Holography Or Interferometry Patents (Class 378/36)
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Publication number: 20130163717Abstract: An imaging apparatus includes a light source unit; a diffraction grating diffracting light from the light source unit; and a detector detecting light from the diffraction grating, wherein the light source unit includes first light-emitting parts emitting light forming a first interference pattern by being diffracted at the diffraction grating, and second light-emitting parts emitting light forming a second interference pattern by being diffracted at the diffraction grating, wherein the first and the second light-emitting parts are disposed so that at least part of the first and second interference pattern overlap and the positions of light regions in the first interference pattern differ from the positions of light regions in the second interference pattern, and wherein a combined pattern is formed by the first interference pattern and the second interference pattern.Type: ApplicationFiled: August 23, 2011Publication date: June 27, 2013Applicant: CANON KABUSHIKI KAISHAInventor: Kentaro Nagai
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Publication number: 20130148780Abstract: Grating interferometer comprising inclined phase grating structures, method for increasing the definition of phase contrast images of interferometers or in applications which are based on the Talbot effect, using inclined phase grating structures, phase gratings wherein the grating structures are positioned at angles on the substrate of the phase grating, method for producing grating structures which are positioned at angles on the substrate of the phase grating, and corresponding uses.Type: ApplicationFiled: June 15, 2011Publication date: June 13, 2013Inventors: Juergen Mohr, Franz Pfeiffer, Elena Reznikova, Vladimir Nazmov
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Publication number: 20130108015Abstract: Embodiments relate to an X-ray interferometer for imaging an object comprising: a phase grating for effecting in correspondence with the phase grating geometry a phase shift to at least a part of X-ray incident onto the phase grating; and an absorption grating for effecting in correspondence with the absorption grating geometry absorption to at least a part of X-ray incident onto the absorption grating. The grating period of the phase grating, and the grating period of the absorption grating may be dimensioned such that a detector for X-rays can be placed at a relatively large distance away from the absorption grating such the phase contrast sensitivity of the image of the object detected by the detector remains substantially unaffected.Type: ApplicationFiled: October 29, 2012Publication date: May 2, 2013Applicant: CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A - RECHERCHE ET DEVELOPPEMENTInventor: CSEM CENTRE SUISSE D'ELECTRONIQUE ET
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Patent number: 8411816Abstract: There is described a radiological image capturing apparatus, which makes it possible to obtain a good X ray image in which contrast of the peripheral portions are emphasized by employing the Talbot interferometer method and the Talbot-Lau interferometer method. The apparatus is provided with an X-ray tube, a multi-slit member, a first diffraction grating, a second diffraction grating and an X-ray detector. The second diffraction grating contacts the X-ray detector. A distance L between the multi-slit element and the first diffraction grating is set to be not less than 0.5 m, a distance Z1 between the first diffraction grating and the second diffraction grating is set to be not less than 0.05 m, and a slit interval distance d0 of the multi-slit element is set to be not less than 2 ?m. With the settings, the abovementioned good X-ray image can be obtained by using the Talbot-Lau interferometer system.Type: GrantFiled: February 14, 2008Date of Patent: April 2, 2013Assignee: Konica Minolta Medical & Graphic, Inc.Inventor: Hiromu Ohara
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Publication number: 20130070893Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.Type: ApplicationFiled: November 20, 2012Publication date: March 21, 2013Applicant: CANON KABUSHIKI KAISHAInventor: CANON KABUSHIKI KAISHA
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Publication number: 20130051515Abstract: A craser device, imaging system utilizing a craser device, and a method of imaging. The craser device includes a gain medium with excited gain medium atoms that emit x-ray and/or gamma-ray photons, a transmission medium abutting the gain medium, and a reflecting mirror comprising one or more lower refractive index layers and abutting the transmission medium. The transmission medium has a higher refractive index than the gain medium and at least one of the materials in the reflecting mirror. The x-ray and/or gamma-ray photons are confined to the transmission medium via total internal reflection and interact multiple times with the excited gain medium atoms through evanescent waves producing amplified stimulated emission leading to formation of a high intensity incoherent or coherent x-ray and/or gamma-ray beam.Type: ApplicationFiled: August 29, 2011Publication date: February 28, 2013Applicant: GENERAL ELECTRIC COMPANYInventor: Susanne Madeline Lee
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Patent number: 8374309Abstract: An arrangement and a method are disclosed for projective and/or tomographic phase-contrast imaging using X-ray radiation. In at least one embodiment, one or more phase grids is/are arranged in the beam path such that during a rotation of the at least one X-ray source, the examination object is scanned with different spatial orientations of the grid lines relative to the examination object such that the complete refraction angle, and hence the complete phase shift gradient, can be determined for each X-ray beam from the two scans with differently oriented phase grids in order to be able to show the phase shift of an examination object in terms of projections or in a tomographic image.Type: GrantFiled: January 13, 2010Date of Patent: February 12, 2013Assignees: Siemens Aktiengesellschaft, Paul Scherrer InstitutInventors: Tilman Donath, Martin Hoheisel, Christian David, Eckhard Hempel, Franz Pfeiffer, Stefan Popescu
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Patent number: 8340243Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.Type: GrantFiled: July 26, 2011Date of Patent: December 25, 2012Assignee: Canon Kabushiki KaishaInventors: Chidane Ouchi, Kentaro Nagai, Toru Den, Hidenosuke Itoh
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Publication number: 20120288055Abstract: An X-ray holography light source element divides an entering X-ray beam to emit two or more mutually coherent X-ray beams. The light source element includes an X-ray waveguide which has a core and a cladding. The core contains a plurality of substances different in a refractive-index real part and is a periodic structure body in which basic structures are periodically disposed; the cladding confines an X-ray to the core to be guided therethrough. The total reflection critical angle of the X-ray on the interface of the core and the cladding is larger than the Bragg angle corresponding to the periodicity of the basic structures of the core. A shield member provided with two or more opening portions for respectively emitting the two or more mutually coherent X-ray beams is disposed at the end portion at an emission side of the X-ray waveguide.Type: ApplicationFiled: May 8, 2012Publication date: November 15, 2012Applicant: CANON KABUSHIKI KAISHAInventors: Atsushi Komoto, Kohei Okamoto, Hirokatsu Miyata
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Patent number: 8306183Abstract: The invention relates to a method and a device for generating phase contrast X-ray images of an object (1). The device comprises an X-ray source (10) that may for example be realized by a spatially extended emitter (11) behind a grating (G0). A diffractive optical element (DOE), for example a phase grating (G1), generates an interference pattern (I) from the X-radiation that has passed the object (1), and a spectrally resolving X-ray detector (30) is used to measure this interference pattern behind the DOE. Using the information obtained for different wavelengths/energies of X-radiation, the phase shift induced by the object can be reconstructed.Type: GrantFiled: November 19, 2008Date of Patent: November 6, 2012Assignee: Koninklijke Philips Electronics N.V.Inventor: Thomas Koehler
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Publication number: 20120236988Abstract: An X-ray imaging apparatus comprises a grating configured to form an interference pattern by diffracting X-rays from an X-ray source, a amplitude grating configured to partly shield X-rays forming the interference pattern, and an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating. The amplitude grating is comprised of a central area and a peripheral area and the peripheral area shows an X-ray transmittance higher than the central area relative to X-rays perpendicularly entering the amplitude grating.Type: ApplicationFiled: March 9, 2012Publication date: September 20, 2012Applicant: CANON KABUSHIKI KAISHAInventors: Toru Den, Kimiaki Yamaguchi, Chidane Ouchi
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Publication number: 20120224236Abstract: An apparatus and method to produce a hologram of an object includes an electromagnetic radiation assembly configured to receive a received electromagnetic radiation, such as light, from the object. The electromagnetic radiation assembly is further configured to diffract the received electromagnetic radiation and transmit a diffracted electromagnetic radiation. An image capture assembly is configured to capture an image of the diffracted electromagnetic radiation and produce the hologram of the object from the captured image.Type: ApplicationFiled: April 16, 2012Publication date: September 6, 2012Applicant: Celloptic, Inc.Inventors: Joseph Rosen, Gary Brooker
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Patent number: 8233587Abstract: A source grating for a Talbot-Lau-type interferometer includes a plurality of channels having incident apertures provided on a side irradiated with X-rays and exit apertures provided on an opposite side of the side irradiated with the X-rays; the exit apertures of the channels have an aperture area smaller than an aperture area of the incident apertures; and the exit apertures of the channels are arranged so that interference fringes of Talbot self-images formed by X-rays exiting from the exit apertures of the adjacent channels are aligned with each other.Type: GrantFiled: April 6, 2010Date of Patent: July 31, 2012Assignee: Canon Kabushiki KaishaInventors: Genta Sato, Toru Den
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Patent number: 8160201Abstract: The aim of the method is to characterize an element (21) comprising a plurality of superposed layers separated from one another by interfaces. It comprises at least the following steps: The element (21) is illuminated with radiation (15) emitted by a source (13); radiation (23) transmitted through the element (21) is collected on a detector (17), this transmitted radiation forming an experimental image of the element (21) on the detector (17), the detector (17) being placed at such a distance from the element (21) that interference fringes appear on the experimental image at the interfaces between the layers; and an approximate value of at least one physical characteristic of at least one given layer is determined by calculation from the experimental image, the determination step being implemented by minimizing the difference between the experimental image and a simulated image of at least part of the experimental image of the element (21).Type: GrantFiled: July 18, 2007Date of Patent: April 17, 2012Assignee: Areva NPInventors: Julien Banchet, David Tisseur
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Patent number: 8139711Abstract: A radiation phase image radiographing apparatus, including a radiation emission unit having multiple radiation sources for emitting radiation onto a subject, the radiation sources being distributed such that radiation emitted from each of the radiation sources and transmitted through the subject forms a part of a projected image of the subject, a first diffraction grating configured to be exposed to the radiation emitted from the multiple radiation sources of the radiation emission unit and to produce a Talbot effect by the exposure, a second diffraction grating for diffracting the radiation diffracted by the first diffraction grating, and a radiation image detector for detecting the radiation diffracted by the second diffraction grating.Type: GrantFiled: September 10, 2009Date of Patent: March 20, 2012Assignee: Fujifilm CorporationInventor: Kenji Takahashi
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Publication number: 20120050832Abstract: A method of generating a hologram of an object is disclosed. The method comprises: receiving data corresponding to a plurality of non-coherent sub-holograms acquired by an optically passive synthetic aperture holographic apparatus, combining the sub-holograms to generate a mosaic hologram of the object, and transmitting the mosaic hologram to a computer readable medium.Type: ApplicationFiled: March 31, 2010Publication date: March 1, 2012Applicant: BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENTInventors: Joseph Rosen, Barak Katz
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Publication number: 20120020454Abstract: A collimator unit includes a filter set for regulating a spectrum of X-rays emitted from an X-ray source, and a source grating having plural X-ray shielding portions and X-ray transmitting portions. The X-ray shielding portions and X-ray transmitting portions extend in a y direction parallel to a rotational axis of a rotating anode of the X-ray source, and are alternately arranged in an x direction orthogonal to an optical axis direction (z direction) of the X-rays. The intensity of the X-rays is reduced in the y direction by a heel effect. However, further reduction in the intensity of the X-rays by vignetting does not occur in the y direction. Since the filter set is disposed upstream from the source grating in an application direction of the X-rays, the source grating forms arrayed narrow focuses of X-ray beams from the X-rays disturbed by a filter element.Type: ApplicationFiled: July 19, 2011Publication date: January 26, 2012Applicant: FUJIFILM CorporationInventor: Dai Murakoshi
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Patent number: 8094776Abstract: Providing a radiation emission unit having multiple radiation sources for emitting radiation onto a subject, in which the multiple radiation sources are distributed such that the radiation emitted from each radiation source and transmitted through the subject forms a part of a projected image of the subject. Each radiation source is a source that emits fan beam radiation and is disposed such that a plane of the fan beam having a wider spread angle intersects with an arrangement direction of the multiple radiation sources and is arranged parallel to each other.Type: GrantFiled: September 28, 2009Date of Patent: January 10, 2012Assignee: FUJIFILM CorporationInventor: Kenji Takahashi
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Patent number: 8073099Abstract: A differential phase-contrast X-ray imaging system is provided. Along the direction of X-ray propagation, the basic components are X-ray tube, filter, object platform, X-ray phase grating, and X-ray detector. The system provides: 1) X-ray beam from parallel-arranged source array with good coherence, high energy, and wider angles of divergence with 30-50 degree. 2) The novel X-ray detector adopted in present invention plays dual roles of conventional analyzer grating and conventional detector. The basic structure of the detector includes a set of parallel-arranged linear array X-ray scintillator screens, optical coupling system, an area array detector or parallel-arranged linear array X-ray photoconductive detector. In this case, relative parameters for scintillator screens or photoconductive detector correspond to phase grating and parallel-arranged line source array, which can provide the coherent X-rays with high energy.Type: GrantFiled: April 21, 2009Date of Patent: December 6, 2011Assignee: Shenzhen UniversityInventors: Han-Ben Niu, Jin-Chuan Guo, Xin Liu
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Publication number: 20110280368Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.Type: ApplicationFiled: July 26, 2011Publication date: November 17, 2011Applicant: CANON KABUSHIKI KAISHAInventors: Chidane Ouchi, Kentaro Nagai, Toru Den, Hidenosuke Itoh
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Patent number: 8041004Abstract: An interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, includes: a) an x-ray source, preferably a standard polychromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase-stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.Type: GrantFiled: June 28, 2007Date of Patent: October 18, 2011Assignee: Paul Scherrer InstitutInventors: Christian David, Franz Pfeiffer
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Publication number: 20110243300Abstract: An X-ray imaging system includes first to third absorption gratings. Initially, the third absorption grating is disposed in a Z axis orthogonal to a detection surface of a FPD, and the position of the third absorption grating is adjusted in ?x and ?y directions based on a dose of X-rays having passed through the third absorption grating. Then, the first absorption grating is disposed in the Z axis so as to produce a moiré pattern. The position of the first absorption grating is adjusted in the ?x and ?y directions so that a frequency of the moiré pattern detected by the FPD becomes uniform. Then, the position of the first absorption grating is adjusted in a Z or ?z direction so that the FPD loses the detection of the moiré pattern. After that, the second absorption grating is aligned in a like manner as the first absorption grating.Type: ApplicationFiled: January 29, 2011Publication date: October 6, 2011Applicant: FUJIFILM CORPORATIONInventors: Yasuhisa KANEKO, Hiroyasu Ishii
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Publication number: 20110235775Abstract: An X-ray imaging system includes an X-ray source, first and second absorption gratings, and an FPD. The first absorption grating passes X-ray emitted from the X-ray source to form a G1 image. The second absorption grating modulates intensity of the G1 image at each of relative positions to form two or more fringe images. The relative positions differ in phase with respect to a period pattern of the G1 image. The FPD detects two or more frames of image data of the fringe images. A defective pixel detector reads two or more frames of image data stored in a memory and obtains a characteristic value of an intensity modulated signal on a pixel-by-pixel basis based on the read image data. The defective pixel detector detects a defective pixel based on the characteristic value obtained.Type: ApplicationFiled: January 28, 2011Publication date: September 29, 2011Applicant: FUJIFILM CORPORATIONInventor: Takuji TADA
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Patent number: 8009797Abstract: An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.Type: GrantFiled: July 23, 2010Date of Patent: August 30, 2011Assignee: Canon Kabushiki KaishaInventors: Chidane Ouchi, Kentaro Nagai, Toru Den, Hidenosuke Itoh
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Patent number: 8005185Abstract: In a method to determine phase and/or amplitude between interfering, adjacent x-ray beams in a detector pixel in a Talbot interferometer for projective and tomographical x-ray phase contrast imaging and/or x-ray dark field imaging, after an irradiation of the examination subject with at least two coherent or quasi-coherent x-rays, an interference of the at least two coherent or quasi-coherent x-rays with the aid of an irradiated phase grating is generated, and the variation of multiple intensity measurements in temporal succession after an analysis grating is determined in relation to known displacements of one of the gratings or of an x-ray source fashioned like a grating, positioned upstream in the beam path, relative to one of the gratings.Type: GrantFiled: September 24, 2009Date of Patent: August 23, 2011Assignee: Siemens AktiengesellschaftInventor: Stefan Popescu
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Publication number: 20110200168Abstract: An imaging apparatus analyzes a periodic pattern of a Moiré due to Talbot interference by the Fourier transform method and forms an image. The imaging apparatus includes a first grating having a structure that transmits light beams from a beam source to refract or diffract the light beams and forms a self image based on a first periodic pattern by the Talbot interference at a predetermined position; a second grating that absorbs part of the first periodic pattern and causes a Moiré to be generated based on a second periodic pattern when the second grating is arranged at a position at which the self image is formed. All cross sections of the Moiré with axes in differential directions of a wavefront for the analysis by the Fourier transform method have a two-dimensional periodic structure in which periods of patterns in the second periodic pattern are the same.Type: ApplicationFiled: April 12, 2011Publication date: August 18, 2011Applicant: CANON KABUSHIKI KAISHAInventors: Chidane Ouchi, Kentaro Nagai
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Publication number: 20110182403Abstract: A two-dimensional X-ray shield grating which may be manufactured more easily and to a manufacturing method to provide therefor is provided. The method of manufacturing the X-ray shield grating includes: a first step of forming a plurality of columnar structures periodically arranged in two directions; and a second step of forming a film which surrounds at least side surfaces of the respective plurality of columnar structures, in which, in the second step, portions of the film formed on side surfaces of columnar structures which are adjacent to each other in the two directions among the plurality of columnar structures are connected to each other in the two directions, and in which the film is formed so that a columnar aperture is formed between columnar structures which are diagonally adjacent to each other with respect to the two directions among the plurality of columnar structures.Type: ApplicationFiled: December 22, 2010Publication date: July 28, 2011Applicant: CANON KABUSHIKI KAISHAInventor: Takashi Nakamura
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Publication number: 20110100880Abstract: Method for producing a stationary wave field of arbitrary shape comprising the steps of defining at least one volume being limited in the direction of the axis of propagation of a beam, of the type 0?z?L; defining an intensity pattern within the said region 0?z?L by a function F(z), describing the said localized and stationary intensity pattern, which is approximated by means of a Fourier expansion or by a similar expansion in terms of (trigonometric) orthogonal functions; providing a generic superposition of Bessel or other beams highly transversally confined; calculating the maximum number of superimposed Bessel beams the amplitudes, the phase velocities and the relative phases of each Bessel beam of the superposition, and the transverse and longitudinal wavenumbers of each Bessel beam of the superposition.Type: ApplicationFiled: May 23, 2005Publication date: May 5, 2011Applicant: Bracco Imaging S.p.A.Inventors: Erasmo Recami, Michel Zamboni Rached, Hugo Enrique Hernandez Figueroa, Valerio Abate, Cesar Augusto Dartora, Kleber Zuza Nobrega, Marco Mattiuzzi
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Patent number: 7924973Abstract: The present invention discloses an interferometer device and method. In embodiments, the device comprises an electromagnetic radiation source emitting radiation having a first mean wavelength ?LE; a phase grating having a first aspect ratio; an absorption grating having a second aspect ratio; and a detector. The electromagnetic radiation source, the phase grating, the absorption grating and the detector are radiatively coupled with each other. The absorption grating is positioned between the detector and the phase grating; the electromagnetic radiation source is positioned in front of the source grating; and wherein the phase grating is designed such to cause a phase shift that is smaller than ? on the emitted radiation. Additional and alternative embodiments are specified and claimed.Type: GrantFiled: November 12, 2008Date of Patent: April 12, 2011Assignee: Csem Centre Suisse D'Electronique Et De Microtechnique SAInventors: Christian Kottler, Rolf Kaufmann
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Publication number: 20110051889Abstract: An X-ray phase grating used for X-ray phase-contrast imaging based on Talbot interference includes a first substrate and a second substrate. The first substrate and the second substrate are combined so as to be shifted from each other by one half period. The first substrate has a first pattern in which first faces and second faces making an angle of ? (where ??0 and ??90° with the first faces are periodically arranged. The second substrate has a second pattern in which third faces corresponding to the first faces and fourth faces corresponding to the second faces and making an angle of ? with the third faces are periodically arranged.Type: ApplicationFiled: August 12, 2010Publication date: March 3, 2011Applicant: CANON KABUSHIKI KAISHAInventor: Genta Sato
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Patent number: 7889838Abstract: An interferometer for X-rays, in particular hard X-rays, for obtaining quantitative phase contrast images, includes a standard polychromatic X-ray source, a diffractive optical beam splitter other than a Bragg crystal in transmission geometry, and a position-sensitive detector with spatially modulated detection sensitivity.Type: GrantFiled: May 30, 2006Date of Patent: February 15, 2011Assignee: Paul Scherrer InstitutInventors: Christian David, Franz Pfeiffer, Timm Weitkamp
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Publication number: 20100272230Abstract: The invention relates to a method and a device for generating phase contrast X-ray images of an object (1). The device comprises an X-ray source (10) that may for example be realized by a spatially extended emitter (11) behind a grating (G0). A diffractive optical element (DOE), for example a phase grating (G1), generates an interference pattern (I) from the X-radiation that has passed the object (1), and a spectrally resolving X-ray detector (30) is used to measure this interference pattern behind the DOE. Using the information obtained for different wavelengths/energies of X-radiation, the phase shift induced by the object can be reconstructed.Type: ApplicationFiled: November 19, 2008Publication date: October 28, 2010Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.Inventor: Thomas Koehler
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Patent number: 7817777Abstract: In a focus detector arrangement and method for an x-ray apparatus for generating projection or tomographic phase-contrast images of an examination subject, a beam of coherent x-rays is generated by an anode that has areas of different radiation emission characteristics arranged in bands thereon, that proceed parallel to grid lines of a phase grid that is used to generate the phase-contrast images.Type: GrantFiled: December 6, 2006Date of Patent: October 19, 2010Assignee: Siemens AktiengesellschaftInventors: Joachim Baumann, Christian David, Martin Engelhardt, Jörg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
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Publication number: 20100260315Abstract: A source grating for a Talbot-Lau-type interferometer includes a plurality of channels having incident apertures provided on a side irradiated with X-rays and exit apertures provided on an opposite side of the side irradiated with the X-rays; the exit apertures of the channels have an aperture area smaller than an aperture area of the incident apertures; and the exit apertures of the channels are arranged so that interference fringes of Talbot self-images formed by X-rays exiting from the exit apertures of the adjacent channels are aligned with each other.Type: ApplicationFiled: April 6, 2010Publication date: October 14, 2010Applicant: CANON KABUSHIKI KAISHAInventors: Genta Sato, Toru Den
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Patent number: 7778389Abstract: The present invention provides an X-ray imaging system and method capable of performing time-resolved observation in a short measurement time at the same density resolution and in the same dynamic range as those for a diffraction enhanced X-ray imaging method, and also capable of observing a sample with high sensitivity even if the intensity of an incident X-ray varies with time. A refraction angle of X-ray beams caused by the sample is detected at a time by X-ray imagers by utilizing multiple X-ray diffractions by multiple analyzer crystals.Type: GrantFiled: June 24, 2008Date of Patent: August 17, 2010Assignee: Hitachi, Ltd.Inventor: Akio Yoneyama
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Patent number: 7751527Abstract: Provided is a thin film stack inspection method capable of accurately measuring and inspecting layer thicknesses of thin film stacks. An X-ray having a long coherence length is used as an incident X-ray and the X-ray specular-reflected from a sample placed on a goniometer is partially bent by a prism. The X-ray bent by the prism and the X-ray going straight are made to interfere with each other to obtain interference patterns. Though being thin film stacks, the sample has a portion having no thin film and thus an exposed substrate. The X-ray not bent by the prism includes an X-ray specular-reflected from the exposed substrate. By changing the incident angle from 0.01° to 1°, the interference patterns of the specular-reflected X-ray are measured. Thus, layer thicknesses are measured using a change in a phase of the X-ray reflected from a film stack interface.Type: GrantFiled: November 13, 2008Date of Patent: July 6, 2010Assignee: Hitachi, Ltd.Inventors: Kazuhiro Ueda, Akio Yoneyama
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Publication number: 20100061508Abstract: A radiation phase image radiographing apparatus, including a radiation emission unit having multiple radiation sources for emitting radiation onto a subject, the radiation sources being distributed such that radiation emitted from each of the radiation sources and transmitted through the subject forms a part of a projected image of the subject, a first diffraction grating configured to be exposed to the radiation emitted from the multiple radiation sources of the radiation emission unit and to produce a Talbot effect by the exposure, a second diffraction grating for diffracting the radiation diffracted by the first diffraction grating, and a radiation image detector for detecting the radiation diffracted by the second diffraction grating.Type: ApplicationFiled: September 10, 2009Publication date: March 11, 2010Applicant: FUJIFILM CorporationInventor: Kenji Takahashi
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Publication number: 20090303559Abstract: An apparatus and method to produce a hologram of an object includes an electromagnetic radiation assembly configured to receive a received electromagnetic radiation, such as light, from the object. The electromagnetic radiation assembly is further configured to diffract the received electromagnetic radiation and transmit a diffracted electromagnetic radiation. An image capture assembly is configured to capture an image of the diffracted electromagnetic radiation and produce the hologram of the object from the captured image.Type: ApplicationFiled: July 18, 2006Publication date: December 10, 2009Applicant: Celloptic Inc.Inventors: Joseph Rosen, Gary Brooker
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Publication number: 20090092227Abstract: An interferometer for X-rays, in particular hard X-rays, for obtaining quantitative phase contrast images, includes a standard polychromatic X-ray source, a diffractive optical beam splitter other than a Bragg crystal in transmission geometry, and a position-sensitive detector with spatially modulated detection sensitivity.Type: ApplicationFiled: May 30, 2006Publication date: April 9, 2009Inventors: Christian David, Franz Pfeiffer, Timm Weitkamp
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Patent number: 7499520Abstract: A sample which includes a region exhibiting a large density change, such as, bones or lungs and a region exhibiting a small density change, such as, biological soft tissues, and whose measurement is difficult to do for conventional absorption and phase contrast X-ray imaging apparatuses is highly sensitively imaged and observed. In a phase contrast X-ray imaging apparatus using an X-ray interferometer, a reference object whose shape and internal density distribution are analogous to those of a sample and which is known is positioned on an optical path other than an optical path in the interferometer on which the sample is positioned.Type: GrantFiled: May 9, 2007Date of Patent: March 3, 2009Assignee: Hitachi, Ltd.Inventors: Akio Yoneyama, Yasuharu Hirai
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Patent number: 7113564Abstract: An imaging apparatus and methods for using the same based upon the interposing of a sample in an X-ray interferometer, such as a Bonse-Hart interferometer. An incident X-ray is split, reflected and combined to form first and second interference beams. When a sample is placed in an optical path of one of the beams, the X-ray intensity, phase and transmission direction of the X-ray beam are altered. A change in the amplitude and phase of the interference beams caused by the sample are obtained using a fringe scanning method, and a detector is used to detect the resulting image.Type: GrantFiled: August 31, 2004Date of Patent: September 26, 2006Assignee: Hitachi, Ltd.Inventor: Akio Yoneyama
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Patent number: 7106455Abstract: There is provided an interferometer for measuring a surface shape of an optical element using interference, including a reference wave-front generating unit for generating a reference wave front for measuring the surface shape, which is provided in a target optical path, and includes an Alvarez lens.Type: GrantFiled: March 6, 2002Date of Patent: September 12, 2006Assignee: Canon Kabushiki KaishaInventors: Akiyoshi Suzuki, Yoshiyuki Sekine
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Patent number: 6870896Abstract: A method of imaging an object that includes subjecting an object to a beam of radiation that is directed along a first direction and analyzing a first portion of the beam of radiation that is transmitted through the object along the first direction so that the intensity of the first portion is suppressed. Analyzing a second portion of the beam of radiation that is refracted from the object. Generating an image of the object based on the suppressed first portion of the beam of radiation and the second portion of the beam of radiation.Type: GrantFiled: December 28, 2001Date of Patent: March 22, 2005Assignee: Osmic, Inc.Inventor: Vladimir V. Protopopov
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Patent number: 6804324Abstract: An analyzer that includes a first multilayer structure, a spacer material deposited on the first multilayer structure and a second multilayer structure deposited on the spacer material.Type: GrantFiled: March 1, 2001Date of Patent: October 12, 2004Assignee: Osmo, Inc.Inventors: Vladimir V. Martynov, Yuriy Platonov
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Publication number: 20030215053Abstract: A method of manufacturing a projection optical system (37) for projecting a pattern from a reticle to a photosensitive substrate, comprising a surface-shape-measuring step wherein the shape of an optical test surface (38) of an optical element (36) which is a component in the projection optical system is measured by causing interference between light from the optical surface (38) and light from an aspheric reference surface (70) while the optical test surface (38) and said reference surface (70) are held in integral fashion in close mutual proximity. A wavefront-aberration-measuring step is included, wherein the optical element is assembled in the projection optical system and the wavefront aberration of the projection optical system is measured.Type: ApplicationFiled: June 16, 2003Publication date: November 20, 2003Applicant: NIKON CORPORATIONInventor: Yutaka Ichihara
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Patent number: 6590954Abstract: An x-ray interferometer for analyzing high density plasmas and optically opaque materials includes a point-like x-ray source for providing a broadband x-ray source. The x-rays are directed through a target material and then are reflected by a high-quality ellipsoidally-bent imaging crystal to a diffraction grating disposed at 1× magnification. A spherically-bent imaging crystal is employed when the x-rays that are incident on the crystal surface are normal to that surface. The diffraction grating produces multiple beams which interfere with one another to produce an interference pattern which contains information about the target. A detector is disposed at the position of the image of the target produced by the interfering beams.Type: GrantFiled: June 20, 2002Date of Patent: July 8, 2003Assignee: The United States of America as represented by the United States Department of EnergyInventor: Jeffrey A. Koch
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Publication number: 20020150204Abstract: Ana analyzer that includes a first multilayer structure, a spacer material deposited on the first multilayer structure and a second multilayer structure deposited on the spacer material.Type: ApplicationFiled: March 1, 2001Publication date: October 17, 2002Inventors: Vladimir V. Martynov, Yuriy Platonov
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Publication number: 20020136352Abstract: A method of imaging an object that includes subjecting an object to a beam of radiation that is directed along a first direction and analyzing a first portion of the beam of radiation that is transmitted through the object along the first direction so that the intensity of the first portion is suppressed. Analyzing a second portion of the beam of radiation that is refracted from the object. Generating an image of the object based on the suppressed first portion of the beam of radiation and the second portion of the beam of radiation.Type: ApplicationFiled: December 28, 2001Publication date: September 26, 2002Inventor: Vladimir V. Protopopov
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Patent number: 6411406Abstract: A holographic microscope is described along with a method for numerically reconstructing a holographic image. The method uses a coordinate transformation of the Kirchhoff-Helmholtz equation to remove the non-linear component from the phase factor. The intensity distribution in the transformed coordinate system is then interpolated on an equidistant point grid and Fast-Fourier-Transforms are used to compute the result.Type: GrantFiled: March 12, 2001Date of Patent: June 25, 2002Assignee: Dalhousie UniversityInventor: H. Juergen Kreuzer
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Patent number: 6327335Abstract: A three-dimensional imaging device comprising a stationary monochromatic beam source projecting a beam onto a plurality of reflective mosaic crystals, wherein the plurality of mosaic crystals reflect the beam through a stationary object onto a stationary detector. A way for scanning the object includes moving the entire set of the mosaic crystals linearly along a line in the plane of the crystals, and rotating the entire plurality of crystals about an axis through the stationary beam source while maintaining the plurality of crystals in a fixed relative orientation. A potential application of the invention is to improve the accuracy of mammography in the diagnosis of breast cancer.Type: GrantFiled: April 13, 1999Date of Patent: December 4, 2001Assignee: Vanderbilt UniversityInventor: Frank Carroll