Abstract: In an arrangement where a physical phenomenon affects a digital video camera and is measured or sensed by a sensor, a delay of a digital video stream from the digital video camera is estimated. The digital video stream is processed by a video processor for producing a signal that represents the changing over time of the effect of the physical phenomenon on the digital video camera. The signal is then compared with the sensor output signal, such as by using cross-correlation or cross-convolution, for estimating the time delay between the compared signals. The estimated time delay may be used for synchronizing when combining additional varied data to the digital video stream for low-error time alignment. The physical phenomenon may be based on mechanical position or motion, such as pitch, yaw, or roll. The time delay estimating may be performed once, upon user control, periodically, or continuously.

Abstract: Systems, methods, and circuitries are provided to perform bidirectional communication using edge timing. In one example, a method includes receiving, on a first signal line, a first signal having a first timing edge and a first data edge. The first timing edge is of a different type than the first data edge. The first data edge is an edge immediately adjacent to the first timing edge and occurs at a first elapsed time after the first timing edge. The method includes sampling the first signal at a predetermined sample time after the first timing edge to determine a first data value. A second data value is determined and a second signal is generated having a second timing edge and a second data edge. A second elapsed time between the second timing edge and the second data edge encodes a second data value. The second signal is transmitted on a second signal line.

Abstract: A system for adjusting core voltage of an integrated circuit to optimize power savings has a ring oscillator on the integrated circuit for providing a ring oscillator signal. The system also has compare logic on the integrated circuit configured to compare the ring oscillator signal with a clock signal from a clock external to the integrated circuit. The compare logic is configured to make a determination whether a frequency of the clock signal is within a predefined margin of a frequency of the ring oscillator and to adjust the core voltage of the integrated circuit based on the determination. Through such adjustments, the core voltage is lowered while ensuring that the core voltage does not reach a point that causes timing errors.

Abstract: Provided is a method and apparatus for aligning a first local oscillator (LO) clock generated by a controllable LO clock generator in a first radio frequency (RF) path with a second LO clock in a second RF path. The apparatus includes a synchronization channel configured to exchange a synchronization clock between the first and second RF paths, a phase detector configured to measure a phase alignment between the first and second LO clocks, and a loop filter configured to drive the controllable LO clock generators using the phase alignment. Also provided is a time to digital converter. The time to digital converter includes a D flip-flop for sampling first and second input clocks with a third clock, and a counter configured to synchronously increment the resulting samples and create a digital proportional value representing the delay between the first and second clocks.

Abstract: According to one embodiment, an A/D converter includes a first delay cell column in which a plurality of delay cells, to which a first bias current corresponding to a difference voltage between an input voltage and a reference voltage is supplied, is connected in series. The converter includes a second delay cell column in which a plurality of delay cells, to which a second bias current corresponding to a negative-phase difference voltage of the difference voltage is supplied, is connected in series. The converter includes an encoder unit configured to encode a difference value, in delay time of signal propagation, between the first delay cell column and the second delay cell column.

Abstract: Time-to-digital converters (TDC) with improved resistance to metastability are provided. The TDC includes a ring oscillator gated by a start signal. A stop signal triggers capturing values of phase signals from the ring oscillator using master-slave flip-flops. Signals from two of the master stages of the flip-flops are logically combined to produce a counter clock signal that causes a counter to count. The outputs of the flip-flops and of the counter are encoded to produce a digital representation of the time between transitions of the start signal and the stop signal. Since the signals from the master stages of flip-flops are captured (and stop toggling) by the stop signal, the counter clock signal stops toggling, and the counter stops counting. This assures that the values of the captured phase signals and the counter are consistent and avoids metastability errors that could otherwise occur.

Abstract: Aspects of the present disclosure relate to floating point timers and counters that are used in a variety of contexts. In some implementations, a floating point counter can be used to generate a wave form made up of a series of pulses with different pulse lengths. An array of these floating point counters can be used to implement a pool of delays. In other implementations, an array of floating point counters can be used to analyze waveforms on a number of different communication channels. Analysis of such waveforms may be useful in automotive applications, such as in wheel speed measurement for example, as well as other applications.

Abstract: Representative implementations of devices and techniques provide bipolar time-to-digital conversion. For example, either a positive time duration or a negative time duration may be converted to a digital representation by a linear time-to-digital converter (TDC). A set of logic functions may be applied to the input of the TDC to provide start and/or stop signals for the TDC. Further, a correction component may be applied to an input or an output of the TDC to compensate for a delay offset of the TDC.

Abstract: An apparatus and method for inserting delay into a start signal of a metastable ring oscillator chain-based time-to-digital circuit (TDC). Included therein is a signal generating circuit that generates the start signal, a plurality of carry elements connected as a chain, each of the carry elements having an input to receive a stop signal, a delay chain circuit including one or more delay modules selected from the plurality of carry elements, at least one feedback line connected between at least one of the delay modules and the signal generating circuit, and a plurality of enable inputs each provided in a respective one of the delay modules. The delay chain circuit generates an amount of delay based on a delay selection signal that is received at the enable inputs and that selects the amount of delay. The delay chain circuit additionally provides the selected amount of delay to the signal generating circuit, which incorporates the delay into the start signal.

Abstract: In one embodiment, a timing relationship between two signals on an integrated circuit is measured using a ring oscillator on the die of the integrated circuit. The measured time difference is outputted in a digital form. A delay line coupled to the ring oscillator may be used to reduce uncertainty in measurement which may result from the effects of latch circuit metastability. Other embodiments are described and claimed.

Abstract: Methods for determining timestamps for signal timing edges for use in, e.g., a reciprocal counter for determining the frequency of a signal is disclosed, comprising the steps of inputting the signal into a tapped delay line, producing a plurality of delay line tap signals at the output of each of the delay line taps. In one embodiment, after detecting the signal timing edge and determining an initial time value corresponding to the timer clock cycle count at the signal timing edge or the next clock timing edge, the delay line tap signals are monitored to determine a fractional correction time value adjustment to be made to the initial value to account for the delay between the signal timing edge and the next clock timing edge to determine the timestamp. In another embodiment, after detecting the signal timing edge, the average of a plurality of delay line timer clock cycle counts corresponding to the timer clock cycle counts at the delay line tap signal timing edges is used to determine the timestamp.

Abstract: A method for high-resolution timing measurement includes a first oscillator generating a first clock with a first frequency. A second oscillator generates a second clock with a second frequency. A delay pulse generator generates a delayed pulse from the second clock. An oscillator tuner controls the second frequency to be as close as possible to the first frequency without being the same as the first frequency. A sampling module samples the delayed pulse at the first frequency. A counter generates a digital counter value by counting a number of samples made by the sampling module.

Abstract: Implementations are presented herein that include a time delay path.

Abstract: A device is disclosed for measuring a plurality of time intervals.

Abstract: A time-to-digital converter device includes a first delay chain circuit that generates a first value corresponding to a time delay between a start signal and a stop signal. The time-to-digital converter device also includes at least one second delay chain circuits that generates a second value corresponding to a time delay between a delayed start signal and the stop signal. At least one delay element generates the delayed start signal by applying a predetermined delay to the start signal, and a combining circuit generates an output value based on the first and second values. In the time-to-digital converter according to the exemplary embodiments of the present advancements, the output value corresponds to the time delay between the start signal and the stop signal.

Abstract: Described is a compact, lower power gated ring oscillator time-to-digital converter that achieves first order noise shaping of quantization noise using a digital implementation. The gated ring oscillator time-to-digital converter includes a plurality of delay stages configured to enable propagation of a transitioning signal through the delay stages during an enabled state and configured to inhibit propagation of the transitioning signal through the delay stages during a disabled state. Delay stages are interconnected to allow sustained transitions to propagate through the delay stages during the enabled state and to preserve a state of the gated ring oscillator time-to-digital converter during the disabled state. The state represents a time resolution that is finer than the delay of at least one of the delay stages. A measurement module determines the number of transitions of the delay stages.

Abstract: A pulse width measurement circuit generates a time difference signal that corresponds to the pulse width of the input pulse signal PULSE. A delay circuit delays the input pulse signal PULSE by a predetermined amount, and outputs a start signal. An inverter inverts the input pulse signal PULSE, and outputs a stop signal. A time measurement circuit measures the time difference between a positive edge in the start signal and a positive edge in the stop signal, and outputs a time difference signal that corresponds to the time difference.

Abstract: One embodiment of an apparatus for generating a time stamp includes a clock input, an event signal input and a time stamp output. A DLL is connected to the clock input, with a plurality of delay elements inside the DLL. An output of each of the delay elements is connected to a data input on a latch. An event signal input is connected to an enable input on each of the latches. An output of each of the latches is connected to the time stamp output. The apparatus is adapted to produce a value on the time stamp output indicating a point at which the event signal input transitions between transitions on the clock input.

Abstract: A time-to-digital converter apparatus including a delay phase-locked loop, a subtracter, a multi-phase detector and a Vernier detector is disclosed. The delay phase-locked loop herein includes digital delay components for producing counting signals. The multi-phase detector includes digital delay components for producing delay outputs according to the counting signals and thereby detecting a pulse input signal. The Vernier detector includes digital delay components for detecting the remainder of the pulse input signal according to the difference between the delay outputs produced by the subtracter.

Abstract: A circuit and method for measuring duty cycle uncertainty in an on-chip global clock. A global clock is provided to a delay line at a local clock buffer. Delay line taps (inverter outputs) are inputs to a register that is clocked by the local clock buffer. The register captures clock edges, which are filtered to identify a single location for each edge. Imbalance in space between the edges indicated imbalance in duty cycle. Up/down signals are generated from any imbalance and passed to a phase locked loop to adjust the balance.

Abstract: Methods for determining timestamps for signal timing edges for use in, e.g., a reciprocal counter for determining the frequency of a signal is disclosed, comprising the steps of inputting the signal into a tapped delay line, producing a plurality of delay line tap signals at the output of each of the delay line taps. In one embodiment, after detecting the signal timing edge and determining an initial time value corresponding to the timer clock cycle count at the signal timing edge or the next clock timing edge, the delay line tap signals are monitored to determine a fractional correction time value adjustment to be made to the initial value to account for the delay between the signal timing edge and the next clock timing edge to determine the timestamp. In another embodiment, after detecting the signal timing edge, the average of a plurality of delay line timer clock cycle counts corresponding to the timer clock cycle counts at the delay line tap signal timing edges is used to determine the timestamp.

Abstract: A high resolution time detecting apparatus using interpolation and a time detecting method using the same are provided. The time detecting apparatus includes a delayer which generates delayed signals by sequentially delaying a reference signal using a plurality of delay elements, a latch unit which outputs latch signals using the delayed signals, and an interpolation unit which outputs interpolated signals using input and output signals of the delay elements. As a result, a high resolution TDC using an interpolation and a time detecting method using the same provide improved performance of digital PLL, high resolution digital signal output at a low power consumption, and controlled circuit size.

Abstract: A time-to-digital converter includes a circular delay chain, a phase interpolator, and a time-to-digital (TDC) core. The circular delay chain receives a first input clock and generates a first set of multi-phase clocks by propagating the first input clock through delay cells in the delay chain. The phase interpolator performs phase interpolation with a second input clock and another clock to generate a second set of multi-phase clocks. The other clock may be a delayed version of the second input clock. The TDC core uses the first and second set of multi-phase clocks to determine the time difference between the first and second input clocks.

Abstract: The present subject matter is directed to a high-speed high resolution and accuracy time interpolator circuit. The interpolator uses basic dual ramp time-to-digital converter architecture, but provides circuits and methodologies to improve the accuracy, reduce the effective intrinsic jitter, and reduce the measurement time. Improved aspects of the present subject matter correspond to the introduction of a current mirror for improved settling time, a high frequency clock for improved resolution and ADC sample processing to improve resolution and accuracy.

Abstract: A time-to-digital converter apparatus including a delay phase-locked loop, a subtracter, a multi-phase detector and a Vernier detector is disclosed. The delay phase-locked loop herein includes digital delay components for producing counting signals. The multi-phase detector includes digital delay components for producing delay outputs according to the counting signals and thereby detecting a pulse input signal. The Vernier detector includes digital delay components for detecting the remainder of the pulse input signal according to the difference between the delay outputs produced by the subtracter.

Abstract: In a time measuring circuit, a pulse delay circuit is provided with a plurality of delay units. The pulse delay circuit is configured to transfer a pulse signal through the plurality of delay units while the pulse signal is delayed by the plurality of delay units. A delay time of each of the plurality of delay units depends on a level of a first drive voltage being input to each of the plurality of delay units. A generating circuit is configured to obtain a number of the delay units through which the pulse signal has passed within a predetermined period to generate, as time measurement data, digital data based on the obtained number. A first setting unit is configured to variably set the level of the first drive voltage being input to each of the plurality of delay units.

Abstract: A system and method for providing improved resolution in the measuring the pulse width of digital signals comprising counting the integral number of measuring clock pulses covered by said digital pulse and triggering a chain of cascaded high resolution delay elements from the trailing edge of said measuring clock pulses. Further, the invention measures the delay count obtained from said chain of cascaded delay elements from the trailing edge of the last measuring clock pulse up to the end of said digital pulse, and adds said measured delay count to said integral measuring clock pulse count to obtain the total width of said digital pulse.

Abstract: A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Abstract: A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Abstract: A circuit for measuring timing uncertainty in a clocked digital path and in particular, the number of logic stages completed in any clock cycle. A local clock buffer receives a global clock and provides a complementary pair of local clocks. A first local (launch) clock is an input to a delay line, e.g., 3 clock cycles worth of series connected inverters. Delay line taps (inverter outputs) are inputs to a register that is clocked by the complementary clock pair to capture progression of the launch clock through the delay line and identify any variation (e.g., from jitter, VDD noise) in that progression. Global clock skew and across chip gate length variation can be measured by cross coupling launch clocks from a pair of such clock buffers and selectively passing the local and remote launch clocks to the respective delay lines.

Abstract: Generally, the embodiments are directed to circuits and methods for time stamping an event at a fraction of a clock cycle. A time stamping circuit comprises two or more detection circuits. The detection circuits receive an event-in signal and generate event signals based on a clock phase at which the event-in signal was received. A decoder receives the event signals and outputs an event-out signal and a time stamp that represents the phase at which the event-in signal was detected. By time stamping the event-in signal to a phase division, the time stamping circuit detects event signals that occur at a rate faster than the clock cycle.

Abstract: Differential delay-line analog-to-digital (A/D) converters for use in current and power sensing applications are provided. These A/D converters are well suited for a wide range of electronic applications, including over-load protection, current mode control, current sharing in digitally controlled switched-mode power supplies, power sensing, and implementation of power optimization methods in power management applications.

Abstract: A method is provided for accurate time measurement. Time is first measured with a first oscillator. At designated intervals, a second oscillator is activated for a period of time based on the first oscillator. The second oscillator is more accurate than the first oscillator. Pulses are then counted from the second oscillator during the period of time. The second oscillator is then turned off after the period of time. The count from the second oscillator is used as a new measurement of the period of time of the first oscillator.

Abstract: In a time measuring circuit, a pulse delay circuit is provided with a plurality of delay units. The pulse delay circuit is configured to transfer a pulse signal through the plurality of delay units while the pulse signal is delayed by the plurality of delay units. A delay time of each of the plurality of delay units depends on a level of a first drive voltage being input to each of the plurality of delay units. A generating circuit is configured to obtain a number of the delay units through which the pulse signal has passed within a predetermined period to generate, as time measurement data, digital data based on the obtained number. A first setting unit is configured to variably set the level of the first drive voltage being input to each of the plurality of delay units.

Abstract: PICA probe system apparatus is described, including apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.

Abstract: A self-calibrating strobe signal generator for a BIST circuit responds to an edge of an input strobe signal by generating corresponding edges of first and second strobe signals separated in time by a target delay specified by input data. The strobe signal generator includes a multiplexer, a delay circuit and a controller. The multiplexer normally provides the input strobe signal as a multiplexer output signal to the delay circuit which generates edges in each of the first and second strobe signals in response to each edge in the multiplexer output signal with a programmable delay between corresponding first and second strobe signal edges.

Abstract: A method of determining the delay between two corresponding noise-like signals comprises determining events at which the level of a first of the signal crosses a predetermined threshold, using each event to sample a second signal, combining the samples to produce an output value and determining the delay from the output value. Preferably, each sample is weighted according to one or more characteristics of the event used to define the sample. The magnitude of the output value could be an indication of the delay, or there could be several output values each for a respective differently-delayed version of the second signal, in which case these could be evaluated to select which corresponds to the actual delay.

Abstract: Measurement of the period of a relatively slow but precise reference clock in terms of a high speed oscillating clock, such as from a voltage controlled oscillator (VCO). The reference clock is known to be accurate and stable and values of the time measurement unit are output that determine the integer and fractional number of the high speed oscillating clock periods which occurred during one reference clock cycle. The measurements are very accurate and all cycles of the reference clock are measured. Such measurements enable various frequency control schemes over the high speed oscillating clock source.

Abstract: A accurate time measurement circuit. The design is amenable to implementation as a CMOS integrated circuits, making the circuit suitable for a highly integrated system, such as automatic test equipment where multiple time measurement circuits are required. The circuit uses a delay locked loop to generate a plurality of signals that are delayed in time by an interval D. The signal to be measured is fed to a bank of delay elements, each with a slightly different delay with the difference in delay between the first and the last being more than D. An accurate time measurement is achieved by finding coincidence between one of the TAP signals and one of the delay signals. The circuit has much greater accuracy than a traditional delay line based time measurement circuit with the same number of taps. It therefore provides both accuracy and fast re-fire time and is less susceptible to noise.

Abstract: PICA probe system methods and apparatus are described, including methods and apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.

Abstract: A method and apparatus for precision time interval measurement in a time-of-flight mass spectrometer (TOF-MS). The method and apparatus produces an instrument capable of measuring bursts of data occurring at rates much higher than the average data rate. An asynchronous serial stream of data, consisting of a start pulse followed by an arbitrary number of stop pulses, repeated an arbitrary number of times, is converted into a digital stream of data synchronized to a precision master clock. Conversion of the asynchronous, analog data to synchronous digital data simplifies the measurement task by allowing the use of powerful, low-cost digital logic in the measurement.

Abstract: The present invention is a decoder for decoding a signal. The decoder includes a discriminator and a threshold generator. The discriminator receives the signal and generates an output voltage equal to a first voltage if the signal is less than a threshold level that is input to the discriminator and equal to a second voltage if the signal is greater than the threshold level. The threshold level depends on the output from the discriminator in a preceding time interval that depends on the impulse response of a transmission link through which the input signal has passed. The threshold generator implements a low-pass analog filter that receives the output voltage during each of the clock periods and generates therefrom a filtered output signal.

Abstract: To accomplish circuit trimming of a packaged IC chip by applying a magnetic field thereon, a magnetically configurable adjuster device is coupled with the packaged IC chip. The magnetically configurable adjuster device includes a Hall element, a signal processor and amplifier device, a decoder, and a configurable adjuster that receives a signal outputted by the packaged IC chip. The configurable adjuster includes a plurality of electrically configurable elements and circuit-trimming members. The Hall element senses and converts the magnetic field into a voltage signal by Hall effect. After amplification, the voltage signal is inputted to the decoder. The decoder decodes the voltage signal into decoded signals that configure the configurable adjuster by means of the configurable elements. With the configurable adjuster hence configured, circuit trimming of the packaged IC chip is achieved via the circuit-trimming members.

Abstract: Methods and structure for improving accuracy of a master delay line associated with slave delay lines wherein the master delay line is design utilizing a higher clock frequency then the clock frequency applied to associated slave delay lines. The higher clock frequency applied to the master delay line in accordance with the present invention permits the master delay line to be comprised of fewer delay elements than would be the case for a master delay line using the same basic clock frequency as associated slave delay lines. The lower number of delay elements comprising the master delay line (i.e., the shorter length of the master delay line) helps reduce static phase errors associated with the master delay line inherent in the design, layout and fabrication of a longer delay line.

Abstract: A circuit measures the signal propagation delay through a selected test circuit. The test circuit is provided with a feedback path so that the test circuit and feedback path together form a free-running oscillator. The oscillator then automatically provides its own test signal that includes alternating rising and falling signal transitions on the test-circuit input node. A phase discriminator samples the output of the oscillator and accumulates data representing the signal propagation delay of either rising or falling signal transitions propagating through the test circuit. The worst-case delay associated with the test circuit can then be expressed as the longer of the two. Knowing the precise worst-case delay allows IC A designers to minimize the guard band and consequently guarantee higher speed performance.

Abstract: A delay test system includes an electronic circuit, such as a normal circuit which has a portion to be tested and a plurality of flip-flop circuits. In this event, each of flip-flop circuits is serially connected to each other to perform a delay test for said normal circuit. Further, a first clock input terminal is connected to the flip-flips and a normal circuit to input a normal mode clock signal. Moreover, a second clock input terminal is connected to the flip-flop circuits and the normal circuit to input a test clock signal. With such a structure, an input and output operation of data signals is carried out in synchronism with edge timings determined by both the normal mode clock signal in the normal mode on the condition that the test clock signal is not supplied to the second clock input terminal. On the other hand, the first and second clock input terminals are separately driven by the normal mode clock signal and the test clock signal in the test mode.

Abstract: Highly accurate time interval measurement is achieved for an electrical waveform. The electrical waveform is sampled and converted to a series of voltages, and the series of voltages is interpolated in order to form a time tag list, using interpolations that are optimized for time interval measurement and analysis. The time tag list accurately represents the times at which particular events of interest occur, and is used to generate displays and results analysis such as adjacent cycle jitter and accurate differential triggering and analysis.

Abstract: A time-to-digital converter records the arrival times of successive signals—which are separated from one another by more than one period of a reference clock signal—by recording the number of nodes disposed within a plurality of fine delay paths—each coupled to a different one of a plurality of coarse delay stages in a first coarse delay path—through which the signals propagate. The delay across each fine delay path is substantially the same as the delay across a coarse delay stage in the coarse delay path. A phase detector maintains the clock signal and its delayed replica in phase by adjusting the delay through each of the coarse delay stages in a second coarse delay path. The time delay between the clock signal and its delayed replica is equal to one period of the clock signal.

Abstract: In a semiconductor integrated circuit, a monitor circuit for evaluation is provided on a semiconductor substrate in an input/output buffer circuit region. This monitor circuit includes a delay circuit, a first flip-flop circuit on the input side of the delay circuit, and a second flip-flop circuit on the output side of the delay circuit.

Abstract: A circuit measures the signal propagation delay through a selected test circuit. The test circuit is provided with a feedback path so that the test circuit and feedback path together form a free-running oscillator. The oscillator then automatically provides its own test signal that includes alternating rising and falling signal transitions on the test-circuit input node. A phase discriminator samples the output of the oscillator and accumulates data representing the signal propagation delay of either rising or falling signal transitions propagating through the test circuit. The worst-case delay associated with the test circuit can then be expressed as the longer of the two. Knowing the precise worst-case delay allows IC designers to minimize the guard band and consequently guarantee higher speed performance.