Holography Or Interferometry Patents (Class 378/36)
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Patent number: 9014333Abstract: An image reconstruction method for differential phase contrast imaging includes receiving data corresponding to a signal produced by an X-ray detector and corresponding to X-rays that passed through a subject and a grating system to reach the X-ray detector. The method also includes performing a fringe analysis on the received data. The fringe analysis includes a non-integer fringe fraction correction utilizing one or more adapted basis functions in the Fourier domain to determine one or more Fourier coefficients. A differential phase image of the subject is generated by utilizing the one or more Fourier coefficients.Type: GrantFiled: December 31, 2012Date of Patent: April 21, 2015Assignee: General Electric CompanyInventors: Jonathan Immanuel Sperl, Dirk Beque
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Patent number: 9001967Abstract: Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital radiographic imaging system and methods for same that can include an x-ray source for radiographic imaging; a beam shaping assembly including a collimator and a source grating, an x-ray grating interferometer including a phase grating, and an analyzer grating; and an x-ray detector, where a single arrangement of the beam shaping assembly, the x-ray grating interferometer and a position of the detector is configured to provide spectral information (e.g. at least two images obtained at different relative beam energies).Type: GrantFiled: December 28, 2012Date of Patent: April 7, 2015Assignee: Carestream Health, Inc.Inventors: Pavlo Baturin, Mark E. Shafer
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Publication number: 20150092916Abstract: A method and system to determine material composition of an object comprises capturing a series of digital radiographic images of the object using a single exposure energy level. An intensity of the captured images is determined as well as phase shift differences. A difference in material composition of the object may be determined based on a combination of the determined intensity and the modulated phase shifts of the captured images.Type: ApplicationFiled: September 29, 2014Publication date: April 2, 2015Inventors: Pavlo Baturin, Mark E. Shafer
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Publication number: 20150092915Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.Type: ApplicationFiled: September 17, 2014Publication date: April 2, 2015Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
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Publication number: 20150092914Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.Type: ApplicationFiled: September 17, 2014Publication date: April 2, 2015Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
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Publication number: 20150071402Abstract: An X-ray imaging system includes: a micro X-ray source array formation part configured to form a micro X-ray source array by partially shielding an X-ray emitted from an X-ray source; and an X-ray detector configured to detect an X-ray transmitted through a test object. The micro X-ray source array formation part includes a plurality of gratings disposed between the X-ray source and the X-ray detector. A ratio of X-rays transmitted through all of the plurality of gratings to X-rays generated from the X-ray source varies depending on a position of an X-ray generating point on the X-ray source, and the micro X-ray source array formation part forms a micro X-ray source array of a pattern in accordance with the variation of the ratio of the transmitted X-rays.Type: ApplicationFiled: September 4, 2014Publication date: March 12, 2015Inventor: Soichiro Handa
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Publication number: 20150071403Abstract: In a radiographic system and a radiographic image generating method that generate a phase contrast image and an absorption image of an subject, the absorption image in which density irregularity is removed or reduced is generated on the basis of a plurality of pieces of image data obtained for generating the phase contrast image.Type: ApplicationFiled: October 22, 2014Publication date: March 12, 2015Applicant: FUJIFILM CORPORATIONInventor: Hiroyasu ISHII
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Publication number: 20150055744Abstract: An embodiment of the invention relates to an X-ray device, more particularly for phase-contrast imaging in the medical sector. In at least one embodiment, the X-ray device includes an X-ray radiation source, a coherence grid, a phase grid and an X-ray detector from a number of pixels arranged in a matrix, the pixels including a lens grid.Type: ApplicationFiled: April 16, 2013Publication date: February 26, 2015Applicant: Siemens AktiengesellschaftInventors: Gisela Anton, Oliver Preusche
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Publication number: 20150055743Abstract: An x-ray phase contrast imaging apparatus and method of operating the same. The apparatus passes x-rays generated by an x-ray source through, in succession, a source grating, an object of interest, a phase grating, and an analyzer grating. The x-ray source, the source grating, the phase grating, and the analyzer grating move as a single entity relative to an object of interest. The phase grating and the analyzer grating remain in fixed relative location and fixed relative orientation with respect to one another. The detected x-rays are converted to a time sequence of electrical signals. In some cases, the apparatus is controlled, and the electrical signals are analyzed by, by a general purpose programmable computer provided with instructions recorded on a machine readable medium. One or more x-ray phase contrast images of the object of interest are generated, and can be recorded or displayed.Type: ApplicationFiled: February 15, 2013Publication date: February 26, 2015Inventors: Srinivasan Vedantham, Andrew Karellas
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Publication number: 20150055745Abstract: A modified phase shifting mask is used to improve performance over traditional Zernike phase contrast imaging. The configurations can lead to an improved imaging methodology potentially with reduced artifacts and more than one order of magnitude gain in photon efficiency, in some examples. Moreover, it can be used to yield a direct representation of the sample's phase contrast information without the need for additional specialized post-acquisition image analysis. The approach can be applied to both wide-field and scanning configurations by using a phase mask including a pattern of phase elements and an illumination mask, having a pattern of holes, for example, that corresponds to a pattern of the phase mask.Type: ApplicationFiled: August 21, 2014Publication date: February 26, 2015Inventors: Christian Holzner, Michael Feser
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Publication number: 20150043710Abstract: There is described a radiological image capturing apparatus, which makes it possible to obtain a good X ray image in which contrast of the peripheral portions are emphasized by employing the Talbot interferometer method and the Talbot-Lau interferometer method. The apparatus is provided with an X-ray tube, a multi-slit member, a first diffraction grating, a second diffraction grating and an X-ray detector. The second diffraction grating contacts the X-ray detector. A distance L between the multi-slit element and the first diffraction grating is set to be not less than 0.5 m, a distance Z1 between the first diffraction grating and the second diffraction grating is set to be not less than 0.05 m, and a slit interval distance d0 of the multi-slit element is set to be not less than 2 ?m. With the settings, the abovementioned good X-ray image can be obtained by using the Talbot-Lau interferometer system.Type: ApplicationFiled: October 28, 2014Publication date: February 12, 2015Inventor: Hiromu OHARA
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Publication number: 20150036795Abstract: The present invention relates to phase contrast X-ray imaging of an object. In order to provide phase contrast information in more than one direction, an X-ray imaging system is provided that comprises an X-ray source (12), an X-ray detector arrangement (16), and a grating arrangement (18) with a phase-grating structure (46) and an analyser-grating structure (48). The X-ray detector arrangement comprises at least eight line-detector units (40) parallel to each other in a first direction (42), the line-detector units extending linearly in a direction (44) perpendicular to the first direction. The X-ray source, the X-ray detector arrangement and the grating arrangement are adapted to perform an acquisition movement in relation to an object in a scanning direction parallel to the first direction.Type: ApplicationFiled: January 22, 2013Publication date: February 5, 2015Applicant: KONINKLIJKE PHILIPS N.V.Inventors: Ewald Roessl, Thomas Koehler
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Publication number: 20150023465Abstract: A source grating includes a first sub-source grating, where first transmitting portions which transmit X-rays, and first shielding portions which shield X-rays, are alternately arranged in a first direction; and a second sub-source grating, where second transmitting portions which transmit X-rays, and second shielding portions which shield X-rays, are alternately arranged in a second direction orthogonal to the first direction. The first sub-source grating is curved so that two positions in the curve align in the first direction. The second sub-source grating is curved so that two positions in the curve align in the second direction.Type: ApplicationFiled: July 14, 2014Publication date: January 22, 2015Inventor: Genta Sato
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Patent number: 8908825Abstract: There is described a radiological image capturing apparatus, which makes it possible to obtain a good X ray image in which contrast of the peripheral portions are emphasized by employing the Talbot interferometer method and the Talbot-Lau interferometer method. The apparatus is provided with an X-ray tube, a multi-slit member, a first diffraction grating, a second diffraction grating and an X-ray detector. The second diffraction grating contacts the X-ray detector. A distance L between the multi-slit element and the first diffraction grating is set to be not less than 0.5 m, a distance Z1 between the first diffraction grating and the second diffraction grating is set to be not less than 0.05 m, and a slit interval distance d0 of the multi-slit element is set to be not less than 2 ?m. With the settings, the above-mentioned good X-ray image can be obtained by using the Talbot-Lau interferometer system.Type: GrantFiled: March 1, 2013Date of Patent: December 9, 2014Assignee: Konica Minolta Medical & Graphic, Inc.Inventor: Hiromu Ohara
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Patent number: 8908824Abstract: An imaging apparatus includes, a diffraction grating that diffracts an electromagnetic wave emitted from an electromagnetic wave source, a shield grating including a shield portion that prevents transmission of the electromagnetic wave and a plurality of transmission portions that allows the electromagnetic wave to transmit therethrough, and a detector that detects the electromagnetic wave transmitted through the transmission portions of the shield grating. The diffraction grating forms an interference pattern in a grid pattern by diffracting the electromagnetic wave; the shield grating has the plurality of transmission portions arranged two-dimensionally; and a ratio of an area of the transmission portion to the area of a unit pattern composed of a portion of the shield portion and one transmission portion of the plurality of transmission portions is larger than 0.25.Type: GrantFiled: October 12, 2011Date of Patent: December 9, 2014Assignee: Canon Kabushiki KaishaInventor: Takeshi Kondoh
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Publication number: 20140341335Abstract: A computation apparatus that calculates information of a subject includes: a calculation unit configured to calculate a spatial distribution of a first first-order phase value, a spatial distribution of a second first-order phase value, and a spatial distribution of a first-order measurement target value, by using the subject data; a calculation unit configured to calculate an error correction function including the first first-order phase value and the second first-order phase value as variables, by using information of the spatial distribution of the first first-order phase value, information of the spatial distribution of the second first-order phase value, and information of the spatial distribution of the first-order measurement target value; and a calculation unit configured to calculate information of a spatial distribution of a second-order measurement target value, corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value.Type: ApplicationFiled: May 13, 2014Publication date: November 20, 2014Applicant: CANON KABUSHIKI KAISHAInventor: Soichiro Handa
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Publication number: 20140341334Abstract: A computation apparatus that calculates subject information by using subject data, includes a calculation unit that calculates spatial distributions of a first-order phase value and a first-order measurement target value by using the subject data, a calculation unit that calculates an error correction function including the first-order phase value as a variable by using information of the spatial distribution of the first-order measurement target value and the spatial distribution of the first-order phase value, and a calculation unit that calculates information of a spatial distribution of a second-order measurement target value corresponding to a spatial distribution obtained by correcting the spatial distribution of the first-order measurement target value by using the error correction function, the information of the spatial distribution of the first-order phase value, and the information of the spatial distribution of the first-order measurement target value.Type: ApplicationFiled: May 13, 2014Publication date: November 20, 2014Applicant: CANON KABUSHIKI KAISHAInventor: Soichiro Handa
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Publication number: 20140328457Abstract: A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.Type: ApplicationFiled: May 16, 2014Publication date: November 6, 2014Applicant: The Johns Hopkins UniversityInventors: Daniel Stutman, Michael Finkenthal
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Patent number: 8855265Abstract: The present invention generally refers to a correction method for grating-based X-ray differential phase contrast imaging (DPCI) as well as to an apparatus which can advantageously be applied in X-ray radiography and tomography for hard X-ray DPCI of a sample object or an anatomical region of interest to be scanned. More precisely, the proposed invention provides a suitable approach that helps to enhance the image quality of an acquired X-ray image which is affected by phase wrapping, e.g. in the resulting Moiré interference pattern of an emitted X-ray beam in the detector plane of a Talbot-Lau type interferometer after diffracting said X-ray beam at a phase-shifting beam splitter grating.Type: GrantFiled: June 10, 2010Date of Patent: October 7, 2014Assignee: Koninklijke Philips N.V.Inventors: Klaus Juergen Engel, Dieter Geller, Gereon Vogtmeier
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Publication number: 20140270061Abstract: An X-ray Talbot interferometer includes a first grating configured to diffract X-rays from an X-ray source and form an interference pattern, a second grating configured to block a portion of X-rays that form the interference pattern, and a detector configured to detect X-rays from the second grating. An inspection object is disposed between the X-ray source and the second grating. The second grating includes a first shield grating portion in which a shield portion and a transmissive portion are arranged periodically at a first period and a second shield grating portion. The first period is expressed as ps×n×Ls/(Ls+Lf), where ps denotes a size of pixels that the detector has, n denotes a positive integer, Ls denotes a distance from the X-ray source to the first shield grating portion, and Lf denotes a distance from the first shield grating portion to the detector.Type: ApplicationFiled: March 11, 2014Publication date: September 18, 2014Applicant: CANON KABUSHIKI KAISHAInventor: Kimiaki Yamaguchi
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Publication number: 20140270060Abstract: An X-ray Talbot interferometer includes a source grating configured to spatially split X-rays emitted from an X-ray source, a diffraction grating configured to form an interference pattern with the X-rays from the source grating, and an X-ray detector configured to detect the X-rays from the diffraction grating. The X-ray Talbot interferometer further includes an angle varying unit configured to vary an angle formed by an optical axis, which is the center of a flux of the X-rays from the X-ray source, and the source grating. The angle varying unit varies the angle formed by the optical axis and the source grating from a first angle to a second angle. The X-ray detector detects the X-rays at least when the optical axis and the source grating form the first angle and when the optical axis and the source grating form the second angle.Type: ApplicationFiled: March 10, 2014Publication date: September 18, 2014Applicant: CANON KABUSHIKI KAISHAInventors: Takashi Date, Genta Sato, Chidane Ouchi
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Publication number: 20140241493Abstract: Method for manufacturing a metal grating structure, wherein, after a concave part having an insulating layer on an inner surface thereof is formed in a silicon substrate, a portion of the insulating layer formed on a bottom part of the concave part is removed, and the silicon substrate at the bottom part of the concave part is etched to increase the surface area of the bottom part of the concave part as compared with a state before the etching, followed by filling the concave part with metal by an electroforming method.Type: ApplicationFiled: July 3, 2012Publication date: August 28, 2014Inventor: Mitsuru Yokoyama
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Publication number: 20140233697Abstract: A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimised and/or aligned with the rows and columns of pixels.Type: ApplicationFiled: July 19, 2012Publication date: August 21, 2014Inventors: Konstantin Ignatyev, Alessandro Olivo, Peter Munro, Robert Speller
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Publication number: 20140226785Abstract: A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in a radiation path of the X-ray illumination system, and a detection system arranged in a radiation path to detect X-rays after passing through the beam splitter.Type: ApplicationFiled: February 6, 2014Publication date: August 14, 2014Applicant: THE JOHNS HOPKINS UNIVERSITYInventors: Dan Stutman, Michael Finkenthal
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Publication number: 20140198895Abstract: A medical imaging system includes a radiographing apparatus and an image processing apparatus. The radiographing apparatus is provided with a Talbot or Talbot-Lau interferometer and includes an X-ray source, an X-ray detector, and a subject table. The image processing apparatus generates at least one of an X-ray absorption image, a differential phase image, and a small-angle scattering image of the subject using an image signal and a background signal obtained through subject radiographing and background radiographing, respectively. The background radiographing is performed with a member held instead of the subject. The member has a material and/or thickness to create change in energy spectrum of X-rays equivalent to change in energy spectrum of X-rays created by the subject.Type: ApplicationFiled: January 14, 2014Publication date: July 17, 2014Applicant: Konica Minolta, Inc.Inventors: Yoshihide HOSHINO, Junko KIYOHARA
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Patent number: 8781069Abstract: A radiographic phase-contrast imaging apparatus obtains a phase-contrast image using two gratings including the first grating and the second grating. The first and second gratings are adapted to form a moire pattern when a periodic pattern image formed by the first grating is superimposed on the second grating. Based on the moire pattern detected by the radiographic image detector, image signals of the fringe images, which correspond to pixel groups located at different positions with respect to a predetermined direction, are obtained by obtaining image signals of pixels of each pixel group, which includes pixels arranged at predetermined intervals in the predetermined direction, as the image signal of each fringe image, where the predetermined direction is a direction parallel to or intersecting a period direction of the moire pattern other than a direction orthogonal to the period direction. Then, a phase-contrast image is generated based on the obtained fringe images.Type: GrantFiled: April 26, 2013Date of Patent: July 15, 2014Assignee: FUJIFILM CorporationInventors: Dai Murakoshi, Toshitaka Agano, Wataru Ito, Shinji Imai
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Publication number: 20140185746Abstract: Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital radiographic imaging system and methods for same that can include an x-ray source for radiographic imaging; a beam shaping assembly including a collimator and a source grating, an x-ray grating interferometer including a phase grating, and an analyzer grating; and an x-ray detector, where a single arrangement of the beam shaping assembly, the x-ray grating interferometer and a position of the detector is configured to provide spectral information (e.g. at least two images obtained at different relative beam energies).Type: ApplicationFiled: December 28, 2012Publication date: July 3, 2014Inventors: Pavlo Baturin, Mark E. Shafer
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Publication number: 20140177790Abstract: Disclosed is a method of reconstructing a representative detailed phase image from a set of fringe pattern interferogram images of an object. The images are captured by an x-ray interferometer having a crossed diffraction grating. A set of captured fringe pattern interferogram images from the x-ray interferometer are provided, the set comprising no more than eight captured fringe pattern interferogram images. The method determines an estimate of an absorption parameter (a), two-dimensional amplitude modulation parameters (mx, my), and two-dimensional phase modulation parameters (?x and ?y) from a closed-form solution using the received set of captured fringe pattern interferogram images, and reconstructs the representative detailed phase image using the parameter estimates.Type: ApplicationFiled: December 11, 2013Publication date: June 26, 2014Applicant: CANON KABUSHIKI KAISHAInventors: DONALD JAMES BONE, SAMPSON SZE CHUNG WONG, KIERAN GERARD LARKIN, RUIMIN PAN
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Publication number: 20140177789Abstract: Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital radiographic imaging system and methods for same that can include an x-ray source for radiographic imaging; a beam shaping assembly including a collimator and a source grating, an x-ray grating interferometer including a phase grating, and an analyzer grating; and an x-ray detector, where the phase-contrast digital radiographic imaging system and methods are adjustable for different mean energies of the x-ray source.Type: ApplicationFiled: December 21, 2012Publication date: June 26, 2014Inventors: Pavlo Baturin, Mark E. Shafer
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Publication number: 20140169522Abstract: A medical imaging system includes an X-ray imaging apparatus and an image processor. The X-ray imaging apparatus is provided with a Talbot or Talbot-Lau interferometer and includes an X-ray source, an X-ray detector, and a subject table. The image processor generates a differential phase image, and optionally, one or both of an X-ray absorption image and a small-angle scattering image of the subject on the basis of the image signal of the subject. The image processor specifies a location of an edge of a bone in the joint on the basis of at least one of the generated images; and detects an edge of a cartilage in the joint in the differential phase image on the basis of the specified location of the bone edge to quantitatively measure a feature of the cartilage.Type: ApplicationFiled: December 4, 2013Publication date: June 19, 2014Applicant: KONICA MINOLTA, INC.Inventor: Yoshihide HOSHINO
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Patent number: 8755487Abstract: An X-ray imaging system includes first to third absorption gratings. Initially, the third absorption grating is disposed in a Z axis orthogonal to a detection surface of a FPD, and the position of the third absorption grating is adjusted in ?x and ?y directions based on a dose of X-rays having passed through the third absorption grating. Then, the first absorption grating is disposed in the Z axis so as to produce a moiré pattern. The position of the first absorption grating is adjusted in the ?x and ?y directions so that a frequency of the moiré pattern detected by the FPD becomes uniform. Then, the position of the first absorption grating is adjusted in a Z or ?z direction so that the FPD loses the detection of the moiré pattern. After that, the second absorption grating is aligned in a like manner as the first absorption grating.Type: GrantFiled: January 29, 2011Date of Patent: June 17, 2014Assignee: Fujifilm CorporationInventors: Yasuhisa Kaneko, Hiroyasu Ishii
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Publication number: 20140153692Abstract: A method forms a representative image from a crossed grating fringe pattern interferogram of an object from an interferometer. The method determines a plurality of spectral lobes from the interferogram and selects from the plurality of determined lobes, two substantially orthogonal sidelobes. The selected sidelobes represent spatial differential phase information of the interferogram. The method applies an inverse Riesz transform to the spatial differential phase information of the selected sidelobes to form a transformed differential phase image, and forms from the transformed differential phase image, a representative image emphasising high frequency detail information of the object.Type: ApplicationFiled: November 27, 2013Publication date: June 5, 2014Applicant: CANON KABUSHIKI KAISHAInventors: Kieran Gerard LARKIN, Peter Alleine FLETCHER
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Patent number: 8737561Abstract: An X-ray phase grating used for X-ray phase-contrast imaging based on Talbot interference includes a first substrate and a second substrate. The first substrate and the second substrate are combined so as to be shifted from each other by one half period. The first substrate has a first pattern in which first faces and second faces making an angle of ? (where ??0 and ??90°) with the first faces are periodically arranged. The second substrate has a second pattern in which third faces corresponding to the first faces and fourth faces corresponding to the second faces and making an angle of ? with the third faces are periodically arranged.Type: GrantFiled: August 12, 2010Date of Patent: May 27, 2014Assignee: Canon Kabushiki KaishaInventor: Genta Sato
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Publication number: 20140126690Abstract: An X-ray imaging apparatus includes an optical device configured to form a periodic pattern using X-rays radiated from an X-ray source, an alignment mark of the optical device, a first detector, a second detector, and a movement unit configured to change at least either a position of the optical device or an angle of the optical device on the basis of a result of detection performed by the second detector. The first detector detects X-rays that have passed through the optical device and a subject, and the second detector detects X-rays that have passed through the alignment mark. The movement unit includes a movement instruction section that instructs the optical device to move on the basis of the result of the detection performed by the second detector and movement sections that move the optical device on the basis of the instruction issued by the movement instruction section.Type: ApplicationFiled: November 1, 2013Publication date: May 8, 2014Applicant: CANON KABUSHIKI KAISHAInventor: Kimiaki Yamaguchi
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Patent number: 8718228Abstract: A phase grating used for X-ray phase imaging is provided, in which a pitch can be narrowed by using a diffraction grating with a low aspect ratio. A phase grating used for X-ray phase imaging, characterized in that the phase grating includes a first diffraction grating in which a first projection part whose thickness is formed so that an in-coming X-ray transmits with a phase ?-shifted, and a first aperture part with the same aperture width as a width of the first projection part are cyclically arranged, and a second diffraction grating in which a second projection part with the same width as a width of the first projection part, and a second aperture part with the same aperture width as the aperture width of the first aperture part are cyclically arranged, and the second diffraction grating is formed as displaced on the first diffraction grating.Type: GrantFiled: March 12, 2009Date of Patent: May 6, 2014Assignee: Canon Kabushiki KaishaInventors: Takashi Nakamura, Aya Imada, Hidenosuke Itoh
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Patent number: 8681934Abstract: An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2? from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function.Type: GrantFiled: July 17, 2013Date of Patent: March 25, 2014Assignee: Canon Kabushiki KaishaInventors: Kentaro Nagai, Toru Den
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Patent number: 8644449Abstract: Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. A displacement of X-rays that have been split by a splitting element and have passed through an object is measured. The displacement can be measured by using a first attenuation element having a transmission amount that continuously changes in accordance with the incident position of X-rays. At this time, an X-ray transmittance of an object that is calculated by using a second attenuation element having a transmission amount that does not change in accordance with the incident position of X-rays is used.Type: GrantFiled: January 15, 2010Date of Patent: February 4, 2014Assignee: Canon Kabushiki KaishaInventors: Taihei Mukaide, Kazuhiro Takada, Kazunori Fukuda, Masatoshi Watanabe
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Patent number: 8638903Abstract: Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained. X-rays are spatially split, and a first attenuation element in which the transmission amount of X-rays continuously changes in accordance with the displacement when the X-rays pass through an object is used. Transmittance is calculated by using the first attenuation element and a second attenuation element that is different from the first attenuation element with respect to an amount of change or a characteristic of change in the transmission amount of X-rays in a direction of a displacement of the X-rays. A differential phase image and the like of the object are calculated using the transmittance.Type: GrantFiled: January 15, 2010Date of Patent: January 28, 2014Assignee: Canon Kabushiki KaishaInventors: Taihei Mukaide, Kazuhiro Takada, Kazunori Fukuda, Masatoshi Watanabe
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Publication number: 20130308750Abstract: In a radiographic system and a radiographic image generating method that generate a phase contrast image and an absorption image of an subject, the absorption image in which density irregularity is removed or reduced is generated on the basis of a plurality of pieces of image data obtained for generating the phase contrast image.Type: ApplicationFiled: April 26, 2013Publication date: November 21, 2013Applicant: FUJIFILM CorporationInventor: FUJIFILM Corporation
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Publication number: 20130308751Abstract: The present invention relates to X-ray differential phase-contrast imaging. In order to enhance the information acquired by phase-contrast imaging, an analyzer grating (34) for X-ray differential phase-contrast imaging is provided with an absorption structure (48). The latter comprises a first plurality (50) of first areas (52) with a first X-ray attenuation, and a second plurality (54) of second areas (56) with a second X-ray attenuation. The second X-ray attenuation is smaller than the first X-ray attenuation, and the first and second areas are arranged periodically in an alternating manner. A third plurality (58) of third areas (60) is provided with a third X-ray attenuation, which lies in a range from the second X-ray attenuation to the first X-ray attenuation, wherein every second of the first or second areas is replaced by one of the third areas.Type: ApplicationFiled: February 2, 2012Publication date: November 21, 2013Applicant: KONINKLIJKE PHILIPS N.V.Inventors: Thomas Koehler, Ewald Rössl
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Publication number: 20130301795Abstract: An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2? from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function.Type: ApplicationFiled: July 17, 2013Publication date: November 14, 2013Inventors: Kentaro Nagai, Toru Den
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Patent number: 8582718Abstract: A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.Type: GrantFiled: November 30, 2010Date of Patent: November 12, 2013Assignee: Morpho Detection, Inc.Inventor: Geoffrey Harding
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Publication number: 20130279651Abstract: According to a method for manufacturing a metal grating structure of the present invention, in filling a concave portion formed in a silicon substrate (30), for instance, a slit groove (SD) with metal by an electroforming method, an insulating layer (34) is formed in advance on an inner surface of the slit groove (SD) as an example of the concave portion by a thermal oxidation method. Accordingly, the metal grating structure manufacturing method is advantageous in finely forming metal parts of the grating structure. A metal grating structure of the present invention is manufactured by the above manufacturing method, and an X-ray imaging device of the present invention is incorporated with the metal grating structure.Type: ApplicationFiled: November 16, 2011Publication date: October 24, 2013Inventor: Mitsuru Yokoyama
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Patent number: 8559594Abstract: An imaging apparatus analyzes a periodic pattern of a Moiré due to Talbot interference by the Fourier transform method and forms an image. The imaging apparatus includes a first grating having a structure that transmits light beams from a beam source to refract or diffract the light beams and forms a self image based on a first periodic pattern by the Talbot interference at a predetermined position; a second grating that absorbs part of the first periodic pattern and causes a Moiré to be generated based on a second periodic pattern when the second grating is arranged at a position at which the self image is formed. All cross sections of the Moiré with axes in differential directions of a wavefront for the analysis by the Fourier transform method have a two-dimensional periodic structure in which periods of patterns in the second periodic pattern are the same.Type: GrantFiled: April 12, 2011Date of Patent: October 15, 2013Assignee: Canon Kabushiki KaishaInventors: Chidane Ouchi, Kentaro Nagai
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Patent number: 8537966Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.Type: GrantFiled: November 20, 2012Date of Patent: September 17, 2013Assignee: Canon Kabushiki KaishaInventors: Chidane Ouchi, Kentaro Nagai, Toru Den, Hidenosuke Itoh
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Patent number: 8532252Abstract: A two-dimensional X-ray shield grating which may be manufactured more easily and to a manufacturing method to provide therefor is provided. The method of manufacturing the X-ray shield grating includes: a first step of forming a plurality of columnar structures periodically arranged in two directions; and a second step of forming a film which surrounds at least side surfaces of the respective plurality of columnar structures, in which, in the second step, portions of the film formed on side surfaces of columnar structures which are adjacent to each other in the two directions among the plurality of columnar structures are connected to each other in the two directions, and in which the film is formed so that a columnar aperture is formed between columnar structures which are diagonally adjacent to each other with respect to the two directions among the plurality of columnar structures.Type: GrantFiled: December 22, 2010Date of Patent: September 10, 2013Assignee: Canon Kabushiki KaishaInventor: Takashi Nakamura
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Publication number: 20130230135Abstract: A joint imaging apparatus includes a subject table and a radiographic unit including a radiation generating section disposed above the subject table to irradiate a joint of a finger, and a detecting section disposed under the subject table to detect radiation passing through the joint. The subject table includes a base unit to fix the wrist, and a subject fixing unit to fix the joint to a predetermined position. The subject fixing unit includes a first fixing member to fix a part on the trunk side of the joint, and a second fixing member to fix a part on the side, opposite to the trunk side, of the joint. A position of the second fixing member is adjustable relative to that of the first fixing member.Type: ApplicationFiled: February 26, 2013Publication date: September 5, 2013Applicant: Konica Minolta Medical & Graphic, Inc.Inventors: Yoshihide HOSHINO, Satoshi NISHINO
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Patent number: 8520799Abstract: An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2? from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function.Type: GrantFiled: October 28, 2009Date of Patent: August 27, 2013Assignee: Canon Kabushiki KaishaInventors: Kentaro Nagai, Toru Den
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Publication number: 20130202081Abstract: The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating (14, 15) for X-ray differential phase-contrast imaging, is provided with a first sub-area (23) comprising at least one portion (24) of a first grating structure (26) and at least one portion (28) of a second grating structure (30). The first grating structure comprises a plurality of bars (34) and gaps (36) with a first grating orientation GO1 (37), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent.Type: ApplicationFiled: October 17, 2011Publication date: August 8, 2013Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventor: Ewald Rössl
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Publication number: 20130177133Abstract: There is described a radiological image capturing apparatus, which makes it possible to obtain a good X ray image in which contrast of the peripheral portions are emphasized by employing the Talbot interferometer method and the Talbot-Lau interferometer method. The apparatus is provided with an X-ray tube, a multi-slit member, a first diffraction grating, a second diffraction grating and an X-ray detector. The second diffraction grating contacts the X-ray detector. A distance L between the multi-slit element and the first diffraction grating is set to be not less than 0.5 m, a distance Z1 between the first diffraction grating and the second diffraction grating is set to be not less than 0.05 m, and a slit interval distance d0 of the multi-slit element is set to be not less than 2 ?m. With the settings, the above-mentioned good X-ray image can be obtained by using the Talbot-Lau interferometer system.Type: ApplicationFiled: March 1, 2013Publication date: July 11, 2013Applicant: Konica Minolta Medical & Graphics, Inc.Inventor: Hiromu OHARA