Worker Or Work Station Efficiency Patents (Class 700/111)
  • Patent number: 7221988
    Abstract: A process control system uses an asset utilization expert to collect data or information pertaining to the assets of a process plant from various sources or functional areas of the plant including, for example, the process control functional areas, the maintenance functional areas and the business systems functional areas. This data and information is manipulated in a coordinated manner by tools, such as optimization and modeling tools and is redistributed to other areas or tools where it is used to perform overall better or more optimal control, maintenance and business activities. Information or data may be collected by maintenance functions pertaining to the health, variability, performance or utilization of a device, loop, unit, etc. and this information may then be sent to and displayed to a process operator or maintenance person to inform that person of a current or future problem.
    Type: Grant
    Filed: September 20, 2004
    Date of Patent: May 22, 2007
    Assignee: Rosemount, Inc.
    Inventors: Evren Eryurek, Trevor D. Schleiss
  • Patent number: 7209859
    Abstract: A system, comprising a plurality of slave devices collecting real time data from process stations, a master device receiving the collected data from the plurality of slave devices, wherein the master device polls the plurality of slave devices in a predetermined order and an analysis device processing the collected data and producing output data as a function of the collected data.
    Type: Grant
    Filed: March 2, 2002
    Date of Patent: April 24, 2007
    Assignee: Linxberg Technology, LLC
    Inventor: Alex G. Zeif
  • Patent number: 7162319
    Abstract: Systems and methods for providing alarming indications and troubleshooting indications and actions in connection with a web converting manufacturing process such as that used for manufacturing disposable absorbent garments. Some of the disclosed embodiments include relating inspection data, such as product (or process) attribute data, to data from other manufacturing-related systems. Also disclosed are systems and methods for linking product (or process) attribute data obtained during the manufacturing process with one or more data sources including raw material data, process setting data, product quality data, and/or productivity data. Also disclosed are systems and methods for identifying manufacturing set point changes and automatically implementing such changes and automated web steering changes based on data from one or more inspection systems.
    Type: Grant
    Filed: September 29, 2004
    Date of Patent: January 9, 2007
    Assignee: Kimberly-Clark Worldwide, Inc.
    Inventors: Robert L. Popp, Kyle S. Allen, Jamie L. Bell, Henry L. Carbone, II, Scott G. Chapple, Clinton David Clark, Tim G. Dollevoet, John G. Hein, Archie Dodds Morgan, Nicholas A. Popp, Shawn A. Quereshi, Erica C. Tremble
  • Patent number: 7162320
    Abstract: Disclosed herein is a method of controlling an assembly line, comprising the steps of providing an article assembly line; designating, on the assembly line, an upstream processing station and a downstream processing station; delivering a first article to the upstream processing station; monitoring an upstream processing function on the first article within the upstream processing station; and if, the upstream processing function in the upstream processing station on a first article is not complete; issuing a signal to an operator in the upstream processing station that the upstream processing function on the first article is not complete; extending the length of the upstream processing station to allow the upstream operator more time to complete the upstream processing function; monitoring the upstream processing function in the extended upstream processing station; and if the upstream processing function on the first article is still not complete; associating a label with the first article in the over travel
    Type: Grant
    Filed: March 30, 2004
    Date of Patent: January 9, 2007
    Assignee: Honda Motor Co., Ltd.
    Inventors: Carl Derson, Chad Knarr
  • Patent number: 7136825
    Abstract: A work assignment system for assigning and composing a work formed from a plurality of work standards to a plurality of stations. A display displays the names of the plurality of work standards as composition targets. A composition condition is input. The plurality of work standards are divided in accordance with the composition condition and one group of the divided work standards is assigned to a station. The assignment result of the work standards of each station to a work assignment file is output.
    Type: Grant
    Filed: January 3, 2001
    Date of Patent: November 14, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Makoto Araki, Atsushi Okada, Takashi Hirashima, Takashi Fukuda
  • Patent number: 7130708
    Abstract: Sheet metal forming is a manufacturing process in which flat sheet metal is drawn into a die cavity to form a product shape. Draw-in amount is the single most important stamping index that controls all forming characteristics (strains and stresses), formability failures (splits, wrinkles) and surface quality (distortions) on a panel. Adaptation of a new die set for repetitively stamping sheet metal parts to a part design specification is simplified by using a math-based simulation of the stamping operation under specified engineering stamping conditions for the specified part. The stamping simulations are used to create an engineered draw-in map comparing selected locations on the peripheral edge of the stamped part with corresponding locations on the peripheral edge of its original sheet metal blank.
    Type: Grant
    Filed: April 1, 2003
    Date of Patent: October 31, 2006
    Assignee: General Motors Corporation
    Inventors: Chuan-Tao Wang, Norman Goan, Jimmy J. Zhang
  • Patent number: 7117057
    Abstract: A yield patrolling system, which monitors production yield of a manufacturing line, has at least one product measurement and test device. The product measurement and test device measures yield determining parameters of product at completion of process steps executed by equipment within the manufacturing line. The system further has a test database in communication with the product measurement and test device to receive and retain the measured yield determining parameters. A statistical calculator is in communication with the test database to receive the measured yield determining parameters. The statistical calculator then calculates from the measured yield determining parameters production yield statistics indicating an amount of the product being fabricated on the manufacturing line.
    Type: Grant
    Filed: September 10, 2002
    Date of Patent: October 3, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co. Ltd.
    Inventors: Woei-Chyi Kuo, Mingchu King, Shih-Tsung Liang
  • Patent number: 7113839
    Abstract: A system and method for providing indexed work machine utilization data. The system implementing the method includes an operator identification device for identifying an operator of a work machine based on operator identification data and a work data collection device for collecting work data related to the work machine. A first processing device indexes the collected work data to the operator identification data and a communication device transmits the indexed work data and operator identification data to a second processing device. The second processing device receives the indexed work data and the operator identification data and provides operator utilization metrics based on the indexed work data that reflect a quantitative performance value associated with at least one of the work machine and operator.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: September 26, 2006
    Assignee: Caterpillar Inc.
    Inventors: Alan Lewis Ferguson, Trent Ray Meiss, Brian Lane Jenkins, Steven Wayne O'Neal, Daniel Craig Wood
  • Patent number: 7103437
    Abstract: There is disclosed a work data collection method. In a darkroom, a data collector (12) photographs a series of jobs through an infrared video camera (14) while observing the jobs being done by a worker (11) through a darkroom goggle. At each break point between the jobs, the data collector operates a hand switch board (21) to enter a break point signal and select a corresponding job title from among a list of job titles displayed on an LCD device (15) that the data collector puts on behind the darkroom goggle. Then, the break point signal and job title data are recorded in association with each other on a hard disc of a portable personal computer (20). If the corresponding job title is not listed, the data collector says that job title to enter it as a sound signal through a microphone. The sound signal is converted into character data of the job title.
    Type: Grant
    Filed: April 2, 2001
    Date of Patent: September 5, 2006
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Takeshi Yoshikawa, Koichi Takahashi, Masaya Kaneko, Yuko Endo, Yoshio Obara
  • Patent number: 7099726
    Abstract: The production of semiconductor devices manufactured through a plurality of manufacturing sites is unitarily managed and an appropriate production plan is instructed. A computer projects a production plan of an entire company based on various information. The production plan is provided to each manufacturing site as a production instruction and provided to each business person or customer as a storing reply or an order accepting period reply. If the projected production plan (possible production volume) does not coincide with a production plan (necessary production volume), parameters obtained by correcting production allocation, production capability, lead time, yield and the like are re-input from a parameter input terminal. Based on the corrected parameters, the computer re-projects the production plan and projects an optimum production plan.
    Type: Grant
    Filed: February 6, 2003
    Date of Patent: August 29, 2006
    Assignee: Renesas Technology Corp.
    Inventors: Kiyohisa Kawase, Hajime Yuasa, Kazuhiko Maeda, Yoshio Kobayashi, Osamu Mishima, Takashi Honma, Jun Akashi, Hiroshi Yamada, Kenichiro Masunaga, Masahiro Koyama, Kenichi Funaki
  • Patent number: 7099730
    Abstract: A terminal table unit is associated with an output apparatus such as valves and solenoids and an input apparatus such as switches and includes not only a main body with a control device and a memory device but also a cassette with a memory medium that is detachably attached to the main body. The control device receives input data from the input apparatus for controlling the output apparatus and drives the output apparatus according to the received input data. The received input data are temporarily stored in the memory device in specified units. When the input data are found to include abnormal data, the control device causes data stored in the memory device to be transferred to the memory medium of the cassette such that the memory cassette can be removed and the abnormal data stored on the memory medium can be analyzed elsewhere.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: August 29, 2006
    Assignee: OMRON Corporation
    Inventors: Masanori Yamashita, Hiroshi Hashimoto, Masaru Imoto, Hajime Izutani, Fumihiko Okumura, Tomoaki Yoshikawa, Hirofumi Iwanaga
  • Patent number: 7099736
    Abstract: Operational administration system enabling reduction in expense burden on user, and permitting manufacturer to comprehend accurately and timely operational status of machine tools on user end. Operational administration system (1) includes, interconnected via Internet (5): manufacturer-end administration device (20); operational data storage/transmission devices (10) connected to numerical controllers for NC machine tools (15); and user-end terminal device (30). The operational data storage/transmission devices (10) gather from the numerical controllers data pertaining to the operational status of the NC machine tools (15), store the data and, when specified transmission conditions are met, send the stored operational status data to administration device (20) in an e-mail data format.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: August 29, 2006
    Assignee: Mori Seiki Co., Ltd.
    Inventors: Makoto Fujishima, Masahiro Komatsu, Akio Karyu, Kingo Maeda, Yuichi Nakazawa, Shizuo Nishikawa
  • Patent number: 7069099
    Abstract: A substrate processing apparatus includes a plurality of cells each including a predetermined processing unit, a transport mechanism, and a cell controller. The cell controller independently controls operations in each cell in accordance with transport setting and processing condition setting for each cell described in recipe data determined for each substrate unit to be processed. Because the processing and transport are performed independently of the operations of adjacent cells, substrates belonging to different substrate units are received through a feed inlet or the same substrate inlet, are processed while being present in the same cell, and are transported to a feed outlet and a return outlet which are different substrate outlets. This allows the presence of different process flows in parallel.
    Type: Grant
    Filed: January 30, 2004
    Date of Patent: June 27, 2006
    Assignee: Dainippon Screen MFG. Co., Ltd.
    Inventors: Kenji Hashinoki, Yasufumi Koyama, Takaharu Yamada
  • Patent number: 7065422
    Abstract: A method for identifying a state of a manufacturing system includes defining at least one virtual sensor having a value. At least one state descriptor including a plurality of condition terms and a trigger probability is defined. Each condition term includes a function of the value of the virtual sensor. The condition terms are evaluated based on the value to determine a classification probability. The state is identified responsive to the classification probability being greater to or equal to the trigger probability. A manufacturing system including a plurality of tools, at least one virtual sensor, and a state classification unit is also provided.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: June 20, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Eric O. Green
  • Patent number: 7065460
    Abstract: An image of the shape of a semiconductor wafer is displayed on a display apparatus for displaying an inspection result of a semiconductor device, and a different color or pattern is displayed for each inspection result as display information indicating the inspection result of a semiconductor device in a region corresponding to the semiconductor device on the image of the semiconductor wafer.
    Type: Grant
    Filed: September 16, 2004
    Date of Patent: June 20, 2006
    Assignee: Matsushita Electric Industrial Co., Inc.
    Inventor: Satoru Nishimura
  • Patent number: 7065426
    Abstract: A method of evaluating the efficiency of an automatic machine, whereby, upon completion of a given production lot, a current performance index achieved by the automatic machine during manufacture of the production lot is calculated; and the current performance index is memorized in a nonvolatile memory, together with various characteristic parameters relating to the processing performed. To evaluate the efficiency of the automatic machine, the current performance index is compared with historic performance indexes memorized previously during operation of the automatic machine and having characteristic parameters substantially similar to the characteristic parameters of the current performance index.
    Type: Grant
    Filed: May 21, 2002
    Date of Patent: June 20, 2006
    Assignee: G. D Societa' per Azioni
    Inventors: Antonio Valentini, Fiorenzo Draghetti
  • Patent number: 7027884
    Abstract: The invention relates to a method of production control and a method of manufacturing industrial products. It is an object of the invention to provide a method of production control and a method of manufacturing industrial products which make it possible to set a target processing quantity of a process appropriately set and to improve the throughput of a production line as a whole. A method of production control for a production line including a plurality of processes is provided, in which a target processing quantity Lk for a process Pk is obtained from: Lk=Nk?SKk(Nk>SKk) Lk=0(Nk?SKk) where the processes are represented by Pn (n=1, 2, . . . , k?1, k, . . .
    Type: Grant
    Filed: March 29, 2005
    Date of Patent: April 11, 2006
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Kazuhiro Watanabe, Yuuichi Kubo, Yuichiro Ohta, Masaru Kitano, Mitsuaki Sugine
  • Patent number: 7010376
    Abstract: A method and apparatus to perform an automatic diagnosis for the poor performance of a control loop, and to determine whether or not the malfunctioning is caused principally by a poor adjustment of the controller tuning parameters. The method makes use of the fact that a poorly tuned control loop amplifies disturbances in a narrow frequency range around the so-called resonant frequency. The method comprises measuring an error in a control loop over time to determine a power spectral density of the error, determining a best fit analytical function describing the power spectral density and measuring a diagnostic value from a difference between the best fit analytical function and the power spectral density of the error.
    Type: Grant
    Filed: October 24, 2003
    Date of Patent: March 7, 2006
    Assignee: Pulp and Paper Research Institute of Canada
    Inventors: Lahoucine Ettaleb, Alain André Roche
  • Patent number: 7006884
    Abstract: A recycling analyzing system comprising: a standard operation time memory which stores standard time for disassembling operation of each component beforehand; an operation time memory which stores time for disassembling operation of each component to be disassembled; an operation time counting unit which counts the time for disassembling operation time of each component constituting the item to be recycled, and stores them in the operation time memory; and a difficult operation extracting unit which refers to the standard time stored in the standard operation time memory, and the time for disassembling operation of each component stored in the operation time memory, and extracts disassembling operations which is difficult.
    Type: Grant
    Filed: January 12, 2004
    Date of Patent: February 28, 2006
    Assignee: Seiko Epson Corporation
    Inventors: Hitoshi Yamakado, Gu Yu, Toru Miyamoto
  • Patent number: 6980928
    Abstract: This disclosure describes a system and method for providing efficiency and cost analysis for a power generation unit. The system of this disclosure includes a current condition data acquisition logic that acquires a plurality of current condition variables for the power generation unit. A design constants acquisition logic acquires a plurality of design constants for the power generation unit; and an analysis logic calculates a operational efficiency of the power generation unit. The method provides efficiency and cost analysis for a power generation unit. The method includes the steps of acquiring a plurality of current condition variables for the power generation unit, and acquiring a plurality of design constants for said power generation unit. With the current condition variables and design constants, the method calculates an operational efficiency of the power generation unit.
    Type: Grant
    Filed: September 6, 2000
    Date of Patent: December 27, 2005
    Assignee: General Electric Company
    Inventors: Catherine Mary Graichen, James Patrick Quaile, William James Sumner
  • Patent number: 6934704
    Abstract: An automatic manhour setting system has a standard manhour database designed to be readable, in which a number of pairs each constituted by a work standard described by a standardized standard expression and a manhour corresponding to the work standard are registered in advance. For each target work standard to which a manhour is to be given, the system matches the expression of the target work standard with the standard expressions of the work standards in the standard manhour database, sets the standard manhour of the matching work standard in the database as the manhour of the target work standard, and outputs the set manhour file.
    Type: Grant
    Filed: January 3, 2001
    Date of Patent: August 23, 2005
    Assignee: Canon Kabushiki Kaisha
    Inventors: Atsushi Okada, Takashi Hirashima, Yoshinori Sawamura, Tomoyuki Sonekawa
  • Patent number: 6917846
    Abstract: An apparatus and method of providing a work machine to a customer is disclosed. An embodiment includes at least one machine sensor and at least one computer. Signals indicative of the work performed by the machine are provided. The computer receives the signals and calculates the productivity of the machine.
    Type: Grant
    Filed: November 21, 2000
    Date of Patent: July 12, 2005
    Assignee: Caterpillar Inc
    Inventor: Thomas P. Muller
  • Patent number: 6907362
    Abstract: A process tool controller of a semiconductor processing tool is provided with software that enables collecting, monitoring and logging information regarding the tool's consumption. Data is collected from the devices used for control of process conditions via the analog and digital inputs and outputs of the process tool controller. Consequently, the devices for controlling the process conditions have the additional function of measuring the tool's consumption. In this way the information regarding the tool's consumption is completely collected on board of the process tool. The parameters to be monitored and reported can be configured by the user, with use of a configuration editor, resulting in optimum flexibility of the system. In the illustrated embodiment, the user interface of the consumption monitoring and logging software is integrated into the user interface of the process control and monitoring software.
    Type: Grant
    Filed: April 20, 2004
    Date of Patent: June 14, 2005
    Assignee: ASM International N.V.
    Inventor: Albert Hasper
  • Patent number: 6901347
    Abstract: Improved reliability, availability and/or maintainability metrics have been developed that account for customer perceived factors such as frequency of outage, duration of outages, business impact of outages, etc. In various realizations and exploitations, such improved metrics may be utilized for managing and/or monitoring availability of enterprise information services or suites, availability of individual computers, devices or facilities, and/or availability of particular functionality or subsystems of any of the above. In one exploitation, personnel management decisions and/or compensation levels may be based on achieved values for such improved metrics. In other exploitations, contractual commitments and/or incentive fees related to an installed system or systems may be based on such improved metrics.
    Type: Grant
    Filed: February 22, 2000
    Date of Patent: May 31, 2005
    Assignee: Sun Microsystems, Inc.
    Inventors: Paul S. Murray, Karen Learn
  • Patent number: 6898476
    Abstract: The object of the present invention is to ensure information sharing in a factory and enhance the production efficiency. The management system of the present invention utilizes a liquid crystal projector PRJ to project an image of management information on a large-scaled display in the factory. A screen SCR is located at a specific position that allows each worker to simultaneously recognize the display and the object of the display (for example, in the case of a storehouse, the storage status of products). The contents of the display are varied according to the location of the display: for example, (1) instructions and actual conditions of storage of products in the storehouse; and (2) requirement of parts from assembly lines to a parts warehouse and status of delivery of parts from the parts warehouse.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: May 24, 2005
    Assignee: Seiko Epson Corporation
    Inventors: Kazuyoshi Watanabe, Takashi Oguchi, Mitsuaki Maruyama, Mamoru Shimizu, Taketoshi Ichikawa
  • Patent number: 6892104
    Abstract: A build cell for manufacturing products according to customer orders includes a build station at which components are assembled according to a customer order to form an assembled product. The build cell also includes a burn station at which the assembled product is configured and tested to form a configured product. In addition, the build cell includes a finishing station at which the configured product is inspected to produce a finished product. A transportation device transports the finished product from the build cell to a transportation system for delivery to a boxing facility, such that the product is assembled, configured, tested, and inspected in the build cell and packaged at the boxing facility. In an illustrative embodiment, the product is a computer, the components include hardware components, which are assembled at the build station, and software is installed at the burn station.
    Type: Grant
    Filed: March 5, 2001
    Date of Patent: May 10, 2005
    Assignee: Dell Products L.P.
    Inventors: Satish Y. Patil, Mark D. Brown, Michael T. Graham, John H. Sanders, C. Michael Cunningham
  • Patent number: 6873878
    Abstract: The present invention provides a throughput monitoring and analysis system and method, comprising: a factor-fetching means and a terminal means. Wherein the factor-fetching means fetches a plurality of raw time data of the production factors corresponding to selected operation events during execution of operation events of the complex machine. The terminal means stores the time data and related information of the production factors and displaying the monitoring results according to set required condition and the data and information.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: March 29, 2005
    Assignee: MACRONIX International Co., Ltd.
    Inventors: Kuei-Yi Liu, Kuo-Hua Chen, De-Cheng Weng, Long-Fan Lin, Chiung-Fang Hsieh
  • Patent number: 6845278
    Abstract: System and method for analyzing information suitable for use in connection with a manufacturing production line constructing a composite product from a sequential addition of component parts during a production run. An inspection system is adapted to inspect a first product attribute of a product being manufactured during the production run. The first product attribute is associated with the first component part. A product attribute database is adapted to store the first product attribute parameter. A processor is adapted to populate the product attribute database with a plurality of first product attribute parameters associated with a sample set of products being manufactured during the production run. A manufacturing information database is adapted to store one or more manufacturing parameters. A logic filter is adapted to correlate the populated plurality of first product attribute parameters with the populated plurality of manufacturing parameters.
    Type: Grant
    Filed: November 18, 2002
    Date of Patent: January 18, 2005
    Assignee: Kimberly-Clark Worldwide, Inc.
    Inventors: Robert L. Popp, Henry L. Carbone, II
  • Publication number: 20040267395
    Abstract: The invention provides control systems and methodologies for controlling a process having one or more motorized pumps and associated motor drives, which provide for optimized process performance according to one or more performance criteria, such as efficiency, component life expectancy, safety, emissions, noise, vibration, operational cost, or the like. More particularly, the subject invention provides for employing machine diagnostic and/or prognostic information in connection with optimizing an overall business operation over a time horizon.
    Type: Application
    Filed: September 30, 2003
    Publication date: December 30, 2004
    Inventors: Frederick M. Discenzo, Ramdas M. Pai, Gerald Peter Schaller, Michael Scott Roote, Richard James Novak, David Lee Jensen, John Crandall Ference, Bennet Ray Williams
  • Patent number: 6823228
    Abstract: A system, method and program product for analyzing fabricator capacity. The invention simplifies analysis by determining a common tool set capacity based on common non-key shared tool sets, a technology capacity based on a unique tool set for a technology, and key shared tool set capacity. Capacity opportunities and constraints, and the capacity shortfalls of tool sets are then evident. Many potential fabricator wafer start loadings can quickly be assessed and the best candidates analyzed further by more detailed, but time-consuming methods.
    Type: Grant
    Filed: February 21, 2002
    Date of Patent: November 23, 2004
    Assignee: International Business Machines Corporation
    Inventors: Otto J. Funke, Edward F. Merrill, Jr., Manoj S. Sanghvi, Sharon B. Sisler, George E. Thyng
  • Publication number: 20040225397
    Abstract: A worker productivity tracking system for determining the productivity of a worker using a manufacturing device. The worker productivity tracking system may include a central processing unit coupled to one or more remote processing units. A remote processing unit may track the amount of time a worker needs to complete a task. The remote processing unit may send the worker data to the central processing unit. The central processing unit may compare the worker data with manufacturing process information to determine the productivity of the worker. A memory card may be used by the remote processing unit to determine whether a worker is able to operate a manufacturing device.
    Type: Application
    Filed: May 7, 2003
    Publication date: November 11, 2004
    Inventor: Bradley L. Gotfried
  • Publication number: 20040176865
    Abstract: A pacing apparatus for use in a manual production line features a sensory output configured to provide varying sensory cues scaled to a desired task achievement period. The pacing apparatus may also include a sensory display having a plurality of lights configured to provide varying visual cues scaled to a desired task achievement period. A system for pacing workers in a manual production line may include means for entering data corresponding to a desired task achievement period and means for providing varying sensory cues scaled to the desired task achievement period.
    Type: Application
    Filed: March 6, 2003
    Publication date: September 9, 2004
    Inventors: Brian K. Breiholz, Toru Moritake, Yoshihito Kondo
  • Patent number: 6778079
    Abstract: The present invention involves a methodology for the interconnection of safety control modules used for the safeguarding of personnel around points and areas of hazardous machine operation. The system includes one or more safety control modules connected together so that the safety control modules communicate with each other using actively diverse safety control signals. The safety control modules are also connected to the machine safety control circuit so that the safety control modules can stop machine operation when one or more safety control modules are activated. The use of actively diverse safety control signals provides a control reliable system.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: August 17, 2004
    Assignee: Banner Engineering
    Inventor: Dane Weber
  • Patent number: 6760639
    Abstract: A method and a system are described for determining the effectiveness of production installations, significant fault events that bring about deviations from a desired effectiveness and the causes of fault events. The production installation is connected to a data acquisition device, which is set up for continuous acquisition and ready-to-call-up storage of installation and production-related data. A service device is connected to the data acquisition device and has an input device for the input of additional installation and production-related descriptive data that cannot be called up from the data acquisition device. An online system part is set up for calling up installation and production-related data from the data acquisition device, calculating the effectiveness, detecting fault events, determining significant fault events by fault event evaluation, and determining in each case the causes of faults. An offline system part is provided and contains a number of generic fault models and assessment models.
    Type: Grant
    Filed: July 29, 2002
    Date of Patent: July 6, 2004
    Assignee: ABB Research Ltd.
    Inventors: Jari Kallela, Gerhard Vollmar, Manuel Greulich, Raiko Milanovic
  • Patent number: 6732000
    Abstract: Within a system and a method for determining performance of a plurality of manufacturing tools which generates a plurality of tool operation data sets in a plurality of non-uniform data analysis formats, there is employed a uniform data analysis format into which is translated the plurality of tool operation data sets in the plurality of non-uniform data analysis formats. The system and the method provide for enhanced efficiency for determining performance of the plurality of manufacturing tools.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: May 4, 2004
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Ta-Feng Tseng, Lee-Chung Lin
  • Patent number: 6701203
    Abstract: This invention entails a data analysis system and method that was developed to specifically address the unique issues in understanding the capacity components of multi chamber systems. The analysis system expresses all components of capacity loss for all chambers in each tool in terms of a full tool equivalent (FTE). The analysis system measures how long the tool is available with only 1 chamber, 2 chambers, etc. working. It then combines that data with the WIP states to accurately determine the production, idle-no-WIP, idle-no-operator, and down components of a full tool.
    Type: Grant
    Filed: September 7, 2001
    Date of Patent: March 2, 2004
    Assignee: International Business Machines Corporation
    Inventors: Donald P. Martin, Michael S. McClintock
  • Publication number: 20040030436
    Abstract: Combined information exchanges systems and methods suitable for use in connection with a manufacturing production line constructing a composite product. Some of the disclosed combined systems and methods include relating inspection data, such as product (or process) attribute data, to data from other manufacturing-related systems. Also disclosed are combined systems and methods for linking product (or process) attribute data obtained during the manufacturing process with one or more data sources including raw material data, process setting data, product quality data, and/or productivity data. Also disclosed are combined systems and methods for identifying manufacturing set point changes and automatically implementing such changes and automated web steering changes based on data from one or more inspection systems.
    Type: Application
    Filed: November 18, 2002
    Publication date: February 12, 2004
    Inventors: Robert L. Popp, Kyle S. Allen, Jamie L. Bell, Henry L. Carbone, Scott G. Chapple, Clinton David Clark, Tim G. Dollevoet, John G. Hein, Archie Dodds Morgan, Nicholas A. Popp, Shawn A. Quereshi, Erica C. Tremble
  • Patent number: 6684120
    Abstract: An FA information collecting method in an FA system for managing plural steps for manufacturing products by using a network connected to these respective steps, is described for quality management. In this method, when collecting working front information sent to a data transmission line in the network and generated in each of these steps, from an information collecting end provided to on the network, a desired information is automatically collected based on a given condition from among the working front information. Time changes in desired information are automatically collected based on a given condition from among the work front information. An FA information combining method and the desired information are automatically combined based on the given condition from among collected plural working front information.
    Type: Grant
    Filed: December 3, 1999
    Date of Patent: January 27, 2004
    Assignee: Bridgestone Corporation
    Inventors: Masaharu Oku, Satoru Shibao, Yukio Fujiyama, Eiji Sasaki
  • Patent number: 6654708
    Abstract: In a workflow system performing works by circulating data to a plurality of staffs via a network, a processing history of a workflow case is recorded and processing histories are collected. A processing situation in the workflow system is checked by using the processing histories collected. In case the situation check decides that a delay is present, case entry is suppressed so as to control a case amount and a work amount.
    Type: Grant
    Filed: February 15, 2002
    Date of Patent: November 25, 2003
    Assignee: Hitachi, Ltd.
    Inventors: Tsuyoshi Nemoto, Mitsuharu Nagayama, Kazuyuki Ichikawa
  • Publication number: 20030187535
    Abstract: The present invention provides a throughput monitoring and analysis system and method, comprising: a factor-fetching means and a terminal means. Wherein the factor-fetching means fetches a plurality of raw time data of the production factors corresponding to selected operation events during execution of operation events of the complex machine. The terminal means stores the time data and related information of the production factors and displaying the monitoring results according to set required condition and the data and information.
    Type: Application
    Filed: May 24, 2002
    Publication date: October 2, 2003
    Inventors: Kuei-Yi Liu, Kuo-Hua Chen, De-Cheng Weng, Long-Fan Lin, Chiung-Fang Hsieh
  • Publication number: 20030153994
    Abstract: A method of distributing workload in a workflow management system includes the step of calculating a load index for each engine of the workflow management system. The load index is calculated as an average activity execution delay attributable to the associated engine. The load indices indicate average execution latency between the start of consecutive activity nodes of a process due to engine loading exclusive of resource execution time. Workload is distributed across the plurality of engines in a load sensitive mode. In one embodiment, distribution switches from a load insensitive mode to a load sensitive mode for distributing processes when a maximum differential load index exceeds a first pre-determined threshold. Distribution switches from the load sensitive mode back to the load insensitive workload distribution mode for distributing processes when the maximum differential load index is less than a second pre-determined threshold.
    Type: Application
    Filed: February 13, 2002
    Publication date: August 14, 2003
    Inventors: Li-Jie Jin, Fabio Casati, Ming-Chien Shan
  • Patent number: 6591153
    Abstract: A system and method for scheduling manufacturing resources based on user defined scheduling and routing goals. Attributes and constraints may be assigned to manufacturing resources and SKUs that facilitates the planning and scheduling of the resources. Resource transitions may be restricted only to desirable transition by using product wheels. Excess work-in-process may be minimized by scheduling orders that consume the excess work-in-process.
    Type: Grant
    Filed: October 12, 2001
    Date of Patent: July 8, 2003
    Assignee: Manugistics, Inc.
    Inventors: Myrick Crampton, George Zdravecky
  • Patent number: 6564113
    Abstract: A system and method are provided for calculating virtual WIP time (“VWIP”) in a multiple-bottleneck, multi-product manufacturing facility. The system and method provide for calculation of one or more bottleneck VWIP values. Each of the bottleneck VWIP values represents the amount of work approaching one of n bottleneck workstations, where n>0. The work approaching the bottleneck workstation comprises at least one of m products, where m>0.
    Type: Grant
    Filed: June 15, 2001
    Date of Patent: May 13, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Larry D. Barto, Steven C. Nettles, Yiwei Li
  • Patent number: 6546303
    Abstract: A method and system for computing a supply chain planning process efficiency E in relation to manufacturing activities of an organization. Input data, including supply and demand input data, is received beginning at time T0. An iteration index R is set equal to 0. Then the method and system implements: incrementing R by 1; adjusting the input data (i.e., changing, deleting, or updating the input data); executing a central planning engine (CPE), using the input data; analyzing results of executing the CPE; and iterating, or computing and stopping. The iterating repeats the incrementing, adjusting, executing, and analyzing. The computing computes E. E may be a function of Q, C, and RP/T. Q is a manual edit ratio in conjunction with adjusting the input data, C=S/D, S is supply, D is demand, T=TE−T0, and P is a real number.
    Type: Grant
    Filed: February 5, 2002
    Date of Patent: April 8, 2003
    Assignee: International Business Machines Corporation
    Inventors: David M. Fried, Thomas A. May
  • Publication number: 20020188368
    Abstract: A method of evaluating the efficiency of an automatic machine, whereby, upon completion of a given production lot, a current performance index achieved by the automatic machine during manufacture of the production lot is calculated; and the current performance index is memorized in a nonvolatile memory, together with various characteristic parameters relating to the processing performed. To evaluate the efficiency of the automatic machine, the current performance index is compared with historic performance indexes memorized previously during operation of the automatic machine and having characteristic parameters substantially similar to the characteristic parameters of the current performance index.
    Type: Application
    Filed: May 21, 2002
    Publication date: December 12, 2002
    Applicant: G. D SOCIETA' PER AZIONI
    Inventors: Antonio Valentini, Fiorenzo Draghetti
  • Patent number: 6493600
    Abstract: A semiconductor manufacturing apparatus reduces limitation on operation position due to the layout of a factory, and enables an operator to check data in a working position upon maintenance of the apparatus, thus realizing efficient operation. A console having a display unit to display wafer information, recipe information, apparatus status and the like, and an input unit to input data and information, is removably fixed in any of a plurality of attachment positions provided on the semiconductor manufacturing apparatus main body, via a console attachment member. The height of the display unit and that of the input unit can be adjusted by height adjustment means having band members and fixing members.
    Type: Grant
    Filed: February 2, 1999
    Date of Patent: December 10, 2002
    Assignee: Canon Kabushiki Kaisha
    Inventor: Kenichi Kotoku
  • Patent number: 6490495
    Abstract: When a reset-up work has been generated associated with a changing in processing data between old and new lots, a cumulative standard time required for the operator to carry out the reset-up work is calculated, and a lapse time since the starting of the reset-up work is subtracted from the calculated cumulative standard time to obtain a cumulative standard remaining time, and the count-down of this cumulative standard remaining time is displayed.
    Type: Grant
    Filed: October 13, 1999
    Date of Patent: December 3, 2002
    Assignee: Yazaki Corporation
    Inventor: Osamu Murata
  • Patent number: 6477437
    Abstract: An assembly work support system includes a training and simulation mode and a work-support mode, with an operator controlling voice or display output by interactive input. The assembly work support system accepts interactive input from the operator in the form of user-interactive control of his or her review of processes to be learned, and includes a simulation mode that gives feedback messages to the operator, a teaching portion with multimedia instructions and simulation exercises with feedback. A central processor or server gathers work flow data and evaluates the data.
    Type: Grant
    Filed: November 24, 1999
    Date of Patent: November 5, 2002
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventor: Yo Hirota
  • Publication number: 20020156548
    Abstract: The present invention provides a novel distributed factory system framework including a novel factory automation lifecycle (200) having lifecycle activities for SW developing and integrating (210), installing and administrating (220), factory modeling (230), manufacturing planning (240), manufacturing controlling, monitoring and tracking (250) and analyzing of manufacturing results (260). The factory lifecycle comprises framework components. The distributed factory system framework also includes application components and building blocks. The framework components are adapted to for managing the application components, while the application components are utilized to provide instructions for managing a process such as a wafer fab. The building blocks are adapted for forming or modifying framework and application components. The distributed factory system framework provides computer implemented methods for integrating processing systems and facilitates process and equipment changes.
    Type: Application
    Filed: February 28, 2002
    Publication date: October 24, 2002
    Applicant: Applied Materials, Inc.
    Inventors: John F. Arackaparambil, Tom Chi, Billy Chow, Patrick M. D'Souza, Parris Hawkins, Charles Huang, Jett Jensen, Badri N. Krishnamurthy, Pradeep M. Kulkarni, Prakash M. Kulkarni, Wen Fong Lin, Shantha Mohan, Bishnu Nandy, Huey-Shin Yuan
  • Publication number: 20020156549
    Abstract: To provide a method of controlling a manufacturing process, a Mahalanobis space of plural manufacturing control parameters is generated on the basis of first sampled data. Then, a Mahalanobis distance from the Mahalanobis space and second sampled data is calculated. A manufacturing process is determined to be under a malfunction operating condition by comparing the Mahalanobis distance and a threshold value.
    Type: Application
    Filed: April 19, 2002
    Publication date: October 24, 2002
    Inventor: Shunji Hayashi