Focus Adjustment Patents (Class 359/383)
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Patent number: 7486329Abstract: A focusing state signal output apparatus comprises, an optical detection part configured to detect a reflected light from a sample, and an output part configured to output an a focusing state signal, which is a signal showing a focusing state of the sample, has inverse sign on both sides of a focused position and shows continuous change of a voltage level crossing a zero at the focused position.Type: GrantFiled: November 27, 2002Date of Patent: February 3, 2009Assignee: Olympus Optical Co., Ltd.Inventor: Hideaki Endo
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Patent number: 7483628Abstract: The present invention discloses an optical viewfinder of a camera having the function of taking photographs, and the viewfinder comprises an objective module, a base, an eyepiece module and an upper casing. The objective module and the eyepiece module are fixed onto the front end and rear end of the base respectively and the upper casing is connected between the objective module and the eyepiece module and disposed in the middle section of the base. The simple structure of the invention is designed according to the principle of optical reflection and features a high resolution, an easy installation, and a convenient production, and the optical viewfinder is extensively used for cameras to substitute a high-cost electronic LCD screen.Type: GrantFiled: September 22, 2006Date of Patent: January 27, 2009Assignee: Top Eight Industrial Corp.Inventor: Claire Lee Jung Kuo
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Publication number: 20090002811Abstract: The present invention relates to a microscopic image capturing apparatus having a structure that, in scanning an imageable area of an imaging unit in a predetermined direction in an imaging object area, in which a sample is present, can reliably set a focal point of the imaging unit on each imaging position set inside the imaging object area regardless of the type of focusing actuator. The microscopic image capturing apparatus has a sample setting stage having a sample setting surface that is inclined with respect to a scan plane orthogonal to an optical axis of an objective lens. By moving the sample setting stage, which has such a sample setting surface, along the scan plane in a manner such that the distance in the optical axis direction between the imaging unit and the sample setting surface varies monotonously, the focal point position of the imaging unit is adjusted in only one direction along the optical axis of the objective lens.Type: ApplicationFiled: March 17, 2006Publication date: January 1, 2009Inventors: Shigeru Uchiyama, Takayuki Inoue, Masatoshi Okugawa
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Patent number: 7468836Abstract: The present invention relates to the analysis of specimens. Specifically, the invention relates to methods and apparatus for reviewing specimen slides, including apparatus for holding the slides. The invention also relates to an automatic focusing method for an imaging system and methods for accommodating vibration in the imaging system. In particular, the methods and apparatus may be applied to the automated analysis of cytological specimen slides.Type: GrantFiled: September 25, 2007Date of Patent: December 23, 2008Assignee: CYTYC CorporationInventors: Garrick L. Maenle, William J. Knox, David Zahniser
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Publication number: 20080310016Abstract: This is an optical apparatus provided with an objective with a correction collar for correcting aberration due to an error in the optical thickness of a piece of cover glass comprising a focusing mechanism for changing a distance between the objective and the sample, an optical thickness detecting unit for detecting the optical thickness of the cover glass, an operating unit for calculating the amount of aberration correction, based on the optical thickness of the cover glass detected by the optical thickness detecting unit, a driver unit for driving a correction collar, based on the amount of aberration correction calculated by the operating unit and an imaging sensor for forming the image of the sample that passes through the objective.Type: ApplicationFiled: April 29, 2008Publication date: December 18, 2008Applicant: Olympus CorporationInventors: Masayoshi Karasawa, Akihiko Yoshikawa, Kazuhiro Hayashi
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Publication number: 20080304145Abstract: An inverted microscope includes a lens holding mechanism which holds an objective lens arranged under a sample and used to form an observation image of the sample; a focusing mechanism which holds the lens holding mechanism on its upper part and moves the objective lens up and down together with the lens holding mechanism; and a microscope main body which serves as a casing including the focusing mechanism therein, and includes an opening allowing an attachment of the focusing mechanism and the lens holding mechanism in its upper wall surface. A size of the lens holding mechanism in a horizontal plane is larger than a size of an image projected onto the horizontal plane of the opening.Type: ApplicationFiled: June 9, 2008Publication date: December 11, 2008Applicant: Olympus CorporationInventor: Kazuhiro HASEGAWA
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Patent number: 7463414Abstract: A microscope includes an adjustment device for positioning a specimen stage. An objective, an objective changer and/or an objective turret is coupled to the adjustment device so that a position of the objective element is adjustable by the adjustment device. A holder for the objective element may be provided coupling the objective element to the adjustment device.Type: GrantFiled: January 26, 2006Date of Patent: December 9, 2008Assignee: Leica Microsystems CMS GmbHInventors: Rafael Storz, Heinrich Ulrich
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Publication number: 20080291532Abstract: A 3-D optical microscope, a method of turning a conventional optical microscope into a 3-D optical microscope, and a method of creating a 3-D image on an optical microscope are described. The 3-D optical microscope includes a processor, at least one objective lens, an optical sensor capable of acquiring an image of a sample, a mechanism for adjusting focus position of the sample relative to the objective lens, and a mechanism for illuminating the sample and for projecting a pattern onto and removing the pattern from the focal plane of the objective lens. The 3-D image creation method includes taking two sets of images, one with and another without the presence of the projected pattern, and using a software algorithm to analyze the two image sets to generating a 3-D image of the sample. The 3-D image creation method enables reliable and accurate 3-D imaging on almost any sample regardless of its image contrast.Type: ApplicationFiled: May 26, 2007Publication date: November 27, 2008Inventors: James Jianguo Xu, Ken Kinsun Lee
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Patent number: 7447426Abstract: An optical apparatus is disclosed, which is capable of suppressing an image blur at the start of zooming. The optical apparatus comprises a memory storing data indicating the position of a second lens unit according to the position of a first lens unit, and a controller. The controller controls the drive width of the second lens unit at a third position with a first driving condition in a case where the drive of the first lens unit is started from a first position, and controls the drive width of the second lens unit at the third position with a second driving condition in a case where the drive of the first lens unit is started from a second position. The drive width of the second lens unit at the third position with the first driving condition is smaller than that with the second driving condition.Type: GrantFiled: May 13, 2005Date of Patent: November 4, 2008Assignee: Canon Kabushiki KaishaInventor: Hiroto Okawara
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Patent number: 7446935Abstract: The present invention relates to the analysis of specimens. Specifically, the invention relates to methods and apparatus for reviewing specimen slides, including apparatus for holding the slides. The invention also relates to an automatic focusing method for an imaging system and methods for accommodating vibration in the imaging system. In particular, the methods and apparatus may be applied to the automated analysis of cytological specimen slides.Type: GrantFiled: September 25, 2007Date of Patent: November 4, 2008Assignee: Cytyc CorporationInventors: Garrick L. Maenle, William J. Knox, David Zahniser
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Publication number: 20080228404Abstract: Systems and methods for high-speed image scanning are disclosed herein One aspect of the invention is directed to a method for high speed image scanning. The method for high speed image scanning includes adjusting an object using a positioning element; directing a portion of an image of the object toward a sensor by positioning a first mirror relative to the object, and by positioning a second mirror relative to the object and the first mirror; controlling the positioning element, the position of the first mirror and the position of the second mirror using a processor; and detecting the portion of the image of the object using the sensor positioned relative to the first mirror and the second mirror. In accord with this method, the first mirror directs the portion of the image of the object in a first direction and the second mirror directs the portion of the image of the object in a second direction.Type: ApplicationFiled: August 24, 2007Publication date: September 18, 2008Inventors: Guy Garty, Gerhard Randers-Pehrson, David J. Brenner, Oleksandra V. Lyulko
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Publication number: 20080225388Abstract: The invention provides a compact optical scanning observation apparatus having an internal focusing mechanism and which is suitable for in-vivo observation of animals. The optical scanning observation apparatus comprises a light source for illuminating a sample; an objective optical system for focusing illumination light onto the sample; a detection-light splitting device for splitting off collected detection light from the illumination light; a detection-light focusing optical system for focusing the split-off detection light; a detector for detecting the focused detection light; a focus scanning device disposed between the detection-light splitting device and the objective optical system; and a lateral-direction scanning device, disposed between the focus scanning device and the objective optical system, for scanning the illumination light from the light source on the sample, in substantially orthogonal directions with respect to the optical axis.Type: ApplicationFiled: November 30, 2007Publication date: September 18, 2008Applicant: OLYMPUS CORPORATIONInventor: Tadashi HIRATA
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Publication number: 20080212172Abstract: An embodiment is disclosed for performing the image processing for analyzing the results of a fluorescence in situ hybridization (FISH) microscopic automated sample analysis to determine specific chromosomal characteristics.Type: ApplicationFiled: October 26, 2007Publication date: September 4, 2008Applicant: Ikonisys, Inc.Inventors: Yanning Zhu, Triantafyllos Tafas, Youngmin Kim, Xiuzhong Wang
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Patent number: 7390997Abstract: A microscope which comprises: an optical system for magnifying a sample; a focus adjuster for adjusting a focus of the optical system on the sample; an optical detector for detecting light through the optical system; a position estimator for estimating a position of the focus of the optical system, which stays with respect to the sample, based on the light detected by the optical detector while the optical system is vibrating with respect to the sample; and a controller for controlling the focus adjuster based on the position of the focus estimated by the position estimator, is disclosed. An auto focusing method for a microscope is also disclosed.Type: GrantFiled: September 29, 2006Date of Patent: June 24, 2008Assignee: Sysmex CorporationInventor: Ryuichi Tohma
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Publication number: 20080123185Abstract: A microscope system has a stage on which an observation sample, including an observation object and a transparent member, is to be placed. An objective lens is placed to face the observation sample placed on the stage, and a focusing unit moves at least one of the stage and the objective lens to perform a focusing operation. An autofocus unit controls a focusing driving unit by a so-called Through-the-Lens: TTL system. After autofocus is performed for the transparent member by the autofocus unit, the focusing driving unit makes at least one of the stage and the objective lens move by a predetermined constant amount.Type: ApplicationFiled: January 22, 2008Publication date: May 29, 2008Applicant: OLYMPUS CORPORATIONInventors: Takashi YONEYAMA, Atsuhiro Tsuchiya, Kenichi Koyama
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Publication number: 20080123184Abstract: A microscope including a body and an optical axis reorientation device is described. The optical axis reorientation device is coupled to the body. The optical axis reorientation device includes at least two selectively adjustable mirrors and is rotatable, with respect to an optical axis of the microscope, to reorient a view of an object observed through the microscope while substantially maintaining a constant position of the microscope body.Type: ApplicationFiled: November 26, 2007Publication date: May 29, 2008Inventors: Douglas W. Hege, Brian T. Wirthlin
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Patent number: 7369304Abstract: The present invention relates to the analysis of specimens. Specifically, the invention relates to methods and apparatus for reviewing specimen slides, including apparatus for holding the slides. The invention also relates to an automatic focusing method for an imaging system and methods for accommodating vibration in the imaging system. In particular, the methods and apparatus may be applied to the automated analysis of cytological specimen slides.Type: GrantFiled: November 5, 2001Date of Patent: May 6, 2008Assignee: Cytyc CorporationInventors: Garrick Maenle, William J. Knox, David Zahniser
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Patent number: 7349152Abstract: This invention is characterized by the following feature. A three-dimensional confocal microscope system for performing image processing based on image pickup data of sliced images of a sample outputted from a confocal scanner and thus acquiring a three-dimensional image of the sample, the system comprising a correction unit for correcting brightness of the sliced images on the basis of depth of the sample. Thus, a three-dimensional confocal microscope system that corrects changes in the brightness of the image due to the depth of the sample and thus achieves uniform brightness of the image at any point in the direction of depth can be realized.Type: GrantFiled: August 12, 2004Date of Patent: March 25, 2008Assignee: Yokogawa Electric CorporationInventor: Takayuki Kei
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Patent number: 7348528Abstract: A distance measuring device capable of being used in microscopes or other optical systems. Embodiments of the invention employ one or more scanning mirrors to scan a reference beam over a target to be inspected. The reference beam is returned and detected by a photodetector. The reference beam may be created by using a knife-edge element which allows the outgoing reference beam and incoming reference beam to follow the same path so that the apparent motion of the spot on the target surface is not detected by the photodetector. The photodetector generates an electronic signal corresponding to the displacement of the target away from the ideal focal point. The electrical signal may be used to drive a servomechanism to displace either the target or the microscope objective lens to bring the target in focus.Type: GrantFiled: December 20, 2005Date of Patent: March 25, 2008Inventor: Daniel R. Marshall
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Patent number: 7345814Abstract: A microscope system has a stage on which an observation sample, including an observation object and a transparent member, is to be placed. An objective lens is placed to face the observation sample placed on the stage, and a focusing unit moves at least one of the stage and the objective lens to perform a focusing operation. An autofocus unit controls a focusing driving unit by a so-called Through-the-Lens: TTL system. After autofocus is performed for the transparent member by the autofocus unit, the focusing driving unit makes at least one of the stage and the objective lens move by a predetermined constant amount.Type: GrantFiled: September 27, 2004Date of Patent: March 18, 2008Assignee: Olympus CorporationInventors: Takashi Yoneyama, Atsuhiro Tsuchiya, Kenichi Koyama
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Publication number: 20080055718Abstract: The present invention provides a control method for a microscope apparatus, comprising: a first step for recognizing a type of a specimen retention member retaining a specimen; a second step for obtaining a first image including the whole image of a specimen retention member showing a picture of the entirety of the specimen retention member and an image of the specimen, and obtaining a second image including only the whole image of the specimen retention member in accordance with the type of the specimen retention member; and a third step for obtaining a macro observation image with a self fluorescence removed except for the specimen based on the first image and second image.Type: ApplicationFiled: August 17, 2007Publication date: March 6, 2008Applicant: Olympus CorporationInventors: Takayuki Kono, Akihiko Yoshikawa
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Patent number: 7327514Abstract: A microscope system having a plurality of exchangeable objective lenses (10); an objective lens changeover element (18) for supporting each of the objective lenses which is operable for placing a selected one of said objective lenses into an optical axis (22) of the microscope system, wherein each objective lens is supported by the changeover element in such a manner that each objective lens is moveable coaxially with respect to the optical axis and relative to the changeover element; and an actuator element (20, 40) for moving the selected one of the objective lenses coaxially relative to the optical axis and relative to the changeover element for focusing the selected one of the objective lenses relative to a specimen (12).Type: GrantFiled: March 1, 2004Date of Patent: February 5, 2008Assignee: Till I.D. GmbHInventors: Rainer Uhl, Hartmann Harz
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Patent number: 7315412Abstract: An optical microscope of high stability such that problems wherein an image of a sample becomes unsharp during observation and movement (drift) of the object point (object) occurs are solved because the defocusing in the Z direction attributable to thermal expansion of the optical microscope is compensated. The optical instruments are characterized as comprising an optical system unit symmetrical to the optical axis in terms of weight and shape and a peripheral unit having a sample positioning mechanism is constituted by combining components having temperature dependences close to zero.Type: GrantFiled: June 13, 2002Date of Patent: January 1, 2008Assignee: Japan Science and Technology CorporationInventors: Kazuhiko Kinoshita, Megumi Shio
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Patent number: 7304790Abstract: A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected light and fluorescence; a second step of performing focusing with respect to the surface of the specimen using the reflected light from the specimen; and a third step of performing focusing for the fluorescence based on the focal position of the specimen surface in the second step.Type: GrantFiled: March 28, 2005Date of Patent: December 4, 2007Assignee: Olympus CorporationInventors: Yoshihiro Kawano, Isao Ishibe, Yoshihisa Tanikawa, Atsuhiro Tsuchiya
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Patent number: 7289199Abstract: An electronic imaging apparatus includes a connecting section connected to an optical apparatus; an optical element having a preset transmittance with respect to light in a preset wavelength region, incident from the optical apparatus; and an electronic image sensor receiving the light transmitted through the optical element.Type: GrantFiled: December 7, 2006Date of Patent: October 30, 2007Assignee: Olympus CorporationInventors: Atsushi Yonetani, Yukio Nonoda, Kazuhiko Yamanouchi
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Patent number: 7283295Abstract: A microscope includes at least one focusing means for focusing an object plane. The focusing means includes first and second adjustment means. The first and second adjustment means are coaxial and independently rotatably adjustable with respect to one another. The second adjustment means are releasably fastenable to the focusing means. In a preferred embodiment, the first adjustment means comprises a coarse focus adjustment knob and the second adjustment means comprises a fine focus adjustment knob. The second adjustment means preferably includes magnetic means adapted for mating engagement with complementary magnetically attractable means of a rotatable focus drive means of the focusing means. A particularly preferred embodiment comprises at least two focusing means wherein the second adjustment means of each may be releasably attached to each; one on each opposite side of the microscope as desired.Type: GrantFiled: March 26, 2004Date of Patent: October 16, 2007Assignee: Leica Microsystems CMS GmbHInventors: Russell Bonaventura, Paul M. Harrison, Kenneth M. Northem
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Patent number: 7274506Abstract: In adjusting a microscope having at least two objectives for superimposing measuring beams of light in an object space to the end of obtaining an interference pattern and for monitoring the object space, each objective having a focal point, a focal plane and a pupil, auxiliary beams of light which are distinguishable from the measuring beams are directed into the objectives, and the auxiliary beams getting back out of the objectives are superimposed to obtain an auxiliary interference pattern. Further, the auxiliary beams getting back out of the objectives are imaged as spots.Type: GrantFiled: January 6, 2006Date of Patent: September 25, 2007Assignee: Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V.Inventor: Johann Engelhardt
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Patent number: 7262908Abstract: A microscope system according to the present invention comprises a stage on which a specimen is placed, an image forming optical system that forms an image of the specimen placed on the stage, an image-capturing device that captures the image of the specimen formed by the image forming optical system, a focused position detection device that detects a focused position for the specimen based upon the specimen image captured by the image-capturing device and a focused position storage device that stores in memory the focused position detected by the focused position detection device. The focused position detection device sets a search range centered around the focused position stored in memory at the focused position storage device and detects the focused position anew by causing the stage and the image forming optical system to move relative to each other over the search range thus set each time a focusing operation is executed.Type: GrantFiled: December 5, 2006Date of Patent: August 28, 2007Assignee: Nikon CorporationInventor: Yasushi Ogihara
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Patent number: 7232222Abstract: Provided is an operation microscope where manipulations to be performed in response to switching between methods for observing an eye to be operated are performed in an interlocked manner, thereby improving manipulability. When recognizing that a change-over switch is switched to its upper position, a control circuit controls a drive apparatus so that an operator microscope is raised, controls a drive mechanism so that an optical unit is moved to an inverter-on position, changes the turned-on position of a light source so that an illumination light flux forms a small angle with respect to an observation optical axis, and controls a solenoid so that a stereo variator is moved to be arranged on an optical path of an observation light flux.Type: GrantFiled: February 17, 2004Date of Patent: June 19, 2007Assignee: Kabushiki Kaisha TopconInventors: Taisaku Kogawa, Nobuaki Kitajima, Kazuyuki Okamura
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Patent number: 7233435Abstract: The present invention concerns a microscope 1. The microscope 1 encompasses a microscope stand 2, an objective 4 having an optical axis 5, a microscope stage 6 serving to receive a specimen 7, and a focusing device 20 serving to focus the specimen 7. With the focusing device 20, the objective or the microscope stage 6 is positionable relative to the microscope stand 2 in the direction of the optical axis 5 of the objective 4. The focusing device 20 comprises at least one operating element 8 with which an operator controls the positioning of the objective 4 or of the microscope stage 6. For adaptation of the spatial arrangement of the operating element 8 to the needs of an operator, the microscope 1 according to the present invention is characterized in that the spatial arrangement of the operating element 8 relative to the microscope stand 2 is modifiable.Type: GrantFiled: August 31, 2004Date of Patent: June 19, 2007Assignee: Leica Microsystems CMS GmbHInventors: Manfred Gilbert, Gerhard Pfeifer, Hans-Joachim Kolb
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Patent number: 7221502Abstract: For a semiconductor device S as a sample of an observed object, there are provided an image acquisition part 1 for carrying out observation of the semiconductor device S, and an optical system 2 comprising an objective lens 20. A solid immersion lens (SIL) 3 for magnifying an image of the semiconductor device S is arranged movable between an insertion position where the solid immersion lens includes an optical axis from the semiconductor device S to the objective lens 20 and is in close contact with a surface of the semiconductor device S, and a standby position off the optical axis. Then an image containing reflected light from SIL 3 is acquired with the SIL 3 at the insertion position, and the insertion position of SIL 3 is adjusted by SIL driver 30, with reference to the image.Type: GrantFiled: March 19, 2004Date of Patent: May 22, 2007Assignee: Hamamatsu Photonics K.K.Inventors: Hirotoshi Terada, Ikuo Arata
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Patent number: 7205531Abstract: When irradiating a sample with light from a light source through an object lens, discretely changing a relative position between a beam condensing position of the object lens and the sample in an optical axis direction of the converging beam, obtaining light intensity information from the sample at each relative position, extracting plural pieces of light intensity information from a light intensity information group, estimating a maximum value on a change curve adaptive to the plural pieces of extracted light intensity information and the relative position for the maximum value, and obtaining the estimated maximum value of the light intensity information and relative position as brightness information and height information, these information about the sample can be continuously obtained by discretely performing an iterative operation on the relative position between a beam condensing position of the object lens and the sample in an optical axis direction of the converging beam.Type: GrantFiled: November 17, 2004Date of Patent: April 17, 2007Assignee: Olympus CorporationInventors: Hideo Watanabe, Wataru Nagata
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Patent number: 7205519Abstract: A confocal microscope apparatus has a confocal scanner for scanning a sample with shifting a focal position of a light beam in a direction perpendicular to an optical axis, a moving mechanism for moving the focal position of the light beam in an optical axis direction, a camera for picking up an image of the sample with the light beam, and a movement control unit for controlling the moving mechanism to move the focal position of the light beam by a predetermined distance in the optical axis direction for every vertical synchronizing signal of the camera in synchronization with the vertical synchronizing signal. A high-speed three-dimensional image can be displayed in such that while measuring the sample, two or more slice images in such an arrangement on a common screen that their positions relative to the sample enables to be grasped.Type: GrantFiled: April 14, 2006Date of Patent: April 17, 2007Assignees: Tokai University Educational System, Yokogawa Electric CorporationInventors: Hideyuki Ishida, Takeo Tanaami
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Patent number: 7196843Abstract: A confocal microscope apparatus comprises a first optical scanning system which obtains a scan image of a sample using a laser beam from a first laser light source, a second optical scanning system which scans specific regions of a sample with a laser beam from a second laser light source that is different from the first laser light source, thereby causing a particular phenomenon, and a beam diameter varying mechanism which can change the beam diameter of the laser beam of at least one of the first optical scanning system and the second optical scanning system. With this configuration, the apparatus further comprises an excitation light intensity distribution calculator which calculates and stores the excitation light intensity distribution along a depth direction on the sample surface from the beam diameter of the laser beam output from the beam diameter varying mechanism.Type: GrantFiled: March 21, 2003Date of Patent: March 27, 2007Assignee: Olympus Optical Co., Ltd.Inventor: Tatsuo Nakata
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Patent number: 7167305Abstract: A microscope system according to the present invention comprises a stage on which a specimen is placed, an image forming optical system that forms an image of the specimen placed on the stage, an image-capturing device that captures the image of the specimen formed by the image forming optical system, a focused position detection device that detects a focused position for the specimen based upon the specimen image captured by the image-capturing device and a focused position storage device that stores in memory the focused position detected by the focused position detection device. The focused position detection device sets a search range centered around the focused position stored in memory at the focused position storage device and detects the focused position anew by causing the stage and the image forming optical system to move relative to each other over the search range thus set each time a focusing operation is executed.Type: GrantFiled: July 24, 2003Date of Patent: January 23, 2007Assignee: Nikon CorporationInventor: Yasushi Ogihara
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Patent number: 7164471Abstract: An electronic imaging apparatus includes a connecting section connected to an optical apparatus; an optical element having a preset transmittance with respect to light in a preset wavelength region, incident from the optical apparatus; and an electronic image sensor receiving the light transmitted through the optical element.Type: GrantFiled: October 31, 2003Date of Patent: January 16, 2007Assignee: Olympus CorporationInventors: Atsushi Yonetani, Yukio Nonoda, Kazuhiko Yamanouchi
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Patent number: 7130116Abstract: The microscope apparatus has an objective lens, a sample base on which an observation sample is placed, a sensor target mounted on the tip portion of the objective lens, and a non-contact sensor mounted on the sample base. The non-contact sensor detects the distance to the sensor target. The microscope further has a motor that moves the objective lens along the optical axis and the controller that controls the motor to keep the relative distance between the tip portion of the objective lens 5 and the sample base constant while the control switch is ON.Type: GrantFiled: May 13, 2005Date of Patent: October 31, 2006Assignees: Research Organization of Information and Systems, Olympus CorporationInventors: Makio Tokunaga, Yoshihiro Ue
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Patent number: 7130117Abstract: A specimen and an objective lens can be quickly brought close together or separated without an operator being concerned about the positional relationship between the specimen and the objective lens, and once the correct positional relationship is established, the focal position can be finely adjusted. The invention includes a first focusing mechanism for moving the objective lens in an optical axis direction relative to the specimen so as to approach the specimen or withdraw therefrom; a second focusing mechanism for displacing an internal optical system in the optical axis direction, and a switching device for switching between operating the first focusing mechanism and operating the second focusing mechanism when the objective lens is disposed at a predetermined switching position.Type: GrantFiled: November 3, 2005Date of Patent: October 31, 2006Assignee: Olympus CorporationInventor: Kei Tsuyuki
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Patent number: 7116038Abstract: An ultrasonic motor of the present invention has a vibrating element 6. The vibrating element 6 includes a first piezoelectric element 62 that undergoes extension and contraction by application of an AC voltage, a reinforcing plate 63 having a contact portion 66 and an arm portion 68, and a second piezoelectric element 64 that undergoes extension and contraction by application of an AC voltage. The first piezoelectric element 62, the reinforcing plate 63, and the second piezoelectric element 64 are laminated in this order. The vibrating element 6 is fixedly mounted through the arm portion 68 so that the contact portion 66 abuts on a driven element (rotor 51). Further, the vibrating element 6 has a body portion and a length L of the body portion in a direction in which the vibrating element 6 extends and contracts by application of the AC voltage is 1 to 20 mm.Type: GrantFiled: February 27, 2004Date of Patent: October 3, 2006Assignee: Seiko Epson CorporationInventors: Osamu Miyazawa, Yasuharu Hashimoto
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Patent number: 7109459Abstract: An auto-focusing method and device are presented for determining an in-focus position of a sample supported on a substrate plate made of a material transparent with respect to incident electromagnetic radiation. The method utilizes an optical system capable of directing incident electromagnetic radiation towards the sample and collecting reflections of the incident electromagnetic radiation that are to be detected. A focal plane of an objective lens arrangement is located at a predetermined distance from a surface of the substrate, which is opposite to the sample-supporting surface of the substrate. A continuous displacement of the focal plane relative to the substrate along the optical axis of the objective lens arrangement is provided, while concurrently directing the incident radiation towards the sample through the objective lens arrangement to thereby focus the incident radiation to a location at the focal plane of the objective lens arrangement.Type: GrantFiled: March 13, 2003Date of Patent: September 19, 2006Assignee: Yeda Research and Development Company Ltd.Inventors: Zvi Kam, Benjamin Geiger
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Patent number: 7102816Abstract: The invention is directed to an arrangement for manual adjustment of a focus position in microscopes with a motor-operated focusing drive. According to the invention, the arrangement has a first operator's control for giving an adjusting path length and a second operator's control for giving an adjusting speed. The two operator's controls are preferably constructed as rotating knobs. An adjusting path length for the focusing movement is given by the rotational angle at the first rotating knob, and an adjusting speed of the focusing movement is given by the rotational angle at the second rotating knob. The change in the rotational angle at the first rotating knob is proportional to the change in the adjusting path and the change in the rotational angle at the second rotating knob is proportional to the change in the adjusting speed.Type: GrantFiled: December 18, 2001Date of Patent: September 5, 2006Assignee: Carl Zeiss Jena GmbHInventors: Tobias Kaufhold, Matthias John
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Patent number: 7088505Abstract: The present invention discloses a microscope and a focusing device for a microscope. The focusing device has at least one operating element attached to a first axle of the focusing device for effecting movement of a microscope stage along the optical axis of the microscope. An adjustable stop mechanism is provided which cooperates with the focusing device to limit the movement of the microscope stage in the direction of the optical axis. The adjustable stop mechanism comprises a rod, a spring for biasing the rod and a screw for adjusting and fixing a position of the rod.Type: GrantFiled: March 26, 2004Date of Patent: August 8, 2006Assignee: Leica Microsystems CMS GmbHInventors: Paul M. Harrison, Russell Bonaventura
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Patent number: 7075046Abstract: A system and method for referencing an objective lens to a desired plane of focus. In one embodiment, a dichroic element is utilized to reflect energy of one or more wavelengths that has passed through an objective lens to a detector for determining a position of the objective lens to a desired plane of focus. The objective lens may be manually and/or automatically focused to the desired plane of focus.Type: GrantFiled: July 27, 2005Date of Patent: July 11, 2006Assignee: University of Vermont and State Agricultural CollegeInventors: Guy G. Kennedy, David M. Warshaw
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Patent number: 7071451Abstract: An autofocus system according to the present invention comprises: a light source; a focusing illumination optical system that forms an optical image generated with light from the light source on a target object through an objective lens; a focusing image forming optical system that receives through the objective lens reflected light generated as the optical image is reflected off the target object and forms a reflected image of the optical image; a photoelectric converter that is provided at an image forming position at which the reflected image is formed by the focusing image forming optical system to detect the reflected image; a signal output device that outputs a signal for controlling a focus actuator based upon a signal corresponding to the reflected image obtained at the photoelectric converter; and an image forming position adjustment device that adjusts an offset quantity between a focus position of the objective lens and an image forming position of the optical image by moving at least one of the imType: GrantFiled: June 16, 2003Date of Patent: July 4, 2006Assignee: Nikon CorporationInventors: Aiichi Ishikawa, Toshiaki Nihoshi
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Patent number: 7046437Abstract: A microscope is provided which includes a frame main body having a base portion, an objective lens switching mechanism, a stage, and an ocular lens for observing a specimen image obtained with one of the objective lenses. A rough/fine motion focusing mechanism is disposed rearward of the stage, for moving the objective lens switching mechanism along the observation optical axis in rough motion and fine motion. A first rough motion handle and a first fine motion handle are provided near the rough/fine motion focusing mechanism, for operating the rough/fine motion focusing mechanism. A rough/fine motion focusing operation portion is provided for operating the rough/fine motion focusing mechanism and includes a second rough motion handle and a second fine motion handle provided near a front end of the base portion. And a linkage mechanism is provided for linking the rough/fine motion focusing mechanism with the rough/fine motion focusing operation portion.Type: GrantFiled: May 3, 2005Date of Patent: May 16, 2006Assignee: Olympus Optical Co., LtdInventors: Kenji Karaki, Kazuhiro Hasegawa, Keisuke Tamura
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Patent number: 7027221Abstract: An auto focus method for a microscope (2), and a system for adjusting a focus for the microscope (2), are disclosed. The microscope (2) possesses a microscope stage (18) and an objective (16) located in a working position. A relative motion in the Z direction takes place between the microscope stage (18) and the objective. Images are read in by the camera (20) during the relative motion, and a microscope control device (4) and a computer (6) are provided for evaluation and determination of the focus position.Type: GrantFiled: April 17, 2003Date of Patent: April 11, 2006Assignee: Leica Microsystems CMS GmbHInventor: Martin Hamborg
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Patent number: 7016110Abstract: The apparatus for automatically focusing an image in a microscope includes onto an object plane includes an optical system configured to form an optical image of a sample plane to be observed, an autofocusing detection system, and a focus correction system. The autofocusing system includes an autofocusing light beam source for generating autofocusing light beams. The autofocusing system further includes a detection system lens for directing autofocusing light beams to an autofocusing detection device, and an autofocusing detection device for determining the amount of displacement of the image of the object plane from a desired focused reference plane. The focusing correction system includes a feedback controller and focus adjusting device for automatically adjusting the distance between an objective lens and the sample plane in order to properly focus the image in the optical system. A related method of automatically focusing an image of an object plane in a microscope.Type: GrantFiled: March 8, 2001Date of Patent: March 21, 2006Assignee: Tibotec BVBAInventor: Marc Jan René Leblans
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Patent number: 6970789Abstract: The invention provides a method for a method for determining a best initial focal position estimate for a current sample location on a substrate comprising multiple sample locations, comprising determining the best initial focal position estimate by using a result from one or more techniques selected from the group consisting of linear regression analysis of focal positions determined for at least two other sample locations on the substrate and quadratic regression analysis of focal positions determined for at least three other sample locations on the substrate.Type: GrantFiled: February 1, 2002Date of Patent: November 29, 2005Assignee: Cellomics, Inc.Inventors: Kim Ippolito, Oleg Lapets, Michael Sipe, Randall Shopoff
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Patent number: 6967773Abstract: A microscope is provided which includes a frame which supports a stage that is adapted to have a specimen placed thereon, an arm provided on the frame to support an objective lens, an observation optical system provided on the arm, and an illumination optical system which includes a light source for illuminating the specimen and which is integrated with the frame. A fastening mechanism fastens the arm and the frame together via at least one spacer, which is provided between the arm and the frame. The spacer has a coefficient of thermal expansion that is different from the coefficient of thermal expansion of the arm. When a temperature of the frame rises due to operation of the light source, the objective lens is moved toward the stage due to the difference in coefficients of thermal expansion between the spacer and the arm.Type: GrantFiled: December 29, 2004Date of Patent: November 22, 2005Assignee: Olympus Optical Co., Ltd.Inventor: Minoru Sukekawa
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Patent number: 6961173Abstract: An optical microscope of high stability such that the image of a sample does not become obscure during observation, and no movement (drift) of an object point (object) occurs. The optical microscope is characterized by comprising vertical straight movement guide mechanisms (4 and 8) for an objective lens (6) of the microscope symmetrical to the optical axis, and fine adjustment units (10, 11 and 12) for the objective lens.Type: GrantFiled: June 13, 2002Date of Patent: November 1, 2005Assignee: Japan Science and Technology CorporationInventors: Kazuhiko Kinoshita, Megamu Shio