Of Susceptibility To Thermally Induced Deteriouration, Flaw, Or Failure Patents (Class 374/57)
  • Patent number: 5220824
    Abstract: A testing apparatus is described that enables both single and double-ended tubular members to be tested under pressure and at elevated temperatures. For double-ended tubular members, the apparatus comprises first and second pressure seals at either end of the tubular member under test, both seals including annular compliant members that bear upon the internal surface of the tubular member. A heater is positioned within the tubular member and one of the pressure seals has an orifice through which the heater is connected to a power source. Pressurization occurs through an orifice in the other pressure seal and cooling apparatus surrounds the first and second ends of the tubular member to cool the pressure seals, thereby enabling the annular compliant members to retain their compliancy when the tubular member is heated to test temperature. For single-ended tubular members, a single pressure seal is used having pathways for both electrical and pressurization connections to the interior of the tubular member.
    Type: Grant
    Filed: August 20, 1991
    Date of Patent: June 22, 1993
    Assignee: The Pennsylvania Research Corporation
    Inventors: David L. Shelleman, Darryl P. Butt, John R. Hellmann, Richard E. Tressler, John J. Mecholsky, Jr.
  • Patent number: 5193910
    Abstract: A thermal analysis instrument which is equipped with a cooling mechanism and device for blowing a drying gas so that when low temperature are being measured moisture is prevented from condensing on the upper end surface of the heating furnace and on a cover that closes the inside of the heating furnace to thereby prevent deposition of frost. Where a robot mechanism is added to this thermal analysis instrument equipped with the cooling mechanism, it is not necessary to impose additional functions on the robot mechanism. The device for blowing a drying gas presents an annular passage mounted near the upper end surface of the heating furnace for blowing the drying gas against the upper end surface and the cover to thereby prevent the deposition of frost.
    Type: Grant
    Filed: November 4, 1991
    Date of Patent: March 16, 1993
    Assignee: Seiko Instruments, Inc.
    Inventor: Ryoichi Kinoshita
  • Patent number: 5167451
    Abstract: The invention relates to a method for testing objects by thermal shock in a closed apparatus, comprising the following, preferably repeated steps:a) introducing the object to be tested into the apparatus,b) cooling the object by immersion in a liquid cold bath,c) drying the object above at least one cold trap or in at least one drying chamber,d) heating the object by immersion in a liquid hot bath ande) drying the object above at least one cold trap or in at least one drying chamber,the temperature difference between the hot bath and cold bath being 50 to 500 K., the temperature of the cold trap being 5-30 K. lower than the temperature of the cold bath and the temperature of the drying chamber being 10 to 50.degree. C. higher than the temperature of the hot bath, and the steps b) to e) being carried out in mutually separated parts of the apparatus, which are connected to one another via closable openings. The invention also relates to a device for testing objects by thermal shock.
    Type: Grant
    Filed: August 8, 1991
    Date of Patent: December 1, 1992
    Assignee: Hoechst Aktiengesellschaft
    Inventors: Walter Muller, Joachim Naumann, Ewald Preisegger, Martin Schnauber
  • Patent number: 5147136
    Abstract: Two environmental test zones at different temperatures are separated by an insulated wall. A portion of the wall is rotatable and is designed to hold a test specimen thereon. By rotating this portion of the insulated wall, the specimen is exposed to different temperature zones in recurrent cycles. The two temperature zones are readily separable for ease in removing and installing test specimens.
    Type: Grant
    Filed: May 20, 1991
    Date of Patent: September 15, 1992
    Assignee: Crane Plastics Company
    Inventors: Jeffrey W. Hartley, Burch E. Zelner
  • Patent number: 5143450
    Abstract: Apparatus (10) for handling devices for testing under varying temperature conditions is disclosed including a mechanical arm (32) pivotally mounted by a bearing (34) to a control portion (16) which is variably vertically positionable relative to a platform portion (14). An insert arm (38) is rotatably mounted within the mechanical arm (32) to reciprocally and rotatably mount a thermal socket (90) for mating with a contactor (126). The socket (90) is mounted to a vacuum cup (48) to allow position alignment as alignment pins (132) are initially slideably received in alignment notches (124) and when no vacuum is applied and is fixed in the aligned position after the application of vacuum. Thermal tubes (74) of probes (50) are reciprocal with the thermal socket (90) to provide thermally conditioned gas/air to the thermal socket (90). The thermal socket (90) provides a swirling action to the thermally conditioned gas/air to exit 360.degree.
    Type: Grant
    Filed: February 1, 1991
    Date of Patent: September 1, 1992
    Assignee: Aetrium, Inc.
    Inventors: Nathan R. Smith, Steven E. Schmitt
  • Patent number: 5138892
    Abstract: A method of carrying out an accelerated light fastness test on a sample of a material to be used under certain conditions of air convection along the surface thereof, is constituted by the steps of positioning a sample to be tested with the surface thereof which is exposed to light during intended conditions of use of the material spaced at a distance from a light source having a constant intensity of light radiated therefrom for causing the surface of the sample to receive a desired intensity of light, and positioning a filter between the surface of the sample and the light source and spaced a distance from the surface of the sample for causing air between the filter and the sample to be at the convection conditions corresponding to the certain conditions of air convection at the surface of the material under its intended conditions of use, whereby the temperature conditions of the material at the surface facing the source of light are made to correspond to the temperature conditions during the intended use
    Type: Grant
    Filed: May 16, 1990
    Date of Patent: August 18, 1992
    Assignee: Suga Test Instruments Co., Ltd.
    Inventor: Shigeru Suga
  • Patent number: 5131758
    Abstract: A sample in a wind tunnel is radiated from a thermal energy source exteriorly of the wind tunnel. A thermal imager system, also located exteriorly of the wind tunnel, reads surface radiations from the sample as a function of time. The produced thermal images are characteristic of the heat transferred from the sample to the flow across the sample. In turn, the measured rates of heat loss of the sample are characteristic of the flow and the sample.
    Type: Grant
    Filed: September 30, 1991
    Date of Patent: July 21, 1992
    Assignee: Administrator of the National Aeronautics and Space Administration
    Inventors: Joseph S. Heyman, D. Michele Heath, Christopher Welch, William P. Winfree, William E. Miller
  • Patent number: 5129443
    Abstract: A method of manufacturing a heat resistant member includes the step of designing the shape of the heat resistant member, including the substeps of estimating thermal stress of the heat resistant member by heating a model formed by a high-thermal expansion material which has a similar shape to the desired shape of the heat resistant member while the model is restrained and also while it is free. The high-thermal expansion material is different from the material of the member being modeled and has a thermal expansion coefficient greater than that of the material of the member being modeled. Additionally, the step of designing includes the substeps of measuring the strain of the model at each of a plurality of predetermined positions while the model is heated by strain gauges adhered to predetermined positions on the model, and calculating the stress at each predetermined position from the difference in measured strain values between the restraint state and the free state.
    Type: Grant
    Filed: July 3, 1991
    Date of Patent: July 14, 1992
    Assignee: Hitachi Metals, Ltd.
    Inventors: Mitsuru Yano, Hisashi Yasuda, Masatoshi Nakamizo, Takashi Hattori, Kenji Itoh
  • Patent number: 5118945
    Abstract: A process, apparatus and heat microscope for testing the properties of materials by the photothermal effect includes generating a laser beam with a laser light source integrated into a portable measuring head, emitting the laser beam toward a region of a surface of a material sample to be tested, and focussing the laser beam to a desired measurement point diameter at a target light spot with optics at an end toward the laser beam, for absorbing a proportion of the amount of light energy with irradiated volume elements of the material sample and emitting infrared light signals from the surface of the volume elements and volume elements adjacent thereto. The emitted IR light signals are conducted to an optical decoupling element for conducting the emited IR light signals further and largely suppressing components of the laser beam reflected at the surface of the sample.
    Type: Grant
    Filed: April 24, 1990
    Date of Patent: June 2, 1992
    Assignee: Siemens Aktiengesellschaft
    Inventors: Erich Winschuh, Harald Petry
  • Patent number: 5099908
    Abstract: A method and apparatus for maintaining an electrically operating device at a desired temperature during burn-in testing of the device includes immersing the device in a bath of an inert liquid having a boiling point less than the desired case temperature. The device generates heat during electrical operation which is transferred to the bath by nucleate boiling of the liquid. The device temperature is monitored until it stabilizes at a temperature between the boiling point of the liquid and the desired device temperature. An inert liquid having a boiling point greater than the desired device temperature is slowly added to the bath to modify the rate of nucleate boiling of the lower-boiling liquid, while the device temperature is simultaneously monitored, until the case temperature reaches the desired device temperature.
    Type: Grant
    Filed: December 20, 1990
    Date of Patent: March 31, 1992
    Assignee: Thermal Management, Inc.
    Inventors: Richard Taraci, Brian Taraci, Imre Gorgenyi
  • Patent number: 5083082
    Abstract: Perfluoropolyethers having an average molecular weight higher than 390 and respectively having a kinematic viscosity lower than 8.5 cSt (at 20.degree. C.), and such as to distill by not more than 10% at temperatures lower than 140.degree. C., and by at least 90% at temperatures not higher than 260.degree. C., or, in the case in which the perfluoropolyether does not contain CF (CF.sub.3) CF.sub.2 O units, having a viscosity lowr than 18 cSt (at 20.degree. C.), and such as to distill by not more than 10% at temperatures lower than 140.degree.C., and by at elast 90% at temperatures not higher than 280.degree. C., are used as the only high-temperature and low-temperature working fluid in the Thermal Shock Tests to which the electronic components are submitted, and at the same time are advantageously used in other tests used in the electronic industry, such as the Gross Leak Test and the Burn in Test, allowing the operators in this field to use only single fluid for a whole set of uses.
    Type: Grant
    Filed: April 24, 1990
    Date of Patent: January 21, 1992
    Assignee: Montedison S.p.A.
    Inventors: Gianangelo Bargigia, Gerardo Caporiccio, Claudio Tonelli, Luciano Flabbi, Giuseppe Marchionni
  • Patent number: 5062119
    Abstract: A method of detecting coated fuel particles having a broken ceramic coated layer in coated fuel particles for high-temperature gas-cooled reactor which comprises permeating a liquid into the interior of the coated fuel particles having a broken ceramic coated layer through a broken portion of the ceramic coated layer, thereafter heating it to expand the liquid by evaporation pyrolysis thereby breaking the ceramic coating layer or the whole body of coated fuel particle by pressure generated.
    Type: Grant
    Filed: December 5, 1990
    Date of Patent: October 29, 1991
    Assignee: Japan Atomic Energy Research Institute
    Inventors: Fumiaki Kobayashi, Kosaku Fukuda
  • Patent number: 5048346
    Abstract: A method of estimating a thermal stress of a heat-resistant member, part or the whole of which is to be heated to a high temperature, comprising heating a model formed by a high-thermal expansion material and having a shape similar to that of the heat-resistant member; and measuring a thermal strain of the model at each of predetermined positions by strain gauges adhered thereto.
    Type: Grant
    Filed: March 29, 1990
    Date of Patent: September 17, 1991
    Assignee: Hitachi Metals, Ltd.
    Inventors: Mitsuru Yano, Hisashi Yasuda, Masatoshi Nakamizo, Takashi Hattori, Kenji Itoh
  • Patent number: 5039228
    Abstract: A fixtureless environmental screening device is provided for the testing of mechanical, electromechanical and electrical devices. The apparatus uses a relatively incompressible fluid having a high heat capacity and a high heat of vaporization to transfer heat and vibration to a device to be tested. The heat transfer characteristics of the fluid permits a device tested to undergo rapid temperature change while being simultaneously subjected to vibrational cycling. By utilizing a fluid as a vibration transmission medium expensive fixtures are avoided so that devices of a wide variety of shapes and sizes may be readily tested. The dielectric properties of the working fluid permits energization of electrical devices during the course of vibration and temperature cycling.
    Type: Grant
    Filed: November 2, 1989
    Date of Patent: August 13, 1991
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Richard H. Chalmers
  • Patent number: 5020920
    Abstract: A method and apparatus for generating thermal waves in a sample and for measuring thermal inhomogeneities at subsurface levels using millimeter-wave radiometry. An intensity modulated heating source is oriented toward a narrow spot on the surface of a material sample and thermal radiation in a narrow volume of material around the spot is monitored using a millimeter-wave radiometer; the radiometer scans the sample point-by-point and a computer stores and displays in-phase and quadrature phase components of thermal radiations for each point on the scan. Alternatively, an intensity modulated heating source is oriented toward a relatively large surface area in a material sample and variations in thermal radiation within the full field of an antenna array are obtained using an aperture synthesis radiometer technique.
    Type: Grant
    Filed: November 3, 1989
    Date of Patent: June 4, 1991
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Nachappa Gopalsami, Apostolos C. Raptis
  • Patent number: 4995273
    Abstract: A method of and apparatus for weather resistance test comprising a process for washing the surface of samples with a cleaner which is added at least between a process for condensing moisture on the surface of the sample after ultraviolet radiation has been applied and the process for again applying ultraviolet radiation after the process for condensing moisture. Impurities adhered to the surface of the sample and substances extracted on the surface of the sample can be removed by washing with the cleaner so that the surface of the sample to which these impurities and substances are adhered intact can be protected from being baked in the ensuing ultraviolet radiation application process. Consequently, generation of spot patterns and excessive color change of the surface of the sample can be prevented.
    Type: Grant
    Filed: May 18, 1989
    Date of Patent: February 26, 1991
    Assignee: Dainippon Plastics Co., Ltd.
    Inventors: Yoshio Kisima, Teruo Iwanaga, Hitoshi Goto
  • Patent number: 4989991
    Abstract: An improved method and apparatus are disclosed for calibrating the emissivity characteristics of a semiconductor wafer within a processing chamber by supporting a sample wafer on a graphite susceptor within the chamber and by comparing the temperature measured within the susceptor in close proximity to the center of the wafer with the temperature measured by the emission of radiation from the surface of the wafer through the walls of the processing chamber. Temperature measurements subsequently made from the radiation emitted from the surface of similar wafers are corrected with reference to the measurement made of the temperature within the susceptor on the sample wafer.
    Type: Grant
    Filed: June 12, 1989
    Date of Patent: February 5, 1991
    Assignee: AG Processing Technologies, Inc.
    Inventors: Michel Pecot, Jaim Nulman
  • Patent number: 4972720
    Abstract: A method and apparatus for characterizing bonding properties in compositions which utilizes thermal energy to cause controlled debonding of interface and/or interply bonds. Debonding events resulting from the controlled debonding are detected and utilized to characterize the interface and/or interply properties of the composition.
    Type: Grant
    Filed: September 20, 1989
    Date of Patent: November 27, 1990
    Assignee: The United States of America as represented by the Secretary of Commerce
    Inventor: Wen-li Wu
  • Patent number: 4957011
    Abstract: A testing system for determining accelerated weathering characteristics of various items such as fabrics and paint samples. Rack means are provided for carrying samples to be tested. A source of irradiation of the inner-facing surfaces of the samples carried on the rack is also provided, along with a blower system for directing a stream of air through the rack. In accordance with this invention, a generally conical member is positioned in the stream of air to redirect the stream outwardly in a generally conical flow path. The generally conical flow path is positioned by the conical member to flow across the inner-facing surfaces of the samples carried on the rack.
    Type: Grant
    Filed: May 1, 1989
    Date of Patent: September 18, 1990
    Assignee: Atlas Electric Devices Co.
    Inventors: James V. Huber, Kurt P. Scott, Rudolph J. Leber
  • Patent number: 4955726
    Abstract: Perfluoropolyethers having an average molecular weight higher than 390 and respectively having a kinematic viscosity lower than 8.5 cSt (at 20.degree. C.), and such as to distill by not more than 10% at temperatures lower than 140.degree. C., and by at least 90% at temperatures not higher than 260.degree. C., or, in the case in which the perfluoropolyether does not contain CF(CF.sub.3)CF.sub.2 O units, having a viscosity lower than 18 cSt (at 20.degree. C.), and such as to distill by not more than 10% at temperatures lower than 140.degree. C., and by at least 90% at temperatures not higher than 280.degree. C., are used as the only high-temperature and low-temperature working fluid in the Thermal Shock Tests to which the electronic components are submitted, and at the same time are advantageously used in other tests used in the electronic industry, such as the Gross Leak Test and the Burn in Test, allowing the operators in this field to use one single fluid for a whole set of uses.
    Type: Grant
    Filed: May 16, 1988
    Date of Patent: September 11, 1990
    Assignee: Montedison S.p.A.
    Inventors: Gianangelo Bargigia, Gerardo Caporiccio, Claudio Tonelli, Luciano Flabbi, Giuseppe Marchionni
  • Patent number: 4926342
    Abstract: A method for accumulating stress damage induced by temperature differentials in a rotor of a high pressure steam turbine utilizes a representation of stress damage corresponding to a period of continuous temperature change. A counter variable associated with the representation of stress damage is incremented each time there is a significant change in direction of change in stress induced in the rotor. Accumulated stress damage is calculated by summing the products of each counter variable times a coefficient of stress damage corresponding to that counter variable. Accumulated stress damage is added to previously accumulated stress damage, calculated prior to resetting of the counter variables, to produce total accumulated stress damage. The total accumulated stress damage is printed on a permanent storage medium, such as paper, and it is compared with an alarm setpoint. If the alarm setpoint is exceeded, a message is sent to the operator and the operation of the steam turbine may also be adjusted.
    Type: Grant
    Filed: December 31, 1987
    Date of Patent: May 15, 1990
    Assignee: Westinghouse Electric Corp.
    Inventors: Edward Y. Hwang, Michael P. Chow
  • Patent number: 4865461
    Abstract: An apparatus for use in determining a thermal characteristic of a specimen includes first and second chucks for engaging two regions of the specimen, a first chuck mounting mechanism for supporting the first chuck in relatively fixed orientation, and a second chuck mounting mechanism. The second chuck mounting mechanism supports the second chuck in relatively movable orientation relative to the first chuck to permit variations in the spacing between the first and second chucks occasioned by thermal variations in the specimen. A base supports the first and second chuck mounting mechanisms. A laser is provided for heating a third region of the specimen lying between the two regions to a different temperature than the two regions. An infrared detector is provided for detecting radiation emitted from the third region.
    Type: Grant
    Filed: February 25, 1988
    Date of Patent: September 12, 1989
    Assignee: Purdue Research Foundation
    Inventors: Raymond E. Taylor, Hans Groot, Weldon E. Vaughn
  • Patent number: 4854727
    Abstract: An improved method and apparatus are disclosed for calibrating the emissivity characteristics of a semiconductor wafer within a processing chamber by supporting a sample wafer on a graphite susceptor within the chamber and by comparing the temperature measured within the susceptor in close proximity to the center of the wafer with the temperature measured by the emission of radiation from the surface of the wafer through the walls of the processing chamber. Temperature measurements subsequently made from the radiation emitted from the surface of similar wafers are corrected with reference to the measurement made of the temperature within the susceptor on the sample wafer.
    Type: Grant
    Filed: October 26, 1987
    Date of Patent: August 8, 1989
    Assignee: AG Processing Technologies, Inc.
    Inventors: Michel Pecot, Jaim Nulman
  • Patent number: 4854726
    Abstract: An environmental chamber for providing thermal stress screening is comprised of a plurality of modular components which may be quickly assembled and disassembled for ease of maintenance and repair. In particular, a heater/cooling unit is coupled by means of a plurality of quick release lockable fasteners to a plenum module. The plenum module in turn is coupled by means of additional quick release lockable fasteners to a blower module. The plenum module in turn is comprised of a heater plenum which communicates with a blower plenum. Gas is drawn into the heater plenum and passed over heating coils which are disposed into the heating plenum from the heating/cooling module. The gas is then communicated to a blower plenum. Cryogenic nitrogen gas is constantly bled through a small (0.015") hole of the liquid nitrogen valve body and is selectively provided to the blower plenum from the heating/cooling module.
    Type: Grant
    Filed: May 29, 1986
    Date of Patent: August 8, 1989
    Assignee: Hughes Aircraft Company
    Inventors: Arthur M. Lesley, William Jaron
  • Patent number: 4834550
    Abstract: An apparatus for testing a heat-insulating tubular member having at least one tubular portion comprising a combustion chamber connected to the tubular portion, a burner mounted in each combustion chamber, and an air line and a fuel supply line both connected to the burner. It may further comprise an air line for increasing exhaust gas pressure which opens on the inner wall of the combustion chamber near the burner.
    Type: Grant
    Filed: August 5, 1987
    Date of Patent: May 30, 1989
    Assignees: Hitachi Metals, Ltd., Shoei Manufacturing Co., Ltd., San-In Sanso Co., Ltd.
    Inventors: Mitsuru Yano, Hajime Hiramatsu, Hiroshi Takaki
  • Patent number: 4822176
    Abstract: A method and apparatus for simulating operational demands acting an expanded tube joints includes penetrating a central inner region of a circular disc of a test body with a plurality of hollow cylinders. Sleeves or hollow plugs are connected to the hollow cylinders in the vicinity of the disc. A stress condition is created in the inner region corresponding to the operational demands by applying a force in an outer region of the disc through a uniform introduction of heat in the outer region while cooling the inner region. Outer hollow cylinders may serve as cooling passages and may form a boundary between the inner region and the outer region. Thermal insulation may be associated with the outer region. An electric resistance heater may be associated with the outer region for applying the force.
    Type: Grant
    Filed: May 12, 1988
    Date of Patent: April 18, 1989
    Assignee: Brown Boveri Reaktor GmbH
    Inventor: Dieter Daum
  • Patent number: 4817447
    Abstract: A weather resistance tester comprising:(a) a U.V. radiation source,(b) a reflector,(c) a shield panel provided in the opening of the reflector and closing the opening for transmitting U.V. radiation therethrough and substantially blocking water vapor,(d) a sample support,(e) temperature adjusting device,(f) a compartment having accommodated therein the above elements (a)-(e),(g) a recycling duct provided with a heat exchanger and blower,(h) a humidifier and(i) a control device for giving operational instructions to maintain a sample on the sample support at a predetermined temperature while the lamp is on and to subject the sample to a condensation condition while the lamp is off.
    Type: Grant
    Filed: June 17, 1987
    Date of Patent: April 4, 1989
    Assignees: Dainippon Plastics Co., Ltd., Iwasaki Electric Co., Ltd
    Inventors: Yoshio Kashima, Hirofumi Kinugasa, Yasuo Yoshida, Teruo Iwanaga
  • Patent number: 4807247
    Abstract: A temperature-controlled accelerated weathering test apparatus concentrates solar radiation upon target samples and controls the flow rate of cooling ambient air circulated across the target samples in order to maintain the target sample temperature substantially constant despite variations in ambient daytime temperature and variations in solar radiation intensity. A temperature sensor is secured to an aluminum panel mounted upon the target board of the test apparatus proximate to the target samples for generating an electrical signal relating to the temperature of the target samples. The temperature sensor and related aluminum panel are coated black to enhance absorbtion of solar radiation. A controller responsive to the electrical signal generated by the temperature sensor controls the application of electrical power to a blower motor used to circulate cooling ambient air across the target samples.
    Type: Grant
    Filed: July 31, 1987
    Date of Patent: February 21, 1989
    Assignee: DSET Laboratories, Inc.
    Inventor: Joseph S. Robbins, III
  • Patent number: 4793716
    Abstract: A thermal shock apparatus comprises a hot gas stream impinging means, a hot gas stream impinging control means, a positioning means for the hot gas stream impinging means, and a sample holding means. A sample is subjected to an essentially instantaneous impingement of a hot gas stream upon a predetermined area of the sample when a heat gun is moved past heat deflection foils and positioned above the sample causing a thermal shock within the sample.
    Type: Grant
    Filed: November 18, 1987
    Date of Patent: December 27, 1988
    Assignee: GTE Laboratories Incorporated
    Inventors: George C. Wei, John Walsh
  • Patent number: 4787752
    Abstract: A temperature conditioning device acheives a fast rate of temperature change in air or gas applied to stress thermally an electronic component by establishing separate cold and hot gas paths from a two-way directing valve interior the device cabinet to a nozzle assembly retaining the gas of selected temperature around the electronic component. An evaporation coil of a mechanical refrigeration system chills the air or gas in the cold gas path interior the cabinet and a tube heater adjusts the air or gas temperature in the cold gas path to that selected. A quartz enveloped nickel-chrome filament heater adjacent the nozzle assembly heats the air or gas in the hot gas path to the temperature selected.
    Type: Grant
    Filed: October 24, 1986
    Date of Patent: November 29, 1988
    Assignee: FTS Systems, Inc.
    Inventors: Douglas S. Fraser, Taylor N. Thompson, Jr.
  • Patent number: 4779163
    Abstract: A fluidized bed method and apparatus involving a grounded electrically conductive bed for controlling or eliminating electrostatic charges therein and high surface area charge dissipators.
    Type: Grant
    Filed: March 5, 1984
    Date of Patent: October 18, 1988
    Assignee: Procedyne Corp.
    Inventors: Karin Bickford, Joseph E. Japka, Robert B. Roaper
  • Patent number: 4777834
    Abstract: The invention relates to a method for determining a composite material constitutive of moving parts in a hermetically sealed refrigerating compressor, wherein a composite material, of which the initial mechanical and thermal properties fulfull the conditions corresponding to the mechanical and thermal stresses in compressors, is placed during a first determined test period T1 in an environment containing the chemical products that are present in a compressor, at a test temperature equivalent to the maximal operating temperature of a compressor, and wherein at the end of this period, its chemical and mechanical properties are measured, and compared with the initial mechanical or chemical properties, and it is assessed by calculation what such properties would become once the material would have been used in an environment of a compressor during a second period T2, longer than the first test period T1, and wherein this material is thus utilized for producing parts provided the assessed properties satisfy the re
    Type: Grant
    Filed: October 14, 1986
    Date of Patent: October 18, 1988
    Assignee: L'Unite Hermetique
    Inventor: Serge Vendittelli
  • Patent number: 4770542
    Abstract: A process and an apparatus for carrying out the process which causes acceleration of photodegradation of polymer substances. The process comprises irradiating a polymer substance with a low wavelength light and then a high wavelength light in an atmosphere with a specified humidity. The apparatus contains an irradiation lamp for irradiating a polymer substance, a rotating mounting plate for supporting the polymer substance, and humidifying means for creating a predetermined humidity for the photodegradation of the polymer substance. The photodegradation process and apparatus are used to precisely determine the useful life of polymer substances.
    Type: Grant
    Filed: June 10, 1986
    Date of Patent: September 13, 1988
    Assignee: The Coca-Cola Company
    Inventors: Akio Takagi, Hiroyuki Higuchi, Yoshihito Ohtake, Hiroshi Matsunaka
  • Patent number: 4760748
    Abstract: An optical deterioration-accelerating weather and optical resistance testing device has a light source and a frame supporting a sample to be tested rotating around the light source. Thermal deterioration of the sample due to radiant heat generated by the light source is inhibited by the provision of a cold air guide enclosing a portion of the sample rotating frame on which the sample is supported. Cold air is introduced to the surfaces of the sample through the cold air guide to maintain the both sides of the sample at a constant test temperature.
    Type: Grant
    Filed: December 30, 1986
    Date of Patent: August 2, 1988
    Assignee: Suga Test Instruments Co., Ltd.
    Inventors: Shinichi Katayanagi, Taro Mori
  • Patent number: 4752140
    Abstract: A method for the detection of delaminated areas in coated materials or layered composites, which allows free-air operation and can be used to scan portions of bulky materials on the spot. This method which makes it possible to detect very small delaminated areas in a very short time (less than 1 millisecond), with a very high sensitivity and without creation of excessive thermal stress in the inspected material, basically comprises the steps of: focusing pulsed, thermal radiations onto the structure to be inspected to produce a vertical displacement of its coating by thermal expansion if a delaminated area is present at the coating-to-substrate interface, and detecting and measuring this vertical displacement if any, by interferometry, preferably laser-beam interferometry. An apparatus for carrying out this method is also disclosed.
    Type: Grant
    Filed: October 1, 1986
    Date of Patent: June 21, 1988
    Assignee: Canadian Patents and Development Limited/Societe Canadienne des Brevets et d'Exploitation Limitee
    Inventors: Paolo Cielo, Gerard Rousset
  • Patent number: 4739258
    Abstract: The reliability and life cycle of a thin-film conductor is predicted accurately and directly by measuring changes in its resistivity during an interval in which its temperature is dynamically increased. A semiconductor wafer containing a number of integrated circuits, each of which contains the thin-film conductor, is placed on a test platform of a semiconductor test station, where probes are positioned to supply a constant current stress to the conductor and to measure the voltage across it. A ramp current is supplied to a resistive heating element on the test platform to effect a linear rise in temperature over a span of time to the thin-film conductor. Changes in the conductor resistivity with respect to temperature provide kinetic data related to electromigration damage in the conductor, and hence to reliability over time.
    Type: Grant
    Filed: July 11, 1986
    Date of Patent: April 19, 1988
    Assignee: Syracuse University
    Inventor: James A. Schwarz
  • Patent number: 4733974
    Abstract: A method and apparatus is provided for computing the life expectancy of electrical power transformers by computing the used life of a transformer at a rate determined by the Arrhenius function of the temperature of the transformer device being monitored.
    Type: Grant
    Filed: July 29, 1986
    Date of Patent: March 29, 1988
    Assignee: Qualitrol Corporation
    Inventor: Richard E. Hagerman
  • Patent number: 4734872
    Abstract: A system for and method of precisely controlling the temperature of an electronic component through a range of temperatures by controlling the temperature of a gas forced into contact with the component is disclosed. The system comprises a dual control loop including two sensors, one for measuring the temperature of the gas and the other for sensing the temperature of the component, for controlling the temperature of the gas so as to provide accurate control of the temperature of the component.
    Type: Grant
    Filed: April 30, 1985
    Date of Patent: March 29, 1988
    Assignee: Temptronic Corporation
    Inventors: George Eager, Pater Selverstone
  • Patent number: 4733973
    Abstract: A glass container to be tested for resistance to thermal schock and impact simulation is first filled with hot water to a point of overflowing. The hot water fill is terminated and the excess permitted to run off. Thereafter the bottle is closed and the external surface is sprayed with cold water to induce a thermal stress upon the container. After the cold water spray a low level internal pressure load is applied to the container following the thermal shock load. The application of the internal pressure extends partial fractures resulting in complete breakage of the container or a break resulting in a decrease of pressure in the container, indicating a failure.
    Type: Grant
    Filed: May 12, 1986
    Date of Patent: March 29, 1988
    Assignee: American Glass Research, Inc.
    Inventors: David R. Machak, Ronald A. Puvak, Russell D. Southwick
  • Patent number: 4729246
    Abstract: A product testing system comprises a housing with at least one opening therein, the housing having an internal, environmentally controlled chamber. Products to be tested are mounted to a product carrier. The latter is carried, in turn, by a product carrier transfer assembly. By means of the vehicle and transfer assembly, the product carrier may be oriented to be received within the housing opening with the products exposed to the environmentally controlled internal housing chamber. In one embodiment, the vehicle traverses a path adjacent one or more housings, and the product carrier transfer assembly rotates, elevates and laterally moves the product carrier to position it in an opening in the housing.
    Type: Grant
    Filed: December 22, 1986
    Date of Patent: March 8, 1988
    Assignee: Despatch Industries, Inc.
    Inventors: Hans L. Melgaard, Wendell L. Schafer
  • Patent number: 4722611
    Abstract: An apparatus for testing the quench-cooling properties of a liquid quenchant includes a thermistor that is adapted to be immersed in the liquid to be tested. An electrical potential is applied across the thermistor, which is contained in one leg of an electrical bridge circuit. A first timer controls the duration of time during which the voltage is applied to the bridge circuit. A voltmeter is connected across the bridge circuit for indicating changes in the bridge balance due to changes in the resistance of the thermistor. The thermistor changes resistance in accordance with the thermal conductivity of the liquid in which it is immersed. Therefore, the quenchant properties of the liquid being tested are determinable by comparing the voltage output of the bridge when the thermistor is immersed in the test liquid with at least one reference voltage output obtained by immersing the thermistor in a reference liquid quenchant. Each test is conducted for the same amount of time, which is controlled by the timer.
    Type: Grant
    Filed: March 13, 1986
    Date of Patent: February 2, 1988
    Assignee: Union Carbide Corporation
    Inventor: David H. Hultgren
  • Patent number: 4710030
    Abstract: An optical stress pulse generation and detection system for non-destructively measuring physical properties of a sample, which uses a pump beam having short duration radiation pulses having an intensity and at least one wavelength selected to non-destructively generate a stress pulse in a sample and directs the non-destructive pump beam to a surface of the sample to generate the stress pulse. The optical stress pulse generation and detection system also uses a probe radiation beam and guides the probe beam to a location at the sample to intercept the stress pulse. The change in optical constants induced by the stress pulse is detected by observing the probe beam after it intercepts the stress pulse.
    Type: Grant
    Filed: May 17, 1985
    Date of Patent: December 1, 1987
    Assignee: Bw Brown University Research Foundation
    Inventors: Jan Tauc, Humphrey J. Maris, Christian Thomsen
  • Patent number: 4698507
    Abstract: Materials to be tested for resistance of immersion swelling, drying shrinkage, thermal expansion and thermal contraction under light exposure are placed on a mount on a rotating shaft which immerses the sample in water, heats and dries it, and exposes it to light before cooling it by again immersing it in water. The samples may be simultaneously exposed to air pollutants by adding gases to a corrosion resistant chamber enclosing the rotating shaft. The chamber enclosing the rotating samples is composed of a lower tank base and a cover fitting into a liquid seal well on the tank base. The cover is fitted with fluorescent lights, an infrared heating strip, a thermocouple and a viewing port. A controller with indicator for the radiant heating strip and a speed control on the rotating shaft drive motor together with "run" and "pause" controls permit selection of the exposure cycles and their conditions.
    Type: Grant
    Filed: September 26, 1986
    Date of Patent: October 6, 1987
    Assignee: KTA-Tator, Inc.
    Inventors: Kenneth B. Tator, Richard O. Lackey
  • Patent number: 4679946
    Abstract: The subject invention discloses a method and apparatus for evaluating both the thickness and compositional variables in a layered or thin film sample. Two independent detection systems are provided for measuring thermal waves generated in a sample by a periodic, localized heating. One detection system is of the type that generates output signals that are primarily a function of the surface temperature of the sample. The other detection system generates signals that are primarily a function of the integral of the temperature beneath the sample surface. The two independent thermal wave measurements permit analysis of both thickness and compositional variables. An apparatus is disclosed wherein both detection systems can be implemented efficiently within one apparatus.
    Type: Grant
    Filed: May 21, 1984
    Date of Patent: July 14, 1987
    Assignee: Therma-Wave, Inc.
    Inventors: Allan Rosencwaig, Jon Opsal
  • Patent number: 4667522
    Abstract: This invention is a humidity testing apparatus comprising a test chamber with external heaters for superheating the steam and preventing condensation in the testing zone. The test chamber is divided into an upper humidity testing section and lower condensate collection and removal section by a horizontal heating plate extending from the back wall to a front edge adjacent to and spaced apart from the front of the test chamber, the heating plate extending from one sidewall to the opposing sidewall of the chamber. Convection currents are introduced into the chamber by the heating plate which is maintained at a temperature above the walls of the chamber. The test chamber has a steam inlet opening in the back wall thereof defining a steam flow path into the upper chamber, and a substantially vertical steam baffle plate extending upward from the heating plate and positioned adjacent to the steam inlet opening in the steam flow path. The bottom wall has a condensate outlet opening in the bottom wall thereof.
    Type: Grant
    Filed: November 1, 1985
    Date of Patent: May 26, 1987
    Assignee: Express Test Corporation
    Inventor: Masaru Kawahara
  • Patent number: 4653323
    Abstract: An apparatus for moving an object in an isolated environment may be employed as a high pressure and temperature facility for testing steam generator tubes. A tube to be tested extends through an opening in a plate that is mounted in a test vessel. The vessel is partially filled with water having selected contaminants, and heated water under high pressure is circulated through the tube to raise the temperature and pressure within the vessel. A lever arm having an inner end and an outer end extends through an opening in the test vessel. A vibration-coupler connects the inner end of the arm to the tube under test, and a fulcrum-former operationally connects an intermediate portion of the arm to the test vessel. The outer end of the lever arm is connected to a plug element which is shaken, so that the arm pivots about a fixed point at the fulcrum-former and the vibration-coupler moves the tube under test with respect to the plate.
    Type: Grant
    Filed: October 9, 1985
    Date of Patent: March 31, 1987
    Assignee: Westinghouse Electric Corp.
    Inventor: Fritz Ottenheimer
  • Patent number: 4647220
    Abstract: A method and apparatus for the non-destructive identification and location of subcoating corrosion on a coated metal surface employing infrared thermography. The apparatus comprises a heat source for directing pulsed infrared radiation onto a test surface; a scanner for scanning the test surface for infrared radiation being emitted therefrom; a detector for capturing said emitted radiation and converting it into a signal representative of the thermal characteristics of the surface; and video display apparatus for visually displaying the signal as a thermal map of the surface. The method comprises the steps irradiating a test surface and detecting temperature differentials that occur on the irradiated surface.
    Type: Grant
    Filed: July 9, 1984
    Date of Patent: March 3, 1987
    Assignee: Lockheed Corporation
    Inventors: Mark J. Adams, Elton M. Crisman, Jr.
  • Patent number: 4640626
    Abstract: A method and apparatus localize weak points within an electrical circuit. The electrical circuit is covered with a liquid crystal and is heated to a temperature just below the clearing point of the liquid crystal. The liquid crystal converts into its unordered condition given a temperature increase and leakage channel within the integrated circuit are completely localized. By irradiating a three-dimensional region, at least one current is induced in the region by generating electron-hole pairs within the electrical circuit, this at least one current causing a temperature increase at at least one weak point of the electrical circuit.
    Type: Grant
    Filed: July 22, 1985
    Date of Patent: February 3, 1987
    Assignee: Siemens Aktiengesellschaft
    Inventors: Ralf Schmid, Johann Otto, Daniela Bernklau, Erwin Knapek
  • Patent number: 4636088
    Abstract: An apparatus and method is disclosed for evaluating surface conditions on a sample. The system is particularly suited for detecting thin residues encountered in semiconductor lithographic and etching processes. The system is also capable of measuring ion implanted dopant concentrations prior to annealing. The apparatus includes an intensity modulated laser beam which is focused on the surface of the sample to generate periodic heating. A second light beam is focused onto the periodically heated area of the sample in a manner such that it is reflected to a detector. The intensity changes in the probe beam, resulting from the temperature induced changes of reflectivity at the surface of the sample, are measured and evaluated to determine the absence or presence of residues, or to measure the concentrations of ion implanted dopants.
    Type: Grant
    Filed: May 21, 1984
    Date of Patent: January 13, 1987
    Assignee: Therma-Wave, Inc.
    Inventors: Allan Rosencwaig, Walter L. Smith
  • Patent number: RE32625
    Abstract: A technique is described that permits direct and accurate evaluation of a thin film conductor's reliability which requires only a few hours to carry out. The technique involves a temperature ramp procedure which dynamically exposes a conductor operating under constant current stress to a linear (in time) rise in temperature. Changes in resistivity of the conductor provides kinetic data that is directly related to both the electromigration process and the reliability of the device.
    Type: Grant
    Filed: August 18, 1986
    Date of Patent: March 15, 1988
    Assignee: Syracuse University
    Inventors: James A. Schwarz, Robert W. Pasco