With Background Radiation Comparison Patents (Class 356/307)
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Patent number: 6881760Abstract: A method for monitoring the solids content in a Fischer-Tropsch product to allow subsequent changes in the Fischer-Tropsch process to prevent downstream problems. The method comprises irradiating the Fischer-Tropsch product with light and measuring the light transmitted through the Fischer-Tropsch product to determine the solids content in the Fisher-Tropsch product.Type: GrantFiled: July 16, 2004Date of Patent: April 19, 2005Assignee: Chevron U.S.A. Inc.Inventors: Ben Smith, Richard Aviani, Dennis J. O'Rear
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Patent number: 6879395Abstract: In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.Type: GrantFiled: June 19, 2001Date of Patent: April 12, 2005Assignee: Otsuka Electronics Co., Ltd.Inventors: Kouichi Oka, Makoto Okawauchi
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Patent number: 6844199Abstract: A system for the detection of bacteria based on bacteria-antibody complexes. Bacteria attached to antibody are detected with resonance Raman spectroscopy. The bacteria are detected directly in a great numerical excess, e.g. 100 to 10,000 of antibody molecules. A sample to be tested is placed in a medium, the medium containing antibodies attached to a surface for binding to a specific bacteria to form an antigen to antibody complex. The medium is contacted with a beam of light energy. The bacteria, as a lower resonance enhanced Raman backscattered energy, is analyzed for the presence or absence of the bacteria.Type: GrantFiled: March 14, 1997Date of Patent: January 18, 2005Assignee: The Board of Governors for Higher Education, State of Rhode Island and Providence PlantationsInventors: Wilfred H. Nelson, Jay F. Sperry
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Patent number: 6801309Abstract: The subject invention relates to a method of mitigating the effects of spurious background signals in spectroscopic measurement systems. The design of a broadband imagining spectrometer is disclosed that enables direct measurement of the spurious optical background intensity during spectroscopic measurements of a sample. The background is measured on a two dimensional surface coincident with the spectrometer exit plane. The background contribution is used to correct the measurements improving the accuracy of the spectroscopic intensity measurement.Type: GrantFiled: October 8, 2002Date of Patent: October 5, 2004Assignee: Therma-Wave, Inc.Inventor: Steve Nelson
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Patent number: 6717669Abstract: Auto-calibrating spectrometers and methods that measure transmission or reflection versus wavelength of a sample without need for calibration for long periods of time. Reflection and transmission spectrometers along with auto-calibrating methods for use therewith are disclosed. Light is focused onto a sample using a lens or similar optical element that transmits light towards the sample reflects light impinging upon it, and transmits light reflected from the sample. If one monitors the light reflected from the first lens and sample, very useful information is available related to the system response versus time. The present invention monitors the reflected light from the first lens and sample, and corrects for the system changes over time using this reflected light.Type: GrantFiled: March 6, 2002Date of Patent: April 6, 2004Assignee: SCI Instruments, Inc.Inventor: Javier Ruiz
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Patent number: 6683685Abstract: In an atomic absorption photometer, depending on a fact whether a background correction is carried out or not, a pattern of a pulse lighting of light sources and a timing of sampling a light receiving signal are changed. Namely, at the time of a background correction measurement, one cycle is divided into three periods, that is, a period of lighting HCL, a period of lighting D2L, and an off period, and at the time of a measurement without a background correction, one cycle is divided into the period of lighting HCL and the off period. Accordingly, at the time of the measurement without the background correction, the period of lighting HCL and the off period become longer, and signal-to-noise ratio of the light receiving signal is improved. Accordingly, an absorbance with high accuracy can be calculated.Type: GrantFiled: December 4, 2001Date of Patent: January 27, 2004Assignee: Shimadzu CorporationInventor: Masumi Sakai
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Patent number: 6680473Abstract: An atomic beam control apparatus controls a position of an atomic beam that passes through a multi-pole magnetic field by irradiating the atomic beam with a light beam. The apparatus includes a probe light generator to generate probe light to detect a position of the atomic beam, a light sensor to receive the probe light, and a current control section to control a current flowing in multi-pole magnetic field generating electrodes controlling the position of the atomic beam. The light beam irradiates the atomic beam so that the atomic beam interacts with both the light beam and the magnetic field, and the position of the atomic beam is controlled by controlling currents fed to the multiple-pole magnetic field generating electrodes based on output values of the light sensor receiving the probe light.Type: GrantFiled: December 14, 2001Date of Patent: January 20, 2004Assignee: Communications Research LaboratoryInventors: Ryuzo Ohmukai, Masayoshi Watanabe
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Patent number: 6674527Abstract: A method in which a multiplicative ratio approach is used to remove the effects of the unwanted background fluorescence when making fluoroescence polarization (FP) measurements rather than the conventional subtractive approach, thus preserving both the precision and accuracy of the FP measurements, is disclosed. The method comprises selecting an appropriate multiplicative ratio, then calculating the selected multiplicative ratio using sample measurements. The calculated multiplicative ratio is multiplied by an appropriate value in a standard FP measurement equation or an appropriate value in an equation derived from a standard FP measurement equation. After this, the corrected FP measurement is calculated. When such multiplicative ratios are applied to the appropriate value or values in an FP measurement equation, the effects of background noise can be reduced without decreasing the precision of the FP measurements.Type: GrantFiled: February 27, 2002Date of Patent: January 6, 2004Assignee: Cambridge Research & Instrumentation Inc.Inventor: Clifford C. Hoyt
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Patent number: 6643011Abstract: An SNR calculation method having the steps of measuring the wavelength characteristic of a dynamic range in an optical spectrum measurement apparatus for each wavelength in a multiplexed wavelength range and storing the wavelength characteristic in a storage unit, measuring the signal level and the noise level of a measured optical signal wavelength, reading the noise level of the wavelength of the measured optical signal produced by each of other optical signal wavelengths multiplexed on the measured optical signal wavelength from the storage unit, subtracting the noise level read from the storage unit from the noise level of the measured optical signal wavelength to provide the corrected noise level, and calculating the SNR of the measured optical signal from the measured optical signal level and the corrected noise level.Type: GrantFiled: February 21, 2002Date of Patent: November 4, 2003Assignee: Ando Electric Co., Ltd.Inventor: Manabu Kojima
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Publication number: 20030169420Abstract: Auto-calibrating spectrometers and methods that measure transmission or reflection versus wavelength of a sample without need for calibration for long periods of time. Reflection and transmission spectrometers along with auto-calibrating methods for use therewith are disclosed. Light is focused onto a sample using a lens or similar optical element that transmits light towards the sample reflects light impinging upon it, and transmits light reflected from the sample. If one monitors the light reflected from the first lens and sample, very useful information is available related to the system response versus time. The present invention monitors the reflected light from the first lens and sample, and corrects for the system changes over time using this reflected light.Type: ApplicationFiled: March 6, 2002Publication date: September 11, 2003Inventor: Javier Ruiz
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Patent number: 6608670Abstract: The LVARS is a fully instrumental, non-destructive spectroscopic device for the analysis and verification and authentication of the optical and electromagnetic properties (OEMP) of the inks, dyes, thin films, plastics, toners, paper, fixatives, paints, and printing agents used in documents and financial instruments. The instrument is quantitative in nature so as to correlate compositional data (elemental, isotopic, structure) with Raman optical spectra. The LVARS design consists of a computer-controlled spectrometer with a microscope-guided grid head containing the laser excitation source and detector and optics.Type: GrantFiled: July 18, 2001Date of Patent: August 19, 2003Assignee: Wizard of Ink & Co.Inventors: Francis A. Nottke, James A. Kirchoff, Jonathan N. Lucke, John Pollard
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Patent number: 6590647Abstract: A method of and apparatus for determining a physical property of a material. The method includes: attaching nanoparticles to a substrate; positioning the substrate near the material; illuminating the nanoparticles with photons having wavelengths that stimulate surface enhanced Raman emissions; detecting photons emitted as a result of the illumination; and determining said physical property of said material using said detected photons. The apparatus includes: a substrate; nanoparticles attached to the substrate; a light source, connected to the substrate, for illuminating the nanoparticles with photons having wavelengths that stimulate surface enhanced Raman emissions; a photodetector, connected to the substrate, for detecting photons emitted as a result of illumination of the nanoparticles; and a processor, connected to the photodetector, for determining a property of material near the nanoparticles from the detected photons.Type: GrantFiled: May 4, 2001Date of Patent: July 8, 2003Assignee: Schlumberger Technology CorporationInventor: Kenneth E. Stephenson
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Patent number: 6519030Abstract: A flame photometer detector is described which uses flame emission spectroscopy as the detection method, computer control and data acquisition, pulsed sampling and a rotating reference filter wheel to eliminate the effects of background chemical species. The detector is particularly suited to the testing of respirator equipment.Type: GrantFiled: September 27, 2000Date of Patent: February 11, 2003Assignee: The Secretary of State for Defence in Her Britannic Majesty's Government of the United Kingdom of Great Britain and Northern IrelandInventors: Paul R Norman, George A Robins, Arthur M Johnston, Grant S Richardson
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Patent number: 6509968Abstract: In embodiments, spectroscopic monitor monitors modulated light signals to detect low levels of contaminants and other compounds in the presence of background interference. The monitor uses a spectrometer that includes a transmissive modulator capable of causing different frequency ranges to move onto and off of the detector. The different ranges can include those with the desired signal and those selected to subtract background contributions from those with the desired signal. Embodiments of the system are particularly useful for monitoring metal concentrations in combustion effluent.Type: GrantFiled: May 17, 2000Date of Patent: January 21, 2003Assignee: Massaschusetts Institute of TechnologyInventors: Paul P. Woskov, Kamal Hadidi
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Publication number: 20030007146Abstract: An analyzer suitable for performing continuous gas analysis in ultra-high purity applications. The analyzer combines a low-level emission source and a gaseous emission spectrometer having a charge coupled device (CCD) diode array as a detector. The CCD detector replaces one or more photomultipliers and narrow bandpass filters typically used in spectrometers. The analyzer performs various processing operations to evaluate and eliminate the effect of background light level, or dark spectrum.Type: ApplicationFiled: July 6, 2001Publication date: January 9, 2003Inventors: Mark Malczewski, Joseph Wegrzyn, Wayne Donald Martin
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Patent number: 6496618Abstract: An optical channel selection device comprises a barrel, an internal optical fiber disposed within the barrel, a first bearing coaxially disposed around the barrel, and a first bearing sleeve coaxially disposed around the first bearing. The barrel is rotatable about a central axis, and comprises a first end surface and a second opposing end surface. The internal optical fiber includes a first fiber end and a second fiber end. The first fiber end is exposed on the first end surface at a radially offset distance from the central axis. The second fiber end is exposed on the second end surface collinearly with the central axis. The first bearing sleeve has a plurality of first bearing sleeve apertures circumferentially spaced from each other. Each first bearing sleeve aperture is disposed in the first bearing sleeve at the radially offset distance, and is selectively optically aligned with the second fiber end through incremental rotation of the barrel.Type: GrantFiled: February 14, 2002Date of Patent: December 17, 2002Assignee: Varian, Inc.Inventors: C. J. Anthony Fernando, James E. Swon
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Patent number: 6480274Abstract: This invention provides a quantitative determination method capable of quickly determining a mean composition of oxide type inclusions and oxygen concentration of a metallic material such as a steel by using an optical emission spectrometer alone. This method comprises the steps of (1) conducting a plurality of times a discharge operation between the metallic material and an opposing electrode in an inert gas atmosphere to obtain an emission spectrochemical spectrum, (2) selecting a discharge in which at least either the oxygen A spectrum or the oxide-forming element spectrum exceed a predetermined intensity for each discharge operation, and (3) subtracting a background from the intensity of the oxygen spectrum and/or the intensity of the oxide-forming elements in the selected discharge, accumulating the balances to obtain a cumulative spectral intensity, and executing quantitative determination by a calibration curve method.Type: GrantFiled: December 28, 1999Date of Patent: November 12, 2002Assignee: Kawasaki Steel CorporationInventors: Akira Yamamoto, Wataru Tanimoto
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Publication number: 20020113962Abstract: An SNR calculation method having the steps of measuring the wavelength characteristic of a dynamic range in an optical spectrum measurement apparatus for each wavelength in a multiplexed wavelength range and storing the wavelength characteristic in a storage unit, measuring the signal level and the noise level of a measured optical signal wavelength, reading the noise level of the wavelength of the measured optical signal produced by each of other optical signal wavelengths multiplexed on the measured optical signal wavelength from the storage unit, subtracting the noise level read from the storage unit from the noise level of the measured optical signal wave length to provide the corrected noise level, and calculating the SNR of the measured optical signal from the measured optical signal level and the corrected noise level.Type: ApplicationFiled: February 21, 2002Publication date: August 22, 2002Inventor: Manabu Kojima
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Publication number: 20020089665Abstract: Output light spectrum P2(&lgr;) data from an optical amplifier and input light spectrum P1(&lgr;) data of signal light are prepared, the difference between the P2(&lgr;) and a value obtained by multiplying the P1(&lgr;) by a provisional gain GT is determined (Steps S232), for the obtained spectrum data, a noise removing process such as a moving average process and the like is performed and then, a spline interpolation process is also performed, whereby ASE light spectrum P3(&lgr;) data is prepared and an ASE light level P ASE is determined (Steps S233 through S235). In addition, a noise figure-measuring device 10 calculates the number of channels of WDM light and signal light wavelengths of the respective channels based on the P1(&lgr;) or P2(&lgr;), and performs analysis to calculate a noise figure NF and the like of an appointed wavelength range around the center of each wavelength thus calculated.Type: ApplicationFiled: November 28, 2001Publication date: July 11, 2002Inventors: Gentaro Ishihara, Tohru Mori
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Publication number: 20020080351Abstract: In an atomic absorption photometer, depending on a fact whether a background correction is carried out or not, a pattern of a pulse lighting of light sources and a timing of sampling a light receiving signal are changed. Namely, at the time of a background correction measurement, one cycle is divided into three periods, that is, a period of lighting HCL, a period of lighting D2L, and an off period, and at the time of a measurement without a background correction, one cycle is divided into the period of lighting HCL and the off period. Accordingly, at the time of the measurement without the background correction, the period of lighting HCL and the off period become longer, and signal-to-noise ratio of the light receiving signal is improved. Accordingly, an absorbance with high accuracy can be calculated.Type: ApplicationFiled: December 4, 2001Publication date: June 27, 2002Applicant: SHIMADZU CORPORATIONInventor: Masumi Sakai
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Publication number: 20010052976Abstract: An optical detection system is adapted particularly for detection of biological reactions, especially fluorescent or chemilluminescent reactions. An excitation source, preferably a laser, illuminates a portion of an object to be examined, the portion preferably comprising one microlocation out of an array of microlocations. An intervening optical detection platform serves to direct the excitation radiation, preferably through use of a scanning system, most preferably through use of an x-y mirror-based scanning system to the portion of the object to be illuminated. A detector, preferably a photomultiplier tube, receives the emitted radiation from the objects to be examined, the detector being characterized in that the diameter of the region examined by the detector is the same as or smaller than the diameter of the illuminated region, and comprises less than the entire surface of the object to be examined, and most preferably images a whole or a part of a single microlocation.Type: ApplicationFiled: August 9, 2001Publication date: December 20, 2001Applicant: Nanogen, Inc.Inventors: Robert D. Juncosa, William F. Butler, Lei Wu, Robert H. Cormack
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Patent number: 6322555Abstract: A method and system for laser surgery produces controlled laser pulses and simultaneously verifies that a sequence of pulses of prescribed energy are being delivered to the patient. A photo detector receives a predetermined portion of the energy of each treatment pulse. A separate monitoring computer compares an output signal from the photo detector corresponding to each treatment laser pulse with a reference value for that type of pulse obtained in a calibration sequence. Implementation in an ophthalmic laser surgery system is also disclosed.Type: GrantFiled: July 23, 1999Date of Patent: November 27, 2001Inventor: Leon C. LaHaye
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Patent number: 6275285Abstract: The LVARS is a fully instrumental, non-destructive spectroscopic device for the analysis and verification and authentication of the optical and electromagnetic properties (OEMP) of organic or inorganic media that is either naturally occurring, or manufactured or processed such as the inks, dyes, thin films, plastics, toners, paper, fixatives, paints, and printing agents used in documents and financial instruments. The instrument is quantitative in nature so as to correlate compositional data (elemental, isotopic, structure) with Raman optical spectra. The LVARS design consists of a computer-controlled spectrometer with a microscope-guided grid head containing the laser excitation source and detector and optics. The spectrometer contains signal processing electronics which sends a stream of data to the computer for analysis and correlation with the library database.Type: GrantFiled: November 29, 1999Date of Patent: August 14, 2001Assignee: Wizard of Ink & Co.Inventors: Francis A. Nottke, James A. Kirchoff, Jonathan N. Lucke
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Patent number: 6222626Abstract: The invention relates to an atomic absorption spectrometer, comprising a measuring light path leading from at least one light source emitting line radiation corresponding to at least one element to be detected, through an atomization means for atomizing a sample containing the element to be detected, to a detection means, and a reference light path leading from each light source to the detection means. The invention is characterized in that a beam splitting means is provided such that a first component of the line radiation of each light source is guidable via the measuring light path and a second component of the line radiation of each light source is simultaneously guidable via the reference light path.Type: GrantFiled: August 28, 1998Date of Patent: April 24, 2001Assignee: Bodenseewerk Perkin-Elmer GmbHInventors: Bernhard Radziuk, Günter Rödel
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Patent number: 6180415Abstract: A method and apparatus for interrogating a target having a plurality of plasmon resonant particles (PREs) distributed in the target are disclosed. In the method, a field containing the target is illuminated, and one or more spectral emission characteristics of the light-scattering particles in the field are detected. From this data, an image of positions and spectral characteristic values in the field is constructed, allowing PREs with a selected spectral signature to be discriminated from other light-scattering entities, to provide information about the field. Also disclosed are a novel PRE composition for use in practicing the method, and a variety of diagnostic applications of the method.Type: GrantFiled: February 20, 1998Date of Patent: January 30, 2001Assignee: The Regents of the University of CaliforniaInventors: Sheldon Schultz, David A. Schultz, David R. Smith, Jack J. Mock, Thomas J. Silva
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Patent number: 6122039Abstract: A object displacement measuring system and utilizing optical triangulation techniques is constructed to determine the displacement of an object between a near and far sensing limits. In constructing the system to determine the object displacement relative to these sensing points, the mathematical calculations needed to determine the controlling transfer function are simplified. In alternate embodiments, the object displacement is measured relative to a measurement window having a fixed width and a known mid-point. With the use of the transfer function resulting from the use of either coordinate systems, an output signal generated by a digital-to-analog converter can be controlled digitally to set the gain and offset values of the output signal rather than adjusting these values using analog circuitry.Type: GrantFiled: October 28, 1998Date of Patent: September 19, 2000Assignee: Banner Engineering Corp.Inventor: Neal A. Schumacher
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Patent number: 6118529Abstract: Background profiles for spectrometers are obtained by recording a number of background measurements over a period of time and analysing the measured data to create a statistical model of the instrument. The result is a set of stored background profiles with low noise level which are available when a sample measurement is made. The operator does not have to allow time to collect a background measurement as is the case in conventional techniques.Type: GrantFiled: August 26, 1999Date of Patent: September 12, 2000Assignee: PerkinElmer International C.V.Inventor: Richard Anthony Spragg
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Patent number: 6104476Abstract: A distance measuring apparatus having skimming function which suppresses electric consumption when a charge storing period is shortened by an electronic shutter function. For this purpose, at an initial setting, an integration period is set to T.sub.1 by ICG pulse and ST pulse, and ON and OFF periods of light emitting diode IRED are set to the same periods. In the ON period, photoelectric conversion is performed on reflected light from a measurement object, and the obtained charge is stored. In the OFF period, a predetermined amount of charge is eliminated by an ICG pulse a, then after the period T.sub.1, the stored charge is transferred to a storage unit on the next stage by an ST pulse b. If an output voltage after several storing operations is higher than a skim judgment voltage, the integration period T.sub.1 is reduced in half, and the ON period of the IRED is shortened.Type: GrantFiled: May 3, 1999Date of Patent: August 15, 2000Assignee: Canon Kabushiki KaishaInventor: Satoshi Suzuki
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Patent number: 6067148Abstract: An execution height setting system 100 includes laser device 102 for setting a horizontal reference plane by rotatably radiating a laser beam and a execution height display device 104. The execution height display device 104 has a light receiving section 112 for receiving the laser beam, an indexing section 118 for indicating a shift of the sensed laser beam relative to the reference position, and a data display section 108 for displaying the inputted grade or execution height. As the execution height display device 104 receives the laser beam, it senses the distance between the laser device 102 and the execution height display device 104 and then computes the desired execution height based on the set grade value. The computation result for the execution height is displayed on the execution height display portion 108c.Type: GrantFiled: September 3, 1998Date of Patent: May 23, 2000Assignee: Kabushiki Kaisha TopconInventors: Jun-ichi Kodaira, Takaaki Yamazaki
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Patent number: 6008888Abstract: The LVARS is a fully instrumental, non-destructive spectroscopic device for the analysis and verification and authentication of the optical and electromagnetic properties (OEMP) of the inks, dyes, thin films, plastics, toners, paper, fixatives, paints, and printing agents used in documents and financial instruments. The instrument is quantitative in nature so as to correlate compositional data (elemental, isotopic, structure) with Raman optical spectra. The LVARS design consists of a computer-controlled spectrometer with a microscope-guided grid head containing the laser excitation source and detector and optics. The spectrometer contains signal processing electronics which sends a stream of data to the computer for analysis and correlation with the library database.Type: GrantFiled: March 16, 1999Date of Patent: December 28, 1999Assignee: Wizard of Ink & Co.Inventors: Francis A. Nottke, James A. Kirchoff, Jonathan N. Lucke
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Patent number: 6008895Abstract: In order to provide a measuring device for determining stoichiometric ratios when burning hydrocarbons by means of which stoichiometric ratios can be determined easily and reliably when burning hydrocarbons, it is proposed that a sensor be provided to detect an intensity of a first fluorescent radiation from C--H molecular fragments arising during the burning and a sensor be provided to detect an intensity of a second fluorescent radiation from molecular fragments arising during the burning and comprising only C atoms, that the sensors generate an intensity-dependent first and second sensor signal, respectively, on the basis of the first and the second fluorescent radiation, and that an evaluation circuit be provided which generates an output signal corresponding to a stoichiometric ratio from a ratio between the intensities of the first and the second fluorescent radiation.Type: GrantFiled: April 6, 1998Date of Patent: December 28, 1999Assignee: Deutsches Zentrum Fuer Luft -und Raumfahrt e.V.Inventors: Claus Wahl, Juergen Steinwandel
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Patent number: 6002477Abstract: A spectrophotometer including a light source (1) operative to emit a beam of light (15), an optical system for directing the light beam (15) to a sample (8) to be analyzed, and a detector (9) which detects the intensity of the light beam after the beam interacts with the sample (8). The light source (1) is operative to emit bursts of light separated by an interval during which no light is emitted. By way of example, a xenon tube may be used for that purpose. The spectrophotometer measures the intensity of the light beam generated by each burst of light after that beam interacts with the sample. Each such light beam may be divided into first and second parts (5 and 4) prior to interaction with the sample (8), and the optical system is arranged to direct the first part (5) to the sample (8) and to direct the second part (4) to a second detector (7) for conducting a reference measurement. A dark signal measurement may be conducted immediately before or after each burst of light.Type: GrantFiled: May 15, 1998Date of Patent: December 14, 1999Assignee: Varian, Inc.Inventor: Michael Ron Hammer
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Patent number: 5999249Abstract: A position detecting element that enables a position to be detected at high speed and high precision, and a range sensor using the same. The position detecting element is provided with a PIN photodiode array 1 having n segments and a parallel arithmetic processing portion 2 that calculates the segment having maximum intensity by comparing n outputs from the segments of the PIN photodiode array 1. The range sensor includes a light source by which the object to be measured is irradiated by optical beam, a lens that gathers rays of the reflected light from the surface of the object to be measured and the position detecting element mentioned above that detects the position of the light gathered by the lens.Type: GrantFiled: October 14, 1997Date of Patent: December 7, 1999Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Masami Ito, Kanji Nishii, Kenji Takamoto, Atsushi Fukui, Kazumasa Takata
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Patent number: 5986757Abstract: Introduction of sample stream air into argon inductively coupled plasma permits continuous monitoring of hazardous air pollutant metals in combustion flue gases. In addition to entrained particulates, various molecular components of flue gas are in the plasma. These species, and reaction products thereof, such as CN species, also undergo excitation resulting in complex emission spectra of appreciable intensity. Serious spectral interference arises for several metal elements, from molecular emission bands associated with the stable CN radical, and other poly-atomic species, such as NO. Failure to account for these interferences can significantly degrade accuracy of monitoring particularly at low metal concentrations in the flue gas.Type: GrantFiled: September 17, 1997Date of Patent: November 16, 1999Assignee: The United States of America as represented by the Secretary of the NavyInventor: Michael D. Seltzer
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Patent number: 5978082Abstract: The object of this invention is to provide an atomic absorptiometer and a metal specimen atomic vapor generation apparatus used in the atomic absorptiometer, which enable a light absorption measurement based on the Zeeman effect highly capable of background correction and eliminate the need for the troublesome work of dismounting a magnet. For this purpose, the following configuration is employed. First, the specimen, hydrochloric acid, and sodium borohydride are delivered and mixed by the peristaltic pump 10 to produce a metallic hydride. The generated gas-liquid mixture solution is separated by the separator 12 into a specimen gas and liquids. The separated specimen gas is introduced into the heating section 30. Electricity is supplied from the power source 28 to the specimen heating section 30 where the specimen gas introduced is heated and separated into hydrogen and a specimen metal vapor to be measured.Type: GrantFiled: January 27, 1998Date of Patent: November 2, 1999Assignee: Hitachi, Ltd.Inventors: Yasushi Terui, Kazuo Moriya, Hiromi Yamashita, Hayato Tobe
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Patent number: 5963309Abstract: A distance measuring system of the active type wherein a distance ranging from a short distance to a great distance can be measured with a high degree of accuracy in accordance with a ratio between outputs of two light receiving elements. The system comprises light emitting means which emits light twice to an object, three or more light receiving elements, and selecting means which selects output signals of different pairs of the light receiving elements when the light emitting means emits light for the first and second times for measurement of distances within short and long distance ranges, respectively. The selected output signals in each pair are compared with each other to take a ratio between them, and distances are calculated based on the ratios thus obtained. Finally, a distance to the object is determined based on the calculated two distances.Type: GrantFiled: October 18, 1993Date of Patent: October 5, 1999Assignee: Minolta Co., Ltd.Inventors: Motohiro Nakanishi, Hiroshi Ootsuka
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Patent number: 5910838Abstract: In a method of determining concentrations by means of atomic absorption spectrometry, the absorption of structured background is determined in a graphite furnace.Type: GrantFiled: April 21, 1997Date of Patent: June 8, 1999Assignee: Bodenseewerk Perkin-Elmer GmbHInventor: Renate Weisse
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Patent number: 5877491Abstract: Method and apparatus for imaging an object illuminated with light onto a photodetector array including a microcomputer for controlling the light gathering of the photodetector array by varying the amount of light reflected onto the photodetector array and by varying a photodetector array variable in response to the output of the photodetector array. In one embodiment, the amount of light reflected onto the photodetector array is varied by modifying either the time the light is reflected onto the array or the power of the light reflected onto the array.Type: GrantFiled: June 5, 1995Date of Patent: March 2, 1999Assignee: Sensor Adaptive Machines, Inc.Inventors: Timothy R. Pryor, Bernard Hockley, Nick Liptay-Wagner, Omer L. Hageniers, Walter J. Pastorius
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Patent number: 5876672Abstract: Light, pulsed or continuous at a wavelength (e.g. 780 nm), fluoresceces a specimen. The specimens may be combinations of a dye (preferably labelled), an antigen (e.g. rubella) and an antibody reactive with the antigen, with properties of polarizing the light when fluoresced. The light polarized in a first direction (e.g. z-axis) parallel to the incident light and in a second direction (e.g. x-axis) perpendicular to the incident light are measured. A second specimen is then provided with the antigen and the antibody but without the dye. The same light as discussed above fluoresces the second specimen and polarizes the light when fluoresced. The light polarized in the first (z-axis) and second (x-axis) directions in the second specimen is measured. These measurements are processed in a microprocessor with the measurements in the z and x directions in the first specimen to identify the antigen or, when the antigen is known, to identify the concentration of the antigen in the first specimen.Type: GrantFiled: May 31, 1996Date of Patent: March 2, 1999Assignee: Diatron Diagnostics CorporationInventors: Walter Beach Dandliker, June K. Dandliker, Jacques Claude Levin
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Patent number: 5862418Abstract: A distance measurement apparatus comprises a light emitting device for emitting light to an object, a light receiving device including a plurality of photocells for receiving light emitted by the light emitting device and reflected by the object, an adding circuit for adding outputs of an arbitrary number of photocells from among the plurality of photocells, and a control circuit for controlling the light emitting device, the light receiving device and the adding circuit. The control circuit comprises a determining circuit for determining a first group of photocells having a maximum addition result based on the addition performed by the adding circuit, and a calculating circuit for setting a second group of photocells comprised of the first group of photocells and a single or a series of photocells contiguous to the first group of photocells, dividing the second group of photocells into element subgroups, and calculating a distance to an object based on outputs of respective divided element groups.Type: GrantFiled: September 19, 1997Date of Patent: January 19, 1999Assignee: Seiko Precision Inc.Inventor: Akira Ito
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Patent number: 5808726Abstract: This invention has as its object to provide a distance measurement apparatus which can relatively easily control the clock generation timing and can prevent dark currents generated by accumulation units from being unbalanced between the ON and OFF states of a light-projection operation even when the accumulation apparatus for temporarily holding charges are arranged between a sensor array and a charge transfer apparatus.Type: GrantFiled: February 26, 1996Date of Patent: September 15, 1998Assignee: Canon Kabushiki KaishaInventors: Akira Egawa, Ryoichi Suzuki
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Patent number: 5801826Abstract: Complex atomic or molecular spectral signatures embedded in interfering background spectra are very rapidly recognized by a spectrometric device that employs precise sweep rate control with signal slope extraction. Very fast optics become feasible. High signal to noise ratios are attained in each of three operational modes. The first, PURGE, is frequently invoked and stores an ambient background pattern in differentiated form. The second, TARGET, stores a signature derived from a target substance placed within the invention's sensing range. The signature retains only signal derivatives that significantly depart from those encountered during PURGE. A SEEK mode employs a similar derivative extraction algorithm, and searches for matches to TARGET signatures stored in a memory bank. During SEEK, pattern correlations to stored targets are sensed, and results displayed.Type: GrantFiled: February 18, 1997Date of Patent: September 1, 1998Assignee: Williams Family Trust BInventor: Richard Ernest Williams
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Patent number: 5760895Abstract: A system for measuring and monitoring water vapor concentration in a sample uses as a light source an argon discharge lamp, which inherently emits light with a spectral line that is close to a water vapor absorption line. In a preferred embodiment, the argon line is split by a magnetic field parallel to the direction of light propagation from the lamp into sets of components of downshifted and upshifted frequencies of approximately 1575 Gauss. The downshifted components are centered on a water vapor absorption line and are thus readily absorbed by water vapor in the sample; the upshifted components are moved away from that absorption line and are minimally absorbed. A polarization modulator alternately selects the upshifted components or downshifted components and passes the selected components to the sample. After transmission through the sample, the transmitted intensity of a component of the argon line varies as a result of absorption by the water vapor.Type: GrantFiled: August 20, 1996Date of Patent: June 2, 1998Assignee: Aerodyne Research, Inc.Inventor: Paul Kebabian
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Patent number: 5751406Abstract: A range finding apparatus includes; M photoprojectors (M: greater than one) provided in one-to-one correspondence with M range-finding axes radially extending within a virtual plane for forwardly projecting detection light along the range-finding axes; a photodetector spaced apart from the virtual plane and having N light detecting portions (N: greater than one), which serves as common photoelectric conversion means for the M photoprojectors; a range-finding axis switching device for selectively allowing the M photoprojectors to emit light; and a distance determination device for determining a distance to an object on the basis of detection values output from the N light detecting portions.Type: GrantFiled: November 20, 1995Date of Patent: May 12, 1998Assignee: Fujitsu LimitedInventors: Fumihiko Nakazawa, Hitoshi Okumura, Satoshi Sano, Fumitaka Abe
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Patent number: 5719663Abstract: An active type range finder apparatus comprises a light projecting element having a base, a lead frame disposed on the base, at least one light emitting member disposed on the lead frame for emitting light to a subject, and at least one control terminal disposed on the base for controlling the light emitting member. A light receiving element is disposed at a base length from the light projecting element for receiving light reflected by the subject. The lead frame and the control terminal of the light projecting element have end portions arranged outside an extension region of the light emitting member in a direction of the base length. When the light emitting member is illuminated, scattered light is prevented from being projected within the extension region of the light emitting member in the direction of the base length, thereby preventing distance measurement errors.Type: GrantFiled: March 30, 1995Date of Patent: February 17, 1998Assignee: Seiko Precision Inc.Inventors: Toshiaki Hirai, Atsushi Takami
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Patent number: 5684292Abstract: A method and apparatus for optically determining the dimension of part surfaces. Particular embodiments describe optical triangulation based coordinate measurement machines capable of accurate measurement of complex surfaces, such as gear teeth and turbine blades. Other embodiments provide highly useful sensors for robot guidance and related purposes. Up to 5 axis sensing capability is provided on surfaces of widely varying form.Type: GrantFiled: June 5, 1995Date of Patent: November 4, 1997Assignee: Sensor Adaptive Machines, Inc.Inventors: Timothy R. Pryor, Bernard Hockley, Nick Liptay-Wagner, Omer L. Hageniers, W. J. Pastorius
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Patent number: 5677541Abstract: This invention discloses method and apparatus for optically determining the dimension of part surfaces. Particular embodiments describe optical triangulation based coordinate measurement machines capable of accurate measurement of complex surfaces, such as gear teeth and turbine blades. Other embodiments provide highly useful sensors for robot guidance and related purposes. Up to 5 axis sensing capability is provided on surfaces of widely varying form.Type: GrantFiled: June 5, 1995Date of Patent: October 14, 1997Assignee: Sensor Adaptive Machines, Inc.Inventors: Timothy R. Pryor, Bernard Hockley, Nick Liptay-Wagner, Omer L. Hageniers, W. J. Pastorius
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Patent number: 5677760Abstract: A rangefinding device for use in a camera comprising a projection section for projecting a light beam emitted by a light source through a projection lens to an object, a light pickup section disposed diagonally opposite from the projection section that picks up, on its light pickup element, light reflected off the object, two-dimensionally senses the light, and outputs incident light position information, a CPU for computing the range to the object based on the output of the light pickup section and an attitude sensor section for sensing the orientation or attitude of the camera. In response to the output of the attitude sensor section, the CPU computes the range to the object based on the incident light position information in either the vertical direction or horizontal direction of the photographing frame, output by the light pickup section.Type: GrantFiled: August 10, 1995Date of Patent: October 14, 1997Assignee: Olympus Optical Co., Ltd.Inventors: Kazuo Mikami, Takashi Inoue
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Patent number: 5670787Abstract: A method and apparatus for optically determining the dimension of part surfaces. Particular embodiments describe optical triangulation based coordinate measurement machines capable of accurate measurement of complex surfaces, such as gear teeth and turbine blades. Other embodiments provide highly useful sensors for robot guidance and related purposes. Up to 5 axis sensing capability is provided on surfaces of widely varying form.Type: GrantFiled: June 5, 1995Date of Patent: September 23, 1997Assignee: Sensor Adaptive Machines, Inc.Inventors: Timothy R. Pryor, Bernard Hockley, Nick Liptay-Wagner, Omer L. Hageniers, W. J. Pastorius
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Patent number: H1844Abstract: A magneto-optical rotation (MOR) spectrometer is disclosed having a laser as a light source and providing a high intensity input light source that yields improvements in the detection limits and in the dynamic operating ranges of the MOR spectrometer.Type: GrantFiled: May 6, 1998Date of Patent: March 7, 2000Assignee: The United States of America as represented by the Secretary of the NavyInventors: Richard Billmers, William J. Scharpf, Alan Laux, Kevin Owens