Abstract: A memory module includes a substrate, plural memory devices, and a buffer. The plural memory devices are organized into at least one rank, each memory device having plural banks. The buffer includes a primary interface for communicating with a memory controller and a secondary interface coupled to the plural memory devices. For each bank of each rank of memory devices, the buffer includes data buffer circuitry and address buffer circuitry. The data buffer circuitry includes first storage to store write data transferred during a bank cycle interval (tRR). The address buffer circuitry includes second storage to store address information corresponding to the data stored in the first storage.

Abstract: A processing device in a memory sub-system initiates read operations on each of a plurality of segments in a first region of the memory device during a first time interval, wherein at least a subset of the plurality of segments in the first region of the memory device are storing host data. The processing device further receives, as a result of at least one read operation, at least one data signal from a corresponding one of the plurality of segments in the first region of the memory device, and performs a signal calibration operation using the at least one data signal to synchronize one or more relevant signals with a reference clock signal used by the processing device.

Abstract: A storage device including a nonvolatile memory device including memory blocks and a controller connected with the nonvolatile memory device through data input and output lines and a data strobe line may be provided. The nonvolatile memory device and the controller may be configured to perform training on the data input and output lines by adjusting a delay of a data strobe signal sent through the data strobe line and adjust delays of the data input and output lines based on the training result.

Abstract: Methods, systems, and apparatuses related to memory operation with multiple sets of latencies are disclosed. A memory device or system that includes a memory device may be operable with one or several sets of latencies (e.g., read, write, or write recovery latencies), and the memory device or system may apply a set of latencies depending on which features of the memory device are enabled. For example, control circuitry may be configured to enable one or more features during operations on a memory array, and the control circuitry may apply a set of latency values based on a number or type of features that are enabled. The sets of latency values may depend, for example, on whether various control features (e.g., dynamic voltage frequency scaling) are enabled, and a device may operate within certain frequency ranges irrespective of other characteristics (e.g., mode register values) or latencies applied.

Abstract: Apparatuses and methods for writing and storing parameter codes for operating parameters, and selecting between the parameter codes to set an operating condition for a memory are disclosed. An example apparatus includes a first mode register and a second mode register. The first mode register is configured to store first and second parameter codes for a same operating parameter. The second mode register is configured to store a parameter code for a control parameter to select between the first and second parameter codes to set a current operating condition for the operating parameter. An example method includes storing in a first register a first parameter code for an operating parameter used to set a first memory operating condition, and further includes storing in a second register a second parameter code for the operating parameter used to set a second memory operating condition.

Abstract: Apparatuses, systems, and methods for counter based read clocks in stacked memory devices. An interface die provides a read command to a core die, which reads data with timing based on the read command provides that data to a read FIFO circuit of the core die. A delay time after providing the read command, the interface die begins providing a counter-based clock signal which operates an output of the read FIFO. The counter-based clock signal operates on a different time domain (e.g., a faster frequency) than the timing of the read command.

Abstract: A memory bank includes at least one storage module, each storage module including a read-write control circuit, a column decoding circuit and a plurality of storage arrays, the plurality of storage arrays being divided into a first unit and a second unit; a first decoding selective signal line, electrically connected to the column decoding circuit and the storage arrays in the first unit; a second decoding selective signal line, electrically connected to the column decoding circuit and the storage arrays in the second unit; a first data signal line; and a second data signal line.

Abstract: A data transmission circuit includes: a comparison circuit, configured to compare received first data on a data bus with received second data on a global data line and output a comparison result of whether a number of different bits between the first data and the second data exceeds a preset threshold; a data conversion circuit, configured to: if the comparison result indicates that the number of different bits exceeds the preset threshold, invert the first data and transmit the inverted first data to the global data line, and otherwise, transmit the first data to the global data line; and a read-write conversion circuit, configured to: if the comparison result indicates that the number of different bits exceeds the preset threshold, transmit data on the global data line to a complementary local data line, and otherwise, transmit data on the global data line to a local data line.

Abstract: This application relates to a data transmission circuit, method, and storage devices. The comparison module compares the bus data on the data bus with the global data on the global data line, and the comparison result shows whether the number of bits that are different from the global data on the output bus data exceeds the preset threshold, which is set based on the comparison result. When the comparison result exceeds the preset threshold, a first data conversion module inverts the bus data and provides it to the data bus buffer module, and when the comparison result does not exceed the preset threshold, the bus data is provided to the data bus buffer module. The data bus buffer module generates a data polarity identification signal according to the comparison result, and transmit the bus data or the inverted data of the bus data to the global data line.

Abstract: The present disclosure relates to the technical field of integrated circuits, and specifically to a delay-locked loop, a control method for a delay-locked loop, and an electronic device. The delay-locked loop includes: a secondary path configured to perform frequency division on an input clock signal to generate a frequency-divided clock signal, adjust the frequency-divided clock signal having a first frequency to obtain an output clock signal in a locking process of the delay-locked loop, and adjust the frequency-divided clock signal to make the frequency-divided clock signal have a second frequency when the delay-locked loop is locked in a standby state, wherein the second frequency is lower than the first frequency; and a primary path configured to output, when obtaining a target instruction, an output clock replica signal having a same phase as the output clock signal.

Abstract: Aspects of a storage device are provided that allow a controller to leverage cache to minimize occurrence of HMB address overlaps between different HMB requests. The storage device may include a cache and a controller coupled to the cache. The controller may store in the cache, in response to a HMB read request, first data from a HMB at a first HMB address. The controller may also store in the cache, in response to an HMB write request, second data from the HMB at a second HMB address. The controller may refrain from processing subsequent HMB requests in response to an overlap of the first HMB address with an address range including the second HMB address, and the controller may resume processing the subsequent HMB requests after the first data is stored. As a result, turnaround time delays for HMB requests may be reduced and performance may be improved.

Abstract: Apparatuses and methods for writing and storing parameter codes for operating parameters, and selecting between the parameter codes to set an operating condition for a memory are disclosed. An example apparatus includes a first mode register and a second mode register. The first mode register is configured to store first and second parameter codes for a same operating parameter. The second mode register is configured to store a parameter code for a control parameter to select between the first and second parameter codes to set a current operating condition for the operating parameter. An example method includes storing in a first register a first parameter code for an operating parameter used to set a first memory operating condition, and further includes storing in a second register a second parameter code for the operating parameter used to set a second memory operating condition.

Abstract: A semiconductor device including a FIFO circuit in which a data capacity can be increased while minimizing an increase in a circuit scale is provided. The semiconductor device includes a single-port type storage unit (11) which stores data, a flip-flop (12) which temporarily stores write data (FIFO input) or read data (FIFO output) of the storage unit (11), and a control unit (14, 40) which controls a write timing of a data signal, which is stored in the flip-flop (12), to the storage unit (11) or a read timing of the data signal from the storage unit to avoid an overlap between a write operation and a read operation in the storage unit (11).

Abstract: A processing device in a memory sub-system initiates read operations on each of a plurality of segments in a first region of the memory device during a first time interval, wherein at least a subset of the plurality of segments in the first region of the memory device are storing host data. The processing device further receives, as a result of at least one read operation, at least one data signal from a corresponding one of the plurality of segments in the first region of the memory device, and performs a signal calibration operation using the at least one data signal to synchronize one or more relevant signals with a reference clock signal used by the processing device.

Abstract: The present disclosure includes apparatuses and methods related to memory topologies. An apparatus may include a first plurality of clam-shell paired memory devices arranged in a star connection topology, each clam-shelled pair of the first plurality of memory devices being coupled by a respective matched branch to a first common command address signal trace. The apparatus may include a second plurality of memory devices coupled to a second common command address signal trace.

Abstract: In one embodiment, the present disclosure includes multichip timing synchronization circuits and methods. In one embodiment, hardware counters in different systems are synchronized. Programs on the systems may include synchronization instructions. A second system executes synchronization instruction, and in response thereto, synchronizes a local software counter to a local hardware counter. The software counter on the second system may be delayed a fixed period of time corresponding to a program delay on the first system. The software counter on the second system may further be delayed by an offset to bring software counters on the two systems into sync.

Abstract: The timing of the synchronous interface is controlled by a dock signal driven by a controller. The clock is toggled in order to send a command to a memory device via the interface. If there are no additional commands to be sent via the interface, the controller suspends the clock signal. When the memory device is ready, the memory device drives a signal back to the controller. The timing of this signal is not dependent upon the clock signal. Receipt of this signal by the controller indicates that the memory device is ready and the clock signal should be resumed so that a status of the command can be returned via the interface, or another command issued via the interface.

Abstract: A method and an apparatus for testing a memory are provided, and the method is adapted for an electronic apparatus to test the memory. In the method, a left edge and a right edge of a first waveform of a clock signal for testing the memory are scanned to obtain a maximum width between two cross points of the left edge and the right edge. A central reference voltage of a data signal outputted by the memory is obtained, and a data width between two cross points of the central reference voltage and a left edge and a right edge of a second waveform of the data signal is obtained. Whether a difference between the data width and the maximum width is greater than a threshold is determined; if the difference is greater than the threshold, the memory is determined to be damaged.

Abstract: A semiconductor apparatus includes a phase detecting unit that continuously detects a first delay amount during a read operation, based on a phase difference between an external clock signal and an internal clock signal; a generating unit that generates a second control signal by delaying a first control signal by a second delay amount that when added to the first delay amount, the sum is a specific time period, a valid time period of the first control signal starts when the read operation starts and is at least to equal a read time for one data signal and less than the specific time period that is from the start of the read operation until output of a received data signal; and a delay control unit that delays the data signal by the first delay amount detected at a start of a valid time period of the generated second control signal.

Abstract: An 8T memory bit cell receives a clock signal and read and write address signals. A read address latch/clock circuit receives the clock signal and the read address signals and initiates a read operation during a first clock cycle state. A write address flip-flop/clock circuit receives the clock signal and the write address signals and initiates a write operation during a second clock cycle state. An inverter receives and inverts the clock signal and applies the inverted clock signal to the write address flip-flop/clock circuit. The read address latch/clock circuit initiates a read word line precharge operation during the second clock cycle state and a write word line precharge operation during the first clock cycle state. The write address flip-flop/clock circuit may also include a loose self-timer to end a write cycle is a clock signal continues beyond a predetermined time.

Abstract: A method for reading data from a plurality of DRAM devices connected to common command, address, and data busses. A clock signal is provided to the plurality of DRAM devices. A read command and address to the plurality of DRAM devices on the command and address busses in synchronization with the clock signal. A read clock signal is provided to the plurality of DRAM devices to initiate a read operation in one of the plurality of DRAM devices that is selected by the address. The one DRAM device delays the read clock signal by an amount based on a speed of the one of the plurality of DRAM devices to generate. First delayed read clock and second delayed read clock signals are provided. The read data is received on the data bus in synchronization with the second delayed read clock signal.

Abstract: In various embodiments an integrated circuit or chip is provided, the integrated circuit including a memory device including a plurality of memory cells, and with the memory cells being configured to store a data content, and a controller being configured to write a predefined data pattern in the memory cells of the memory device, reading the data content of the memory cells, mapping each read data content which corresponds to an expected data content depending on the predefined data pattern to a predefined instruction for the controller, with the predefined instruction causing the controller to carry out a predefined action which is representative for the accurate operation of the memory cells, determining that the memory device operates accurately, if the controller carries out the predefined action, and determining that the memory device does not operate accurately, if the controller does not carry out the predefined action.

Abstract: A semiconductor memory apparatus including a test circuit configured for generating compressed data by comparing and compressing data stored in a plurality of memory cells inside a memory bank during a first test mode, and configured for outputting the compressed data as test data to an input/output pad through one selected global line during the first test mode, and the test circuit is configured for transmitting the compressed data to a plurality of global lines during a second test mode, combining the compressed data loaded in the respective global lines during the second test mode, and outputting the combination result as the test data to the input/output pad during the second test mode.

Abstract: A memory control module includes a read module configured to receive a first signal read from a first storage region of a memory cell, and receive a second signal read from a second storage region of the memory cell. A data detection module is configured to, based on a noiseless signal, detect respective data in each of the first storage region and the second storage region. The noiseless signal includes an ideal signal and an interference signal associated with at least one of the first signal and the second signal.

Abstract: Methods and systems for detection and correction of timing signal drift in memory systems are provided. A start time and an end time of a first time interval is determined with control circuitry such that a last falling edge in a first of a plurality of data strobe sequences received from the memory occurs outside of the first time interval. A start time and an end time of a close-enable time interval is adjusted based at least in part on determining whether a second of the plurality of data strobe sequences occurs within the first time interval. Sampling of data received from the memory is disabled in response to determining that the last falling edge in the second received data strobe sequence occurs within the close-enable time interval.

Abstract: A method and circuit for implementing faster-cycle-time and lower-energy write operations for Synchronous Dynamic Random Access Memory (SDRAM), and a design structure on which the subject circuit resides are provided. A first RAS (row address strobe) to CAS (column address strobe) command delay (tRCD) is provided to the SDRAM for a read operation. A second delay tRCD is provided for a write operation that is substantially shorter than the first delay tRCD for the read operation.

Abstract: Various method and apparatus embodiments for training a delay for enabling a data strobe signal in a memory subsystem are disclosed. In one embodiment, a system includes a memory controller configured to receive a data strobe signal. The memory controller includes a training circuit. The training circuit includes a first storage circuit coupled to receive the data strobe signal on a data input and an enable signal on a clock input, and a training unit configured to, based on an output signal received from the first flip-flop, adjust a phase of the enable signal until an assertion of the enable signal coincides with a preamble indication in the data strobe signal.

Abstract: In one embodiment, the invention is a hybrid superconducting-magnetic memory cell and array. One embodiment of a memory cell includes a magnetoresistive element and at least one superconducting element wired in parallel with the magnetoresistive element. In a further embodiment, memory cells of the disclosed configuration are arranged to form a memory array.

Abstract: A memory operative to provide concurrent two-port read and two-port write access functionality includes a memory array comprising first and second pluralities of single-port memory cells organized into a plurality of rows of memory banks, and multiple checksum modules. The second plurality of memory cells are operative as spare memory banks. Each of the checksum modules is associated with a corresponding one of the rows of memory banks. The memory further includes a first controller and multiple mapping tables. The first controller and at least a portion of the first and second pluralities of memory cells enable the memory array to support two-port read or single-port write operations. A second controller is operative to receive read and write access requests, and to map logical and spare memory bank identifiers to corresponding physical memory bank identifiers via the mapping tables to thereby emulate concurrent two-port read and two-port write access functionality.

Abstract: Within a non-volatile memory device, a read operation directed to a nonvolatile memory cell having a positive threshold voltage applies a positive read voltage to a selected word line and a first control signal to a page buffer connected to a selected bit line, but if the memory cell has a negative threshold voltage the read operation applies a negative read voltage to the selected word line and a second control signal to the page buffer different from the first control signal.

Abstract: A system for determining the logic state of a resistive memory cell element, for example an MRAM resistive cell element. The system includes a controlled voltage supply, an electronic charge reservoir, a current source, and a pulse counter. The controlled voltage supply is connected to the resistive memory cell element to maintain a constant voltage across the resistive element. The charge reservoir is connected to the voltage supply to provide a current through the resistive element. The current source is connected to the charge reservoir to repeatedly supply a pulse of current to recharge the reservoir upon depletion of electronic charge from the reservoir, and the pulse counter provides a count of the number of pulses supplied by the current source over a predetermined time. The count represents a logic state of the memory cell element.

Abstract: A system including a read module and a sequence detector module. The read module is configured to read a plurality of memory cells located along a bit line or a word line of a memory array and to generate a plurality of read signals. The sequence detector module is configured to detect a sequence of data stored in the plurality of memory cells based on (i) the plurality of read signals and (ii) a plurality of reference signals associated with the plurality of memory cells. One of the plurality of reference signals associated with a first memory cell of the plurality of memory cells includes (i) a first signal and (ii) a second signal. The first signal is free of interference from a second memory cell adjacent to the first memory cell along the bit line or the word line. The second signal includes interference from the second memory cell.

Abstract: In a method of reading a nonvolatile memory device, the method comprising, a reading operation of reading data of a selected memory cell; and a read retry operation of performing one or more read operations by changing a non-selection read voltage applied to non-selected memory cells until the read operation succeeds, when it is detected that an error has occurred in the operation of reading data.

Abstract: Circuits and techniques for operating a memory circuit are disclosed. A disclosed circuit includes a memory circuit and a sleep circuit with an output terminal coupled to the memory circuit. The sleep circuit is operable to receive a control signal and further operable to place the memory circuit in different modes of operation. The memory circuit may be placed in either a first mode of operation, a second mode of operation or a third mode of operation based at least partly on the control signal. An input terminal of the sleep circuit is coupled to an output terminal of the control circuit. The control circuit is operable to receive an enable signal and is operable to supply the control signal to the sleep circuit at first, second and third voltage levels during the first, second and third modes of operation, respectively, based on the enable signal and a clock signal.

Abstract: Disclosed herein is a device that includes a plurality of stacked core chips and an interface chip that controls the core chips. Each of the core chips includes a memory cell array, a penetration electrode, and an output circuit that outputs read data that are read from the memory cell array to the penetration electrode. The penetration electrode respectively provided in the core chips are commonly connected with each other, and the output circuits respectively provided in the core chips are activated in response to a read clock signal supplied from the interface chip.

Abstract: Some embodiments include methods of reading memory cells. The memory cells have a write operation that occurs only if a voltage of sufficient absolute value is applied for a sufficient duration of time; and the reading is conducted with a pulse that is of too short of a time duration to be sufficient for the write operation. In some embodiments, the pulse utilized for the reading may have an absolute value of voltage that is greater than or equal to the voltage utilized for the write operation. In some embodiments, the memory cells may comprise non-ohmic devices; such as memristors and diodes.

Abstract: Circuits, methods, and apparatus for memory interfaces that compensate for skew between a clock signal and DQ/DQS signals that may be caused by a fly-by routing topology. The skew is compensated by clocking the DQ/DQS signals with a phase delayed clock signal, where the phase delay has been calibrated. In one example calibration routine, a clock signal is provided to a receiving device. A DQ/DQS signal is also provided and the timing of their reception compared. A delay of the DQ/DQS signal is changed incrementally until the DQ/DQS signal is aligned with the clock signal at the receiving device. This delay is then used during device operation to delay a signal that clocks registers providing the DQ/DQS signals. Each DQ/DQS group can be aligned to the clock, or the DQS and DQ signals in a group may be independently aligned to the clock at the receiving device.

Abstract: A synchronous type semiconductor storage device includes an array unit which includes a cell array and sense amplifiers. The synchronous type semiconductor storage device includes a read/write pulse generator which generates a read pulse signal and a write pulse signal according to a clock signal, the clock signal defining one cycle time of a read operation and a write operation with respect to the array unit as one cycle. The synchronous type semiconductor storage device includes a secondary amplifier which is activated according to the read pulse signal to read out data stored in the sense amplifiers through the read/write line. The synchronous type semiconductor storage device includes a write driver which is activated according to the write pulse signal to write data in the sense amplifiers through the read/write line.

Abstract: The present disclosure includes methods, and circuits, for operating a memory device. One method embodiment for operating a memory device includes controlling data transfer through a memory interface in an asynchronous mode by writing data to the memory device at least partially in response to a write enable signal on a first interface contact, and reading data from the memory device at least partially in response to a read enable signal on a second interface contact. The method further includes controlling data transfer in a synchronous mode by transferring data at least partially in response to a clock signal on the first interface contact, and providing a bidirectional data strobe signal on an interface contact not utilized in the asynchronous mode.

Abstract: A non-volatile memory device is operated by outputting data in response to an alternating sequence of first and second edges of a read control signal, respectively. A determination is made whether the read control signal and a write control signal are in synchronization at one of the first edges. Output of the data is stopped at the second edge that follows the one of the first edges of the read control signal if the read control signal and the write control signal are in synchronization at the one of the first edges.

Abstract: A memory cell includes a storage element, a write circuit coupled to the storage element and a read circuit coupled to the storage element. At least a portion of the storage element and at least a portion of the write circuit are fabricated using a thicker functional gate oxide and at least a portion of the read circuit is fabricated using a thinner functional gate oxide.

Abstract: In at least one embodiment, a multiplexer has a plurality of sub-circuits, and each of the plurality of sub-circuits has a first transistor, a second transistor, and a third transistor. Drains of the first transistors are coupled with a first terminal of a fourth transistor, and drains of the second transistors are coupled with a second terminal of the fourth transistor. In at least one embodiment, a method of outputting data using the multiplexer includes turning on the second transistor of a selected one of the plurality of sub-circuits responsive to a clock signal and address information. The second transistor of a non-selected one of the plurality of sub-circuits is turned off. The fourth transistor is turned on responsive to the clock signal.

Abstract: Integrated circuits may communicate with off-chip memory. Such types of integrated circuits may include memory interface circuitry that is used to interface with the off-chip memory. The memory interface circuitry may be calibrated using a procedure that includes read calibration, write leveling, read latency tuning, and write calibration. Read calibration may serve to ensure proper gating of data strobe signals and to center the data strobe signals with respect to read data signals. Write leveling ensures that the data strobe signals are aligned to system clock signals. Read latency tuning serves to adjust read latency to ensure optimum read performance. Write calibration may serve to center the data strobe signals with respect to write data signals. These calibration operations may be used to calibrate memory systems supporting a variety of memory communications protocols.

Abstract: An interleaved memory circuit includes a memory bank including at least one first memory cell for storing a charge representative of a first datum, the first memory cell being coupled with a first word line and a first bit line. The interleaved memory circuit further includes a local control circuit coupled with the memory bank. The interleaved memory circuit further includes a global control circuit coupled with the local control circuit, an interleaving access including a clock signal having a first cycle and a second cycle for accessing the first memory cell, where the second cycle is capable of enabling the local control circuit to trigger a first transition of a first read column select signal RSSL for accessing the first memory cell.

Abstract: In one embodiment, the invention is a hybrid superconducting-magnetic memory cell and array. One embodiment of a memory cell includes a magnetoresistive element and at least one superconducting element wired in parallel with the magnetoresistive element. In a further embodiment, memory cells of the disclosed configuration are arranged to form a memory array.

Abstract: Methods and systems for detection and correction of timing signal drift in memory systems are provided. A start time and an end time of a first time interval is determined with control circuitry such that a last falling edge in a first of a plurality of data strobe sequences received from the memory occurs outside of the first time interval. A start time and an end time of a close-enable time interval is adjusted based at least in part on determining whether a second of the plurality of data strobe sequences occurs within the first time interval. Sampling of data received from the memory is disabled in response to determining that the last falling edge in the second received data strobe sequence occurs within the close-enable time interval.

Abstract: A Dynamic Random Access Memory (DRAM) performs read, write, and refresh operations. The DRAM includes a plurality of sub-arrays, each having a plurality of memory cells, each of which is coupled with a complementary bit line pair and a word line. The DRAM further includes a word line enable device for asserting a selected one of the word lines and a column select device for asserting a selected one of the bit line pairs. A timing circuit is provided for controlling the word line enable device, the column select device, and the read, write, and refresh operations in response to a word line timing pulse. The read, write, and refresh operation are performed in the same amount of time.

Abstract: Low supply voltage memory apparatuses are presented. In one embodiment, a memory apparatus comprises a memory and a memory controller. The memory controller includes a read controller. The read controller prevents a read operation to a memory location from being completed, for at least N clock cycles after a write operation to the memory location, where N is the number of clock cycles for the memory location to stabilize after the write operation.

Abstract: A burst read control circuit acts as an interface to allow a burst-read capable device to execute burst reads from a page-mode capable memory device. The burst read control circuit coordinates burst read requests from the burst-read capable device and subsequent responses from the page-mode capable memory device by accessing subsequent and contiguous memory locations of the page-mode capable memory device.

Abstract: A multiplexing circuit includes a plurality of first circuits and a second circuit coupled to outputs of the plurality of first circuits. A first circuit of the plurality of first circuits is configured to receive a first data line as a first input and a clock signal as a second input, and provide an output signal to a first circuit output. After the first circuit is selected for use, the clock signal, a first sub-circuit of the first circuit coupled to the second circuit, and the second circuit are configured to provide a first output logic level to the output signal based on a first data logic level of the first data line; and a second sub-circuit of the first circuit coupled to the first circuit output is configured to provide a second output logic level to the output signal based on a second data logic level of the first data line.