Shadow Or Beam Blocking Patents (Class 356/638)
  • Patent number: 11060847
    Abstract: A system is provided with a measurement system having a plurality of light sources, a plurality of light sensors, and a controller coupled to the plurality of light sources and the plurality of light sensors. The controller is configured to monitor one or more parameters between a rotor and a casing at least partially based on an interruption or a transmission of one or more paths of light from the plurality of light sources to the plurality of light sensors.
    Type: Grant
    Filed: October 30, 2019
    Date of Patent: July 13, 2021
    Assignee: General Electric Company
    Inventors: Kurt Kramer Schleif, Andrew David Ellis
  • Patent number: 10921113
    Abstract: A system is provided with a measurement system having a light source, a plurality of light sensors, and a controller coupled to the light source and the plurality of light sensors. The controller is configured to monitor one or more parameters between a rotor and a casing at least partially based on an interruption or a transmission of light from the light source to the plurality of light sensors.
    Type: Grant
    Filed: October 30, 2019
    Date of Patent: February 16, 2021
    Assignee: General Electric Company
    Inventors: Kurt Kramer Schleif, Andrew David Ellis
  • Patent number: 10204287
    Abstract: Provided is an image processing apparatus and method for detecting a transparent image from an input image. The image processing apparatus may include an image segmenting unit to segment an input image into a plurality of segments, a likelihood determining unit to determine a likelihood that a transparent object is present between adjacent segments among the plurality of segments, and an object detecting unit to detect the transparent object from the input image based on the likelihood.
    Type: Grant
    Filed: May 11, 2016
    Date of Patent: February 12, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Seung Won Jung, Seung Kyu Lee, Ouk Choi, Do Kyoon Kim, Kee Chang Lee
  • Patent number: 10175036
    Abstract: Method of measuring at least one dimension (L) of an object (1) having a first axis (2), the method including the use of a first optical system (11) including an optical sensor (111) and having a second optical axis (113), the measuring method including (i) obtaining at least one series of data from the optical sensor when the object is in movement relative to the first optical system, notably an angular movement of the first axis relative to the second axis and/or a movement of the object in rotation about the first axis and/or a movement of the object in translation along the second axis and (ii) processing the at least one series of data to quantify said at least one dimension.
    Type: Grant
    Filed: June 27, 2016
    Date of Patent: January 8, 2019
    Assignee: ROLEX SA
    Inventors: Christian Mougin, Philippe Jacot, Olivier Perrinjaquet
  • Patent number: 8881380
    Abstract: There is provided a component mounting apparatus, which includes: a nozzle which sucks a component; a nozzle supporting member, on which the nozzle is installed, which moves in a vertical direction with respect to an upper surface of a substrate on which the component sucked at the nozzle is mounted; an optical system which captures an image of a leading edge portion of the nozzle where the component is sucked in a component mounting operation, from a side direction, such that an optical axis of the optical system is inclined at a predetermined angle with respect to a sucking surface of the nozzle; and an analyzer which analyzes the image of the leading edge portion to determine whether a sucking state of the component sucked by the nozzle is normal or abnormal.
    Type: Grant
    Filed: May 30, 2012
    Date of Patent: November 11, 2014
    Assignee: Samsung Techwin Co., Ltd.
    Inventor: Hatase Takayuki
  • Patent number: 8836957
    Abstract: An optoelectronic sensor (10) is provided with a plurality of light transmitters (14) and light receivers (26) that form between one another a field (20) of mutually parallel monitoring beams (18), wherein beam shaping optics (16, 24) are assigned to the light transmitters (14) and the light receivers (26). The optics (16, 24) comprise a geometry and arrangement leading to a mutual overlap of the optics (16, 24) in a direction diagonal, in particular perpendicular, to the field (20).
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: September 16, 2014
    Assignee: Sick AG
    Inventors: Daniel Kietz, Jürgen Bürger, Axel Hauptmann, Günter Hirt
  • Patent number: 8823519
    Abstract: Systems, methods, and apparatuses for gathering data are disclosed. For example, a plant matter sensor includes a pair of parallel spaced apart sensor arms and a control console, a first of the arms having a plurality of emitter spaced along its length, each emitter configured to emit a signal substantially perpendicularly to the arm to be received by a corresponding receiver on the second arm. The console contains controller means to control the rate, strength and regularity of the signal emitted by each of the emitters, collectors to collect data from each receiver as to the existence or absence of receipt of a signal, a processor to process data received from the controllers and the collectors and determine the height of any plant matter traversed by the plant matter sensor and predetermined intervals, and storage to store the plant matter height data generated by the processor for subsequent download or analysis.
    Type: Grant
    Filed: June 8, 2006
    Date of Patent: September 2, 2014
    Assignees: C-Dax Limited, Massey University
    Inventors: Ian Yule, Robert Murray, Hayden Lawrence, James Frederick Stewart, Willem-Peter Vander Laan
  • Patent number: 8717582
    Abstract: A sensor apparatus for detecting an overhang on a load of a carrier device, having a sensor arrangement with at least one transmitter and a receiver and also an electronic unit for control purposes. According to the invention, the sensor arrangement senses two regions of the carrier device with a load during a movement of the carrier device such that evaluation of the geometrical position of the regions in relation to one another is made possible, wherein the first region relates to the carrier device and the second region relates to the load. Furthermore, the electronic unit is designed for generating a signal for each region and linking the signals such that it is possible to ascertain an overhang from this.
    Type: Grant
    Filed: October 1, 2013
    Date of Patent: May 6, 2014
    Assignee: Cedes Safety & Automation AG
    Inventor: Eric Lutz
  • Patent number: 8593649
    Abstract: A defect detector for corrugated cardboard flutes comprises an optical projector for projecting to traveling flutes an inspection light having an effective line of which the length is about one pitch of flutes inclined slightly so that a tip of a normal flute is positioned on or slightly under the posterior end of the effective line and simultaneously a slope of an adjacent normal flute is positioned on the anterior end side of the effective line, an optical receiver equipped with a light-receiving element for receiving the inspection light reflected by a flute to output information according to the light-receiving position, and normal or abnormal determining means which determines that the flute height is normal if the light-receiving position detected is within an allowable range Wp.
    Type: Grant
    Filed: December 11, 2007
    Date of Patent: November 26, 2013
    Assignee: Phonic Co., Ltd.
    Inventor: Shinichi Mouri
  • Patent number: 8564791
    Abstract: A sensor apparatus for detecting an overhang on a load of a carrier device, having a sensor arrangement with at least one transmitter and a receiver and also an electronic unit for control purposes. According to the invention, the sensor arrangement senses two regions of the carrier device with a load during a movement of the carrier device such that evaluation of the geometrical position of the regions in relation to one another is made possible, wherein the first region relates to the carrier device and the second region relates to the load. Furthermore, the electronic unit is designed for generating a signal for each region and linking the signals such that it is possible to ascertain an overhang from this.
    Type: Grant
    Filed: August 8, 2006
    Date of Patent: October 22, 2013
    Assignee: CEDES Safety & Automation AG
    Inventor: Eric Lutz
  • Patent number: 8550444
    Abstract: A method and system for centering and aligning manufactured parts of various sizes at an optical measurement station are provided. The system includes apparatus having a central axis substantially parallel to the measurement axis and including a plurality of members having open and closed positions. The members have holding faces which are substantially equidistant from the central axis during movement between the open and closed positions. At least one of the members applies a force on an exterior side surface of a part disposed between the holding faces during movement between the positions to reposition the part at the station. The repositioned part is centered and aligned with respect to the measurement axis at the station. The holding faces releasably hold the repositioned part in a holding position between the open and closed positions at the station.
    Type: Grant
    Filed: October 29, 2010
    Date of Patent: October 8, 2013
    Assignee: GII Acquisition, LLC
    Inventors: Gregory M. Nygaard, David A. Strickland
  • Patent number: 8390826
    Abstract: A method and apparatus that linearly scans at least one plane of radiation having a width wider than the diameter of the part onto an exterior side surface of the supported part so that the part occludes the at least one plane of radiation at a plurality of spaced apart locations. The invention includes forming a virtual representation of an outer profile of the part in a reference frame based on the input data and providing a virtual representation of an inner bore of a physical gauge in the reference frame. Then determining an interference position between the part and the gauge using the virtual representations wherein the interference position is a position along the axis where the bore diameter is substantially equal to the part diameter. Finally calculating a distance along the axis based on the interference position and storing the distance.
    Type: Grant
    Filed: April 20, 2011
    Date of Patent: March 5, 2013
    Assignee: GII Acquisition, LLC
    Inventor: Eric M. Walstra
  • Patent number: 8237935
    Abstract: A method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts are provided. The system includes a support for supporting a part to be inspected and/or a calibration device along a measurement axis. The system further includes a head apparatus including a plurality of radiation plane generators for directing an array of planes of radiation at the part and/or device so that the part and/or device occludes each of the planes of radiation to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part and/or device. The head apparatus further includes a plurality of radiation plane receivers or cameras such as line scan cameras.
    Type: Grant
    Filed: February 12, 2010
    Date of Patent: August 7, 2012
    Assignee: GII Acquisition, LLC
    Inventors: Michael G. Nygaard, Gregory M. Nygaard, George M. Nygaard, John D. Spalding
  • Patent number: 8163224
    Abstract: An equipment for metal-laser sintering process includes a powder layer forming unit, an irradiation unit which irradiates light beams, a correction target on which a correction mark serving as a fiducial in correction of the irradiation points of the light beams is formed, and an imaging camera which takes an image of the correction mark. The correction target is formed of a material which is melted by irradiation of light beam so as to be formed a through hole. The correction target is disposed on the substrate and the light beams are irradiated to penetrate the correction target so that the correction mark is formed. Subsequently, the imaging camera takes an image of the correction mark and the location of the correction mark is measured, and thus, correction of the irradiation points is performed.
    Type: Grant
    Filed: October 23, 2008
    Date of Patent: April 24, 2012
    Assignee: Panasonic Corporation
    Inventors: Yoshikazu Higashi, Satoshi Abe
  • Patent number: 8132802
    Abstract: An apparatus for quickly retaining and releasing parts having a wide range of sizes and designs at an optical measurement station is provided. The apparatus includes a rod having proximal and distal ends. The apparatus further includes a part-engaging first tip attached to the distal end of the rod to move therewith. The apparatus still further includes a part-engaging second tip. The apparatus includes a support structure for supporting the second tip and the rod. The apparatus further includes a quick-release, clamping mechanism for adjustably and releasably clamping the rod to the support structure so that the rod can move the first tip between a part-release position in which a part held between the tips is released for removal from the station and a part-retaining position in which a part is firmly held between the tips. Held parts having a wide range of sizes and designs can be optically measured at the station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: March 13, 2012
    Assignee: GII Acquisition, LLC
    Inventors: Kenneth S. Kolodge, Michael G. Nygaard, Gregory M. Nygaard
  • Publication number: 20110219610
    Abstract: A lay meter includes a computer based device, a light source for creating a light plane operably connected with the computer based device, a shadow based sensor a light plane operably connected with the computer based device, and signal processing circuits and software for processing sensed signals such that a clean square wave voltage signal is generated in direct response to the lays passing through the light plane.
    Type: Application
    Filed: March 9, 2011
    Publication date: September 15, 2011
    Inventor: Kenneth Cornelison
  • Patent number: 7990528
    Abstract: A photosensitive chip, including: at least one set of photosensors substantially aligned in a Y direction; and a layer of non-transmissive material including a plurality of openings. Each opening in the plurality of openings includes a respective center line and overlaps only a portion of a respective photosensor so that only the portion of the respective photosensor is photosensitive. The respective center lines for openings for each set of photosensors are not collinear in the Y direction. In an example embodiment, the plurality of openings includes at least one row of openings substantially aligned in an X direction, orthogonal to the Y direction. In an example embodiment, each opening has an equal width in an X direction, orthogonal to the Y direction.
    Type: Grant
    Filed: September 29, 2009
    Date of Patent: August 2, 2011
    Assignee: Xerox Corporation
    Inventors: Paul A. Hosier, Jagdish C. Tandon
  • Patent number: 7920278
    Abstract: A non-contact method and system for inspecting parts using two different types of machine vision methodologies are provided. The system has enhanced versatility and includes a triangulation-based subsystem to obtain triangulation-based sensor data, a radiation plane-based profile inspection subsystem to obtain shadowed radiation plane-based sensor data and a data processor for processing or fusing the triangulation-based sensor data and the shadowed radiation plane-based sensor data to obtain dimensional information related to the part.
    Type: Grant
    Filed: September 19, 2008
    Date of Patent: April 5, 2011
    Assignee: GII Acquisition, LLC
    Inventor: Michael G. Nygaard
  • Patent number: 7907269
    Abstract: An apparatus for detecting top scattered light from a substrate. A source directs a light onto a position on the substrate. The light thereby reflects off in a specular beam, scatters off the top surface, and scatters off a bottom surface of the substrate. An objective receives the top and bottom scattered light. The objective has a first focal point focused on the position on the top surface of the substrate, and a second focal point focused on a pinhole field stop. The pinhole field stop passes the top scattered light that is focused on the pinhole field stop, and blocks the bottom scattered light. A sensor receives and quantifies the top scattered light.
    Type: Grant
    Filed: June 24, 2010
    Date of Patent: March 15, 2011
    Assignee: KLA-Tencor Corporation
    Inventor: Steven W. Meeks
  • Patent number: 7889327
    Abstract: A method for non-contact measurement of the velocity and/or the length of an extrudate moved forward in the longitudinal direction, in particular of a cable during the production.
    Type: Grant
    Filed: August 14, 2009
    Date of Patent: February 15, 2011
    Assignee: Sikora AG
    Inventor: Harald Sikora
  • Patent number: 7796278
    Abstract: A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes.
    Type: Grant
    Filed: September 19, 2008
    Date of Patent: September 14, 2010
    Assignee: GII Acquisition, LLC
    Inventors: John D. Spalding, Eric M. Walstra
  • Patent number: 7777900
    Abstract: A method and system for optically inspecting parts are provided. The method includes the step of supporting a part along a measurement axis. The method includes scanning the part with an array of spaced planes of radiation so that the part occludes each of the planes of radiation at spaced locations along the axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain raw data. The method further includes providing calibration data and processing the calibration data and the raw data to obtain measurements of the part.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: August 17, 2010
    Assignee: GII Acquisition, LLC
    Inventors: Michael G. Nygaard, Gregory M. Nygaard, George M. Nygaard, John D. Spalding
  • Publication number: 20100201806
    Abstract: A method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts are provided. The system includes a support for supporting a part to be inspected and/or a calibration device along a measurement axis. The system further includes a head apparatus including a plurality of radiation plane generators for directing an array of planes of radiation at the part and/or device so that the part and/or device occludes each of the planes of radiation to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part and/or device. The head apparatus further includes a plurality of radiation plane receivers or cameras such as line scan cameras.
    Type: Application
    Filed: February 12, 2010
    Publication date: August 12, 2010
    Applicant: GII ACQUISITION, LLC DBA GENERAL INSPECTION, LLC
    Inventors: Michael G. Nygaard, Gregory M. Nygaard, George M. Nygaard, John D. Spalding
  • Patent number: 7752009
    Abstract: A method of checking the height of a mail item relative to at least one dimensional threshold SH defining a change in postage. The mail items are advanced at a constant speed V along a reference surface. The presence of a mail item is detected relative to a given point of the reference surface. First and second times t1, t2 for which the same mail item is present at the first and second distances d1, d2 relative to the reference surface is detected. The ratio t2/t1 is compared with a value equal to (1??), where ? represents a correction coefficient of less than 1 that depends on the tolerances for detection of the presence of a mail item. The height of a mail item is considered greater than the dimensional threshold SH if, and only if, the relationship t2/t1>1?? is true.
    Type: Grant
    Filed: January 28, 2005
    Date of Patent: July 6, 2010
    Assignee: NEOPOST Technologies
    Inventors: Christian Nicolas, Didier Painault
  • Patent number: 7747065
    Abstract: A manufacturing process for sheet or shaped work products includes advancing the work product in a direction along a processing path; establishing a reference line with respect to the processing path; capturing visual data related to the work product; converting the visual data into a pixel array; and setting a predetermined line of pixels to correspond with the reference line.
    Type: Grant
    Filed: September 13, 2005
    Date of Patent: June 29, 2010
    Inventor: Major K. Howe
  • Patent number: 7738121
    Abstract: A method and inspection head apparatus for optically measuring geometric dimensions of a part are provided. The method optically measures the geometric dimensions of a part having a part axis at an inspection station. The method includes directing an array of spaced planes of radiation at the part so that the part occludes each of the planes of radiation at spaced locations along the part axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method further includes measuring the amount of radiation present in each of the unobstructed planar portions.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: June 15, 2010
    Assignee: GII Acquisition, LLC
    Inventor: John D. Spalding
  • Patent number: 7732797
    Abstract: A device and method for detecting the presence or absence of an object which has repetitive motion are disclosed comprising, a receiver for receiving a signal from the object, and circuitry for determining the presence or absence of the object to be detected, wherein the circuitry records the signal from the receiver as a pattern of data during at least part of the repetitive motion of the object, compares the data with a previously recorded data pattern and, produces an output signal based on the comparison. The signal may be received during discrete time intervals, and may be light which can be transmitted with varying intensity. The circuitry may determine the value of signal received at a receiver and produce a binary value. The signal received at the receiver can be reflected from the object to be detected.
    Type: Grant
    Filed: September 7, 2005
    Date of Patent: June 8, 2010
    Assignee: Renishaw PLC
    Inventors: Victor Gordon Stimpson, Colin Timothy Bell, William Kenneth Davies, Paul Maxted
  • Patent number: 7684061
    Abstract: An electronic component mounting apparatus includes a beam projector for projecting a laser beam, a beam receiver which is placed in opposition to the beam projector and which receives a laser beam projected from the beam projector, a light-reception-sensitivity setting unit for adjusting light-reception sensitivity of the beam receiver, a projection-side orifice provided in the beam projector to narrow a projection spot diameter of the laser beam, and a reception-side orifice provided in the beam receiver to narrow a light-reception spot diameter, where the light-reception sensitivity of the beam receiver is improved. As a result, an electronic component mounting apparatus capable of accurately detecting height size of small components by using a relatively inexpensive photoelectric sensor can be provided.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: March 23, 2010
    Assignee: Panasonic Corporation
    Inventors: Masanori Hiyoshi, Hidehiro Saho, Noboru Yamasaki, Tadashi Endo
  • Patent number: 7684054
    Abstract: A system and method are disclosed for inspecting a component having a length, a width, and an axis. The system includes a fixture for holding the component, a light source disposed on one side of the component, and an optical detector disposed on the other side of the component. In the preferred embodiment, the detector has a field of view wider than the width of the component, thereby enabling the detector to image a portion of the outer edges of the component. A translation stage is operative to move the light source and detector in unison along the length of the component and a processor, in communication with the detector and the translation stage, is operative to: a) receive electrical signals representative of the outer profile imaged by the detector; b) move the translation stage incrementally along the length of the component; and c) record the outer profile imaged by the detector at each increment and form a composite profile of the component.
    Type: Grant
    Filed: August 25, 2006
    Date of Patent: March 23, 2010
    Assignee: GII Acquisition, LLC
    Inventor: David Crowther
  • Patent number: 7633635
    Abstract: A method and system are provided for automatically identifying non-labeled, manufactured parts. The system includes an electronic storage device to store templates of a plurality of known good, manufactured parts. Each of the templates includes a part profile and a set of features. Each of the features includes a range of acceptable values. Each of the templates has a part identification code associated therewith. A first subsystem optically measures a profile and features of a part to be purchased. The system further includes a processor operable to compare the profile and the features of the part to be purchased with the profile and corresponding features of each of the stored templates to identify a template which most closely matches the profile and features of the part to be purchased and to generate and transmit an identification signal representing the part identification code for the part associated with the most closely matched template.
    Type: Grant
    Filed: August 7, 2006
    Date of Patent: December 15, 2009
    Assignee: GII Acquisitions, LLC
    Inventors: Gregory M. Nygaard, John V. McKowen
  • Patent number: 7633634
    Abstract: Optical modules and a method of precisely assembling the modules are provided. The method includes the step of providing a set of optical components including a plurality of beam shaping components for converting at least one initial shape in cross section of a laser beam to at least one desired shape in cross section and an optical mount for supporting the set of optical components. The method further includes holding and locating the optical mount relative to a reference axis. The method still further includes holding the optical components in position relative to the optical mount during the step of holding and locating wherein the positions of the beam shaping components are initial positions. The method includes directing a laser beam having the at least one initial shape at the set of optical components during the step of holding the optical components.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: December 15, 2009
    Assignee: GII Acquisition, LLC
    Inventors: John D. Spalding, Paul L. Bourget, Harold W. Brunt, Jr.
  • Patent number: 7592614
    Abstract: An image is recorded of the edge of a moving object, in particular a sheet, in a machine processing printing material. The illumination is carried out with an illuminating device, and an image is recorded of at least one part of the edge with an image recording device. The use of the illuminating device and/or the image recording device is substantially synchronous with the movement of the object and substantially parallel to the direction of movement of the object. A preferred illuminating device has a row or array of light sources which in each case are switched on and off synchronously with the movement of the object. The constant shadow or shadow strip produced by the illumination moves with the object and ensures adequate contrast between the brightly illuminated object and the dark background, so that the object can be segmented reliably, at least in the region of the edge, and its position, orientation and movement can be determined.
    Type: Grant
    Filed: April 2, 2007
    Date of Patent: September 22, 2009
    Assignee: Heidelberger Druckmaschinen AG
    Inventor: Tobias Müller
  • Patent number: 7545514
    Abstract: A pick and place machine includes a sensor disposed to acquire an image of a nozzle before a pick operation, and one or more images after the pick operation. Image analytics based upon these images reveal important characteristics that can be used to classify the pick operation. In some embodiments, a plurality of after-pick images are acquired at different poses (angular orientations).
    Type: Grant
    Filed: September 14, 2006
    Date of Patent: June 9, 2009
    Assignee: CyberOptics Corporation
    Inventors: Swaminathan Manickam, John P. Konicek, David W. Duquette, Steven K. Case
  • Publication number: 20090103113
    Abstract: A method and system for optically inspecting parts are provided. The method includes the step of supporting a part along a measurement axis. The method includes scanning the part with an array of spaced planes of radiation so that the part occludes each of the planes of radiation at spaced locations along the axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain raw data. The method further includes providing calibration data and processing the calibration data and the raw data to obtain measurements of the part.
    Type: Application
    Filed: October 23, 2007
    Publication date: April 23, 2009
    Inventors: Michael G. Nygaard, Gregory M. Nygaard, George M. Nygaard, John D. Spalding
  • Publication number: 20090103111
    Abstract: A method and inspection head apparatus for optically measuring geometric dimensions of a part are provided. The method optically measures the geometric dimensions of a part having a part axis at an inspection station. The method includes directing an array of spaced planes of radiation at the part so that the part occludes each of the planes of radiation at spaced locations along the part axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method further includes measuring the amount of radiation present in each of the unobstructed planar portions.
    Type: Application
    Filed: October 23, 2007
    Publication date: April 23, 2009
    Inventor: John D. Spalding
  • Publication number: 20090103112
    Abstract: A non-contact method and system for inspecting parts using two different types of machine vision methodologies are provided. The system has enhanced versatility and includes a triangulation-based subsystem to obtain triangulation-based sensor data, a radiation plane-based profile inspection subsystem to obtain shadowed radiation plane-based sensor data and a data processor for processing or fusing the triangulation-based sensor data and the shadowed radiation plane-based sensor data to obtain dimensional information related to the part.
    Type: Application
    Filed: September 19, 2008
    Publication date: April 23, 2009
    Applicant: GII ACQUISITION, LLC DBA GENERAL INSPECTION, LLC
    Inventor: Michael G. Nygaard
  • Publication number: 20090079998
    Abstract: Apparatus is provided for slitting composite material into tape and for measuring the width of the slit tape as the tape is being reeled onto take up rolls. The tape width is measured by an optical micrometer. The optical micrometer includes a transmitter for directing radiant energy over the tape and, a receiver for receiving radiant energy from the transmitter that passes across an edge of the tape and for producing a signal related to the width of the tape.
    Type: Application
    Filed: September 22, 2007
    Publication date: March 26, 2009
    Inventors: Patrick L. Anderson, Leonard P. Estrada
  • Patent number: 7477388
    Abstract: A system and method of preventing substrate backside reflected components in a beam of electromagnetic radiation caused to reflect from the surface of a sample in an ellipsometer or polarimeter system, involving placing a mask adjacent to the surface of the sample which allows electromagnetic radiation to access the sample over only a limited area, wherein the mask can include detector elements for collecting electromagnetic radiation reflected from the sample backside.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: January 13, 2009
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Martin M. Liphardt, James D. Welch, Corey L. Bungay, John A. Woollam
  • Patent number: 7456978
    Abstract: A shape measuring apparatus includes a point light source including a white light-emitting diode, a collimator lens for forming a parallel beam as a result of causing light emitted from the point light source to be incident upon the collimator lens, a telecentric lens device, including two-side telecentric optics or object-side telecentric optics, for being irradiated with the light that has passed an object to be measured from the collimator lens, and an image sensor for projecting thereon an image of the object produced by the light that has passed through the telecentric lens device.
    Type: Grant
    Filed: November 16, 2005
    Date of Patent: November 25, 2008
    Assignee: Kabushiki Kaisha Kobe Seiko Sho
    Inventor: Masaru Akamatsu
  • Patent number: 7446886
    Abstract: A method for reconstructing the profile of structures on surfaces. According to said method, at least two images of the same area of the surface that is to be analyzed are evaluated, said images being recorded from a nearly vertical perspective, for example, and the surface being illuminated from different directions at a flat angle thereto. Elevations or depressions on the surface thus cast a distinct shadow in the recorded images, the position of which varies according to the incident light. Inclined areas can be identified by means of a brighter reflection. The vertical profile of a structure on the surface can be determined, and the shape of a fin can hence be reconstructed, for example, by analyzing shadow contours and outlines of bright areas. Even flat inclination changes can be determined by integrating the shape-from-shading process so as to evaluate brightness patterns such that a 3D reconstruction of the surface can be obtained, which matches the original well.
    Type: Grant
    Filed: September 24, 2004
    Date of Patent: November 4, 2008
    Assignee: Daimler AG
    Inventors: Claus Aufmuth, Claus Lörcher, Christian Wöhler
  • Publication number: 20080158573
    Abstract: A diameter measuring instrument that comprises a straight-edge and two legs or jaws, wherewith the distance between the legs can be read-off. The invention is characterized in that the straightedge (2) is provided with a leg (3) which is fixed in relation to the straightedge and a leg (4) which is movable rela-tive to the straightedge, or alternatively with two legs that are movable relative to the straightedge; in that each leg (3, 4) includes a laser (5, 6) which is designed to emit a visible laser beam (7, 8) in a direction that coincides with the length direction of respective legs (3, 4); and in that the laser beams (7, 8) are parallel to one another.
    Type: Application
    Filed: March 28, 2006
    Publication date: July 3, 2008
    Applicant: HALGOF SWEDEN AB
    Inventor: Stefan Haglof
  • Patent number: 7262868
    Abstract: The invention relates to a method of and to an apparatus for ascertaining the transverse dimensions, such as diameters, of one or more rod-shaped articles, for example, continuous or finite-length cigarette rods and/or other rod-shaped smokers' products. When the method and/or the apparatus is utilized to ascertain the transverse dimensions of a single rod-shaped article, such as a continuous cigarette rod-which is stationary, which turns about its longitudinal axis and/or which is moved lengthwise, the apparatus can employ at least one radiation source which emits a beam of radiation against the stationary or moving article whereby the article intercepts a first portion of the beam and permits the remaining portion to impinge upon a device which evaluates the non-intercepted portion of the beam and generates signals denoting the diameter of the article.
    Type: Grant
    Filed: February 5, 2004
    Date of Patent: August 28, 2007
    Assignee: Hauni Maschinenbau AG
    Inventors: Siegfried Hapke, Dirk Sacher, Dierk Schröder, Peter Straube
  • Patent number: 7259873
    Abstract: Method for measuring the cross-sectional dimension of an elongated profile having rounded or sharp edges, in particular of a flat or sector cable by illuminating the article with light sources and determination of a plurality of shadow borders and calculating the parameter of the circle from the coordinates of the light sources and the shadow borders. The dimensions are determined from the circular parameter.
    Type: Grant
    Filed: March 23, 2005
    Date of Patent: August 21, 2007
    Assignee: Sikora, AG
    Inventors: Harald Sikora, Werner Blohm
  • Patent number: 7210321
    Abstract: The centreline runout (a) and out of roundness (b) of a shaft (100) is measured by measuring the distance between the central longitudinal axis (102) of the shaft (100) and each of a plurality of angularly spaced measurement points (103) located on the outer surface of the shaft in a measurement plane (18) using a measuring device (10). The position of the centroid (104) of the shaft at the measurement plane (18) is calculated along with the distance between the centroid (104) and the shaft central longitudinal axis (102), providing a centreline runout measurement (a). The distance between each measurement point (103) and the centroid (104) is calculated with these distances being used to calculate an out of round measurement (b).
    Type: Grant
    Filed: May 14, 2004
    Date of Patent: May 1, 2007
    Assignee: Dana Australia Pty Ltd.
    Inventor: Ian M. George
  • Patent number: 7167252
    Abstract: A non-contact surface measurement system, method and apparatus provides data to computers so that the topography of the surface of an object can be digitally recreated. 3-D images that define tool paths can be created from the data. Thus, cavities may be formed in selected materials by a tool. The appropriately selected materials safely encapsulate the object, which may be an artifact, art object, or other fragile or valuable item for moving or storage.
    Type: Grant
    Filed: November 23, 2004
    Date of Patent: January 23, 2007
    Inventor: Kevin Gallup
  • Patent number: 7161687
    Abstract: A light source (1) sends towards an object under test (5) a light beam (2) with such a size as to encompass the object (5). Past the object, the beam (2) is processed by an optical processing system (6), comprising a band-pass spatial filter (8) located in the Fourier Plane of a converging lens (7), the object (5) being located in the front focal plane of that lens. The filtered beam is collected by a detector (10) that generates an electrical signal representative of the intensity of the field distribution associated with that beam. A system (11) for processing the electrical signal comprises a band-pass filter (12) with temporal cut-off frequencies corresponding with the spatial cut-off frequencies of the spatial filter in the optical processing system (6) and obtains the value of the requested quantity form the electrical signal.
    Type: Grant
    Filed: January 29, 2003
    Date of Patent: January 9, 2007
    Assignee: Area Sistemi S.r.l.
    Inventor: Enrico Maria Pirinoli
  • Patent number: 7159594
    Abstract: The invention relates to a method for adjusting the selecting out of winnowings in the manufacture of smokable products, in particular cigarettes, wherein the current size distribution of a stream of tobacco particles passing a measuring point, per unit of time, is detected and compared with a settable nominal size distribution, and wherein an arrangement for separating the winnowings is continually adjusted, depending on the result of said comparison, and to a corresponding device comprising a sensor for detecting the current size distribution, an arrangement for inputting a nominal size distribution, an arrangement for comparing said current size distribution with said settable nominal size distribution, and lastly an adjusting arrangement for setting the arrangement for separating the winnowings, depending on the output signal of said comparing arrangement.
    Type: Grant
    Filed: September 3, 2003
    Date of Patent: January 9, 2007
    Assignee: British American Tobacco (Germany) GmbH
    Inventors: Volker Kuhl, Heinz-Werner Masurat, Thomas Müller, Bernd Rabenstein
  • Patent number: 7078719
    Abstract: Apparatus for measuring an object (4) with at least one rectilinear edge or profile (4a, 4b) parallel to a given direction (y), comprising: a laser source (1) which emits radiation (2, 2a) which impinges on the said edge or profile; a first cylindrical converging lens (5) the directrices of which are parallel to the direction (y), disposed downstream of the object (4); a spatial filter (6) disposed in the focal plane (A) of the first converging lens (5); a second converging lens (7) disposed downstream of the spatial filter (6); and photosensors (8) disposed in the focal plant (F) of the second converging lens (7).
    Type: Grant
    Filed: April 5, 2002
    Date of Patent: July 18, 2006
    Assignee: Area Sistemi S.r.l.
    Inventor: Enrico Maria Pirinoli
  • Patent number: 6947152
    Abstract: A large profile, high speed laser micrometer is formed from a light source unit comprised of a plurality of emitter modules that combine to emit a laser sheet and a detector array comprised of a plurality of detector modules. The laser micrometer also includes a data processing unit. Each of the emitter modules is aligned with a corresponding detector module such that an object passing between the light source unit and the detector array can be measured to an accuracy of at least 4/100ths of an inch.
    Type: Grant
    Filed: February 1, 2002
    Date of Patent: September 20, 2005
    Assignee: 3DM Devices Inc.
    Inventors: John Keightley, Eric Rechner, Adriano Cunha
  • Patent number: 6929110
    Abstract: Systems and techniques for providing an improved coin acceptor are described. In one aspect, an electronic coin acceptor exaggerates relatively small differences in coin diameters. A coin deposited into the coin acceptor passes along a coin path through two sensing beams, with at least one of the beams positioned at a nonperpendicular angle to the coin path. Timing information relating to the coin's passage through the beams is recorded and utilized to identify the coin. In another aspect, the thickness of the coin is determined as the coin passes through the sensing beams.
    Type: Grant
    Filed: September 20, 2002
    Date of Patent: August 16, 2005
    Assignee: Ellenby Technologies Inc.
    Inventors: Bob M. Dobbins, Christian F. Dungan, Aaron H. Dobbins