Performance Monitoring Patents (Class 700/108)
  • Patent number: 12007753
    Abstract: A computer implemented method and system for predicting motor failure. The system and method employ artificial intelligence to train machine learning models to predict failure mechanisms within a machine. The system features at least one database configured to store machine performance indicator data. At least one server is configured to receive the indicator data and train machine learning models which are used by a processor to predict motor failure. The method for predicting motor failure is iterative, allowing the machine learning model to become more skilled at predicting machine performance outcomes in real-time.
    Type: Grant
    Filed: June 14, 2019
    Date of Patent: June 11, 2024
    Inventors: Yandong Zhang, Yasser Khan
  • Patent number: 12007698
    Abstract: An information processing apparatus includes an acquisition unit configured to acquire process information about a substrate process, the process information including process data and a process condition, and a display control unit configured to control a display on a display apparatus based on the process information acquired by the acquisition unit, wherein the display control unit selectively displays, on the display apparatus, a first screen that displays the process data of a lot including a plurality of substrates on a lot-by-lot basis and a second screen that displays the process data of a first lot on a substrate-by-substrate basis, the first lot being a lot designated by a user from the lot displayed on the first screen.
    Type: Grant
    Filed: January 11, 2023
    Date of Patent: June 11, 2024
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Takahiro Takiguchi, Kenta Kita
  • Patent number: 11946693
    Abstract: The invention relates to a system for controlling an argon flow rate of a fluid at the outlet of an assembly of at least one distillation column in order to reach a target dioxygen level (SP).
    Type: Grant
    Filed: May 22, 2019
    Date of Patent: April 2, 2024
    Assignee: L'Air Liquide, Societe Anonyme Pour L'Etude Et L'Exploitation Des Procedes Georges Claude
    Inventor: Marc Bastid
  • Patent number: 11829116
    Abstract: An intelligent identification and warning method for an uncertain object of a production line in a digital twin environment, includes: establishing a model library for uncertain physical objects from a non-production line system; adding attribute data to the uncertain physical objects from the non-production line system; importing an established model library and added attribute data for the uncertain physical objects from the non-production line system into a model library of an existing DT production line system; performing auto-detection on an uncertain physical object entering a production line system; performing auto-detection on an actual size of the uncertain physical object entering the production line system; warning a danger for an unsafe object by means of voice prompting, system alarming and information pushing; matching a corresponding three-dimensional (3D) model in the established model library for a safe object; and loading a matched 3D model to the DT production line system.
    Type: Grant
    Filed: May 2, 2022
    Date of Patent: November 28, 2023
    Assignee: ZHENGZHOU UNIVERSITY OF LIGHT INDUSTRY
    Inventors: Haoqi Wang, Hao Li, Rongjie Huang, Gen Liu, Hongyu Du, Bing Li, Xiaoyu Wen, Yuyan Zhang, Chunya Sun
  • Patent number: 11823926
    Abstract: Provided is a method of managing a target process. The method performed by a process management apparatus includes: generating a reference pattern indicating a normal state based on reference observed data on a process factor measured while the target process is maintained in the normal state; obtaining observed data on the process factor measured for a specified observation period; calculating a dissimilarity between the reference pattern and the observed data; and constructing a regression tree for the target process by using the observed data and the dissimilarity, wherein the process factor is set as an independent variable of the regression tree, and the dissimilarity is set as a dependent variable of the regression tree.
    Type: Grant
    Filed: November 23, 2021
    Date of Patent: November 21, 2023
    Assignee: SAMSUNG SDS CO., LTD.
    Inventors: Ji Hoon Kang, A Hyang Han, Soon Mok Kwon, Min Sik Chu
  • Patent number: 11822319
    Abstract: A semiconductor system shares information on a semiconductor manufacturing apparatus between first and second semiconductor manufacturing apparatuses through direct communication. The first semiconductor manufacturing apparatus includes a first acquisition unit acquiring first information on the first semiconductor manufacturing apparatus, a first storage unit storing the acquired first information, and a first communication unit sending the stored first information to the second semiconductor manufacturing apparatus.
    Type: Grant
    Filed: September 9, 2020
    Date of Patent: November 21, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Noriaki Koyama, Kazushi Shoji, Motokatsu Miyazaki
  • Patent number: 11787120
    Abstract: A method of predicting a post-sintering geometry of a green body part includes determining stress differentiating material properties of a material configuration of the green body part by physically measuring the stress differentiating material properties of the material configuration and identifying a plurality of stress regions in the green body part via a first sintering analysis of the green body part. Each stress region is associated with a portion of the green body part subjected to a particular stress state during sintering. The method also includes assigning different sets of stress differentiating material properties to each of the plurality of stress regions to form a stress-simulated green body part and predicting the post-sintering geometry via a second sintering analysis of the stress-simulated green body part.
    Type: Grant
    Filed: November 9, 2020
    Date of Patent: October 17, 2023
    Assignee: General Electric Company
    Inventor: Ananda Barua
  • Patent number: 11782425
    Abstract: There is provided a configuration that includes: a main controller configured to, when executing a process recipe including a specific step of executing a sub-recipe, control a process controller to execute the sub-recipe a predetermined number of times to perform a predetermined process to a substrate: and a device management controller configured to collect device data during an execution of the process, recipe and store the device data in a storage part. The device management controller is further configured to: search the storage part; acquire the device data in a designated step among respective steps constituting the sub-recipe for a number of times of execution of the sub-recipe; calculate a first standard deviation of the device data acquired for the number of times of execution; and compare the first standard deviation with a threshold value and generate an alarm when the first standard deviation exceeds the threshold value.
    Type: Grant
    Filed: March 3, 2020
    Date of Patent: October 10, 2023
    Assignee: KOKUSAI ELECTRIC CORPORATION
    Inventors: Kazuyoshi Yamamoto, Kazuhide Asai, Hidemoto Hayashihara, Mitsuru Fukuda, Kayoko Yashiki, Takayuki Kawagishi, Hiroyuki Iwakura
  • Patent number: 11719451
    Abstract: A building system for detecting faults in an operation of building equipment. The building system comprising one or more memory devices configured to store instructions thereon that cause the one or more processors to perform a cumulative sum (CUSUM) analysis on actual building data and corresponding predicted building data to obtain cumulative sum values for a first plurality of times within a first time period; analyze cumulative sum values associated with a second plurality of times occurring before the first time to identify a second time of the second plurality of times at which a second cumulative sum value is at a local minimum; and determine that a first fault began at the second time.
    Type: Grant
    Filed: December 23, 2019
    Date of Patent: August 8, 2023
    Assignee: JOHNSON CONTROLS TYCO IP HOLDINGS LLP
    Inventors: Jaume Amores Llopis, Young M. Lee, Sugumar Murugesan, Steven R. Vitullo
  • Patent number: 11714981
    Abstract: An information processing system including a circuitry configured to detect first identification information used to identify a job, generate second identification information associated with the first identification information, and create a slip on which the first identification information and the second identification information are displayed.
    Type: Grant
    Filed: April 21, 2021
    Date of Patent: August 1, 2023
    Assignee: Ricoh Company, Ltd.
    Inventors: Hajime Kawasaki, Makoto Aoki, Takeshi Ogawa, Koichi Kudo
  • Patent number: 11687061
    Abstract: A data collection and analysis system includes a communication unit and a data acquisition unit. The communication unit collects data indicating an internal state or operation state of an equipment item. The data acquisition unit acquires, from the communication unit, the data synchronized for each of groups according to setting information, the setting information being information in which the groups, a data acquisition timing, and a storage location of the data are set for a channel allocated to the data to be acquired from the equipment item, each of the groups bringing together a plurality of the channels, the data acquisition timing being a timing at which the data are acquired from the communication unit.
    Type: Grant
    Filed: December 26, 2019
    Date of Patent: June 27, 2023
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Masataka Hashishita, Kazumi Iida, Hidematsu Hayashi
  • Patent number: 11675347
    Abstract: A method for remote monitoring of an industrial machine having a relay based or PLC based controller includes steps of providing a hardware interface module for directly interfacing with the relay based or PLC based controller of the industrial machine, directly interfacing the hardware interface module with the relay based or PLC based controller to identify occurrence of power cycles of the industrial machine, registering the hardware interface module through a portal accessible through a network, communicating the occurrence of the power cycles of the industrial machine detected with the hardware interface module to a database in operative communication with the portal and storing the occurrence of the power cycles within the database, and providing a user interface indicative of performance of the industrial machine based on the power cycles of the industrial machine detected with the hardware interface module and stored in the database.
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: June 13, 2023
    Assignee: LeClaire Manufacturing Company
    Inventor: Robert Andrew Moore
  • Patent number: 11659029
    Abstract: System and method for performing diagnostics in a multi-cloud system triggers a diagnostic workflow in a first cloud computing environment of the multi-cloud system in response to an event in the multi-cloud system and execute the diagnostic workflow in the first cloud computing environment by identifying components in the multi-cloud system that are affected by the event and obtaining probes for the identified components. For each component of the identified components, a sub-flow of the diagnostic workflow is started to run at least one probe of the obtained probes to generate a diagnostic result of the component. A diagnostic report is generated based on the diagnostic result of each component of the identified components.
    Type: Grant
    Filed: September 15, 2020
    Date of Patent: May 23, 2023
    Assignee: VMWARE, INC.
    Inventors: Hemanth Kumar Pannem, Abhinav Vijay Bhagwat, Uday Suresh Masurekar, Amol Kanitkar, Aniket Deole
  • Patent number: 11619924
    Abstract: A combined visualization configuration is stored and provided by a visualization manager to a thin client HMI. Based upon the configuration, the thin client HMI accesses individual visualizations from automation components, such as automation controllers, motor controllers, camera, and so forth. Policies may be established for users and their roles, and for particular thin client HMIs, and for particular locations of or around a machine or process being monitored and/or controlled. Based on the policies, the individual visualizations are combined and may be changed if one or more of the factors changes. Interactions with the individual visualizations of the combined visualization result in signals back to the automation components originating the visualizations.
    Type: Grant
    Filed: April 13, 2017
    Date of Patent: April 4, 2023
    Assignee: Rockwell Automation, Inc.
    Inventors: Tim Caine, Randy Cannady
  • Patent number: 11520322
    Abstract: Techniques for manufacturing optimization using a multi-tenant machine learning platform are disclosed. A method for manufacturing optimization includes: obtaining physical sensor data, by a manufacturing device associated with a tenant of a multi-tenant machine learning platform; determining, by a machine learning spoke system associated with the tenant, a machine learning parameter based on at least the physical sensor data; preventing exposure of the first physical sensor data of the first manufacturing device to any other tenant of the multi-tenant machine learning platform; transmitting the machine learning parameter from the machine learning spoke system to a machine learning hub system of the multi-tenant machine learning platform; and updating, by the machine learning hub system, a multi-tenant machine learning model based at least on the machine learning parameter.
    Type: Grant
    Filed: May 26, 2020
    Date of Patent: December 6, 2022
    Assignee: MARKFORGED, INC.
    Inventors: Gregory Thomas Mark, Corey Hazeltine Walsh, Bruce David Jones
  • Patent number: 11449044
    Abstract: A real-time control system includes a fault detection training technique to implement a data-driven fault detection function that provides an operator with information that enables a higher level of situational awareness of the current and likely future operating conditions of the process plant. The fault detection training technique enables an operator to recognize when a process plant component is behaving abnormally to potentially take action, in a current time step, to alleviate the underlying cause of the problem, thus reducing the likelihood of or preventing a stall of the process control system or a failure of the process plant component.
    Type: Grant
    Filed: April 17, 2020
    Date of Patent: September 20, 2022
    Assignee: EMERSON PROCESS MANAGEMENT POWER & WATER SOLUTIONS, INC.
    Inventor: Xu Cheng
  • Patent number: 11431727
    Abstract: Techniques are described herein that are capable of providing security for code between a code generator and a compiler. The code generator generates source code. The code generator generates a first checksum of a file that includes the source code. The code generator provides the first checksum to the compiler via a secure channel. The compiler generates a second checksum of the file that includes the source code. The compiler determines whether to compile the source code based at least in part on whether the first checksum and the second checksum are the same. The first checksum and the second checksum being the same indicates that the source code is to be compiled. The first checksum and the second checksum being different indicates that the source code is not to be compiled.
    Type: Grant
    Filed: March 3, 2017
    Date of Patent: August 30, 2022
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Gabriel Alexandru Ghiondea, Morgan Asher Brown, Jeremy Scott Barton, Barry Dorrans
  • Patent number: 11415971
    Abstract: A computer device is provided. The computer device includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store, in the at least one memory device, a model for simulating a portion of an assembly line and receive scan data of a first inspection of a product being assembled, execute the model using the scan data as inputs to generate a final profile of the product, compare the final profile to one or more thresholds, determine if the final profile exceeds at least one of the one or more thresholds, and adjust the first device if the determination is that the final profile exceeds at least one of the one or more thresholds.
    Type: Grant
    Filed: February 10, 2020
    Date of Patent: August 16, 2022
    Assignee: GlobalWafers Co., Ltd.
    Inventor: Sumeet S. Bhagavat
  • Patent number: 11379973
    Abstract: A system for determining the location of a toolpiece, the system comprising: a tool carrying a toolpiece and comprising an imaging device for capturing images of the environment around the tool, the tool being actuable to manipulate the toolpiece to work on a workpiece; and an image processor remote from the tool and communicatively coupled to the imaging device for receiving images therefrom and having access to reference data representing an expected environment, the image processor being configured to compare an image captured by the imaging device with the reference data to identify a match therebetween and to determine in dependence on characteristics of that match the location of the toolpiece; wherein the system is configured to cause the tool to transmit images captured by the imaging device to the image processor in response to actuation of the tool.
    Type: Grant
    Filed: January 11, 2019
    Date of Patent: July 5, 2022
    Assignee: UBISENSE LIMITED
    Inventor: Andrew Martin Robert Ward
  • Patent number: 11340142
    Abstract: A method includes receiving raw data and generating a manufacturing data packet (MDP) that includes at least a portion of the raw data. Generating the MDP includes associating metadata with the raw data and associating a timestamp with the raw data. The timestamp is synchronized to a common reference time. A data model associated with the MDP is obtained. The data model includes one or more predefined data types and one or more predefined data fields. A first data type from the one or more predefined data types is determined based at least in part on characteristics of the raw data. An algorithm is determined based at least in part on the first data type. The MDP is processed according to the algorithm to produce an output. The first data type is associated with the raw data. The output is associated with a data field of the first data type.
    Type: Grant
    Filed: September 4, 2020
    Date of Patent: May 24, 2022
    Assignee: Sight Machine, Inc.
    Inventors: Nathan Oostendorp, Kurtis Alan Demaagd, Ryan L. Smith
  • Patent number: 11334063
    Abstract: Methods and systems for policy automation for a data collection system in an industrial environment are disclosed. A policy input interface may be structured to receive policy inputs relating to definition of at least one parameter of at least one of a rule, a policy, or a protocol, wherein the at least one parameter defines at least one of: a configuration for a data collection device, an access policy for accessing data from the data collection device, or a collection policy for collection of data by the data collection device, and a policy automation engine structured to interpret the policy inputs and automatically configure and deploy the at least one of the rule, the policy, or the protocol within the data collection system.
    Type: Grant
    Filed: December 18, 2018
    Date of Patent: May 17, 2022
    Assignee: Strong Force IoT Portfolio 2016, LLC
    Inventors: Charles Howard Cella, Gerald William Duffy, Jr., Jeffrey P. McGuckin, Mehul Desai
  • Patent number: 11321284
    Abstract: In a computer-implemented method for adapting time series database schema, a plurality of queries to a time series database received over a time period is accessed, wherein time series data is ingested into the time series database according to a time series database schema, wherein time series data comprises a plurality of dimensions. The plurality of queries of the time period is analyzed to determine a relative frequency of the plurality of dimensions within the plurality of queries over the time period. It is determined whether to adapt the time series database schema based at least in part on the relative frequency of the plurality of dimensions within the plurality of queries over the time period.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: May 3, 2022
    Assignee: VMware, Inc.
    Inventor: Clement Pang
  • Patent number: 11305937
    Abstract: A process control system for a facility that has a station arrangement including at least one at least partially automated working station and a vehicle arrangement including at least one at least partially automated transport vehicle for transporting material to be conveyed to, in and/or from the station arrangement. The process control system includes a process means for planning, implementing and/or observing, particularly monitoring processes of the station arrangement, a fleet means for planning, implementing and/or observing, particularly monitoring movements of the vehicle arrangement, and a working means arrangement with at least one working means for controlling and/or monitoring at least one working station of the station arrangement. The process and fleet means and/or the process means and the working means arrangement and/or the fleet means and the working means arrangement are configured to communicate with each other.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: April 19, 2022
    Assignee: KUKA Systems GmbH
    Inventors: Andreas Bauer, Horst-Moritz Maus
  • Patent number: 11283585
    Abstract: A decentralized communication device is provided that facilitates optimal positioning and orientation of one or more antennas for wireless communication with external devices. The decentralized communication device includes one or more master components and one or more slave components. The master and the slave components are physically separate and communicate wirelessly. In some embodiments the slave acts as a carrier frequency translator between the master and an external wireless device, where it communicates with the external device using a first frequency and communicates with the master using a second frequency which is different from the first frequency. In another embodiment the slave has most or all the physical layer to do the digital coding, digital modulation, data framing, data formatting and data packetization for communicating with an external device, in which case digital coding and digital modulation is distributed between the master and the slave.
    Type: Grant
    Filed: August 28, 2020
    Date of Patent: March 22, 2022
    Assignee: GOLBA LLC
    Inventor: Mehran Moshfeghi
  • Patent number: 11282727
    Abstract: A control device of a substrate processing apparatus includes a reading unit, an estimation unit, a comparison unit, and a correction unit. The reading unit reads out a reference processing condition for processing a substrate. The estimation unit estimates an actual processing condition when the substrate is processed. The comparison unit compares the reference processing condition and the actual processing condition with each other. The correction unit corrects a processing condition for the substrate based on a comparison result in the comparison unit.
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: March 22, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Jun Nonaka
  • Patent number: 11262736
    Abstract: Methods and systems for policy automation for a data collection system in an industrial environment are disclosed. A policy input interface may be structured to receive policy inputs relating to definition of at least one parameter of at least one of a rule, a policy, or a protocol, wherein the at least one parameter defines at least one of: a configuration for a data collection device, an access policy for accessing data from the data collection device, or a collection policy for collection of data by the data collection device, and a policy automation engine structured to interpret the policy inputs and automatically configure and deploy the at least one of the rule, the policy, or the protocol within the data collection system.
    Type: Grant
    Filed: December 18, 2018
    Date of Patent: March 1, 2022
    Assignee: Strong Force IoT Portfolio 2016, LLC
    Inventors: Charles Howard Cella, Gerald William Duffy, Jr., Jeffrey P. McGuckin, Mehul Desai
  • Patent number: 11264121
    Abstract: Direct measurement and simulation of real-time production rates of chemical products in complex chemical plants is complex. A predictive model developed based on machine learning algorithms using historical sensor data and production data provides accurate real-time prediction of production rates of chemical products in chemical plants. An optimization model based on machine learning algorithms using clustered historical sensor data and production data provides optimal values for controllable parameters for production maximization.
    Type: Grant
    Filed: August 23, 2016
    Date of Patent: March 1, 2022
    Assignee: Accenture Global Solutions Limited
    Inventors: Fang Hou, Yikai Wu, Kexin Ren, Hui Shen, Xinyong Min, Xiaopei Cheng
  • Patent number: 11257001
    Abstract: An enhanced prediction model utilizing product life cycle segmentation and historic prediction data for generating more accurate future failure rates. Input data is segmented into groups based on failure modes of a corresponding life cycle. A prediction model such as Weibull analysis is implemented for each segmented group. Historical prediction data is also segmented into groups. Prediction parameters for each group of segmented historical prediction data are compared with one another and the comparisons are then used to adjust the prediction parameters generated from the segmented groups of input data. Updated parameters for the input data are then output thereby generating a new future failure rate.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: February 22, 2022
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Lu Liu, Sia Kai Julian Tan, Kevin A. Dore, II, Steven Hurley, Jr.
  • Patent number: 11243527
    Abstract: A production process control method includes acquiring first recorded production process information, extracting second production process information from the first recorded production process information, establishing a matching model for correlating a first satisfied parameter with a second satisfied parameter, establishing a production capability prediction model for predicting production capability, inputting a first production parameter into the matching model to obtain a value of a second production parameter for producing a preset workpiece, inputting the value of the first production parameter and the value of the second production parameter into the production capability prediction model to calculate a complex production capability index (CPK) value, determining whether the CPK value reaches a preset capability standard, and setting the value of the first production parameter and the value of the second production parameter when the CPK value reaches the preset capability standard.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: February 8, 2022
    Assignee: HONGFUJIN PRECISION ELECTRONICS(TIANJIN)CO., LTD.
    Inventor: Shih-Cheng Wang
  • Patent number: 11226613
    Abstract: An anomaly detection device includes: a machining state collection unit which collects machining execution information at a predetermined time interval; a machining execution information recording unit which records the collected machining execution information in a storage unit; a selection unit which selects, from a set of a plurality of pieces of machining execution information recorded by executing a machining command a plurality of times, a subset of the machining execution information in order to calculate an average pattern according to a machining step which is an analysis target; an average pattern calculation unit which calculates the average pattern corresponding to the machining step of the analysis target based on the subset; and an anomaly detection unit which compares the machining execution information in the machining step of the analysis target with the average pattern to detect whether or not an anomaly occurs in the machining step of the analysis target.
    Type: Grant
    Filed: April 22, 2020
    Date of Patent: January 18, 2022
    Assignee: FANUC CORPORATION
    Inventor: Yousuke Ootomo
  • Patent number: 11226326
    Abstract: A fluid sensor/plant machinery monitoring system and method wherein a plurality of on-line fluid property sensors output on-line sensor data and are connected to an interface configured with a server outputting the on-line sensor data via a network. A remote information management system requests and receives the on-line sensor data via the network, stores machine fluid property laboratory data, and calculates an estimate of one or more fluid properties based on both the received on-line sensor data and the stored laboratory data. A manifold unit receives fluid from a machine and includes ports for the on-line fluid property sensors. The remote information management system calculates one or more fluid properties based on both the received on-line sensor data and the stored laboratory data based on models where a machine fluid property is a function of both the on-line sensor data and the stored laboratory data for the machine.
    Type: Grant
    Filed: June 18, 2018
    Date of Patent: January 18, 2022
    Assignee: Spectro Scientifics, Inc.
    Inventors: Giuseppe Adriani, Matteo Paoli
  • Patent number: 11222783
    Abstract: A test wafer is placed inside a baking module and is baked. Via one or more temperature sensors, a cumulative heat amount delivered to the test wafer during the baking is measured. The measured cumulative heat amount is compared with a predefined cumulative heat amount threshold. In response to the comparing indicating that the measured cumulative heat amount is within the predefined cumulative heat amount threshold, it is determined that the baking module is qualified for actual semiconductor fabrication. In response to the comparing indicating that the measured cumulative heat amount is outside of the predefined cumulative heat amount threshold, it is determined that the baking module is not qualified for actual semiconductor fabrication.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: January 11, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Chia-Cheng Chao, Chung-Cheng Wang, Chun-Kuang Chen
  • Patent number: 11218664
    Abstract: A scalable dual mode monitoring system according to the present invention is configured to communicate using RF communication channels wherever possible for better range and less battery power consumption. When the system uses 2.4 GHz FHSS RF technology, the system coverage could reach a range of 250 meters line of sight; standby current goes down significantly as compared to that of solely using Wi-Fi communication channel; time to get video streaming is reduced when compared to systems that solely use Wi-Fi communication channel because RF communication channels allow for better and faster synchronization; system set-up via RF link is easy without pairing or any setup and requires simply plug and play when using RJ45 cable connecting to router from the hub.
    Type: Grant
    Filed: March 17, 2020
    Date of Patent: January 4, 2022
    Inventor: Wai Hung Lee
  • Patent number: 11204184
    Abstract: An air-conditioning apparatus includes: a suction-air temperature detection sensor that detects the temperature of air that is sucked into a heat exchange unit or the temperature of space to be subjected to heat exchange as a suction air temperature; a cooled/heated-air temperature detection sensor that detects the temperature of air blown from the heat exchange unit or the temperature of the heat exchange unit as a cooled/heated air temperature; and a control device, which includes a microcomputer or a hardware circuit. The control device acquires data on a temperature difference between the suction air temperature detected by the suction-air temperature detection sensor and the cooled/heated air temperature detected by the cooled/heated-air temperature detection sensor at different times as time-series data, and determines whether the heat exchange unit is dirty or not based on the time-series data regarding the temperature difference.
    Type: Grant
    Filed: April 5, 2018
    Date of Patent: December 21, 2021
    Assignee: Mitsubishi Electric Corporation
    Inventor: Hirotoshi Yano
  • Patent number: 11157344
    Abstract: Multiple component mounters that configure multiple user-side component mounting lines and a support-side information server are connected so as to be able to communicate with each other via a network. The support-side information server includes an information registration section collecting and registering failure information generated in the multiple user-side production devices and updating and registering failure avoidance information as a failure avoidance method becomes apparent, and an information distribution section distributing the failure information and the failure avoidance information to the user-side production devices.
    Type: Grant
    Filed: February 24, 2017
    Date of Patent: October 26, 2021
    Assignee: FUJI CORPORATION
    Inventors: Hironori Kondo, Shingo Kokawa
  • Patent number: 11144038
    Abstract: A graphical user interface (GUI) for designing and monitoring an industrial automation system presents an alert based on a condition of an object corresponding to a respective industrial automation device displayed on the GUI. The GUI generates one or more suggestions for resolving the alert, including referencing a historical data set, parsing the historical data set to identify one or more previous instances in which the condition of the object occurred and was successfully resolved, and identifying one or more respective remedial actions taken in each of the one or more identified previous instances to resolve the condition. The GUI presents the one or more remedial actions as the one or more suggestions for resolving the alert, receives an input selecting one of the one or more remedial actions, and implements the selected remedial action.
    Type: Grant
    Filed: September 27, 2019
    Date of Patent: October 12, 2021
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Andrew R. Stump, Anthony Carrara, Christopher W. Como, Sharon Billi-Duran, Matthew R. Ericsson, Srdjan Josipovic, Eashwer Srinivasan, Michael D. Kalan
  • Patent number: 11119004
    Abstract: A strain estimation device according to an aspect of the present disclosure is a strain estimation device that estimates strain of a component provided in a fluid and includes a pressure acquisition unit that acquires a pressure signal including time-series pressure values at a predetermined position in a vicinity of the component, an estimation unit that estimates, based on the pressure signal, a strain signal including time-series strain values occurring at the component, and an output unit that outputs the strain signal. The estimation unit converts the pressure signal into the strain signal using an estimation filter determined based on a power spectral density of pressure and a power spectral density of strain occurring at the component when the pressure is applied to the position.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: September 14, 2021
    Assignee: IHI Corporation
    Inventor: Tatsuya Hashizume
  • Patent number: 11120350
    Abstract: The present invention discloses a multilevel pattern monitoring method for a process industry process and belongs to the fields of industrial production and processing. The multilevel pattern monitoring method comprises the steps: dividing an industry process into a plurality of levels from the view of patterns, selecting a different key performance index for each level, acquiring operating data relevant to the key performance index, identifying the pattern of each level, and proposing a pattern monitoring method for each level based on a data driven method to realize pattern monitoring in the industry process.
    Type: Grant
    Filed: January 24, 2019
    Date of Patent: September 14, 2021
    Assignee: JIANGNAN UNIVERSITY
    Inventors: Xiaoli Luan, Niannian Zheng, Enbo Feng, Chenglin Liu, Fei Liu
  • Patent number: 11109645
    Abstract: Systems and methods for monitoring the quality of a surface treatment applied to an article in a manufacturing process are provided. A surface treatment may be applied to at least a portion of an article. A thermal profile of the article may be obtained and used to determine temperature indications of different regions of the article to which the surface treatment has been applied. A standard model of the article may be obtained that includes model regions having model temperature ranges. The temperature indications of the article can be compared with the model temperature ranges to determine if any temperature indications are outside of a corresponding model temperature range. The article may be a shoe part. The surface treatments may include the application of heat, plasma, dye, paint, primer, and/or the application of other materials, substances, and/or processes.
    Type: Grant
    Filed: May 25, 2018
    Date of Patent: September 7, 2021
    Assignee: NIKE, Inc.
    Inventors: Dragan Jurkovic, Chun-Wei Huang, Jen-Chuan Lin, Shih-Yuan Wu, Chih-Chun Chai, Ming-Ji Lee, Chien-Liang Yeh
  • Patent number: 11107664
    Abstract: A plasma processing apparatus including a state prediction apparatus that predicts an apparatus state of the plasma processing apparatus configured to include an apparatus data recording unit that records apparatus data output from the plasma processing apparatus during the processing of the sample, a physical environment measurement data recording unit that measures physical environment in the processing chamber and records apparatus physical environment data, data correction unit that extracts a temporal change component of the physical environment from a plurality of the apparatus physical environment data recorded in the physical environment measurement data recording unit and extracts the temporal change component of the physical environment from the apparatus data to remove the temporal change components, and an apparatus state prediction calculation unit that predicts the state of the plasma processing apparatus using the apparatus data from which the temporal change component of the physical environme
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: August 31, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yoshito Kamaji, Masahiro Sumiya
  • Patent number: 11107804
    Abstract: An IC that includes a contiguous standard cell area with a 4x3 e-beam pad that is compatible with advanced manufacturing processes and an associated e-beam testable structure.
    Type: Grant
    Filed: June 30, 2019
    Date of Patent: August 31, 2021
    Assignee: PDF Solutions, Inc.
    Inventors: Stephen Lam, Dennis Ciplickas, Tomasz Brozek, Jeremy Cheng, Simone Comensoli, Indranil De, Kelvin Doong, Hans Eisenmann, Timothy Fiscus, Jonathan Haigh, Christopher Hess, John Kibarian, Sherry Lee, Marci Liao, Sheng-Che Lin, Hideki Matsuhashi, Kimon Michaels, Conor O'Sullivan, Markus Rauscher, Vyacheslav Rovner, Andrzej Strojwas, Marcin Strojwas, Carl Taylor, Rakesh Vallishayee, Larg Weiland, Nobuharu Yokoyama, Matthew Moe
  • Patent number: 11099487
    Abstract: A lithographic process is performed on a set of semiconductor substrates consisting of a plurality of substrates. As part of the process, the set of substrates is partitioned into a number of subsets. The partitioning may be based on a set of characteristics associated with a first layer on the substrates. A fingerprint of a performance parameter is then determined for at least one substrate of the set of substrates. Under some circumstances, the fingerprint is determined for one substrate of each subset of substrates. The fingerprint is associated with at least the first layer. A correction for the performance parameter associated with an application of a subsequent layer is then derived, the derivation being based on the determined fingerprint and the partitioning of the set of substrates.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: August 24, 2021
    Assignee: ASML Netherlands BV
    Inventors: Marc Hauptmann, Everhardus Cornelis Mos, Weitian Kou, Alexander Ypma, Michiel Kupers, Hyunwoo Yu, Min-Sub Han
  • Patent number: 11069585
    Abstract: Implementations of a method for healing a crack in a semiconductor substrate may include identifying a crack in a semiconductor substrate and heating an area of the semiconductor substrate including the crack until the crack is healed.
    Type: Grant
    Filed: February 7, 2020
    Date of Patent: July 20, 2021
    Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
    Inventor: Michael J. Seddon
  • Patent number: 11068463
    Abstract: A system and method for efficiently managing log data to be transferred to a DBMS (database management system). The system includes a processor that detects a change in a log file and reads a log message; performs a first preprocessing to change the content of the log message when it is decided that inputting the log message to the DBMS is necessary, and that changing of the content of the log message is necessary; generates column data by parsing on the first preprocessed log message and separating the parsed log message into columns; performs a second preprocessing to change the content of the column data when it is decided that inputting the column data to the DBMS is necessary, and that changing of the content of the column data is necessary; and provides the second preprocessed column data to the DBMS.
    Type: Grant
    Filed: August 21, 2017
    Date of Patent: July 20, 2021
    Assignee: Machbase, Inc.
    Inventor: Sung Jin Kim
  • Patent number: 11054801
    Abstract: A data processing method for processing a plurality of pieces of unit-processing data includes: a reference data changing step of changing reference data (data that is selected from a plurality of pieces of unit-processing data for each unit-element, and to be compared with each piece of unit-processing data); and a reference data extending step of extending new reference data which is the reference data after change by the reference data changing step to a unit-element other than a unit-element for which the reference data has been changed.
    Type: Grant
    Filed: January 30, 2019
    Date of Patent: July 6, 2021
    Inventors: Hideji Naohara, Takashi Ikeuchi
  • Patent number: 11054317
    Abstract: Disclosed herein is a method of measuring the chucking force of an electrostatic chuck. The method comprises placing a sensor wafer onto the electrostatic chuck, wherein the sensor wafer comprises a plurality of pressure sensors, and applying a chucking voltage to the electrostatic chuck. The method further comprises measuring the chucking force with the plurality of pressure sensors to determine a first chucking force profile of the electrostatic chuck, and processing a plurality of wafers on the electrostatic chuck. The method further comprises placing the sensor wafer onto the electrostatic chuck, and applying the chucking voltage to the electrostatic chuck. The method further comprises measuring the chucking force with the plurality of pressure sensors to determine a second chucking force profile of the electrostatic chuck.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: July 6, 2021
    Assignee: Applied Materials, Inc.
    Inventors: Charles G. Potter, Wendell Glenn Boyd, Jr., Govinda Raj, Robert Hirahara
  • Patent number: 11055447
    Abstract: This disclosure relates to precision agriculture that relies on monitoring micro-climatic conditions of a farm to make accurate disease forecasts for better crop protection and improve yield efficiency. Conventional systems face challenge in managing energy and bandwidth of transmission considering the humongous volume of data generated in a field through IoT based sensors. The present disclosure provides energy-efficient adaptive parameter sampling from the field by optimally configuring the parameter sampling rate thereby maximizing energy-efficiency. This helps reduce unnecessary traffic to a cloud while extending network lifetime.
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: July 6, 2021
    Assignee: TATA CONSULTANCY SERVICES LIMITED
    Inventors: Prachin Lalit Jain, Sanat Sarangi, Prakruti Vinodchandra Bhatt, Srinivasu Pappula
  • Patent number: 11048219
    Abstract: A system and method for controlling automation includes a machine performing at least one operation and including a sensor for generating data in response to a performance of the operation by the machine. Data generated by the sensor is stored for retrieval by a server in data memory storage. The server includes at least one display template for displaying the data, and the server generates a data display by populating the at least one display template with the data. The data template can be populated with data in real time, to display the data display immediate to the generation of the data. The display template includes a data feature which is differentiated for displaying the data feature in a mode determined by the data populating the data display. The data display can be displayed in real time by a user device in communication with the server.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: June 29, 2021
    Assignee: BEET, INC.
    Inventor: David Jingqiu Wang
  • Patent number: 11027492
    Abstract: Quality control method and control system for a stock of a base material for the additive manufacture of components includes selecting a batch of a base material out of a plurality of indexed batches of the stock, wherein base material assigned to the same batch index is indicative to the quality of the respective base material, loading a quantity of base material of the selected batch into a manufacturing system, additively manufacturing the component from the base material, wherein the base material of the selected batch is exposed to manufacturing conditions in a build area and updating the batch index of the base material remaining from the additive manufacture in the build area according to the exposure.
    Type: Grant
    Filed: February 9, 2017
    Date of Patent: June 8, 2021
    Assignee: Siemens Energy Global GmbH & Co. KG
    Inventors: Carl Hockley, Yaroslav Lebed
  • Patent number: 11019152
    Abstract: An equipment installation support system is usable to support setting of a plurality of pieces of equipment intended to be installed in a plurality of buildings. The support system includes a plurality of recording tools, and a server. Each recording tool is assigned to one of the plurality of pieces of equipment and includes a medium having recorded information concerning the assigned one of the plurality of pieces of equipment. The server manages the plurality of pieces of equipment. A specific piece of equipment is intended to be installed in a specific building among the plurality of buildings and has a configuration to adjust a room environment of the specific building. A specific recording tool is assigned second identification information that is assigned to the specific piece of equipment and identifies the specific piece of equipment from pieces of equipment other than the specific piece of equipment.
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: May 25, 2021
    Assignee: Daikin Industries, Ltd.
    Inventors: Shinichirou Fujimoto, Hiroshi Doumae, Daisuke Satou