With Environmental Control Patents (Class 378/80)
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Patent number: 11927550Abstract: The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.Type: GrantFiled: December 10, 2021Date of Patent: March 12, 2024Assignee: MALVERN PANALYTICAL B.V.Inventors: Jaap Boksem, Detlef Beckers
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Patent number: 11921062Abstract: The present invention relates to a device for spectroscopic measurements, in particular X-ray diffraction (XRD), temperature-resolved second harmonic generation (TR-SHG) or infrared (IR) measurements, which prevents the formation of condensation (dew) or ice (frost) when carrying out spectroscopic measurements in sub-ambient temperature conditions and to a method of spectroscopic measurements with said device.Type: GrantFiled: May 10, 2019Date of Patent: March 5, 2024Assignee: Universite de Rouen-NormandieInventors: Gérard Coquerel, Simon Clevers
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Patent number: 11846594Abstract: It is enabled to surely attach a sample holder to a goniometer head with good reproducibility in a relatively easy manner, the sample holder holding a porous complex crystal where a single-crystal is soaked. There is provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising a goniometer having a goniometer head 514 to which a sample holder 310 is attached, the sample holder holding a porous complex crystal where a sample is soaked; an X-ray irradiation section that irradiates the X-rays to the porous complex crystal whose position is adjusted with the goniometer head 514, wherein a positioning portion for positioning the sample holder 310 to be attached is formed on a surface of the goniometer head 514, the sample holder 310 being attached onto the surface.Type: GrantFiled: November 21, 2019Date of Patent: December 19, 2023Assignee: Rigaku CorporationInventor: Takashi Sato
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Patent number: 11536639Abstract: An intelligent lithology identification system and method based on images and spectrum technology. The intelligent lithology identification system includes a rock shape analysis system, an image identification system, a sample processing system, a spectrum analysis system, and a central analysis and control system; wherein the central analysis and control system determines the final lithology of a sample according to the rock identification results from the image identification system and the analysis results from the spectrum analysis system. The technical solution further identifies the content and type of minerals by using spectrum technology, integrates and analyzes the results of spectrum analysis and image identification, and finally gives the lithology of the rock, which greatly improves the accuracy of lithology identification.Type: GrantFiled: April 26, 2019Date of Patent: December 27, 2022Assignee: SHANDONG UNIVERSITYInventors: Shucai Li, Zhenhao Xu, Heng Shi, Huihui Xie, Tengfei Yu, Wenyang Wang, Xin Huang, Yuchao Du
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Patent number: 11249037Abstract: A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.Type: GrantFiled: May 24, 2017Date of Patent: February 15, 2022Assignee: SMS GROUP GMBHInventors: Mostafa Biglari, Ulrich Sommers, Christian Klinkenberg, Michel Renard, Guy Raymond, Oliver Pensis, Tobias Terlau, Horst Krauthäuser
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Patent number: 9739725Abstract: A method for characterizing the catalyst structure in a fuel cell, and in particular the transmission X-ray absorption measurements (XAS), in which a novel fuel cell design is used. The fuel cell comprises a first (planar) electrode having a first catalyst, a second (planar) electrode having a second catalyst, and an electrolyte membrane disposed between the electrodes and having a layer thickness lm, wherein the first electrode comprises at least one catalyst-free circular region having a radius R1max. Contrary to what has been customary until now, the second electrode of the fuel cell according to the invention likewise comprises a catalyst-free circular region having a radius R2<R1max. Advantageously, 0.5 lm?[R1max?R2]?2 lm applies.Type: GrantFiled: January 17, 2014Date of Patent: August 22, 2017Inventor: Andrei Kulikovsky
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Patent number: 9008270Abstract: The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ? axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ? axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle.Type: GrantFiled: April 24, 2012Date of Patent: April 14, 2015Assignee: Rigaku CorporationInventors: Tomokazu Hasegawa, Kazuaki Aburaya
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Publication number: 20150071409Abstract: A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part (11) and a second chamber part (12) which can be connected together and are configured so as to form a closed chamber, (b) a sample holder, (c) an integrated temperature control device for controlling the temperature of a sample (P) which is provided on the sample holder, and (d) an active cooling system for dissipating heat from the sample temperature control chamber, the active cooling system comprising a heat sink and/or a fan. A system for X-ray-based analysis of a sample, in particular for X-ray diffraction measurements, is also described.Type: ApplicationFiled: September 10, 2014Publication date: March 12, 2015Inventors: Josef Gautsch, Christian Resch
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Publication number: 20140185768Abstract: Method of measuring scattering of X-rays, characterized in that a compound to be analyzed is installed in a receptacle (1) comprising a flat bottom permeable to X-rays, in that an analysis by scattering of the X-rays is carried out by sending a stream of X-rays upwards in the direction of said bottom permeable to the X-rays and by measuring the stream of scattered X-rays that is reflected downwards, and in that a thermostatically controlled fluid at the same temperature as that of the compound to be analyzed in the receptacle is projected towards the flat bottom (3) permeable to X-rays, from outside the receptacle (1), and device for measuring scattering of X-rays characterized in that it comprises a receptacle (1) comprising a bottom shut off by a membrane (3) transparent to X-rays, as well as a diffractometer whose goniometer (4, 5) is installed so as to direct a beam of X-rays from below towards the membrane (3) transparent to X-rays and the detector (5) being installed for the measurement of the X-rays scType: ApplicationFiled: April 2, 2012Publication date: July 3, 2014Applicant: UNIVERSITE DE ROUENInventors: Gerard Coquerel, Morgane Sanselme, Anais Lafontaine
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Patent number: 8737564Abstract: The disclosure relates to devices for creating a low-background scattering environment proximate to the stage of an x-ray diffractometer, x-ray diffractometer systems comprising the same, and methods for collecting x-ray diffraction data.Type: GrantFiled: November 22, 2011Date of Patent: May 27, 2014Assignee: Aptuit (West Lafayette), LLCInventors: Richard B. McClurg, Paul J. Schields, Rex A. Shipplett, II, Gerald Wetli
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Publication number: 20120275567Abstract: The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ? axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ? axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle.Type: ApplicationFiled: April 24, 2012Publication date: November 1, 2012Applicant: Rigaku CorporationInventors: Tomokazu Hasegawa, Kazuaki Aburaya
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Publication number: 20120155612Abstract: The disclosure relates to devices for creating a low-background scattering environment proximate to the stage of an x-ray diffractometer, x-ray diffractometer systems comprising the same, and methods for collecting x-ray diffraction data.Type: ApplicationFiled: November 22, 2011Publication date: June 21, 2012Applicant: APTUIT (West Lafayette) LLCInventors: Richard B. MCCLURG, Paul J. SCHIELDS, Rex A. SHIPPLETT, II, Gerald WETLI
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Patent number: 8160751Abstract: Systems, devices, and methods to mitigate the pressure disturbance associated with the injection of low-pressure analyte samples into a high-pressure HPLC fluid stream, to enhance chromatographic performance related to retention time and reproducibility. The preferred embodiment coordinates the injection run with active pressure control of a binary solvent delivery system to virtually eliminate the customary pressure drop when the low-pressure loop is brought on line. An additional benefit that enhances reproducibility is accomplished by forcing a consistent timing relationship between the injection run, the mechanical position of the delivery pump pistons, and the start and subsequent gradient delivery.Type: GrantFiled: February 25, 2011Date of Patent: April 17, 2012Assignee: Waters Technologies CorporationInventors: Stanley P. Pensak, Jr., John Heden, Steven J. Ciavarini, John Lamoureux, Miguel Soares
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Patent number: 8119991Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.Type: GrantFiled: August 12, 2010Date of Patent: February 21, 2012Assignee: Jordan Valley Semiconductors Ltd.Inventor: Dale A Harrison
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Patent number: 8019048Abstract: A window arrangement on a pressure pipe, with a casing in the train or at the end of the pressure pipe, said casing featuring flanges on diametrically opposing sides having radially directed passages, whose axes are standing perpendicular to the longitudinal axis of the pressure pipe and are located in a measurement plane for an x-ray measurement device, an x-ray source being associated to the one passage on the outer side and a receiver sensitive to X-rays to the other passage, and with window plates that are transmissive for X-rays which are sealingly arranged in the associated passage and are fixed in the passage with the aid of a fastening member and which consist of a material which is resistant against high temperatures and process-due etchings by chemically aggressive substances.Type: GrantFiled: August 14, 2009Date of Patent: September 13, 2011Assignee: Sikora AGInventors: Harald Sikora, Ralf Seidel
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Patent number: 7917250Abstract: Systems, devices, and methods to mitigate the pressure disturbance associated with the injection of low-pressure analyte samples into a high-pressure HPLC fluid stream to enhance chromatographic performance related to retention time and reproducibility. The injection event is coordinated with active pressure control of a binary solvent delivery system to virtually eliminate the customary pressure drop when the low-pressure loop is brought on line. Consistent timing with the injection event of the mechanical position of the delivery pump pistons, and the start and subsequent gradient delivery generates reproducible results.Type: GrantFiled: August 19, 2005Date of Patent: March 29, 2011Assignee: Waters Technologies CorporationInventors: Stanley P. Pensak, Jr., John Heden, Steven J. Ciavarini, John Lamoureux, Miguel Soares
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Patent number: 7796726Abstract: An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.Type: GrantFiled: February 14, 2007Date of Patent: September 14, 2010Assignee: University of Maryland, Baltimore CountyInventors: Keith Gendreau, Jose Vanderlei Martins, Zaven Arzoumanian
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Patent number: 7542546Abstract: Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surface of a small metal rod (16). The patterned film (12) preferably includes a tip end (24) for holding a crystal. Preferably, a small sample aperture is disposed in the film for reception of the crystal. A second, larger aperture can also be provided that is connected to the sample aperture by a drainage channel, allowing removal of excess liquid and easier manipulation in viscous solutions. The curvature imparted to the film (12) increases the film's rigidity and allows a convenient scoop-like action for retrieving crystals. The polyimide contributes minimally to background and absorption, and can be treated to obtain desired hydrophobicity or hydrophilicity.Type: GrantFiled: August 27, 2007Date of Patent: June 2, 2009Assignee: Cornell Research Foundation, Inc.Inventors: Robert E. Thorne, Zachary Stum, Kevin O'Neill, Jan Kmetko
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Patent number: 7477724Abstract: X-ray apparatus 10 includes an X-ray source (22), an X-ray detector (28) facing the X-ray source. Inlet (6) accepts a stream of particles and a guide system (18) guides the stream of particles (16) in free space between the X-ray source (22) and detector (28) so that X-ray analysis can be carried out on the particles in the stream (16) in a sample region (21) between the source (22) and the detector (28).Type: GrantFiled: March 16, 2006Date of Patent: January 13, 2009Assignee: PANalytical B.V.Inventors: Roger Meier, Sebastian Gehrke, Karl-Ernst Wirth
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Patent number: 7400705Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.Type: GrantFiled: June 9, 2003Date of Patent: July 15, 2008Assignee: Rigaku CorporationInventors: Kazuhito Hoshino, Yoshio Iwasaki
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Patent number: 7331714Abstract: A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging. The full field transmission mode allows two-dimensional (2-D) imaging and tomography. The nanoprobe instrument includes zone plate optics for focusing and imaging. The nanoprobe instrument includes a stage group for positioning the zone plate optics. The nanoprobe instrument includes a specimen stage group for positioning the specimen. An enhanced laser Doppler displacement meter (LDDM) system provides two-dimensional differential displacement measurement in a range of nanometer resolution between the zone-plate optics and the sample holder. A digital signal processor (DSP) implements a real-time closed-loop feedback technique for providing differential vibration control between the zone-plate optics and the sample holder.Type: GrantFiled: September 29, 2005Date of Patent: February 19, 2008Assignee: UChicago Argonne, LLCInventors: Deming Shu, Jorg M. Maser, Barry Lai, Franz Stefan Vogt, Martin V. Holt, Curt A. Preissner, Robert P. Winarski, Gregory B. Stephenson
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Patent number: 7274769Abstract: A method and apparatus for the transportation, remote and unattended mounting, and visual alignment and monitoring of protein crystals for synchrotron generated x-ray diffraction analysis. The protein samples are maintained at liquid nitrogen temperatures at all times: during shipment, before mounting, mounting, alignment, data acquisition and following removal. The samples must additionally be stably aligned to within a few microns at a point in space. The ability to accurately perform these tasks remotely and automatically leads to a significant increase in sample throughput and reliability for high-volume protein characterization efforts. Since the protein samples are placed in a shipping-compatible layered stack of sample cassettes each holding many samples, a large number of samples can be shipped in a single cryogenic shipping container.Type: GrantFiled: February 22, 2005Date of Patent: September 25, 2007Assignee: The Regents of the University of CaliforniaInventors: Robert A. Nordmeyer, Gyorgy P. Snell, Earl W. Cornell, William F. Kolbe, Derek T. Yegian, Thomas N. Earnest, Joseph M. Jaklevich, Carl W. Cork, Bernard D. Santarsiero, Raymond C. Stevens
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Patent number: 7263162Abstract: Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surface of a small metal rod (16). The patterned film (12) preferably includes a tapered tip end (24) for holding a crystal. Preferably, a small sample aperture is disposed in the film for reception of the crystal. A second, larger aperture can also be provided that is connected to the sample aperture by a drainage channel, allowing removal of excess liquid and easier manipulation in viscous solutions. The curvature imparted to the film (12) increases the film's rigidity and allows a convenient scoop-like action for retrieving crystals. The polyimide contributes minimally to background and absorption, and can be treated to obtain desired hydrophobicity or hydrophilicity.Type: GrantFiled: September 19, 2005Date of Patent: August 28, 2007Assignee: Cornell Research Foundation, Inc.Inventors: Robert E. Thorne, Zachary Stum, Kevin O'Neill, Jan Kmetko
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Patent number: 7120227Abstract: The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.Type: GrantFiled: May 25, 2004Date of Patent: October 10, 2006Assignee: Rigaku CorporationInventors: Tetsuya Ozawa, Susumu Yamaguchi, Kohji Kakefuda
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Patent number: 6956928Abstract: A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed vertically along a primary beampath to a sample located on a sample support. The small angle scattered x-ray energy travels through a secondary beampath to a detector. The primary and secondary beampaths may be evacuated and separated from a sample chamber by fluid seals. Beam conditioning optics and a collimator may be used in the primary beampath, and a beamstop used in the secondary beampath. The sample chamber may have a microscope or camera, which may be movable, for observing the sample, and a translation stage for moving the sample in at least two dimensions.Type: GrantFiled: May 5, 2003Date of Patent: October 18, 2005Assignee: Bruker AXS, Inc.Inventors: Bob Baoping He, Rolf Dieter Schipper
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Patent number: 6927399Abstract: A device is proposed for the precision rotation of samples on a diffractometer, especially for X-ray or synchrotron radiation diffraction experiments, comprising: a centering element (26) which is held at one end of a motor-driven rotating shaft (22) and can be displaced in a plane orthogonal to the axis of rotation of the rotating shaft (22), a sample holder (30) which is fixed to the centering element (26) or integral with the latter for holding a sample (32) substantially centrally with respect to the axis of rotation in an X-ray or synchrotron radiation beam (S), at least one micrometer finger (36) which is arranged in the region of the centering element (26) and can be positioned orthogonally with respect to the axis of rotation of the rotating shaft (22) by means of a micrometer finger drive device.Type: GrantFiled: July 22, 2003Date of Patent: August 9, 2005Assignee: Europaisches Laboratorium fur Molekularbiologie (EMBL)Inventors: Florent Cipriani, Jean Charles Castagna
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Patent number: 6896247Abstract: An X-ray analysis system controls the humidity of a sample. The analysis system has a device for dividing a gas flow stream into two portions and for submerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturized gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample. This system and a method for its use allow measurements of samples to be made as a function of humidity and temperature over wide ranges of these parameters under highly stable conditions in a straightforward manner which are not susceptible to malfunction and which can be produced and operated at low cost.Type: GrantFiled: July 18, 2002Date of Patent: May 24, 2005Assignee: Bruker Axs GmbHInventors: Uwe Georg Brotzeller, Hans Leitz
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Patent number: 6836532Abstract: A biological crystal formation screening apparatus uses an x-ray diffraction technique to analyze the sample containers of a sample tray for the presence of crystal formation. An x-ray source is directed toward a sample under investigation, and a two-dimensional x-ray detector is located to receive any diffracted x-ray energy. A positioning apparatus allows the different sample containers of a tray to be sequentially aligned with the source and detector, allowing each to be examined. The sample container is arranged such that a sample is located relative to the well solution so that the x-ray beam is directed to the sample without being incident on the well solution.Type: GrantFiled: April 9, 2002Date of Patent: December 28, 2004Assignee: Bruker AXS, Inc.Inventors: Roger D. Durst, Bob Baoping He
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Patent number: 6825048Abstract: The present invention relates to a method for the wet chemical preparation of materials libraries consisting of a large number of solids, the solids being deposited from reaction mixtures in microreaction chambers onto a bottom plate which simultaneously serves as the library substrate. Depending on the material selected for the library substrate, the solids can subsequently be examined non-destructively, for example, by reflecting or penetrating microarea X-ray diffraction.Type: GrantFiled: February 26, 2001Date of Patent: November 30, 2004Assignee: hte Aktiengesellschaft the high throughput experimentation companyInventors: Wilhelm F. Maier, Jens Klein, Christian Lehmann, Hans-Werner Schmidt
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Patent number: 6748048Abstract: An attachment 3 mounted on a specimen support portion 2 of an X-ray apparatus 1 includes a cover member 9 covering a specimen S and a scattered ray excluding member 8 provided between the cover member 9 and the specimen S. The scattered ray excluding member 8 takes in the form of a box, a case or enclosure defined by a wall 16. The enclosure has a large opening 14a on the side of the cover member 9 and a small opening 14b on the side of the specimen S. The scattered ray excluding member 8 functions to prevent scattered X-ray emitted from the cover member when X-rays from an X-ray source passes through the cover member 9 and traveling toward an X-ray detector.Type: GrantFiled: November 18, 2002Date of Patent: June 8, 2004Assignee: Rigaku CorporationInventor: Akihide Dosho
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Patent number: 6590955Abstract: An open chamber-type X-ray fluorescence analysis apparatus is provided to analyze a large-sized sample located outside the open chamber. The apparatus has a helium inlet provided in the open chamber for injecting helium gas into the chamber to replace gas within the chamber with helium, a film attaching/removing mechanism for covering the opening in the chamber with a film having high transmittance with respect to X-rays, and a gas outlet provided in the chamber for allowing gas to exit the chamber.Type: GrantFiled: April 5, 2001Date of Patent: July 8, 2003Assignee: Seiko Instruments Inc.Inventors: Yoshiki Matoba, Mitsuo Naito, Koichi Tamura
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Patent number: 6456688Abstract: An X-ray spectrometer having a curved crystal monochromator which diffracts a continuous X-ray beam from an X-ray source to produce a monochromatic X-ray beam. An angle of incidence of the continuous X-ray beam can be changed with respect to the monochromator so as to change the wavelength of the monochromatic X-ray beam which is focused on and taken out from a receiving slit. The X-ray source, the monochromator and the receiving slit must be positioned always on a Rowland circle. The X-ray source and the monochromator can be moved so that the angle of incidence changes, while the receiving slit remains always stationary and the direction of an X-ray path from the center of the monochromator to the receiving slit remains always constant. Such an X-ray spectrometer is usable as an X-ray irradiation system of XAFS (X-ray Absorption Fine Structure) apparatus so that XAFS measurements require no movement of the sample.Type: GrantFiled: August 22, 2000Date of Patent: September 24, 2002Assignee: Rigaku CorporationInventors: Takeyoshi Taguchi, Noboru Osawa, Kazuyuki Tohji
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Patent number: 6408047Abstract: The invention provides a method of performing x-ray crystallography on samples by using a robot to select the target sample, to position the sample for x-ray crystallography, and to deposit the sample, all without transferring the sample to another device, such as a goniometer. This method allows high throughput, automated crystallography, thereby providing a high volume of samples to be tested while lessening the need for human intervention.Type: GrantFiled: October 4, 2000Date of Patent: June 18, 2002Assignee: Rigaku/MSC, Inc.Inventors: Mel Kitagawa, Keith Crane, Paul N Swepston, Joseph D Ferrara
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Patent number: 5848122Abstract: An apparatus for making rapid in-situ thermal stress measurements includes a controlled atmosphere test chamber for receiving and holding a test sample, and a heating zone within the test chamber confined to the near vicinity of the test sample. A test sample holder, a test sample heater, an x-y translation stage and a rotating stage are mounted within the test chamber. An X-ray source is positioned for producing an incident X-ray beam directed at the test sample from different inclination angles. The incident X-ray beam passes through a long but narrow X-ray window in the test chamber, diffracts from the test sample back through the same X-ray window and continues outside of the chamber to an X-ray detector. The diffracted X-ray beam is converted to light. The light is transmitted through optical fibers and is detected by a CCD array. The invention uses an advantageous scintillation material and a slow scan, fiber-optic compatible CCD photo-sensor array.Type: GrantFiled: March 25, 1997Date of Patent: December 8, 1998Assignee: Advanced Technology Materials, Inc.Inventor: David S. Kurtz
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Patent number: 5832054Abstract: A fluorescent x-ray analyzer of the type irradiating a sample from below is provided with both a larger outer cover case and a smaller outer cover case respectively for covering a relatively large and small sample placed on top of a base plate at the top of an evacuable analysis chamber. The inner cover case is attached to the inside of the outer cover case when a small sample is to be analyzed but the two cover cases are separated and only the outer cover case is used when a larger sample is to be analyzed such that only a small amount of air is required to be removed to create a vacuum environment around the sample.Type: GrantFiled: August 15, 1997Date of Patent: November 3, 1998Assignee: Shimadzu CorporationInventor: Shoji Kuwabara
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Patent number: 5390230Abstract: A sample holder for diffraction analysis protects air or moisture sensitive samples and accommodates samples of different sizes, both without contributing to background noise. In particular, a sample holder for beam diffractometery includes a holder body having a substantially flat beam-facing top surface and a through-hole extending through the top surface, a piston fitted in the through-hole so as to travel along an axis of the through-hole, and a cup-shaped cap fitted over at least a portion of the top surface, surrounding the through-hole. To minimize background noise, the top surface of the holder body and a top surface of the piston are made of quartz. For sample loading, a substantially flat plate and a mechanism for removably attaching the plate so as to overlie the top surface of the holder body are provided. The cap may be made of thin plastic so as to not affect the incident X-ray beam.Type: GrantFiled: March 30, 1993Date of Patent: February 14, 1995Assignee: Valence Technology, Inc.Inventor: On-Kok Chang
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Patent number: 5046077Abstract: The invention discloses a method and an apparatus for measuring lattice spacings in particular of a single crystal during the growth thereof by vapor deposition while located in a heating furnace.Type: GrantFiled: June 15, 1990Date of Patent: September 3, 1991Assignee: U.S. Philips CorporationInventor: Hiromu Murayama
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Patent number: 4821303Abstract: Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20.degree. (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.Type: GrantFiled: October 6, 1987Date of Patent: April 11, 1989Assignee: The Dow Chemical CompanyInventors: Timothy G. Fawcett, William C. Harris, Jr., Robert A. Newman, Lawrence F. Whiting, Frank J. Knoll
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Patent number: 4658411Abstract: A goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample comprises a sample-holder to maintain the monocrystal to be analyzed in the axis of the incident X-ray or neutron beam. Means for driving this sample-holder on itself, about a first axis, and also in rotation about a second axis perpendicular to the first and a third axis perpendicular to the second. The sample-holder is borne by a slave-goniometer comprising a transverse bar made of ferromagnetic material fast with the sample-holder, therefore perpendicular to the first axis of rotation of the sample-holder on itself. The sample-holder is rotatably mounted onto a support forming part of a universal joint mounted on a fixed base and of which the two perpendicular axes correspond respectively to the second and third axes of rotation.Type: GrantFiled: June 19, 1985Date of Patent: April 14, 1987Assignee: Centre National de la Recherche Scientifique (CNRS).Inventors: Roger Argoud, Jean-Noel Muller
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Patent number: 4602377Abstract: An adjustable X-ray collimation system for a diamond-anvil high-pressure cell of the type including a cooperable piston and cylinder and a pair of opposing diamonds located between the head of the piston and the head of the cylinder. The X-ray collimation system includes a tubular insert which contains an X-ray collimator. The insert is engageable in the bore of the piston. The collimator is mounted within the insert by means of an elastomeric O-ring at the end closest the opposed diamonds, and by means of a set of adjustable set screws at the opposite end. By adjustment of the set screws the collimator can be pivoted about the O-ring and brought into alignment with the opposed diamonds and the sample contained therein. In the preferred embodiment there is further provided a set of plugs which are insertable in the bore of the collimator. The plugs have bores of different diameters.Type: GrantFiled: March 30, 1984Date of Patent: July 22, 1986Assignee: The United States of America as represented by the United States Department of EnergyInventors: David Schiferl, Barton W. Olinger, Robert W. Livingston
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Patent number: H355Abstract: Specimen particles in pressurized liquid sea are reoriented by magnetic stirring as a magnetic field surrounding the particles changes direction and the particle reorient themselves to respond to the change. Nonmagnetic particles as well as magnetic particles can be reoriented by simply including magnetic particles along with the nonmagnetic particles in the sea so that the magnetic particles collide with the nonmagnetic particles or attach to them so as to reorient them (individual particles) as they themselves reorient is response to change in direction of the magnetic field.Type: GrantFiled: July 2, 1986Date of Patent: October 6, 1987Assignee: United States of AmericaInventors: Earl F. Skelton, William T. Elam, Alan W. Webb