Abstract: Disclosed is a microscope for operation. This microscope for operation comprises a front lens 15 disposed between an eye 8 to be operated and an objective 14. The front lens collects an illuminating light P to guide the collected light within the eye for illuminating an interior of the eye. An operator performs an operation within the eye through an eyepiece 39. A refracting power of the front lens 15 is within a range of 30D to 50D.

Abstract: A coupling in a metrology system for placement between a floating inspection chamber and a fixed transfer chamber. The coupling prevents transfer of vibrations between the chambers and seals a passage between the chambers. The coupling includes a first flange attached to the inspection chamber, a second flange not in contact with the first flange and attached to the transfer chamber, and a looped diaphragm having an outer peripheral edge region secured to the first flange and an inner peripheral edge region secured to the second flange to thereby couple the flanges together and close a space between the flanges. Clamps are provided for securing the outer and inner peripheral edge regions of the diaphragm to the first and second flanges, respectively.

Abstract: An epi-fluorescent microscope is constructed with a quick changing set of filters. A wheel containing a plurality of dichroic beamsplitter mirrors mounted equidistance from a center axis of the wheel is mounted at a 45° angle within the lightpath and provides a beamsplitter function. Light from an excitation source is provided as monochromatic light, so that light from the excitation source is reflected by a selected one of the dichroic mirrors to the specimen, and Stokes shifted light from the specimen is transmitted through the dichroic mirror. By separately mounting the dichroic mirrors, the dichroic mirrors can be quickly moved and a quicker change of sensed fluorophores is achieved.

Abstract: Optical scanner system approaches are described in which novel focusing approaches are provided. A control algorithm accounts for geometric variation of successive scans in opposite directions across a microarray slide or substrate in order to provide optimized focus. The feedback approach taught may involve PI or PID terms. In either type of control approach, a projected slope of the slide is calculated and followed back and forth outside a scan region of the array in exiting and entering fully adaptive focusing zones, respectively. During turn-around, the system may track a setpoint between the periods of following the extrapolated slope. Also provided are methods of using the subject system in a biopolymer array based application, including genomic and proteomic applications.

Abstract: A microscope apparatus has a sample table for supporting a sample and being mounted to undergo movement in a horizontal direction. A line sensor acquires a line image for each of a series of measuring positions of the sample in accordance with movement of the sample at a constant speed by one measuring width of the line sensor in the horizontal direction. An image processing device produces an image of the sample based on the line images acquired by the line sensor. A focusing device has a light-projecting member for projecting light onto the sample at a position forward of a leading side of an imaging range of the line sensor in the horizontal direction to prevent light reflected by the sample as a result of the projected light from being incident on and interfering with the line images acquired by the line sensor.

Abstract: A confocal microscope has an illumination beam path of a light source, a detection beam path of a detector, a scanning device, optics combining and separating the illumination beam path and detection beam path, and an objective, in which both an incident specimen illumination and a transmitted specimen illumination are possible. The confocal microscope according to the present invention is characterized in that in order to switch over from an incident specimen illumination occurring through the objective to a transmitted specimen illumination occurring toward the objective, beam deflection optics and optionally beam-shaping optics can be introduced on the side of the specimen plane facing away from the objective.

Abstract: A rough motion shaft 54 and a fine motion shaft 55 are provided on a front side of a stage 37 with respect to an optical axis of an observation optical system of a microscope. Further, a rough motion shaft 45 and a fine motion shaft 46 are provided on a rear side with respect to the optical axis. The rough motion shaft 54 and the fine motion shaft 55 are linked with the rough motion shaft 45 and the fine motion shaft 46 so as to move objective lenses 43 selectively in rough motion or fine motion. Objective lenses 43A, 43B are arranged in a circular shape on a fixing member 111 and a rotating member 113 rotates objective lenses 43A, 43B along the direction of the arrangement. The rotating member 113 includes a weight 123 that applies a rotation force in an inverse direction.

Abstract: An incident illumination unit which can be installed in a slot of an incident illumination device to which a field stop unit or an aperture stop unit is installed, comprises an optical element holding part configured to hold an optical element, a focus mechanism which moves the optical element holding part along an incident illumination axis of the incident illumination device, an insertion and withdrawal mechanism which moves the focus mechanism to a vertical direction to the incident illumination axis, and a outer frame which integrally accommodates the optical element holding part, the focus mechanism and the insertion and withdrawal mechanism and has a slot shape which is inserted and positioned to the slot part of the incident illumination device.

Abstract: An apparatus for optical scanning of multiple specimens (1) and/or specimen regions, the specimens (1) being associated with a specimen receiving device (2) and being optically scannable by a scanning device (3), is easy to operate for data recording of many specimens in the shortest possible time, using simple and economical optical system components. The apparatus according to the present invention is characterized in that the specimen receiving device (2) is rotatable about an axis (4).

Abstract: For a semiconductor device S as a sample of an observed object, there are provided an image acquisition part 1 for carrying out observation of the semiconductor device S, and an optical system 2 comprising an objective lens 20. A solid immersion lens (SIL) 3 for magnifying an image of the semiconductor device S is arranged movable between an insertion position where the solid immersion lens includes an optical axis from the semiconductor device S to the objective lens 20 and is in close contact with a surface of the semiconductor device S, and a standby position off the optical axis. Then an image containing reflected light from SIL 3 is acquired with the SIL 3 at the insertion position, and the insertion position of SIL 3 is adjusted by SIL driver 30, with reference to the image.

Abstract: An operating knob (20) for an optical system (100) is disclosed. The operating knob (20) has a first and a second coaxially arranged rotating element (21, 22). The first and the second rotating element (21, 22) have at least partly conical form. The first rotating element (21) has at the side directly opposing the second rotating element (22) a larger diameter than the second rotating element (22) and a step is formed at the side of the second rotating element (22) directly opposing the first rotating element (21), wherein the step possesses a diameter which is approximately the diameter of the first rotating element.

Abstract: There is disclosed an inverted microscope comprising an objective lens disposed under a sample, a tube lens which is disposed in a light path of an observation light emitted from the objective lens and which forms the observation light into an image, an incident light illumination optical device which is disposed between the objective lens and the tube lens, and which introduces incident light illumination into the light path of the observation light, and an input/output port which is disposed between the incident light illumination optical device and the tube lens, and which splits a light flux from the light path of the observation light or introduces the light flux into the light path of the observation light.

Abstract: An optical microscope of high stability such that the image of a sample does not become obscure during observation, and no movement (drift) of an object point (object) occurs. The optical microscope is characterized by comprising vertical straight movement guide mechanisms (4 and 8) for an objective lens (6) of the microscope symmetrical to the optical axis, and fine adjustment means (10, 11 and 12) for the objective lens.

Abstract: An optical microscope of high stability such that problems wherein an image of a sample becomes unsharp during observation and movement (drift) of the object point (object) occurs are solved because the defocusing in the Z direction attributable to thermal expansion of the optical microscope is compensated. The optical instruments are characterized as comprising an optical system unit symmetrical to the optical axis in terms of weight and shape and a peripheral unit having a sample positioning mechanism is constituted by combining components having temperature dependences close to zero.

Abstract: There is disclosed a microscope focusing apparatus comprising a light illuminator, an objective lens, an observation tube, a holder which holds these, a focusing main body including a focusing movable portion which linearly and vertically moves, and an attaching portion, formed in the focusing movable portion, which fixes the holder, wherein the holder comprises a first holder including a first support, the first support disposed on an observation optical axis, which supports the light illuminator, and a second holder including a second support, the second support disposed outside the observation optical axis, which supports the light illuminator, and one of the first and second holders can be selectively attached to the attaching portion.

Abstract: In a confocal microscope, a beam of light from a light source is lead to a rotary disk by way of an optical lens and a half mirror, and made to strike specimen by way of an objective lens. The rotary disk has random pin hole pattern sections where pin holes are randomly bored through a light blocking mask, and an aperture section having an area k2 times greater than the area of the random pin hole pattern sections and allowing any light to pass therethrough. The beam of light reflected by the specimen is made to enter a CCD camera by way of the objective lens, the rotary disk, the half mirror and a condenser lens. The CCD camera is adapted to selectively pick up a composite image containing a confocal image component and a non-confocal image component of the specimen obtained through the random pin hole pattern sections and a conventional image of the specimen obtained through the aperture section.

Abstract: With the optical detection of a difference between both sides of a divided focus spot light of a section on a self-luminous body, the light from a light source point of said section on a self-luminous body is represented as a graph having a more peculiar point or a sharper point within the diffraction limit of the objective than the light intensity distribution graph of the focus spot light from said light source point of said section. With three values M, N and O from said optical detection of a difference in both sides of a divided focus spot light of said section on a self-luminous body, the brightness of a photo-image of said object on a self-luminous body is obtained by the value (M−2N+O).

Abstract: A microscope system whereby microscopic specimens can be continuously and autonomously maintained in focus without sacrifice to the optimum resolution of the objective. The system achieves focus by splitting the image emerging from the objective lens into two pathways, a focus test pathway and an observational pathway. Each pathway contains an electronically indexed lens module. The focus test pathway lens module is continuously varied, resulting in focal variations in its projected image. The focus test pathway lens position is correlated with the focus camera image for optimum focus. The indexed value for the optimum focus, obtained from the focus test pathway, is then compared to the index value of the lens module in the observational pathway where immediate correction is applied if necessary. Therefore, time and three-dimensional information which would be lost with conventional focusing is acquired, processed, and utilized without negative effects to the observational path.

Abstract: An operating-microscope system including an operating microscope, a carrier system for the microscope, and at least one drive element that can be actuated by a switch and is intended for moving and/or focusing a microscope includes a sterilizable hand switch arranged on the operating table. The switch is positioned and configured so that the surgeon may actuate the switch to move and/or focus the microscope without releasing the operating instrument.

Abstract: A microscope arrangement for fluorescence spectroscopy, especially fluorescence correlation spectroscopy, is proposed having at least two beam paths (38, 40, 50) that can be focused in each case onto a measuring volume, situated in a common measuring area of the microscope array, of a sample (12) to be investigated. At least one (50) of the beam paths (38, 40, 50) is an illuminating beam path that leads from a light source (44) to the measuring area. At least one further (38, 40) of the beam paths (38, 40, 50) is, moreover, an observing beam path that leads from the measuring area to a photodetector (26, 36) providing a fluorescence detection signal. The microscope arrangement has at least one optical element (18, 20, 22, 28, 30, 48) that is arranged in one of the beam paths (38, 40, 50) and can be adjusted for the purpose of setting the focus of this beam path (38, 40, 50).

Abstract: Arrangement and method for focus monitoring in a microscope with digital image generation, preferably in a confocal microscope. The arrangement provides an additional, rotatably supported transparent optical component in the known construction of a microscope in front of a main beam splitter arranged in the beam path in the area of a parallel illumination beam path. According to the method, the images required for focus monitoring are recorded with a transparent optical component inclined by angle +&agr; or −&agr;. The images are checked for correlation of the image contents in the direction of beam displacement by pixel-by-pixel displacement. The determined displacement &Dgr;s at optimum correlation represents a measurement of the instantaneous focusing or defocusing. The suggested solution for focus monitoring is applicable with slight adaptations for all microscopes outfitted with digital image-generating methods and arrangements.

Abstract: By mounting a projection lens to a first supporting member for fixing spatial light modulators, polarization beam splitters and a cross dichroic prism, and providing a second supporting member having a thermal expansion coefficient larger than that of the first supporting member between the projection lens and the first supporting member, afluctuation of distance between the spatial light modulators and the projection lens due to heat generated by a light source lamp of a projection type display apparatus and temperature change in use environment can be canceled so that an optimum projected image having nothing to do with being out of focus can always be obtained.

Abstract: A focusing system for a microscope has an objective lens, a sample stage, a reflected illumination system for generating fluorescence from a sample, a transmitted illumination system for irradiating light on the sample to capture a transmitted optical image, a set of optical elements for forming the transmitted optical image on the basis of a phase information included in light transmitted through the sample, an optical element for dividing the fluorescence image and the transmitted optical image, a sensor for capturing the transmitted optical image divided by the optical element for dividing light, a focus detecting section for detecting a focusing level of the transmitted optical image on the basis of a signal output from the sensor, and a driver for moving at least one of the objective lens and the stage to focus on the sample on the basis of the focusing level.

Abstract: A focus detecting device includes a multi-beam producing member for emitting a plurality of light beams; a light-blocking member for blocking a part of the plurality of light beams; a beam splitting member having a surface for reflecting or transmitting an incident light beam; a light-condensing optical system for condensing the incident light beam; and a photodetector having at least two light-receiving sections. The multi-beam producing member and the light-blocking member are placed on a first optical path, and the light-condensing optical system and the photodetector are placed on a second optical path. The beam splitting member is located at the intersection of the optical axis of the first optical path with the optical axis of the second optical path, and the photodetector is located at a position where the light beam is condensed by the light-condensing optical system.

Abstract: An auto focus method for a microscope (2), and a system for adjusting a focus for the microscope (2), are disclosed. The microscope (2) possesses a microscope stage (18) and an objective (16) located in a working position. A relative motion in the Z direction takes place between the microscope stage (18) and the objective. Images are read in by the camera (20) during the relative motion, and a microscope control device (4) and a computer (6) are provided for evaluation and determination of the focus position.

Abstract: A process for displaying three-dimensional point distributions in a laser scanning microscope with a tiltable fine focusing stage, wherein an actual scanned first raster point distribution is compared with a computer-generated second raster point distribution, and the first raster points are utilized for display in the second raster point distribution when the raster points in both distributions correspond with one another, while intermediate values are formed from points of the first raster point distribution lying in the vicinity of second raster points when there is no correspondence, wherein the position of these intermediate values corresponds to the position of the second raster points, or a displacement of the X/Y-scanner of the microscope and/or of the stage tilting means is carried out in a particularly advantageous manner with reference to a computer-determined two- or three-dimensional raster point distribution in such a way that the scanned raster points in and/or on an object correspond completel

Abstract: A focus point detection device comprises an illuminator that illuminates a specimen obliquely by letting a light flux at an angle to an optical axis of an objective lens enter in such a way that the optical axis and the light flux cross each other in the vicinity of a point in focus at an object side of the objective lens, an image-forming device that forms an image of the observation plane by converging a light from the observation plane of the specimen via the objective lens and a light amount detector that detects amount of light in response to the image formed by the image-forming device with a light sensor, wherein the light amount detector detects a light other than a regular reflection light from a surface of the specimen. Also, a fluorescence microscope comprises the focus point detection device and the infinity objective lens.

Abstract: A microscope apparatus which is capable of quickly taking a clear image of a sample. A support base supports the sample and a microscope magnifies the sample. A line sensor acquires a line image of the magnified sample and an image processing device produces an image of the sample based on the line image acquired by the line sensor. The support base has an adjusting mechanism for adjusting a tilt thereof and a focal length of the microscope. Focusing is achieved by, means of a light-projecting device for projecting light onto the sample and a light-receiving device for receiving light reflected by the sample and determining a focal length based on deformation of the received light. The light is projected onto the sample at a position in the vicinity of a range on the sample to be imaged by the line sensor. A two-dimensional CCD sensor is used to obtain a two-dimensional image of the sample for setting an imaging region.

Abstract: A position adjusting means is provided at an outer periphery of an objective lens opposite to an observation sample and the observation sample is moved by the position adjusting means in an optical axis direction of the objective lens to set a focal point of the objective lens to the observation sample.

Abstract: An improved mounting apparatus for use in recording microscopic images with an image recording device, such as a camera or camcorder is provided. The apparatus is capable of readily aligning the optical axis of the image recording device and the optical axis of the microscope optical tube of the apparatus. Also provided are methods of using the device to observe, record and/or alter a specimen on which the apparatus is mounted. In addition, a microscope is provided which has simple but durable means for gross and fine focus adjustments. The microscope includes an optical tube for magnifying an image of a specimen to be viewed, and an optical tube sleeve in which the optical tube is rotatably and slideably retained. The optical tube includes a radial projection which is adapted to slide along the edge of the sleeve to grossly and finely adjust the focus of the microscope.

Abstract: A scanning electron microscope equipped with a laser defect detection function has an automatic focusing function that performs the steps of: obtaining a deviation (offset) amount between focal positions of an optical microscope and a scanning electron microscope; detecting a defect by a laser dark-field image of the optical microscope; analyzing the dark-field image to readjust a focus of the optical microscope to adjust a height of the optical microscope; and automatically adjusting a focus of the scanning electron microscope by adding a readjusted amount of the focus of the optical microscope to the offset amount before an observation is conducted by the scanning electron microscope.

Abstract: High speed, wide area microscopic scanning or laser positioning is accomplished with an inertia-less deflector (for example an acousto-optic or electro-optic deflector) combined with a high speed wide area microscopic scanning mechanism or laser positioner mechanism that has inertia, the motion of the inertia-less deflector specially controlled to enable a focused spot to stabilize, for example to stop and dwell or be quickly aimed. It leads to improved data acquisition from extremely small objects and higher speed operation. In the case of fluorescence reading of micro-array elements, dwelling of fluorophore-exciting radiation in a spot that is relatively large enables obtaining the most fluorescent photons per array element, per unit time, a winning criterion for reducing fluorophore saturation effects. The same inertia-less deflector performs stop and dwell scanning, edge detection and raster scans.

Abstract: An autofocus module for a microscope-based system includes at least two light sources, each of which generates a light beam for focusing. An optical directing device is provided that directs a respective portion of each light beam onto an incoupling means, which couples each of the light beams into the illuminating light beam of the microscope-based system and directs the light beams onto a specimen. A first and a second detector receive the light beams of the first and second light source reflected from the surface of the specimen, and ascertain the intensities on the first and second detector in time-multiplexed fashion.

Abstract: The apparatus for automatically focusing an image in a microscope includes onto an object plane includes an optical system configured to form an optical image of a sample plane to be observed, an autofocusing detection system, and a focus correction system. The autofocusing system includes an autofocusing light beam source for generating autofocusing light beams. The autofocusing system further includes a detection system lens for directing autofocusing light beams to an autofocusing detection device, and an autofocusing detection device for determining the amount of displacement of the image of the object plane from a desired focused reference plane. The focusing correction system includes a feedback controller and focus adjusting device for automatically adjusting the distance between an objective lens and the sample plane in order to properly focus the image in the optical system. A related method of automatically focusing an image of an object plane in a microscope.

Abstract: Disclosed herein is a stereomicroscope. The stereomicroscope comprises a microscope main body, a stand including a stand base portion on which a sample is to be laid, a support disposed vertically on the stand base portion, a focus adjust portion attached so as to be movable along the support, and an arm portion connected to the focus adjust portion for connecting the microscope main body thereto, so that the microscope main body is mounted on the stand to focus the sample, a light source lamp which illuminates the sample, and a light source unit in which the light source lamp is contained and which is attachable to at least one of the stand base portion, the support, and the arm portion.

Abstract: The invention is directed to an arrangement for confocal autofocusing of optical devices, preferably for fine focusing of microscopes, in which an illumination beam path is directed onto an observed object, and image information from the surface of the observed object as well as information about the focus position is obtained from the light that is reflected in an objective by the observed object and, based on this information, a correction of the focus position is carried out by means of an evaluating and adjusting unit. In a device of the type described herein, the image information and the information about the focus position are guided in different, spatially separated optical branches.

Abstract: The invention is directed to a microscope with multifunctional operator controls for operating a plurality of electrically controlled components such as objective turret, filter turret, diaphragms, focus, illumination devices, and so on. Since the number of microscope functions to be controlled far exceeds the number of operator controls which can be operated in an ergonomic manner, one of the available microscope functions can be selectively assigned to every operator control. Further, functions of externally connected devices such as image recording cameras or manipulators can also be assigned to the operator controls of the microscope.

Abstract: A scanning optical microscope using a wavefront converting element suffers minimum off-axis performance degradation and allows the wavefront converting element to be controlled by a simple method. Further, a pupil relay optical system is simple in arrangement or unnecessary. A laser scanning microscope includes a laser oscillator 6 and a wavefront converting element 5 for applying a desired wavefront conversion to a laser beam 15 emitted from the laser oscillator 6. An objective 7 collects a wavefront-converted approximately parallel laser beam 17 emerging from the wavefront converting element 5 onto a sample 9. A detector 29 detects signal light emitted from the sample 9. An actuator 8 scans the objective 7 along a direction perpendicular to the optical axis.

Abstract: A biochemical substance is efficiently observed with focusing accurately and rapidly on the substance disposed on an inside of a container. A focusing mark, which is used as a reference when a focal point of an optical system is adjusted, is disposed on the outside of a transparent bottom of each well in a micro plate. A focus-shift-distance corresponding to a distance between the mark and a desired position to be observed is determined. The optical system focuses on the mark, and then, the focal point the optical system is shifted by the focus-shift-distance. This shift allows an object to be focused on accurately and rapidly even when unclear images are obtained.

Abstract: A process for displaying three-dimensional point distributions in a laser scanning microscope with a tiltable fine focusing stage, wherein an actual scanned first raster point distribution is compared with a computer-generated second raster point distribution, and the first raster points are utilized for display in the second raster point distribution when the raster points in both distributions correspond with one another, while intermediate values are formed from points of the first raster point distribution lying in the vicinity of second raster points when there is no correspondence, wherein the position of these intermediate values corresponds to the position of the second raster points, or a displacement of the X/Y-scanner of the microscope and/or of the stage tilting means is carried out in a particularly advantageous manner with reference to a computer-determined two- or three-dimensional raster point distribution in such a way that the scanned raster points in and/or on an object correspond completel

Abstract: A drive mechanism includes a fine-movement ring provided at each of both ends of a fine-movement coupling shaft, disposed outside each of rough-movement handles, and having a smaller outside diameter than an outside diameter of each of the rough-movement handles, and a fine-movement handle detachably attached to at least one of the fine-movement rings.

Abstract: A method and apparatus for preventing excessive closure between a retractable tip objective and the stage of a microscope which includes positioning a sensor in the turret of a microscope, which sensor is capable of detecting excessive retracting of the retractable tip into the body of the objective, and providing a controller for monitoring the sensor for such excessive retracting and issuing an alert in response to the detection of an event of such excessive retracting. The alert may be made by way of an audio output, or by a visual cue or both. Extinguishing the lamp of the microscope is a preferred visual cue, as the excessive retracting of the retractable tip is generally caused by a focusing error, and the extinguishing of the light source reduces or eliminates the ability of the user of the microscope to focus the microscope, thus attracting his or her attention.

Abstract: Disclosed is a microscope for operation. This microscope for operation comprises a front lens 15 disposed between an eye 8 to be operated and an objective 12. The front lens collects an illuminating light P to guide the collected light within the eye for illuminating an interior of the eye. An operator performs an operation within the eye through an eyepiece 30. A refracting power of the front lens 15 is within a range of 30D to 50D.

Abstract: A microscope system is provided comprising a positioning system for positioning at least one microscope objective, an electronic camera unit, and an autofocus device for focusing the positioning system in response to a control signal. The electronic camera unit is comprised of at least one image sensor for generating an acquisition signal representing an acquired microscope image, and a control unit for generating a control signal from the acquisition signal. An autofocus algorithm is implemented in the control unit to generate the control signal from the acquisition signal.

Abstract: A confocal microscope for observing the image of an object to be observed by scanning a spot light for illuminating the object through an objective lens, comprises an aperture stop for adjusting the numerical aperture of the objective lens; and a control unit for calculating a contrast of the image of the object corresponding to each focal position while varying the focal position of the objective lens along the direction of the optical axis so as to determine the height of the unevenness on the surface of the object from a change of the contrast, thereby setting the aperture stop to have the focal depth substantially equal to the height of the unevenness.

Abstract: A microscope having a mirror for deflecting light from an illumination light source in a direction of an objective lens and illuminating a specimen via a condenser lens disposed above the mirror includes a stage support which is mounted on the upper surface of a base portion to permanently hold a stage, on which a specimen is placed, with respect to the optical axis direction of the objective lens, a condenser body mounted on the upper surface of the base portion, a condenser lens holding member for holding the condenser body, an elevating mechanism for vertically moving the condenser lens holding member, and a focusing mechanism for moving the objective lens in the optical axis direction.

Abstract: A microscope unit of the present invention comprises various optical units relating to a plurality of different microscopic methods, a revolver for an objective lens, to which at least one objective lens is attached, a focusing mechanism which moves the revolver for the objective lens in a direction of an optical axis and focuses the objective lens selectively inserted onto the optical axis, an illumination light source, electromotive actuators which are individually disposed on the various optical units, the revolver for the objective lens, and the focusing mechanism and in which an electromotive control can be carried out, one microscope observation tube in which the various optical units, the revolver for the objective lens, and the focusing mechanism are integrally incorporated, and an attachment portion which is disposed on the microscope observation tube and which is attachable/ detachable with respect to supports of various test apparatuses.

Abstract: An inverted microscope has a microscope base, a stage, an observation optical system, a stage support structure which is arranged on the microscope base and supports the stage, and a switching structure having a plurality of objective lenses and capable of inserting one of the objective lenses into an optical path of the observation optical system selectively. A support structure is fixed to a lower surface of the stage and supports the switching structure for movement in an optical axis direction of the objective lens inserted in the optical path of the observation optical system.

Abstract: Apparatus and methods that improve the depth resolution of confocal microscopy images using out-of-focus information from within the focal plane of interest (from the x-y direction) and/or from planes above and below the focal plane of interest (from the z-direction). The interaction of (a) a reflective surface or other light-emanating material and (b) the PSF formed by a confocal microscope results in “out-of-focus” information in, above and below the focal plane; this “out-of-focus” information can be measured. Comparing the measurements in the x-y plane, preferably at a plurality of z-positions, can improve the resolution along each of the x, y, and z-axes, increase the number of the photons used in the system, thus improving the signal to noise ratio, and help correct for aberrations, such as spherical aberrations or other optical aberrations, in the optical system of a microscope.

Abstract: A method and apparatus for three dimensional optical microscopy is disclosed which employs dual opposing objective lenses about a sample and extended incoherent illumination to provide enhanced depth or Z-direction resolution. In a first embodiment, observed light from both objective lenses are brought into coincidence on an image detector and caused to interfere thereon by optical path length adjustment. In a second embodiment, illuminating light from an extended incoherent light source is detected to the sample through both objective lenses and caused to interfere with a section of the sample by adjusting optical path lengths. Observed light from one objective lens is then recorded. In a third embodiment, which combines the first two embodiments, illuminating light from an extended incoherent light source is directed to the sample through both objective lenses and caused to interfere within a section of the sample by adjusting optical path lengths.