Detail Of Electrical Heating Control Patents (Class 374/11)
  • Patent number: 6632015
    Abstract: With input compensation-type differential scanning calorimeters of the related art, the power supplied fluctuated even with non-endothermic reference materials, and the reference material side temperature therefore also fluctuated. Mutual interference between feedback loops also made precise temperature control difficult. In the present invention, power supplied to the sample side is changed to compensate for a temperature difference between the sample side and the reference material side using a differential thermal feedback loop, power to be supplied to the reference material side heater to make the reference material side temperature correspond to the program temperature is controlled, and the same amount of the power is also supplied to the sample side with the average temperature feedback loop.
    Type: Grant
    Filed: April 18, 2001
    Date of Patent: October 14, 2003
    Assignee: Seiko Instruments Inc.
    Inventor: Jun Nagasawa
  • Publication number: 20030189966
    Abstract: A thermostat assembly for opening and closing an electrical circuit in response to the temperature within a measurement region. The thermostat assembly includes a relatively low-cost bimetal disc thermostat, but may be used in circumstances where temperature or other conditions exceed the design limitations of the bimetal disc thermostat. An elongated probe has a distal end arranged to extend at least to the measurement region, and a heat-disseminating end in thermal contact with a thermally-conductive outer housing surface of the bimetal disc thermostat.
    Type: Application
    Filed: March 21, 2003
    Publication date: October 9, 2003
    Applicant: Woodlane Environmental Technology, Inc.
    Inventor: Gregory M. McCarren
  • Patent number: 6626567
    Abstract: A cooling system for thermal analysis equipment provides rapid cool down and steady state operation of a differential scanning calorimeter (DSC) at any predetermined temperature between a minimal temperature and room temperature using a throttle-cycle cooler based on a single stage compressor. The cooling system operates with a mixed refrigerant that includes some liquid fraction at the inlet to a cryostat that houses the key cold elements for the cooling system. A temperature actuated automatic throttle valve in the cooling system increases refrigerant mass flow rate when the differential scanning calorimeter increases the heat load (and vice-versa) that is generally provided by a heater. At the same time, the valve design provides a high mass flow during cool down and automatic flow rate reduction at an intermediate temperature as the overall system approaches an operating condition during cool down.
    Type: Grant
    Filed: July 12, 2001
    Date of Patent: September 30, 2003
    Inventor: Mikhail Boiarski
  • Patent number: 6616330
    Abstract: An automatic humidity step control thermal analysis apparatus has a detector for detecting and measuring a physical property of a sample and for generating a physical property signal corresponding to the physical property of the sample. The sample is housed in a sample chamber which is capable of controlling the temperature and humidity of the sample. A water chamber generates water vapor at a preselected temperature and is capable of controlling the temperature of water in the water chamber in a stepwise manner. A heat insulating pipe directs water vapor from the water chamber to the sample chamber and includes a heater for preventing dew condensation. A signal stability determination circuit receives a physical property signal from the detector and generates a trigger signal when a rate of change of the physical property signal drops below a preselected reference value.
    Type: Grant
    Filed: October 26, 2001
    Date of Patent: September 9, 2003
    Assignees: Seiko Instruments Inc., Chugai Seiyaku Kabushiki Kaisha
    Inventors: Nobutaka Nakamura, Toshihiko Nakamura, Noriyuki Takata
  • Patent number: 6583391
    Abstract: A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample (7) and a heat source (1) and evaluating a functional relation between the measured heat flow (HF) and an associated temperature is based on controlling the heating power of the heat source (1) so as to cause the heat source to follow a temperature program (17) as a function of time superposed with a modulation (23) of the heating power.
    Type: Grant
    Filed: January 31, 2001
    Date of Patent: June 24, 2003
    Assignee: Mettler-Toledo GmbH
    Inventors: Urs Jörimann, Thomas Hütter
  • Patent number: 6551835
    Abstract: A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample and a heat source (1, 2) and ,evaluating a functional relation between the measured heat flow and an associated temperature is based on controlling the heating power of the heat source (1, 2) so as to cause the heat source to follow a temperature program (Tp) as a function of time superposed with a stochastic variation (FSIP), (FIG. 2).
    Type: Grant
    Filed: September 26, 2000
    Date of Patent: April 22, 2003
    Assignee: Mettler-Toledo GmbH
    Inventors: Jürgen Schawe, Ingo Alig, Dirk Lellinger
  • Patent number: 6530686
    Abstract: The sample temperature is roughly controlled according to a program temperature by a furnace temperature controller, and at the same time precisely controlled by a detector temperature controller. Also, if a temperature difference occurs, the supply powers to heaters separately provided close to the sample and reference are adjusted such that the temperature difference is returned to zero by a differential heat compensating circuit, outputting a difference in supply power as a differential heat flow.
    Type: Grant
    Filed: September 23, 1999
    Date of Patent: March 11, 2003
    Assignee: Seiko Instruments Inc.
    Inventor: Nobutaka Nakamura
  • Patent number: 6508585
    Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.
    Type: Grant
    Filed: November 30, 2001
    Date of Patent: January 21, 2003
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
  • Patent number: 6422742
    Abstract: A sample holder and a reference holder are arranged coaxially. Heat conductors making heat exchange with a heat sink are joined to the heat sink at the same position. The inside diameter of the heat sink can be made close to the diameter of the sample container without spoiling the stability of the baseline that is a feature of heat-flux DSC. The heat capacity of the heat sink can be decreased. Therefore, the response to the temperature as it is elevated and lowered can be improved greatly.
    Type: Grant
    Filed: December 2, 1998
    Date of Patent: July 23, 2002
    Assignee: Seiko Instruments Inc.
    Inventor: Ryoichi Kinoshita
  • Publication number: 20020085615
    Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.
    Type: Application
    Filed: November 30, 2001
    Publication date: July 4, 2002
    Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
  • Patent number: 6402369
    Abstract: Provided are, among other things, devices for and methods for performing thermal signature assays on a two or more samples in an array, using active/control base thermopiles, the method comprising: [a] performing a heat transfer to the two or more samples in each of a two or more containers, using at least one base thermopile in thermal communication with the two or more containers; and [b] determining a total heat transferred to the samples by the base thermopile in step [a]; and [c] sensing in real time a temperature difference between a first sample and a second sample of the two or more samples resulting from performing step [a].
    Type: Grant
    Filed: November 2, 1999
    Date of Patent: June 11, 2002
    Assignee: Sarnoff Corporation
    Inventors: David Norman Ludington, Thomas Louis Fare, Dominic Joseph Lo Iacono, Timothy James Davis, Helen Jiang Semus, Paul John Stabile, Frank Guarnieri, Russell Todd Granzow, Peter J. Zanzucchi, William Chiang
  • Patent number: 6393374
    Abstract: A method and apparatus for power throttling to manage the temperature of an IC. A temperature sensor is manufactured on the same die as the IC components. The temperature sensor generates an output in response to junction temperature of the IC components. A state machine is coupled to receive the output of the temperature sensor and to provide power reduction functions in response to the temperature sensor output exceeding a maximum thermal value. The maximum thermal value is less than the maximum allowable temperature of the IC corresponding to maximum power consumption. Thus, the invention reduces power consumption at a thermal value lower that a potentially catastrophic value rather than shutting down the IC when catastrophic failure is imminent.
    Type: Grant
    Filed: March 30, 1999
    Date of Patent: May 21, 2002
    Assignee: Intel Corporation
    Inventors: Linda J. Rankin, Edward A. Burton, Stephen H. Gunther, Jack D. Pippin
  • Publication number: 20020021740
    Abstract: A method for calculating sample heat flow in a differential scanning calorimeter. A preferred embodiment of the invention calculates the heat flow to the sample while accounting for the effect of heat storage in the sample pans and the difference in heating rate between sample and reference. Accounting for heat flow associated with the pans and the difference between sample and reference heating rates gives a more accurate sample heat flow measurement and improves resolution, which is the ability to separate closely spaced thermal events in the heat flow result.
    Type: Application
    Filed: January 24, 2001
    Publication date: February 21, 2002
    Inventor: Robert L. Danley
  • Publication number: 20020018509
    Abstract: A cooling system for thermal analysis equipment provides rapid cool down and steady state operation of a differential scanning calorimeter (DSC) at any predetermined temperature between a minimal temperature and room temperature using a throttle-cycle cooler based on a single stage compressor. The cooling system operates with a mixed refrigerant that includes some liquid fraction at the inlet to a cryostat that houses the key cold elements for the cooling system. A temperature actuated automatic throttle valve in the cooling system increases refrigerant mass flow rate when the differential scanning calorimeter increases the heat load (and vice-versa) that is generally provided by a heater. At the same time, the valve design provides a high mass flow during cool down and automatic flow rate reduction at an intermediate temperature as the overall system approaches an operating condition during cool down.
    Type: Application
    Filed: July 12, 2001
    Publication date: February 14, 2002
    Inventor: Mikhail Boiarski
  • Patent number: 6318890
    Abstract: A heat flow calorimeter comprises a single sample holder (5) in thermal contact with a heat source (1). A temperature difference over mutually spaced locations (11, 12) along a heat flow path between sample (23) and heat source (1) is measured. The measured signal (24, 25) is combined with a compensation signal from a signal source (34) to derive a compensated temperature difference signal representative of the net heat flow to sample (23), (FIG. 1).
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: November 20, 2001
    Assignee: Mettler-Toledo GmbH
    Inventors: Thomas Hütter, Urs Jörimann
  • Publication number: 20010038660
    Abstract: With input compensation-type differential scanning calorimeters of the related art, the power supplied fluctuated even with non-endothermic reference materials, and the reference material side temperature therefore also fluctuated. Mutual interference between feedback loops also made precise temperature control difficult. In the present invention, power supplied to the sample side is changed to compensate for a temperature difference between the sample side and the reference material side using a differential thermal feedback loop, power to be supplied to the reference material side heater to make the reference material side temperature correspond to the program temperature is controlled, and the same amount of the power is also supplied to the sample side with the average temperature feedback loop.
    Type: Application
    Filed: April 18, 2001
    Publication date: November 8, 2001
    Inventor: Jun Nagasawa
  • Patent number: 6275750
    Abstract: The present invention relates to a method and apparatus for setting heating conditions in a heating furnace wherein a temperature distribution of an object to be heated is measured required minimum times and thermal analysis for the object is performed, thereby optimally heating the object.
    Type: Grant
    Filed: July 16, 1998
    Date of Patent: August 14, 2001
    Assignee: Fujitsu Limited
    Inventors: Hiroki Uchida, Seiki Sakuyama
  • Patent number: 6238085
    Abstract: A sensor having an active sensing material exposed to the substance to be detected and an active reference material that is shielded from the substance to be detected. Thermocouples having a set of junctions proximate to the active sensing material and another set of junctions to the active reference material for measuring the temperatures at the respective materials. The junctions are connected differentially in that a difference of the two temperatures is measured. A heater is proximate and common to the two materials. Heat pulses may be applied to the materials via the heater and the temperatures are measured. If ambient factors or substances affect the active sensing material, its thermal response will be different than that of the active reference material, and a differential pulse-like indication of temperature will be detected.
    Type: Grant
    Filed: December 31, 1998
    Date of Patent: May 29, 2001
    Assignee: Honeywell International Inc.
    Inventors: Robert E. Higashi, Barrett E. Cole
  • Patent number: 6239415
    Abstract: In a thermal analysis process for investigating thermal phase transformations, a sample and a reference substance are placed into a furnace with rising temperature of a predetermined rate operated by a programmed temperature controller. The temperatures of the sample and reference substance are sensed by temperature sensors. The temperature difference is determined by a device having an output signal which is proportional to the temperature difference and which is generated by the known quasi-static heating technique. The temperature difference is automatically controlled continuously so that the thermal phase transformation of the sample takes place at a constant rate. The output signal which is function of time t, is integrated with respect to time by an integrating unit and the output signal of the integrating unit is further transformed into a signal dependent on the temperature of the sample.
    Type: Grant
    Filed: October 25, 1999
    Date of Patent: May 29, 2001
    Inventors: Ferenc Paulik, Edit Paulik Bessenyeyné, Krisztina Paulik Walther
  • Patent number: 6210035
    Abstract: A thermal analyzer includes a processor for processing a thermal analysis signal of a sample obtained by performing high-speed thermal analysis of the sample at an experimental heating rate. The processor includes a peak component calculator for calculating peak components of the thermal analysis signal, an activation energy calculator for calculating activation energy values based on the peak components of the thermal analysis signal, and a heating rate conversion and output device for estimating a second thermal analysis signal that would be obtained under a thermal analysis of the sample conducted at a desired heating rate different from the experimental heating rate based on the experimental heating rate and the activation energy values obtained by the activation energy calculator, the second thermal analysis signal being calculated based on the thermal analysis signal obtained at the experimental heating rate.
    Type: Grant
    Filed: November 25, 1998
    Date of Patent: April 3, 2001
    Assignee: Seiko Instruments Inc.
    Inventor: Nobutaka Nakamura
  • Patent number: 6146012
    Abstract: The DSC (DTA) signal waveform measured under an experimental heating rate condition is separated into a base line and individual basic peak elements, and the respective activation energies are calculated corresponding to each of basic peak elements separated. A DSC (DTA) signal that should be obtained at an another heating rate is estimated from the data obtained from the experimental heating rate and it is outputted. In this process, the temperature shift caused by heating rate difference is corrected using the values of activation energies obtained.
    Type: Grant
    Filed: January 15, 1999
    Date of Patent: November 14, 2000
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Rintaro Nakatani, Ryoichi Kinoshita
  • Patent number: 6095679
    Abstract: A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few .mu.m.sup.3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.
    Type: Grant
    Filed: April 21, 1997
    Date of Patent: August 1, 2000
    Assignee: TA Instruments
    Inventors: Azzedine Hammiche, Hubert Murray Montagu Pollock, Michael Reading, Mo Song
  • Patent number: 6062726
    Abstract: The method of detecting and identifying a substance in a sample requires the sample to be changed from a first temperature to a second temperature, the sample scanned with an instrument for measuring infrared radiation, the temperature difference between the temperature of the substance at the sample's first and second temperatures determined, and the substance identified based on this temperature difference. The infrared method allows for the objective determination of a substance in a sample without the necessity of the labor and time required in conventional methods and is especially suitable for detecting the presence of "stickies" in recycled paper.
    Type: Grant
    Filed: August 4, 1998
    Date of Patent: May 16, 2000
    Assignee: The Board of Trustees Western Michigan University
    Inventors: William K. Forester, Timothy J. Lobbes
  • Patent number: 5973299
    Abstract: A heater controller for allocating heaters to cool a thermal chamber of a scientific instrument evaporates cryogenic liquid to produce a coolant gas. The gas is injected into a chamber to cool a sample disposal therein. The controller allocates low-capacity heaters in compliance with IEC guidelines to prevent problems generally associated with switching of large current loads, such as heaters. In one embodiment, heaters are activated so as to avoid jump discontinuities by effectively averaging the power delivered by the heaters. A second embodiment reduces complexity by essentially disregarding the problem of the jump discontinuity. A third embodiment groups the heaters according to a binary grouping scheme. The heater controller of the present invention can be used to control temperature according to a user supplied temperature profile.
    Type: Grant
    Filed: September 11, 1997
    Date of Patent: October 26, 1999
    Assignee: TA Instruments, Inc.
    Inventor: John R. Reader, Jr.
  • Patent number: 5967659
    Abstract: A differential calorimeter includes sample and reference cells, a thermal shield surrounding these cells, heating devices thermally coupled to the thermal shield and the cells, a temperature monitoring system for monitoring temperature of the shield, cell temperatures and temperature differentials between the cells and the shield, and a control system. The control system has input lines to receive signals from the temperature sensors and output lines connected to the heating devices. The control system is configured to generate output signals for control of heating devices. A gain setting and scan rate are selected by means of a user interface. The output control signals are functions of input temperature signals and the user-selected gain setting, and also functions of input temperature signals and the user-selected scan rate using a mapping function stored in memory.
    Type: Grant
    Filed: September 16, 1998
    Date of Patent: October 19, 1999
    Assignee: MicroCal, Incorporated
    Inventors: Valerian V. Plotnikov, John F. Brandts, J. Michael Brandts
  • Patent number: 5876118
    Abstract: A calorimeter apparatus includes a facility for rapid cooling of a heating vessel therein. A jacket surrounds the vessel wall. A partition member between the jacket and the vessel wall defines an inlet plenum adjacent the jacket and a spatial gap adjacent the vessel wall. Pressurized cooling gas is conveyed into the inlet plenum after termination of heating the vessel. The partition member has a distributed plurality of orifices such that the gas is jetted through the orifices to impingement cool the vessel wall. The gas is discharged from the spatial gap through an outlet plenum at an end wall of the vessel. The plurality of orifices are distributed in a pattern of varying density across the partition member such that uniform cooling of the vessel wall by the jetted gas is effected.
    Type: Grant
    Filed: December 8, 1995
    Date of Patent: March 2, 1999
    Assignee: The Perkin-Elmer Corporation
    Inventor: Herman Vogel
  • Patent number: 5823677
    Abstract: The method of detecting and identifying a substance in a sample requires the sample to be changed from a first temperature to a second temperature, the sample scanned with an instrument for measuring infrared radiation, the temperature difference between the temperature of the substance and a reference temperature determined, and the substance identified based on this temperature difference. The infrared method allows for the objective determination of a substance in a sample without the necessity of the labor and time required in conventional methods and is especially suitable for detecting the presence of "stickies" in recycled paper.
    Type: Grant
    Filed: March 18, 1996
    Date of Patent: October 20, 1998
    Assignee: The Board of Trustees of Western Michigan
    Inventors: William K. Forester, Timothy J. Lobbes
  • Patent number: 5813763
    Abstract: A calorimeter includes sample and reference cells, a thermal shield surrounding these cells, a heating device thermally coupled to the thermal shield, temperature sensors for monitoring a temperature of the shield and a temperature differential between the shield and the cells, and a control system. The control system has an output line connected to the heating device and input lines to receive signals from the temperature sensors. The control system is configured to generate on its output line an output signal which is a function of both the input signals received on its input lines.
    Type: Grant
    Filed: October 11, 1996
    Date of Patent: September 29, 1998
    Assignee: Microcal Incorporated
    Inventors: Valerian V. Plotnikov, John F. Brandts, J. Michael Brandts
  • Patent number: 5672289
    Abstract: A Control circuit for a differential scanning calorimeter which includes a sample heater, a reference heater, a system for generating a sample heater DC voltage and a system for generating a reference heater DC voltage. A balanced operational amplifier arrangement is provided which includes a circuit for controlling the differential heater voltage and a circuit for independently controlling the average heater voltage, so that the average heater power and the differential heater power are independently controlled.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: September 30, 1997
    Assignee: The Perkin-Elmer Corporation
    Inventor: Michael J. O'Neill
  • Patent number: 5624187
    Abstract: A modulated differential scanning calorimeter ("MDSC") wherein the temperature of the sample and/or the reference is modulated by modulating the characteristics of a gas in thermal contact with the sample and or a reference. In a first embodiment, the major heat flow path between the sample/reference and the furnace is the purge gas in the furnace chamber. The composition of the purge gas in the furnace chamber of the DSC cell is modulated by alternately purging the DSC cell with a high thermal conductivity gas (e.g., helium) and with a low thermal conductivity gas (e.g., nitrogen), thus modulating the flow of heat to and from the cell. In a second embodiment, the sample and reference are heated (or cooled) by a temperature-controlling gas flowing around the sample and reference holders. The gas is heated by being passed through a furnace before it flows around the sample and the reference.
    Type: Grant
    Filed: June 2, 1995
    Date of Patent: April 29, 1997
    Assignee: TA Instruments, Inc.
    Inventor: Michael Reading
  • Patent number: 5599104
    Abstract: The temperature of a heat reservoir is varied according to a linear function which is AC modulated. At this time, the temperature difference between two points located in a heat flow path going from the heat reservoir to an unknown sample is measured. Also, the temperature difference between two points located in a heat flow path going from the heat reservoir to a reference sample is measured. These two pairs of points are arranged symmetrically. Then, the resulting signals are demodulated, and each signal is divided into an AC component and a low-frequency component. Using these signals, the DSC signal is separated into a heat capacity component and a latent heat component.
    Type: Grant
    Filed: September 23, 1994
    Date of Patent: February 4, 1997
    Assignee: Seiko Instruments Inc.
    Inventors: Nobutaka Nakamura, Yoshihiko Teramoto
  • Patent number: 5509733
    Abstract: The present invention is an infrared-heated differential thermal analyzing instrument. The instrument uses an actively cooled heat sink, and a heat flow restricting element connecting the heat sink to a differential thermal analysis sensor. An IR heater directs IR radiation onto the lateral surfaces of the heat sink and the heat flow restricting element. These lateral surfaces are polished and coated with a high IR reflectance coating, so that heat absorption is minimized. The IR heater preferably uses either elliptical or parabolic mirrors to focus the IR radiation onto the heat sink and the heat flow restricting element. A second embodiment of the invention uses two heat sinks, and two heat flow restricting elements, with one heat sink and one heat flow restricting element mounted on either side of the differential analysis thermal sensor.
    Type: Grant
    Filed: December 21, 1993
    Date of Patent: April 23, 1996
    Assignee: TA Instruments, Inc.
    Inventor: Robert L. Danley
  • Patent number: 5474385
    Abstract: The interpretation of dynamic differential calorimetry ("DDSC") data is enhanced by parsing the data according to whether it is obtained while the sample is being heated, cooled, or re-heated. Each DDSC scan is split up into three separate components, depending upon whether the sample is undergoing heating, cooling or reheating. Each component can then be analyzed separately to investigate the sample response to temperature change as the sample is being heated, cooled, or re-heated. Each file is deconvoluted separately, using a deconvolution routine that first removes the effect of the phase lag due to the instrument's finite response time.
    Type: Grant
    Filed: August 24, 1994
    Date of Patent: December 12, 1995
    Assignee: TA Instruments, Inc.
    Inventor: Michael Reading
  • Patent number: 5439291
    Abstract: The present invention is a modulated differential thermal analysis technique for determining the composition, phase, structure, identification, or other properties of a material that undergoes a transition as function of temperature or other driving variable. As applied to differential scanning calorimetric analysis (DSC), the preferred embodiment comprises (1) heating a sample of the material with a linear temperature ramp that is modulated with a sinusoidal heating rate oscillation; (2) simultaneously heating a reference at the same linear temperature ramp; (3) measuring the differential temperature of the sample and reference; and (4) deconvoluting the resultant heat flow signal into rapidly and non-rapidly reversible components.
    Type: Grant
    Filed: December 22, 1993
    Date of Patent: August 8, 1995
    Assignee: TA Instruments, Inc.
    Inventor: Michael Reading
  • Patent number: 5335993
    Abstract: A method and apparatus for measuring the thermal conductivity of materials using modulated differential scanning calorimetry (MDSC). Two MDSC heat capacity measurements are made consecutively. One measurement is made under conditions which ensure obtaining a fairly accurate value for the heat capacity of the material ("quasi-ideal conditions"). Another measurement is made under conditions such that the measured effective heat capacity differs from the accurate value of the heat capacity due to thermal conductivity effects. Generally, the non-ideal conditions differ from the ideal conditions by one parameter, such as the size of the sample, the modulation frequency used to measure the heat capacity, or, for thin films, the presence or absence of a specimen on the thin film. The thermal conductivity of the material is then calculated from the difference between the heat capacity measured under quasi-ideal conditions and the effective heat capacity measured under non-ideal conditions.
    Type: Grant
    Filed: June 30, 1993
    Date of Patent: August 9, 1994
    Assignee: TA Instruments, Inc.
    Inventors: Sanford M. Marcus, Michael Reading
  • Patent number: 5293404
    Abstract: A thermal analysis device with a sample transporting machine which automatically carries out pretreatment of a sample to quickly heat or cool it. The configuration includes an electric furnace, a temperature controller, a temperature program setter, a sample placing/removing program setter, and a sample transporter, wherein the said sample placing/removing program setter commands the said sample transporter to place the said sample in or remove it from the said electric furnace in synchronization with a synchronization signal from the said temperature program setter and in accordance with a preset sample placing/removing program and, hence, the said sample placing and removing operations (i.e. to place a sample in the electric furnace or, conversely to remove a sample from the electric furnace) are carried out in the electric furnace which is performing a heating operation or a cooling operation in accordance with a temperature program output by the said temperature program setter.
    Type: Grant
    Filed: November 27, 1991
    Date of Patent: March 8, 1994
    Assignee: Seiko Instruments Inc.
    Inventor: Haruo Takeda
  • Patent number: 5248199
    Abstract: The present invention is a spatially-resolved differential analysis technique. A modulated differential analysis technique is applied using a proximal probe to obtain a spatially resolved characterization of a heterogeneous sample comprising at least two phases. As applied to spatially-resolved modulated differential scanning calorimetry, the present invention comprises a thermocouple probe that is scanned over the sample surface. The differential temperature of the area of the sample just beneath the thermocouple probe is obtained with respect to the temperature of a reference. The temperature of the sample and the reference is modulated above and below a transition temperature for one phase of the sample. The signal from the thermocouple probe is deconvoluted to obtain an image of the sample delineating the regions of the sample having that phase.
    Type: Grant
    Filed: May 26, 1992
    Date of Patent: September 28, 1993
    Assignee: TA Instruments, Inc.
    Inventor: Michael Reading
  • Patent number: 5228778
    Abstract: A heat analyzer equipped to automatically perform operations necessary for protection of measured data and for restart when a problem occurs or a measurement ends and to quickly turn off all power sources by a command input manually by an operator to a system section after daily use. At least one measurement-section power source 6 which can be turned off by an associated measurement controller 5 and a system-section power source 14 which can be turned off by a system controller 11 are included.
    Type: Grant
    Filed: July 16, 1992
    Date of Patent: July 20, 1993
    Assignee: Seiko Instruments Inc.
    Inventor: Rintaro Nakatani
  • Patent number: 5224775
    Abstract: The present invention relates to differential analytical techniques for determining the composition, phase, structure, identification or other properties of a material that undergoes a transition as function of a driving variable. As applied to differential scanning calorimetric analysis (DSC), the preferred embodiment comprises: (1) heating a sample of the material with a linear temperature ramp that is modulated with a sinusoidal heating rate oscillation; and (2) deconvoluting the resultant heat flow signal into rapidly reversible and non-rapidly reversible components.
    Type: Grant
    Filed: March 2, 1992
    Date of Patent: July 6, 1993
    Assignee: TA Instruments, Inc.
    Inventors: Michael Reading, Brian K. Hahn, Benjamin S. Crowe
  • Patent number: 5198752
    Abstract: An electric probing-test machine comprises a probe card having a plurality of probes contacted with chips of a semiconductor wafer and serving to apply test signal to a tester which judges whether circuits on the chips of the wafer are correct or deficient, a main chuck for holding the wafer at a test temperature, a system for cooling the main chuck, and a controller for controlling the cooling system. The main chuck includes a chuck top contacted directly with the wafer, a jacket arranged to conduct heat exchange relative to the chuck top, and a temperature sensor for detecting the temperature of the chuck top. The cooling system has a pump for supplying a coolant from a reservoir to the jacket. Responsive to temperature information detected by the temperature sensor, the amount of the coolant supplied from the reservoir to the jacket is controlled by the controller to thereby control the temperature of the chuck top.
    Type: Grant
    Filed: July 31, 1991
    Date of Patent: March 30, 1993
    Assignee: Tokyo Electron Limited
    Inventors: Eiji Miyata, Masahiko Sugiyama, Masahiko Kohno, Masataka Hatta
  • Patent number: 5193910
    Abstract: A thermal analysis instrument which is equipped with a cooling mechanism and device for blowing a drying gas so that when low temperature are being measured moisture is prevented from condensing on the upper end surface of the heating furnace and on a cover that closes the inside of the heating furnace to thereby prevent deposition of frost. Where a robot mechanism is added to this thermal analysis instrument equipped with the cooling mechanism, it is not necessary to impose additional functions on the robot mechanism. The device for blowing a drying gas presents an annular passage mounted near the upper end surface of the heating furnace for blowing the drying gas against the upper end surface and the cover to thereby prevent the deposition of frost.
    Type: Grant
    Filed: November 4, 1991
    Date of Patent: March 16, 1993
    Assignee: Seiko Instruments, Inc.
    Inventor: Ryoichi Kinoshita
  • Patent number: 5186540
    Abstract: A calorimetric calibration system includes a thermoelectric calibration heat pump device disposed between fluid supplying inlet and outlet pipes coupled to the waterload. The calibration heat pump device provides a controlled delta temperature to the fluid flowing through the pipes for providing a standard of reference for the calibration of calorimetric measurement systems relying on the conversion of RF or microwave energy to heat. The thermoelectric calibration heat pump device consumes a relatively low electrical power, is small in size, inexpensive to manufacture, and is safe to operate.
    Type: Grant
    Filed: December 30, 1991
    Date of Patent: February 16, 1993
    Assignee: Raytheon Company
    Inventors: Arthur L. Walsh, Barry E. Genereux
  • Patent number: 5108191
    Abstract: A method and the instrument associated therewith for determining the Curie points of ferromagnetic materials which display no significant abrupt change in heat absorption around the Curie points thereof by means of a conventional thermal analyzer with externally added facilities to provided an external magnetic field. The abrupt change of heat absorption of the ferromagnetic materials is increased by adding the external magnetic field to increase the magnetic anisotropy energy thereof and to strengthen the spontaneous magnetization thereof.
    Type: Grant
    Filed: September 12, 1990
    Date of Patent: April 28, 1992
    Assignee: Industrial Technology Research Institute
    Inventors: Ming-Sheng Leu, Chorng-Sheng Tsai, Ming-Jhy Jiang, Yng-Jye Yu, Chun-Sien Lin
  • Patent number: 5098196
    Abstract: A circuit for differential calorimetry includes a pair of resistance elements in a bridge circuit. Separate DC heating currents are effected in each element by high impedance current sources. An AC voltage is applied to the bridge. In measuring AC differental voltage between the elements, the DC is filtered out. The filtered AC differential voltage is fed back to effect a current differential between the heating currents to null the differential temperature causing the differential voltage. A similarly filtered average AC voltage on the elements is compared with a reference voltage, and the resulting error voltage is fed back to control the average of the heating currents. A very high impedance current source includes a voltage-current transducer with an output of a heating current passed through a monitor resistor, with matched resistances from both sides of the monitor connected back to positive and negative inputs to the transducer, and a control voltage applied across the inputs.
    Type: Grant
    Filed: January 4, 1991
    Date of Patent: March 24, 1992
    Assignee: The Perkin-Elmer Corporation
    Inventor: Michael J. O'Neill
  • Patent number: 5044764
    Abstract: A sensor comprising a heating element and a temperature detecting element used to measure a temperature of the heating element are both held out of contact with each other within a sensor protecting tube. For fluid exhibiting slow changes in its state as time elapses, a fluid state is measured on the basis of a differential temperature between temperatures prior to and during heating of the heating element. For the fluid exhibiting rapid changes in its state as time elapses, the sensor is caused to generate heat while the temperature of this sensor is measured, and a separate temperature measuring sensor measures the temperature of the fluid. The fluid state is determined on the basis of the differential temperature between the temperatures of the sensor and the temperatures of the fluid.
    Type: Grant
    Filed: March 1, 1990
    Date of Patent: September 3, 1991
    Assignee: Snow Brand Milk Products Co., Ltd.
    Inventors: Kazuichi Aoki, Yukihiro Saiki
  • Patent number: 4904090
    Abstract: A temperature sensor is incorporated within a housing having a silicon window through which infra-red radiation can enter. Mounted on a support structure is a semiconductor fabrication consisting of a reference junction and a sensing junction, covered with a black absorber. The reference junction is responsive to the temperature of the housing, whereas the sensing junction is responsive to the temperature of the housing and also the temperature of a remote zone from which infra-red radiation can enter the housing via the window. A Peltier heater/cooler controls the temperature of the housing, which temperature is monitored by a sensor to provide a measure of that of the remote zone.
    Type: Grant
    Filed: November 27, 1987
    Date of Patent: February 27, 1990
    Assignee: Thorn EMI plc
    Inventor: Colin C. Oliver
  • Patent number: 4897798
    Abstract: This adaptive environment control system provides an HVAC control system that adapts to the continually-changing thermal characteristics of the building in which it operates. The adaptive environment control system periodically estimates the thermal characteristics of the building and uses these estimates to control the operation of the HVAC system. The adaptive environment control system also periodically measures the performance characteristics of the HVAC system to obtain data with which to update these thermal characteristic estimates. These thermal characteristic estimates enable the adaptive environment control system to determine both the length of time it takes the building to heat up and cool down when the HVAC system idles, as well as the amount of time it takes the HVAC system to heat or cool the building.
    Type: Grant
    Filed: December 8, 1986
    Date of Patent: January 30, 1990
    Assignees: American Telephone and Telegraph Company, AT&T Information Systems Inc.
    Inventor: Lawrence J. Cler
  • Patent number: 4858155
    Abstract: Apparatus for controlling reaction temperatures in a chemical analyzer comprises a thermoelectric element operating in response to a temperature sensor, and control means capable of predicting a setpoint deviation for a future time period, and, when an overshoot is predicted, reducing a control signal for the element by an amount proportional to a current setpoint deviation. The apparatus includes at least one reaction cell and a buffer unit for thermally stabilizing a fluid that is fed, on demand, into the reaction cell, the cell and the buffer unit having separate thermoelectric elements and sensors. A microcomputer control system generates independent control signals for the elements.
    Type: Grant
    Filed: December 24, 1985
    Date of Patent: August 15, 1989
    Assignee: Beckman Instruments, Inc.
    Inventors: Dobson Okawa, Wing S. Pang, Dang Ngo, George Shibata
  • Patent number: 4848921
    Abstract: Apparatus and methods are disclosed for performing power compensation in a differential scanning calorimeter. The device operates by first subjecting only a reference material, in a single furnace, to a predetermined, variable, temperature program supplied by a program control. The values of the heating power supplied to the reference material are stored in a memory as a function of the temperature measured at the single furnace by a temperature sensor. The sample is then exposed, in the same furnace, to heating powers which are consecutively applied to the furnace, under program control, in accordance with the values stored in memory. The real temperatures of the sample are then measured by the temperature sensor. A supplementary compensating heating power is supplied to the sample, which power varies in accordance with the difference between the stored, programmed temperature and the real temperature in the sense of eliminating this temperature difference.
    Type: Grant
    Filed: September 22, 1986
    Date of Patent: July 18, 1989
    Assignee: Bodenseewerk Perkin-Elmer & Co., GmbH
    Inventor: Wolfgang Kunze
  • Patent number: 4783174
    Abstract: A continuously operating non-adiabatic, differential calorimeter, i.e., a differential isoperibol scanning calorimeter, for measuring the heat capacity of small samples typically from 10 milligrams to 50 milligrams, in a temperature range from about 1 Kelvin to about 100 Kelvin.
    Type: Grant
    Filed: August 18, 1986
    Date of Patent: November 8, 1988
    Assignee: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.v.
    Inventors: Eberhard Gmelin, Karl Ripka, Susanne Lederer