Spectroscopy Patents (Class 356/451)
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Patent number: 7595887Abstract: A spectroscopic detection system is described for monitoring ambient air for toxic chemical substances. The system can be a compact, portable multiple gas analyzer capable of detecting and discriminating a broad range of chemical constituents including various nerve and blister agents as well as toxic industrial chemicals at low or sub part per billion (ppb) levels. The system minimizes false alarms (e.g., false positives or negatives), features high specificity, and can operate with response times on the order of a few seconds to a few minutes, depending on the application. The system can be an entirely self-contained analyzer, with a Fourier Transform Infrared (FTIR) spectrometer, a gas sample cell, a detector, an embedded processor, a display, power supplies, an air pump, heating elements, and other components onboard the unit with an air intake to collect a sample and an electronic communications port to interface with external devices.Type: GrantFiled: May 12, 2008Date of Patent: September 29, 2009Assignee: MKS Instruments, Inc.Inventors: Martin L. Spartz, Vidi Saptari
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Patent number: 7595886Abstract: A wavelength monitor includes the following elements. An optical divider divides a beam of measured light into first and second divided beams of measured light. An interfering element converts the first and second divided beams of measured light into first and second parallel beams of measured light to cause interference between the first and second parallel beams of measured light with each other thereby generating an interfered beam of measured light. A light receiving element way including a plurality of light receiving elements receives the interfered beam of measured light. An interference signal converting unit receives output signals from the light receiving element array to generate interference signals different in phase by 90 degrees from each other. A signal processing unit receives the interference signals from the interference signal converting unit to obtain a wavelength of the measured light from the interference signals.Type: GrantFiled: June 23, 2006Date of Patent: September 29, 2009Assignee: Yokogawa Electric CorporationInventors: Takaaki Hirata, Minoru Maeda, Hironori Takai, Hiroki Saitou
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Patent number: 7593112Abstract: A system for comparative interferogram spectrometry includes an interferometer configured to generate interferograms from incident radiation from a target region, an interferogram database containing stored interferograms, and a processing subsystem configured to receive the generated interferograms and compare the received interferograms to the stored interferograms.Type: GrantFiled: October 2, 2006Date of Patent: September 22, 2009Assignee: EOIR Technologies, Inc.Inventors: George G. He, Diane E. Deterline
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Publication number: 20090225322Abstract: Methods and systems are disclosed for selecting a set of interrogation wavelengths from spectral data, the method including the steps of performing a principal coordinate transformation on the spectral data, choosing an objective function which describes the efficiency of the transformation in separating the class of agents from the class of interferents, rank ordering the interrogation wavelengths according to said objective function, and choosing the set of wavelengths with the highest rank. In one preferred embodiment, the objective function is the smallest spectral angle between the class of agents and the class of interferents.Type: ApplicationFiled: May 7, 2008Publication date: September 10, 2009Applicant: SPARTA, INC.Inventors: Philip D. Henshaw, Pierre C. Trepagnier, Matthew B. Campbell
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Patent number: 7586618Abstract: A method of examining a sample comprises exposing the sample to a pump pulse of electromagnetic radiation for a first period of time, exposing the sample to a stimulant pulse of electromagnetic radiation for a second period of time which overlaps in time with at least a portion of the first exposing, to produce a signal pulse of electromagnetic radiation for a third period of time, and interfering the signal pulse with a reference pulse of electromagnetic radiation, to determine which portions of the signal pulse were produced during the exposing of the sample to the stimulant pulse. The first and third periods of time are each greater than the second period of time.Type: GrantFiled: February 28, 2005Date of Patent: September 8, 2009Assignee: The Board of Trustees of the University of IllinoisInventors: Daniel L. Marks, Stephen A. Boppart
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Publication number: 20090219542Abstract: For evaluation of a measured parameter with a measuring cell having a cavity which generates for light an optical path length difference changing corresponding to the variation of the measured parameter, the method includes: introducing light from a white light source with the aid of an optical waveguide via a coupler (3) disposed in the path of the optical waveguide into the cavity, coupling out at least a portion of the light reflected back into the optical waveguide from the cavity with the aid of the coupler and conducting this reflected light to an optical spectrometer, determining the optical spectrum of the reflected light in the spectrometer and generating a spectrometer signal, conducting the spectrometer signal to a computing unit, wherein the spectrometer signal is directly converted through the computing unit to an interferogram and from its intensity progression the location of the particular extremal amplitude value is determined and this particular location represents directly the particular vaType: ApplicationFiled: March 24, 2008Publication date: September 3, 2009Inventors: Peter Waegli, Felix Mullis
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Publication number: 20090219543Abstract: The invention relates to a spectrograph (11) comprising a waveguide (10) provided with accesses (10; 10b, 12), a means for injecting two guided contra-propagative waves by each accesses in such a way that a spatial interference is formed in the waveguide, means (19, 20, 14, 16) for detecting the energy of the evanescent wave of the guided field produced by the interference of said contra-propagative waves.Type: ApplicationFiled: August 4, 2006Publication date: September 3, 2009Inventors: Etienne Le Coarer, Pierre Benech, Pierre Kern, Gilles Lerondel, Sylvain Blaize, Alain Morand
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Publication number: 20090219544Abstract: Exemplary arrangement, apparatus, method and computer accessible can be provided. For example, using the exemplary arrangement, apparatus and method, it is possible to configured to propagate at least one electro-magnetic radiation. Indeed, it is possible to receive, using at least one first arrangement, a first portion of the at least one electro-magnetic radiation directed to a sample and a second portion of the least one electro-magnetic radiation directed to a reference, the first arrangement can be structured to at least partially reflect and at least partially allow to transmit the first and second portions.Type: ApplicationFiled: September 5, 2008Publication date: September 3, 2009Applicant: The General Hospital CorporationInventors: Chulmin Joo, Johannes F. De Boer
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Publication number: 20090215191Abstract: The invention provides an optical sensor for detecting chemical reaction activity, including, e.g., enzyme activity and catalytic or reactive molecule activity. An optical sensor of the invention includes a porous photonic film that produces a predetermined spectral reflectance response. In preferred embodiments, the film has a chemical coating (such as a hydrophobic layer) within its pores with an affinity for the reaction product(s) of the catalytic or otherwise reactive analyte A coating can also act as a protective layer in preferred embodiment. A thin substrate susceptible to reaction by at least one analyte of interest is on the surface of the thin film to block pores of the thin film. A method of detecting chemical reaction activity of the invention exposes the optical sensor to an analyte of interest, such as an enzyme or otherwise catalytic or reactive molecule.Type: ApplicationFiled: January 10, 2007Publication date: August 27, 2009Inventors: Michael J. Sailor, Manuel M. Orosco, Claudia Pacholski, Gordon M. Miskelly
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Publication number: 20090207414Abstract: An apparatus is provided for measuring a frequency-domain optical coherence tomography power spectrum from a sample. The apparatus includes a broadband light source, an optical spectrum analyzer, and a partially reflective element optically coupled to the light source, to the optical spectrum analyzer, and to the sample. A first portion of light from the light source is reflected by the partially reflective element and propagates to the optical spectrum analyzer. A second portion of light from the light source propagating through the partially reflective element, impinging the sample, reflecting from the sample, and propagating to the optical spectrum analyzer.Type: ApplicationFiled: February 17, 2009Publication date: August 20, 2009Applicant: The Board of Trustees of the Leland Stanford Junior UniversityInventors: Aydogan Ozcan, Michel J.F. Digonnet, Gordon S. Kino
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Patent number: 7573577Abstract: Methods for chemically-resolved optical microscopy are presented. The methods can provide a wide-field, spatial interference imaging using multiple nonlinear scattering channels to produce multiple, spatially coherent anti-Stokes Raman scattering (CARS).Type: GrantFiled: October 19, 2006Date of Patent: August 11, 2009Assignee: Southwest Research InstituteInventor: Robert E. Martinez
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Publication number: 20090195776Abstract: A method for collecting and analyzing spectrum data to identify a composition of a sample material is described. The method includes obtaining a sample material, receiving a geographical location of the sample material at a handheld instrument, and analyzing the sample material to obtain sample spectrum data using the handheld instrument. The method also includes determining whether to perform an analysis of the sample spectrum data using the handheld instrument, or to perform the analysis of the sample spectrum data using a remote computer. The method also includes determining a composition of the sample material based on an analysis of the sample spectrum data and recording in a memory area at least one of the composition and the geographical location of the sample material.Type: ApplicationFiled: July 17, 2008Publication date: August 6, 2009Inventors: Roger David Durst, John Hooper Landefeld, Jeremy Lea, Larry Stephen Price
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Patent number: 7564561Abstract: A method of absolute optical frequency measurement is realized by using mode-locked laser frequency combs to measure the optical frequency of an unknown laser. By varying the repetition frequency, the relative frequency location of the unknown laser to the beating comb line is determined according to the corresponding variation of the beat frequency. Also, by varying the offset frequency of the mode-locked laser, the real offset frequency detected by a self-referencing technique can be determined according to the corresponding variation of the beat frequency between the unknown laser and the mode-locked laser frequency combs. The mode number of the frequency comb is uniquely and adequately determined through measuring the beat frequencies between the unknown laser and the mode-locked laser frequency combs at various repetition frequencies and through measuring the corresponding mode number change, and hence the optical frequency of the unknown laser is determined.Type: GrantFiled: February 12, 2007Date of Patent: July 21, 2009Assignee: Industrial Technology Research InstituteInventor: Jin-Long Peng
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Patent number: 7564560Abstract: A spectrophotometer incorporating an interferometer and a dispersive system is adapted to have an enlarged inlet field without degrading its spatial resolution. To this end, spectral data deduced horn measurements performed by means of the interferometer are transferred into spectral data deduced from measurements per formed by means of the dispersive system. Such spectrophotometer makes it possible to scan an observation field quickly, and is compatible with use on board a satellite.Type: GrantFiled: November 29, 2006Date of Patent: July 21, 2009Assignee: Astrium SASInventor: Frédérick Pasternak
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Publication number: 20090180101Abstract: Apparatus and method for estimating a downhole fluid property using a carrier conveyable into a well borehole, one or more light sources carried by the carrier, the one or more light sources comprising at least one quantum cascade laser light source, a fluid sample cell that receives light emitted from the one or more light sources, and at least one photodetector that detects light emitted from the one or more light sources after the light interacts with a fluid in the fluid sample cell.Type: ApplicationFiled: January 16, 2008Publication date: July 16, 2009Inventor: Sebastian Csutak
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Publication number: 20090180122Abstract: Methods and apparatus are provided employing rapid scanning continuous wave terahertz spectroscopy and imaging for the non-destructive evaluation of materials such as animal hides and natural cork, and explosive detection, concealed weapon detection, and drug detection. A system employing an aperiodic detector array and implementing phase modulation at 100 kHz significantly reduces the imaging time and enables interferometric images of a THz point source to be obtained at several frequencies between 0.3 and 0.95 THz.Type: ApplicationFiled: January 14, 2009Publication date: July 16, 2009Applicant: New Jersey Institute of TechnologyInventor: John Francis Federici
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Publication number: 20090174885Abstract: Disclosed is a low-cost high-resolution compact accelerometer which utilizes multiple self-mixing optical interferometers. The device is also a micro-opto-electro-mechanical systems (MOEMS) sensor. The interferometers are used to detect acceleration as well as monitor the wavelength, temperature, and refractive index and perform differential measurements. In addition, photodetectors are employed to monitor the input optical power.Type: ApplicationFiled: January 2, 2009Publication date: July 9, 2009Inventor: Chian Chiu Li
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Publication number: 20090173884Abstract: An object of the present invention is to provide a spectroscopic method and an apparatus which can measure a trace element accurately with high sensitivity. In order to achieve this object, for example, in Fourier transformation infrared spectroscopy (FT-IR), a reference spectrum and a measurement spectrum including an impurity spectrum are measured in order to obtain a differential spectrum comprising the impurity spectrum and a flat baseline, correction including a frequency shift of the reference spectrum before calculating a differential spectrum, is performed on the reference spectrum. This makes it possible to remove baseline deformation due to phonon absorbance of silicon included in the conventional differential spectrum, and to obtain an infrared absorption spectrum of the substitutional carbon with high accuracy and high sensitivity.Type: ApplicationFiled: January 6, 2009Publication date: July 9, 2009Applicant: SUMCO TECHXIV CORPORATIONInventors: Kiyoshi Nagai, Harumi Shibata, Sayaka Hamaguchi
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Patent number: 7557928Abstract: An apparatus using optical coherence tomography based on spectral interference and an ophthalmic apparatus, which can accurately obtain information on an object in a depth direction by correcting misalignment between an optical member of a spectral optical system and a photodetector, includes an interference optical system for irradiating measurement light being low coherent light onto the object and synthesizing the measurement light reflected from the object and reference light being low coherent light to interfere, a spectral optical system which disperses interference light for every frequency, a photodetector photo-receiving the dispersed interference light, means guiding calibration light for adjusting alignment between the spectral optical system and the photodetector to the spectral optical system, means storing reference spectral information, and means adjusting the alignment based on a comparison between spectral information on the calibration light guided to the spectral optical system and photo-reType: GrantFiled: November 30, 2006Date of Patent: July 7, 2009Assignee: NIDEK Co., Ltd.Inventor: Tokio Ueno
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Publication number: 20090153871Abstract: The present invention relates to sensor apparatus and methods, pertinent to electromagnetic energy in visible and other spectra, to capture and reproduce substantially all electromagnetic information within a relevant spectrum. This invention takes advantage of the wave properties of light, using tiny components dimensioned to the relevant wavelengths of light. Recent developments in nano-technology permit construction of wave-based detectors, instead of photon-counting receivers. These wave detectors can operate in the electromagnetic spectral range, including submillimeter, infrared, visible, ultraviolet and X-ray bands, with consequent low noise and tremendous sensitivity due to gain resulting from their inherent antenna construction. This invention provides for both non-contact and contact coupling methods between the sensor and the receiver/demodulator.Type: ApplicationFiled: June 11, 2008Publication date: June 18, 2009Inventors: Eric Dean Rosenthal, Richard Jay Solomon, Clark Eugene Johnson
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Publication number: 20090147263Abstract: The field of the invention is that of spectroscopic analysis devices allowing the spectral analysis of radiation. The device according to the invention is of the interference type, it comprises at least a first reflecting layer onto which is deposited a multilayer of alternately transparent and photo-absorbing thin films, each photo-absorbing layer being connected to electronic detection means supplying a primary electronic signal and the device also comprising means for analyzing the primary signals and configured in such a manner as to determine the spectral distribution of the original radiation.Type: ApplicationFiled: December 5, 2008Publication date: June 11, 2009Applicant: COMMISSARIAT A L' ENERGIE ATOMIQUEInventors: Pascale PARREIN, Pierre Gidon
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Patent number: 7535572Abstract: The present invention provides an economically feasible robust spatial heterodyne spectroscopy (SHS) interferometer. A first type prior art monolithic SHS interferometer is exceedingly expensive, whereas a second type of prior art SHS interferometer is extremely large and has many components, which need to be tuned. The present invention is much less expensive than the first type of prior art SHS interferometer and is much smaller that the second type of prior art SHS interferometer.Type: GrantFiled: November 20, 2006Date of Patent: May 19, 2009Assignee: The United States of America as represented by the Secretary of the NavyInventor: Christoph R Englert
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Patent number: 7535004Abstract: Disclosed is a Fourier transform infrared spectrophotometer, which comprises: a main interferometer section including a beam splitter, a fixed mirror, a movable mirror, and a phase plate disposed between the beam splitter and the fixed mirror; a control interferometer section having a quadrature control system for calculating a position of the movable mirror; a center-burst-position detection section operable, based on an input of interference signals and interferograms, to subject respective intensities of the interferograms to an addition processing while correcting a positional deviation of the movable mirror, so as to obtain a cumulative interferogram, and detecting a center burst position having a maximum intensity value in the cumulative interferogram; a center-burst-position storage section operable to store the detected center burst position; and a measurement-start-position determination section operable, based on the stored center burst position, to determine a measurement start position of the movaType: GrantFiled: November 28, 2007Date of Patent: May 19, 2009Assignee: Shimadzu CorporationInventor: Yoshitake Yamamoto
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Publication number: 20090116027Abstract: A THz. spectrometer a includes an adjustable resonator situated between two parabolic mirrors at least one being movable with a stepper motor to create a resonance chamber. A terahertz source irradiated the chamber and a mixer which also receives a signal modulated by the sample in the resonance chamber.Type: ApplicationFiled: April 30, 2008Publication date: May 7, 2009Applicant: SECURITY LOGIC AGInventor: Noel Axelrod
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Publication number: 20090116028Abstract: An optical system for analyzing light from a plurality of samples is provided. The optical system includes a plurality of holders adapted to have samples located therein, a collection lens, a transmission grating, and a reimaging lens. The collection lens is configured to receive and substantially collimate light from the samples. The transmission grating is configured to spectrally disperse the substantially collimated light from the collection lens. The reimaging lens is configured to receive the light from the light dispersing element and direct the light onto a light detection device. A method of optically analyzing at least one sample is also provided.Type: ApplicationFiled: January 13, 2009Publication date: May 7, 2009Applicant: Life Technologies CorporationInventor: Richard T. Reel
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Patent number: 7522786Abstract: In detection and sensing, light is transmitted through layers or structures that vary laterally, such as with a constant gradient or a step-like gradient. After transmission, a position of a transmitted portion of the light or of output photons can be used to determine wavelength change or to obtain other photon energy information. The light can be received, for example, from a stimulus-wavelength converter such as an optical fiber sensor or another optical sensor. A component that propagates the light from the converter to a transmission structure can spread the light across the transmission structure's entry surface. At the exit surface of the transmission structure, photosensor components can sense or detect transmitted light or output photons, such as with a photosensor array or a position sensor. A photosensed quantity can be compared, such as with another photosensed quantity or with a calibration quantity. A differential quantity can be obtained using photosensed quantities.Type: GrantFiled: December 22, 2005Date of Patent: April 21, 2009Assignee: Palo Alto Research Center IncorporatedInventors: Peter Kiesel, Oliver Schmidt
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Publication number: 20090073450Abstract: Embodiments of the invention pertain to the optical phenomena of ‘slow-light’ and ‘fast-light’, provided by a highly optically dispersive medium; that is, one in which the absolute value of the group index of refraction of the medium is equal to or greater than four. Apparatus embodiments of the invention are directed to an optical spectroscopic parameter detection and/or measurement apparatus. In various non-limiting aspects, the apparatus may be in the form of an interferometer, a spectral interferometer, a spectrometer, a wavemeter, a tunable narrowband filter, and other such devices. Various non-limiting, exemplary apparatus may include a two-beam interferometer, a multiple-beam interferometer, a grating-based interferometer/spectrometer, a Fourier-Transform interferometer, and others.Type: ApplicationFiled: September 12, 2008Publication date: March 19, 2009Applicant: University of RochesterInventors: Robert W. Boyd, Daniel J. Gauthier, Zhimin Shi
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Patent number: 7505135Abstract: Method and system for determining the optical temporal response of a medium (12) to a short optical pulse excitation, by sending light (11) that comprises spectral frequencies which make up the Fourier Transform of the short pulse to be emulated through the medium. The relative amplitude and phase change (20) of each of the spectral components light (14) exiting the medium is determined with respect to that of the illuminating light source and the spectral response of the medium is obtained from the relative amplitude and phase change. An inverse Fourier Transform is then computationally performed on the spectral response to obtain the temporal response of the medium to the emulated short pulse.Type: GrantFiled: July 14, 2003Date of Patent: March 17, 2009Assignee: Ariel Ltd.Inventors: Er′el Granot, Shmuel Sternklar
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Patent number: 7502118Abstract: A photo-thermal interferometric spectroscopy system is disclosed that provides information about a chemical at a remote location. A first light source assembly is included that emits a first beam. The first beam has one or more wavelengths that interact with the chemical and change a refractive index of the chemical. A second laser produces a second beam. The second beam interacts with the chemical resulting in a third beam with a phase change that corresponds with the change of the refractive index of the chemical. A detector system is positioned remote from the chemical to receive at least a portion of the third beam. An adaptive optics system at least partially compensates the light beam degradation caused by atmospheric turbulence.Type: GrantFiled: February 21, 2007Date of Patent: March 10, 2009Assignee: CeLight, Inc.Inventor: Isaac Shpantzer
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Publication number: 20090046293Abstract: Optical communications can be performed using spectral interferometry. An incident transmission pulse or beam may be mixed with a locally generated beam or pulse to create an interference pattern that may be analyzed to extract the transmitted data. The incident transmission pulse or beam may also be split and mixed with itself to create an interference pattern.Type: ApplicationFiled: January 10, 2008Publication date: February 19, 2009Inventors: John Cabaniss, Tom Chaffee
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Publication number: 20090024360Abstract: The present invention offers an alternative strategy for the correlation of interference information to chemical and/or physical properties of a sample. This strategy can be implemented in a method and a system, which offer substantial technical and commercial advantages over state of the art techniques based on interference spectroscopy. The method comprises the steps of: a. obtaining an interferogram and/or at least one interferogram element corresponding to a modulation of electromagnetic signal emitted from, transmitted onto or through, or having interacted with at least a part of the sample, b. performing i. at least one transformation of the interferogram and/or a segment of the interferogram and/or an interferogram element with at least one function, ii. optionally repeating i) for another segment of the interferogram and/or interferogram element, wherein the transformation does not comprise a Fourier Transformation if i) is conducted only once, thereby obtaining at least one score, c.Type: ApplicationFiled: November 16, 2006Publication date: January 22, 2009Applicant: CHEMOMETEC A/SInventor: Borkur Arnvidarson
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Patent number: 7479966Abstract: The disclosure relates to Method and Apparatus for Super Montage Large area Spectroscopic Imaging. In one embodiment of the disclosure, a method for producing a spectroscopic image of an object includes the steps of (a) irradiating the object with light to thereby produce from the object scattered and/or emitted light for each of a plurality of wavelengths; (b) producing separately for each of the plurality of wavelengths a plurality of substantially contiguous sub-images of the object; (c) compensating for spatial aberrations in ones of the sub-images for a select one of the plurality of wavelengths; (d) compensating for intensity aberrations between ones of the substantially contiguous sub-images for one of the plurality of wavelengths; and (e) combining the sub-images for the select one wavelength to thereby produce said spectroscopic image of the object.Type: GrantFiled: September 19, 2005Date of Patent: January 20, 2009Assignee: ChemImage CorporationInventors: John S. Maier, Jason H. Neiss
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Patent number: 7466929Abstract: A system and method for superheterodyne detection in accordance with the invention. The system comprises a first conversion unit for performing a first heterodyne operation on an optical input signal to generate an electrical IF signal. A second conversion unit is electrically or optically coupled to the first conversion unit. The second conversion unit performs a second heterodyne operation to generate an electrical output signal suitable for signal processing.Type: GrantFiled: March 11, 2004Date of Patent: December 16, 2008Assignee: Agilent Technologies, Inc.Inventors: Douglas M. Baney, Tun S. Tan, Bogdan Szafraniec
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Patent number: 7466421Abstract: A diffractive interferometric optical device is provided for measuring spectral properties of light. The device includes means for coupling in a single spatial mode of an incoming light field to be examined, means for splitting the single spatial mode of incoming light field into at least two partial fields, means for changing one of a shape or a direction of propagation of the wavefront of at least one of the at least two partial fields in dependence on the wavelength and means for generating an interference pattern superimposing the at least two partial fields. The device further comprises detection means to record and evaluate the interference pattern at a plurality of discrete spatial positions in order to derive spectral properties of the incoming light field.Type: GrantFiled: July 15, 2002Date of Patent: December 16, 2008Assignee: CAMPus Technologies AGInventor: Thilo Weitzel
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Publication number: 20080304074Abstract: The present invention provides apparatuses and methods for sample analysis, such as tissue analysis, that integrate high wavenumber (HW) Raman spectroscopy for chemical composition analysis and optical coherence tomography (OCT) to provide depth and morphological information. The invention also provides side-viewing optical probes that are based on a single double clad optical fiber for performing the combined HW Raman spectroscopy and OCT. Intravascular catheter embodiments and related vascular diagnostic methods are also provided.Type: ApplicationFiled: June 8, 2008Publication date: December 11, 2008Inventor: James F. Brennan, III
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Patent number: 7457721Abstract: Without using an interferometer, small displacement and/or three-dimensional shape of an object is detected in a noncontact way with high accuracy using pseudo-phase information calculated from e.g., a speckle pattern having a spatially random structure. A speckle image of the test object of the before displacement is obtained, and a spatial frequency spectrum is calculated by executing an N-dimensional Fourier transform for this. The complex analytic signal is obtained by setting the amplitude of frequency spectrum in the half plane including zero frequency in this amplitude distribution to zero, and executing the frequency spectrum amplitude in the half plane of the remainder in the inverse Fourier transform. And then, the amplitude value of this complex analytic signal is replaced with the constant value, a part of the obtained analytic signal domain is clipped, the phase information is calculated by the phase-only correlation function, and the cross-correlation peak in N-dimension is obtained.Type: GrantFiled: April 22, 2005Date of Patent: November 25, 2008Assignee: The University of Electro-CommunicationsInventors: Mitsuo Takeda, Wei Wang, Nobuo Ishii, Yoko Miyamoto
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Publication number: 20080285043Abstract: A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement includes a second measuring beam path and/or second reference beam path. The optical path lengths of the second measuring beam path and/or second reference beam path are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.Type: ApplicationFiled: December 6, 2006Publication date: November 20, 2008Applicant: CARL ZEISS MEDITEC AGInventors: Adolf Friedrich Fercher, Rainer Leitgeb
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Patent number: 7450238Abstract: Disclosed are an array and a method for the spectrally resolving detection of a sample (22) that is illuminated by means of an illuminating radiation (12) by detecting a sample radiation (24) emitted by the sample (22). Said array comprises an illuminating beam path via which illuminating radiation (12) can be delivered to the sample (22) from a lighting source (10, 10?), and an observation beam path via which sample radiation (24) can be delivered to a detector (40) an observation radiation.Type: GrantFiled: January 26, 2004Date of Patent: November 11, 2008Assignee: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften E.V.Inventors: Walther Rainer Heintzmann, Allen Keith Lidke, Michael Thomas Jovin
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Patent number: 7450241Abstract: An apparatus and associated method for detecting vulnerable plaque within a lumen defined by an intraluminal wall is described. The apparatus includes a probe having a distal portion and a proximal portion. The apparatus includes an optical waveguide extending along the probe. The optical waveguide is configured to carry optical radiation between the distal and proximal portions, and has a distal end in communication with the intraluminal wall. The apparatus includes an interferometer coupled to the optical waveguide and configured to provide an interference signal for sub-surface imaging of the intraluminal wall, and a processing module configured to provide spectroscopic information from detected intensity of light collected from the intraluminal wall.Type: GrantFiled: September 30, 2005Date of Patent: November 11, 2008Assignee: InfraReDx, Inc.Inventor: Andres F. Zuluaga
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Patent number: 7450239Abstract: An optical pulse evaluation device and an in-service optical pulse evaluation device is disclosed which are capable of characteristics evaluation of an optical pulse itself or a sample launched therein in a relatively high bit-rate region. The optical pulse evaluation device evaluates a pulse waveform expressing an optical intensity of the optical pulse, an instantaneous frequency of the optical pulse, or a modulated light prepared by modulating the optical pulse in a light source end. The optical pulse evaluation device also observes a waveform change after a known optical pulse is passed through a device such as an optical fiber to evaluate a waveform deterioration or a compensation behavior caused by the device. The in-service optical pulse evaluation device is capable of measuring a wavelength dispersion in an optical communication.Type: GrantFiled: March 31, 2005Date of Patent: November 11, 2008Assignee: Santec CorporationInventors: Noboru Uehara, Yuichi Takushima, Yasuyuki Ozeki, Yoichi Hirota
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Patent number: 7446877Abstract: A spectroscopic sensor apparatus based on an all optical fiber platform includes a light source, a sensor head, and a fiber acousto-optic tunable filter (FAOTF) based spectrometer. The target agent to be detected interacts with the optical field through the sensor head and produces an absorption or emission spectrum. The absorption or emission spectrum is then measured by the AOTF spectrometer to analyze the constituent of the target agent.Type: GrantFiled: August 26, 2005Date of Patent: November 4, 2008Assignee: BWT Property Inc.Inventors: Qun Li, Sean Xiaolu Wang
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Patent number: 7446878Abstract: The present invention provides methods and apparatuses that can improve measurement accuracy in interferometers. The invention provides methods for determining digital compensation filters that measure a frequency response or responses to be compensated, and then determining a filter target response from the inverse of the frequency response or responses. A digital compensation filter can be determined from the filter target response using a discrete sum of cosines with a phase argument. The invention also allows other desired filter responses to be integrated into the filter target response before determining the digital compensation filter.Type: GrantFiled: November 16, 2006Date of Patent: November 4, 2008Assignee: TruTouch Technologies, Inc.Inventors: Trent Ridder, Ben ver Steeg, John D. Maynard, Zachary Benz
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Patent number: 7443512Abstract: The present invention relates to an apparatus and method for a measurement of a film thickness using an improved fast Fourier transformation. The apparatus includes a light source, a light receiving unit for converging a light from the light source, a detection unit for splitting a reflection light reflected by the surface of the sample and inputted into the optical fabric through the lens, and outputted to the other side of the optical fabric based on a light intensity of each wavelength and providing a certain amount of wavelength, a conversion unit for converting a wavelength based spectrum data detected by the detection unit into an analog signal and then converting into a digital signal through a converter, a computation unit for computing the number of vibrations based on a high speed Fourier transformation, and an analyzing unit for measuring a film thickness.Type: GrantFiled: June 18, 2003Date of Patent: October 28, 2008Assignee: Ellipso Technology Co., Ltd.Inventors: Sang-Youl Kim, Sang-Jun Kim
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Patent number: 7440107Abstract: A sampling spectrophotometer comprising an interferometer is used for performing a spectral analysis of light produced by a source. The sampling is adapted for eliminating uncertainty in the frequencies that are associated with spectral components deduced from an interferogram. Preferably, the interferometer is of Michelson type, and is equipped with at least one staircase mirror in one of the two optical paths. Elementary reflecting strips of the staircase mirror can then be offset with respect to one another according to a variable step.Type: GrantFiled: November 29, 2006Date of Patent: October 21, 2008Assignee: Astrium SASInventor: Frédérick Pasternak
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Patent number: 7436517Abstract: Excitation light is inputted to an optical element with uniformly dispersed inorganic fluorescent nanoparticles whose radius is controlled. Fluorescence is emitted from the inorganic fluorescent nanoparticles through photoexcitation and outputted from one end of the optical element. By controlling the radius of the inorganic fluorescent nanoparticles dispersed in the optical element, the wavelength range and spectral width of the light outputted from the optical element are controlled.Type: GrantFiled: March 30, 2006Date of Patent: October 14, 2008Assignee: FUJIFILM CorporationInventor: Hiroyuki Hiiro
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Patent number: 7436518Abstract: A Fourier Transform Spectrometer (“FTS”) system includes a Fizeau FTS having a plurality of sub-collecting elements, adjacent ones of which are separated by a gap distance, and at least one of which has an adjustable optical path. The FTS system further includes a Michelson FTS having an adjustable optical path. The FTS system further includes one or more processors configured to select spectral data collected by the Fizeau FTS corresponding to spatial frequencies for which the Fizeau FTS has a modulation transfer function (“MTF”) value above a first threshold level, to select spectral data collected by the Michelson FTS corresponding to spatial frequencies for which the Michelson FTS has a MTF value above a second threshold level, and to combine the selected spectral data from the Fizeau FTS with the selected spectral data from the Michelson FTS.Type: GrantFiled: October 18, 2006Date of Patent: October 14, 2008Assignee: Lockheed Martin CorporationInventors: Eric H. Smith, Richard L. Kendrick
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Patent number: 7433552Abstract: Light, such as from an analyte-wavelength converter or other optical sensor, is propagated to a detector or transmission structure with an entry surface and with output positions such as in an exit surface. For example, the position of light output by such a detector can be used to detect presence of an analyte such as a biomolecule or chemical. Or relative quantities of photons provided at positions of the exit surface can indicate analyte information such as presence, absence, quantity, or concentration. The detector or transmission structure can have a laterally varying energy transmission function, such as with a constant gradient or a step-like gradient. At the exit surface of the transmission structure, a photosensor array or position sensor can sense transmitted light or output photons, and, in response, circuitry can provide signals indicating the analyte information.Type: GrantFiled: December 22, 2005Date of Patent: October 7, 2008Assignee: Palo Alto Research Center IncorporatedInventors: Peter Kiesel, Oliver Schmidt
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Patent number: 7433044Abstract: A Fourier transform spectrometer based on a modified Sagnac interferometer is described. The instrument uses one or more gratings as dispersive elements to greatly improve the spectral resolution, and in-line optics to match the beam size in the interferometer to optimize the efficiency. The resolution can approach about 0.6 GHz at about 632.8 nm (?/??=8.4×105). A CCD or photodiode array is used as the detector and the fast Fourier transform of the fringe pattern is performed by a computer. Some embodiments employ no mechanically moving parts; therefore, they are compact and easy to align. Practical applications include remote sensing, process monitoring, and basic research. The fast response time of the detector also allows real time spectral analysis.Type: GrantFiled: June 3, 2005Date of Patent: October 7, 2008Assignee: University of HawaiiInventors: Eric Szarmes, Huan Ma
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Publication number: 20080231859Abstract: A photodetection device, a photodetection method, an image sensor and an image pickup method can increase the number of pixels, while suppressing degradation of the S/N ratio. The photodetection device includes a spectroscopic element formed by means of an optical microresonator having a plurality of resonant wavelength bands differentiated by positions as a function of a geometric structure and a plurality of photoelectric conversion elements arranged at different positions to detect light of the plurality of resonant wavelength bands.Type: ApplicationFiled: March 18, 2008Publication date: September 25, 2008Applicant: CANON KABUSHIKI KAISHAInventor: Masaya Ogino
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Patent number: 7427932Abstract: An optical signal is copressively sampled using an imaging system. The imaging system is created from a plurality of subimaging systems. Each subimaging system comprises a subaperture and a plurality of sensors. The optical signal is collected at each subaperture of the plurality of subimaging systems at a single time step. The optical signal is transformed into a subimage at each subimaging system of plurality of subimaging systems. The subimage includes at least one measurement from a plurality of sensors of each subimaging systems. An image of the optical signal is calculated from the sampling function and each subimage, spatial location, pixel sampling function, and point spread function of each subimaging system of the plurality of subimaging systems. The sampling function is selected so that the number of measurements from a plurality of subimages is less than a number of estimated optical signal values in the image.Type: GrantFiled: July 31, 2007Date of Patent: September 23, 2008Assignee: Duke UniversityInventors: David J. Brady, Nikos Pitslanis, Xiaobai Sun, Prasant Potuluri