Abstract: A focus detection system for use in a multi-beam optical pickup assembly is provided that uses an optical element, either a holographic element or diffractive element, to split beams reflected off of a data-bearing surface of an optical disk into a plurality of data beams and a plurality of focus beams. The optical element also introduces astigmatism into the focus beams. The focus beams are projected onto focus detectors configured to account for overlap between adjacent focus beams to produce an accurate focus error signal.
Type:
Grant
Filed:
October 9, 1998
Date of Patent:
May 8, 2001
Assignee:
Zen Research (Ireland), Ltd.
Inventors:
Tatiana Kosoburd, Amir Alon, Shlomo Shapira, Michael Naor
Abstract: This invention provides an optical head apparatus that is not influenced by the offset component contained in a track deviation signal and the track offset caused by lens shift control. According to an optical head apparatus of this invention, portions of light-receiving regions of a photodetector for detecting a track deviation signal are used as offset component detection light-receiving regions for removing any offset component from a track deviation signal. With this arrangement, the offset component contained in a track deviation signal, i.e., the influence of a lens shift on a tracking error signal, is removed by using light from the region where all the 0th-order diffracted light, 1st-order diffracted light, and −1st-order diffracted light of the light reflected by the optical disk overlap each other.
Abstract: An optical pickup includes a photo-detector. The photo-detector is structured by light receiving elements on one of which a blind zone is formed. If a relationship between an output of the light receiving element formed with a blind zone and a lens position is displayed as a graph on a measurement signal output device, a point that a beam converges on the blind zone, i.e., a point that a spot size assumes a minimum, is displayed as an edge. In the photo-detector, a region for receiving a sub-beam on light shield side, i.e., one sub-beam having a grater spot size, has a width broader than a width of a region for receiving a sub-beam on an aperture side, i.e., another sub-beam smaller in spot size.