Abstract: A method is provided for imaging a workpiece by capturing successive frames of an elongate stationary field of view transverse to a workpiece transit path of a robot, while the workpiece is transported by the robot. The robot transit path is illuminated with an elongate illumination pattern transverse to the transit path to obtain a workpiece image of successive frames. Motion-induced image distortion is corrected by computing respective correct locations of respective ones of the frames along the transit path.

Abstract: Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data.

Abstract: A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.

Abstract: The technology disclosed relates to scanning of large flat substrates for reading and writing images. Examples are flat panel displays, PCB's and photovoltaic panels. Reading and writing is to be understood in a broad sense: reading may mean microscopy, inspection, metrology, spectroscopy, interferometry, scatterometry, etc. of a large workpiece, and writing may mean exposing a photoresist, annealing by optical heating, ablating, or creating any other change to the surface by an optical beam. In particular, we disclose a technology that uses a rotating or swinging arm that describes an arc across a workpiece as it scans, instead of following a traditional straight-line motion.

Abstract: In one embodiment, a system includes an optical monitoring system configured to optically communicate with an interior of a rotary machine. The optical monitoring system is configured to redirect a field of view toward different regions of a component within the interior of the rotary machine while the rotary machine is in operation, and to capture an image of each region.

Abstract: Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.

Abstract: In a method for processing a workpiece in a tool machine, a first step (Step S4) for continuously measuring a position of a tip portion of a tool attached to a main axis, a second step (Step S5) for computing a displacement amount of the position of the tip point of the tool based on a result of the measurement, a third step (Step S8) for observing a time period while the displace amount is belonged in arrange of allowable displace amount previously determined, a fourth step (Step S9) for keeping an idling operation in case that the time for which the displace amount is belonged in the range of the allowable displacement amount is shorter than a time period previously determined and intermitting the idling operation in the case that the time for which the displace amount is belonged in the range of the allowable displacement amount become the time period previously determined and a fifth step (Step S10) for starting a process with respect to the workpiece in the case that the idling operation is finished are

Abstract: There is described a method with which, on the basis of a three-dimensional recording of a component to be reworked, its surface configuration can be determined and stored temporarily so that, after it has been coated, it can be produced in its original surface form, or in its surface form then required, in certain regions, i.e. locally in the area of film-cooling openings. An especially precise and quick three-dimensional recording can be achieved by the use of the triangulation method. In this case, a reference pattern depicted on the component by a projector is recorded by two camera arranged at an angle. From the images from the cameras, the coordinates describing the surface three-dimensionally can then be determined by a control system using the triangulation method.

Abstract: A system and a method for detecting a damaged or missing machine part. The system includes an image capturing device for capturing images of the machine and a processor for processing the captured images. The system may further include a sensible output for providing an indication of a damaged or missing machine part. The method includes capturing images of the machine against a background which moves relative to the machine over time, selecting a pair of time-separated images from the captured images, generating a displacement image from the pair of images, comparing the machine from the displacement image with a machine model, and identifying a damaged or missing machine part from the comparison of the displacement image with the machine model. The method may further include providing a sensible output which indicates a damaged or missing machine part.

Abstract: The invention provides a system and method for monitoring the molten state of electric-resistance-welded pipe on-line. In the system, a mirror provided at a front end side inside a container receives light emitted by the welded parts of the tube-shaped steel strip through heat resistant glass from the side direction and reflects the image in the direction of a relay lens provided at a base end side of a relay lens unit. The relay lenses relay the image to a conversion lens, which forms the image on the imaging area of a CCD camera. Therefore, it is possible to capture the welded parts from the side direction by a resolution in accordance with the resolution of the CCD camera and possible to obtain information of the welded parts more accurately than in the past and on-line.

Abstract: Tools for determining belt wear are provided. Specifically, non-contact based systems and processes are described which enable a quick and accurate measurement of belt wear. Based on the measurements of belt wear, a wear condition for the belt can be determined. Information regarding the wear condition can then be used to determine an appropriate remedial measure for responding to the determined wear condition.

Abstract: A measurement device includes a pattern light characteristic setting unit configured to set illumination light having a pattern light characteristic to be projected onto a measurement object, a reflected light measurement unit configured to measure reflected light when the measurement object is irradiated with the illumination light on, an image feature extraction unit configured to extract from the measured reflected light an image feature based on a physical characteristic of the measurement object, a feature distribution calculation unit configured to calculate a distribution characteristic for each local region of the image feature, and a pattern light control unit configured to control the pattern light characteristic of the illumination light, which includes a pattern light characteristic for distance measurement and a pattern light characteristic for image feature extraction, based on the calculated distribution characteristic for each local region.

Abstract: An ultrasound device for medical application has a transducer formed by a number of transducer elements. The transducer elements are carried on a flexible support that allows the transducer elements to be configured to an examination subject. A measurement device determines, for each transducer element, a distance or a rotation thereof with respect to a reference point. The reference point can be a point that is physically a part of the ultrasound device, or can be a virtual reference point.

Abstract: The invention relates to a method and device for optically measuring external thread profiles, particularly at the ends of pipes, wherein the thread is previously synchronously produced in a production line and is continuously measured in line from start to finish of the thread prior to further processing. The aim of the invention is to allow cost-effective inspection of the thread during synchronous production of the thread.

Abstract: A display apparatus able to perform appropriate and accurate focusing. An image displayed on a display unit is stored in a first storage unit, a focus position of the image is moved by a movement unit, and the image obtained after the focus position movement is stored in a second storage unit. The images stored in the first and second storage units are compared by a comparison unit on a pixel basis, and based on a result of the comparison, an image area where there is a change in pixel state is extracted by an extraction unit, a contrast value in the extracted image area is calculated by a calculation unit, and a change in the calculated contrast values is determined by a determination unit. Based on a result of the determination, the attribute of pixels in the extracted image area is changed by a change unit.

Abstract: A surface inspection apparatus, which includes a detecting device of scanning a surface of an inspection object with an inspection light and outputting a signal corresponding to a light amount of refection light from the surface, generates a two-dimensional image of the surface of the inspection object on the basis of the output signal of the detecting device (S1), classifies pixels contained in the two-dimensional image into a first group of pixels having tones corresponding to defects on the surface of the inspection object and a second group of pixels having tones not corresponding to the defects, extracts the first group of pixels as a defect candidate part for each region surrounded by second groups of pixels (S3 to S5), discriminates a defect candidate part larger than a prescribed size as a defect (S6), inspects the two-dimensional image for each specific inspection region, and identifies an inspection region as a defect region, in which density of defect candidate parts that are smaller than the presc

Abstract: This invention enables information on a connection wiring with a substrate of a mounted component to be accurately and easily inputted in an X-ray examination apparatus. In teaching of a substrate examination, when a user inputs a two-dimensional region of a component to be examined with respect to a visible light image of the substrate, three-dimensional data is generated for the relevant region, which data is then analyzed to acquire a center coordinate, the number, the number of rows, and the number of columns on a ball terminal connecting the component to the substrate. Results such as the center coordinate acquired in such a manner may be displayed. The visible light image for the substrate is displayed in a display field of a screen.

Abstract: A method of processing an article with a coated abrasive product, including a repeat of a single marking, comprises detecting at least two characteristics of the repeat of a single marking. The repeat is placed along the length of the abrasive product at a first major surface, wherein each of the detected characteristics conveys independent information regarding the abrasive product. The method further includes comparing the information to a database. A method of acquiring information of the coated abrasive product includes detection and comparing steps.

Abstract: The invention relates to an apparatus rating a monitoring element to which is or was applied a dye penetrant procedure and which is fitted with at least one artificial defect in the form of at least one indentation, the apparatus including an image recorder generating an image of at least parts of the monitoring element, said parts comprising at least portions of the minimum of one artificial defect, said apparatus including an image analyzer rating the image generated by the image recorder, and to a corresponding method.

Abstract: Aspects of the present invention are related to systems, methods and apparatus for image-based automatic defect detection.

Abstract: An unevenness inspection method for inspecting presence of unevenness in a panel material, the method includes: acquiring a plurality of primary images by imaging the panel material under inspection on a plurality of levels of condition; creating a plurality of secondary images by processing the plurality of primary images to enhance variation of the image; creating a composite image by combining the plurality of secondary images with a prescribed weighting; and determining the presence of unevenness using the composite image, the prescribed weighting being determined so that a region having the unevenness can be distinguished from the other region, when the plurality of secondary images are created for the panel material for training use having unevenness and are combined into a composite image.

Abstract: A method wherein images of different types of objects within a class are partitioned into region stacks. For each one of the stacks, the method: (a) applies a template to extract fragments having a predetermined size and one of a plurality of different spatial orientations, to generate extracted templates; (b) determines, from the extracted templates, a most frequent one thereof having only a first number of fragments with a common spatial orientations; (c) records the number of images having the determined most frequent extracted template; (d) repeats (b) and (c) with successively increasing number of fragments until the number of recoded images falls below a threshold; and (e) selects as a master extracted template the one of the most frequent templates having the largest recorded number of fragments. The master extracted templates for the stacks are combined into a map that is then compared with background images to remove extracted templates matching segment in the background.

Abstract: The device includes: bearing element (55) for the lens (100); element (53) for acquiring a global image (90) of the drill hole (110) of the lens (100) in a lighting direction (D51, A52), or image acquisition direction (A53); element (54) for processing the image when the lens is carried by the carrier element (55). The processing element (54) designed for determining, from the global image of the drill hole (110) the position of center (C1) of the opening of the drill hole (110) that gives onto one of the faces (98) of the lens (100) and/or the transverse dimension of the opening of the drill hole (110) that corresponds to the desired transverse dimension (D).

Abstract: An imaging inspection machine for inspecting objects located within articles, with the imaging inspection machine having an inspection location for articles having a quantity of objects located along a path of travel through an inspection location located within the imaging inspection machine. Imaging inspection devices are positioned on the frame and adapted for directing beams through articles as articles move through the inspection location within the imaging inspection machine. As a result of inspecting the articles, output signals are applied to a processing and analysis assembly which performs only simple table lookups into an appropriately formed table and one multiplication for each pixel to correct nonlinearities matched by a cubic polynomial.

Abstract: There is provided a database storing reference data including a plurality of reference image data, which are obtained by imaging reference substrates, respectively, wherein each of the reference substrates lacks only one of the films of different kinds but includes remainder of the films of different kinds, and wherein in the reference substrates the lacking films are different from each other, and wherein the plurality of reference image data is classified into categories according to the kinds of the films. Difference degrees between color information of a defect area extracted from an image data of an inspection target substrate and color information of corresponding areas of the reference substrates are calculated. Based on the difference degree, the defective film is identified.

Abstract: A separation filter selection device provided with an image input unit, a memory unit, a setting unit, an evaluation unit and a separation filter selection unit is disclosed. The image input unit inputs a captured image capturing a tire surface including a characteristic portion thereof. The memory unit stores plural filters for performing image processing of the captured image, stores a training image in which the characteristic portion is separated from the captured image, and a weighted image in which a weighting is set to a predetermined region of the captured image. The setting unit combines two or more filters out of the plural filters and sets a separation filter. The evaluation unit derives an evaluation value of the separation filter on the basis of an image in which a differential between the processed image that has been processed by each of the filters of the separation filter, and the training image, and to which a weighting based on the weighted image is applied.

Abstract: Method of determining the position of a target drill hole to be drilled in a target corrective lens having an expected target outline after shaping, the position being determined from a reference lens having a reference outline and at least one reference drill hole, the method includes: acquiring an image and at least one characteristic of the curvature of the reference lens; determining, in the acquisition plane, the reference distance in projection between the projection of a reference anchor point of the associated reference lens and the reference lens and the projection of a reference drilling point of the reference drill hole calculating the three-dimensional reference distance between the reference anchor point and the reference drilling point as a function of the characteristic of the curvature of the reference lens (100) and of the determined reference distance; and determining the position of the target drilling point for the target drill hole of the target corrective lens as a function of the calcul

Abstract: A method for correcting coaxial light image edge location errors in a precision machine vision inspection system is disclosed. The method comprises comparing an edge position measurement of a workpiece edge feature using coaxial light and stage light. Edge position measurements using stage light have a lower uncertainty than that of coaxial light. Position correction factors may be determined from the difference between the two edge position measurements. The position correction factors may be stored for correcting subsequent edge position measurements that are based on images acquired using coaxial light. In some embodiments, position correction factors may be determined based on comparing edge position measurements for a plurality of edges.

Abstract: An apparatus for axially aligning a first coupling member and a second coupling member that can be connected so as to form a rotating assembly. The apparatus includes a measurement arrangement configured to be mounted onto the first coupling member and to be rotated therewith. The measurement arrangement includes an emitter arrangement configured to emit first and second signals in the direction of the second coupling member so as to cause at least a portion of said first and second signals to be reflected by the second coupling member. The measurement apparatus further has a capture arrangement configured to capture at least a portion of the first and second reflected signals. The apparatus includes a control arrangement configured to determine an offset in axial alignment between the first and second coupling member based on at least the first and second reflected signals.

Abstract: The invention provides an image processing apparatus for generating coordination calibration points. The image processing apparatus includes a subtracting module, an edge detection module and an intersection point generation module. The subtracting module subtracts a first image from a second image to generate a first subtracted image, and subtracts the first image from a third image to generate a second subtracted image. The edge detection module performs an edge detection process for the first subtracted image to generate a first edge image, and performs the edge detection process for the second subtracted image to generate a second edge image, wherein the first edge image includes a first edge and the second edge image includes a second edge. The intersection point generation module generates, according to the first and second edges, an intersection point pixel, serving as the coordination calibration point corresponding to the first edge and the second edge.

Abstract: A method is provided for programming step and repeat operations of a machine vision inspection system. The machine vision inspection system includes an imaging portion, a stage for holding one or more workpieces in a field of view (FOV) of the imaging portion, a control portion, and a graphical user interface (GUI). According to the method, a user operates the machine vision inspection system to define a set of inspection operations to be performed on a first configuration of workpiece features. The user also operates the GUI to display a step and repeat dialog box, in which he defines a first plurality of parameters defining a set of default step and repeat locations for performing the defined set of inspection operations. The user further operates the GUI to define a set of inspection step and repeat locations, which is a subset of the defined set of default step and repeat locations, where the inspection operations are to be actually performed.

Abstract: An image processing apparatus includes a reading unit configured to read an open document. The open document includes a first page including a first image and a second page including a second image. The apparatus also includes a storing unit configured to store the first page read by the reading unit as first page image data including the first image, and to store the second page read by the reading unit as second page image data including the second image.

Abstract: A surface inspection device includes an image generator for generating a digital image achieved by imaging an inner surface of a bore which is subjected to a boring work, a line extraction processor for extracting a line along a horizontal direction set to a line extraction direction from the digital image, and an estimating unit for determining the state of the inner surface of the bore based on the line extracted by the line extraction processor. The line extraction processor extracts lines along the line detection direction from respective digital images before and after rotation which are achieved by rotating the digital image once or over plural times every predetermined angle while the line extraction direction is fixed, and the estimating unit determines the state of the inner surface of the bore based on the lines extracted from the respective digital images before and after the rotation.

Abstract: A method for processing the image data of the surface of a wafer (2) recorded by at least one camera (5) is disclosed, wherein an image field (15) is defined for each camera (5) in such a way that the recorded image content is repeated after N recorded images. In an evaluation electronics (18) M utility programs (19) are determined, wherein M is equal to the number of recorded images after which the image content is repeated. The number M of utility programs (19) is adapted to the number N of images. Each of the M utility programs (19) of the plurality of recorded images is only fed with images having the same image contents in order to detect defects on the basis of the image contents of the images of the surface of the wafer. The results of the M utility programs (19) are respectively forwarded to a central program (20) in a sequential manner, which compiles a distribution of the defects present on the surface of the wafer (2) from the individual results of the M utility programs (19).

Abstract: A method and system for inspecting a surface of a semiconductor workpiece comprises providing a surface inspection system and using the surface inspection apparatus to cause laser light to impinge upon a test location on the workpiece surface and thereby cause the laser light to emerge from the surface as returned light comprising at least one of reflected light and scatter light; collecting the returned light and generating a signal from the returned and collected light, the signal comprising a signal value representative of a characteristic of the workpiece surface at the test location; providing a plurality of threshold candidates and causing the surface inspection system to select a threshold from among the plurality of threshold candidates; comparing the threshold to the signal value to obtain a difference value; using the difference value to assess the characteristic of the workpiece surface at the test location; and using the surface inspection system to automatically cause the method to be repeated fo

Abstract: A method for measuring errors of workpieces by comparing a three-dimensional model and the workpieces manufactured according to the three-dimensional model is provided. The method converts a point cloud of each workpiece to a measured triangular mesh model, and aligns each measured triangular mesh model to the three-dimensional model. The method further compares each measured triangular mesh model with the three-dimensional model to check for differences between two model so as to obtain errors of each workpiece, and generates one or more analysis reports according to the errors of each workpiece.

Abstract: A method for finding edge points of an object is disclosed. The method includes receiving an electronic image of an object, selecting one or more edge points in the image of the object, creating an image template for each edge point in the object image. The method further includes receiving a command to measure a second object of the same kind as the object and obtaining a measured object image, reading the image templates for the same kind of object from the storage device, and finding a matched sub-image to each image template from the measured object image according to an image matching algorithm, obtaining a central point of each matched sub-image and displaying coordinates of the central point of the matched sub-image.

Abstract: Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.

Abstract: A method of coalescing information about inspected objects. The method includes acquiring an image set of an object to be inspected, the image set having a three-dimensional model of the object and a plurality of two-dimensional images of the object. A location of interest is identified on a surface of the modeled object and global coordinate points of the three-dimensional model are designated that characterize the location of interest of the modeled object. A markup tag annotating the location of interest is associate with the designated global coordinate points of the three-dimensional model, and the markup tag is conveyed when viewing any one of the plurality of two-dimensional images of the image set that have at least one image point that correlates to a corresponding designated global coordinate point of the three-dimensional model that characterize the location of interest.

Abstract: A system and method determines the shape of a surface that preferably is a deployed space-based adaptive flexible membrane antenna, using patterned projections, image capturing, and membrane shape processing for producing membrane shape data describing the contour of the surface of the membrane with the membrane shape data then preferably used as inputs for a feedback control actuation system for deforming the membrane to a desired shaped so as to maintain the three-dimensional shape of the membrane in the desired shape.

Abstract: A device for automatic illumination and inspection of tubular probes, in particular stents, is proposed, with rotatable means for holding the probes that are to be inspected, with an electronic camera and associated lens, with a computer-based electronic imaging system, and with means for illuminating the probe that is to be inspected. The probe surfaces are illuminated by means of a combination of dark field illumination and transillumination.

Abstract: A method to detect and rank appearance distortions includes creating virtual models of a reference panel and a processed panel, including a first reference patch and the processed panel, respectively. Projecting a first simulated light pattern on the reference panel and the processed panel, and viewing the first reference patch and the first processed patch from a first viewpoint with respect to the first simulated light pattern. The method compares a first reference reflection at the first reference patch with a first processed reflection at the first processed patch, and creates a first index value from optical variations between the appearance of the reference and processed reflections. The first index value is output in a computer readable format. The method may compare the first index value to a predetermined index value and determine whether the processed panel is within an acceptable appearance quality threshold.

Abstract: Systems and methods for transprojection of geometry data acquired by a coordinate measuring machine (CMM). The CMM acquires geometry data corresponding to 3D coordinate measurements collected by a measuring probe that are transformed into scaled 2D data that is transprojected upon various digital object image views captured by a camera. The transprojection process can utilize stored image and coordinate information or perform live transprojection viewing capabilities in both still image and video modes.

Abstract: A mask inspecting apparatus and method of inspecting a mask having a plurality of openings used in deposition in a desired pattern, the mask inspecting apparatus capable of detecting a defect of the mask through the openings of the mask.

Abstract: In laser welding, the welding area is depicted coaxially in relation to the laser beam (3) through the laser optics (4), wherein not only a triangulation line and a grey or color image of the solidified weld is recorded but also the process radiation of the welding process. From these three image elements, an optimum quality assessment of the welding process and of the weld can be made.

Abstract: A machine vision inspection system (MVIS) and a related light stripe edge feature location method are disclosed. The MVIS comprises a control system, a light stripe projection system, an imaging system, and a user interface. In a region of interest including the edge feature, the light stripe projection system focuses a light stripe transverse to the edge direction and across the edge feature, such that the light stripe has a changing stripe intensity profile along the light stripe. The imaging system acquires an image of the light stripe and the control system analyzes the image to determine the location of the edge feature based on a changing light intensity profile along the stripe. The method may be implemented in an edge detection video tool. The method may be advantageous for inspecting highly textured, beveled, chamfered, rounded or damaged edges, for example.

Abstract: A method of assessing the quality of metal parts, for example through detection of defects in a metal part induced by processing the metal part, comprises acquiring a thermal image of the metal part after processing the metal part, determining a difference image by comparing the thermal image to a reference image, the difference image being related to temperature differences between temperature data represented by the thermal image and by the reference image, and determining a gradient image using the difference image, the gradient image representing temperature difference gradients within the difference image. An example apparatus comprises a camera, such as a thermal camera, an image processor, and an output device such as a display.

Abstract: A method of analyzing a thermal image of a coated substrate to determine the presence of defects includes determining a defect temperature range based on a color of the coated substrate and the maximum temperature of the coated substrate in the thermal image. Thereafter, the thermal image is processed by determining a signal value of a pixel of interest based on a temperature of the pixel of interest, temperatures of pixels in a kernel of pixels surrounding the pixel of interest, and the color of the coated substrate. The signal value of the pixel of interest is then compared to the lower temperature threshold of the defect temperature range, wherein the pixel of interest is a defect location when the signal value of the pixel of interest is greater than or equal to the lower temperature threshold.

Abstract: A method for verifying completion of a task is provided. In various embodiments, the method includes obtaining location coordinates of at least one location sensor within a work cell. The at least one sensor is affixed to a tool used to operate on a feature of a structure to be assembled, fabricated or inspected. The method additionally includes, generating a virtual object locus based on the location coordinates of the at least one location sensor. The virtual object locus corresponds to a computerized schematic of the structure to be assembled and represents of all possible locations of an object end of the tool within the work cell. The method further includes, identifying one of a plurality of candidate features as the most likely to be the feature operated on by the tool. The identification is based on a probability calculation for each of the candidate features that each respective candidate feature is the feature operated on by the tool.

Abstract: A method for producing three-dimensionally structured surfaces of objects, the object surface being created as a reproduction of a three-dimensionally structured original surface with the aid of a machining tool. Accordingly, the topology of the original surface is first determined, a measured depth value being assigned to each surface or grid element, creating a depth map of the original surface. The depth values are evaluated in terms of their influence on the reflective properties of the surface elements and the reflective properties are stored in the form of parameters. The depth values are then modified in accordance with the reflective values and are used as topological data for the electronic control of a machining tool.