Having Diffraction Grating Means Patents (Class 356/328)
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Publication number: 20100265382Abstract: An optical microscanner achieves wide rotation angles utilizing a curved reflector. The optical microscanner includes a moveable mirror for receiving an incident beam and reflecting the incident beam to produce a reflected beam and a Micro Electro-Mechanical System (MEMS) actuator that causes a linear displacement of the moveable minor. The curved reflector produces an angular rotation of the reflected beam based on the linear displacement of the moveable mirror.Type: ApplicationFiled: April 16, 2010Publication date: October 21, 2010Applicant: SI-WARE SYSTEMSInventors: DIAA A. KHALIL, HISHAM HADDARA
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Patent number: 7817274Abstract: Spectrometers, particularly compact spectrometers, are constructed with their spectral performance characteristics being optimized as well as with their instrument/device volume being reduced significantly. The light propagation path, either in transparent media or in free space, of the optical beams emitting from a small input aperture/slit of a spectrometer, is caused to be two-dimensional or unilateralized (propagating within a thin layer of air or media), enabling physical sizes of any optical elements needed thereafter to construct a spectrometer to be reduced significantly in one dimension. As a result, a significant reduction of instrument/device volume (in one dimension or even in two dimensions) is achieved, which is applicable to and beneficial to either a classical dispersion spectrometer or a compact dispersion spectrometer.Type: GrantFiled: May 5, 2008Date of Patent: October 19, 2010Inventor: Jingyun Zhang
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Patent number: 7817273Abstract: Systems, including methods, apparatus, and algorithms, for spectrally imaging a two-dimensional array of samples are disclosed. In one such system, a method of sample analysis includes directing light from a two-dimensional array of examination sites onto a detection area such that dispersed light of known spectral composition from each site falls on the detection area. The method further includes assigning a corresponding two-dimensional array of regions of the detection area for detecting spectra from the examination sites based, at least in part, on the known spectral composition. The method also includes placing samples into the two dimensional array of examination sites and obtaining spectral data for each sample based on the detection area.Type: GrantFiled: June 30, 2006Date of Patent: October 19, 2010Assignee: Life Technologies CorporationInventors: Dar Bahatt, Chirag Patel, Derek K. Prothro, Roy H. Tan
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Patent number: 7812949Abstract: A spectrometer which in one embodiment including a dispersive element and a concave element. The dispersive element may be a flat or concave grating which receives light and reflects the light in different collimated wavelengths. The concave element being located downstream from the dispersive element and arranged to reflect and focus the light toward a detector. The reflected light from the concave element including astigmatism. A cylindrical lens positioned between the concave element and the detector and configured to simultaneously correct the astigmatism and demagnify the light across the detector. In one embodiment the cylindrical lens varies in thickness progressively along its length.Type: GrantFiled: October 17, 2007Date of Patent: October 12, 2010Assignee: Horiba Jobin Yvon Inc.Inventors: Remy Delmas, Francois Baratange
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Patent number: 7813891Abstract: This application generally relates to methods and systems for detecting spectrophotometer misalignment. In particular, the application may characterize the noise of a spectral measurement relative to a reference substrate known to exhibit a generally linear (flat) spectral output over a known spectrum. From the spectral measurement, a linear regression may be performed on a portion of the spectral output to determine a best fit line and a correlation of determination (“R-squared value”) may be determined correlated the measured data to the best fit line. Finally, the R squared value may be compared to a predetermined threshold R squared value to determine if the sensor is misaligned beyond an acceptable amount. If so, an alert may be generated.Type: GrantFiled: September 30, 2008Date of Patent: October 12, 2010Assignee: Xerox CorporationInventors: Paul S. Bonino, Timothy J. Sulenski
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Patent number: 7808635Abstract: A wide swath imaging spectrometer utilizing an array of individual spectrometer modules in the telescope focal plane to provide an extended field of view. The spectrometer modules with their individual detectors are arranged so that their slits overlap with motion on the scene providing contiguous spatial coverage. The number of modules can be varied to take full advantage of the field of view available from the telescope.Type: GrantFiled: August 27, 2008Date of Patent: October 5, 2010Assignee: Lawrence Livermore National Security, LLCInventor: Michael P. Chrisp
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Patent number: 7804593Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40).Type: GrantFiled: June 2, 2005Date of Patent: September 28, 2010Assignee: Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.Inventors: Helmut Becker-Roβ, Stefan Florek, Günter Wesemann, Michael Okruss
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Patent number: 7804588Abstract: A measuring device for optical and spectroscopic examination of a sample includes a housing, a first light source, a window, an optical spectrometer with a dispersive element and a number of detector elements and which can record light from the first light source which is indirectly reflected by the sample and reenters the housing through the window, an electronic camera whose incidence opening is directed onto the sample, through the window, and an electronic evaluation device which is connected to an image sensor of the camera and to the detector elements. The camera may be assigned a second light source.Type: GrantFiled: January 10, 2008Date of Patent: September 28, 2010Assignee: Deere & CompanyInventors: Georg Kormann, Rico Priesnitz, Nico Correns, Michael Rode
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Publication number: 20100238440Abstract: A hyperspectral imaging system has fore-optics including primary, secondary and tertiary fore-optics mirrors, and an imaging spectrometer including primary, secondary and tertiary spectrometer mirrors. Light from a distant object is collected by the primary fore-optics mirror, and the tertiary fore-optics mirror forms an intermediate object image at an entrance side of a spectrometer slit. The spectrometer mirrors are configured so that light from an exit side of the slit is diffracted by a grating on the secondary mirror, and an image representing spectral and spatial components of the object is formed by the tertiary spectrometer mirror on a focal plane array. The surface of each mirror of the fore-optics and the spectrometer has an associated axis of symmetry. The mirrors are aligned so that their associated axes coincide to define a common system axis, thus making the imaging system easier to assemble and align in relation to prior systems.Type: ApplicationFiled: March 17, 2009Publication date: September 23, 2010Inventors: Mark Oskotsky, Michael J. Russo, JR.
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Patent number: 7796252Abstract: A novel scanning monochromator uses a PM stepper-motor to directly drive a diffraction grating. By employing interpolated encoder feedback in combination with the PM stepper-motor feedback, a resolution of over 250,000 pulsed steps is available for each revolution of the PM stepper-motor. This translates into more than 20,000 incremental angular-displacement steps over a usable 30° range of dispersion-element rotation. High field accuracy is achieved by a direct PM stepper-driven diffraction grating, and a unique calibration approach based on Wood's anomalies. A plurality of diffracted light beams emerge from the oscillating grating, and these are scanned past a detector for detection, whereby the relative rotation information of the grating can be detected with great accuracy. A number of tolerance-correcting measures are also included to yield an extremely accurate, self-lubricating scanning monochromator that can be economically produced.Type: GrantFiled: December 19, 2008Date of Patent: September 14, 2010Assignee: Unity Scientific, LLCInventors: Robert Randall Wilt, George E. Toth
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Patent number: 7791722Abstract: A spectrophotometer is provided capable of reducing the influence of the vibration as much as possible when a wavelength dispersion element is rotationally driven and capable of increasing the analysis accuracy. When a fluorescence signal is obtained from the fluorescence detector, the central control unit A/D converts the fluorescence signal at sampling intervals of T1 for vibration convergence determination, and provides the result data to the data processor (S1). At the timing of performing the vibration convergence determination (S2), the data processor performs a predetermined signal processing to the digital signals obtained (S3), and determines whether all the data that have been obtained within a given period of time from the latest data are equal to or smaller than a specified value (S4). If all the data are equal to or smaller than the specified value, it is determined that the diffraction grating's vibration is converged, and the vibration convergence determination operation is terminated.Type: GrantFiled: September 17, 2008Date of Patent: September 7, 2010Assignee: Shimadzu CorporationInventor: Hiroyuki Minato
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Patent number: 7787111Abstract: A hyperspectral reflectance and fluorescence line-scan imaging system is used for on-line quality and safety inspection of agricultural commodities. The system simultaneously acquires hyperspectral/multispectral combinations of both fluorescence and reflectance images of the agricultural commodities.Type: GrantFiled: April 25, 2008Date of Patent: August 31, 2010Assignee: The United States of America as represented by the Secretary of AgricultureInventors: Moon S. Kim, Yud Ren Chen, Kuanglin Chao, Alan M. Lefcourt
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Patent number: 7787120Abstract: Detection sensitivity is improved by increasing the amount of light of beams that irradiate a sample cell without causing saturation of a detector with ultraviolet beams or visible beams. This spectrophotometer includes a sample cell, which stores a sample to be measured, a visible light source and an ultraviolet light source each for supplying an incident beam that enters the sample, a spectroscope, which disperses a beam that has passed through the sample, an optical detector, which detects beams dispersed from such beam (spectrum), and a dichroic element which reflects or transmits ultraviolet beams from the ultraviolet light source and which transmits or reflects visible beams from the visible light source. Optics are configured such that ultraviolet beams and visible beams that have passed through or have been reflected by the dichroic element enter the sample cell.Type: GrantFiled: June 26, 2008Date of Patent: August 31, 2010Assignee: Hitachi High-Technologies CorporationInventors: Motohiro Yamazaki, Ryoji Inaba, Kosaku Toyosaki, Shintaro Kubo, Takashi Gomi, Katsunobu Hama, Kiyotoshi Mori, Hideyuki Akiyama
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Apparatus for measuring a spectral distribution of a printed product produced with a printing device
Patent number: 7787125Abstract: An apparatus (10) measures a spectral distribution of a printed product (12) produced with a printing device. The apparatus (10) has an illuminating source (20) for illuminating the printed product (12), an optoelectronic measuring means (32) for measurer the reflectance value of a section of the spectrum of the light (26) reflected from the printed product (12), an optical disperser (28) for dispersing the wavelengths of the reflected light (26), and a light entry gap plane that is definitive for the disperser (28). The light entry gap plane that is definitive for the disperser (28) is created by the surface of the printed product (12) to be examined.Type: GrantFiled: April 2, 2007Date of Patent: August 31, 2010Assignee: Theta Systems Elektronik GmbHInventors: Christina Tatarczyk, Joachim Tatarczyk -
Publication number: 20100208262Abstract: A spectroscope includes an emitting portion from where light is output, a dispersive element which is disposed on a side of the light emitting portion, to which the light is output, an incidence portion on which, light dispersed by the dispersive element is incident, and a temperature-compensating element which is disposed between the emitting portion and the incidence portion, and which is such that, an angle of incidence of the light dispersed on the incidence portion becomes almost constant with respect to a change in temperature in an operating temperature range. Moreover, the optical apparatus has such spectroscope in which temperature is compensated.Type: ApplicationFiled: December 1, 2009Publication date: August 19, 2010Inventors: Takehiro Yoshida, Takeshi Yamazaki, Koji Matsumoto, Satoshi Watanabe, Shohei Kobayashi
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Patent number: 7777878Abstract: Application of digital light processor (DLP) systems in monochromator, spectrophotometer or the like systems to mediate selection of individual wavelengths, and/or to image elected regions of a sample in an imaging ellipsometer, imaging polarimeter, imaging reflectometer, imaging spectrophotometer, and/or to provide chopped beams.Type: GrantFiled: December 18, 2007Date of Patent: August 17, 2010Assignee: J.A. Woollam Co., Inc.Inventor: Martin M. Liphardt
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Publication number: 20100201981Abstract: A zoned order sorting filter for a spectrometer in a semiconductor metrology system is disclosed with reduced light dispersion at the zone joints. The order sorting filter comprises optically-transparent layers deposited underneath, or on top of thin-film filter stacks of the order sorting filter zones, wherein the thicknesses of the optically-transparent layers are adjusted such that the total optical lengths traversed by light at a zone joint are substantially equal in zones adjacent the zone joint. A method for wavelength to detector array pixel location calibration of spectrometers is also disclosed, capable of accurately representing the highly localized nonlinearities of the calibration curve in the vicinity of zone joints of an order sorting filter.Type: ApplicationFiled: February 12, 2009Publication date: August 12, 2010Applicant: TOKYO ELECTRON LIMITEDInventors: Fred STANKE, Adam Norton, Holger Tuitje
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Patent number: 7773215Abstract: A digital spectrophotometer and a spectrologial method for determining spectrum wavelength of an unknown illuminant, and the digital spectrophotometer has a base, an operating assembly and a photographic assembly. The operating assembly is attached to the base and has an operating pedestal, a rotating frame and a spectrometer. The rotating frame is connected rotatably to the operating pedestal. The spectrometer is connected solidly to the rotating frame. The photographic assembly is connected to the operating assembly. The spectrologial method is calculated the diffraction angle ? i and the wavelength of the unknown illuminant by putting the parameters into the into the first and second functions.Type: GrantFiled: May 10, 2007Date of Patent: August 10, 2010Assignee: Shin-Hsiang HuangInventors: Jwh Lee, Shih-Fang Wu, Zi-Yu Liu, Zhe-Rui Zhang
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Patent number: 7768641Abstract: Computed tomography imaging spectrometers (“CTIS”s) having patterns for imposing spatial structure are provided. The pattern may be imposed either directly on the object scene being imaged or at the field stop aperture. The use of the pattern improves the accuracy of the captured spatial and spectral information.Type: GrantFiled: January 24, 2007Date of Patent: August 3, 2010Assignee: California Institute of TechnologyInventors: Gregory H. Bearman, Daniel W. Wilson, William R. Johnson
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Patent number: 7768642Abstract: An imaging catadioptric spectrometer using a Mangin type lens and pupil lens adjacent to a grating. Electromagnetic radiation received by aperture slits is directed to a reflective portion of a Mangin type lens and redirected to a pupil adjacent a diffraction grating. Diffracted light is transmitted through a refractive portion of the Mangin type lens and through a corrector lens to image the spectral components of electromagnetic radiation onto a detector. The detector may be an enhanced detector utilizing an array of smaller spaced detectors. By balancing the powers of the lens elements, a single optical material may be used. In one embodiment, multiple aperture slits are spaced apart and decentered with respect to the optical axis permitting collection of opposing diffraction orders on two detectors. A wide field of view having a low F number is obtained with an operating wavelength range in the infrared from approximately 7.5 to 13.5 microns.Type: GrantFiled: May 2, 2007Date of Patent: August 3, 2010Assignee: BAE Systems Information and Electronic Systems Integration Inc.Inventors: Mark Oskotsky, Michael J. Russo, Jr., Dipak Banerjee
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Patent number: 7764374Abstract: The present invention relates to a micro total analysis system comprising a spectroscope and a method of manufacturing such a system comprising a spectroscope in a one step process. More over the invention relates to a method of analyzing a sample in the system. The micro total analysis system comprising a spectroscope provided on a substrate and for measuring electromagnetic radiation and at least one microfluidic channel. The spectroscope comprises: a slab waveguide for guiding electromagnetic waves towards a diffraction grating dispersing the electromagnetic waves into their component wavelengths, and output means for receiving the deflected electromagnetic waves. At least a part of the microfluidic channel, the slab waveguide and the grating comprises the same main material, such as a polymer material.Type: GrantFiled: July 14, 2005Date of Patent: July 27, 2010Assignee: Serstech ABInventors: Jörg Hübner, Anders Michael Jørgensen, Thomas Aarøe Anhøj, Dan Anker Zauner
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Patent number: 7755758Abstract: The present invention relates to an apparatus and to a method of optical spectrum analysis of an optical spectrum of a light beam (4), comprising the steps of selecting a certain part of the optical spectrum of the light beam (4) to provide a filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a power amplitude (O(?)) of the filtered light beam (12), detecting the filtered light beam (12) to provide an electrical signal corresponding to a wavelength of the filtered light beam (12), and providing the power amplitude as a function of the wavelength of the filtered light beam (12).Type: GrantFiled: March 30, 2007Date of Patent: July 13, 2010Assignee: Agilent Technologies, Inc.Inventor: Rüdiger Mästle
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Publication number: 20100171953Abstract: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arranType: ApplicationFiled: May 9, 2008Publication date: July 8, 2010Applicant: Gesellschaft zur Forderung der analytischen Wissenschaften e.V.Inventors: Helmut Becker-Ross, Michael Okruss, Stefan Florek
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Publication number: 20100170498Abstract: An air quality instrumentation system for a concentrated solar power generation system using a fluid heat transfer medium includes a pipe, a window and a spectroscope. The pipe extends from the concentrated solar power generation system and contains system air from within the concentrated solar power generation system. The window is positioned within the pipe to permit light to pass through the pipe and the system air. The spectroscope is positioned adjacent the window to assess concentration of a constituent within the system air, the concentration of the constituent providing an indication of an operating condition of the concentrated solar power generation system.Type: ApplicationFiled: January 7, 2009Publication date: July 8, 2010Applicant: Hamilton Sundstrand CorporationInventors: Andrew J. Zillmer, Joseph P. Carroll
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Publication number: 20100141944Abstract: An apparatus for the spectral diagnosis of substances and/or surfaces includes a radiation source which can be variably adjusted over a predetermined spectral range and whose emitted radiation is focused onto a sample to be examined, wherein a first optical sensor unit detects a radiation component, which is influenced by the sample to be examined, as a useful signal and forwards it to an evaluation and control unit, and to an associated method. The radiation source comprises a light-emitting diode with a predetermined emission wavelength which can be varied between a first emission wavelength and a second emission wavelength by a dynamic change in temperature of the light-emitting diode within the predetermined spectral range, wherein a second optical sensor unit detects a component of the emitted radiation as a reference signal and forwards it to the evaluation and control unit for error compensation purposes.Type: ApplicationFiled: January 31, 2008Publication date: June 10, 2010Inventor: Peter Zipfl
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Patent number: 7728973Abstract: An apparatus for the detection of spectral information along a geometrical line with a dispersive element, which is suspended from an axis of rotation, for the spectral dispersion of electromagnetic radiation from a range on the geometrical line into spectral constituents, a line detector for the detection of the spectral constituents of the radiation emanating from the range on the geometrical line and a dispersive-element deflector, the deflector being designed to deflect the dispersive element on the axis of rotation, so that depending on an angle of deflection a radiation from another range of the geometrical line is incident on the line detector.Type: GrantFiled: April 25, 2007Date of Patent: June 1, 2010Assignee: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung E.V.Inventor: Heinrich Grueger
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Patent number: 7728971Abstract: An analysis system, tool, and method for performing downhole fluid analysis, such as within a wellbore. The analysis system, tool, and method provide for a tool including a spectroscope for use in downhole fluid analysis which utilizes an adaptive optical element such as a Micro Mirror Array (MMA) and two distinct light channels and detectors to provide real-time scaling or normalization.Type: GrantFiled: December 23, 2008Date of Patent: June 1, 2010Assignee: Precision Energy Services, Inc.Inventors: Sean M. Christian, Jess V. Ford, Mike Ponstingl, Anthony Johnson, Sven Kruger, Margaret C. Waid, Bryan Kasperski, Enrique Prati
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Patent number: 7719675Abstract: Methods for evaluating an optically variable device (“OVD”) or optically variable media (“OVM”) are disclosed. The methods include the steps of applying light of a single wavelength from a calibrated light source to the OVD or OVM; measuring the light diffracted by the OVD or OVM with an integrating sphere; measuring the total incident light on the OVD or OVM; and calculating a diffraction efficiency for the OVD or OVM at the single wavelength based on the measurement of light diffracted and the measurement of total incident light.Type: GrantFiled: February 26, 2007Date of Patent: May 18, 2010Assignee: Applied Extrusion Technologies, Inc.Inventors: Robert K. Grygier, Kelan Wieloch
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Patent number: 7719680Abstract: A spectroscope designed to utilize an adaptive optical element such as a micro mirror array (MMA) and two distinct light channels and detectors. The devices can provide for real-time and near real-time scaling and normalization of signals.Type: GrantFiled: September 5, 2008Date of Patent: May 18, 2010Assignee: Custom Sensors and TechnologyInventors: Sean M. Christian, Jess V. Ford, Mike Ponstingl, Sven Kruger, Margaret C. Waid, Bryan W. Kasperski, Entique Prati
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Patent number: 7715005Abstract: An optical sensor comprises at least two planar Bragg gratings defined on a single substrate and arranged to receive light from a light source, each grating having a wavelength filtering response that varies with an effective modal index experienced by light propagating in the Bragg grating and a Bragg wavelength different to those of the other gratings, and at least one sample window overlying one or more of the gratings that can receive a sample of fluid that affects the effective modal index and response of the grating, the gratings filtering the light and outputting the filtered light for spectral analysis, from which the refractive index and related properties of the fluid can be determined. One or more of the gratings can be a reference grating used to compensate for temperature and other disturbances to the sensors. Gratings may have individual sample windows for testing separate fluid samples, or may share a common window so that a single fluid can be tested using several gratings.Type: GrantFiled: July 7, 2005Date of Patent: May 11, 2010Assignee: University of SouthamptonInventors: Gregory Daniel Emmerson, Corin Barry Edmund Gawith, Peter George Robin Smith
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Publication number: 20100110428Abstract: A measuring arrangement for spectroscopic examination and throughput acquisition of a crop flow is provided, the arrangement having a spectrometer which comprises a light source, a window, a dispersive element and a detector, the light source is positioned to illuminate the crop flow during operation through the window, and positioned such that light reflected by the crop flow passes through the window and onto the dispersive element, which is positioned to deflect the reflected light onto the detector in different directions as a function of wavelength, a throughput-determining device cooperating with the crop flow, and a recording device for recording the measured values of the spectrometer and of the throughput determining device.Type: ApplicationFiled: October 5, 2009Publication date: May 6, 2010Inventors: Rico Priesnitz, Judith Stauder
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Publication number: 20100110429Abstract: A method for measuring the refractive index of a material with Bragg gratings includes the emission of a collimated radiation beam (9) from a radiation source (4) with a large spectrum and orientation thereof along a direction normal to the material (2) to be examined, the propagation of the collimated radiation beam (9) entering the material (2), then a Bragg diffraction grating (3) that is obliquely placed to the direction of the collimated radiation beam (9), and again the material (2), the subjection to spectral analysis of the collimated radiation beam exiting the material (2), the grating (3) producing a minimum in the spectrum subjected to the spectral analysis in accordance with Bragg's law, and the calculation of the refractive index of the material (2) from the measure of the wavelength corresponding to the minimum in thus spectrum. A relevant apparatus is described.Type: ApplicationFiled: April 17, 2008Publication date: May 6, 2010Applicant: UNIVERSITA' POLITECNICA DELLE MARCHEInventors: Francesco Simoni, Riccardo Castagna, Luigino Criante, Daniele Eugenio Lucchetta, Francesco Vita
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Patent number: 7710568Abstract: The present invention is a portable gas leak detector preferably comprising a portable optical spectroscopy apparatus for measurement of gas concentration.Type: GrantFiled: September 26, 2008Date of Patent: May 4, 2010Assignees: Southwest Sciences Incorporated, Southern Cross CorporationInventors: Mark E. Paige, Joel A. Silver, Frank T. Petroski, Jr., Sean Durkin
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Patent number: 7705983Abstract: A wavelength displacement correcting system and method where a monochromatic beam from an LED is incident through an incident slit of a spectral device and is diffracted on a diffraction grating to form a dispersed light image. Information relating to the dispersed light image is outputted and a wavelength displacement is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width is calculated, using the calculated wavelength displacement amount of the beam, and the calculated wavelength displacement amounts of at least two diffracted beams.Type: GrantFiled: January 28, 2008Date of Patent: April 27, 2010Assignee: Konica Minolta Sensing, Inc.Inventors: Kenji Imura, Takeshi Matsumoto
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Patent number: 7705984Abstract: A spectroscope includes a diffraction grating having a plurality of ruled parallel lines; and a plurality of spectroscopic paths, each of which has a collimator for collimating incident light, emits the collimated light to the diffraction grating, and emits return light, which returns from the diffraction grating, through a slit provided on the path. In the spectroscope, measured light is emitted through the plurality of spectroscopic paths so as to extract light which is included in the measured light and has a predetermined wavelength; and the collimators of the spectroscopic paths are arranged so that irradiation areas of light emitted from the collimators are offset from each other at least in a direction along the ruled parallel lines. The collimators of the spectroscopic paths may be arranged so that incident angles of light emitted from the collimators coincide with each other.Type: GrantFiled: January 15, 2009Date of Patent: April 27, 2010Assignee: Yokogawa Electric CorporationInventors: Manabu Kojima, Tsutomu Kaneko, Toshikazu Yamamoto
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Patent number: 7701574Abstract: A diffractive optical element device for use in spectroscopy, where broadband light is emitted from a light source towards the optical element and from there is transmitted to at least one detector. The optical element has a plurality of diffractive dispersively focusing patterns, preferably partly integrated into each other, whose respective centers are two-dimensionally offset relative to each other in order to produce a plurality of spectra, where at least two are separate, but offset relative to each other and/or partly overlapping. In an alternative embodiment, the optical element consists of either one diffractive optical element that is related to a wavelength and produces a spectrum, or at least two diffractive optical elements which are related to respective wavelengths and which produce at least two mutually partly overlapping spectra to give a composite spectrum. The optical element is capable of producing at least one indication of upper and/or lower wavelength value in the spectrum.Type: GrantFiled: January 17, 2007Date of Patent: April 20, 2010Assignee: Tomra Systems ASAInventors: Ib-Rune Johansen, Odd Løvhaugen
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Publication number: 20100091288Abstract: Apparatus and method for estimating a fluid property include an optic member having a material within the optic member responsive to the fluid property. A detector is operably associated with the optic member that detects a change in the material, the change being indicative of the fluid property.Type: ApplicationFiled: October 15, 2008Publication date: April 15, 2010Inventors: Rocco DiFoggio, D. Duncan Blue, III
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Patent number: 7697137Abstract: A monolithic Offner spectrometer is described herein as are various components like a diffraction grating and a slit all of which are manufactured by using a state-of-the-art diamond machining process. In one embodiment, a monolithic Offner spectrometer is directly manufactured by using a diamond machining process. In another embodiment, a monolithic Offner spectrometer is manufactured by using molds which are made by a diamond machining process. In yet another embodiment, a diffraction grating is directly manufactured by using a diamond machining process. In still yet another embodiment, a diffraction grating is manufactured by using a mold which is made by a diamond machining process. In yet another embodiment, a slit is directly manufactured by using a diamond machining process.Type: GrantFiled: March 28, 2007Date of Patent: April 13, 2010Assignee: Corning IncorporatedInventor: Lovell E Comstock, II
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Patent number: 7692790Abstract: The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monochromator spectrometer arrangements.Type: GrantFiled: May 10, 2006Date of Patent: April 6, 2010Assignee: Carl Zeiss Microimaging GmbHInventors: Felix Kerstan, Nico Correns
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Patent number: 7692784Abstract: The apparatus and methods herein provide light sources and spectral measurement systems that can improve the quality of images and the ability of users to distinguish desired features when making spectroscopy measurements by providing methods and apparatus that can improve the dynamic range of data from spectral measurement systems.Type: GrantFiled: September 27, 2004Date of Patent: April 6, 2010Assignee: Tidal Photonics, Inc.Inventors: Nicholas B. MacKinnon, Ulrich Stange
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Patent number: 7688445Abstract: A spectroscope of the present invention includes a concave diffraction grating which disperses incident light, an incident light introduction unit which introduces incident light into the concave diffraction grating, and an outgoing light receiving unit which receives outgoing light dispersed for different wavelengths by the concave diffraction grating. The spectroscope further includes an incident aperture which limits an incident angle of light emitted by the incident light introduction unit to the concave diffraction grating, and an outgoing aperture which limits an outgoing angle of outgoing light dispersed for different wavelengths by the concave diffraction grating to the light receiving unit. The spectroscope is constructed so that relatively rotational transfer of at least two out of the concave diffraction grating, the incident aperture and the outgoing apertures can be performed along a Rowland circle which the concave diffraction grating forms.Type: GrantFiled: June 8, 2007Date of Patent: March 30, 2010Assignee: Canon Kabushiki KaishaInventors: Yoichiro Handa, Norihiko Utsunomiya
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Patent number: 7684037Abstract: An optical spectroscopy tool is provided. In one embodiment a highly efficient means by which moderate resolution spectroscopy may be performed in the vacuum ultraviolet (VUV) is described. In one embodiment the techniques can be used as a high throughput spectrometer to spatially disperse wavelengths in and around the VUV in such a manner as to generate a substantially flat field focal plane, suitable for use in combination with an array detector. Some embodiments utilize prism based spectrometers. Some embodiments utilize detector elements that may be movable and/or located within the spectrometer. In some embodiments, collimated light may be provided as an input to the spectrometer.Type: GrantFiled: February 27, 2007Date of Patent: March 23, 2010Assignee: MetroSol, Inc.Inventors: Dale A. Harrison, Anthony T. Hayes
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Patent number: 7678566Abstract: In a chromatography quantitative measuring apparatus according to the present invention, a beam applied from a light source to a chromatography test strip is formed into an elliptical shape by an optical means such as a cylindrical lens, a variation in absorbance that accompanies elution of a marker regent is detected while the elliptical beam is applied between a marker reagent hold part and a detection part, and a measurement is automatically started in a prescribed period of time since the detection of variation. According to the chromatography quantitative measuring apparatus so configured, non-uniform coloration is reduced by shaping the beam elliptically with the optical means, whereby the accuracy of quantitative analysis is enhanced, and the apparatus can be operated easily.Type: GrantFiled: September 25, 2001Date of Patent: March 16, 2010Assignee: Panasonic CorporationInventors: Koji Miyoshi, Masahiro Aga, Kaoru Shigematsu
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Patent number: 7675618Abstract: A multiplexing spectrometer measures at least one parameter, such as temperature, pressure or stress. The system multiplexes the outputs of Bragg stack sensors deposited at the distant ends of optical fibers brought in contact or in close proximity to objects. The spectrometer detects the peaks of the optical signals returned from the Bragg stacks and converts them into corresponding values of the parameters of interest. The spectrometer includes an optical system that comprises an entrance slit, a diffraction grating as a light dispersing means. Multiplexing occurs on a two-dimensional solid state matrix photo detector detects and converts the light signals returned from the Bragg stack sensing elements into corresponding electrical signals, and a built-in look-up table to provides the values of the parameters of interest that correspond the spectral characteristics of the returned light signals.Type: GrantFiled: April 16, 2007Date of Patent: March 9, 2010Assignee: ASE Optics, Inc.Inventors: Todd Blalock, Christopher Cotton
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Patent number: 7675617Abstract: Disclosed is an optical array (2) for the spectrally selective identification of light of a light beam, particularly for identifying light of a detecting light beam (3) in a preferably confocal scanning microscope (1). Said optical array comprises a means (18) for the spatial spectral decomposition of the light beam, means for selecting a given continuous spectral range, and a detector (28). The inventive optical array (2) is characterized by at least one blocking element (25, 26, 27) which can be introduced into the light beam in order to stop down a given partial spectral region located within the selected continuous spectral range.Type: GrantFiled: April 22, 2005Date of Patent: March 9, 2010Assignee: Leica Microsystems CMS GmbHInventor: Werner Knebel
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Publication number: 20100053609Abstract: A wide swath imaging spectrometer utilizing an array of individual spectrometer modules in the telescope focal plane to provide an extended field of view. The spectrometer modules with their individual detectors are arranged so that their slits overlap with motion on the scene providing contiguous spatial coverage. The number of modules can be varied to take full advantage of the field of view available from the telescope.Type: ApplicationFiled: August 27, 2008Publication date: March 4, 2010Inventor: Michael P. Chrisp
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Publication number: 20100053611Abstract: A diffraction grating structure having ultra-high density of grooves comprises an echellette substrate having periodically repeating recessed features, and a multi-layer stack of materials disposed on the echellette substrate. The surface of the diffraction grating is planarized, such that layers of the multi-layer stack form a plurality of lines disposed on the planarized surface of the structure in a periodical fashion, wherein lines having a first property alternate with lines having a dissimilar property on the surface of the substrate. For example, in one embodiment, lines comprising high-Z and low-Z materials alternate on the planarized surface providing a structure that is suitable as a diffraction grating for EUV and soft X-rays. In some embodiments, line density of between about 10,000 lines/mm to about 100,000 lines/mm is provided.Type: ApplicationFiled: July 28, 2009Publication date: March 4, 2010Applicant: THE REGENTS OF THE UNIVERSITY OF CALIFORNIAInventors: Howard A. Padmore, Dmytro L. Voronov, Rossana Cambie, Valeriy V. Yashchuk, Eric M. Gullikson
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Publication number: 20100053610Abstract: Apparatus and methods for detecting molecules are disclosed. One such embodiment is an apparatus for detecting molecules. The apparatus includes a substrate having a surface; and an array of features formed over the surface in a grating pattern. Each of the features includes a top surface. The apparatus also includes a plurality of receptors coupled to the top surfaces of the features. Each of the receptors is configured to bind to a target molecule. A sample is provided over the substrate while a light is illuminated onto the apparatus. A light scattered by the apparatus is detected by a spectrometer. The presence and/or concentration of target molecules can be determined, based at least partly on a shift in the spectral peak of the light.Type: ApplicationFiled: August 29, 2008Publication date: March 4, 2010Inventor: Kwangyeol Lee
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Patent number: 7667882Abstract: One embodiment of a system includes a volume hologram for dispersing a general diffuse beam of light provided as input; a detector for receiving and detecting light dispersed by the volume hologram; and a Fourier transforming lens for forming the Fourier transform of the light dispersed from the volume hologram onto the detector. Other systems and methods are also provided.Type: GrantFiled: October 12, 2005Date of Patent: February 23, 2010Assignee: Georgia Tech Research Corp.Inventors: Ali Adibi, Chao Ray Hsieh, Arash Karbaschi, Omid Momtahan
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Publication number: 20100039643Abstract: A spectrometer system includes an optical assembly for collimating light, a micro-ring grating assembly having a plurality of coaxially-aligned ring gratings, an aperture device defining an aperture circumscribing a target focal point, and a photon detector. An electro-optical layer of the grating assembly may be electrically connected to an energy supply to change the refractive index of the electro-optical layer. Alternately, the gratings may be electrically connected to the energy supply and energized, e.g., with alternating voltages, to change the refractive index. A data recorder may record the predetermined spectral characteristic.Type: ApplicationFiled: July 2, 2009Publication date: February 18, 2010Applicant: US of America as represented by the Administratior of the National Aeronautics & Space AdministratioInventors: Yeonjoon Park, Sang H. Choi, Glen C. King, James R. Elliott