
    Filed: February 9, 2017
    Date of Patent: December 11, 2018
    Assignee: Savannah River Nuclear Solutions, LLC
    Inventors: Patrick E. O'Rourke, Robert J. Lascola, David Immel, Edward A. Kyser, III, Jean R. Plummer
  • Patent number: 9804094
    Abstract: To improve the detection sensitivity, detection accuracy, and reproducibility when electrostatic discharge is generated in a sample solution and analysis is performed using light emission in the generated plasma. A flow channel 100, which has cylindrical main portions each expanding conically from a narrow portion, is filled with a conductive sample solution, and an electric field is applied to the flow channel 100 to generate plasma in the generated air bubbles, so that the resulting light emission is measured.
    Type: Grant
    Filed: November 20, 2012
    Date of Patent: October 31, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshinobu Kohara, Yuzuru Takamura
  • Patent number: 9778176
    Abstract: The method includes guiding a light beam to a first optical path, the light beam being attenuated to an attenuated light beam and detecting a first value indicative of a first intensity of the attenuated light beam. The method further includes generating a last light pulse, dissociating at least part of the gas compound molecules (optionally excited) or dissociated parts thereof (optionally excited) on the first optical path to first part atoms, molecules, ions, or radicals, and to another part using the last light pulse, the light beam being further attenuated by absorption to the first part atoms, molecules, ions, or radicals on the first optical path. The method further includes detecting a second value indicative of a second intensity of the attenuated light beam and determining, using the first and second values, the gas compound content of the gas mixture. A gas compound measuring device measures uses the method.
    Type: Grant
    Filed: June 8, 2012
    Date of Patent: October 3, 2017
    Assignee: VALMET TECHNOLOGIES OY
    Inventors: Tapio Sorvajärvi, Juha Toivonen, Juha Roppo, Jaani Silvennoinen, Sonja Enestam
  • Patent number: 9152758
    Abstract: A process of determining whether a patient with a disease or disorder will be responsive to a drug, used to treat the disease or disorder, including obtaining a test spectrum produced by a mass spectrometer from a serum produced from the patient. The test spectrum may be processed to determine a relation to a group of class labeled spectra produced from respective serum from other patients having the or similar clinical stage same disease or disorder and known to have responded or not responded to the drug. Based on the relation of the test spectrum to the group of class labeled spectra, a determination may be made as to whether the patient will be responsive to the drug.
    Type: Grant
    Filed: November 11, 2011
    Date of Patent: October 6, 2015
    Assignee: Biodesix, Inc.
    Inventors: Heinrich Röder, Maxim Tsypin, Julia Grigorieva
  • Publication number: 20150062577
    Abstract: A method for deriving a background-corrected portion of a measured optical emission spectrum comprising the steps of identifying two or more background correction points from the portion of the measured emission spectrum; deriving a background correction function fitted to the identified background correction points, and applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum, wherein the background correction points are identified from the measured data points by consideration of the gradients between the measured data points.
    Type: Application
    Filed: August 27, 2014
    Publication date: March 5, 2015
    Inventors: Stephen HARTWELL, Nigel Cooper BAILEY
  • Patent number: 8817253
    Abstract: Method for hyper-spectral imaging and analysis of a sample of matter, for identifying and characterizing an object of interest therein. Preparing test solution or suspension of the sample, including adding thereto a spectral marker specific to object of interest, such that if object of interest is in test solution or suspension, object of interest becomes a hyper-spectrally active target which is hyper-spectrally detectable and identifiable; adding to test solution or suspension a background reducing chemical, for reducing background interfering effects caused by presence of objects of non-interest in test solution or suspension, thereby increasing hyper-spectral detectability of hyper-spectrally active target in test solution or suspension; generating and collecting hyper-spectral image data and information of test solution or suspension; and, processing and analyzing thereof.
    Type: Grant
    Filed: April 16, 2012
    Date of Patent: August 26, 2014
    Assignee: Green Vision Systems Ltd.
    Inventors: Danny S. Moshe, Vladimir Weinstein
  • Patent number: 8699022
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: April 15, 2014
    Assignee: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Patent number: 8658967
    Abstract: A method for sustaining a plasma includes providing a volume of a gas; generating illumination of a first selected wavelength; and forming a first plasma species in a first region of the gas and a second plasma species in a second region of the gas by focusing the illumination of the first wavelength into the volume of gas, the first region having a first average temperature and a first size, the second region having a second average temperature and a second size, the illumination of the first selected wavelength transmitted by the second plasma species, the illumination of the first selected wavelength absorbed by the first plasma species by tuning the first selected wavelength of the illumination to an absorption line of the first plasma species, the absorption line being associated with an ionic absorption transition or an excited neutral transition of the first plasma species.
    Type: Grant
    Filed: June 21, 2012
    Date of Patent: February 25, 2014
    Assignee: KLA-Tencor Corporation
    Inventors: Ilya Bezel, Anatoly Shchemelinin, Matthew Derstine
  • Patent number: 8582717
    Abstract: In the present invention, a fluorescent X-ray analysis is made for a sample such as a liquid fuel including an object component such as sulfur. A background related to scattered X-rays and a system peak is subtracted from a fluorescent X-ray intensity of the object component, which is obtained from a spectrum acquired by the fluorescent X-ray analysis. A correction corresponding to the composition of the sample is performed for the fluorescent X-ray intensity obtained by subtracting the background. A calibration curve representing the relation between a value, which is obtained after performing the correction for the fluorescent X-ray intensity obtained by subtracting the background, and a concentration of the object component is preset. The concentration of the object component in the sample is calculated on the basis of the calibration curve.
    Type: Grant
    Filed: November 5, 2010
    Date of Patent: November 12, 2013
    Assignee: Horiba, Ltd.
    Inventor: Sumito Ohzawa
  • Patent number: 8487979
    Abstract: The invention is a detection system that provides for background removal from a field of view (FOV) of spectra. A panoramic field of regard may be partitioned into a large number of FOV's. An FOV may include spectra including that of a target substance. Such detection may require removing the spectra other than that of the target. This may amount to removal of the background with an estimated background developed from spectra of one or more FOV's which may be similar to the background of the FOV with the target. An estimation of the background may be a sum of a number of FOV spectra where each spectrum is assigned a weight, the total amount of the weights being one.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: July 16, 2013
    Assignee: Honeywell International Inc.
    Inventors: Darryl Busch, Kwong Wing Au
  • Patent number: 8482730
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: August 24, 2012
    Date of Patent: July 9, 2013
    Assignee: Applied Biosystems, LLC
    Inventors: Austin Tomaney, Mark Oldham
  • Publication number: 20120327410
    Abstract: The innovation uses the response of media to electromagnetic (EM) signals in order to identify them. When EM sources are directed at a target medium, a response is obtained from an EM detector observing the event. By comparing a measured response to a library of known profiles, one or more likely candidates for the target medium can be determined.
    Type: Application
    Filed: June 23, 2011
    Publication date: December 27, 2012
    Applicant: CVG MANAGEMENT CORPORATION
    Inventor: Robert A. Maston
  • Patent number: 8274650
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: May 6, 2010
    Date of Patent: September 25, 2012
    Assignee: Applied Biosystems, LLC
    Inventors: Austin B. Tomaney, Mark F. Oldham
  • Patent number: 8269965
    Abstract: A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function or the number of photon counts.
    Type: Grant
    Filed: May 5, 2010
    Date of Patent: September 18, 2012
    Assignee: Olympus Corporation
    Inventor: Peet Kask
  • Patent number: 8184286
    Abstract: An atomic absorption spectrophotometer that memorizes the maximum amount of light of each light source when an transmissivity of each of a plurality of dimmers is largest; computes an appropriate transmissivity of each dimmer for equalizing the amounts of light of the plurality of light sources from the maximum amount of light of each of the light sources; and sets the dimmer's transmissivity to be the appropriate transmissivity.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: May 22, 2012
    Assignee: Shimadzu Corporation
    Inventors: Katsumi Harada, Kazuo Sugihara
  • Patent number: 8159661
    Abstract: Method for hyper-spectral imaging and analysis of a sample of matter, for identifying and characterizing an object of interest therein. Preparing test solution or suspension of the sample, including adding thereto a spectral marker specific to object of interest, such that if object of interest is in test solution or suspension, object of interest becomes a hyper-spectrally active target which is hyper spectrally detectable and identifiable; adding to test solution or suspension a background reducing chemical, for reducing background interfering effects caused by presence of objects of non-interest in test solution or suspension, thereby increasing hyper spectral detectability of hyper spectrally active target in test solution or suspension; generating and collecting hyper-spectral image data and information of test solution or suspension; and, processing and analyzing thereof.
    Type: Grant
    Filed: February 14, 2008
    Date of Patent: April 17, 2012
    Assignee: Green Vision Systems Ltd.
    Inventors: Danny S. Moshe, Vladimir Weinstein
  • Publication number: 20120086940
    Abstract: Methods of determining asymmetric properties of structures are described. A method includes measuring, for a grating structure, a first signal and a second, different, signal obtained by optical scatterometry. A difference between the first signal and the second signal is then determined. An asymmetric structural parameter of the grating structure is determined based on a calculation using the first signal, the second signal, and the difference.
    Type: Application
    Filed: October 8, 2010
    Publication date: April 12, 2012
    Inventors: Meng-Fu Shih, In-Kyo Kim, Xiafang Zhang, Leonid Poslavsky
  • Patent number: 8107072
    Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22.
    Type: Grant
    Filed: October 6, 2009
    Date of Patent: January 31, 2012
    Assignee: Shimadzu Corporation
    Inventor: Kazuo Yamauchi
  • Patent number: 8082103
    Abstract: Hourly CO2 concentration, amount of solar radiation, and plant distribution information are calculated through observation from predetermined satellites. A concentration of CO2 absorbed by plant-chlorophyll per each time unit is calculated. By adding up the CO2 concentration on the earth and the concentration of CO2 absorbed by the plant-chlorophyll, a CO2 concentration obtained provided that no plant-chlorophyll exist is calculated for a certain period. Thereafter, a mean concentration of CO2 that is absorbed according to changes in the distribution of plant-chlorophyll is calculated on the basis of a monthly mean solar radiation amount and plant-chlorophyll distribution information. By subtracting the CO2 concentration, which is a mean, from the total CO2 concentration, a CO2 concentration, which is a normal, is calculated.
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: December 20, 2011
    Assignee: Fujitsu Limited
    Inventor: Shuichi Tanahashi
  • Patent number: 7899650
    Abstract: In one aspect, a signal processing system includes a processor, an I/O device operatively associated with the processor, and a memory device bearing instructions configured to cause the processor to obtain a representation of signal data over a data domain and position a sliding-window over a portion of the signal data, such portion corresponding to a sliding-window domain, to analyze the signal data within the sliding-window domain to detect the presence of a signature multiplet and, based on the analysis of the data, to estimate the pedestal of the signal data within the sliding-window domain.
    Type: Grant
    Filed: June 4, 2008
    Date of Patent: March 1, 2011
    Assignee: University Of Maryland, Baltimore County
    Inventors: Abhijit Yeshwantpur, Joel M. Morris
  • Publication number: 20110032516
    Abstract: Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method.
    Type: Application
    Filed: June 11, 2010
    Publication date: February 10, 2011
    Inventors: Xin Zhou, Xiang Liu, Alfred Feitisch
  • Patent number: 7859663
    Abstract: In a polychrometer and a method for correcting stray light of the polychrometer, relative spectral (inter-pixel) distribution of stray light independent of a spectral distribution of an incident light is obtained, intensity coefficient of the stray light is calculated according to spectral (inter-pixel) distribution of the incident light, spectral (inter-pixel) distribution of the stray light included in a spectral (inter-pixel) distribution of an incident light is estimated and corrected. Thus, the stray light can be more accurately corrected as compared with a conventional case where stray light distribution is directly estimated from an incident light.
    Type: Grant
    Filed: August 26, 2008
    Date of Patent: December 28, 2010
    Assignee: Konica Minolta Sensing Inc.
    Inventor: Kenji Imura
  • Publication number: 20100290031
    Abstract: The invention relates to a method and a device for determining a predefined spectral range, particularly the spectral range around the red edge. In said method, the analysis of the spectral range is carried out by means of two overlapping spectral value functions. The invention also relates to a method and a system for characterizing existent vegetation.
    Type: Application
    Filed: April 13, 2007
    Publication date: November 18, 2010
    Inventor: Wilhelm Luedeker
  • Patent number: 7826052
    Abstract: A method to correct measurement error in a resonance energy-transfer assay, including exciting anti-Stokes photoluminescent donors with at least one wavelength of light which is greater than an emission wavelength of acceptor molecules; measuring emission at the acceptor's emission wavelength and which differs from the donor's emission wavelength in at least two different time windows; a first time window within the time window defined by the excitation light pulse and a second non-overlapping time window which follows the first time window; and correcting the emission signal, which includes signals originating from non-radiative and radiative energy transfer, within the first time window by estimating the ratio of the signals from non-radiative and radiative energy transfer or the signal originating from radiative energy transfer using at least one emission signal measured in the second time window.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: November 2, 2010
    Assignee: Hidex Oy
    Inventors: Ville Haaslahti, Juhani Aalto, Timo Oikari, Tero Soukka
  • Publication number: 20100265501
    Abstract: Method and apparatus for performing spectroscopy, include the combining of first and second light beams to form a reference beam, focusing the first and second light beams and the reference beam onto a sample, receiving a reflected light beam from the sample at a monochromator, and viewing a predetermined wavelength band of the reflected light beam from the monochromator. Portions of the first and second light beams, which may be visible and IR forms of electromagnetic energy, are heterodyned through a crystal. A monochromator receives a reflection of the reference beam from the sample, and Fourier transformation is performed on the output of the monochromator. The first and second beams of electromagnetic energy can be split to form first and second component beams and the reference beam, all of which are propagated to the sample.
    Type: Application
    Filed: June 18, 2008
    Publication date: October 21, 2010
    Inventors: Alexander V. Benderskii, Igor V. Stiopkin, Himali Dilrukshi Jayathilake
  • Patent number: 7760354
    Abstract: A spectroscopic detector includes a tunable light source, such as a continuously tunable, optical parametric oscillator laser; means for measuring the emitted radiation at a plurality of emission wavelengths to obtain a plurality of spectral measurement data; and a processor for processing the spectral measurement data, where the processor includes a multispectral data processing algorithm or is configured for 1) combining the plurality of spectral measurement data into a composite spectrum, and 2) applying the algorithm to the composite spectrum. The spectra such as resonant and near-resonant Raman Spectra that are acquired are more complete and contain more information. A powerful multispectral analysis code such as IHPS, CHOMPS, or ENN analyzes the acquired data points, examining details of the spectra that could not be handled by traditional methods.
    Type: Grant
    Filed: October 9, 2008
    Date of Patent: July 20, 2010
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Jacob Grun, Sergei Nikitin, Charles K Manka
  • Patent number: 7715004
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: July 28, 2008
    Date of Patent: May 11, 2010
    Assignee: Applied Biosystems, LLC
    Inventors: Austin B. Tomaney, Mark F. Oldham
  • Patent number: 7679059
    Abstract: Low concentrations of water vapor within a background of one or more olefin gases may be detected and quantified using a differential absorption spectrometer. A dehydrated sample of the gas is used as a background sample whose absorption spectrum allows elimination of absorption features not due to water vapor in the gas. Absorption spectra may recorded using tunable diode lasers as the light source. These lasers may have a wavelength bandwidth that is narrower than the water vapor absorption feature used for the differential absorption spectral analysis.
    Type: Grant
    Filed: March 7, 2007
    Date of Patent: March 16, 2010
    Assignee: SpectraSensors, Inc.
    Inventor: Xin Zhou
  • Patent number: 7623233
    Abstract: Multivariate optical analysis systems employ multivariate optical elements and utilize multivariate optical computing methods to determine information about a product carried by light reflected from or transmitted through the product.
    Type: Grant
    Filed: March 2, 2007
    Date of Patent: November 24, 2009
    Assignee: Ometric Corporation
    Inventors: Robert P. Freese, Ryan J. Priore, John C. Blackburn, Jonathan H. James, David L. Perkins
  • Publication number: 20090177432
    Abstract: The invention is an optical method and apparatus for measuring the temperature of semiconductor substrates in real-time, during thin film growth and wafer processing. Utilizing the nearly linear dependence of the interband optical absorption edge on temperature, the present method and apparatus result in highly accurate measurement of the absorption edge in diffuse reflectance and transmission geometry, in real time, with sufficient accuracy and sensitivity to enable closed loop temperature control of wafers during film growth and processing. The apparatus operates across a wide range of temperatures covering all of the required range for common semiconductor substrates.
    Type: Application
    Filed: April 17, 2008
    Publication date: July 9, 2009
    Inventors: Charles A. Taylor, II, Darryl Barlett, Douglas Perry, Roy Clarke, Jason Williams
  • Patent number: 7557915
    Abstract: A system and method to automatically obtain spectra for samples. The method involves a two phase process including a photobleaching phase and a spectral acquisition phase. In the photobleaching phase, a series of spectral data sets of a sample are collected. A relative difference is determined between the background of subsequent spectral data sets is determined and compared to a predetermined threshold value. If threshold difference is less than the relative difference between the background of subsequent spectral data sets, the steps of collecting a series of spectra data sets is automatically repeated. In the spectrum acquisition phase, a series of Raman data sets of the sample are collected until a target SNR is obtained.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: July 7, 2009
    Assignee: ChemImage Corporation
    Inventors: John Maier, Patrick Treado, Matthew Nelson, Lindy McClelland, Shona Stewart
  • Patent number: 7554659
    Abstract: A system and method for obtaining hyperspectral visible absorption images. The system includes a light source which illuminates a sample containing light absorbing material, a platform, an optical lens, a detector. The platform has a section for placement of the sample and a section devoid of sample. The transmitted photons produced by the sample and collected by the optical lens are separated into a plurality of wavelength bands using a filter or a fiber array spectral translator coupled to a spectrometer. The system includes a programmable code for operating in a sample mode or background mode and calculating an absorption image. In the background mode, the platform motion is controlled so the optical lens collects transmitted photons from the, portion of the platform devoid of sample to generate a background transmission image. In the sample mode, the platform motion is controlled so the optical lens collects transmitted photons from the sample to generate a sample transmission image.
    Type: Grant
    Filed: September 26, 2006
    Date of Patent: June 30, 2009
    Assignee: ChemImage Corporation
    Inventors: David Tuschel, Arjun Bangalore, Oksana Klueva
  • Patent number: 7533000
    Abstract: A method of analyzing a dataset of spectra is provided in which each spectrum has a count value for each of a number of parameter values within a parameter range. The method is for identifying one or more parameter values that exhibit a significant variation within the dataset. A dataset of spectra is obtained and a statistical analysis is applied to the count values for each of the parameter values. The result of the analysis for each parameter value is a function of the variation in the count values. A spectrum that is representative of at least part of the dataset of spectra is then displayed together with the results of the statistical analysis. A corresponding computer program and system for performing the method are also disclosed.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: May 12, 2009
    Assignee: Oxford Instruments Analytical Limited
    Inventors: Peter John Statham, Charles Penman
  • Patent number: 7471390
    Abstract: A spectrometer collects background spectra during the idle time in which it is not collecting spectra from a sample. These spectra are collected over a range of exposure times, allowing the background reading on each pixel to be modeled as a function of exposure time. When sample spectra are then collected, the exposure time for the sample spectra can be used with the modeled function to compute an estimated background within the sample spectra. The estimated background can then be subtracted from the sample spectra, thereby reducing the noise therein.
    Type: Grant
    Filed: March 2, 2007
    Date of Patent: December 30, 2008
    Assignee: Thermo Electron Scientific Instruments, LLC
    Inventors: Francis J. Deck, Richard C. Wieboldt, David L. Dalrymple
  • Patent number: 7436510
    Abstract: A spectroscopic detector for identifying the presence of a first substance in the presence of another substance includes a laser for illuminating the substances at a plurality of wavelengths to induce the emission of radiation characteristic of the substance; a spectrometer for measuring the emitted radiation to obtain a plurality of spectral measurement data; and a processor for processing the data. An algorithm combines the data into a composite spectrum and a parameter characteristic of the first substance is identified while information in the composite spectrum contributed by emission of radiation from the other substance is removed to identify the presence of the first substance and obtain a characteristic spectral signature of the first substance. The signature is compared to signatures in a spectral library database, wherein at least some of the library signatures have spectral characteristics differentiated from each other by identifiable spectral characteristics caused by environmental factors.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: October 14, 2008
    Assignees: The United States of America as represented by the Secretary of the Navy
    Inventors: Jacob Grun, Charles K Manka, Jeffrey H Bowles, Michael R Corson, Jay F Sperry
  • Patent number: 7408729
    Abstract: The present invention relates generally to the storage and/or retrieval of information on magnetic storage media by using one or more novel approaches alone or in combination. These novel approaches are capable of using at least one code which may comprise more than two values (i.e., more than a “0” and a “1”). A series of approaches applies generally to existing electric and/or magnetic storage/retrieval systems (e.g., magnetic, magneto-optic, etc.) as well as other novel electrical/magnetic systems. Each series of approaches is capable of storing information in one or more codes, wherein such approaches permit, if desired, the use of at least one higher order code which is different from the traditional binary code of “0's” and “1's” currently utilized for the storage of digital information.
    Type: Grant
    Filed: November 20, 2003
    Date of Patent: August 5, 2008
    Assignee: GR Intellectual Reserve, LLC
    Inventors: Juliana H. J. Brooks, Mark G. Mortenson
  • Patent number: 7405823
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: July 29, 2008
    Assignee: Applera Corporation
    Inventors: Austin B. Tomaney, Mark F. Oldham
  • Publication number: 20080062418
    Abstract: A guided mode resonance (GMR) sensor assembly and system are provided. The GMR sensor includes a waveguide structure configured for operation at or near one or more leaky modes, a receiver for input light from a source of light onto the waveguide structure to cause one or more leaky TE and TM resonant modes and a detector for changes in one or more of the phase, waveshape and/or magnitude of each of a TE resonance and a TM resonance to permit distinguishing between first and second physical states of said waveguide structure or its immediate environment.
    Type: Application
    Filed: January 22, 2007
    Publication date: March 13, 2008
    Inventors: Robert Magnusson, Debra D. Wawro
  • Patent number: 7265824
    Abstract: The invention relates to a method and a device for obtaining a low-noise optical signal. According to the method, a luminous beam is injected through two apertures and after detection respectively a basic optical signal (21) and a corrective optical signal (22) are generated. Both optical signals obtained (21, 22) are subtracted, so that a resulting optical signal is generated, forming the low-noise optical signal. The apertures are preferably two slits of a spectroscope, the optical signals being expressible relative to the wavelength.
    Type: Grant
    Filed: January 13, 2004
    Date of Patent: September 4, 2007
    Assignee: Jobin Yvon S.A.S.
    Inventor: Alain Le Marchand
  • Patent number: 7239383
    Abstract: The embodiments disclosed herein generally relate to identifying and removing background noise in spectroscopic imaging of a sample. Because white-light has essentially constant intensity at every wavelength, background noise caused by white light can be identified and removed from spectroscopic measurements including Raman spectroscopy. Thus, once the Raman spectrum for a sample is obtained, it may be corrected to remove the white-light dispersive spectrum in accordance with the embodiments disclosed herein.
    Type: Grant
    Filed: June 30, 2004
    Date of Patent: July 3, 2007
    Assignee: Chemimage Corporation
    Inventors: John S. Maier, Jason N. Neiss, Shona Stewart, Matthew P. Nelson, Joseph Demuth, Patrick J. Treado
  • Patent number: 7233393
    Abstract: A system and method for characterizing contributions to signal noise associated with charge-coupled devices adapted for use in biological analysis. Dark current contribution, readout offset contribution, photo response non-uniformity, and spurious charge contribution can be determined by the methods of the present teachings and used for signal correction by systems of the present teachings.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: June 19, 2007
    Assignee: Applera Corporation
    Inventors: Austin B. Tomaney, Mark F. Oldham
  • Patent number: 7170596
    Abstract: An atomic absorption spectrophotometer including a self reverse type hollow cathode lamp and a photomultiplier tube further includes a preliminary tester for measuring a strength of a signal L when a smaller current is supplied to the hollow cathode lamp and a strength of a signal H when a larger current is supplied while a voltage V applied between a cathode and an anode of the photomultiplier is changed. It also includes an optimal voltage detector for detecting a value V0 of the voltage V at which a super ratio U (which is defined as a ratio of a first ratio L0/H0 to a second ratio L1/H1) is closest to unity under a condition that two values V1 and V0 of the voltage V are arbitrarily chosen so that a ratio H1/H0 or a ratio L1/L0 is a predetermined value.
    Type: Grant
    Filed: May 4, 2004
    Date of Patent: January 30, 2007
    Assignee: Shimadzu Corporation
    Inventors: Masumi Sakai, Kazuo Nagasawa