Abstract: A spectroscope includes an emitting portion from where light is output, a dispersive element which is disposed on a side of the light emitting portion, to which the light is output, an incidence portion on which, light dispersed by the dispersive element is incident, and a temperature-compensating element which is disposed between the emitting portion and the incidence portion, and which is such that, an angle of incidence of the light dispersed on the incidence portion becomes almost constant with respect to a change in temperature in an operating temperature range. Moreover, the optical apparatus has such spectroscope in which temperature is compensated.

Abstract: An improvement is added to a spectroscope for performing wavelength dispersion of measured light with a wavelength dispersion element and receiving the light at a light reception element. The spectroscope has a first compound lens made up of a plurality of lenses for converting measured light into parallel light and emitting the parallel light to the wavelength dispersion element; a second compound lens made up of a plurality of lenses for gathering the measured light subjected to the wavelength dispersion in the wavelength dispersion element and causing the light reception element to receive the light; and a base for fixing the wavelength dispersion element, the first compound lens, and the second compound lens. The linear expansion coefficient of the compound focal length of the first compound lens, the linear expansion coefficient of the compound focal length of the second compound lens, and the linear expansion coefficient of a material forming the base are substantially equal.

Abstract: A spectroscopic analysis of a sample includes arranging the sample in a resonator cavity for transmitting cavity mode frequencies with a cavity mode frequency spacing, coupling pulsed source light into the resonator cavity, with the source light including source comb frequencies with a source frequency spacing, coupling pulsed transmitted light out of the resonator cavity, and spectrally resolved detecting the transmitted light with a detector device. The cavity mode frequency spacing and the source frequency spacing are detuned relative to each other, so that the transmitted light includes transmitted comb frequencies with a spacing larger than the source frequency spacing. The detecting feature includes collecting spectral distributions of the transmitted light in dependence on relative positions of the cavity mode frequencies and the source comb frequencies.

Abstract: Provided is a spectroscope that can be manufactured easily, can be reduced in size, and can provide high wavelength resolution of a specific spectral band. Specifically, provided is a spectroscope with a diffraction grating 331 that deflects and separates incident light in different directions depending on to an element of the incident light, at least one optical element 332a, diffusing a light that has passed through this diffraction grating 331 and has entered the optical element 332a, a line sensor 333, which receives the light that has passed through the optical element 332a, thereby only light that has a specific deflection angle within a specific range of wavelengths from among all the light that entered said optical element 332a is selectively expanded and received.

Abstract: Embodiments of the invention provide a device called a “G-Fresnel” device that performs the functions of both a linear grating and a Fresnel lens. We have fabricated the G-Fresnel device by using PDMS based soft lithography. Three-dimensional surface profilometry has been performed to examine the device quality. We have also conducted optical characterizations to confirm its dual focusing and dispersing properties. The G-Fresnel device can be useful for the development of miniature optical spectrometers as well as emerging optofluidic applications. Embodiments of compact spectrometers using diffractive optical elements are also provided. Theoretical simulation shows that a spectral resolution of approximately 1 nm can be potentially achieved with a millimeter-sized G-Fresnel. A proof-of-concept G-Fresnel-based spectrometer with subnanometer spectral resolution is experimentally demonstrated.

Abstract: An optical characteristic measuring apparatus of the invention includes a sequentially-readable charge storage sensor array having a plurality of light receiving elements. Irradiation of first illumination light and second illumination light is controlled in such a manner that a period for irradiating the second illumination light onto a sample containing a fluorescent material is included in an integration period of each of the light receiving elements for receiving a wavelength component of fluoresced light from the sample in measuring an optical characteristic of the sample. The optical characteristic measuring apparatus having the above arrangement enables to accurately measure the optical characteristics of samples containing a fluorescent material in a short time by scanning the samples.

Abstract: An inspection apparatus measures a property of a substrate including a periodic structure. An illumination system provides a beam of radiation with an illumination profile including a plurality of illuminated portions. A radiation projector projects the beam of radiation onto the substrate. A detector detects radiation scattered from the periodic structure and separately detects first order diffracted radiation and at least one higher order of diffracted radiation of each of the illuminated portions. A processor determines the property of the substrate from the detected radiation. The plurality of illuminated portions are arranged such that first order diffracted radiation arising from one or more of the illuminated portions are not overlapped by zeroth order or first order diffracted radiation arising from any other of the illuminated portions.

Abstract: The invention relates to electromagnetic radiation microoptical diffraction gratings and to a method suitable for the manufacture thereof. The diffraction gratings in accordance with the invention can be used as microspectrometers in the form of scanning microgratings. The microgratings are provided with a surface structure and are able to be manufactured cost effectively and in high volumes. The surface structure is formed at a surface of a substrate and is formed from linear structural elements arranged substantially equidistantly and aligned substantially parallel to one another. At least part of the surface of the substrate and of the structural elements is coated with at least one further layer which forms a uniform sinusoidal surface contoured in a wave-shape (sinusoidal) manner and having alternating arranged wave peaks and wave troughs. A reflective layer can additionally be applied to increase the intensity of reflected radiation.

Abstract: In one general aspect, a spectroscopic apparatus is disclosed for investigating heterogeneity of a sample area. The apparatus includes an image acquisition system operative to acquire images of a plurality of sub-areas in the sample area and a sub-area selection interface operative to receive a selection designating one of the sub-areas for which an image has been obtained. A spectrometer has a field of view and is operative to acquire a spectrum of at least part of one of the sub-areas in its field of view, and a positioning mechanism is responsive to the sub-area selection interface and operative to position the field of view of the spectrometer relative to the sample area based on a received selection.

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract: A method of forming an image of a target that comprises illuminating a target with light, maneuvering an optical unit having at least one diffractive element in front of the target through a plurality of positions, capturing, during the maneuvering, a plurality of spectrally encoded frames each from a portion of the light that is scattered from a different of a plurality of overlapping segments along a track traversing an image plane of the target, and combining the plurality of spectrally encoded frames to form a composite multispectral image of at least a portion of said target.

Abstract: An electromagnetic radiation detection device is described which includes a tunable dispersive optical element configured to receive electromagnetic radiation and to change the dispersion of the received electromagnetic radiation; a sensor configured to detect the dispersed electromagnetic radiation changed by the dispersive optical element; and a controller configured to: (i) selectively tune the dispersive optical element so as to adjust the dispersion of the received electromagnetic radiation; and (ii) change one or more of operating parameters of the sensor in accordance with the adjusted dispersion. In some implementations, the radiation detection device may be configured as a spectrometer to measure one or more properties of electromagnetic radiation. A method for detecting electromagnetic radiation is also disclosed.

Abstract: A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.

Abstract: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arran

Abstract: System and method for spatially and spectrally parallelized FAST. A sample is illuminated to thereby produce interacted photons. The photons are passed through a filter and received at a two-dimensional end of a FAST device wherein said FAST device comprises a two-dimensional array of optical fibers drawn into a one-dimensional fiber stack so as to effectively convert a two-dimensional array of optical fibers into a curvilinear field of view, and wherein said two-dimensional array of optical fibers is configured to receive said photons and transfer said photons out of said fiber array spectral translator device and to a spectrograph through said one-dimensional fiber stack wherein said one-dimensional fiber stack comprises at least two columns of fibers spatially offset in parallel at the entrance slit of said spectrograph. The photons are then detected at a detector to thereby obtain a spectroscopic data set representative of the sample.

Abstract: Embodiments of a system and method for collecting hyperspectral and polarimetric data that are spatially and temporally coincident include a dispersive element configured to receive incident electromagnetic radiation. The dispersive element is configured to disperse a non-zero order of the electromagnetic radiation into its constituent spectra, which is directed to a first focal plane array, and may be read out as hyperspectral data. The dispersive element is also configured to reflect a zero order of the electromagnetic radiation, which is directed through a polarity discriminating element to a second focal plane array, which may be read out as polarimetric data. By synchronously reading out the first and second focal plane arrays, the hyperspectral and polarimetric data may be both spatially and temporally coincident.

Abstract: A method of attaching an object to be measured to a structure causing a diffraction phenomenon; irradiating the structure to which the object to be measured is attached and which causes the diffraction phenomenon with an electromagnetic wave; detecting the electromagnetic wave scattered by the structure causing the diffraction phenomenon; and measuring a characteristic of the object to be measured from the frequency characteristic of the detected electromagnetic wave. The object to be measured is attached directly to the surface of the structure causing the diffraction phenomenon. Thus, the method for measuring the characteristic of an object to be measured exhibits an improved measurement sensitivity and high reproducibility. A structure causing a diffraction phenomenon and used for the method, and a measuring device are provided.

Abstract: A spectrometer includes a micro-ring grating device having coaxially-aligned ring gratings for diffracting incident light onto a target focal point, a detection device for detecting light intensity, one or more actuators, and an adjustable aperture device defining a circular aperture. The aperture circumscribes a target focal point, and directs a light to the detection device. The aperture device is selectively adjustable using the actuators to select a portion of a frequency band for transmission to the detection device. A method of detecting intensity of a selected band of incident light includes directing incident light onto coaxially-aligned ring gratings of a micro-ring grating device, and diffracting the selected band onto a target focal point using the ring gratings. The method includes using an actuator to adjust an aperture device and pass a selected portion of the frequency band to a detection device for measuring the intensity of the selected portion.

Abstract: A detection system is used during irradiation of an interaction region of a structure with laser light. The structure includes embedded material. The detection system includes means for receiving light emitted from the interaction region. The detection system further includes means for separating the received light into a spectrum of wavelengths. The detection system further includes means for analyzing at least a portion of the spectrum for indications of embedded material within the interaction region.

Abstract: This invention relates to a wavelength tunable spectrometer and a wavelength tuning method thereof, and more particularly to a wavelength tunable spectrometer and a wavelength tuning method thereof which are capable of providing the highest efficiency of wavelength of applied light without replacement of a diffraction grid or without operation of an observed portion.

Abstract: A catadioptric dual waveband imaging spectrometer that covers the visible through short-wave infrared, and the midwave infrared spectral regions, dispersing the visible through shortwave infrared with a zinc selenide grating and midwave infrared with a sapphire prism. The grating and prism are at the cold stop position, enabling the pupil to be split between them. The spectra for both wavebands are focused onto the relevant sections of a single dual waveband detector. Spatial keystone distortion is controlled to less than one tenth of a pixel over the full wavelength range, facilitating the matching of the spectra in the midwave infrared with the shorter wavelength region.

Abstract: Fiber optic sensors employ a high brightness light source such as a fiber optic supercontinuum source, multiplexed superluminescent light emitting diodes, or a broadband tunable laser diode. Light is delivered to the measurement location via fiber optics and sensor optics directs infrared radiation onto material the being monitored that is located in a hostile environment. A disperse element is positioned in the detection beam path in order to separate the wavelengths and to perform spectral analysis. A spectral analysis of the radiation that emerges from the sheet yields information on a plurality of parameters for the material. For papermaking applications, the moisture level, temperature and cellulose content in the paper can be obtained.

Abstract: A spectrometer includes: an entrance aperture, a collimator, intended to produce, from a light source, a collimated input light (5), a plurality of gratings arranged in a 2-D matrix, a plurality of detectors, and an exit aperture.

Abstract: In the spectroscopy module 1, a light absorbing layer 6 having a light-passing hole 6a through which light L1 advancing into a spectroscopic portion 3 passes and a light-passing hole 6b through which light L2 advancing into a light detecting portion 4a of a light detecting element 4 passes is integrally formed by patterning. Therefore, it is possible to prevent deviation of the relative positional relationship between the light-passing hole 6a and the light-passing hole 6b. Further, since the occurrence of stray light is suppressed by the light absorbing layer 6 and the stray light is absorbed, the light detecting portion 4a of the light detecting element 4 can be suppressed from being made incident. Therefore, according to the spectroscopy module 1, it is possible to improve the reliability.

Abstract: The present invention relates to processing of coded aperture images. Multiple frames of data acquired by the coded aperture imaging system, each with a different coded aperture array, are processed to form an image. The processing incorporates the constraints that the image solution must be positive and that the solution should be zero outside an expected image region. In one embodiment image enhancement may involve dividing the processed image into image regions having a spatially invariant point spread function and solving an inverse problem for each image region to reduce image blurring.

Abstract: A spectrometry apparatus includes a transmissive diffraction grating that transmits incident light. The transmissive diffraction grating has inclined surfaces made of a first dielectric material. The inclined surfaces are arranged so that they are inclined relative to a reference line. When the angle of incidence of light incident on the transmissive diffraction grating is measured with respect to the reference line and defined as an angle ?, and the angle of diffraction of diffracted light is measured with respect to the reference line and defined as an angle ?, the angle of incidence ? is smaller than a Bragg angle ? defined with respect to the inclined surfaces, and the angle of diffraction ? is greater than the Bragg angle ?.

Abstract: Light dispersing device comprising a slit element having a slit for exposure to electromagnetic radiation, wherein the slit element is configured and disposed for turning the slit between at least two positions. The light dispersing device is used together with a streak camera, whereby in a first position the slit is adjusted to influence the temporal resolution of the streak camera and in a second postion the slit is adjusted to influence the spectral resolution of the streak camera.

Abstract: A spectrometer system includes an optical assembly for collimating light, a micro-ring grating assembly having a plurality of coaxially-aligned ring gratings, an aperture device defining an aperture circumscribing a target focal point, and a photon detector. An electro-optical layer of the grating assembly may be electrically connected to an energy supply to change the refractive index of the electro-optical layer. Alternately, the gratings may be electrically connected to the energy supply and energized, e.g., with alternating voltages, to change the refractive index. A data recorder may record the predetermined spectral characteristic.

Abstract: The present invention provides apparatuses including a point light source, a diffraction grating oriented in a light path generated from the point light source wherein the diffraction grating diffracts and concentrates light from the point light source into one or more rings of light, a detector positioned to detect one or more of the rings of light or light transmitted from a sample exposed to said rings of light, and a computer operably connected to the detector to analyze the intensity of one or more of the rings of light or said light transmitted from said sample. Variations including samples and additional components and methods of making the apparatuses of the present invention are also disclosed.

Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized.

Abstract: A swept wavelength interrogation system includes a tunable light source for outputting a light beam that is tunable over a range of wavelengths and an optical reader head for distributing the light beam among a plurality of sensors and for measuring response spectra from the sensors. A wavelength-tracking device measures centroid wavelengths of the light beam. A processor calculates a centroid wavelength of the response spectra from the sensors based on the measured centroid wavelengths of the light beam.

Abstract: The spectroscopy module 1 is provided with a body portion 2 for transmitting light L1, L2, a spectroscopic portion 3 for dispersing light L1 made incident from the front plane 2a of the body portion 2 into the body portion 2 to reflect the light on the front plane 2a, a light detecting element 4 having a light detecting portion 41 for detecting the light L2 dispersed and reflected by the spectroscopic portion 3 and electrically connected to a wiring 9 formed on the front plane 2a of the body portion 2 by face-down bonding, and an underfill material 12 filled in the body portion 2 side of to the light detecting element 4 to transmit the light L1, L2.

Abstract: An optical spectrum analyzer includes a diffraction-grating control unit configured to change an angle of a diffraction grating to change a wavelength of a dispersed light beam extracted from incident light, a calculator unit configured to calculate an angle of the diffraction grating such that the wavelength of the dispersed light beam has a sampling wavelength, and to store the data indicating the angle, a FIFO memory configured such that part of the data is inputted to it, for outputting the data at each reception of a trigger signal indicating timing of sampling, and an FIFO memory control unit configured to output the subsequent data to the FIFO memory, when a remaining data amount of the FIFO memory reaches a predetermined value or lower.

Abstract: A method of operating a spectrometer to determine the wavelength of an optical signal, in particular for determining the resonant wavelength of an optical fibre Bragg grating. The spectrometer comprises an array of photosensitive pixels each of which generates an output signal in response to the intensity of light incident on the pixel, and a refractive element arranged to direct light to a particular position in the array depending on the wavelength of the light. The method involves selecting a first group of pixels in the array by reference to an expected wavelength distribution of the optical signal and monitoring the output signals from the first group of pixels. On the basis of the output signals from the first group of pixels a second group of pixels is selected and the wavelength of the optical signal is determined from the output signals of the second group of pixels.

Abstract: In a state that the body portion 4 is regulated by inner wall planes 27, 29, 28 of the package 3 so as not to move in parallel or perpendicularly with respect to the rear plane 4b, the spectroscopic module is directly supported by the package 3, thereby when the spectrometer is downsized, the spectroscopic module 2 can be supported securely and also there is provided securely a positional accuracy between the light incident opening 22a of the package 3, the spectroscopic portion 6 of the spectroscopic module 2 and the light detecting element 7. Further, the lead 23 is buried into the package 3 to give derivation and support by the lead deriving portion 26, thereby the lead deriving portion 26 in itself of the package 3 is allowed to act as a base when wire bonding is conducted to electrically connect the lead 23 with the light detecting element 7, thus preventing breakage and deviation of the spectroscopic module 2.

Abstract: Since a spectroscopic module (1) has a plate-shaped body section (2), the spectroscopic module can be reduced in size by reducing the thickness of the body section (2). Moreover, since the body section (2) is plate-shaped, the spectroscopic module (1) can be manufactured, for example, by using a wafer process. More specifically, by providing lens sections (3), diffraction layers (4), reflection layers (6) and light detecting elements (7) in a matrix form on a glass wafer which becomes many body sections (2) and dicing the glass wafer, many spectroscopic modules (1) can be manufactured. This enables easy mass production of spectroscopic modules (1).

Abstract: Alignment marks 12a, 12b, 12c, and 12d are formed on the flat plane 11a of the peripheral edge portion 11 formed integrally with the diffracting layer 8, and when the lens portion 7 is mounted onto the substrate 2, these alignment marks 12a, 12b, 12c and 12d are positioned to the substrate 2, thereby making exact alignment of the diffracting layer 8 with respect to the light detecting portion 4a of the light detecting element 4, for example, not by depending on a difference in curvature radius of the lens portion 7. In particular, the alignment marks 12a, 12b, 12c and 12d are formed on the flat plane 11a, thereby image recognition is given to exactly detect positions of the alignment marks 12a, 12b, 12c and 12d, thus making it possible to make exact alignment.

Abstract: An optical apparatus includes a first substrate including an optical functional element, and a second substrate including a movable micromechanical functional element, the first substrate and the second substrate being connected in a stacked manner, so that a light path exists which is convoluted between the first substrate and the second substrate, the movable micromechanical functional element and the optical functional element being arranged in the light path. In addition, a method of producing an optical apparatus includes producing a first substrate including an optical functional element, and producing a second substrate including a movable micromechanical functional element, as well as connecting the first and second substrates, so that a light path exists which is convoluted between the first and second substrates, the movable micromechanical functional element and the optical functional element being arranged in the light path.

Abstract: In the spectrometer 1, a lens portion 3 having a spherical surface 35 on which a spectroscopic portion 4 is provided and a bottom plane 31 in which a light detecting element 5 is disposed, has a side plane 32 substantially perpendicular to the bottom plane 31 and a side plane 34 substantially perpendicular to the bottom plane 31 and the side plane 32. Then, a package 11 that houses a spectroscopy module 10 has side planes 16 and 18 respectively coming into planar-contact with the side planes 32 and 34, and contact portions 22 coming into contact with the spherical surface 35. Therefore, the side planes 32 and 34 of the lens portion 3 are respectively brought into planar-contact with the side planes 16 and 18 of the package 11 while bringing the spherical surface 35 of the lens portion 3 into contact with the contact portions 22 of the package 11, that positions the spectroscopic portion 4 and the light detecting element 5 with respect to a light incident window plate 25 of the package 11.

Abstract: In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is bonded to a front plane 2a of a substrate 2 with an optical resin adhesive 63. Thus, it is possible to reduce a stress generated onto the light detecting element 5 due to a thermal expansion difference between the light detecting element 5 and the substrate 2. Additionally, on the light detecting element 5, a first convex portion 101 is formed so as to be located at least between the light detecting portion 5a and the light passing hole 50 when viewed from a direction substantially perpendicular to the front plane 2a.

Abstract: The spectrometer 1 is provided with a package 2 in which a light guiding portion 7 is provided, a spectroscopic module 3 accommodated inside the package 2, and a support member 29 arranged on an inner wall plane of the package 2 to support the spectroscopic module 3. The spectroscopic module 3 is provided with a body portion 11 for transmitting light made incident from the light guiding portion 7 and a spectroscopic portion 13 for dispersing light passed through the body portion 11 on a predetermined plane of the body portion 11, and the spectroscopic portion 13 is supported by the support member 29 on the predetermined plane in a state of being spaced away from the inner wall plane.

Abstract: An optical measurement apparatus includes a spectroscopic measurement device, a first optical fiber for propagating light to be measured, a hemispherical portion having a light diffuse reflection layer on an inner wall of the hemispherical portion, and a plane portion disposed to close an opening of the hemispherical portion and having a mirror reflection layer located to face the inner wall of the hemispherical portion. The plane portion includes a first window for directing the light emitted thorough the first optical fiber into an integrating space. The integrating space is formed by the hemispherical portion and the plane portion. The optical measurement apparatus further includes a second optical fiber for propagating the light in the integrating space to the spectroscopic measurement device through a second window of the plane portion.

Abstract: In a spectroscopy module 1, a light detecting element 5 having a light passing hole 50 is used. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is electrically connected to a wiring 9 formed on a front plane 2a of a substrate 2 by face-down bonding, and a resin layer 79 is formed as an underfill resin between the substrate 2 and the light detecting element 5. Therefore, it is possible to improve the fixing strength between the substrate 2 and the light detecting element 5. Additionally, before the resin layer 79 is formed, a resin layer 78 is formed along a guide portion 77 that surrounds the passing hole 50. Thus, the resin layer 79 is prevented from penetrating into the light passing hole 50, which makes it possible to make a light be appropriately incident into the substrate 2.

Abstract: Optical device comprising: a spatial filter means for eliminating, from the light rays emanating from an observed scene those coming from a direction or restricted range of directions in space, while letting through most of the light rays coming from said scene; means for varying the direction or the restricted range of directions in space in correspondence with which the spatial filter means eliminates said light rays; a spectral dispersion means for imparting to the light rays coming from said spatial filter means a deviation that is dependent on their wavelength; and an image detector for recording the light rays dispersed by said spectral dispersion means, each point on said image detector receiving light rays coming from said scene and having a different wavelength depending on the direction in space from which they come.

Abstract: A detection device comprising a substrate comprising a plurality of objects of which properties are changed due to the contact with a target substance, means for bringing the target substance into contact with the objects, and means for detecting a change in properties of the objects caused when the target substance is brought into contact with the objects, based on light output when the objects are irradiated with light, wherein the plurality of the objects are located in the direction in which the light for irradiation travels, and the detecting means is means for detecting the change in the properties based on the summation of light output from the plurality of the objects upon irradiation with light.

Abstract: A Dyson imaging spectrometer includes an entry port extending in a direction X, an exit port, a diffraction grating including a set of lines on a concave support, an optical system including a lens, the lens including a plane first face and a convex second face, the convex face of the lens and the concave face of the diffraction grating being concentric, the optical system being adapted to receive an incident light beam coming from the entry port and to direct it toward the diffraction grating, to receive a beam diffracted by the diffraction grating, and to form a spectral image of the diffracted beam in a plane of the exit port, the spectral image being adapted to be spatially resolved in an extension direction X? of the image of the entry port. The diffraction grating includes a set of non-parallel and non-equidistant lines and/or the support of diffraction grating is aspherical in order to form an image of the entry port in the exit plane of improved image quality and of very low distortion.

Abstract: The apparatus and methods herein provide light sources and spectral measurement systems that can improve the quality of images and the ability of users to distinguish desired features when making spectroscopy measurements by providing methods and apparatus that can improve the dynamic range of data from spectral measurement systems.

Abstract: The present invention relates to methods of measuring the optical characteristics of volume holographic gratings with high resolution and with a large spectral coverage using a spectrally broad band source in conjunction with instruments that measure the spectrum such as spectrometers, imaging spectrometers, and spectrum analyzers.

Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized.

Abstract: A modified concentric spectrograph for diffracting light with high stray light rejection without astigmatism is provided. The modified spectrograph includes a grating, a lens, and at least one entrance port and one exit port. The grating has a concave surface and a meridian plane with a first side and a second side. The lens has a substantially planar surface and a convex surface. Preferably, the convex and concave surfaces are substantially concentric. The ports are substantially located on different sides of the meridian plane near a focal plane of the spectrograph. The position of a focal plane may be modified using an optically transmissive triangular prism with a reflective surface, and an optically transmissive block. The position of a focal plane may further be modified with one or more optically transmissive plates. Methods for using the spectrograph are also provided.