Abstract: Aspects of the subject disclosure may include, for example, a repeater device having a first coupler to extract downstream channel signals from first guided electromagnetic waves bound to a transmission medium of a guided wave communication system. An amplifier amplifies the downstream channel signals to generate amplified downstream channel signals. A channel selection filter selects one or more of the amplified downstream channel signals to wirelessly transmit to the at least one client device via an antenna. A second coupler guides the amplified downstream channel signals to the transmission medium of the guided wave communication system to propagate as second guided electromagnetic waves. Other embodiments are disclosed.

Abstract: A pulse multiplier includes a polarizing beam splitter, a wave plate, and a set of multi-surface reflecting components (e.g., one or more etalons and one or more mirrors). The polarizing beam splitter passes input laser pulses through the wave plate to the multi-surface reflecting components, which reflect portions of each input laser pulse back through the wave plate to the polarizing beam splitter. The polarizing beam splitter reflects each reflected portion to form an output of the pulse multiplier. The multi-surface reflecting components are configured such that the output pulses exiting the pulse multiplier have an output repetition pulse frequency rate that is at least double the input repetition pulse frequency.

Abstract: The present invention discloses a co-aperture multi-field of view (FOV) image-spectrum cooperative detection system, and the system includes an infrared optical window, a large FOV two-dimensional scanning mirror, a co-aperture multi-FOV main optical system, a large FOV scanning detector, a staring infrared detector, an infrared non-imaging broadband spectrum measuring unit, a data processing unit, a control unit, and a servo system. Correspondingly, the present invention further provides a method based on the system. The present invention searches a target area by using large FOV scanning, and identifies a target by using medium FOV staring infrared detection, and small FOV fine detection is finally performed on the area to identify the target in combination with spectrum data analysis.

Abstract: A system and method for obtaining super-resolution image of an object. An illumination beam is directed through an optical axis onto the object to be imaged. Paraxial rays of the illumination beam are deflected away from the optical axis and into a beam dump. The non-paraxial rays are collected after being reflected by the object so as to generate an image only from the non-paraxial rays.

Abstract: A metrology method includes obtaining a pattern reflection light reflected from an object by irradiating a first divided light, which is generated by reflecting a polarized light, to the object; obtaining a phase-controlled mirror reflection light reflected from a reflector by irradiating a second divided light, which is generated by transmitting the polarized light, to the reflector; and obtaining a pattern of the object based on an interference signal between the pattern reflection light and the mirror reflection light.

Abstract: A bio-chip package comprises a substrate a first layer over the substrate comprising an image sensor. The bio-chip package also comprises a second layer over the first layer. The second layer comprises a waveguide system a grating coupler. The bio-chip package also comprises a third layer arranged to accommodate a fluid between a first-third layer portion and a second-third layer portion, and to allow the fluid to pass from a first side of the third layer to a second side of the third layer. The third layer comprises a material having a predetermined transparency with respect to a wavelength of a received source light, the waveguide system is configured to direct the received source light to the grating coupler, and the image sensor is configured to determine a change in the wavelength of the source light caused by a coupling between the source light and the fluid.

Abstract: This invention relates to a system and methods including their manufacturing technologies for enhanced sensing capability of one or more bioagents covering from HIV, Pathogens, virus, to cells detection. More particularly, this invention is related to HIV and pathogen diagnosis system and methods which may increase its sensitivity and may reduce the diagnosis time. Furthermore, the diagnosis system and method may be applicable to all early stage patients with various age groups, where early and accuracy in diagnosis, are required.

Abstract: A system comprises: a polarization state aligner (PSA) comprising: an input port; a first polarization beam splitter (PBS) coupled to the input port; a first phase shifter (PS) coupled to the first PBS; a first polarization rotator (PR) coupled to the first PBS; a first beam splitter (BS) coupled to the first PS and the first PR; a first output port coupled to the first BS; and a second output port coupled to the first BS.

Abstract: A system and method for more accurately generating the surface normal calibration maps ?(AoLP) and ?(DoLP,?) to compensate for structured scene reflections for 3-D polarimetric imaging. This is accomplished using a microfacet scattering model to develop the functional form of a polarized bidirectional reflectance distribution function (BRDF) of the object surface. The ambient radiance is ray traced to the BRDF to create the calibration maps ?(AoLP) and ?(DoLP,?), which may be combined into a single calibration map ?(DoLP, AoLP). These maps are applied to the AoLP and DoLP images to compute an array of surface normals, which are then mapped to form a 3-D image of the object.

Abstract: A microscope apparatus includes a light source configured to emit a coherent illuminating light, an optical system configured to irradiate a specimen with the illumination light, and a detector configured to form an image based on a light generated from the specimen by the illumination light that irradiates the specimen. The optical system is configured to project a plurality of focal points of the illumination light on the specimen, and allow the plurality of focal points to interfere with each other while changing phases of the plurality of focal points.

Abstract: Interferometer systems and methods for providing improved defect detection and quantification are disclosed. The systems and methods in accordance with the present disclosure may detect surface defects on patterned or bare wafer surfaces and subsequently quantify them. In certain embodiments in accordance with the present disclosure, amplitude maps of the wafer surfaces are obtained and are utilized in addition/alternative to phase maps for wafer surface feature detection. Furthermore, local one-dimensional and/or two-dimensional unwrapping techniques are also disclosed and are utilized in certain embodiments in accordance with the present disclosure to provide height and depth information of the detected defects, further improving the detection capabilities of the measurement systems.

Abstract: A sample clock generator includes a first optical path and a second optical path through which input lights are guided, an optical phase shifter to shift a phase of the input light guided through the first optical path, an interference-light generating unit to combine a phase-shifted input light and the input light guided through the second optical path to thereby generate an interference light for sample clock, a splitting unit to split the interference light for sample clock into two split lights having different phases, one light receiving unit to at least receive one split light from among the two split lights having different phases, the other light receiving unit to at least receive the other split light, a signal generating unit to generate a sample clock signal based on signals outputted from the one light receiving unit and the other light receiving unit.

Abstract: Systems and methods are described herein for a self-referencing interferometer. The interferometer can comprise an improved spatial phase shifter that reduces the number of components, size and complexity of the spatial phase shifter and maintains a common path for a combined reference beam and signal beam. The self-referencing interferometer further comprises a single mode fiber shunt for filtering the reference beam and further reducing the size of the interferometer. The angle of the reference beam can be tilted before being recombined with the single beam which further simplifies the spatial phase shifting component of the interferometer.

Abstract: A Fourier transform spectrometer (Da) of the invention extracts, in generating an integrated interferogram obtained by integrating a plurality of interferograms, an output of an interferometer (11a) within a predetermined range according to positioning information of a center burst in an interferogram measured at a time before measurement of an interferogram at the present time.

Abstract: A laser interferometer and a method for operating a laser interferometer perform a differential position measurement by laser interferometry of two elements while offering a rotational degree of freedom to one of the elements using a reflecting sphere as a mirror for the laser beam. The laser interferometer and method do not require the object to be aligned with the rotation axis, but instead can track the object in off-centered geometries. This is achieved by employing the pointing of the reflected beam from the sphere as a feedback signal to realign the interferometer which then has a constant beam pointing to the center of the sphere in all cases. The laser interferometer and method keep the direction of the measurement constant. The laser interferometer and method are suitable for homodyne and heterodyne types of laser interferometer technology.

Abstract: As system and method to transmit information with intensity interferometry includes a digital switch configured to receive a baseline message, and, for each of a plurality of bits of a received interferometric message, set the digital switch to an output position depending upon the bit value of the interferometric message. A first and second pair of transmitters separated by a first and second defined distance, wherein the defined distances are different, are configured to broadcast each of the plurality of bits of the baseline message depending upon the output position of the digital switch. One or more pairs of receivers are configured to receive the broadcast of the plurality of bits of the baseline message. An interferometric message recovery module is configured to recover the bits of the received interferometric message after receiving the broadcast of the baseline message at the one or more pairs of receivers.

Abstract: An interferometer module for quantum processing is described including a substrate having two or more input ports and two or more output ports; multiple photonic pathways embedded in the substrate for conveying photons from the two or more input ports and the two or more output ports; and one or more partial beam splitters embedded in the substrate in a photonic pathway for generating spatial and polarization entanglement.

Abstract: A time space coherence interferometer (TSCI) system is provided. In one embodiment of the present invention the TSCI system includes an interferometer in communication with an RF source and a receiver. The interferometer includes a first switch, a second switch, a transmit element, a receive element and a sequencer circuit, wherein the sequencer circuit is configured to alternate the first and second switches between first and second configurations. In a first configuration, the signal from the RF source is provided to the transmit element, where it is communicated to the receive element via a signal path, and provided to the receiver. In the second configuration, the signal from the RF source is provided to the receiver via a reference path. The switching sequence results in a complex ratio of the signal path signal to the reference path signal (e.g., an S21 transmission ratio) being provided to the receiver.

Abstract: Provided is an optical apparatus characterized in that alight from a light source is split to a first light and a second light, and the first light is focused onto an observation object, that an optical filter having a light shielding region for high resolution is disposed in at least one optical path selected from optical paths of the first light, second light and response light from the observation object, that an interference light formed by causing interference between the response light and the reference light in polarized states different from each other is split to multiple beams, and desired amplitude information signals are obtained from the multiple beams through a phase plate and a polarization plate to increase intensity of the second light, whereby the signal to noise ratio is improved.

Abstract: A system and method to obtain and process interferometer output scans is described. The interferometer-based sensor system includes a tunable laser to transmit a transmit signal and a polarization scrambler to produce a polarization state change on the transmit signal. The system also includes an interferometer to provide an output scan based on the transmit signal with the polarization state change and a processor to process the output scan.

Abstract: An optical fiber environmental detection system comprising an interferometer, a broadband light source and a detector is disclosed. The interferometer further comprises a thin core fiber, a first single mode fiber and a second single mode fiber; wherein the thin core fiber is coupled to the first and second single mode fiber via a first junction and a second junction respectively. When an emission light reaches the first junction, high-order cladding modes will be excited. The excited cladding modes will interfere with the core mode at the second junction. The interferences determine the intensity maximum or minimum of the received signal. When there is an ambient environmental change, a shift of the received signal would be induced. According to the shift, environmental change, for instance ambient temperature, could be determined.

Abstract: A method for processing polarization data includes steps of acquiring a plurality of sets of polarization data items, converting the set of polarization data items into a representation including parameters of amplitude and phase, and averaging the converted set of polarization data items.

Abstract: Provided is an apparatus and method for measuring IQ imbalance, and in particular, is an apparatus and method for measuring IQ imbalance for an optical receiver. The apparatus for measuring IQ imbalance for an optical receiver includes a light generating unit generating optical and reference signals to provide the optical and reference signals to an optical receiver, a graph creating unit creating a Lissajous figure by using an in-phase (I) signal and a quadrature-phase (Q) signal output from the optical receiver in response to the optical and reference signals, and a calculating unit calculating IQ imbalance for the optical receiver with reference to the Lissajous figure.

Abstract: A tool employs Raman spectroscopy, optical imaging, physical measurements, smart software applications, and custom databases for automated on-site gem and mineral identification, measurement, and authenticity verification. Operators with no technical expertise can perform on-site, fast, nondestructive gem and mineral characterization. A custom smart application for data handling and processing enables applicability with a variety of processors. Automated generation of Raman spectral signatures and subsequent correlation to spectral fingerprints of known materials enables gem and mineral identification and verification in field settings. A single tool provides high resolution digital optical imaging and physical measurement capabilities, enables comprehensive sample characterization and reporting that currently requires multiple tools and significant labor.

Abstract: An optical detector system comprises a hermetic optoelectronic package, an optical bench installed within the optoelectronic package, a balanced detector system installed on the optical bench. The balanced detector system includes at least two optical detectors that receive interference signals. An electronic amplifier system installed within the optoelectronic package amplifies an output of at least two optical detectors. Also disclosed is an integrated optical coherence tomography system. Embodiments are provided in which the amplifiers, typically transimpedance amplifiers, are closely integrated with the optical detectors that detect the interference signals from the interferometer. Further embodiments are provided in which the interferometer but also preferably its detectors are integrated together on a common optical bench. Systems that have little or no optical fiber can thus be implemented.

Abstract: Techniques and devices for measuring polarization crosstalk in birefringence optical media including polarization maintaining fiber.

Abstract: Six-axis four-subdividing interferometer comprising a six-axis light splitting system and an interference module which are sequentially arranged along the incident direction of polarization orthogonal double-frequency laser, wherein the six-axis light splitting system comprises five 45-degree plane beam splitters and four 45-degree full-reflecting mirrors.

Abstract: In the field of optic instruments comprising at least one optical architecture, a photoreception assembly and means for acquisition and analysis of the images arising from the said photoreception assembly, the acquisition and analysis means comprising an algorithm of phase diversity type, an optical architecture comprises an optical plate of low or zero optical power arranged in the vicinity of the photoreception assembly and disposed so as to form on all or part of the said assembly a first focused image and a second image defocused by a first predetermined value and shifted by a second predetermined value with respect to the first image. The optic instrument can advantageously be a space telescope.

Abstract: A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.

Abstract: An optical sensing device including a source unit configured to generate a polychromatic light beam containing p-polarized beam and s-polarized beam; an interferometric unit configured to introduce birefringent retardation for generating optical path difference between the p-polarized beam and the s-polarized beam; a SPR sensing unit configured to receive both p-polarized beam and s-polarized beam and induce a SPR effect to the p-polarized beam associated with a target sample; and a detection unit for detecting target sample characteristics by obtaining an interference spectrum of the p-polarized beam and the s-polarized beam from the SPR sensing unit.

Abstract: An interferometric system includes a polarization separation element (10), a first polarization conversion element (11), a Mach-Zehnder interferometer (2) including a first (4) and second (5) arms connected to one another by a first (6) and second (7) ends in order for a first and second beams (20, 21) having the same polarization to pass through the interferometer in a reciprocal manner in opposite directions of propagation, respectively, so as to form a first and second interferometric beam (22, 23), a second polarization conversion element (11) for obtaining an interferometric beam (24), the polarization of which is converted, a polarization-combining element (10), and a detection element (8) suitable for detecting an output beam (25).

Abstract: An optical imaging device which receives an optical collimated input beam, the device having a pair of axicon lenses through which a beam is directed to generate a collimated ring beam, wherein the ring beam is scattered from a substance to generate a return beam, and to bypass a reflector that redirects the return beam to prevent the return beam from interfering with the input beam; and a detector which detects an image projected by the return beam.

Abstract: A method and system are presented for determining a line profile in a patterned structure, aimed at controlling a process of manufacture of the structure. The patterned structure comprises a plurality of different layers, the pattern in the structure being formed by patterned regions and un-patterned regions. At least first and second measurements are carried out, each utilizing illumination of the structure with a broad wavelengths band of incident light directed on the structure at a certain angle of incidence, detection of spectral characteristics of light returned from the structure, and generation of measured data representative thereof. The measured data obtained with the first measurement is analyzed, and at least one parameter of the structure is thereby determined.

Abstract: Low-coherence scanning systems and methods for operating the same include simultaneously measuring two phase-shifted interferograms corresponding to intensity patterns produced by interfering test light reflected from a test object with reference light on respective first and second detectors, in which the test light and reference light are derived from a common source. The interferograms measured by the first detector define a first set of scanning interferometry signals, and the interferograms measured by the second detector define a second set of interferometry signals corresponding to substantially the same multiple transverse locations on the test object, in which each interferometry signal in the second set is phase-shifted relative to a corresponding interferometry signal in the first set. An electronic processor processes the first set and second set of interferometry signals either independently from each other or in a combined manner to obtain information about the test object.

Abstract: An interferometer includes a light source, a beam splitter, a measuring reflector, a reference retroreflector, a detector system, and two transparent plane plates. The beam splitter splits a first beam of rays, emitted by the light source, into at least one measuring beam and at least one reference beam, via which a first splitting plane is defined. The measuring beam propagates in a measuring arm and the reference beam propagates in a reference arm until being recombined at a recombining location in a first recombining plane. The first recombining plane is oriented parallel to the first splitting plane. The measuring reflector, on which the measuring beam falls perpendicularly at least twice, is disposed in the measuring arm and is joined to an object to be measured that is movable along a measuring direction. The reference retroreflector, on which the reference beam falls at least once, is disposed in the reference arm.

Abstract: The present invention relates to an interferometer and an optical device using same. Unclear interference patterns and restrictions between light source and the interferometer for conventional devices require precise control devices. The present invention enables to control a wave plate of an interferometer to make the amplitude of object beam split by a polarization beam splitter asymmetric against that of reference beam, resulting the brightness of interference patterns adjustable, while using tunable laser as light source of an optical device and adopting frequency scanning methods to prevent restrictions between light source and interferometer.

Abstract: Embodiments generally relate to a light source and methods for minimizing temperature sensitivity of a light source light source. In one embodiment a light source includes a light-emitting diode, a light beam having an optical axis, a photodetector and a polarizer. The diode is operatively configured to emit the light beam. The beam splitter, positioned to intercept the light beam, includes a first optical surface operatively configured to reflect a first portion of the light beam and to transmit a second portion of the light beam therethrough. The photodetector is positioned to capture the first portion of the light beam after reflection by the beam splitter and operatively configured to generate photocurrent proportional to an intensity of that captured first portion. The polarizer is positioned between the diode and the beam splitter, and is operatively configured to polarize the light beam along a polarization direction perpendicular to its optical axis.

Abstract: The disclosed invention describes a new apparatus performing a new data acquisition for quantitative refractive index tomography. It is based on a linear scanning of the specimen, opposed to the classical approaches based on rotations of either the sample or the illumination beam, which are based on the illumination with plane waves, which orientation is successively modified in order to acquire angular information. On the contrary, the inventive apparatus and method rely on a specially shaped illumination, which provides straightforwardly an angular distribution in the illumination of the specimen. The specimen can thus be linearly scanned in the object plane in order to acquire the data set enabling tomographic reconstruction, where the different positions directly possess the information on various angles for the incoming wave vectors.

Abstract: A method for determining information about a test object includes combining two or more scanning interference signals to form a synthetic interference signal; analyzing the synthetic interference signal to determine information about the test object; and outputting the information about the test object. Each of the two or more scanning interference signals correspond to interference between test light and reference light as an optical path length difference between the test and reference light is scanned, wherein the test and reference light are derived from a common source. The test light scatters from the test object over a range of angles and each of the two or more scanning interferometry signals corresponds to a different scattering angle or polarization state of the test light.

Abstract: A method of analysis of a sample, including the steps of: (a) splitting an input optical beam into a probe beam and reference beam; (b) utilizing the probe beam to interrogate a sample and obtaining a return sample beam there from; (c) manipulating the reference beam into a predetermined polarization state; (d) mixing the return sample beam and reference beam producing a series of mixed beams; and (e) analyzing the polarization components of the series of mixed beams.

Abstract: A wavefront sensing technique using Polarization Rotation INTerferometry (PRINT) provides a self-referencing, high-resolution, direct measurement of the spatially dependent phase profile of a given optical beam. A self-referencing technique is used to create a reference beam in the orthogonal polarization and a polarization measurement to measure the spatial-dependent polarization parameters to directly determine the absolute phase profile of the beam under test. A high-resolution direct measurement of the spatially-resolved phase profile of one or more optical beams is realized.

Abstract: A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.

Abstract: Methods for controlling light transmission through a medium by transmitting light from a single spatial portion of an input optical field through the medium creating an output optical field, superposing the output optical field with a reference optical field creating an optical interference field, detecting an intensity of a spatial portion of a polarization component of the optical interference field and using the detected intensity to determine a value of an optical field amplitude and of an optical field phase for each of a plurality of spatial portions of the input optical field and for each of first and second orthogonal input polarization states of transmitted light entering the medium. The method may be used in the control of the transmission of light 1) through a medium, which is randomizing in amplitude, phase and/or polarization or 2) through a multi-mode fiber or for beam shaping, optical trapping and/or optical manipulation.

Abstract: In one embodiment, a surface inspection system comprises a radiation source that emits a broadband radiation beam, a radiation directing assembly to target radiation onto a surface of an object, the radiation directing assembly comprising a radiation collection assembly to collect radiation reflected from the surface of the object, the radiation collection assembly comprising at least one multi-chip detector array assembly positioned within a field of view of the inspection system.

Abstract: An interferometer includes an optical assembly for directing an input optical field, a space-variant polarization converter, and an analyzer. The optical assembly is configured and operable to produce first and second spatially separated optical fields of incident coherent radiation of substantially the same intensity and different polarizations and to define first and second spatially separated optical paths for propagation of said first and second optical fields thereby allowing interaction between the first optical field and an element affecting a phase thereof in said first optical path. The space-variant polarization converter is accommodated in said combined path and being configured and operable to simultaneously apply space-variant polarization conversion to two beams corresponding to combined first and second optical fields having different polarizations and produce radially and azimuthally polarized beams respectively. The analyzer is located downstream of said polarization converter.

Abstract: An interferometer module for quantum processing is described including a substrate having two or more input ports and two or more output ports; multiple photonic pathways embedded in the substrate for conveying photons from the two or more input ports and the two or more output ports; and one or more partial beam splitters embedded in the substrate in a photonic pathway for generating spatial and polarization entanglement.

Abstract: A construction machine control system comprises a laser surveying instrument for projecting N-shaped beams in rotary irradiation, a construction machine operated within a predetermined range of the N-shaped beams, and an elevation angle detecting unit. The construction machine comprises a working mechanical unit for carrying out construction operation, a machine control device for controlling the working mechanical unit, and at least three beam detectors disposed at known positions with respect to reference position of the construction machine. The beam detectors detect the three fan beams and output result of photodetection. The elevation angle detecting unit obtains elevation angles of each of the beam detectors with respect to the laser surveying instrument based on result of photodetection of three fan beams from the beam detectors. The machine control device is configured to control tilting of the working mechanical unit based on the elevation angle obtained.

Abstract: An ellipsometry system and a detection unit thereof are capable of achieving miniaturization and price reduction associated therewith. The ellipsometry system includes the detection unit that: has an optical polarization element; separates an interference polarization beam obtained by causing the object-reflected polarization beam and reference reflected polarization beam to interfere with each other into a plurality of interference polarization beams on a wavelength basis; and detects the respective separated polarization components in each wavelength.

Abstract: An interferometer includes a light source and a beam splitter, via which the beam of rays emitted by the light source is split into a measurement beam and a reference beam. The measurement beam propagates in a measuring arm extending in a first direction between the beam splitter and a measuring reflector. The measuring reflector brings about an offset perpendicular to the direction of incidence between the measurement beam falling on it and the measurement beam reflected back by it. In a reference arm extending in a second direction, the reference beam propagates between the beam splitter and a reference reflector. In addition, the interferometer has a detector system, to which the superposed and recombined measurement beam and reference beam are able to be supplied, and via which a distance-dependent interference signal with respect to the position of the measuring reflector is able to be generated.

Abstract: A system and method to obtain and process interferometer output scans is described. The interferometer-based sensor system includes a tunable laser to transmit a transmit signal and a polarization scrambler to produce a polarization state change on the transmit signal. The system also includes an interferometer to provide an output scan based on the transmit signal with the polarization state change and a processor to process the output scan.