With Environmental Control Patents (Class 378/80)
  • Patent number: 11927550
    Abstract: The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.
    Type: Grant
    Filed: December 10, 2021
    Date of Patent: March 12, 2024
    Assignee: MALVERN PANALYTICAL B.V.
    Inventors: Jaap Boksem, Detlef Beckers
  • Patent number: 11921062
    Abstract: The present invention relates to a device for spectroscopic measurements, in particular X-ray diffraction (XRD), temperature-resolved second harmonic generation (TR-SHG) or infrared (IR) measurements, which prevents the formation of condensation (dew) or ice (frost) when carrying out spectroscopic measurements in sub-ambient temperature conditions and to a method of spectroscopic measurements with said device.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: March 5, 2024
    Assignee: Universite de Rouen-Normandie
    Inventors: Gérard Coquerel, Simon Clevers
  • Patent number: 11846594
    Abstract: It is enabled to surely attach a sample holder to a goniometer head with good reproducibility in a relatively easy manner, the sample holder holding a porous complex crystal where a single-crystal is soaked. There is provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising a goniometer having a goniometer head 514 to which a sample holder 310 is attached, the sample holder holding a porous complex crystal where a sample is soaked; an X-ray irradiation section that irradiates the X-rays to the porous complex crystal whose position is adjusted with the goniometer head 514, wherein a positioning portion for positioning the sample holder 310 to be attached is formed on a surface of the goniometer head 514, the sample holder 310 being attached onto the surface.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: December 19, 2023
    Assignee: Rigaku Corporation
    Inventor: Takashi Sato
  • Patent number: 11536639
    Abstract: An intelligent lithology identification system and method based on images and spectrum technology. The intelligent lithology identification system includes a rock shape analysis system, an image identification system, a sample processing system, a spectrum analysis system, and a central analysis and control system; wherein the central analysis and control system determines the final lithology of a sample according to the rock identification results from the image identification system and the analysis results from the spectrum analysis system. The technical solution further identifies the content and type of minerals by using spectrum technology, integrates and analyzes the results of spectrum analysis and image identification, and finally gives the lithology of the rock, which greatly improves the accuracy of lithology identification.
    Type: Grant
    Filed: April 26, 2019
    Date of Patent: December 27, 2022
    Assignee: SHANDONG UNIVERSITY
    Inventors: Shucai Li, Zhenhao Xu, Heng Shi, Huihui Xie, Tengfei Yu, Wenyang Wang, Xin Huang, Yuchao Du
  • Patent number: 11249037
    Abstract: A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: February 15, 2022
    Assignee: SMS GROUP GMBH
    Inventors: Mostafa Biglari, Ulrich Sommers, Christian Klinkenberg, Michel Renard, Guy Raymond, Oliver Pensis, Tobias Terlau, Horst Krauthäuser
  • Patent number: 9739725
    Abstract: A method for characterizing the catalyst structure in a fuel cell, and in particular the transmission X-ray absorption measurements (XAS), in which a novel fuel cell design is used. The fuel cell comprises a first (planar) electrode having a first catalyst, a second (planar) electrode having a second catalyst, and an electrolyte membrane disposed between the electrodes and having a layer thickness lm, wherein the first electrode comprises at least one catalyst-free circular region having a radius R1max. Contrary to what has been customary until now, the second electrode of the fuel cell according to the invention likewise comprises a catalyst-free circular region having a radius R2<R1max. Advantageously, 0.5 lm?[R1max?R2]?2 lm applies.
    Type: Grant
    Filed: January 17, 2014
    Date of Patent: August 22, 2017
    Inventor: Andrei Kulikovsky
  • Patent number: 9008270
    Abstract: The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ? axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ? axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle.
    Type: Grant
    Filed: April 24, 2012
    Date of Patent: April 14, 2015
    Assignee: Rigaku Corporation
    Inventors: Tomokazu Hasegawa, Kazuaki Aburaya
  • Publication number: 20150071409
    Abstract: A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part (11) and a second chamber part (12) which can be connected together and are configured so as to form a closed chamber, (b) a sample holder, (c) an integrated temperature control device for controlling the temperature of a sample (P) which is provided on the sample holder, and (d) an active cooling system for dissipating heat from the sample temperature control chamber, the active cooling system comprising a heat sink and/or a fan. A system for X-ray-based analysis of a sample, in particular for X-ray diffraction measurements, is also described.
    Type: Application
    Filed: September 10, 2014
    Publication date: March 12, 2015
    Inventors: Josef Gautsch, Christian Resch
  • Publication number: 20140185768
    Abstract: Method of measuring scattering of X-rays, characterized in that a compound to be analyzed is installed in a receptacle (1) comprising a flat bottom permeable to X-rays, in that an analysis by scattering of the X-rays is carried out by sending a stream of X-rays upwards in the direction of said bottom permeable to the X-rays and by measuring the stream of scattered X-rays that is reflected downwards, and in that a thermostatically controlled fluid at the same temperature as that of the compound to be analyzed in the receptacle is projected towards the flat bottom (3) permeable to X-rays, from outside the receptacle (1), and device for measuring scattering of X-rays characterized in that it comprises a receptacle (1) comprising a bottom shut off by a membrane (3) transparent to X-rays, as well as a diffractometer whose goniometer (4, 5) is installed so as to direct a beam of X-rays from below towards the membrane (3) transparent to X-rays and the detector (5) being installed for the measurement of the X-rays sc
    Type: Application
    Filed: April 2, 2012
    Publication date: July 3, 2014
    Applicant: UNIVERSITE DE ROUEN
    Inventors: Gerard Coquerel, Morgane Sanselme, Anais Lafontaine
  • Patent number: 8737564
    Abstract: The disclosure relates to devices for creating a low-background scattering environment proximate to the stage of an x-ray diffractometer, x-ray diffractometer systems comprising the same, and methods for collecting x-ray diffraction data.
    Type: Grant
    Filed: November 22, 2011
    Date of Patent: May 27, 2014
    Assignee: Aptuit (West Lafayette), LLC
    Inventors: Richard B. McClurg, Paul J. Schields, Rex A. Shipplett, II, Gerald Wetli
  • Publication number: 20120275567
    Abstract: The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ? axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ? axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle.
    Type: Application
    Filed: April 24, 2012
    Publication date: November 1, 2012
    Applicant: Rigaku Corporation
    Inventors: Tomokazu Hasegawa, Kazuaki Aburaya
  • Publication number: 20120155612
    Abstract: The disclosure relates to devices for creating a low-background scattering environment proximate to the stage of an x-ray diffractometer, x-ray diffractometer systems comprising the same, and methods for collecting x-ray diffraction data.
    Type: Application
    Filed: November 22, 2011
    Publication date: June 21, 2012
    Applicant: APTUIT (West Lafayette) LLC
    Inventors: Richard B. MCCLURG, Paul J. SCHIELDS, Rex A. SHIPPLETT, II, Gerald WETLI
  • Patent number: 8160751
    Abstract: Systems, devices, and methods to mitigate the pressure disturbance associated with the injection of low-pressure analyte samples into a high-pressure HPLC fluid stream, to enhance chromatographic performance related to retention time and reproducibility. The preferred embodiment coordinates the injection run with active pressure control of a binary solvent delivery system to virtually eliminate the customary pressure drop when the low-pressure loop is brought on line. An additional benefit that enhances reproducibility is accomplished by forcing a consistent timing relationship between the injection run, the mechanical position of the delivery pump pistons, and the start and subsequent gradient delivery.
    Type: Grant
    Filed: February 25, 2011
    Date of Patent: April 17, 2012
    Assignee: Waters Technologies Corporation
    Inventors: Stanley P. Pensak, Jr., John Heden, Steven J. Ciavarini, John Lamoureux, Miguel Soares
  • Patent number: 8119991
    Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.
    Type: Grant
    Filed: August 12, 2010
    Date of Patent: February 21, 2012
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventor: Dale A Harrison
  • Patent number: 8019048
    Abstract: A window arrangement on a pressure pipe, with a casing in the train or at the end of the pressure pipe, said casing featuring flanges on diametrically opposing sides having radially directed passages, whose axes are standing perpendicular to the longitudinal axis of the pressure pipe and are located in a measurement plane for an x-ray measurement device, an x-ray source being associated to the one passage on the outer side and a receiver sensitive to X-rays to the other passage, and with window plates that are transmissive for X-rays which are sealingly arranged in the associated passage and are fixed in the passage with the aid of a fastening member and which consist of a material which is resistant against high temperatures and process-due etchings by chemically aggressive substances.
    Type: Grant
    Filed: August 14, 2009
    Date of Patent: September 13, 2011
    Assignee: Sikora AG
    Inventors: Harald Sikora, Ralf Seidel
  • Patent number: 7917250
    Abstract: Systems, devices, and methods to mitigate the pressure disturbance associated with the injection of low-pressure analyte samples into a high-pressure HPLC fluid stream to enhance chromatographic performance related to retention time and reproducibility. The injection event is coordinated with active pressure control of a binary solvent delivery system to virtually eliminate the customary pressure drop when the low-pressure loop is brought on line. Consistent timing with the injection event of the mechanical position of the delivery pump pistons, and the start and subsequent gradient delivery generates reproducible results.
    Type: Grant
    Filed: August 19, 2005
    Date of Patent: March 29, 2011
    Assignee: Waters Technologies Corporation
    Inventors: Stanley P. Pensak, Jr., John Heden, Steven J. Ciavarini, John Lamoureux, Miguel Soares
  • Patent number: 7796726
    Abstract: An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: September 14, 2010
    Assignee: University of Maryland, Baltimore County
    Inventors: Keith Gendreau, Jose Vanderlei Martins, Zaven Arzoumanian
  • Patent number: 7542546
    Abstract: Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surface of a small metal rod (16). The patterned film (12) preferably includes a tip end (24) for holding a crystal. Preferably, a small sample aperture is disposed in the film for reception of the crystal. A second, larger aperture can also be provided that is connected to the sample aperture by a drainage channel, allowing removal of excess liquid and easier manipulation in viscous solutions. The curvature imparted to the film (12) increases the film's rigidity and allows a convenient scoop-like action for retrieving crystals. The polyimide contributes minimally to background and absorption, and can be treated to obtain desired hydrophobicity or hydrophilicity.
    Type: Grant
    Filed: August 27, 2007
    Date of Patent: June 2, 2009
    Assignee: Cornell Research Foundation, Inc.
    Inventors: Robert E. Thorne, Zachary Stum, Kevin O'Neill, Jan Kmetko
  • Patent number: 7477724
    Abstract: X-ray apparatus 10 includes an X-ray source (22), an X-ray detector (28) facing the X-ray source. Inlet (6) accepts a stream of particles and a guide system (18) guides the stream of particles (16) in free space between the X-ray source (22) and detector (28) so that X-ray analysis can be carried out on the particles in the stream (16) in a sample region (21) between the source (22) and the detector (28).
    Type: Grant
    Filed: March 16, 2006
    Date of Patent: January 13, 2009
    Assignee: PANalytical B.V.
    Inventors: Roger Meier, Sebastian Gehrke, Karl-Ernst Wirth
  • Patent number: 7400705
    Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: July 15, 2008
    Assignee: Rigaku Corporation
    Inventors: Kazuhito Hoshino, Yoshio Iwasaki
  • Patent number: 7331714
    Abstract: A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging. The full field transmission mode allows two-dimensional (2-D) imaging and tomography. The nanoprobe instrument includes zone plate optics for focusing and imaging. The nanoprobe instrument includes a stage group for positioning the zone plate optics. The nanoprobe instrument includes a specimen stage group for positioning the specimen. An enhanced laser Doppler displacement meter (LDDM) system provides two-dimensional differential displacement measurement in a range of nanometer resolution between the zone-plate optics and the sample holder. A digital signal processor (DSP) implements a real-time closed-loop feedback technique for providing differential vibration control between the zone-plate optics and the sample holder.
    Type: Grant
    Filed: September 29, 2005
    Date of Patent: February 19, 2008
    Assignee: UChicago Argonne, LLC
    Inventors: Deming Shu, Jorg M. Maser, Barry Lai, Franz Stefan Vogt, Martin V. Holt, Curt A. Preissner, Robert P. Winarski, Gregory B. Stephenson
  • Patent number: 7274769
    Abstract: A method and apparatus for the transportation, remote and unattended mounting, and visual alignment and monitoring of protein crystals for synchrotron generated x-ray diffraction analysis. The protein samples are maintained at liquid nitrogen temperatures at all times: during shipment, before mounting, mounting, alignment, data acquisition and following removal. The samples must additionally be stably aligned to within a few microns at a point in space. The ability to accurately perform these tasks remotely and automatically leads to a significant increase in sample throughput and reliability for high-volume protein characterization efforts. Since the protein samples are placed in a shipping-compatible layered stack of sample cassettes each holding many samples, a large number of samples can be shipped in a single cryogenic shipping container.
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: September 25, 2007
    Assignee: The Regents of the University of California
    Inventors: Robert A. Nordmeyer, Gyorgy P. Snell, Earl W. Cornell, William F. Kolbe, Derek T. Yegian, Thomas N. Earnest, Joseph M. Jaklevich, Carl W. Cork, Bernard D. Santarsiero, Raymond C. Stevens
  • Patent number: 7263162
    Abstract: Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surface of a small metal rod (16). The patterned film (12) preferably includes a tapered tip end (24) for holding a crystal. Preferably, a small sample aperture is disposed in the film for reception of the crystal. A second, larger aperture can also be provided that is connected to the sample aperture by a drainage channel, allowing removal of excess liquid and easier manipulation in viscous solutions. The curvature imparted to the film (12) increases the film's rigidity and allows a convenient scoop-like action for retrieving crystals. The polyimide contributes minimally to background and absorption, and can be treated to obtain desired hydrophobicity or hydrophilicity.
    Type: Grant
    Filed: September 19, 2005
    Date of Patent: August 28, 2007
    Assignee: Cornell Research Foundation, Inc.
    Inventors: Robert E. Thorne, Zachary Stum, Kevin O'Neill, Jan Kmetko
  • Patent number: 7120227
    Abstract: The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: October 10, 2006
    Assignee: Rigaku Corporation
    Inventors: Tetsuya Ozawa, Susumu Yamaguchi, Kohji Kakefuda
  • Patent number: 6956928
    Abstract: A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed vertically along a primary beampath to a sample located on a sample support. The small angle scattered x-ray energy travels through a secondary beampath to a detector. The primary and secondary beampaths may be evacuated and separated from a sample chamber by fluid seals. Beam conditioning optics and a collimator may be used in the primary beampath, and a beamstop used in the secondary beampath. The sample chamber may have a microscope or camera, which may be movable, for observing the sample, and a translation stage for moving the sample in at least two dimensions.
    Type: Grant
    Filed: May 5, 2003
    Date of Patent: October 18, 2005
    Assignee: Bruker AXS, Inc.
    Inventors: Bob Baoping He, Rolf Dieter Schipper
  • Patent number: 6927399
    Abstract: A device is proposed for the precision rotation of samples on a diffractometer, especially for X-ray or synchrotron radiation diffraction experiments, comprising: a centering element (26) which is held at one end of a motor-driven rotating shaft (22) and can be displaced in a plane orthogonal to the axis of rotation of the rotating shaft (22), a sample holder (30) which is fixed to the centering element (26) or integral with the latter for holding a sample (32) substantially centrally with respect to the axis of rotation in an X-ray or synchrotron radiation beam (S), at least one micrometer finger (36) which is arranged in the region of the centering element (26) and can be positioned orthogonally with respect to the axis of rotation of the rotating shaft (22) by means of a micrometer finger drive device.
    Type: Grant
    Filed: July 22, 2003
    Date of Patent: August 9, 2005
    Assignee: Europaisches Laboratorium fur Molekularbiologie (EMBL)
    Inventors: Florent Cipriani, Jean Charles Castagna
  • Patent number: 6896247
    Abstract: An X-ray analysis system controls the humidity of a sample. The analysis system has a device for dividing a gas flow stream into two portions and for submerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturized gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample. This system and a method for its use allow measurements of samples to be made as a function of humidity and temperature over wide ranges of these parameters under highly stable conditions in a straightforward manner which are not susceptible to malfunction and which can be produced and operated at low cost.
    Type: Grant
    Filed: July 18, 2002
    Date of Patent: May 24, 2005
    Assignee: Bruker Axs GmbH
    Inventors: Uwe Georg Brotzeller, Hans Leitz
  • Patent number: 6836532
    Abstract: A biological crystal formation screening apparatus uses an x-ray diffraction technique to analyze the sample containers of a sample tray for the presence of crystal formation. An x-ray source is directed toward a sample under investigation, and a two-dimensional x-ray detector is located to receive any diffracted x-ray energy. A positioning apparatus allows the different sample containers of a tray to be sequentially aligned with the source and detector, allowing each to be examined. The sample container is arranged such that a sample is located relative to the well solution so that the x-ray beam is directed to the sample without being incident on the well solution.
    Type: Grant
    Filed: April 9, 2002
    Date of Patent: December 28, 2004
    Assignee: Bruker AXS, Inc.
    Inventors: Roger D. Durst, Bob Baoping He
  • Patent number: 6825048
    Abstract: The present invention relates to a method for the wet chemical preparation of materials libraries consisting of a large number of solids, the solids being deposited from reaction mixtures in microreaction chambers onto a bottom plate which simultaneously serves as the library substrate. Depending on the material selected for the library substrate, the solids can subsequently be examined non-destructively, for example, by reflecting or penetrating microarea X-ray diffraction.
    Type: Grant
    Filed: February 26, 2001
    Date of Patent: November 30, 2004
    Assignee: hte Aktiengesellschaft the high throughput experimentation company
    Inventors: Wilhelm F. Maier, Jens Klein, Christian Lehmann, Hans-Werner Schmidt
  • Patent number: 6748048
    Abstract: An attachment 3 mounted on a specimen support portion 2 of an X-ray apparatus 1 includes a cover member 9 covering a specimen S and a scattered ray excluding member 8 provided between the cover member 9 and the specimen S. The scattered ray excluding member 8 takes in the form of a box, a case or enclosure defined by a wall 16. The enclosure has a large opening 14a on the side of the cover member 9 and a small opening 14b on the side of the specimen S. The scattered ray excluding member 8 functions to prevent scattered X-ray emitted from the cover member when X-rays from an X-ray source passes through the cover member 9 and traveling toward an X-ray detector.
    Type: Grant
    Filed: November 18, 2002
    Date of Patent: June 8, 2004
    Assignee: Rigaku Corporation
    Inventor: Akihide Dosho
  • Patent number: 6590955
    Abstract: An open chamber-type X-ray fluorescence analysis apparatus is provided to analyze a large-sized sample located outside the open chamber. The apparatus has a helium inlet provided in the open chamber for injecting helium gas into the chamber to replace gas within the chamber with helium, a film attaching/removing mechanism for covering the opening in the chamber with a film having high transmittance with respect to X-rays, and a gas outlet provided in the chamber for allowing gas to exit the chamber.
    Type: Grant
    Filed: April 5, 2001
    Date of Patent: July 8, 2003
    Assignee: Seiko Instruments Inc.
    Inventors: Yoshiki Matoba, Mitsuo Naito, Koichi Tamura
  • Patent number: 6456688
    Abstract: An X-ray spectrometer having a curved crystal monochromator which diffracts a continuous X-ray beam from an X-ray source to produce a monochromatic X-ray beam. An angle of incidence of the continuous X-ray beam can be changed with respect to the monochromator so as to change the wavelength of the monochromatic X-ray beam which is focused on and taken out from a receiving slit. The X-ray source, the monochromator and the receiving slit must be positioned always on a Rowland circle. The X-ray source and the monochromator can be moved so that the angle of incidence changes, while the receiving slit remains always stationary and the direction of an X-ray path from the center of the monochromator to the receiving slit remains always constant. Such an X-ray spectrometer is usable as an X-ray irradiation system of XAFS (X-ray Absorption Fine Structure) apparatus so that XAFS measurements require no movement of the sample.
    Type: Grant
    Filed: August 22, 2000
    Date of Patent: September 24, 2002
    Assignee: Rigaku Corporation
    Inventors: Takeyoshi Taguchi, Noboru Osawa, Kazuyuki Tohji
  • Patent number: 6408047
    Abstract: The invention provides a method of performing x-ray crystallography on samples by using a robot to select the target sample, to position the sample for x-ray crystallography, and to deposit the sample, all without transferring the sample to another device, such as a goniometer. This method allows high throughput, automated crystallography, thereby providing a high volume of samples to be tested while lessening the need for human intervention.
    Type: Grant
    Filed: October 4, 2000
    Date of Patent: June 18, 2002
    Assignee: Rigaku/MSC, Inc.
    Inventors: Mel Kitagawa, Keith Crane, Paul N Swepston, Joseph D Ferrara
  • Patent number: 5848122
    Abstract: An apparatus for making rapid in-situ thermal stress measurements includes a controlled atmosphere test chamber for receiving and holding a test sample, and a heating zone within the test chamber confined to the near vicinity of the test sample. A test sample holder, a test sample heater, an x-y translation stage and a rotating stage are mounted within the test chamber. An X-ray source is positioned for producing an incident X-ray beam directed at the test sample from different inclination angles. The incident X-ray beam passes through a long but narrow X-ray window in the test chamber, diffracts from the test sample back through the same X-ray window and continues outside of the chamber to an X-ray detector. The diffracted X-ray beam is converted to light. The light is transmitted through optical fibers and is detected by a CCD array. The invention uses an advantageous scintillation material and a slow scan, fiber-optic compatible CCD photo-sensor array.
    Type: Grant
    Filed: March 25, 1997
    Date of Patent: December 8, 1998
    Assignee: Advanced Technology Materials, Inc.
    Inventor: David S. Kurtz
  • Patent number: 5832054
    Abstract: A fluorescent x-ray analyzer of the type irradiating a sample from below is provided with both a larger outer cover case and a smaller outer cover case respectively for covering a relatively large and small sample placed on top of a base plate at the top of an evacuable analysis chamber. The inner cover case is attached to the inside of the outer cover case when a small sample is to be analyzed but the two cover cases are separated and only the outer cover case is used when a larger sample is to be analyzed such that only a small amount of air is required to be removed to create a vacuum environment around the sample.
    Type: Grant
    Filed: August 15, 1997
    Date of Patent: November 3, 1998
    Assignee: Shimadzu Corporation
    Inventor: Shoji Kuwabara
  • Patent number: 5390230
    Abstract: A sample holder for diffraction analysis protects air or moisture sensitive samples and accommodates samples of different sizes, both without contributing to background noise. In particular, a sample holder for beam diffractometery includes a holder body having a substantially flat beam-facing top surface and a through-hole extending through the top surface, a piston fitted in the through-hole so as to travel along an axis of the through-hole, and a cup-shaped cap fitted over at least a portion of the top surface, surrounding the through-hole. To minimize background noise, the top surface of the holder body and a top surface of the piston are made of quartz. For sample loading, a substantially flat plate and a mechanism for removably attaching the plate so as to overlie the top surface of the holder body are provided. The cap may be made of thin plastic so as to not affect the incident X-ray beam.
    Type: Grant
    Filed: March 30, 1993
    Date of Patent: February 14, 1995
    Assignee: Valence Technology, Inc.
    Inventor: On-Kok Chang
  • Patent number: 5046077
    Abstract: The invention discloses a method and an apparatus for measuring lattice spacings in particular of a single crystal during the growth thereof by vapor deposition while located in a heating furnace.
    Type: Grant
    Filed: June 15, 1990
    Date of Patent: September 3, 1991
    Assignee: U.S. Philips Corporation
    Inventor: Hiromu Murayama
  • Patent number: 4821303
    Abstract: Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20.degree. (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.
    Type: Grant
    Filed: October 6, 1987
    Date of Patent: April 11, 1989
    Assignee: The Dow Chemical Company
    Inventors: Timothy G. Fawcett, William C. Harris, Jr., Robert A. Newman, Lawrence F. Whiting, Frank J. Knoll
  • Patent number: 4658411
    Abstract: A goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample comprises a sample-holder to maintain the monocrystal to be analyzed in the axis of the incident X-ray or neutron beam. Means for driving this sample-holder on itself, about a first axis, and also in rotation about a second axis perpendicular to the first and a third axis perpendicular to the second. The sample-holder is borne by a slave-goniometer comprising a transverse bar made of ferromagnetic material fast with the sample-holder, therefore perpendicular to the first axis of rotation of the sample-holder on itself. The sample-holder is rotatably mounted onto a support forming part of a universal joint mounted on a fixed base and of which the two perpendicular axes correspond respectively to the second and third axes of rotation.
    Type: Grant
    Filed: June 19, 1985
    Date of Patent: April 14, 1987
    Assignee: Centre National de la Recherche Scientifique (CNRS).
    Inventors: Roger Argoud, Jean-Noel Muller
  • Patent number: 4602377
    Abstract: An adjustable X-ray collimation system for a diamond-anvil high-pressure cell of the type including a cooperable piston and cylinder and a pair of opposing diamonds located between the head of the piston and the head of the cylinder. The X-ray collimation system includes a tubular insert which contains an X-ray collimator. The insert is engageable in the bore of the piston. The collimator is mounted within the insert by means of an elastomeric O-ring at the end closest the opposed diamonds, and by means of a set of adjustable set screws at the opposite end. By adjustment of the set screws the collimator can be pivoted about the O-ring and brought into alignment with the opposed diamonds and the sample contained therein. In the preferred embodiment there is further provided a set of plugs which are insertable in the bore of the collimator. The plugs have bores of different diameters.
    Type: Grant
    Filed: March 30, 1984
    Date of Patent: July 22, 1986
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: David Schiferl, Barton W. Olinger, Robert W. Livingston
  • Patent number: H355
    Abstract: Specimen particles in pressurized liquid sea are reoriented by magnetic stirring as a magnetic field surrounding the particles changes direction and the particle reorient themselves to respond to the change. Nonmagnetic particles as well as magnetic particles can be reoriented by simply including magnetic particles along with the nonmagnetic particles in the sea so that the magnetic particles collide with the nonmagnetic particles or attach to them so as to reorient them (individual particles) as they themselves reorient is response to change in direction of the magnetic field.
    Type: Grant
    Filed: July 2, 1986
    Date of Patent: October 6, 1987
    Assignee: United States of America
    Inventors: Earl F. Skelton, William T. Elam, Alan W. Webb