Detail Of Electrical Heating Control Patents (Class 374/11)
  • Patent number: 10094718
    Abstract: The differential adiabatic compensation calorimeter comprises sample and reference containers, sample and reference temperature sensors connected back-to-back, in series, sample and reference compensating heaters coupled to the sample and reference containers, and a temperature-controlled chamber. In this differential adiabatic mixing and reaction calorimeter, the sample heat-sink heat loss to the sample container is compensated so that the exothermic reaction is conducted in an adiabatic state, resulting in an undistorted adiabatic process gaining the highest adiabatic temperature rise that corresponds to the theoretical value and an experimentally measured time to maximum rate value. The calorimeter is designed for measuring the time-resolved adiabatic temperature rise, the rate of temperature rise, the time to maximum temperature peak and time to maximum rate of an exothermic chemical reaction.
    Type: Grant
    Filed: January 2, 2015
    Date of Patent: October 9, 2018
    Inventor: Frank L. Wu
  • Patent number: 10060804
    Abstract: A cooling-heating stage-type fast scanning calorimeter capable of being integrated with other microscopic structure characterization techniques. The cooling-heating stage-type fast scanning calorimeter includes a sample chamber provided with light transmission and reflection transparent windows on the walls thereof, a cooling-heating stage provided with internal heating elements and coolant channels for temperature control and also provided with a transmission hole, a sample chamber temperature control system and a fast calorimetric system.
    Type: Grant
    Filed: December 20, 2013
    Date of Patent: August 28, 2018
    Assignee: Nanjing University
    Inventors: Dongshan Zhou, Lai Wei, Jing Jiang, Qi Xue, Wei Chen, Xiaoliang Wang, Wei Jiang, Christoph Schick
  • Patent number: 9702837
    Abstract: A system for measuring glass transition temperature of a polymer can include a cell having a closed bottom and a peripheral wall extending from the bottom, a sample holder having a first supporting pin and a second supporting pin spaced apart from the first supporting pin, a loading probe in the cell for selectively contacting a polymer sample disposed on the sample holder, a temperature probe in the cell, a heater in the cell, a temperature sensor, a source of pressure, a source of gas in communication with the cell, and a data acquisition system operably connected to the loading probe, the temperature probe and the source of pressure. The first and second supporting pins and the loading probe in the cell provide a three-point flexural bending assembly for measuring bending of the polymer sample under varied conditions of temperature and pressure in the presence of a gas.
    Type: Grant
    Filed: December 2, 2014
    Date of Patent: July 11, 2017
    Assignee: KUWAIT INSTITUTE FOR SCIENTIFIC RESEARCH
    Inventor: Salah T. Al-Enezi
  • Patent number: 9562845
    Abstract: Apparatus features a sample tube adapter made of conductive material, having a first part to contain and touch a sample tube having a sample therein, and a second part to provide a thermal path for heat transfer to/from the sample tube and a thermal assembly for performing a sample analysis; and sample support rails to receive the sample tube adapter to provide physical support for the sample tube, orient the sample tube adapter in relation to the thermal assembly so there is contact between the sample tube adapter and the thermal assembly to provide the thermal path for heat transfer to/from the sample tube and the thermal assembly, and align the sample tube adapter in relation to a light source so there is a registration between the sample tube and a light beam provided by the light source, all for performing the sample analysis.
    Type: Grant
    Filed: February 17, 2016
    Date of Patent: February 7, 2017
    Assignee: Xylem IP UK S. A R. L.
    Inventor: Valdis R. Vesma
  • Patent number: 9528953
    Abstract: A thermo-analytical instrument, especially a differential scanning calorimeter has a sample position (201, 401) for receiving a sample (206), a reference position (202, 402), a heating means associated with the sample position and the reference position, a means for setting a predetermined temperature program of nominal values of temperature versus time, a first sensor (407) for measuring a sample temperature (TS) at the sample position, and a controller. The controller controls the heating power of the heating means so that measured sample temperature essentially follows the predetermined temperature program.
    Type: Grant
    Filed: January 30, 2014
    Date of Patent: December 27, 2016
    Assignee: Mettler-Toledo GmbH
    Inventors: Ernst Van De Kerkhof, Paul Pieter Willem Van Grinsven
  • Patent number: 9310263
    Abstract: The present invention generally relates to an adiabatic scanning calorimeter for simultaneous measurements of the temperature dependence of heat capacity and enthalpy of liquids and solids and phase transitions therein. Moreover, the invention allows for an accurate separation between pretransitional enthalpy variations and true latent heats at first-order or weakly first-order phase transitions. In addition, the invention relates to calorimeters for controlling temperature differences and heat fluxes in different modes of operation.
    Type: Grant
    Filed: July 7, 2011
    Date of Patent: April 12, 2016
    Assignee: Katholieke Universiteit Leuven
    Inventors: Jan Thoen, Christ Glorieux, Jan Leys
  • Patent number: 9213008
    Abstract: Certain embodiments herein are directed to a differential scanning calorimeter comprising a sample holder thermally coupled to a first furnace, a reference holder thermally coupled to a second furnace, and a processor electrically coupled to the first furnace and the second furnace, the processor configured to receive data during a scan of a sample to provide a heat flow trace and further configured to subtract a calculated baseline from the heat flow trace, the calculated baseline comprising the sum of an isothermal baseline function, a scanning baseline function and a transient baseline function. Calibration methods are also described.
    Type: Grant
    Filed: January 20, 2010
    Date of Patent: December 15, 2015
    Assignee: PERKINELMER SINGAPORE PTE LIMITED
    Inventors: Robert Alan Hoult, Richard Bruce Cassel
  • Patent number: 9127988
    Abstract: A heat flux measurement apparatus 100 includes a first measurement unit 110, a second measurement unit 120, and heat flux calculation units 130, 140. The first measurement unit 110 measures a temperature difference between a first measurement location and a second measurement location that is lower in temperature than the first measurement location, using a thermocouple 112. The second measurement unit 120 measures a temperature difference between a third measurement location that can be assumed to be isothermal with the first measurement location and a fourth measurement location that can be assumed to be isothermal with the second measurement location, using a thermocouple 122 different in time constant from the thermocouple 112.
    Type: Grant
    Filed: October 4, 2010
    Date of Patent: September 8, 2015
    Assignee: IMAGINEERING, INC.
    Inventors: Yuji Ikeda, Atsushi Nishiyama, Takashi Furui
  • Publication number: 20140233601
    Abstract: A thermoanalytical instrument, and especially a differential scanning calorimeter, has first and second measurement positions, a heater and a temperature sensor associated with each of the measurement positions, and a controller. The controller, which has an associated means for setting a predetermined temperature program, controls a heating power of the first heater to cause the temperature measured at the first position to follow the temperature program. The controller also controls both heaters to eliminate any temperature difference between the measured first and second temperatures. The controller also provides a means for determining the lower of the measured first and second measured temperatures and applies additional power to the heater associated with that lower measured temperature.
    Type: Application
    Filed: April 24, 2014
    Publication date: August 21, 2014
    Applicant: Mettler-Toledo AG
    Inventors: Ernst Van De Kerkhof, Paul Pieter Willem Van Grinsven
  • Patent number: 8746966
    Abstract: A thermoanalytical instrument, and especially a differential scanning calorimeter, has first and second measurement positions, a heater and a temperature sensor associated with each of the measurement positions, and a controller. The controller, which has an associated means for setting a predetermined temperature program, controls a heating power of the first heater to cause the temperature measured at the first position to follow the temperature program. The controller also controls both heaters to eliminate any temperature difference between the measured first and second temperatures. The controller also provides a means for determining the lower of the measured first and second measured temperatures and applies additional power to the heater associated with that lower measured temperature.
    Type: Grant
    Filed: May 14, 2009
    Date of Patent: June 10, 2014
    Assignee: Mettler-Toledo AG
    Inventors: Ernst Van De Kerkhof, Paul Pieter Willem Van Grinsven
  • Publication number: 20140146847
    Abstract: A thermo-analytical instrument, especially a differential scanning calorimeter has a sample position (201, 401) for receiving a sample (206), a reference position (202, 402), a heating means associated with the sample position and the reference position, a means for setting a predetermined temperature program of nominal values of temperature versus time, a first sensor (407) for measuring a sample temperature (TS) at the sample position, and a controller. The controller controls the heating power of the heating means so that measured sample temperature essentially follows the predetermined temperature program.
    Type: Application
    Filed: January 30, 2014
    Publication date: May 29, 2014
    Inventors: Ernst Van De Kerkhof, Paul Pieter Willem Van Grinsven
  • Publication number: 20140146846
    Abstract: A detecting method for detecting fan failure in an electronic device is provided. The electronic device includes at least one fan and an air inlet structure. A first sensor is mounted on a central processing unit (CPU) and senses a first temperature value. A second sensor is mounted on the air inlet structure and senses a second temperature value. The detecting method includes steps of acquiring the first temperature value and the second temperature value; calculating a power value of the CPU; calculating a thermal resistance value based on the acquired first temperature value, the acquired second temperature value and the power value of the CPU; determining whether the calculated thermal resistance value is more than a predetermined thermal resistance value; and generating fan failure information when the calculated thermal resistance value is more than a predetermined thermal resistance value.
    Type: Application
    Filed: March 21, 2013
    Publication date: May 29, 2014
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: CHIH-CHUNG SHIH, CHAO-KE WEI, HUNG-CHOU CHAN, CHIA-WEN LEE
  • Patent number: 8371746
    Abstract: A thermal analysis device comprising a replaceable sensor that can be contacted via a contact element of an electrical contacting means, a heating element and a cooling element. The contact element(s) is thermally connected with the heating element and can be heated essentially independently of the operating state of the cooling element even when no sensor is mounted to the device.
    Type: Grant
    Filed: November 15, 2010
    Date of Patent: February 12, 2013
    Assignee: Mettler-Toledo AG
    Inventors: Corinne Schärer, Ulrich Esser, Thomas Hütter
  • Patent number: 8342744
    Abstract: The differential scanning calorimeter includes: a heat sink, which stores a measuring sample and a reference material; a heater, which heats the heat sink; a cooling block, which is separated away from the heat sink, and positioned below the heat sink; a thermal resistor, which is connected between the heat sink and the cooling block, and forms a heat flow path therebetween; a cooling head, which is detachably fitted to the cooling block, and is cooled by an external cooling device; and differential heat flow detectors, which output a temperature difference between the measuring sample and the reference material as a heat-flow-difference signal, in which: the cooling block forms a side wall to fit the bore of the cooling head outward from the joint of the thermal resistance body; the top surface of the cooling head is lower than the joint.
    Type: Grant
    Filed: February 16, 2010
    Date of Patent: January 1, 2013
    Assignee: SII NanoTechnology Inc.
    Inventors: Shinya Nishimura, Kentaro Yamada, Hirohito Fujiwara
  • Patent number: 8301316
    Abstract: A baffle is provided proximate an array of fans used to cool electronic components. The baffle may assume different orientations with respect to the array of fans.
    Type: Grant
    Filed: January 25, 2010
    Date of Patent: October 30, 2012
    Assignee: Hewlett-Packard Develpment Company, L.P.
    Inventors: Mun Hoong Tai, Chee Kit John Chan, Su Nee Chin, Siang Aun Yeoh
  • Patent number: 8231267
    Abstract: Control systems and calorimeters using them are provided. In certain examples, a calorimeter comprising a thin film sample sensor, a thin film reference sensor, a first controller configured to receive a temperature signal from only the reference sensor and to generate a first control signal, based on the received temperature signal, to provide average power to the sample sensor and to the reference sensor, and a second controller configured to receive temperature signals from both the sample sensor and the reference sensor and to generate a second control signal, based on the temperature signals received from both the sample sensor and the reference sensor, to provide differential power to only the sample sensor is described. Methods using the control systems and calorimeters are also described.
    Type: Grant
    Filed: June 5, 2009
    Date of Patent: July 31, 2012
    Assignee: PerkinElmer Health Sciences, Inc.
    Inventors: Christoph E. G. Schick, Evgeny Zhuravlev
  • Patent number: 8156632
    Abstract: According to the present disclosure, a system for sensing attributes of tissue in at least one direction is provided. The system includes a thermal conductivity probe having a sensor configured to measure thermal conductivity in the target tissue in at least one direction, and an electrical conductivity probe having a sensor configured to measure electrical conductivity in the target tissue in at least one direction, a power supply operatively coupled to the thermal conductivity probe and being configured to supply power to the thermal conductivity probe, an impedance analyzer operatively coupled to the electrical conductivity probe, and a computer operatively coupled to at least one of the power supply, the multimeter and the impedance analyzer.
    Type: Grant
    Filed: April 29, 2011
    Date of Patent: April 17, 2012
    Assignee: TYCO Healthcare Group LP
    Inventors: Roop L. Mahajan, Ming Yi, Ronald J. Podhajsky, Hrishikesh V. Panchawagh
  • Patent number: 8038342
    Abstract: The present invention relates to a method for determining the kinetics of gas hydrate formation in a fluid comprising water, wherein the following stages are carried out: a sample of the fluid is provided in form of a water-in-oil stable emulsion, DSC measurements are performed on the sample to obtain at least one peak corresponding to the gas hydrate conversion energy in the water drops of said emulsion, kinetic characteristics of the formation of hydrates in said fluid are deduced from the peak.
    Type: Grant
    Filed: May 24, 2006
    Date of Patent: October 18, 2011
    Assignee: Institut Francais du Petrole
    Inventors: Christine Dalmazzone, Benjamin Herzhaft, Lionel Rousseau
  • Patent number: 7951144
    Abstract: According to the present disclosure, a system for sensing attributes of tissue in at least one direction is provided. The system includes a thermal conductivity probe having a sensor configured to measure thermal conductivity in the target tissue in at least one direction, and an electrical conductivity probe having a sensor configured to measure electrical conductivity in the target tissue in at least one direction, a power supply operatively coupled to the thermal conductivity probe and being configured to supply power to the thermal conductivity probe, an impedance analyzer operatively coupled to the electrical conductivity probe, and a computer operatively coupled to at least one of the power supply, the multimeter and the impedance analyzer.
    Type: Grant
    Filed: January 18, 2008
    Date of Patent: May 31, 2011
    Inventors: Roop L. Mahajan, Ming Yi, Ronald J. Podhajsky, Hrishikesh V. Panchawagh
  • Patent number: 7909505
    Abstract: A device and method for investigating phase transformation properties and structural changes of materials. In one form, the device simulates actual thermal processing conditions, while the method can be used in both simulations as well as in actual processing conditions. An analysis using at least one of the device and method is referred to as a single sensor differential thermal analysis, as it compares the temperature recorded in a measured specimen against a reference thermal history without requiring the derivation of the reference thermal history from measured reference temperatures.
    Type: Grant
    Filed: January 6, 2009
    Date of Patent: March 22, 2011
    Assignee: The Ohio State University
    Inventors: Boian Todorov Alexandrov, John C. Lippold, Seth Jason Norton
  • Publication number: 20110013663
    Abstract: Thermal analysis method, particularly for determining the heat capacity of body, or its derivative with respect to temperature, or a latent heat, said method comprising differential measurement of a physical parameter between two samples (84, 84?) undergoing a temperature change under equivalent conditions, said method being characterized in that said samples are essentially identical as to composition and thermal properties and exhibit, at the start of the measurement, an initial temperature difference of known magnitude. Apparatus for carrying out such a method.
    Type: Application
    Filed: December 5, 2008
    Publication date: January 20, 2011
    Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Jean-Luc Garden, Jacques Chaussy
  • Publication number: 20110007775
    Abstract: The differential adiabatic compensation calorimeter comprises sample and reference containers, sample and reference temperature sensors connected back-to-back, in series, sample and reference compensating heaters coupled to the sample and reference containers, and a temperature-controlled chamber. In this differential adiabatic mixing and reaction calorimeter, the sample heat-sink heat loss to the sample container is compensated so that the exothermic reaction is conducted in an adiabatic state, resulting in an undistorted adiabatic process gaining the highest adiabatic temperature rise that corresponds to the theoretical value and an experimentally measured time to maximum rate value. The calorimeter is designed for measuring the time-resolved adiabatic temperature rise, the rate of temperature rise, the time to maximum temperature peak and time to maximum rate of an exothermic chemical reaction.
    Type: Application
    Filed: July 6, 2010
    Publication date: January 13, 2011
    Inventor: Frank L. Wu
  • Patent number: 7802916
    Abstract: There is provided a differential scanning calorimeter for exactly measuring a calorie variation of the measured sample on the basis of the temperature difference between sample container and the reference container without the influence of the heat irregularity incoming from the surroundings and the noise components.
    Type: Grant
    Filed: December 20, 2007
    Date of Patent: September 28, 2010
    Assignee: SII NanoTechnology Inc.
    Inventor: Yoshihiko Teramoto
  • Patent number: 7781703
    Abstract: The thermal analyzer comprises temperature deviation approximation formula holder which holds an approximate formula of a temperature deviation between sample and furnace and an elevating or lowering rate of the temperature of furnace during measuring the temperature deviation, programmed temperature corrector which corrects a programmed temperature in proportion to the elevating or lowering rate of the temperature. So that, since the temperature deviation is corrected in proportion to the elevating or lowering rate of the temperature program, the temperature deviation between sample and furnace is controlled to diminish when heating or cooling the sample using the temperature program which elevates or lowers the temperature of the sample or the furnace.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: August 24, 2010
    Assignee: SII NanoTechnology Inc.
    Inventor: Jun Nagasawa
  • Patent number: 7748894
    Abstract: A thermal analysis equipment includes a thermal analysis data preservation function that preserves, as thermal analysis data, signals from a temperature sensor and a physical quantity sensor that detect a temperature and a change in physical quantity, respectively, of a sample. An electromagnetic-wave data acquisition control function controls acquisition of electromagnetic wave data in accordance with setting of a trigger to acquire the electromagnetic wave data. An electromagnetic-wave data preservation function preserves the electromagnetic wave data. An electromagnetic-wave data correlation function correlates the preserved electromagnetic wave data to a position on the thermal analysis data when the trigger is set.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: July 6, 2010
    Assignee: SII NanoTechnology Inc.
    Inventor: Rintaro Nakatani
  • Patent number: 7744273
    Abstract: A thermal analysis apparatus possesses a temperature sensor measuring a temperature of a heating furnace inside, a temperature program setter which can set a temperature program and outputs a temperature program signal, a temperature control section adjusting a supply electric power to a heater in compliance with a difference between the temperature program signal and a detection signal of the temperature sensor, a processor section calculating an air flow rate corresponding to a program temperature, and a mass flow controller which adjusts an air flow rate supplied to the heating furnace inside in compliance with a signal of the air flow rate calculated by the processor section. In the processor section, operation expressions calculating the air flow rate are set so as to differ respectively in a higher temperature side and a lower temperature side than a predetermined boundary temperature.
    Type: Grant
    Filed: August 20, 2007
    Date of Patent: June 29, 2010
    Assignee: SII Nanotechnology Inc.
    Inventors: Kanji Nagasawa, Rintaro Nakatani
  • Publication number: 20100046573
    Abstract: Control systems and calorimeters using them are provided. In certain examples, a calorimeter comprising a thin film sample sensor, a thin film reference sensor, a first controller configured to receive a temperature signal from only the reference sensor and to generate a first control signal, based on the received temperature signal, to provide average power to the sample sensor and to the reference sensor, and a second controller configured to receive temperature signals from both the sample sensor and the reference sensor and to generate a second control signal, based on the temperature signals received from both the sample sensor and the reference sensor, to provide differential power to only the sample sensor is described. Methods using the control systems and calorimeters are also described.
    Type: Application
    Filed: June 5, 2009
    Publication date: February 25, 2010
    Inventors: Christoph E.G. Schick, Evgeny Zhuravlev
  • Publication number: 20090310644
    Abstract: A thermoanalytical instrument, and especially a differential scanning calorimeter, has first and second measurement positions, a heater and a temperature sensor associated with each of the measurement positions, and a controller. The controller, which has an associated means for setting a predetermined temperature program, controls a heating power of the first heater to cause the temperature measured at the first position to follow the temperature program. The controller also controls both heaters to eliminate any temperature difference between the measured first and second temperatures. The controller also provides a means for determining the lower of the measured first and second measured temperatures and applies additional power to the heater associated with that lower measured temperature.
    Type: Application
    Filed: May 14, 2009
    Publication date: December 17, 2009
    Applicant: Mettler-Toledo AG
    Inventors: Ernst Van De Kerkhof, Paul Pieter Willem Van Grinsven
  • Patent number: 7578613
    Abstract: A modulated differential scanning calorimeter that accounts for heat flow due to evaporative solvent loss. The calorimeter modulates the temperature applied to a sample and a reference to determine the amount of heat flow that is due to evaporation. By calculating the amount of heat flow due to evaporation, the user can determine how much of the heat flow of any given well is due to the process of interest as opposed to evaporation.
    Type: Grant
    Filed: September 11, 2007
    Date of Patent: August 25, 2009
    Assignee: Waters Investments Limited
    Inventor: Michael Reading
  • Patent number: 7568832
    Abstract: A rapid image-based method for validating good electrical contact between existing LSP material on a structure, and LSP material on an applied patch, thus ensuring continuous LSP through the patch. The method and apparatus are used in the repair of LSP by validating an electrical connection between new and existing LSP materials. It can also be used during manufacturing to ensure good contact between sections of LSP material.
    Type: Grant
    Filed: May 12, 2006
    Date of Patent: August 4, 2009
    Assignee: The Boeing Company
    Inventors: Morteza Safai, Gary E. Georgeson
  • Publication number: 20090190625
    Abstract: An apparatus, system, and method are disclosed for determining fan rotation direction. A first temperature detection module detects a first temperature at a first location between a fan and a heat generating device. The fan provides cooling for the heat generating device by drawing air from the heat generating device across the first location to the fan when the fan is rotating in a first direction. A second temperature detection module detects a second temperature at a second location where the heat generating device is between the second location and the fan such that heat from the heat generating device is drawn away from the second location when the fan is rotating in the first direction. A temperature comparison module determines if the second temperature is above the first temperature. A fan rotation error module generates a fan rotation error signal if the second temperature is above the first temperature.
    Type: Application
    Filed: January 30, 2008
    Publication date: July 30, 2009
    Applicant: International Business Machines Corporation
    Inventors: Chu Te Chung, C. Charles Dishman, Jen-Ching Lin, Randhir S. Malik
  • Publication number: 20090175310
    Abstract: The input energies provided to a print head of a thermal printer are adjusted based on the temperature of a platen in the thermal printer. The platen temperature may be measured by a sensor or predicted by a platen temperature model. Such a model may derive the predicted platen temperature from an observed temperature of a heat sink in the thermal printer. A thermal history control algorithm may use the platen temperature, whether actual or predicted, to compensate for the platen temperature by adjusting the input energies.
    Type: Application
    Filed: January 7, 2008
    Publication date: July 9, 2009
    Inventors: Suhail S. Saquib, Brian Busch
  • Patent number: 7481574
    Abstract: A thermal flow rate sensor includes: a bridge circuit having a heat-generating resistor generating heat by receiving a supplied current, a heating element temperature detector having a resistance value varying in accordance with a temperature of the heat-generating resistor and a fluid temperature detector having a resistance value varying in accordance with a temperature of a fluid; a comparison portion supplying a digital output indicating a difference between voltages at intermediate points in the bridge circuit; a DA converter converting an output from the comparison portion to an analog signal and supplying the resultant signal to the heat-generating resistor as the current; and an output operation portion accumulating outputs from the comparison portion for a prescribed period to output a result of accumulation as a flow rate for the prescribed period, of the fluid which is an object of measurement.
    Type: Grant
    Filed: May 3, 2006
    Date of Patent: January 27, 2009
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Yuji Ariyoshi
  • Patent number: 7473028
    Abstract: A device and method for investigating phase transformation properties and structural changes of materials. In one form, the device simulates actual thermal processing conditions, while the method can be used in both simulations as well as in actual processing conditions. An analysis using at least one of the device and method is referred to as a single sensor differential thermal analysis, as it compares the temperature recorded in a measured specimen against a reference thermal history without requiring the derivation of the reference thermal history from measured reference temperatures.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: January 6, 2009
    Assignee: The Ohio State University
    Inventors: Boian Todorov Alexandrov, John C. Lippold, Seth Jason Norton
  • Publication number: 20080304540
    Abstract: A thermal measurement apparatus and method for performing heat flux differential scanning calorimetry (DSC) is disclosed. A variable thermal resistor is used to couple a measurement assembly to a heat sink in the thermal measurement apparatus, such that samples can be rapidly heated and rapidly cooled. The apparatus can be configured with a highly conductive sample assembly enclosure. The enclosure can include a high emissivity coating. In one embodiment, the enclosure extends along a longitudinal direction that is about the same as that of an infrared lamp assembly used to heat the enclosure, thereby increasing the efficiency of heating the sample enclosure. In one configuration, the variable thermal resistor comprises a gap whose gas composition can be varied during a sample measurement to independently optimize sample heating and cooling rates.
    Type: Application
    Filed: May 30, 2008
    Publication date: December 11, 2008
    Applicant: Waters Investments Limited
    Inventor: Robert L. Danley
  • Publication number: 20080279249
    Abstract: A thermal analysis apparatus possesses a temperature sensor measuring a temperature of a heating furnace inside, a temperature program setter which can set a temperature program and outputs a temperature program signal, a temperature control section adjusting a supply electric power to a heater in compliance with a difference between the temperature program signal and a detection signal of the temperature sensor, a processor section calculating an air flow rate corresponding to a program temperature, and a mass flow controller which adjusts an air flow rate supplied to the heating furnace inside in compliance with a signal of the air flow rate calculated by the processor section. In the processor section, operation expressions calculating the air flow rate are set so as to differ respectively in a higher temperature side and a lower temperature side than a predetermined boundary temperature.
    Type: Application
    Filed: August 20, 2007
    Publication date: November 13, 2008
    Inventors: Kanji NAGASAWA, Rintaro NAKATANI
  • Patent number: 7425896
    Abstract: A tag testing device uses an infrared camera to take an image of a plurality of radio frequency identification tags, compares the image with a stored standard tag pattern image storage, and detects defective tags based on the comparison. A radio wave transceiver bulk reads the tags using anti-collision, a tag response counter counts a number of tag responses, and a defective tag detector compares a number of heat emitting tags based upon the image processing with a number of tag responses counted by the tag response counter. If the number of heat emitting tags does not match a number of responsive tags, a number of the tags tested are changed by partially shielding the tags and the radio wave transceiver repeatedly bulk reads the tags using the anti-collision function while a shielding range is gradually changed, thereby narrowing down other possible defective but heat emitting tags.
    Type: Grant
    Filed: November 22, 2005
    Date of Patent: September 16, 2008
    Assignees: Fujitsu Limited, Fujitsu Frontech Limited
    Inventor: Hiroshi Kawamata
  • Publication number: 20080181281
    Abstract: A thermal analysis apparatus includes: a sample temperature control device for surrounding a sample placed on a measurement position and controlling the temperature of the sample; a balance beam for supporting the sample and capable of tilting about a pivot point; and a sample moving device that allows the balance beam to slide between a first position at which the sample is situated at the measurement position and a second position at which the sample is situated at a distant position which is a position outside the sample temperature control unit. The distant position is a position which is deviated laterally from a line trajectory extending from the measurement position to the outside of the sample temperature control device. When the sample is at the measurement position, the balance beam is allowed to linearly slide and subsequently to rotationally slide about an axial line, to thereby transport the sample from the measurement position to the distant position.
    Type: Application
    Filed: September 26, 2007
    Publication date: July 31, 2008
    Applicant: RIGAKU CORPORATION
    Inventor: Nobuhiro TANAKA
  • Patent number: 7392150
    Abstract: An electronic device is proposed for accompanying a perishable good during one period to monitor the exposure of the good to an environmental parameter, such as temperature. The device includes a data interface for receiving data representing the exposure of the good to the environmental parameter during an immediately preceding period. It further includes a sensor for measuring the environmental parameter. Also, the device includes a processor for using a relationship specific to the good (such an Arrhenius equation for that good) to compute a characteristic of the good at the end of the one period using the received data and the output of the sensor. The device further includes a memory for recording the output of the sensor. To economise on memory usage, data is stored at a faster rate during periods when the data is of most significant (e.g. it indicates a high temperature).
    Type: Grant
    Filed: October 22, 2002
    Date of Patent: June 24, 2008
    Assignee: 3M Innovative Properties Company
    Inventors: Anton Kuepper, Karl-Heinz Romann
  • Patent number: 7338640
    Abstract: A method of manufacturing a sensor is provided. The method includes disposing a sacrificial layer on a substrate, disposing a low-thermal-conductivity layer on the sacrificial layer, and disposing a first set of conductive arms and a second set of conductive arms on the low-thermal-conductivity layer to form a plurality of thermal junctions. The plurality of thermal junctions is adapted to form a plurality of hot junctions and a plurality of cold junctions when subjected to a difference in temperature. The method also includes removing the sacrificial layer and a portion of the low-thermal-conductivity layer to form a cavity therein. The cavity is configured to provide insulation for the plurality of hot junctions. A thermopile sensor is also provided, and a calorimetric gas sensor implementing the thermopile sensor is provided.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: March 4, 2008
    Assignee: General Electric Company
    Inventors: Sunil Srinivasa Murthy, Anis Zribi, Shankar Chandrasekaran
  • Patent number: 7287903
    Abstract: An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, uniform cooling and heating of the samples. The samples are preferably uniformly spaced to allow for uniform air flow. The samples are mounted in slots which are preferably oriented radially outward from the opening. The sample mounts comprise electrical connectors which form a network connected to at least one ohmmeter for measuring the resistance of the samples. The samples preferably comprise test coupons, each with multiple daisy-chained nets of vias or other components to be tested. Also a method for thermal testing of samples consisting of steps to characterize the samples before the test is run.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: October 30, 2007
    Assignee: Conductor Analysis Technologies, Inc.
    Inventors: Timothy A. Estes, Robert Neves
  • Patent number: 7275862
    Abstract: A differential scanning calorimeter has a heat sink for accommodating therein a measurement sample and a reference material, and a differential heat flow detector that detects a temperature difference between the sample and the reference material. A cooling mechanism cools the heat sink, and a thermoconductor is disposed between the cooling mechanism and the heat sink and forms a heat flow path between the two. A first heater heats the heat sink, and a second heater heats the thermoconductor to thereby heat the heat sink. The second heater begins operating before the first heater nears its rated maximum output power.
    Type: Grant
    Filed: November 17, 2004
    Date of Patent: October 2, 2007
    Assignee: SII NanoTechnology Inc.
    Inventors: Shinya Nishimura, Rintaro Nakatani, Ryoichi Kinoshita
  • Patent number: 6885964
    Abstract: In a method and an apparatus for thermal analysis, a target region is divided by dividing the geometry of the target object of the thermal analysis into a finite number of finite elements or cells. The thermal analysis on the target region is conducted using the results of the division. A temperature distribution on the target object is obtained from the heat transfer coefficients by a temperature distribution calculating unit. The actual temperatures at specific points are obtained based on temperature distribution obtained by the specific point temperature calculating unit. Differences between the actually obtained temperatures at the specific points and the predetermined target temperatures at the specific points are obtained by a difference calculating/determining unit. If the differences are determined to be out of the prescribed range, the heat transfer coefficients are changed by a heat transfer coefficient updating unit.
    Type: Grant
    Filed: July 26, 2002
    Date of Patent: April 26, 2005
    Assignee: Honda Giken Kogyo Kabushiki Kaisha
    Inventors: Takashi Ogino, Hirotaka Murakami
  • Patent number: 6869214
    Abstract: A calorimeter that includes a sample cell, a reference cell, a pressure system that applies a variable pressure to the sample cell, and a pressure controller that controls the pressure applied by the pressure system to the sample cell. By applying identical pressure perturbations to both the sample and reference cells over a range of temperatures, the calorimeter can be used to accurately calculate both the thermal coefficient of expansion of various substances, and the volume change of molecules undergoing a structural transition.
    Type: Grant
    Filed: January 30, 2003
    Date of Patent: March 22, 2005
    Assignee: MicroCal LLC
    Inventors: Valerian V. Plotnikov, John F. Brandts, J. Michael Brandts
  • Publication number: 20040001524
    Abstract: A method and apparatus for thermally investigating a material by driving the material through a temperature profile composed of isothermal and non-isothermal segments is disclosed, which enable determination of a kinetic component in a measured heat flow signal caused by the exposure of the material to the temperature profile.
    Type: Application
    Filed: June 9, 2003
    Publication date: January 1, 2004
    Inventors: Urs Jorimann, Thomas Hutter
  • Publication number: 20030214994
    Abstract: A thermocycler comprising a temperature control block (1,2,3) which is designed to receive several specimens and which is fitted with a control unit (6) that in consecutive cycles applies the different temperature levels (40° C., 70° C., 95° C.) of a PCR procedure to said block, said thermocycler being characterized in that said temperature controlling block is sub-divided into thermally separate segments (1, 2, 3) each of which is controlled separately and receives several specimens, the control unit (6) being designed to drive the said segments at different cycling rates (nine, seven, four).
    Type: Application
    Filed: May 13, 2003
    Publication date: November 20, 2003
    Applicant: EPPENDORF AG
    Inventors: Kirsten Schicke, Claudia Hofmann
  • Patent number: 6632015
    Abstract: With input compensation-type differential scanning calorimeters of the related art, the power supplied fluctuated even with non-endothermic reference materials, and the reference material side temperature therefore also fluctuated. Mutual interference between feedback loops also made precise temperature control difficult. In the present invention, power supplied to the sample side is changed to compensate for a temperature difference between the sample side and the reference material side using a differential thermal feedback loop, power to be supplied to the reference material side heater to make the reference material side temperature correspond to the program temperature is controlled, and the same amount of the power is also supplied to the sample side with the average temperature feedback loop.
    Type: Grant
    Filed: April 18, 2001
    Date of Patent: October 14, 2003
    Assignee: Seiko Instruments Inc.
    Inventor: Jun Nagasawa
  • Publication number: 20030189966
    Abstract: A thermostat assembly for opening and closing an electrical circuit in response to the temperature within a measurement region. The thermostat assembly includes a relatively low-cost bimetal disc thermostat, but may be used in circumstances where temperature or other conditions exceed the design limitations of the bimetal disc thermostat. An elongated probe has a distal end arranged to extend at least to the measurement region, and a heat-disseminating end in thermal contact with a thermally-conductive outer housing surface of the bimetal disc thermostat.
    Type: Application
    Filed: March 21, 2003
    Publication date: October 9, 2003
    Applicant: Woodlane Environmental Technology, Inc.
    Inventor: Gregory M. McCarren
  • Patent number: 6626567
    Abstract: A cooling system for thermal analysis equipment provides rapid cool down and steady state operation of a differential scanning calorimeter (DSC) at any predetermined temperature between a minimal temperature and room temperature using a throttle-cycle cooler based on a single stage compressor. The cooling system operates with a mixed refrigerant that includes some liquid fraction at the inlet to a cryostat that houses the key cold elements for the cooling system. A temperature actuated automatic throttle valve in the cooling system increases refrigerant mass flow rate when the differential scanning calorimeter increases the heat load (and vice-versa) that is generally provided by a heater. At the same time, the valve design provides a high mass flow during cool down and automatic flow rate reduction at an intermediate temperature as the overall system approaches an operating condition during cool down.
    Type: Grant
    Filed: July 12, 2001
    Date of Patent: September 30, 2003
    Inventor: Mikhail Boiarski
  • Patent number: 6616330
    Abstract: An automatic humidity step control thermal analysis apparatus has a detector for detecting and measuring a physical property of a sample and for generating a physical property signal corresponding to the physical property of the sample. The sample is housed in a sample chamber which is capable of controlling the temperature and humidity of the sample. A water chamber generates water vapor at a preselected temperature and is capable of controlling the temperature of water in the water chamber in a stepwise manner. A heat insulating pipe directs water vapor from the water chamber to the sample chamber and includes a heater for preventing dew condensation. A signal stability determination circuit receives a physical property signal from the detector and generates a trigger signal when a rate of change of the physical property signal drops below a preselected reference value.
    Type: Grant
    Filed: October 26, 2001
    Date of Patent: September 9, 2003
    Assignees: Seiko Instruments Inc., Chugai Seiyaku Kabushiki Kaisha
    Inventors: Nobutaka Nakamura, Toshihiko Nakamura, Noriyuki Takata