Abstract: Techniques for programming a non-volatile memory device, such as a Flash memory, include floating source lines of memory cells based on a data pattern that is being programmed to the memory device. The source lines to float are selected such that a distance between drain bit lines and source bit lines of different memory cells in a row is maximized. In this manner, leakage current between these drain bit lines and source bit lines can be decreased.

Abstract: Non volatile memories and methods of programming thereof are disclosed. In one embodiment, the method of programming a memory array includes receiving a series of data blocks, each data block having a number of bits that are to be programmed, determining the number of bits that are to be programmed in a first data block, determining the number of bits that are to be programmed in a second data block, and writing the first data block and the second data block into the memory array in parallel if the sum of the number of bits that are to be programmed in the first data block and the second data block is not greater than a maximum value. The first and second data blocks may or may not be adjacent data blocks. Improved programming efficiency may be achieved in a memory circuit when the maximum allowable current may be limited by the application or the size of a charge pump. Inverse data may be written in parallel if the sum is greater than the maximum value.

Abstract: A semiconductor memory device capable of reducing off-current in a standby mode is provided. The semiconductor memory device includes an enable signal generating unit configured to receive a plurality of address decoding signals and generate a first enable signal to select a first cell block and a second enable signal to select a second cell block, and an internal voltage generating unit for generating an internal voltage by controlling a supply of a first voltage in accordance with the first or second enable signals.

Abstract: The addressing circuit of a semiconductor memory device includes a plurality of register units coupled to an input unit and a plurality of memory cell arrays, wherein the plurality of register units are configured to store inputted data in response to register control signals, and a control unit configured to generate the register control signals, using defect information of respective memory cell arrays, to control whether or not the register units store the inputted.

Abstract: The read channel of a solid state non-volatile memory may be configured to compensate for shifts in the threshold voltages of memory cells of the memory. A log of write time information and write temperature information from one or more write operations is stored in a data unit header. The read channel configuration, which may include reference voltages used for the read operation, is determined using the write time information and the write temperature information. Memory cells of the data unit are read using the configured read channel. A historical profile spanning multiple write operations may also be developed and used to configure the read channel.

Abstract: A layout for simultaneously sub-accessible memory modules is disclosed. In one embodiment, a memory module includes a printed circuit board having a plurality of sectors, each sector being electrically isolated from the other sectors and having a multi-layer structure. At least one memory device is attached to each sector, the memory devices being organized into a plurality of memory ranks. A driver is attached to the printed circuit board and is operatively coupled to the memory ranks. The driver is adapted to be coupled to a memory interface of the computer system. Because the sectors are electrically-isolated from adjacent sectors, the memory ranks are either individually or simultaneously, or both individually and simultaneously accessible by the driver so that one or more memory devices on a particular sector may be accessed at one time.

Abstract: A semiconductor memory device includes a memory cell array, a page buffer, a data line pair, a differential amplifier and a precharger. The memory cell array includes a plurality of pages in which a plurality of memory cells are arranged. The page buffer is formed adjacent to the memory cell array, and includes a plurality of sense amplifiers configured to temporarily hold page data read from the memory cells in the page. The data line pair is arranged in the page buffer and is connected to the sense amplifiers. The differential amplifier is configured to amplify a potential difference between lines of the data line pair. The precharger is configured to precharge the data line pair to a predetermined potential. At least one of the differential amplifier and the precharger is formed in the page buffer, and the at least one circuit is electrically connected to the data line pair.

Abstract: Dual I/O data read is performed in an integrated circuit which includes a serial peripheral interface memory device. In one example, a second page read address is transmitted to the memory device using a first input pin and a second input pin concurrently, while transferring data from the memory device associated with a first page read address using a first output pin and a second output pin concurrently. The first page read address is associated with a first location in the memory device and the second page read address is associated with a second location in the memory device.

Abstract: An N-dimension addressable memory is disclosed. The memory includes an N-dimension array of bit ceils and logic configured to address each bit cell using N-Dimension Addressing (NDA), where N is at least two and the array of bit cells is addressable by N orthogonal address spaces. Each bit cell of the N-dimension addressable memory includes a bit storage element, N word lines, and N bit lines.

Abstract: An integrated circuit and method for modifying data by compressing the data in third dimensional memory technology is disclosed. In a specific embodiment, an integrated circuit is configured to perform compression of data disposed in third dimensional memory. For example, the integrated circuit can include a third dimensional memory array configured to store an input independent of storing a compressed copy of the input, a processor configured to compress the input to form the compressed copy of the input, and a controller configured to control access between the processor and the third dimensional memory array. The third dimension memory array can include one or more layers of non-volatile re-writeable two-terminal cross-point memory arrays fabricated back-end-of-the-line (BEOL) over a logic layer fabricated front-end-of-the-line (FEOL). The logic layer includes active circuitry for data operations (e.g., read and write operations) and data compression operations on the third dimension memory array.

Abstract: A flash memory device having at least two bank, where the each bank has an independently configurable page size and core controller. The core controller is local to each bank, and governs memory access operations for the bank that include read, program and erase operations. Each core controller controls timing and activation of row circuits, column circuits, voltage generators, and local input/output path circuits for a corresponding memory access operation of the bank. Concurrent operations are executable in multiple banks to improve performance. Each bank has a page size that is configurable with page size configuration data such that only selected wordlines are activated in response to address data. The configuration data can be loaded into the memory device upon power up for a static page configuration of the bank, or the configuration data can be received with each command to allow for dynamic page configuration of the bank.

Abstract: An N-dimension addressable memory. The memory includes an N-dimension array of bit cells and logic configured to address each bit cell using N-Dimension Addressing (NDA), where N is at least two and the array of bit cells is addressable by N orthogonal address spaces. Each bit cell of the N-dimension addressable memory includes a bit storage element, N word lines, and N bit lines.

Abstract: A method of programming data in a flash memory device is disclosed. The memory device includes a memory cell array which in turn includes at least one block, and the block in turn includes a plurality of pages. A program command to program a plurality of pages in the block is received. The plurality of pages is programmed in a predefined order. An address corresponding to a page that was programmed last amongst the plurality of pages is stored.

Abstract: A method for reading a nonvolatile memory array including an array of memory cells, each memory cell including a substrate, a control gate, a charge storage element, a source region and a drain region, includes receiving, at an address register, a read command including an address for a memory cell in the array of memory cells and an indication regarding whether the read command is a full page read command or a partial page read command. A starting address for a page including the received address is identified, wherein the page includes multiple rows of memory cells in the array of memory cells. The address register is reset to the starting address for the page. It is determined whether all memory cells in the page are non-programmed. Data indicative of a non-programmed state of the page is output if it is determined that all memory cells in the page are non-programmed.

Abstract: The invention includes a system and method of modifying a setting of a NAND flash memory device using serial peripheral interface (SPI) communication from a master to the NAND flash memory device. One embodiment generally includes sending an enable signal to a first memory circuit input, sending a clock signal to a second memory circuit input, sending a command signal synchronized to the clock signal to a third memory circuit input, sending a memory register address signal synchronized to the clock signal to the third memory circuit input, and sending a setting signal synchronized to the clock signal to the third memory circuit input.

Abstract: A nonvolatile ferroelectric memory immediately outputs data stored in a page buffer without performing a cell access operation when a page buffer is accessed. Since a block page address region and a column page address region are arranged in less significant bit region, and a row address region is arranged in more significant bit region, the cell operation is not performed in the access of the page address buffer, thereby improving reliability of the cell and reducing power consumption.

Abstract: A semiconductor memory device capable of reducing off-current in a standby mode is provided. The semiconductor memory device includes an enable signal generating unit configured to receive a plurality of address decoding signals and generate a first enable signal to select a first cell block and a second enable signal to select a second cell block, and an internal voltage generating unit for generating an internal voltage by controlling a supply of a first voltage in accordance with the first or second enable signals.

Abstract: Methods, devices and systems for reducing the quantity of external interconnections of a memory device are disclosed. Implementation of one such method, device and system includes inputting over an address bus a first portion of an address of a next row of memory cells to be activated. The first portion of the address of the next row of memory cells to be activated is embedded in a command related to the previously activated row of memory cells. The next row of memory cells is subsequently activated according to a concurrently received second portion of the address of the next row of memory cells also received over the address bus. The portioning of the address signals can reduce the width of the address bus and, therefore, the number of required respective external interconnections.

Abstract: A method of programming data in a flash memory device is disclosed. The memory device includes a memory cell array which in turn includes at least one block, and the block in turn includes a plurality of pages. A program command to program a plurality of pages in the block is received. The plurality of pages is programmed in a predefined order. An address corresponding to a page that was programmed last amongst the plurality of pages is stored.

Abstract: An integrated circuit including a memory module having a plurality of memory banks is disclosed. One embodiment provides an even number of at least four memory banks. Each memory bank has a plurality of memory cells. Each two of the memory bank form a memory bank region and being alternately connected to an m-bit data bus. The memory banks are classified into two groups, each group including a memory bank of each memory bank region. The memory module further includes a selection device connected to the memory banks and being responsive to selection bits. The selection device selects one of the two groups of memory banks and a group of i memory cells within the memory banks of the selected group of memory banks to access the selected i memory cells per one stroke via the associated m-bit data buses of the memory groups including the selected memory banks, m being equal to an integer multiple of i.

Abstract: Phase-change memory (PCM) cells store data using alloy resistors in high-resistance amorphous and low-resistance crystalline states. The time of the memory cell's set-current pulse can be 100 ns, much longer than read or reset times. The write time thus depends on the write data and is relatively long. A page-mode caching PCM device has a lookup table (LUT) that caches write data that is later written to an array of PCM banks. Host data is latched into a line FIFO and written into the LUT, reducing write delays to the relatively slow PCM. Host read data can be supplied by the LUT or fetched from the PCM banks. A multi-line page buffer between the PCM banks and LUT allows for larger block transfers using the LUT. Error-correction code (ECC) checking and generation is performed for data in the LUT, hiding ECC delays for data writes into the PCM banks.

Abstract: An integrated circuit including an array of memory cells, a circuit, volatile storage, and non-volatile storage. The circuit is configured to detect defective memory cells in the array of memory cells and provide addresses of the defective memory cells. The volatile storage is configured to store the addresses, where each entry in the volatile storage includes one of the addresses and a volatile storage master bit. The non-volatile storage is configured to store the addresses, where each entry in the non-volatile storage includes one of the addresses and a non-volatile storage master bit.

Abstract: Provided are a nonvolatile memory device and a method for setting configuration information of the nonvolatile memory device. The nonvolatile memory device can include a nonvolatile memory cell array, a configuration register and a configuration controller. The configuration controller can be configured to set configuration information in the configuration register based on the state of a select flag stored in the nonvolatile memory cell array. The nonvolatile memory device can be configured to maintain the configuration information using the select flag and a lock flag to prevent the configuration information from changing when security is utilized and reduce the likelihood of the nonvolatile memory device operating erroneously.

Abstract: Capacitive coupling from storage elements on adjacent bit lines is compensated by adjusting voltages applied to the adjacent bit lines. An initial rough read is performed to ascertain the data states of the bit line-adjacent storage elements, and during a subsequent fine read, bit line voltages are set based on the ascertained states and the current control gate read voltage which is applied to a selected word line. When the current control gate read voltage corresponds to a lower data state than the ascertained state of an adjacent storage element, a compensating bit line voltage is used. Compensation of coupling from a storage element on an adjacent word line can also be provided by applying different read pass voltages to the adjacent word line, and obtaining read data using a particular read pass voltage which is identified based on a data state of the word line-adjacent storage element.

Abstract: A nonvolatile memory device comprises a page buffer unit, first to kth logic combination units, and a control unit. The page buffer unit includes first to Nth page buffer blocks. N and k are natural numbers. Each of the first to Nth page buffer blocks comprises m page buffers, divided into first to kth page buffer groups, and first to kth pass/fail check units configured to output respective verification signals, each indicative of a program pass or a program fail, according to data stored in latches of the page buffers included in each of the page buffer groups. The first to kth logic combination units are each configured to output respective first to kth pass/fail determination signals.

Abstract: The control method includes a step of varying driving ability of a selector transistor which selects a diffusion layer in a selected memory cell and a diffusion layer of at least one non-selected memory cell which adjoins to the selected memory cell when the selected memory cell makes transition from a memory cell at one end to a memory cell at other end within a memory block.

Abstract: A method of programming a non-volatile memory device includes receiving data to be programmed into memory cells of the memory device, programming the memory cells with the data, and selectively performing one of a plurality of program verify operations based on a current program loop number to determine whether the memory cells have been successfully programmed. For example, one of a wired-OR pass/fail check operation and a Y-scan pass/fail check operation may be performed according to the current program loop number. Related methods and devices are also discussed.

Abstract: A method for programming a flash memory device including a plurality of memory cells, each storing multi-bit data, includes reading data from selected memory cells. An error of the read data is detected and corrected. Input program data is programmed into the selected memory cells based upon the error-corrected read data.

Abstract: An image memory, image memory system, and memory controller that are capable of efficiently accessing a rectangular area of two-dimensionally arrayed data are provided. The memory device has: a memory cell array that has a plurality of memory unit areas, each of which is selected by addresses; a plurality of input/output terminals; and an input/output unit provided between the memory cell array and the plurality of input/output terminals.

Abstract: An address replacing circuit includes a sub-bank region selecting unit that allows a first sub-bank region or a second sub-bank region to be selectively activated, in response to a row address and first and second bits of a column address in accordance with operation modes a first column region activating unit that generates a first column region activating address and a second column region activating address from the first bit of the column address, a second column region activating unit that generates a third column region activating address and a fourth column region activating address from the second bit of the column address, and a column region selecting unit that allows at least one of first to fourth column regions of the first sub-bank region and first to fourth column regions of the second sub-bank region to be selectively activated, in response to the first to fourth column region activating addresses.

Abstract: The memory device has: a plurality of banks, each of which has a memory cell array having a plurality of page areas that are selected by row addresses respectively, and each of which is selected by a bank address; a row controller that controls activation of the page areas within each of the banks in response to a first operation code; and a group of data input/output terminals. A memory unit area within each of the activated page areas is accessed based on the column address. The row controller generates bank activation signals for the plurality of banks in response to multi-bank information data and a supplied bank address that are supplied along with the first command, and generates the row address of each of the plurality of banks in response to the supplied bank address and a supplied row address. The plurality of banks activate the page areas in response to the bank activation signals and the row addresses generated by the row address calculator.

Abstract: In one aspect a non-volatile memory device is provided which is operable in a programming mode and a read mode. The memory device includes a memory cell array which includes a plurality of non-volatile memory cells, a plurality of word lines, and a plurality of bit lines. The memory device further includes an internal data output line for outputting data read from the bit lines of the memory array, and a page buffer operatively connected between a bit line of the memory cell array and the internal data output line. The page buffer includes a sense node which is selectively connected to the bit line, a latch circuit having a latch node which is selectively connected to the sense node, a latch input path which sets a logic voltage of the latch node in the programming mode and the read mode, and a latch output path which is separate from the latch input path and which sets as logic voltage of the internal date output line according to the logic voltage of the latch node.

Abstract: Provided are a nonvolatile memory and an apparatus and method for deciding data validity for the same, in which validity of data stored in the nonvolatile memory can be decided. The nonvolatile memory includes a memory cell storing data bits in a plurality of pages included in a predetermined block through a plurality of states realized by at least two bits. The block includes a first page in which data bits for determining validity of data bits written by a user are stored, and a second page in which the data bits written by the user are stored.

Abstract: Various embodiments of the present invention are generally directed to a method and apparatus for carrying out a partial block update operation upon a resistive sense memory (RSM) array, such as formed from STRAM or RRAM cells. The RSM array is arranged into multi-cell blocks (sectors), each block having a physical block address (PBA). A first set of user data is written to a selected block at a first PBA. A partial block update operation is performed by writing a second set of user data to a second block at a second PBA, the second set of user data updating a portion of the first set of user data in the first PBA. The first and second blocks are thereafter read to retrieve the second set of user data and a remaining portion of the first set of user data.

Abstract: A method for reading a nonvolatile memory array including an array of memory cells, each memory cell including a substrate, a control gate, a charge storage element, a source region and a drain region, includes receiving, at an address register, a read command including an address for a memory cell in the array of memory cells and an indication regarding whether the read command is a full page read command or a partial page read command. A starting address for a page including the received address is identified, wherein the page includes multiple rows of memory cells in the array of memory cells. The address register is reset to the starting address for the page. It is determined whether all memory cells in the page are non-programmed. Data indicative of a non-programmed state of the page is output if it is determined that all memory cells in the page are non-programmed.

Abstract: Methods of programming a memory, memory devices, and systems are disclosed, for example. In one such method, each data line of a memory to be programmed is biased differently depending upon whether one or more of the data lines adjacent the data line are inhibited. In one such system, a connection circuit provides data corresponding to the inhibit status of a target data line to page buffers associated with data lines adjacent to the target data line.

Abstract: A method for refreshing a flash memory device includes providing first and second refresh fields that include a plurality of memory blocks, and determining, when there is a request for a refresh, a condition of a memory block to be refreshed in accordance with which of the first and second refresh fields includes the memory block to be refreshed.

Abstract: A nonvolatile ferroelectric memory immediately outputs data stored in a page buffer without performing a cell access operation when a page buffer is accessed. Since a block page address region and a column page address region are arranged in less significant bit region, and a row address region is arranged in more significant bit region, the cell operation is not performed in the access of the page address buffer, thereby improving reliability of the cell and reducing power consumption.

Abstract: The memory device has: a plurality of banks, each of which has a memory cell array having a plurality of page areas that are selected by row addresses respectively, and each of which is selected by a bank address; a row controller that controls activation of the page areas within each of the banks in response to a first operation code; and a group of data input/output terminals. A memory unit area within each of the activated page areas is accessed based on the column address. The row controller generates bank activation signals for the plurality of banks in response to multi-bank information data and a supplied bank address that are supplied along with the first command, and generates the row address of each of the plurality of banks in response to the supplied bank address and a supplied row address. The plurality of banks activate the page areas in response to the bank activation signals and the row addresses generated by the row address calculator.

Abstract: A semiconductor memory having a plurality of memory cells coupled to bit lines includes a bit line selecting circuit, a latch circuit, and a switching circuit. The bit line selecting circuit is disposed in a cell area where the memory cells are formed. The bit line selecting circuit is configured to select one of the bit lines in response to a first control signal. The latch circuit is disposed in a surrounding circuit area. The latch circuit is configured to perform a program operation or a read operation on the memory cells corresponding to the bit line selected by the bit line selecting circuit. The switching circuit is disposed in the surrounding circuit area, and is coupled between the bit line selecting circuit and the latch circuit. The switching circuit is configured to switch between the bit line selecting circuit and the latch circuit in response to a second control signal.

Abstract: Phase-change memory (PCM) cells store data using alloy resistors in high-resistance amorphous and low-resistance crystalline states. The time of the memory cell's set-current pulse can be 100 ns, much longer than read or reset times. The write time thus depends on the write data and is relatively long. A page-mode caching PCM device has a lookup table (LUT) that caches write data that is later written to an array of PCM banks. Host data is latched into a line FIFO and written into the LUT, reducing write delays to the relatively slow PCM. Host read data can be supplied by the LUT or fetched from the PCM banks. A multi-line page buffer between the PCM banks and LUT allows for larger block transfers using the LUT. Error-correction code (ECC) checking and generation is performed for data in the LUT, hiding ECC delays for data writes into the PCM banks.

Abstract: To store, in a memory block whose word lines are written successively in a word line writing order, a plurality of data pages that are ordered by logical page address, the pages are written to the word lines so that every page that is written to any one of the word lines has a higher logical page address than any page that is written to a subsequently written word line, regardless of the sequence in which the pages are received for writing. Alternatively, the pages are written to the word lines so that for every pair of written word lines, the word line of the pair that is earlier in the writing order has written thereto a page having a higher logical page address than at least one page written to the other word line of the pair.

Abstract: Devices allow a system using a memory array, or the memory itself, to more efficiently control refresh intervals. This reduces standby current and the overhead associated with refresh operations. The device includes a variable analog refresh signal generation circuit that initiates a refresh operation on one or more memory cells of a memory array. The circuit integrates a refresh timer element with an event signal generator such that a refresh interval as defined by the refresh timer element is changed when events are detected that may change the data retention time of one or more memory cells. One or more of the circuits is placed to monitor an entire memory array, different sub-arrays, or different portions of different sub-arrays. This allows additional refresh operations to be closely tied to actual events, thus increasing overall efficiency.

Abstract: An integrated circuit device having a display memory which stores data for at least one frame from among image information displayed in a display panel which has a plurality of scan lines and a plurality of data lines, wherein the display memory includes a plurality of RAM blocks each of which includes first and second RAM block regions; wherein each of the RAM blocks includes a wordline control circuit which controls a plurality of wordlines provided in each of the first and second RAM block regions; wherein the wordline control circuit is disposed between the first and second RAM block regions; wherein the first and second RAM block regions are disposed along a first direction; and wherein the wordlines extend along the first direction.

Abstract: Phase-change memory (PCM) cells store data using alloy resistors in high-resistance amorphous and low-resistance crystalline states. The time of the memory cell's set-current pulse can be 100 ns, much longer than read or reset times. The write time thus depends on the write data and is relatively long. A page-mode caching PCM device has a lookup table (LUT) that caches write data that is later written to an array of PCM banks. Host data is latched into a line FIFO and written into the LUT, reducing write delays to the relatively slow PCM. Host read data can be supplied by the LUT or fetched from the PCM banks. A multi-line page buffer between the PCM banks and LUT allows for larger block transfers using the LUT. Error-correction code (ECC) checking and generation is performed for data in the LUT, hiding ECC delays for data writes into the PCM banks.

Abstract: High performance non-volatile memory devices have the programming voltages trimmed for individual types of memory pages and word lines. A group of word lines within each erasable block of memory are tested in successive program loops to minimize the problem of incurring excessive number of erase/program cycles. An optimum programming voltage for a given type of memory pages is derived from statistical results of a sample of similar of memory pages.

Abstract: A nonvolatile semiconductor device includes a plurality of word lines, a plurality of bit lines, a plurality of memory cell arrays having a plurality of electrically reprogrammable memory cells which are connected to said word lines and said bit lines, a data program control section which programs a plurality of first multi-bits data each having a first number of bits, or a plurality of second multi-bits data each having a second number of bits twice that of said first multi-bits data, to said plurality of memory cell arrays, a page buffer circuit which stores said plurality of first multi-bits data or said plurality of second multi-bits data which is read for each of said word lines from said plurality of memory cell arrays, a data transfer section which transfers said plurality of first multi-bits data or said plurality of second multi-bits data which is read for each of said second number of bits from said page buffer circuit synchronized with a second clock signal having a cycle which is twice that of a f

Abstract: Methods, devices and systems for reducing the quantity of external interconnections of a memory device are disclosed. Implementation of one such method, device and system includes inputting over an address bus a first portion of an address of a next row of memory cells to be activated. The first portion of the address of the next row of memory cells to be activated is embedded in a command related to the previously activated row of memory cells. The next row of memory cells is subsequently activated according to a concurrently received second portion of the address of the next row of memory cells also received over the address bus. The portioning of the address signals can reduce the width of the address bus and, therefore, the number of required respective external interconnections.

Abstract: Methods and apparatus are provided. A first data value is read from a first memory cell and is stored. An attempt is made to add a second data value to the first memory cell. If the attempt to add the second data value to the first memory cell is unsuccessful, the first data value and the second data value are written to one or more other memory cells.

Abstract: A wordline decoder scheme for a memory device is generally described. In one example, a memory device includes a distributed logical NOR gate to decode addressing signals to generate wordline selection signals within a block of memory wherein the distributed logical NOR gate comprises a wordline decoder output driver, the wordline decoder output driver comprising two transistors coupled with a wordline signal.